USM35X

Krautkramer USM 35X Issue 01, 04/2005 0-1
Contents
1 Introduction ........................................ 1-1
1.1 Safety information..................................... 1-2
Batteries...................................................... 1-2
Software ...................................................... 1-2
Defects/errors and exceptional stresses ..... 1-3
1.2 Important information on
ultrasonic testing ...................................... 1-3
Preconditions for testing with
ultrasonic test equipment ............................ 1-3
Operator training.......................................... 1-4
Technical test requirements ........................ 1-4
Limits of testing .......................................... 1-5
Ultrasonic wall thickness measurement ...... 1-5
Effect of the test objects material .............. 1-5
Effect of temperature variations .................. 1-6
Measurement of remaining wall
thickness .................................................... 1-6
Ultrasonic evaluation of flaws ..................... 1-6
Flaw boundary method ................................ 1-6
Echo display comparison method ............... 1-7
1.3 The USM 35X family.................................. 1-8
The different instrument versions................ 1-8
Special features .......................................... 1-9
1.4 How to use this manual .......................... 1-10
1.5 Layout and presentation in this
manual ..................................................... 1-11
Attention and Note symbols ...................... 1-11
Listings ..................................................... 1-11
Operating steps......................................... 1-11
2 Standard package and
accessories ........................................ 2-1
2.1 Standard package ..................................... 2-3
2.2 Recommended accessories ..................... 2-5
Contents
1 Introduction ........................................ 1-1
1.1 Safety information..................................... 1-2
Batteries...................................................... 1-2
Software ...................................................... 1-2
Defects/errors and exceptional stresses ..... 1-3
ultrasonic testing ...................................... 1-3
Preconditions for testing with
ultrasonic test equipment ............................ 1-3
Operator training.......................................... 1-4
Technical test requirements ........................ 1-4
Limits of testing .......................................... 1-5
Ultrasonic wall thickness measurement ...... 1-5
Effect of the test objects material .............. 1-5
Effect of temperature variations .................. 1-6
Measurement of remaining wall
thickness .................................................... 1-6
Ultrasonic evaluation of flaws ..................... 1-6
Flaw boundary method ................................ 1-6
Echo display comparison method ............... 1-7
1.3 The USM 35X family.................................. 1-8
The different instrument versions................ 1-8
Special features .......................................... 1-9
1.4 How to use this manual .......................... 1-10
1.5 Layout and presentation in this
manual ..................................................... 1-11
Attention and Note symbols ...................... 1-11
Listings ..................................................... 1-11
Operating steps......................................... 1-11
2 Standard package and
accessories ........................................ 2-1
2.1 Standard package ..................................... 2-3
2.2 Recommended accessories ..................... 2-5
0-2 Issue 01, 04/2005 Krautkramer USM 35X
Contents
3 Initial start-up...................................... 3-1
3.1 Power supply ............................................. 3-2
Operation using the power supply unit ........ 3-2
Operation using batteries ............................ 3-3
Charging the batteries ................................. 3-5
3.2 Connecting a probe .................................. 3-7
3.3 Starting the USM 35X ................................ 3-8
Switching on................................................ 3-8
Reset .......................................................... 3-8
Information lines in the startup screen........ 3-8
4 Principles of operation ...................... 4-1
4.1 Operators controls ................................... 4-2
4.2 Screen display........................................... 4-3
Functions on the display ............................. 4-4
Other displays ............................................. 4-5
4.3 Keys and rotary knobs .............................. 4-6
Function keys ............................................. 4-6
On/Off key .................................................. 4-6
Special keys ............................................... 4-7
Rotary knobs ............................................... 4-8
4.4 Operational concept .................................. 4-8
Setting the functions ................................... 4-9
4.5 Important basic settings ......................... 4-10
Selecting the language.............................. 4-10
Selecting units .......................................... 4-11
Setting the date......................................... 4-12
Setting the time......................................... 4-13
4.6 Basic settings of the display .................. 4-14
Selecting the color scheme....................... 4-14
Setting the lighting .................................... 4-14
Contents
3 Initial start-up...................................... 3-1
3.1 Power supply ............................................. 3-2
Operation using the power supply unit ........ 3-2
Operation using batteries ............................ 3-3
3.2 Connecting a probe .................................. 3-7
3.3 Starting the USM 35X ................................ 3-8
Switching on................................................ 3-8
Reset .......................................................... 3-8
Information lines in the startup screen........ 3-8
4 Principles of operation ...................... 4-1
4.1 Operators controls ................................... 4-2
4.2 Screen display........................................... 4-3
Functions on the display ............................. 4-4
Other displays ............................................. 4-5
4.3 Keys and rotary knobs .............................. 4-6
Function keys ............................................. 4-6
On/Off key .................................................. 4-6
Special keys ............................................... 4-7
Rotary knobs ............................................... 4-8
4.4 Operational concept .................................. 4-8
Setting the functions ................................... 4-9
4.5 Important basic settings ......................... 4-10
Selecting the language.............................. 4-10
Selecting units .......................................... 4-11
Setting the date......................................... 4-12
Setting the time......................................... 4-13
4.6 Basic settings of the display .................. 4-14
Selecting the color scheme....................... 4-14
Setting the lighting .................................... 4-14
Contents
5 Operation ............................................ 5-1
5.1 Overview of the functions......................... 5-2
Function groups first operating level ........... 5-3
Function groups second operating level ...... 5-3
Function groups third operating level .......... 5-4
5.2 Setting the gain ......................................... 5-5
Defining the dB incrementation for gain ...... 5-5
5.3 Adjusting the display range
(function group BASE) .............................. 5-6
RANGE (Display range) .............................. 5-6
MTLVEL (Sound velocity) ........................... 5-7
D-DELAY (Display starting point) ................ 5-7
P-DELAY (Probe delay) ............................... 5-8
5.4 Adjusting the pulser
(function group PULS) .............................. 5-9
DAMPING (Probe matching) ....................... 5-9
POWER (Intensity) ................................... 5-10
DUAL (Pulser-receiver separation) ............ 5-10
PRF-MOD (Pulse repetition frequency) ..... 5-11
5.5 Adjusting the receiver
(function group RECV) ............................ 5-11
FINE G (Fine adjustment of gain) ............. 5-12
dBSTEP.................................................... 5-12
REJECT .................................................... 5-12
FREQU (Frequency range) ........................ 5-13
RECTIFY (Rectification) ............................ 5-13
5.6 Setting the gates
(function groups aGAT and bGAT) ......... 5-14
Tasks of the gates..................................... 5-14
aLOGIC/bLOGIC (Evaluation logic of
the gates) .................................................. 5-15
aSTART/bSTART (Starting points of
the gates) .................................................. 5-16
aWIDTH/bWIDTH (Width of the gates) ...... 5-16
aTHRSH/bTHRSH (Response and
measurement threshold of the gates) ........ 5-16
Contents
5 Operation ............................................ 5-1
5.1 Overview of the functions......................... 5-2
Function groups first operating level ........... 5-3
Function groups second operating level ...... 5-3
Function groups third operating level .......... 5-4
5.2 Setting the gain ......................................... 5-5
Defining the dB incrementation for gain ...... 5-5
(function group BASE) .............................. 5-6
RANGE (Display range) .............................. 5-6
MTLVEL (Sound velocity) ........................... 5-7
D-DELAY (Display starting point) ................ 5-7
P-DELAY (Probe delay) ............................... 5-8
(function group PULS) .............................. 5-9
DAMPING (Probe matching) ....................... 5-9
POWER (Intensity) ................................... 5-10
DUAL (Pulser-receiver separation) ............ 5-10
PRF-MOD (Pulse repetition frequency) ..... 5-11
(function group RECV) ............................ 5-11
FINE G (Fine adjustment of gain) ............. 5-12
dBSTEP.................................................... 5-12
REJECT .................................................... 5-12
FREQU (Frequency range) ........................ 5-13
RECTIFY (Rectification) ............................ 5-13
(function groups aGAT and bGAT) ......... 5-14
Tasks of the gates..................................... 5-14
aLOGIC/bLOGIC (Evaluation logic of
the gates) .................................................. 5-15
aSTART/bSTART (Starting points of
the gates) .................................................. 5-16
aWIDTH/bWIDTH (Width of the gates) ...... 5-16
aTHRSH/bTHRSH (Response and
measurement threshold of the gates) ........ 5-16
Contents
5.7 Calibrating the USM 35X......................... 5-17
Calibrating the display range ..................... 5-17
Choosing the measuring point ................... 5-17
Calibration with straight- and
angle-beam probes .................................... 5-18
Calibration with dual-element (TR)
probes ....................................................... 5-21
5.8 Measuring ................................................ 5-23
General notes............................................ 5-23
5.9 Measurement of dB difference
(function group REF) .............................. 5-25
Recording a reference echo ...................... 5-26
Deleting a reference echo ......................... 5-26
Echo comparison ...................................... 5-27
5.10Classification of welds
(function group AWS) .............................. 5-28
Rating of welds according to AWS ............ 5-28
5.11Calculation of flaw position
(function group TRIG) ............................. 5-31
ANGLE (Angle of incidence) ................... 5-32
X-VALUE (X-value of the probe) ................ 5-32
COLOR ..................................................... 5-33
THICKNE (Material thickness) .................. 5-33
DIAMET (Outside diameter of the test
object) ....................................................... 5-33
5.12Data saving
(function group MEM) ............................. 5-34
Storing a data set ...................................... 5-35
Deleting a data set .................................... 5-35
Deleting all data set .................................. 5-36
Recalling a stored data set ....................... 5-36
5.13Dataset management
(function group DATA) ............................. 5-38
TESTINF (Storing additional
information) ............................................... 5-39
PREVIEW (Dataset preview) .................... 5-41
DIR (Dataset directory) ............................. 5-42
SETTING (Function list) ............................ 5-42
Contents
5.7 Calibrating the USM 35X......................... 5-17
Calibrating the display range ..................... 5-17
Choosing the measuring point ................... 5-17
angle-beam probes .................................... 5-18
Calibration with dual-element (TR)
probes ....................................................... 5-21
5.8 Measuring ................................................ 5-23
General notes............................................ 5-23
(function group REF) .............................. 5-25
Recording a reference echo ...................... 5-26
Deleting a reference echo ......................... 5-26
Echo comparison ...................................... 5-27
5.10Classification of welds
(function group AWS) .............................. 5-28
Rating of welds according to AWS ............ 5-28
5.11Calculation of flaw position
(function group TRIG) ............................. 5-31
ANGLE (Angle of incidence) ................... 5-32
X-VALUE (X-value of the probe) ................ 5-32
COLOR ..................................................... 5-33
THICKNE (Material thickness) .................. 5-33
DIAMET (Outside diameter of the test
object) ....................................................... 5-33
5.12Data saving
(function group MEM) ............................. 5-34
Storing a data set ...................................... 5-35
Deleting a data set .................................... 5-35
Deleting all data set .................................. 5-36
Recalling a stored data set ....................... 5-36
5.13Dataset management
(function group DATA) ............................. 5-38
TESTINF (Storing additional
information) ............................................... 5-39
