Automotive Electronics Council -

Standards
• AEC is an abbreviation of "Automotive Electronics Council."
• AEC is an industry organization
Promotes the standardization of reliability or
qualification standards for automotive electronic
components
Consisting of major auto manufacturers and major
electronic component manufacturers in the USA.
• The AEC-Qxxx standards are widely adopted as standards for
automotive electronic components, practically serving as the
industry standards.
 Automotive Electronics Council -
Standards
• The Automotive Electronics Council (AEC)
was
Originally established by Chrysler, Ford, and GM for
the purpose of establishing common part-qualification
and quality-system standards.
• It has consisted of two Committees
1. The Quality Systems Committee
2. The Component Technical Committee.
 Automotive Electronics Council -
Standards
• The AEC Component Technical Committee:
It is the standardization body for establishing
standards for reliable, high quality electronic
components.
Components meeting these specifications are
suitable for use in the harsh automotive
environment without additional component-
level qualification testing.
 Automotive Electronics Council -
Standards
The AEC-Qxxx standards are classified into the
following groups, according to the component category.
1. AEC-Q100: Integrated circuits (ICs)
2. AEC-Q101: Discrete semiconductor components
(transistors, diodes, etc.)
3. AEC-Q200: Passive components (capacitors,
inductors, etc.)
 AEC - Q100: Failure Mechanism Based Stress Test
Qualification For Integrated Circuits

 AEC - Q100 Rev - H: Failure Mechanism Based Stress Test

Qualification For Integrated Circuits (base document)<=""
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 AEC - Q100-001 - Rev-C: Wire Bond Shear Test
 AEC - Q100-002 - Rev-E: Human Body Model (HBM)
Electrostatic Discharge Test
 AEC - Q100-004 - Rev-D: IC Latch-Up Test
 AEC - Q100-005 - Rev-D1: Non-Volatile Memory
Program/Erase Endurance, Data Retention, and Operational
Life Test
 AEC - Q100-007 - Rev-B: Fault Simulation and Test Grading
 AEC - Q100-008 - Rev-A: Early Life Failure Rate (ELFR)
 AEC - Q100-009 - Rev-B: Electrical Distribution Assessment
 AEC - Q100-010 - Rev-A: Solder Ball Shear Test
 AEC - Q100: Failure Mechanism Based Stress Test
Qualification For Integrated Circuits

 AEC - Q100-011 - Rev-C1: Charged Device Model (CDM)

Electrostatic Discharge Test
 AEC - Q100-012 - Rev-: Short Circuit Reliability
Characterization of Smart Power Devices for 12V Systems
 AEC - Q101 Rev - D1: Failure Mechanism Based Stress Test
Qualification For Discrete Semiconductors (base document)
 AEC - Q101-001 - Rev-A: Human Body Model (HBM)
Electrostatic Discharge Test
 AEC - Q101-003 - Rev-A: Wire Bond Shear Test
 AEC - Q101-004 - Rev-: Miscellaneous Test Methods
 AEC - Q101-005 - Rev-: Charged Device Model (CDM)
Electrostatic Discharge Test
 AEC - Q101-006 - Rev-: Short Circuit Reliability Characterization
of Smart Power Devices for 12V Systems
 AEC - Q102: Failure Mechanism Based Stress
Test Qualification for Discrete Optoelectronic
Semiconductors in Automotive Applications
AEC - Q102 Rev - (Initial Release): Failure
Mechanism Based Stress Test Qualification for
Discrete Optoelectronic Semiconductors in
Automotive Applications
AEC - Q104 Rev - (Initial Release): Failure
Mechanism Based Stress Test Qualification For
Multichip Modules (MCM) In Automotive
Applications
 AEC - Q200: Stress Test Qualification For
Passive Components
 AEC - Q200 Rev - D base: Stress Test Qualification For Passive
Components (base document)
 AEC - Q200-001 - Rev-B: Flame Retardance Test
 AEC - Q200-002 - Rev-B: Human Body Model (HBM) Electrostatic
Discharge Test
 AEC - Q200-003 - Rev-B: Beam Load (Break Strength) Test
 AEC - Q200-004 - Rev-A: Measurement Procedures for Resettable
Fuses
 AEC - Q200-005 - Rev-A: Board Flex / Terminal Bond Strength Test
 AEC - Q200-006 - Rev-A: Terminal Strength (SMD) / Shear Stress
Test
 AEC - Q200-007 - Rev-A: Voltage Surge Test
 Stress-Test Qualification
• The minimum temperature range required for each
passive electrical component type is listed below

