Microscopy & Resolution

Magnification: Image size/Object size Resolution: The fineness of detail that can be distinguished in an image.

Highest Typical Resolution Optical Microscope ~200 nm Electron Microscope ~0.1 nm

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Definitions
Acceptance angle Numerical Aperture NA = n sin Rayleigh resolution criterion for a circular aperture x = 0.61 /NA

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OPTICAL MICROSCOPES
Image construction for a simple biconvex lens

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Rayleigh criterion for resolution

Numerical Aperature

Resolution

Rayleigh Criterion

www.microscopy.fsu.edu ; www.imb-jena.de See more interactive tutorials at www.microscopy.fsu.edu OU NanoLab/NSF NUE/Bumm & Johnson

BrightField
Full aperture is illuminated

Comparison

DarkField
A central obstruction blocks the central cone.

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Dark-Field Optical Microscopy

A central obstruction blocks the central cone. The sample is only illuminated by the marginal rays. These marginal rays must be at angles too large for the objective lens to collect. Only light scattered by the object is collected by the lens.
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www.microscopy.fsu.edu

Dark-Field Optical Microscopy

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www.microscopy.fsu.edu

THE ELECTRON MICROSCOPE

The wavelength of the electron can be tuned by changing the accelerating voltage.

de Broglie : = h/mv : wavelength associated with the particle h: Planks constant 6.6310-34 Js; mv: momentum of the particle me= 9.110-31 kg; e = 1.610-19 coulomb
P.E eV = mv2 = h/(2meV) = 12.3/V (for V in KV, in ) V of 60 kV, = 0.05 x ~ 2.5 Microscopes using electrons as illuminating radiation TEM & SEM

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Components of the TEM

1. 2. 3. 4. 5. 6. 7. Electron Gun: Filament, Anode/Cathode Condenser lens system and its apertures Specimen chamber Objective lens and apertures Projective lens system and apertures Correctional facilities (Chromatic, Spherical, Astigmatism) Desk consol with CRTs and camera

Transformers: 20-100 kV; Vacuum pumps: 10-6 10-10 Torr

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Schematic of E Gun & EM lens

Magnification: 10,000 100,000; Resolution: 1 - 0.2 nm

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TEM IMAGES

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www.udel.edu ; www.nano-lab. com ; www.thermo.com