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n
(x,y)=the mobility of the
carriers at point (x,y)
Device width is Z
Channel Length is L
Assume a Long Channel device (for
now do not worry about the channel
length modulation effect)
ECE 3040 - Dr. Alan Doolittle Georgia Tech
MOS Transistor I-V Derivation
Concept of Effective mobility
The mobility of carriers near the interface is
significantly lower than carriers in the
semiconductor bulk due to interface
scattering.
Since the electron concentration also varies
with position, the average mobility of
electrons in the channel, known as the
effective mobility, can be calculated by a
weighted average,
| |
}
}
}
}
=
=
=
=
=
=
=
=
=
=
=
) (
0
2
) (
0
) (
0
) (
0
) , ( ) , (
) (
/ arg ) , ( ) (
,
) , (
) , ( ) , (
y x x
x
n
N
n
y x x
x
N
y x x
x
y x x
x
n
n
c
c
c
c
dx y x n y x
y Q
q
cm e ch dx y x n q y Q
defining or
dx y x n
dx y x n y x
Empirically
( )
constants are ,
1
u
u
and where
V V
o
T GS
o
n
+
=
ECE 3040 - Dr. Alan Doolittle Georgia Tech
MOS Transistor I-V Derivation
Drain Current-Voltage Relationship
In the Linear Region, V
GS
>V
T
and 0<V
DS
<V
dsat
dy
d
n q nE q J J
n qD nE q J
n y n Ny N
N n N
|
~ ~ ~
V + =
Neglecting the diffusion current, and recognizing the current is
only in the y-direction,
ECE 3040 - Dr. Alan Doolittle Georgia Tech
MOS Transistor I-V Derivation
Drain Current-Voltage Relationship
In the Linear Region, V
GS
>V
T
and 0<V
DS
<V
dsat
}
}
} }
}
} } }
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
=
|
.
|
\
|
|
|
.
|
\
|
=
= =
DS
DS
DS
c
c
V
N
n
D
V
N n D
V
N n
L y
y
D
N n
y x x
x
n
y x x
x
Ny Ny D
d Q
L
Z
I
d Q Z L I
d Q Z dy I
dy
d
Q Z
dx y x n y x q
dy
d
Z
dx J Z dxdz J I
|
|
|
|
|
|
|
|
|
|
|
0
0
0 0
) (
0
) (
0
) , ( ) , (
To find I
D
, we need an expression relating the
electrostatic potential, |, and Q
N
ECE 3040 - Dr. Alan Doolittle Georgia Tech
MOS Transistor I-V Derivation
Capacitor-Like Model for Q
N
Assumptions:
Neglect all but the mobile inversion charge (valid for deep inversion)
For the MOSFET, the charge in the semiconductor is a linear function of
position along the semiconductor side of the plate. Thus, | varies from 0 to V
DS
MOS Capacitor MOS Transistor
( )
T GS
V V for > ~
T GS ox N
V V C Q
( )
T GS
V V for >
~ |
T GS ox N
V V C Q
Source
Drain
,
dV
dQ
C Since
ox
=
Neglect the depletion region charge
Note: Assuming a linear variation of potential along the channel
leads to an underestimation of current but is a good estimate for
hand calculations.
Only voltages above threshold create inversion charge
ECE 3040 - Dr. Alan Doolittle Georgia Tech
MOS Transistor I-V Derivation
Using Capacitor-Like Model for Q
N
we can estimate I
D
as:
( )
( )
T GS Dsat DS
DS
DS T GS
ox n
D
V
T G ox
n
D
V
N
n
D
V V and V V
V
V V V
L
C Z
I
d V V C
L
Z
I
d Q
L
Z
I
DS
DS
> s s
(
=
}
}
=
=
=
=
0
2
2
0
0
| |
|
|
|
|
This is known as the square law describing the
Current-Voltage characteristics in the Linear or
Triode region.
Note the linear behavior for small V
DS
(can neglect V
DS
2
term). Note
the negative parabolic dependence for larger V
DS
but still V
DS
<V
Dsat
(can NOT neglect V
DS
2
term).