PREVIEW (Dataset preview) .................... 5-41
DIR (Dataset directory) ............................. 5-42
SETTING (Function list) ............................ 5-42
Contents
5.14Configuring the USM 35X for a test
application ............................................... 5-43
TOF (Selecting the measuring point) ......... 5-44
S-DISP (Zoomed display of reading) ......... 5-46
MAGNIFY (Gate spreading) ...................... 5-48
A-Scan (Setting the A-scan) ..................... 5-48
Configuring the measurement line ............. 5-49
Setting the display .................................... 5-50
FILLED (Echo display mode) .................... 5-51
VGA .......................................................... 5-51
SCHEME .................................................. 5-51
LIGHT (LCD backlight) .............................. 5-52
SCALE (Configuring the measurement
line) ........................................................... 5-52
5.15General configuration ............................. 5-53
DIALOG (Selecting the language) ............. 5-53
UNIT (Selecting units of measurement) .... 5-54
BAUD-R (Baud rate for transmission) ........ 5-55
PRINTER (Printer for test report) .............. 5-55
COPYMOD (Assignment of the key) ... 5-55
TIME/DATE (Setting the time and date) .... 5-56
ANAMOD .................................................. 5-57
HORN........................................................ 5-58
EVAMOD (Echo evaluation) ...................... 5-58
5.16Other functions with special keys .......... 5-59
Freeze ....................................................... 5-59
Zooming the echo display ......................... 5-59
The key ............................................... 5-59
5.17Status symbols and LEDs ...................... 5-60
Status symbols ......................................... 5-60
LEDs ......................................................... 5-60
5.18Distance-amplitude curve
(only USM 35X DAC and USM 35S) ........ 5-61
DACMOD (Activating DAC/TCG) ............... 5-62
DACECHO (Recording reference curve) .... 5-63
T-CORR (Sensitivity correction) ................ 5-64
OFFSET (Distance of multiple DAC) ......... 5-65
Echo evaluation with DAC......................... 5-65
Contents
5.14Configuring the USM 35X for a test
application ............................................... 5-43
TOF (Selecting the measuring point) ......... 5-44
S-DISP (Zoomed display of reading) ......... 5-46
MAGNIFY (Gate spreading) ...................... 5-48
A-Scan (Setting the A-scan) ..................... 5-48
Configuring the measurement line ............. 5-49
Setting the display .................................... 5-50
FILLED (Echo display mode) .................... 5-51
VGA .......................................................... 5-51
SCHEME .................................................. 5-51
LIGHT (LCD backlight) .............................. 5-52
SCALE (Configuring the measurement
line) ........................................................... 5-52
5.15General configuration ............................. 5-53
DIALOG (Selecting the language) ............. 5-53
UNIT (Selecting units of measurement) .... 5-54
BAUD-R (Baud rate for transmission) ........ 5-55
PRINTER (Printer for test report) .............. 5-55
COPYMOD (Assignment of the key) ... 5-55
TIME/DATE (Setting the time and date) .... 5-56
ANAMOD .................................................. 5-57
HORN........................................................ 5-58
EVAMOD (Echo evaluation) ...................... 5-58
5.16Other functions with special keys .......... 5-59
Freeze ....................................................... 5-59
Zooming the echo display ......................... 5-59
The key ............................................... 5-59
5.17Status symbols and LEDs ...................... 5-60
Status symbols ......................................... 5-60
LEDs ......................................................... 5-60
5.18Distance-amplitude curve
(only USM 35X DAC and USM 35S) ........ 5-61
DACMOD (Activating DAC/TCG) ............... 5-62
Contents
5.19Distance-amplitude curve according
to JIS Z3060-2002 (only USM 35X DAC
and USM 35S) .......................................... 5-66
DACMOD (Activating DAC according
to JIS) ....................................................... 5-67
BOLDLI (Choice of a registration curve) .... 5-70
5.20Evaluation according to the DGS
method (only USM 35X S) ...................... 5-71
Measuring with DGS ................................. 5-71
Selecting the DGS mode .......................... 5-73
Default settings for the DGS
measurement ............................................ 5-73
Recording the reference echo and
displaying the DGS curve ......................... 5-75
Evaluation of reflectors ............................. 5-76
Transfer correction..................................... 5-78
Sound attenuation ..................................... 5-78
Locks, error messages ............................. 5-81
Validity of the DGS method....................... 5-81
6 Documentation .................................. 6-1
6.1 Printing data .............................................. 6-2
Preparing the printer .................................... 6-2
Preparing the USM 35X .............................. 6-2
Printing........................................................ 6-3
6.2 Documentation with UltraDOC ................. 6-4
7 Maintenance and care ....................... 7-1
7.1 Care of the instrument .............................. 7-2
7.2 Care of the batteries .................................. 7-3
Care of the batteries.................................... 7-3
How to handle alkaline batteries.................. 7-4
7.3 Maintenance .............................................. 7-5
Contents
5.19Distance-amplitude curve according
to JIS Z3060-2002 (only USM 35X DAC
and USM 35S) .......................................... 5-66
DACMOD (Activating DAC according
to JIS) ....................................................... 5-67
BOLDLI (Choice of a registration curve) .... 5-70
5.20Evaluation according to the DGS
method (only USM 35X S) ...................... 5-71
Measuring with DGS ................................. 5-71
Selecting the DGS mode .......................... 5-73
Default settings for the DGS
measurement ............................................ 5-73
displaying the DGS curve ......................... 5-75
Evaluation of reflectors ............................. 5-76
Transfer correction..................................... 5-78
Sound attenuation ..................................... 5-78
Locks, error messages ............................. 5-81
Validity of the DGS method....................... 5-81
6 Documentation .................................. 6-1
6.1 Printing data .............................................. 6-2
Preparing the printer .................................... 6-2
Preparing the USM 35X .............................. 6-2
Printing........................................................ 6-3
6.2 Documentation with UltraDOC ................. 6-4
7 Maintenance and care ....................... 7-1
7.1 Care of the instrument .............................. 7-2
7.2 Care of the batteries .................................. 7-3
Care of the batteries.................................... 7-3
How to handle alkaline batteries.................. 7-4
7.3 Maintenance .............................................. 7-5
Contents
7.4 Recycling ................................................... 7-6
General view of the device.......................... 7-6
Materials for separate disposal ................... 7-8
Further materials and components ........... 7-10
Recycling data of master device............... 7-12
8 Interfaces and peripherals ................ 8-1
8.1 Interfaces ................................................... 8-2
8.2 I/O interface ............................................... 8-4
Contact assignment of the
LEMO-1-B socket ....................................... 8-5
8.3 RS 232 interface ........................................ 8-6
Contact assignment of the Sub-D socket ... 8-6
8.4 RGB interface............................................. 8-7
8.5 Data exchange ........................................... 8-8
Connecting a printer or a PC ....................... 8-8
Activation of serial communication ............. 8-8
Printing data ................................................ 8-9
Technical Specifications
according to EN 12668-1
8.6 Remote control .......................................... 8-9
Syntax and timing ..................................... 8-11
Functions and remote control codes ......... 8-17
Other remote control codes....................... 8-24
Control codes for the rotary knobs/
function keys ............................................ 8-26
9 Appendix ............................................ 9-1
9.1 Function directory..................................... 9-2
9.2 EC declaration of conformity ................... 9-7
9.3 Manufacturer/Service addresses .............. 9-8
9.4 Spare parts list ........................................ 9-10
10 Changes ........................................... 10-1
11 Index ................................................. 11-1
Contents
7.4 Recycling ................................................... 7-6
General view of the device.......................... 7-6
Materials for separate disposal ................... 7-8
Further materials and components ........... 7-10
Recycling data of master device............... 7-12
8 Interfaces and peripherals ................ 8-1
8.1 Interfaces ................................................... 8-2
8.2 I/O interface ............................................... 8-4
Contact assignment of the
LEMO-1-B socket ....................................... 8-5
8.3 RS 232 interface ........................................ 8-6
Contact assignment of the Sub-D socket ... 8-6
8.4 RGB interface............................................. 8-7
8.5 Data exchange ........................................... 8-8
Connecting a printer or a PC ....................... 8-8
Activation of serial communication ............. 8-8
Printing data ................................................ 8-9
Technical Specifications
according to EN 12668-1
8.6 Remote control .......................................... 8-9
Syntax and timing ..................................... 8-11
Functions and remote control codes ......... 8-17
Other remote control codes....................... 8-24
function keys ............................................ 8-26
9 Appendix ............................................ 9-1
9.1 Function directory..................................... 9-2
9.2 EC declaration of conformity ................... 9-7
9.3 Manufacturer/Service addresses .............. 9-8
9.4 Spare parts list ........................................ 9-10
10 Changes ........................................... 10-1
11 Index ................................................. 11-1
Introduction 1
Introduction 1
Introduction Safety information
1.1 Safety information
The USM 35X has been designed and tested according
to DIN EN 61 010 Part 1, 2002, Safety requirements for
electrical measuring, control and lab equipment, and
was technically in perfectly safe and faultless condition
when leaving the manufacturing works.
In order to maintain this condition and to ensure a safe
operation, you should urgently read the following safety
information before putting the instrument into operation.
A Attention:
The USM 35X is an instrument for materials testing.
Any use for medical applications or other purposes
is not allowed!
The USM 35X may only be used in industrial envi-
ronments!
The USM 35X is waterproof according to IP 66. The
USM 35X can be operated with batteries or a power
supply unit.
The power supply unit has the electrical safety class II.
Batteries
For the battery operation of the USM 35X, we recom-
mend the use of a lithium-ion battery. The operation
using alkaline batteries, NiMH or NiCad cells is likewise
possible. You should only use the products recom-
mended by us for the battery operation.
You can charge the lithium-ion battery within the instru-
ment itself or in an external battery charger. If you want
to use NiMH or NiCad cells, you have to charge them in
an external battery charger.
As soon as you connect the power supply unit to the
USM 35X, the battery power supply is interrupted. If a
lithium-ion battery is inserted, the charging process
starts automatically when you connect the instrument
to the mains supply. Please refer to chapter 3.1 on
power supply, and to chapter 7 on how to handle
batteries.
Software
According to the current state of the art, software is
never completely free from errors. Before using any
software-controlled test equipment, please make sure
1.1 Safety information
The USM 35X has been designed and tested according
to DIN EN 61 010 Part 1, 2002, Safety requirements for
electrical measuring, control and lab equipment, and
was technically in perfectly safe and faultless condition
when leaving the manufacturing works.
In order to maintain this condition and to ensure a safe
operation, you should urgently read the following safety
information before putting the instrument into operation.
A Attention:
The USM 35X is an instrument for materials testing.
Any use for medical applications or other purposes
is not allowed!
The USM 35X may only be used in industrial envi-
ronments!
The USM 35X is waterproof according to IP 66. The
USM 35X can be operated with batteries or a power
supply unit.
The power supply unit has the electrical safety class II.
Batteries
For the battery operation of the USM 35X, we recom-
mend the use of a lithium-ion battery. The operation
using alkaline batteries, NiMH or NiCad cells is likewise
possible. You should only use the products recom-
mended by us for the battery operation.
You can charge the lithium-ion battery within the instru-
ment itself or in an external battery charger. If you want
to use NiMH or NiCad cells, you have to charge them in
an external battery charger.
As soon as you connect the power supply unit to the
USM 35X, the battery power supply is interrupted. If a
lithium-ion battery is inserted, the charging process
starts automatically when you connect the instrument
to the mains supply. Please refer to chapter 3.1 on
power supply, and to chapter 7 on how to handle
batteries.
Software
According to the current state of the art, software is
never completely free from errors. Before using any
software-controlled test equipment, please make sure
that the required functions operate perfectly in the in-
tended combination.
