Outline

Common Fault Models (Review)

Defects and Delay Faults
Delay Fault Models
Transition Faults
Path Delay Faults
Robust Path Test
Non-robust Path Test

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Common Fault Models

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 Only if no other path delay is increased.

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 Exercise
Consider the 4-Nand implementation of the
XOR gate in the previous slide. There are
six I/O paths hence 12 path delay faults. For
each of these faults, determine if it is
robustly testable, only non-robustly testable
or not testable (functionally redundant).
Provide justification for your answers.

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Broadside is also called launch-off-capture test.
Skewed-Load is also called launch-off-shift test.

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 Timing for
launch-off-capture
Transition-delay
fault testing

IC: Initialization Clock

LC: Launch Clock
CC: Capture Clock
SEN: Scan Enable

This figure is borrowed from the paper, Ahmed et al., ITC-2005, Paper 11.1
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 Timing for
launch-off-shift
Transition-delay
fault testing

IC: Initialization Clock

LC: Launch Clock
CC: Capture Clock
SEN: Scan Enable

Delay
This figure is borrowed from FaultAhmed
the paper, Testing
et al.,Tu
ITC-2005,30
Paper 11.1
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(See Prof. Patels website for details on Segment Test)
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