ECE 3040 - Dr. Alan Doolittle Georgia Tech
MOS Transistor I-V Derivation
Capacitor-Like Model for Q
N
For V
DS
>V
dsat
the voltage drop across our channel is V
Dsat
with the remaining voltage
(V
DS
-V
Dsat
) dropped across the pinch-off region
( )
DS Dsat
Dsat
Dsat T GS
ox n
Dsat D
V V
V
V V V
L
C Z
I I s
(
= =
2
2
But the charge at the end of the channel is zero due to the pinched off channel,
( )
Dsat T GS
Dsat T GS ox N
V V V
or
V V V C L y Q
=
= ~ = 0 ) (
Thus,
( ) | |
DS Dsat T GS
ox n
Dsat D
V V V V
L
C Z
I I s = =
2
2
( )
T GS Dsat DS
DS
DS T GS
ox n
D
V V and V V
V
V V V
L
C Z
I
> s s
(
=
0
2
2
= =
~
(
=
600 100
,
1 / 6 166 . 0 200
01 . 0
V small for
2
2
DS
2
DS
GS
DS
T GS ox n
DS T GS
ox n
DS
D
DS
DS
DS T GS
ox n DS
DS T GS
ox n
D
R
Thus
V cm F e
R
V V C
Z
L
V V V
L
C Z
V
I
V
R
V V V
L
C Z V
V V V
L
C Z
I
ECE 3040 - Dr. Alan Doolittle Georgia Tech
MOS Transistor Applications
Current Source
The same transistor is to be used for a Current Source. Define the range of
drain-source voltage that can be used to achieve a fixed current of 50 uA.
For a constant current regardless of Drain-Source voltage, we must use the
saturation region:
( ) | |
( )
( )
V V
V
cm uF VSec cm
uA
V V V V
L
C Z
I I
GS
GS
DS Dsat T GS
ox n
Dsat D
173 . 1
1
2
/ 166 . 0 / 200 100
50
2
2
2 2
2
=
=
s = =
This source will operate over a V
DS
>V
GS
-V
T
or V
DS
>0.173 V
ECE 3040 - Dr. Alan Doolittle Georgia Tech
MOS Transistor: Deviations From Ideal
Channel Length Modulation Effect
Above pinch-off (when V
DS
>V
Dsat
=V
GS
-V
T
) the channel length reduces
by a value AL.
Thus, the expression for drain current,
Becomes,
( ) | |
DS Dsat T GS
ox n
Dsat D
V V V V
L
C Z
I I s = =
2
2
( )
( ) | |
( ) | |
DS Dsat T GS
ox n
Dsat D
DS Dsat T GS
ox n
Dsat D
V V
L
L
V V
L
C Z
I I
L
L
L L L
V V V V
L L
C Z
I I
s
|
.
|
\
|
A
+ = =
|
.
|
\
|
A
+ ~
A
( A
s
A
= =
1
2
1
1 1
L, L * since or
2
2
2
*In many modern devices, this assumption does not hold. Thus, the channel length modulation parameter we are deriving does not describe the IV
expressions well.
ECE 3040 - Dr. Alan Doolittle Georgia Tech
MOS Transistor: Deviations From Ideal
Channel Length Modulation Effect
DS
V
L
L
=
A
But the fraction of the channel that is pinched off
depends linearly on V
DS
because the voltage
across the pinch-off region is (V
DS
-V
Dsat
) so,
( ) | |( )
DS Dsat DS T GS
ox n
Dsat D
V V V V V
L
C Z
I I s + = =
1
2
2
where is known as the Channel-Length
Modulation parameter and is typically:
0.001 V
-1
< <0.1 V
1
Channel Length Modulation
causes the dependence of drain
current on the drain voltage in
saturation.
ECE 3040 - Dr. Alan Doolittle Georgia Tech
MOS Transistor: Deviations From Ideal
Body Effect (Substrate Biasing)
Until now, we have only considered
the case where the substrate (Body)
has been grounded.
but the substrate (Body) is often
intentionally biased such that the
Source-Body and Drain-Body
junctions are reversed biased.
The body bias, V
BS
, is known as the backgate bias and can be used to modify the
threshold voltage.
Note that now our channel potential has an offset equal to V
BS
, .