If you have any questions about the use of your test
equipment, please contact your nearest representative
of GE Inspection Technologies.
Defects/errors and exceptional stresses
If you have reason to believe that a safe operation of
your USM 35X is no longer possible, you have to dis-
connect the instrument and secure it against uninten-
tional reconnection. Remove the batteries if necessary.
A safe operation is e.g. no longer possible
if the instrument shows visible damages,
if the instrument no longer operates perfectly,
after prolonged storage under adverse conditions
(e.g. exceptional temperatures and/or especially high
air humidity, or corrosive environmental conditions),
after being subjected to heavy stresses during trans-
portation.
ultrasonic testing
Please read the following information before using your
USM 35X. It is important that you understand and ob-
serve this information to avoid any operator errors that
might lead to false test results. This could result in per-
sonal injuries or damages to property.
Preconditions for testing with ultrasonic
test equipment
This operating manual contains essential information on
how to operate your test equipment. In addition, there
are a number of factors which affect the test results. A
description of these factors would go beyond the scope
of an operating manual. The following list therefore only
mentions the three most important conditions for a safe
and reliable ultrasonic inspection:
the operator training
the knowledge of special technical test requirements
and limits
the choice of appropriate test equipment.
that the required functions operate perfectly in the in-
tended combination.
If you have any questions about the use of your test
equipment, please contact your nearest representative
of GE Inspection Technologies.
Defects/errors and exceptional stresses
If you have reason to believe that a safe operation of
your USM 35X is no longer possible, you have to dis-
connect the instrument and secure it against uninten-
tional reconnection. Remove the batteries if necessary.
A safe operation is e.g. no longer possible
if the instrument shows visible damages,
if the instrument no longer operates perfectly,
after prolonged storage under adverse conditions
(e.g. exceptional temperatures and/or especially high
air humidity, or corrosive environmental conditions),
after being subjected to heavy stresses during trans-
portation.
ultrasonic testing
Please read the following information before using your
USM 35X. It is important that you understand and ob-
serve this information to avoid any operator errors that
might lead to false test results. This could result in per-
sonal injuries or damages to property.
Preconditions for testing with ultrasonic
test equipment
This operating manual contains essential information on
how to operate your test equipment. In addition, there
are a number of factors which affect the test results. A
description of these factors would go beyond the scope
of an operating manual. The following list therefore only
mentions the three most important conditions for a safe
and reliable ultrasonic inspection:
the operator training
the knowledge of special technical test requirements
and limits
the choice of appropriate test equipment.
Introduction Important information on ultrasonic testing
Operator training
The operation of an ultrasonic test device requires a
proper training in ultrasonic test methods.
A proper training comprises for example adequate
knowledge of:
the theory of sound propagation
the effects of sound velocity in the test material
the behavior of the sound wave at interfaces be-
tween different materials
the propagation of the sound beam
the influence of sound attenuation in the test object
and the influence of surface quality of the test ob-
ject.
Lack of such knowledge could lead to false test results
with unforeseeable consequences. You can contact for
example NDT societies or organizations in your country
(DGZfP in Germany; ASNT in the USA), or also GE
Inspection Technologies, for information concerning
existing possibilities for the training of ultrasonic in-
spectors as well as on the qualifications and certifi-
cates that can finally be obtained.
Technical test requirements
Every ultrasonic test is subject to specific technical
test requirements. The most important ones are:
the definition of the scope of inspection
the choice of the appropriate test method
the consideration of material properties
the determination of limits for recording and
evaluation.
It is the task of those with overall responsibility for test-
ing to ensure that the inspector is fully informed about
these requirements. The best basis for such information
is experience with identical test objects. It is also es-
sential that the relevant test specifications be clearly
and completely understood by the inspector.
GE Inspection Technologies regularly holds specialized
training courses in the field of ultrasonic testing. The
scheduled dates for these courses will be given to you
on request.
Operator training
The operation of an ultrasonic test device requires a
proper training in ultrasonic test methods.
A proper training comprises for example adequate
knowledge of:
the theory of sound propagation
the effects of sound velocity in the test material
the behavior of the sound wave at interfaces be-
tween different materials
the propagation of the sound beam
the influence of sound attenuation in the test object
and the influence of surface quality of the test ob-
ject.
Lack of such knowledge could lead to false test results
with unforeseeable consequences. You can contact for
example NDT societies or organizations in your country
(DGZfP in Germany; ASNT in the USA), or also GE
Inspection Technologies, for information concerning
existing possibilities for the training of ultrasonic in-
spectors as well as on the qualifications and certifi-
cates that can finally be obtained.
Technical test requirements
Every ultrasonic test is subject to specific technical
test requirements. The most important ones are:
the definition of the scope of inspection
the choice of the appropriate test method
the consideration of material properties
the determination of limits for recording and
evaluation.
It is the task of those with overall responsibility for test-
ing to ensure that the inspector is fully informed about
these requirements. The best basis for such information
is experience with identical test objects. It is also es-
sential that the relevant test specifications be clearly
and completely understood by the inspector.
GE Inspection Technologies regularly holds specialized
training courses in the field of ultrasonic testing. The
scheduled dates for these courses will be given to you
on request.
Limits of testing
The information obtained from ultrasonic tests only
refers to those parts of the test object which are
covered by the sound beam of the probe used.
Any conclusions from the tested parts to be applied to
the untested parts of the test object should be made
with extreme caution.
Such conclusions are generally only possible in cases
where extensive experience and proven methods of
statistical data acquisition are available.
The sound beam can be completely reflected from
boundary surfaces within the test object so that flaws
and reflection points lying deeper remain undetected. It
is therefore important to make sure that all areas to be
tested in the test object are covered by the sound beam.
Ultrasonic wall thickness measurement
All ultrasonic wall thickness measurements are based
on a time-of-flight measurement. Accurate measure-
ment results require a constant sound velocity in the
test object. In test objects made of steel, even with
varying alloying constituents, this condition is mostly
fulfilled. The variation in sound velocity is so slight that
it is only of importance for high-precision measure-
ments. In other materials, e.g. nonferrous metals or
plastics, the sound velocity variations may be even
larger and thus affect the measuring accuracy.
Effect of the test objects material
If the test objects material is not homogeneous, the
sound may propagate at different sound velocities in
different parts of the test objects. An average sound
velocity should then be taken into account for the range
calibration. This is achieved by means of a reference
block whose sound velocity corresponds to the average
sound velocity of the test object.
If substantial sound velocity variations are to be ex-
pected, then the instrument calibration should be read-
justed to the actual sound velocity values at shorter
time intervals. Failure to do so may lead to false thick-
ness readings.
Limits of testing
The information obtained from ultrasonic tests only
refers to those parts of the test object which are
covered by the sound beam of the probe used.
Any conclusions from the tested parts to be applied to
the untested parts of the test object should be made
with extreme caution.
Such conclusions are generally only possible in cases
where extensive experience and proven methods of
statistical data acquisition are available.
The sound beam can be completely reflected from
boundary surfaces within the test object so that flaws
and reflection points lying deeper remain undetected. It
is therefore important to make sure that all areas to be
tested in the test object are covered by the sound beam.
Ultrasonic wall thickness measurement
All ultrasonic wall thickness measurements are based
on a time-of-flight measurement. Accurate measure-
ment results require a constant sound velocity in the
test object. In test objects made of steel, even with
varying alloying constituents, this condition is mostly
fulfilled. The variation in sound velocity is so slight that
it is only of importance for high-precision measure-
ments. In other materials, e.g. nonferrous metals or
plastics, the sound velocity variations may be even
larger and thus affect the measuring accuracy.
Effect of the test objects material
If the test objects material is not homogeneous, the
sound may propagate at different sound velocities in
different parts of the test objects. An average sound
velocity should then be taken into account for the range
calibration. This is achieved by means of a reference
block whose sound velocity corresponds to the average
sound velocity of the test object.
If substantial sound velocity variations are to be ex-
pected, then the instrument calibration should be read-
justed to the actual sound velocity values at shorter
time intervals. Failure to do so may lead to false thick-
ness readings.
Effect of temperature variations
The sound velocity within the test object also varies as
a function of the materials temperature. This can cause
appreciable errors in measurements if the instrument
has been calibrated on a cold reference block and is
then used on a warm or hot test object. Such measure-
ment errors can be avoided either by warming the refer-
ence block to the same temperature before calibrating,
or by using a correction factor obtained from tables.
Measurement of remaining wall thickness
The measurement of the remaining wall thickness on
plant components, e.g. pipes, tanks and reaction ves-
sels of all types which are corroded or eroded from the
inside, requires a perfectly suitable gauge and special
care in handling the probe.
The inspectors should always be informed about the
corresponding nominal wall thicknesses and the likely
amount of wall thickness losses.
Ultrasonic evaluation of flaws
In present-day test practice, there are basically two
different methods of flaw evaluation:
If the diameter of the sound beam is smaller than the
extent of the flaw, then the beam can be used to ex-
plore the boundaries of the flaw and thus determine its
area.
If, however, the diameter of the sound beam is larger
than the size of the flaw, the maximum echo response
from the flaw must be compared with the maximum
echo response from an artificial flaw provided for com-
parison purposes.
Flaw boundary method
The smaller the diameter of the probes sound beam,
the more accurately the boundaries (and therefore the
flaw area) can be determined by the flaw boundary
method. If, however, the sound beam is relatively
broad, the flaw area determined can substantially differ
from the actual flaw area. Care should therefore be
taken to select a probe which will give a sufficiently
narrow beam at the position of the flaw.
Effect of temperature variations
The sound velocity within the test object also varies as
a function of the materials temperature. This can cause
appreciable errors in measurements if the instrument
has been calibrated on a cold reference block and is
then used on a warm or hot test object. Such measure-
ment errors can be avoided either by warming the refer-
ence block to the same temperature before calibrating,
or by using a correction factor obtained from tables.
Measurement of remaining wall thickness
The measurement of the remaining wall thickness on
plant components, e.g. pipes, tanks and reaction ves-
sels of all types which are corroded or eroded from the
inside, requires a perfectly suitable gauge and special
care in handling the probe.
The inspectors should always be informed about the
corresponding nominal wall thicknesses and the likely
amount of wall thickness losses.
Ultrasonic evaluation of flaws
In present-day test practice, there are basically two
different methods of flaw evaluation:
If the diameter of the sound beam is smaller than the
extent of the flaw, then the beam can be used to ex-
plore the boundaries of the flaw and thus determine its
area.
If, however, the diameter of the sound beam is larger
than the size of the flaw, the maximum echo response
from the flaw must be compared with the maximum
echo response from an artificial flaw provided for com-
parison purposes.
Flaw boundary method
The smaller the diameter of the probes sound beam,
the more accurately the boundaries (and therefore the
flaw area) can be determined by the flaw boundary
method. If, however, the sound beam is relatively
broad, the flaw area determined can substantially differ
from the actual flaw area. Care should therefore be
taken to select a probe which will give a sufficiently
narrow beam at the position of the flaw.
Echo display comparison method
The echo from a small, natural flaw is usually smaller
than the echo from an artificial comparison flaw, e.g.
circular disc flaw of the same size. This is due, for in-
stance, to the roughness of the surface of a natural
flaw, or to the fact that the beam does not impinge on it
at right angles.
If this fact is not taken into account when evaluating
natural flaws, there is a danger of underestimating their
magnitude.
