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    Sulficker Ali
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    All microscopes which provide images of atoms on or in the surface of any body is called atomic force microscope or the AFM, while all those microscopes which uses the principle of the atomic force microscopes are called as scanning probe microscope or the SPM’S. These scanning probe microscopes work by measuring a local property such as height ,optical absorbtion magnetism etc ,by scanning over the sample by measuring the above property and providing the image on the television,with the probe or the tip placed very close to the sample.The resulting image obtained on the television screen consists of rows and columns of information’s on above the other which have to be decoded for getting the image .The small probe sample seperation makes it possible to makes it possible to make measurements of and over a small area. These microscopes have high accuracy to measure surfaces of size of nanometers (especially that of an atomic force microscope). These scanning probe microscopes have high resolution power in the order of picometers unlike the ordinary and traditional microscopes these scanning probe microscopes do not use or pocess any lens to show or measure the surface so the size of the probe rather than diffraction effects generally limit their resolution.

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    All microscopes which provide images of atoms on or in the surface of any body is called atomic force microscope or the AFM, while all those microscopes which uses the principle of the atomic force microscopes are called as scanning probe microscope or the SPM’S. These scanning probe microscopes work by measuring a local property such as height ,optical absorbtion magnetism etc ,by scanning over the sample by measuring the above property and providing the image on the television,with the probe or the tip placed very close to the sample.The resulting image obtained on the television screen consists of rows and columns of information’s on above the other which have to be decoded for getting the image .The small probe sample seperation makes it possible to makes it possible to make measurements of and over a small area. These microscopes have high accuracy to measure surfaces of size of nanometers (especially that of an atomic force microscope). These scanning probe microscopes have high resolution power in the order of picometers unlike the ordinary and traditional microscopes these scanning probe microscopes do not use or pocess any lens to show or measure the surface so the size of the probe rather than diffraction effects generally limit their resolution.

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    175 views16 pages

    AFM Presentation

    Uploaded by

    Sulficker Ali
    All microscopes which provide images of atoms on or in the surface of any body is called atomic force microscope or the AFM, while all those microscopes which uses the principle of the atomic force microscopes are called as scanning probe microscope or the SPM’S. These scanning probe microscopes work by measuring a local property such as height ,optical absorbtion magnetism etc ,by scanning over the sample by measuring the above property and providing the image on the television,with the probe or the tip placed very close to the sample.The resulting image obtained on the television screen consists of rows and columns of information’s on above the other which have to be decoded for getting the image .The small probe sample seperation makes it possible to makes it possible to make measurements of and over a small area. These microscopes have high accuracy to measure surfaces of size of nanometers (especially that of an atomic force microscope). These scanning probe microscopes have high resolution power in the order of picometers unlike the ordinary and traditional microscopes these scanning probe microscopes do not use or pocess any lens to show or measure the surface so the size of the probe rather than diffraction effects generally limit their resolution.

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    HISTORY
    Atomic force microscopy (AFM) was developed when
    people tried to extend STM technique to investigate the
    electrically non-conductive materials, like proteins.

    The Scanning Tunneling Microscope (STM) was invented
    by Gerd Binnig and Heinrich Rohrer , for which they were
    awarded the Nobel Prize in 1984.

    A few years later, the first Atomic Force Microscope (AFM)
    was developed by G. Binnig, Ch. Gerber, and C. Quate at
    Stanford University by gluing a tiny shard of diamond onto
    one end of a tiny strip of gold foil

    Currently AFM is the most common form of scanning probe
    microscopy
    fb.com/sulficker.ali.ismail
    ATOMIC FORCE MICROSCOPE (AFM)
    The AFM is one of the foremost tools for
    imaging, measuring and manipulating matter
    at the nanoscale. The information is
    gathered by "feeling" the surface with a
    mechanical probe.

    fb.com/sulficker.ali.ismail
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    WORKING
    Operates :attractive and repulsive forces
    Two types (a) DC mode(contact mode) (b)
    AC mode(non contact mode)

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    PROBE TIPS
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    CONTACT MODE
    Cantilever in contact
    Laser falls on the sample
    Repulsive forces deflect the cantilever
    Angular deflection of the laser
    Bending measured by a photodetector

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    NON CONTACT MODE
    Instead of measuring single deflections of a
    cantilever, a vibrating cantilever is used and
    the change in the resonance frequency of the
    cantilever is measured as it interacts with the
    field imposed by the sample.
    In this mode, the probe is not in physical
    contact with the sample.

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    CONTACT MODE VS NON CONTACT MODE.
    Contact mode imaging is heavily influenced by
    frictional and adhesive forces, and can damage
    samples and distort image data.
    Non-contact imaging generally provides low
    resolution and can also be hampered by the
    contaminant (e.g., water) layer which can
    interfere with oscillation.


    fb.com/sulficker.ali.ismail
    NANOLITHOGRAPHY:
    Normally an AFM is used to image a surface without
    damaging it in any way. But an AFM can also be used to
    modify the surface deliberately, but applying either
    excessive force or high pulses with an AFM. This
    technique is known as nanolithography


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    ADVANTAGES OF AFM
    Can operate in air, liquid or vacuum
    Sample and tip may be conducting or insulating
    Samples viewed by AFM do not require any special
    treatments (such as metal/carbon coatings) that would
    irreversibly change or damage the sample.
    fb.com/sulficker.ali.ismail
    GOOD AFM
    Noise Floor
    Tip Life
    Thermal Drift
    fb.com/sulficker.ali.ismail
    Brukers Industry
    Cypher AFM (Asylum Research)
    Park AFM

    Price ranges from $ 20,000 to $ 1,000,000
    fb.com/sulficker.ali.ismail
    CYPHER AFM
    The Worlds Highest Resolution AFM

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    THANK YOU !!

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    QUESTIONS ?
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