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contact force. The bending of the cantilever is monitored through the vertical deflection of the reflected laser on the photodetector. Feedback loop looks at the vertical deflection to maintain constant contact force during scanning.
Applications:
Atomic and molecular resolution imaging Force-Distance Measurements Characterization of hard, rigid surfaces (metals, thin films)
10m scan
fragile samples Imaging force can be increased by: Surface tension forces due to adsorbed fluid layer Electrostatic forces Operation under fluid alleviates some of these problems
forces Allows samples to be imaged in native fluid environment Disadvantages Only partially alleviates lateral forces Not practical to submerge many surfaces
Typically frequency ranges from 70 KHz to 350KHz depending on the dimension of the cantilever. The contact force is related to the amplitude of oscillation. The amplitude of oscillation is monitored using the Photodetector. The feedback loop maintains a constant contact force via keeping the Amplitude of oscillation constant.
frequency to obtain AC signal Scans probe on the end of oscillating cantilever above the adsorbed fluid layer on the sample surface Probe responds to Van der Waals forces which extend from 1nm to 10nm above the adsorbed layer Feedback loop maintains constant oscillation amplitude or frequency during scanning
Disadvantages
Resolution limited by tip-sample
separation Must scan slowly to avoid contacting and getting stuck in adsorbed layer Due to these disadvantages, applications for noncontact mode imaging have been limited
TappingMode AFM
Incorporates benefits of contact mode and non
contact mode while overcoming their drawbacks Scans probe on end of oscillating cantilever across the sample surface Oscillation amplitude typically >20nm Large oscillation amplitude allows tip to "tap" on the sample surface without getting stuck in adsorbed layer Feedback loop maintains constant oscillation amplitude Operates in air and fluid
TappingMode AFM
TappingMode AFM
10-100 nm
"Free" Amplitude
Amplitude reduced
TappingMode Advantages
Virtually eliminates shear (lateral) forces Reduces normal (vertical) forces
technique Allows imaging of soft, fragile, and adhesive surfaces without risk of sample damage
TappingMode Applications
Semiconductor surfaces Data Storage Devices Optics Metals and insulators
Thin Films
Polymers Biological Surfaces (air
Composites
Numerous other
applications