In the case of very jagged or fissured flaws, e.g. shrink
holes in castings, it may be that the sound scattering
occurring at the boundary surface of the flaw is so
strong that no echo at all is produced. In such cases, a
different evaluation method should be chosen, e.g. use
of the backwall echo attenuation in the evaluation.
The distance sensitivity of the flaw echo plays an im-
portant part when testing large components. Attention
should be paid here to choosing artificial comparison
flaws which are as far as possible governed by the
same distance laws as the natural flaws to be evalu-
ated.
The ultrasonic wave is attenuated in any material. This
sound attenuation is very low, e.g. in parts made of
fine-grained steel, likewise in many small parts made of
other materials. However, if the sound wave travels
larger distances through the material, a high cumulative
sound attenuation can result even with small attenua-
tion coefficients. There is then a danger that echoes
from natural flaws appear too small. For this reason, an
estimate must always be made of the effects of attenu-
ation on the evaluation result and taken into account if
applicable.
If the test object has a rough surface, part of the inci-
dent sound energy will be scattered at its surface and
is not available for the test. The larger this initial scat-
tering, the smaller the flaw echoes appear, and the
more errors occur in the evaluation result.
It is therefore important to take the effect of the test
objects surfaces on the height of the echo into account
(transfer correction).
Echo display comparison method
The echo from a small, natural flaw is usually smaller
than the echo from an artificial comparison flaw, e.g.
circular disc flaw of the same size. This is due, for in-
stance, to the roughness of the surface of a natural
flaw, or to the fact that the beam does not impinge on it
at right angles.
If this fact is not taken into account when evaluating
natural flaws, there is a danger of underestimating their
magnitude.
In the case of very jagged or fissured flaws, e.g. shrink
holes in castings, it may be that the sound scattering
occurring at the boundary surface of the flaw is so
strong that no echo at all is produced. In such cases, a
different evaluation method should be chosen, e.g. use
of the backwall echo attenuation in the evaluation.
The distance sensitivity of the flaw echo plays an im-
portant part when testing large components. Attention
should be paid here to choosing artificial comparison
flaws which are as far as possible governed by the
same distance laws as the natural flaws to be evalu-
ated.
The ultrasonic wave is attenuated in any material. This
sound attenuation is very low, e.g. in parts made of
fine-grained steel, likewise in many small parts made of
other materials. However, if the sound wave travels
larger distances through the material, a high cumulative
sound attenuation can result even with small attenua-
tion coefficients. There is then a danger that echoes
from natural flaws appear too small. For this reason, an
estimate must always be made of the effects of attenu-
ation on the evaluation result and taken into account if
applicable.
If the test object has a rough surface, part of the inci-
dent sound energy will be scattered at its surface and
is not available for the test. The larger this initial scat-
tering, the smaller the flaw echoes appear, and the
more errors occur in the evaluation result.
It is therefore important to take the effect of the test
objects surfaces on the height of the echo into account
(transfer correction).
Introduction The USM 35X family
1.3 The USM 35X family
The USM 35X is a lightweight and compact ultrasonic
flaw detector especially suitable for
locating and evaluating material defects,
measuring wall thicknesses,
saving and documenting test results.
With its frequency range from 0.5 to 20 MHz and a
maximum calibration range of 10 m (steel), the USM35X
is designed for use on large workpieces and in high-
resolution measurements.
The different instrument versions
The USM 35X is available in several versions which are
desgined for different applications:
USM 35X
Standard version for universal ultrasonic test applica-
tions.
USM 35X DAC
The multiple DAC curves and time-corrected gain
enable a field-oriented echo amplitude evaluation
according to almost all international test specifica-
tions.
USM 35X S
DGS evaluation mode in addition to multiple DAC
curves and TCG.
DGS curves are stored for all narrow-band single-
element probes; amplitude evaluation is carried out
either in dB above DAC curve or equivalent reflector
size (ERS).
Data Logger option
This option is available for all USM 35X versions and
is used for the recording and documentation of thick-
ness readings.
1.3 The USM 35X family
The USM 35X is a lightweight and compact ultrasonic
flaw detector especially suitable for
locating and evaluating material defects,
measuring wall thicknesses,
saving and documenting test results.
With its frequency range from 0.5 to 20 MHz and a
maximum calibration range of 10 m (steel), the USM35X
is designed for use on large workpieces and in high-
resolution measurements.
The different instrument versions
The USM 35X is available in several versions which are
desgined for different applications:
USM 35X
Standard version for universal ultrasonic test applica-
tions.
USM 35X DAC
The multiple DAC curves and time-corrected gain
enable a field-oriented echo amplitude evaluation
according to almost all international test specifica-
tions.
USM 35X S
DGS evaluation mode in addition to multiple DAC
curves and TCG.
DGS curves are stored for all narrow-band single-
element probes; amplitude evaluation is carried out
either in dB above DAC curve or equivalent reflector
size (ERS).
Data Logger option
This option is available for all USM 35X versions and
is used for the recording and documentation of thick-
ness readings.
Special features
low weight (2.2 kg including lithium-ion battery) and
compact size
waterproof instrument case with protection class
IP 66
long operating time (> 12 hours) by means of lithium-
ion battery with internal and external charging possi-
bility
handy equipped with a non-slip, ratcheting prop-up
stand, also used as handle
rotary knobs for direct adjustment of gain as well as
for changing the currently selected function
two independant gates for accurate wall thickness
measurements from the workpiece surface up to the
first echo, or between two backwall echoes, including
measurement on coated workpieces with a resolution
of 0.01 mm (up to 100 mm), referred to steel
magnify gate: spreading of the gate range over the
entire screen width
5.7", 1/4 VGA-TFT color display to display the digi-
tized signals (320 240 pixels, 115 86 mm )
VGA interface for the connection of an external
monitor
color display of gates for an easier distinction
easily recognizable reflection geometry when using
angle-beam probes by the variation of A-scan or
background color at every deflection point
data memory: 800 data sets, including alphanumeric
description, documentation possibility via a printer
increased calibration range: up to 9999 mm (steel),
depending on the frequency range
semiautomatic two point calibration
pulse repetition frequency variable in ten steps
to avoid phantom echoes when testing large
workpieces
choice of frequency range for the connected probe
signal display mode: full-wave rectification, positive
half-wave or negative halv-wave and radio frequency
display of 4 readings plus 1 reading zoomed in the
A-scan, user-configurable
Special features
low weight (2.2 kg including lithium-ion battery) and
compact size
waterproof instrument case with protection class
IP 66
long operating time (> 12 hours) by means of lithium-
ion battery with internal and external charging possi-
bility
handy equipped with a non-slip, ratcheting prop-up
stand, also used as handle
rotary knobs for direct adjustment of gain as well as
for changing the currently selected function
two independant gates for accurate wall thickness
measurements from the workpiece surface up to the
first echo, or between two backwall echoes, including
measurement on coated workpieces with a resolution
of 0.01 mm (up to 100 mm), referred to steel
magnify gate: spreading of the gate range over the
entire screen width
5.7", 1/4 VGA-TFT color display to display the digi-
tized signals (320 240 pixels, 115 86 mm )
VGA interface for the connection of an external
monitor
color display of gates for an easier distinction
easily recognizable reflection geometry when using
angle-beam probes by the variation of A-scan or
background color at every deflection point
data memory: 800 data sets, including alphanumeric
description, documentation possibility via a printer
increased calibration range: up to 9999 mm (steel),
depending on the frequency range
semiautomatic two point calibration
pulse repetition frequency variable in ten steps
to avoid phantom echoes when testing large
workpieces
choice of frequency range for the connected probe
signal display mode: full-wave rectification, positive
half-wave or negative halv-wave and radio frequency
display of 4 readings plus 1 reading zoomed in the
A-scan, user-configurable
Introduction How to use this manual
1.4 How to use this manual
The present operating manual applies to all instrument
versions of the USM 35X. Differences in the functions
or setting values are always marked.
Before operating the USM 35X for the first time, it is
absolutely necessary that you read the chapters 1, 3
and 4 of this manual. They will inform you about the
necessary preparations of the instrument, give you a
description of all keys and screen displays, and explain
the operating principle.
In doing this, you will avoid any errors or failures of the
instrument and be able to use the full range of instru-
ment functions.
You will find the latest changes to this operating manual
in chapter 10 Changes. It describes corrections that
have become necessary at short notice and have not
yet been included in the general manual. If no correc-
tions have become necessary, this chapter is empty.
The specifications/Technical Specifications according
to EN 12668-1 for the USM 35X family can be found in
the attachment at the end of this operating manual.
The Data Logger option, which can be applied to all
USM 35X versions, is described in a chapter of its own
at the end of the operating manual. All functions refer-
ring to the Data Logger and the tolerance monitor are
described here. At the same time, the standard operat-
ing manual applies to all other functions.
Introduction How to use this manual
1.4 How to use this manual
The present operating manual applies to all instrument
versions of the USM 35X. Differences in the functions
or setting values are always marked.
Before operating the USM 35X for the first time, it is
absolutely necessary that you read the chapters 1, 3
and 4 of this manual. They will inform you about the
necessary preparations of the instrument, give you a
description of all keys and screen displays, and explain
the operating principle.
In doing this, you will avoid any errors or failures of the
instrument and be able to use the full range of instru-
ment functions.
You will find the latest changes to this operating manual
in chapter 10 Changes. It describes corrections that
have become necessary at short notice and have not
yet been included in the general manual. If no correc-
tions have become necessary, this chapter is empty.
The specifications/Technical Specifications according
to EN 12668-1 for the USM 35X family can be found in
the attachment at the end of this operating manual.
The Data Logger option, which can be applied to all
USM 35X versions, is described in a chapter of its own
at the end of the operating manual. All functions refer-
ring to the Data Logger and the tolerance monitor are
described here. At the same time, the standard operat-
ing manual applies to all other functions.
Introduction Layout and presentation in this manual
1.5 Layout and presentation in
this manual
To make it easier for you to use this manual, all operat-
ing steps, notes, etc., are always presented in the
same way. This will help you find individual pieces of
information quickly.
Attention and Note symbols
A Attention:
The Attention symbol indicates peculiarities and spe-
cial aspects in the operation which could affect the
accuracy of the results.
H Note:
Note contains e.g. references to other chapters or spe-
cial recommendations for a function.
Listings
Listings are presented in the following form:
Variant A
Variant B
...
Operating steps
Operating steps appear as shown in the following ex-
ample:
Loosen the two screws at the bottom.
Remove the cover.
...
Introduction Layout and presentation in this manual
1.5 Layout and presentation in
this manual
To make it easier for you to use this manual, all operat-
ing steps, notes, etc., are always presented in the
same way. This will help you find individual pieces of
information quickly.
Attention and Note symbols
A Attention:
The Attention symbol indicates peculiarities and spe-
cial aspects in the operation which could affect the
accuracy of the results.
H Note:
Note contains e.g. references to other chapters or spe-
cial recommendations for a function.
Listings
Listings are presented in the following form:
Variant A
Variant B
...
Operating steps
Operating steps appear as shown in the following ex-
ample:
Loosen the two screws at the bottom.
Remove the cover.
...
Standard package and accessories 2
Standard package and accessories 2
Standard package and accessories
This chapter informs you about the standard package
and the accessories available for the USM 35X.
It describes
accessories included in the standard package,
recommended accessories.
This chapter informs you about the standard package
and the accessories available for the USM 35X.
It describes
accessories included in the standard package,
recommended accessories.
