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Formation of the pn Junction Energy Band Diagrams Concepts of Junction Potential Modes of the pn Junction Derivation of the IV Characteristics of a pn Junction Diode Linear Piecewise Models Breakdown Diode Special Types of pn Junction Semiconductor Diodes Applications of Diode
INTRODUCTION
The origin of a wide range of electronic devices being used can be traced back to a simple device, the pn junction diode. The pn junction diode is formed when a p-type semiconductor impurity is doped on one side and an n-type impurity is doped on the other side of a single crystal. All the macro effects of electronic devices, i.e., wave shaping, amplifying or regenerative effects, are based on the events occurring at the junction of the p n device. Most modern devices are a modification or amalgamation of pn devices in various forms. Prior to the era of semiconductor diodes, vacuum tubes were being extensively used. These were bulky, costly and took more time to start conducting because of the thermo-ionic emission. The semiconductor diodes and the allied junction devices solved all these problems.
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The diagram above shows the 2D structure of the Si crystal. The light green lines represent the electronic bonds made when the valence electrons are shared. Each Si atom shares one electron with each of its four closest neighbors so that its valence band will have a full 8 electrons.
N-Type Material
N-Type Material:
When extra valence electrons are introduced into a material such as silicon an n-type material is produced. The extra valence electrons are introduced by putting impurities or dopants into the silicon. The dopants used to create an n-type material are Group V elements. The most commonly used dopants from Group V are arsenic, antimony and phosphorus. The 2D diagram to the left shows the extra electron that will be present when a Group V dopant is introduced to a material such as silicon. This extra electron is very mobile.
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P-Type Material
P-Type Material:
P-type material is produced when the dopant that is introduced is from Group III. Group III elements have only 3 valence electrons and therefore there is an electron missing. This creates a hole (h+), or a positive charge that can move around in the material. Commonly used Group III dopants are aluminum, boron, and gallium. The 2D diagram to the left shows the hole that will be present when a Group III dopant is introduced to a material such as silicon. This hole is quite mobile in the same way the extra electron is mobile in a n-type material.
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A semiconductor pn junction The presence of a concentration gradient between two materials in such intimate contact results in a diffusion of carriers that tends to neutralize this gradient. This process is known as the diffusion process. The nature of the pn junction so formed may, in general, be of two types: A step-graded junction:- In a step-graded semiconductor junction, the impurity density in the semiconductor is constant. A linearly-graded junction:- In a linearly-graded junction, the impurity density varies linearly with distance away from the junction.
(where pn is the hole concentration in n-type semiconductors, np is the electron concentration in p-type semiconductors; nn and pp are the electron and hole concentrations in n- and p-type semiconductors respectively.)
The energy band diagram of a pn junction under the condition of thermal equilibrium
It should be noted that a voltmeter cannot measure this electrostatic potential since the internal field is set up to oppose the diffusion current and also since the built-in potential is cancelled exactly by the potential drop across the contact. The barrier energy corresponding to barrier potential Vd is expressed as EB = eVd. The value of EB can be changed by doping change. The value of EB is different for different semiconductors.
The width of the depletion region is inversely proportional to the doping strength, as a larger carrier concentration enables the same charge to be achieved over a smaller dimension.
It should be noted that the depletion charge for different doping is not constant. The barrier field is normally independent of the doping concentration except under conditions of heavy doping, which may alter the bandgap itself, thereby modifying the barrier field. The value of Vd in terms of the hole and electron concentrations can be derived in the following manner.
At thermal equilibrium, the non-degenerate electron concentrations for the n-type and p-type can be written as:
where Ecn, Ecp, Efn, and Efp are the conduction and Fermi level energies of the n-type and p-type semiconductors, respectively, and Nc is the effective density-of-states. The Fermi levels are given by:
At equilibrium condition, the Fermi level must be constant throughout the entire crystal. Otherwise, because of the availability of lower energy levels, a flow of carriers would result. The Fermi levels, therefore, must line up at the equilibrium.
(where, the plus and minus signs are for the reverse-biased and the forward-biased conditions.)
The plus sign is for the forward-biased case where minority carriers are injected. The minus sign is for the reverse-biased case where minority carriers are extracted. The concentration of the carriers on the boundaries, for the usual cases, Na >> ni and under an external applied voltage V is shown in right side figure. Electron and hole carriers at the boundaries of a pn junction under an externally applied voltage
Properties of Diodes
VD = Bias Voltage ID = Current through Diode. ID is Negative for Reverse Bias and Positive for Forward Bias IS = Saturation Current VBR = Breakdown Voltage V = Barrier Potential Voltage
ID
(mA)
IS VBR ~V
VD
(nA)
Properties of Diodes
The transconductance curve on the previous slide is characterized by the following equation:
ID = IS(eVD/VT 1)
As described in the last slide, ID is the current through the diode, IS is the saturation current and VD is the applied biasing voltage. VT is the thermal equivalent voltage and is approximately 26 mV at room temperature. The equation to find VT at various temperatures is: VT = kT/ q k = 1.38 x 10-23 J/K T = temperature in Kelvin q = 1.6 x 10-19 C is the emission coefficient for the diode. It is determined by the way the diode is constructed. It somewhat varies with diode current. For a silicon diode is around 2 for low currents and goes down to about 1 at higher currents