ECE 3040 - Dr. Alan Doolittle Georgia Tech
( )
( ) devices) channel - p (for 2
2
2
devices) channel - n (for 2
2
2
F
S
D
ox
S
F T
F
S
A
ox
S
F T
qN
C
V
qN
C
V
|
c
c
|
|
c
c
|
=
+ =
MOS Transistor: Deviations From Ideal
Body Effect (Substrate Biasing)
Thus, our threshold potential with the body grounded,
The Gate- Body Threshold becomes,
( )
( ) devices) channel - n (for 2
2
2
devices) channel - p (for 2
2
2
BS F
S
A
ox
S
BS F GB
BS F
S
D
ox
S
BS F GB
V
qN
C
V V
V
qN
C
V V
Threshold
Threshold
+ =
+ =
|
c
c
|
|
c
c
|
But we would like to have this in terms of V
GS
instead of V
GB
.
Since, V
GS
=V
GB
+V
BS
( )
( ) devices) channel - p (for 2
2
2
devices) channel - n (for 2
2
2
BS F
S
D
ox
S
F GS
BS F
S
A
ox
S
F GS
V
qN
C
V
V
qN
C
V
Threshold
Threshold
+ =
+ =
|
c
c
|
|
c
c
|
Surface Potential |
S
V
T
=
ECE 3040 - Dr. Alan Doolittle Georgia Tech
MOS Transistor: Deviations From Ideal
Body Effect (Substrate Biasing)
( ) ( ) ( ) ( )
( ) ( ) ( ) ( )
ox
F BS F TO TP T
F BS F TO TN T
C
V V Jaeger V Pierret V
V V Jaeger V Pierret V
S A
2qN
where,
devices) channel - p (for 2 2
devices) channel - n (for 2 2
c
| |
| |
=
+ = =
+ = =
This can be rewritten in the following form (more convenient to reference the threshold
voltage to the V
BS
=0 case).
is known as the body effect parameter
ECE 3040 - Dr. Alan Doolittle Georgia Tech
MOS Transistor:
Enhancement Mode verses Depletion Mode MOSFET
We have been studying the enhancement mode MOSFET
(Metal-Oxide-Semiconductor Field Effect Transistor). It is called
enhancement because conduction occurs only after the channel
conductance is improved or enhanced. In this case,
V
TN
>0 and V
TP
<0
Transistors can be fabricated such that:
These transistors have conduction for V
GS
=0 due to a channel
already existing without the need to invert the near surface
region. To modulate currents, a field must applied to the gate that
depletes the channel. Thus, transistors of this nature are called
Depletion mode MOSFETs.
0 V and 0 V
TP TN
> s
ECE 3040 - Dr. Alan Doolittle Georgia Tech
MOS Transistor:
Enhancement Mode verses Depletion Mode MOSFET
ECE 3040 - Dr. Alan Doolittle Georgia Tech
MOS Transistor:
Summary
Jaeger uses the notation:
Pierret) in (Z Width Gate the is W where
PMOS
Pierret) in (Z Width Gate the is W where
'
'
L
W
C
L
W
K K
L
W
C
L
W
K K
NMOS
ox p p p
ox n n n
= =
= =
4-Terminal 3-Terminal
NMOS
(n-channel)
PMOS
(p-channel)
Enhancement Enhancement Depletion Depletion
ECE 3040 - Dr. Alan Doolittle Georgia Tech
MOS Transistor:
Summary
NMOS PMOS
Regardless of Mode
Cutoff
Linear
Saturation
Threshold Voltage
V
T
for Enhancement
Mode
V
T
for Depletion
Mode
Pierret) in Z W : (Note
'
= = =
L
W
C
L
W
K K
ox n n n
Pierret) in Z W : (Note
'
= = =
L
W
C
L
W
K K
ox p p p
TN GS DS
V V for I s = 0
TP GS DS
V V for I > = 0
( ) | |( )
0
1
2
2
> > >
+ =
TN GS DS TN GS
DS TN GS
ox n
DS
V V V and V V
V V V
L
C Z
I
( ) | |( )
0
1
2
2
> > s
+ =
TP GS DS TP GS
DS TP GS
ox n
DS
V V V and V V
V V V
L
C Z
I
( )
0
2
2
> > >
(
=
DS TN GS TN GS
DS
DS TN GS
ox n
DS
V V V and V V
V
V V V
L
C Z
I
( )
0
2
2
> > s
(
=
DS TP GS TP GS
DS
DS TP GS
ox n
D
V V V and V V
V
V V V
L
C Z
I
0 >
TN
V
0 s
TN
V
0 <
TP
V
0 >
TP
V
( ) ( )
F BS F TO TP
V V V | | 2 2 + = ( ) ( )
F SB F TO TN
V V V | | 2 2 + + =
ECE 3040 - Dr. Alan Doolittle Georgia Tech
MOS Transistor:
Bias Circuitry-Enhancement Mode NMOS
Due to zero DC current flow in the gate, the bias analysis of a MOSFET
is significantly easier than a BJT.