2.1 Standard package
Product code Description Order number
Ultrasonic testing kit
consisting of:
USM 35X Compact Ultrasonic Flaw Detector, basic version
with LEMO-1-TRIAX connectors 36 060
or
with BNC connectors 36 061
or
USM 35X DAC Compact Ultrasonic Flaw Detector, DAC version
or
or
USM 35X S Compact Ultrasonic Flaw Detector, DAC/TCG and
DGS evaluation with LEMO-1-TRIAX connectors 36 064
or
Standard package
2.1 Standard package
Ultrasonic testing kit
consisting of:
USM 35X Compact Ultrasonic Flaw Detector, basic version
or
or
USM 35X DAC Compact Ultrasonic Flaw Detector, DAC version
or
or
USM 35X S Compact Ultrasonic Flaw Detector, DAC/TCG and
DGS evaluation with LEMO-1-TRIAX connectors 36 064
or
Standard package
Standard package and accessories Standard package
UM 30 Transport case 35 654
AC power supply/battery charger 102 163
Operating manual in English 48 001
Standard package and accessories Standard package
UM 30 Transport case 35 654
AC power supply/battery charger 102 163
Operating manual in English 48 001
Standard package and accessories Recommended accessories
2.2 Recommended accessories
Operating manual in German 48 002
Operating manual in French 48 003
Operating manual in Spanish 48 004
Operating manual in Japanese 48 005
Operating manual in Chinese 48 006
LI-ION Li-Ion battery NI2020, 10.8 V, 6.6 Ah 102 208
DR36 Battery charger for external charging
of the Li-Ion battery 35 297
NCA 1-6 6 NiCd cells, 3 Ah (alternatively to Li-Ion) 25 810
Energy 16 Desk rapid charger for external charging
of NiMH or NiCd cells 101 729
UM 32 Protection bag including neck strap 35 655
UD 20 PC cable, 25-pin (PC), 9-pin (instrument) 32 291
Standard package and accessories Recommended accessories
2.2 Recommended accessories
Operating manual in German 48 002
Operating manual in French 48 003
Operating manual in Spanish 48 004
Operating manual in Japanese 48 005
Operating manual in Chinese 48 006
LI-ION Li-Ion battery NI2020, 10.8 V, 6.6 Ah 102 208
DR36 Battery charger for external charging
of the Li-Ion battery 35 297
NCA 1-6 6 NiCd cells, 3 Ah (alternatively to Li-Ion) 25 810
Energy 16 Desk rapid charger for external charging
of NiMH or NiCd cells 101 729
UM 32 Protection bag including neck strap 35 655
UD 30 Seiko Printer cable, 9-pin (instrument)/9-pin (printer) 18 495
UD 32 Epson Printer cable, 9-pin (instrument)/25-pin (printer) 34 944
Adapter 25/9-pin for printer cable UD 19-1 on USM 35X 16 121
Serial-to-parallel printer cable (Patton Model 2029) 101 761
Adapter cable RS232 USB 35 838
UM 25 Analog cable, 8-pin Lemo plug (instrument), open ended 35 268
UM 31 VGA adapter for connection of an external monitor 35 653
UM 28 D Option: Data Logger (retrofittable to all versions) 35 800
UM 200 W UltraDOC data communication software for USM 35 024
U 100 W UltraDOC 33 829
PZ-USM Calibration certificate according to EN 12668-1 35 263
Epson LX Matrix printer for mains operation, single sheet and
continuous stationary 17 995
Seiko DPU Thermal printer for mains and battery operation 17 993
Recommended accessories
UD 30 Seiko Printer cable, 9-pin (instrument)/9-pin (printer) 18 495
UD 32 Epson Printer cable, 9-pin (instrument)/25-pin (printer) 34 944
Adapter 25/9-pin for printer cable UD 19-1 on USM 35X 16 121
Serial-to-parallel printer cable (Patton Model 2029) 101 761
Adapter cable RS232 USB 35 838
UM 25 Analog cable, 8-pin Lemo plug (instrument), open ended 35 268
UM 31 VGA adapter for connection of an external monitor 35 653
UM 28 D Option: Data Logger (retrofittable to all versions) 35 800
UM 200 W UltraDOC data communication software for USM 35 024
U 100 W UltraDOC 33 829
PZ-USM Calibration certificate according to EN 12668-1 35 263
Epson LX Matrix printer for mains operation, single sheet and
continuous stationary 17 995
Seiko DPU Thermal printer for mains and battery operation 17 993
Recommended accessories
Initial start-up 3
Initial start-up 3
Initial start-up
Connecting the instrument
Connect the USM 35X to the mains socket-outlet using
the corresponding power supply unit. The plug recep-
tacle is at the top left of the USM 35X.
Push the Lemo plug of the power supply unit into the
plug receptacle until it snaps into place with a clearly
audible click.
Power supply
3.1 Power supply
The USM 35X can be operated with an external power
pack adaptor or with batteries.
You can connect the USM 35X to the mains supply
system even if it carries batteries. The battery power is
then automatically interrupted.
Operation using the power supply unit
Mains connection
The power supply unit is delivered with two different
power cables for Euro and USA standard.

Initial start-up
Connecting the instrument
Connect the USM 35X to the mains socket-outlet using
the corresponding power supply unit. The plug recep-
tacle is at the top left of the USM 35X.
Push the Lemo plug of the power supply unit into the
plug receptacle until it snaps into place with a clearly
audible click.
Power supply
3.1 Power supply
The USM 35X can be operated with an external power
pack adaptor or with batteries.
You can connect the USM 35X to the mains supply
system even if it carries batteries. The battery power is
then automatically interrupted.
Operation using the power supply unit
Mains connection
The power supply unit is delivered with two different
power cables for Euro and USA standard.

Initial start-up Power supply
When pulling off the Lemo plug, withdraw the metal
bushing on the plug first in order to release the lock.
The power supply unit is automatically set to any nomi-
nal voltage between 90 VAC and 240 VAC.
Operation using batteries
Use either a lithium-ion battery or 6 standard C-cells
(NiCad, NiMH, or alkaline cells) for the battery opera-
tion. We recommend the use of a lithium-ion battery. It
has a higher capacity and consequently ensures a
longer operating time of the instrument.
Inserting batteries
The battery compartment is situated at the instrument
back; the lid is fastened with 2 attachment screws.
Press the two attachment screws of the battery
compartment downward in order to loosen them.
Lift the lid off upward. To the right in the open battery
compartment, you will see two springs and several
connection pins.
Insert the battery into the battery compartment. To
do this, first press the right side of the battery
against the springs of the battery compartment.
Make sure that the socket on the right side of the
battery is connected with the connection pins in the
battery compartment.
Initial start-up Power supply
When pulling off the Lemo plug, withdraw the metal
bushing on the plug first in order to release the lock.
The power supply unit is automatically set to any nomi-
nal voltage between 90 VAC and 240 VAC.
Operation using batteries
Use either a lithium-ion battery or 6 standard C-cells
(NiCad, NiMH, or alkaline cells) for the battery opera-
tion. We recommend the use of a lithium-ion battery. It
has a higher capacity and consequently ensures a
longer operating time of the instrument.
Inserting batteries
The battery compartment is situated at the instrument
back; the lid is fastened with 2 attachment screws.
Press the two attachment screws of the battery
compartment downward in order to loosen them.
Lift the lid off upward. To the right in the open battery
compartment, you will see two springs and several
connection pins.
Insert the battery into the battery compartment. To
do this, first press the right side of the battery
against the springs of the battery compartment.
Make sure that the socket on the right side of the
battery is connected with the connection pins in the
battery compartment.
Initial start-up
or
Insert the batteries into the battery compartment and
check the right polarity.
Close the battery compartment and fasten the
attachment screws.
Checking the battery charge of lithium-ion batteries
The lithium-ion battery is equipped with a battery
charge indicator. The battery charge indicator is situated
at the front right of the battery. Four LEDs indicate the
charge level of battery. Check the battery charge before
inserting the battery into the instrument.
The number of LEDs that are on has the following
meaning:
4 LEDs battery charge 100 ... 76%
1 LED battery charge 25 ... 10%
1 LED flashing battery charge <10%
Power supply
Initial start-up
or
Insert the batteries into the battery compartment and
check the right polarity.
Close the battery compartment and fasten the
attachment screws.
Checking the battery charge of lithium-ion batteries
The lithium-ion battery is equipped with a battery
charge indicator. The battery charge indicator is situated
at the front right of the battery. Four LEDs indicate the
charge level of battery. Check the battery charge before
inserting the battery into the instrument.
The number of LEDs that are on has the following
meaning:
1 LED battery charge 25 ... 10%
1 LED flashing battery charge <10%
Power supply
Initial start-up
Press the button PUSH at the front side of the
battery. Four LEDs indicate the charge level of
battery.
H Note:
You can also check the battery charge even if the battery
is located in the battery compartment of the instrument.
Battery charge indicator
In the measurement line of the USM 35X, an inverted B
appears if the battery charge is low.
Power supply
H Note:
If the icon for low battery charge appears, you should
urgently close your test job and exchange the batteries.
You should take replacement batteries with you if you
aim to carry out measurements on site.
Charging the batteries
You can charge the lithium-ion battery either directly in
the instrument or by means of an external battery
charger. You always need an external battery charger to
charge standard C-cells.
Internal charging
Requirement:
Lithium-ion battery, order number 102 208
Power supply/charger unit, order number 102 163
If a battery is located in the instrument, the charging
process is started automatically when you connect the
plug-in power supply unit. You can carry out ultrasonic
inspections and charge a battery at the same time.
Initial start-up
Press the button PUSH at the front side of the
battery. Four LEDs indicate the charge level of
battery.
H Note:
You can also check the battery charge even if the battery
is located in the battery compartment of the instrument.
Battery charge indicator
In the measurement line of the USM 35X, an inverted B
appears if the battery charge is low.
Power supply
H Note:
If the icon for low battery charge appears, you should
urgently close your test job and exchange the batteries.
You should take replacement batteries with you if you
aim to carry out measurements on site.
the instrument or by means of an external battery
charger. You always need an external battery charger to
charge standard C-cells.
Internal charging
Requirement:
Lithium-ion battery, order number 102 208
Power supply/charger unit, order number 102 163
If a battery is located in the instrument, the charging
process is started automatically when you connect the
plug-in power supply unit. You can carry out ultrasonic
inspections and charge a battery at the same time.
Initial start-up
The charging time is 10 hours with a simultaneous ul-
trasonic inspection. If the instrument is not being used
for ultrasonic inspections, the charging time is 8 hours.
This charging time applies to ambient temperatures
from 25 to 30 C. Please take into consideration that
the batteries are not charged to their full capacity at
higher temperatures.
The LED display on the plug-in power supply unit indi-
cates the status of the charging process.
Power supply
green LED yellow LED red LED Status
off flashing off no battery detected
off flashing dark/bright flashing bright/dark charging at low power
off on off quick charging phase 1
flashing dark/bright flashing bright/dark off quick charging phase 2
on off off battery charged
off off flashing bright/dark temperature error, auto-reversible
off off on csharging error, permanent
External charging
Lithium-ion batteries can be charged by means of an
external battery charger. We recommend the battery
charger with the order number 35 297. To charge single
NiCad or NiMH cells, you need the external desktop
battery charger with the order number 101 729.
Initial start-up
The charging time is 10 hours with a simultaneous ul-
trasonic inspection. If the instrument is not being used
for ultrasonic inspections, the charging time is 8 hours.