GRADE TEMPERATURE PASSIVE COMPONENT TYPE TYPICAL/EXAMPLE

RANGE
Maximum capability unless otherwise APPLICATION
MINIMUM MAXIMUM
specified and qualified

0 -50°C +150°C Flat chip ceramic resistors, X8R All automotive

ceramic capacitors

1 -40°C +125°C Capacitor Networks, Resistors, Most underhood

Inductors, Transformers, Thermistors,

Resonators, Crystals and Varistors, all

other ceramic and tantalum capacitors

° ° Passenger
2 -40 C +105 C Aluminum Electrolytic capacitors compartment hot spots

3 -40°C +85°C Film capacitors, Ferrites, R/R-C Most passenger

Networks and Trimmer capacitors compartment

4 0°C +70°C Non-automotive

 TABLE 1 - QUALIFICATION SAMPLE SIZE
REQUIREMENTS
Stress NO. Note Sample Size Per Number Accept on
Lot of lots Number
failed

Pre-and Post-Stress 1 G All qualification parts submitted 0

Electrical Test for testing

High Temperature 3 DG 77 1 0
Exposure
Note B

Temperature Cycling 4 DG 77 1 0
Note B

1
Destructive Physical 5 DG 10 0
Analysis
Note B

Moisture Resistance 6 DG 77 1 0
Note B

77
Note B
Humidity Bias 7 DG 1 0
 TABLE 1 - QUALIFICATION SAMPLE SIZE
REQUIREMENTS
Stress NO. Note Sample Size Per Number Accept on
Lot of lots Number
failed
Note B

External Visual 9 NG All qualification parts submitted 0

Physical Dimensions 10 NG 30 1 0

Terminal Strength 11 DGL 30 1 0

Resistance to Solvent 12 DG 5 1 0

Mechanical Shock 13 DG 30 1 0

Vibration 14 DG Note B

Resistance to Solder 15 DG 30 1 0
Heat

Thermal Shock 16 DG 30 1 0

ESD 17 D 15 1 0
 TABLE 1 - QUALIFICATION SAMPLE SIZE
REQUIREMENTS
Stress NO. Note Sample Size Number of Accept on
Per Lot lots Number failed

Solderability 18 D 15 each 1 0
condition
Electrical Characterization 19 NG 30 3 0
Note A

Flammability 20 D Present certificate of compliance

Board Flex 21 DS 30 1 0

Terminal Strength (SMD) 22 DS 30 1 0

Beam Load 23 DG 30 1 0

Flame Retardance 24 DG 30 1 0
Rotation Life 25 DG 30 1 0

Surge Voltage 27 DG 30 1 0
Salt Spray 29 DG 30 1 0

Electrical Transient 30 DG 30 1 0
Conduction
Shear Strength 31 DG 30 1 0

Short Circuit Fault 32 DG 30 1 0

Current Durability
Fault Current Durability 33 DG 30 1 0

End-of-Life Mode Verification 34 DG 30 1 0

Jump Start Endurance 35 DG 30 1 0

Load Dump Endurance 36 DG 30 1 0

AEC - Q200: Stress Test Qualification
For Passive Components
 TANTALUM & CERAMIC CAPACITORS
 ALUMINUM ELECTROLYTIC CAPACITORS
 FILM CAPACITORS
 MAGNETICS (INDUCTORS/TRANSFORMERS)
 NETWORKS (R-C/C/R)
 RESISTORS
 THERMISTORS
 TRIMMER CAPACITORS/RESISTORS
 VARISTORS
 QUARTZ CRYSTALS
 CERAMIC RESONATORS
 FERRITE EMI SUPPRESSORS/FILTERS
 POLYMERIC RESETTABLE FUSES
3.Procedure for Identification of AEC approved
part list

Silicon Expert’s Part Search tool makes it easy

to determine if your electronic parts are
qualified by the Automotive Electronics
Council.
AEC-Silicon Expert also provides the AEC
number.
3.Procedure for Identification of AEC approved
part list
Enter the Part Number
 Enter the part number in the search box at the top of the
page and click the Go search button.
Select the Part Number Hyperlink
 On the results page, select the hyperlink of the part number
to go to the part details page.
Find the AEC Information
 AEC qualified components as well as the AEC numbers are
displayed on the summary tab under the summary data.