A B
C Form Thevenin
circuits looking out
the gate, drain, and
source
ECE 3040 - Dr. Alan Doolittle Georgia Tech
DS DS
GS th G
V R I V
V R I V
+ =
+ =
3 10
3
But I
G
=0 so V
GS
=3V
Assume Saturation operation (selected for
easy math because I
DS
does not depend on
V
DS
since no was given =0):
( ) | |
( ) | |
DS
DS
TN GS DS TN GS
n
DS
V Check
A
x
i
V v v for V v
K
i
50 1 3
2
10 25
0
2
2
6
2
= =
> > =
V V V V V
V k uA V
TN GS DS
DS
2 5
) 100 ( 50 10
= > =
+ =
Assumption of Saturation operation was correct! If it were not correct simply
make another assumption (I.e. linear region) and resolve.
MOS Transistor:
Bias Circuitry-Enhancement Mode NMOS
I
DS
I
G
ECE 3040 - Dr. Alan Doolittle Georgia Tech
MOS Transistor:
Bias Circuitry-Depletion Mode NMOS
Bias circuit of a depletion mode device is much simpler due to the fact
that the device conducts drain current for V
GS
=0V
What value of R1 results in 100 uA drain current?
Again Assuming saturation:
2
200
0
3
V
uA
K
V
V V
n
TO
=
=
=
( ) | |
( )
( )
V V V V V V V
V k uA V R I V
V Check
K
uA I
V
R
V
V uA
uA
V
K
I
V V
V v v for V v
K
i
TN GS DS
DS DS DS
DS
DS
GS
n
DS
TN GS
TN GS DS TN GS
n
DS
1 ) 3 ( 2 8
20 100 1 10
20
100
2
1
2
/ 200
100 2
3
2
0
2
2
2
+ = = > =
+ = + =
O =
= =
= + = + =
> > =
I
DS
Assumption of Saturation operation was correct! If it were not correct simply
make another assumption (I.e. linear region) and resolve.
ECE 3040 - Dr. Alan Doolittle Georgia Tech
PMOS Transistor:
Bias Circuitry-Enhancement Mode PMOS
2
25
0
1
V
uA
K
V
V V
p
TO
=
=
=
( ) | |( ) ( ) | |
( ) | |
( ) | |
( ) | |
0 ) 1 ( 66 . 2 08 . 6 0
08 . 6
4 . 34 1 66 . 2
2
6 25
66 . 2 71 . 2 0 21 . 7 051 . 0
1
2
6 25
000 , 39 4 6 10
2
600 5 . 1 || 1 6
1 5 . 1
5 . 1
10
0
2
1
2
2
2
2
2
2 2
> > > >
= + =
= +
=
+ = =
+
= =
=
+ + =
O = = =
+
=
> > s
= + = =
TP GS DS
DS
DS D D DS S D DD
D
GS GS GS
GS GS
GS TP GS
p
S EQ DD
EQ G G GS S S DD
EQ EQ
TP GS DS TP GS
TP GS
p
DS TP GS
ox n
S D
V V V
V Check
V V R I V R I V
A
E
I
V or V V V
V V
E
V V V
K
R V V
V R I V R I V
K M M R V
M M
M
V V
V V V and V V
V V
K
V V V
L
C Z
I I
= + =
+ + =