This charging time applies to ambient temperatures
from 25 to 30 C. Please take into consideration that
the batteries are not charged to their full capacity at
higher temperatures.
The LED display on the plug-in power supply unit indi-
cates the status of the charging process.
Power supply
green LED yellow LED red LED Status
off flashing off no battery detected
off flashing dark/bright flashing bright/dark charging at low power
off on off quick charging phase 1
flashing dark/bright flashing bright/dark off quick charging phase 2
on off off battery charged
off off flashing bright/dark temperature error, auto-reversible
off off on csharging error, permanent
External charging
Lithium-ion batteries can be charged by means of an
external battery charger. We recommend the battery
charger with the order number 35 297. To charge single
NiCad or NiMH cells, you need the external desktop
battery charger with the order number 101 729.
Initial start-up
3.2 Connecting a probe
To prepare the USM 35X for operation, you have to
connect a probe to it. Any Krautkramer probe can be
used for the USM 35X, provided the appropriate cable
is available and the operating frequency is within an
adequate range.
The USM 35X is available with the probe connectors
LEMO-1-TRIAX or BNC.
The probe is connected to the sockets at the top right
on the instrument casing. Both connector sockets are
equally suitable (connected in parallel) for connecting
probes equipped with only one ultrasonic element (ultra-
sonic transducer) so that it does not matter which one
of the two sockets is used.
When connecting a dual-element (TR) probe (having
one transmitter element and one receiver element), or
two probes (of which one is transmitting and the other
one receiving), attention should be paid to connecting
the transmitter element to the right-hand socket (trans-
mitter, marked with black circle at the rear of the instru-
ment case) and the receiver element to the left-hand
socket (receiver, marked with red circle).
A Attention:
If this is not taken into account, the consequence
would be a mismatching which may lead to consider-
able power losses or even to echo waveform distor-
tions.
Receiver Transmitter
Connecting a probe
Initial start-up
3.2 Connecting a probe
To prepare the USM 35X for operation, you have to
connect a probe to it. Any Krautkramer probe can be
used for the USM 35X, provided the appropriate cable
is available and the operating frequency is within an
adequate range.
The USM 35X is available with the probe connectors
LEMO-1-TRIAX or BNC.
The probe is connected to the sockets at the top right
on the instrument casing. Both connector sockets are
equally suitable (connected in parallel) for connecting
probes equipped with only one ultrasonic element (ultra-
sonic transducer) so that it does not matter which one
of the two sockets is used.
When connecting a dual-element (TR) probe (having
one transmitter element and one receiver element), or
two probes (of which one is transmitting and the other
one receiving), attention should be paid to connecting
the transmitter element to the right-hand socket (trans-
mitter, marked with black circle at the rear of the instru-
ment case) and the receiver element to the left-hand
socket (receiver, marked with red circle).
A Attention:
If this is not taken into account, the consequence
would be a mismatching which may lead to consider-
able power losses or even to echo waveform distor-
tions.
Receiver Transmitter
Connecting a probe
Initial start-up
3.3 Starting the USM 35X
Switching on
To start the USM 35X, press the switch-on key .
The start display of the USM 35X appears; here you
will also see the current software version of the instru-
ment. The instrument carries out a self-check and then
switches over to stand-by mode.
The settings of all function values and the basic set-
tings (language and units) are the same as before
switching-on of the instrument.
Reset
If any functions can no longer be operated after a warm
start, or if you want to reset the instrument to the basic
setup, then you should carry out a cold start by simul-
taneously pressing the and the key.
The cold start message Basic Initialization is dis-
played. The instrument is initialized and reset to its
basic setup (dialog language: English, for more details
on how to select the language, please refer to chapter 4).
A Attention:
All saved data are deleted.
Information lines in the startup screen
You can enter two lines (each with up to 39 characters)
for information purposes in the startup screen. For this
use the remote function (codes I1 and I2, refer to chap-
ter 8).
Starting the USM 35X
Initial start-up
3.3 Starting the USM 35X
Switching on
To start the USM 35X, press the switch-on key .
The start display of the USM 35X appears; here you
will also see the current software version of the instru-
ment. The instrument carries out a self-check and then
switches over to stand-by mode.
The settings of all function values and the basic set-
tings (language and units) are the same as before
switching-on of the instrument.
Reset
If any functions can no longer be operated after a warm
start, or if you want to reset the instrument to the basic
setup, then you should carry out a cold start by simul-
taneously pressing the and the key.
The cold start message Basic Initialization is dis-
played. The instrument is initialized and reset to its
basic setup (dialog language: English, for more details
on how to select the language, please refer to chapter 4).
A Attention:
All saved data are deleted.
Information lines in the startup screen
You can enter two lines (each with up to 39 characters)
for information purposes in the startup screen. For this
use the remote function (codes I1 and I2, refer to chap-
ter 8).
Starting the USM 35X
Principles of operation 4
Principles of operation 4
Principles of operation Operators controls
Keys for selecting
a function
Rotary knob for
direct setting of the
current function
Rotary knob for
direct gain setting
Special keys for
special instrument
functions
Keys for selecting a function group
On/Off key
4.1 Operators controls
LED A: Gate alarm
R: Rejection
D: Dual on
Key for changing
the operation level
Principles of operation Operators controls
Keys for selecting
a function
Rotary knob for
direct setting of the
current function
Rotary knob for
direct gain setting
Special keys for
special instrument
functions
Keys for selecting a function group
On/Off key
4.1 Operators controls
LED A: Gate alarm
R: Rejection
D: Dual on
Key for changing
the operation level
Principles of operation Screen display
4.2 Screen display
The USM 35X has a digital screen for the display of
A-scan in the normal mode
A-scan in the zoom mode
The zoom mode is activated using the key .
H Note:
The screen display always shows the gain and the ad-
justed dB step value. All other functions are locked in
zoom mode.
4.2 Screen display
The USM 35X has a digital screen for the display of
A-scan in the normal mode
A-scan in the zoom mode
The zoom mode is activated using the key .
H Note:
The screen display always shows the gain and the ad-
justed dB step value. All other functions are locked in
zoom mode.
Functions on the display
The names of the five function groups are displayed at
the bottom of the screen. The currently selected func-
tion group is highlighted.
Indicated at the right of the display, next to the A-scan,
are the functions of the corresponding function group.
The display of the functions disappears in the zoom
mode.
Functions on the display
The names of the five function groups are displayed at
the bottom of the screen. The currently selected func-
tion group is highlighted.
Indicated at the right of the display, next to the A-scan,
are the functions of the corresponding function group.
The display of the functions disappears in the zoom
mode.
Amplitude height
Gate A (%)
Sound path
Gate A
Amplitude height
Gate B (%)
Sound path
Gate B
Status indicator:
TOF = Flank
Other displays
The measurement line below the screen display shows
values of settings, measured values, and status indica-
tions. As an alternative, a scale can be shown here,
giving an overview of the echo positions.
H Note:
Every measurement value can also be shown in an
enlarged display at the top right corner of the A-scan
(setting in the function group MEAS, function S-DISP).
H Note:
You can configure the four positions of the measure-
ment line for set and measured values as required
(function group MSEL). Please refer to chapter 5.14,
section Configuring the measurement line on this sub-
ject.
Example of a measurement line
Amplitude height
Gate A (%)
Sound path
Gate A
Amplitude height
Gate B (%)
Sound path
Gate B
Status indicator:
TOF = Flank
Other displays
The measurement line below the screen display shows
values of settings, measured values, and status indica-
tions. As an alternative, a scale can be shown here,
giving an overview of the echo positions.
H Note:
Every measurement value can also be shown in an
enlarged display at the top right corner of the A-scan
(setting in the function group MEAS, function S-DISP).
H Note:
You can configure the four positions of the measure-
ment line for set and measured values as required
(function group MSEL). Please refer to chapter 5.14,
section Configuring the measurement line on this sub-
ject.
Example of a measurement line
Principles of operation Keys and rotary knobs
4.3 Keys and rotary knobs
Function keys
For changing between operation levels (below),
For selection of the function groups (below) and
For selection of the functions (right).
On/Off key
For turning the device on or off.
4.3 Keys and rotary knobs
Function keys
For changing between operation levels (below),
For selection of the function groups (below) and
For selection of the functions (right).
On/Off key
For turning the device on or off.
Special keys
To directly activate individual instrument functions:
To choose the increment for the gain setting
To freeze the A-scan
To display a zoomed A-scan
To transfer the data
To record measured values and to save the data
Special keys
To directly activate individual instrument functions:
To choose the increment for the gain setting
To freeze the A-scan
To display a zoomed A-scan
To transfer the data
To record measured values and to save the data
Principles of operation
Rotary knobs
The USM 35X is equipped with two rotary knobs.
The left-hand rotary knob enables you to directly set
the gain; the right-hand rotary knob serves for setting
the currently selected function.
The two rotary knobs enable both step-by-step and
accelerated settings. You can define a setting step by
step by slightly operating the rotary knob which will
snap into place at the next setting. To accelerate the
setting, operate the rotary knob continuously, i.e. at a
constant speed. This enables you to quickly bridge
great differences between the settings.
Keys and rotary knobs
4.4 Operational concept
The USM 35X is an easy-to-use instrument. It has
three operating levels, and you can change between
them by pressing the key. You will recognize your
currently active operating level by the number on the
separation line between the first and the second func-
tion group.
If the instrument is equipped with the Data Logger option,
a fourth operating level is added to the existing ones.
Each operating level contains five function groups.
First operating level
Second operating level
Third operating level
Rotary knobs
The USM 35X is equipped with two rotary knobs.
The left-hand rotary knob enables you to directly set
the gain; the right-hand rotary knob serves for setting
the currently selected function.
The two rotary knobs enable both step-by-step and
accelerated settings. You can define a setting step by
step by slightly operating the rotary knob which will
snap into place at the next setting. To accelerate the
setting, operate the rotary knob continuously, i.e. at a
constant speed. This enables you to quickly bridge
great differences between the settings.
Keys and rotary knobs
4.4 Operational concept
The USM 35X is an easy-to-use instrument. It has
three operating levels, and you can change between
them by pressing the key. You will recognize your
currently active operating level by the number on the
separation line between the first and the second func-
tion group.
If the instrument is equipped with the Data Logger option,
a fourth operating level is added to the existing ones.
Each operating level contains five function groups.
Setting the functions
Shown below the A-scan are five function groups that
you can directly select using the corresponding key.
The selected function group is highlighted and the cor-
responding four functions are displayed next to the
A-scan on the right. You can likewise directly select the
individual functions using the corresponding keys.
Functions with double assignments
Some functions have double assignments. You will rec-
ognize the functions with double assignments by an
arrow (icon >) after the function name.
Toggle between the two functions by repeatedly press-
ing the corresponding key .
Coarse and fine adjustment of functions
You can choose between coarse and fine adjustment
for some functions. You can toggle between these two
adjustment modes by pressing the corresponding
key several times. The fine adjustment is identified
by an asterisk preceding the function value.
The following functions offer a choice between coarse
and fine adjustment:
Function Function group
RANGE BASE
MTLVEL BASE
D-DELAY BASE
aSTART aGAT
aWIDTH aGAT
bWIDTH bGAT
S-REF1 CAL
S-REF2 CAL
ANGLE TRIG
THICKNE TRIG
DIAMET TRIG
For more details on the adjustment possibilities, please
read from page 5-5 onward.
Operational concept
Setting the functions
Shown below the A-scan are five function groups that
you can directly select using the corresponding key.
The selected function group is highlighted and the cor-
responding four functions are displayed next to the
A-scan on the right. You can likewise directly select the
individual functions using the corresponding keys.
Functions with double assignments
Some functions have double assignments. You will rec-
ognize the functions with double assignments by an
arrow (icon >) after the function name.
Coarse and fine adjustment of functions
You can choose between coarse and fine adjustment
for some functions. You can toggle between these two
adjustment modes by pressing the corresponding
key several times. The fine adjustment is identified
by an asterisk preceding the function value.
The following functions offer a choice between coarse
and fine adjustment:
Function Function group
RANGE BASE
MTLVEL BASE
D-DELAY BASE
aSTART aGAT
aWIDTH aGAT
bWIDTH bGAT
S-REF1 CAL
S-REF2 CAL
ANGLE TRIG
THICKNE TRIG
DIAMET TRIG
For more details on the adjustment possibilities, please
read from page 5-5 onward.
Operational concept
4.5 Important basic settings
Selecting the language
Select the language in which the function names should
be displayed on the screen in the function DIALOG
(Function group CFG1). The following languages are
available:
German
English (default setting)
French
Italian
Spanish
Portuguese
Dutch
Swedish
Slovenian
Romanian
Finnish
Czech
Danish
Hungarian
Croatian
Russian
Slovakian
Norwegian
Polish
Japanese
H Note:
More dialog languages can be added on request.
If necessary, go to the third operating level.
In the function group CFG1 select the function
DIALOG.
Important basic settings
4.5 Important basic settings
Selecting the language
Select the language in which the function names should
be displayed on the screen in the function DIALOG
(Function group CFG1). The following languages are
available:
German
French
Italian
Spanish
Portuguese
Dutch
Swedish
Slovenian
Romanian
Finnish
Czech
Danish
Hungarian
Croatian
Russian
Slovakian
Norwegian
Polish
Japanese
H Note:
In the function group CFG1 select the function
DIALOG.
Principles of operation Important basic settings
H Note:
Double assignment of the function DIALOG/UNIT
(icon >). Toggle between the two functions by repeatedly
pressing the corresponding key .
Select the required language by means of the right-
hand rotary knob.
Selecting units
In the function UNIT (function group CFG1) you can
choose your favorite units between mm or inch.
In the function group CFG1 select the function UNIT.
H Note:
Set the required unit by means of the right-hand
rotary knob.
A Attention:
Select your units immediately when you start working
with the USM 35X because if you change the unit, all
the current settings are deleted, and the basic setup is
loaded again.
Principles of operation Important basic settings
H Note:
Select the required language by means of the right-
hand rotary knob.
Selecting units
In the function UNIT (function group CFG1) you can
choose your favorite units between mm or inch.
In the function group CFG1 select the function UNIT.
H Note:
Set the required unit by means of the right-hand
rotary knob.
A Attention:
Select your units immediately when you start working
with the USM 35X because if you change the unit, all
the current settings are deleted, and the basic setup is
loaded again.
In order not to delete anything by accident, a safety
prompt is displayed in the measurement line.
If you are sure that you want to change the unit,
press the key belonging to the function UNIT one
more time.
The unit is now changed, the current data are
deleted.
If you want to abort the process, press any other
key. The previous setting is kept in that case.
Setting the date
The date is saved together with the test results. You
can set it in the function DATE (function group CFG2).
A Attention:
Please take into account that the USM 35X only indi-
cates the year with two digits.
You should always make sure that you use correctly
set values of date. Test results may otherwise be falsi-
fied.
If necessary, change to the third operation level.
Select the function DATE in the function group
CFG2.
H Note:
Double assignment of the function DATE/TIME (icon >).
Use the left-hand rotary knob to select the value that
you want to vary, e.g. the day.
Use the right-hand rotary knob to vary the selected
value.
In order not to delete anything by accident, a safety
prompt is displayed in the measurement line.
If you are sure that you want to change the unit,
press the key belonging to the function UNIT one
more time.
The unit is now changed, the current data are
deleted.
If you want to abort the process, press any other
key. The previous setting is kept in that case.
Setting the date
The date is saved together with the test results. You
can set it in the function DATE (function group CFG2).
A Attention:
Please take into account that the USM 35X only indi-
cates the year with two digits.
You should always make sure that you use correctly
set values of date. Test results may otherwise be falsi-
fied.
Select the function DATE in the function group
CFG2.
H Note:
you want to vary, e.g. the day.
value.
Setting the time
The function TIME (function group CFG2) serves for
setting the current hour of time. It is saved together
with the test results.
A Attention:
You should always make sure that you are using the
correct time settings. Test results may otherwise be
falsified.
Dont forget to manually set the time when changing
from winter to summer time.
Select the function TIME in the function group CFG2.
H Note:
you want to vary, e.g. the hour.
value.
Setting the time
The function TIME (function group CFG2) serves for
setting the current hour of time. It is saved together
with the test results.
A Attention:
You should always make sure that you are using the
correct time settings. Test results may otherwise be
falsified.
Dont forget to manually set the time when changing
from winter to summer time.
Select the function TIME in the function group CFG2.
H Note:
you want to vary, e.g. the hour.
value.
4.6 Basic settings of the display
The equipment of the USM 35X includes a high-resolu-
tion color display. You can optimize the display settings
to your individual viewing habits and to the operational
environment.
Selecting the color scheme
You can use the function SCHEME (function group
LCD) to choose one of four color schemes. The color
scheme determines the color of all displays and that of
the background. You cannot vary the colors of gates
because they are fixed as follows:
Gate A red
Gate B green
Gate C blue
H Note:
All color schemes are suitable for indoor use. For out-
door use, we recommend the color schemes 3 and 4.
Basic settings of the display
Select the function SCHEME in the function group
LCD.
Use the right-hand rotary knob to choose the required
color scheme.
Setting the lighting
Use the function LIGHT (function group LCD) to set the
display lighting. You can choose between the default
lighting max. and a lighting in the economy mode min..
H Note:
The economy mode reduces the current consumption
and consequently increases the operating time in bat-
tery operation.
Select the function LIGHT in the function group LCD.
Use the right-hand rotary knob to set the required
lighting.
4.6 Basic settings of the display
The equipment of the USM 35X includes a high-resolu-
tion color display. You can optimize the display settings
to your individual viewing habits and to the operational
environment.
Selecting the color scheme
You can use the function SCHEME (function group
LCD) to choose one of four color schemes. The color
scheme determines the color of all displays and that of
the background. You cannot vary the colors of gates
Gate A red
Gate B green
Gate C blue
H Note:
Basic settings of the display
Select the function SCHEME in the function group
LCD.
color scheme.
Setting the lighting
Use the function LIGHT (function group LCD) to set the
display lighting. You can choose between the default
lighting max. and a lighting in the economy mode min..
H Note:
tery operation.
Select the function LIGHT in the function group LCD.
lighting.
Operation 5
Operation 5
Operation Overview of the functions
5.1 Overview of the functions
The functions of the USM 35X are combined to form
function groups on three operating levels.
If the instrument has the option Data Logger, there is an
additional fourth operation level.
Press the key to change between the operating
levels.
Press the key to select the function group shown
above it.
Press the key to select the function shown next
to it. The setting of the selected function is carried
out via the right-hand rotary knob.
The gain function is always directly available via the
left-hand rotary knob.
You can carry out important functions (switch on/off,
dB-step, freeze, zoom and report printout) by pressing
the special keys (ref. chapter 4).
You will also find an overview of the function groups
and their functions on the fold-out page.
Each operating level contains five function groups. You
will recognize your currently active operating level by
the number on the separation line between the first and
the second function group.
H Note:
If the instrument is equipped with the Data Logger op-
tion, a fourth operating level is added. For this, refer to
the corresponding chapter Option Data Logger.
5.1 Overview of the functions
The functions of the USM 35X are combined to form
function groups on three operating levels.
If the instrument has the option Data Logger, there is an
additional fourth operation level.
Press the key to change between the operating
levels.
Press the key to select the function group shown
above it.
Press the key to select the function shown next
to it. The setting of the selected function is carried
out via the right-hand rotary knob.
The gain function is always directly available via the
left-hand rotary knob.
You can carry out important functions (switch on/off,
dB-step, freeze, zoom and report printout) by pressing
the special keys (ref. chapter 4).
You will also find an overview of the function groups
and their functions on the fold-out page.
Each operating level contains five function groups. You
will recognize your currently active operating level by
the number on the separation line between the first and
the second function group.
H Note:
If the instrument is equipped with the Data Logger op-
tion, a fourth operating level is added. For this, refer to
the corresponding chapter Option Data Logger.
Function groups first operating level
BASE The functions that you find here are re-
quired for the basic adjustment of the
screen displays.
PULS Combined in this group are the functions
that serve for the adjustment of pulser.
RECV Combined in this group are the functions
that serve for the adjustment of receiver.
aGAT All functions for setting the gate A can be
found in this group.
bGAT All functions for setting the gate B can be
Function groups second operating level
CAL This function group makes functions for the
semiautomatic calibration available to you.
REF This function group serves for measuring
the dB difference between a reference
echo and the reflector echo.
or
AWS This is where you will find all functions for
the classification of flaws in welds accord-
ing to the AWS D1.1 specification.
or
DAC This is the function group where you can
set the functions for the DAC (only
USM 35X DAC and USM 35X S).
or
JDAC The DAC functions in this function group
are modified to allow for a flaw evaluation
according to JIS (Japanese Industrial
Standard) Z3060-2002 (only USM35X DAC
and USM 35X S).
Function groups first operating level
BASE The functions that you find here are re-
quired for the basic adjustment of the
screen displays.
PULS Combined in this group are the functions
that serve for the adjustment of pulser.
RECV Combined in this group are the functions
that serve for the adjustment of receiver.
aGAT All functions for setting the gate A can be
bGAT All functions for setting the gate B can be
Function groups second operating level
CAL This function group makes functions for the
semiautomatic calibration available to you.
REF This function group serves for measuring
the dB difference between a reference
echo and the reflector echo.
or
AWS This is where you will find all functions for
the classification of flaws in welds accord-
ing to the AWS D1.1 specification.
or
DAC This is the function group where you can
set the functions for the DAC (only
USM 35X DAC and USM 35X S).
or
JDAC The DAC functions in this function group
are modified to allow for a flaw evaluation
according to JIS (Japanese Industrial
Standard) Z3060-2002 (only USM35X DAC
and USM 35X S).
Operation
or
DGS This function group serves for the ampli-
tude evaluation according to the DGS
method (only USM 35X S).
TRIG Combined in this group are the functions
required for angle beaming using angle-
beam probes for the display of a (reduced)
projection distance and depth position of a
reflector (for plane-parallel and circular
curved test components).
MEM These functions serve for storing, loading
and deleting of data sets.
DATA The functions of this group serve for the
dataset management and documentation.
Function groups third operating level
MEAS In this group, you can define the measuring
point, select a parameter for the zoomed
measured-value display in the A-scan as
well as for the setting of the Magnify func-
tion, and you can select different settings
for the A-scan.
MSEL This is where you configure your measure-
ment line. You can choose one display for
each of the four positions.
LCD This is the function group where you can
set the LCD contrast and backlight as well
as the echo display mode on the screen.
CFG1 Functions for the configuration: unit, dialog
language, printer driver and assignment of
the key
CFG2 Other functions for configuration: time and
date, alarm horn; plus the changeover
between the evaluation modes
Overview of the functions
Operation
or
DGS This function group serves for the ampli-
tude evaluation according to the DGS
method (only USM 35X S).
TRIG Combined in this group are the functions
required for angle beaming using angle-
beam probes for the display of a (reduced)
projection distance and depth position of a
reflector (for plane-parallel and circular
curved test components).
MEM These functions serve for storing, loading
and deleting of data sets.
DATA The functions of this group serve for the
dataset management and documentation.
Function groups third operating level
MEAS In this group, you can define the measuring
point, select a parameter for the zoomed
measured-value display in the A-scan as
well as for the setting of the Magnify func-
tion, and you can select different settings
for the A-scan.
MSEL This is where you configure your measure-
ment line. You can choose one display for
each of the four positions.
LCD This is the function group where you can
set the LCD contrast and backlight as well
as the echo display mode on the screen.
CFG1 Functions for the configuration: unit, dialog
language, printer driver and assignment of
the key
CFG2 Other functions for configuration: time and
date, alarm horn; plus the changeover
between the evaluation modes
Overview of the functions
Operation Setting the gain
5.2 Setting the gain
This function, operated via the left-hand rotary knob,
enables you to quickly and directly set the gain.
You can use the gain to adjust the required sensitivity
in order to control the echo amplitudes.
Turn the left-hand rotary knob to set the gain. The
current gain is indicated in the top left corner of the
screen.
Defining the dB incrementation for gain
You can use the key to select a certain incremen-
tation for setting the gain. You have a choice between
6 steps:
0.0 dB (locked)
0.5 dB
1.0 dB
2.0 dB
6.0 dB
6.5 20.0 dB
H Note:
The setting 0.0 dB locks the gain in this way preventing
any accidental change of setting.
You can determine the step size of the sixth step using
the function dBSTEP in the function group RECV.
Press to change between the six steps.
The corresponding step size setting is indicated
below the current gain on the screen.
Operation Setting the gain
5.2 Setting the gain
This function, operated via the left-hand rotary knob,
enables you to quickly and directly set the gain.
You can use the gain to adjust the required sensitivity
in order to control the echo amplitudes.
Turn the left-hand rotary knob to set the gain. The
current gain is indicated in the top left corner of the
screen.
Defining the dB incrementation for gain
You can use the key to select a certain incremen-
tation for setting the gain. You have a choice between
6 steps:
0.0 dB (locked)
0.5 dB
1.0 dB
2.0 dB
6.0 dB
6.5 20.0 dB
H Note:
The setting 0.0 dB locks the gain in this way preventing
any accidental change of setting.
You can determine the step size of the sixth step using
the function dBSTEP in the function group RECV.
Press to change between the six steps.
The corresponding step size setting is indicated
below the current gain on the screen.
Operation
(function group BASE)
The function group BASE enables you to make the
basic adjustment of the display range. The display on
the screen must be adjusted for the material to be test-
ed (function MTLVEL) and for the probe used (function
P-DELAY).
If required, go to the first operating level.
Select the function group BASE.
Adjusting the display range (function group BASE)
H Note:
In order to accurately adjust the material velocity and
the probe delay, please read the section Calibrating the
USM 35X, chapter 5.7, beforehand.
RANGE (Display range)
You can adjust the range for your measurement in
RANGE.
Coarse adjustment:
from 0.5 mm ... 1400 (9999) mm in even steps
Fine adjustment:
up to 9.99 mm in steps of 0.01 mm
up to 999 mm in steps of 1 mm
H Note:
The adjustment range for the display range depends on
the frequency range setting (function FREQU in func-
tion group RECV).
Operation
(function group BASE)
The function group BASE enables you to make the
basic adjustment of the display range. The display on
the screen must be adjusted for the material to be test-
ed (function MTLVEL) and for the probe used (function
P-DELAY).
Select the function group BASE.
Adjusting the display range (function group BASE)
H Note:
In order to accurately adjust the material velocity and
the probe delay, please read the section Calibrating the
USM 35X, chapter 5.7, beforehand.
RANGE (Display range)
You can adjust the range for your measurement in
RANGE.
Coarse adjustment:
from 0.5 mm ... 1400 (9999) mm in even steps
Fine adjustment:
up to 999 mm in steps of 1 mm
H Note:
The adjustment range for the display range depends on
the frequency range setting (function FREQU in func-
tion group RECV).
Operation Adjusting the display range (function group BASE)
Frequency range Adjustment range (c = 5920 m/s)
0.2 to 1 MHz 0.5 to 9999 mm/0.02" to 390"
0.5 to 4 MHz 0.5 to 9999 mm/0.02" to 390"
0.8 to 8 MHz 0.5 to 1420 mm/0.02" to 50"
2 to 20 MHz 0.5 to 1420 mm/0.02" to 50"
Select the function RANGE.
If required, toggle between coarse and fine adjust-
ment.
Adjust the required value by means of the right-hand
rotary knob.
MTLVEL (Sound velocity)
Use MTLVEL to set the sound velocity within the test
object. You can use sound velocities between 1000 and
15000 m/s.
Coarse adjustment, in steps as follows (m/s):
15000 9000 5000 2000
14000 8000 4000 1600
13000 7000 3250 1450
12000 6320 3130 1000
11000 6000 3000
10000 5920 2730
Fine adjustment
1000 ... 15000 in steps of 1 m/s
A Attention:
Always ensure that the function MTLVEL is correctly
set. The USM 35X calculates all range and distance
indications on the basis of the value adjusted here.
Select the function MTLVEL.
ment.
rotary knob.
D-DELAY (Display starting point)
Here you can choose whether to display the adjusted
range (for example 250 mm) starting from the surface
of the test object, or in a section of the test object
starting at a later point. This allows you to shift the
complete screen display and consequently also the
display zero.
Frequency range Adjustment range (c = 5920 m/s)
0.2 to 1 MHz 0.5 to 9999 mm/0.02" to 390"
0.5 to 4 MHz 0.5 to 9999 mm/0.02" to 390"
0.8 to 8 MHz 0.5 to 1420 mm/0.02" to 50"
2 to 20 MHz 0.5 to 1420 mm/0.02" to 50"
Select the function RANGE.
ment.
rotary knob.
MTLVEL (Sound velocity)
Use MTLVEL to set the sound velocity within the test
object. You can use sound velocities between 1000 and
15000 m/s.
Coarse adjustment, in steps as follows (m/s):
15000 9000 5000 2000
14000 8000 4000 1600
13000 7000 3250 1450
12000 6320 3130 1000
11000 6000 3000
10000 5920 2730
Fine adjustment
1000 ... 15000 in steps of 1 m/s
A Attention:
Always ensure that the function MTLVEL is correctly
set. The USM 35X calculates all range and distance
indications on the basis of the value adjusted here.
Select the function MTLVEL.
ment.
rotary knob.
D-DELAY (Display starting point)
Here you can choose whether to display the adjusted
range (for example 250 mm) starting from the surface
of the test object, or in a section of the test object
starting at a later point. This allows you to shift the
complete screen display and consequently also the
display zero.
If the display should for example start from the surface of
the test object, the value in D-DELAY must be set to 0.
Coarse adjustment
10 mm ... 1024 mm/0.3" ... 40" in even steps
Fine adjustment
up to 99.9 mm/9.999" in steps of 0.01 mm/0.001"
up to 1024 mm/10" in steps of 0.1 mm/0.001"
Select the function D-DELAY.
ment.
Adjust the value for the display starting point by
means of the right-hand rotary knob.
P-DELAY (Probe delay)
Every probe has a delay line between the transducer
element and the coupling face. This means that the
initial pulse must first pass through this delay line be-
fore the sound wave can enter the test object. You can
compensate for this influence of the delay line in the
function P-DELAY.
H Note:
If the value for P-DELAY is not known, read the section
Calibrating the USM 35X, chapter 5.7, in order to deter-
mine this value.
Select the function P-DELAY.
Adjust the value for the probe delay by means of the
right-hand rotary knob.
If the display should for example start from the surface of
the test object, the value in D-DELAY must be set to 0.
Coarse adjustment
10 mm ... 1024 mm/0.3" ... 40" in even steps
Fine adjustment
up to 99.9 mm/9.999" in steps of 0.01 mm/0.001"
up to 1024 mm/10" in steps of 0.1 mm/0.001"
Select the function D-DELAY.
ment.
Adjust the value for the display starting point by
means of the right-hand rotary knob.
P-DELAY (Probe delay)
Every probe has a delay line between the transducer
element and the coupling face. This means that the
initial pulse must first pass through this delay line be-
fore the sound wave can enter the test object. You can
compensate for this influence of the delay line in the
function P-DELAY.
H Note:
If the value for P-DELAY is not known, read the section
Calibrating the USM 35X, chapter 5.7, in order to deter-
mine this value.
Select the function P-DELAY.
Adjust the value for the probe delay by means of the
Operation
(function group PULS)
You will find all functions for the adjustment of the puls-
er in the function group PULS.
Select the function group PULS.
DAMPING (Probe matching)
This function serves for matching the probe. You can
use it to adjust the damping of the probes oscillating
circuit and to consequently change the height, width
and resolution of the echo display.
low
This setting has a lower damping effect and produc-
es higher and broader echoes.
high
This setting reduces the echo height but mostly also
produces narrow echoes with higher resolution.
Select the function DAMPING.
Set the required value by means of the right-hand
rotary knob.
Adjusting the pulser (function group PULS)
Operation
(function group PULS)
er in the function group PULS.
Select the function group PULS.
DAMPING (Probe matching)
This function serves for matching the probe. You can
use it to adjust the damping of the probes oscillating
circuit and to consequently change the height, width
and resolution of the echo display.
low
This setting has a lower damping effect and produc-
es higher and broader echoes.
high
This setting reduces the echo height but mostly also
produces narrow echoes with higher resolution.
Select the function DAMPING.
Set the required value by means of the right-hand
rotary knob.
Adjusting the pulser (function group PULS)
Operation Adjusting the pulser (function group PULS)
POWER (Intensity)
Use the function POWER to set the pulser voltage. You
can choose between two settings:
high high voltage
low low voltage
The setting high is recommended for all inspections in
which maximum sensitivity is important, e.g. for the
detection of small flaws. Choose the setting low for
broadband probes or if narrow echoes are required (bet-
ter lateral resolution).
Select the function POWER.
setting.
DUAL (Pulser-receiver separation)
You can use the function DUAL to activate the pulser-
receiver separation.
off
Single-element operation; the probe connection
sockets are connected in parallel.
on
Dual mode for the use with dual-element (TR) probes;
the left-hand socket (red) is connected with the
amplifier input whereas the initial pulse is available at
the right-hand socket (black).
through
Through-transmission mode for the use with two
separate probes; the receiver is connected with left
(red), the pulser is connected with right (black).
Select the function DUAL.
setting.
If the DUAL function is active, the LED D (dual) is on.
POWER (Intensity)
Use the function POWER to set the pulser voltage. You
can choose between two settings:
high high voltage
low low voltage
The setting high is recommended for all inspections in
which maximum sensitivity is important, e.g. for the
detection of small flaws. Choose the setting low for
broadband probes or if narrow echoes are required (bet-
ter lateral resolution).
Select the function POWER.
setting.
DUAL (Pulser-receiver separation)
You can use the function DUAL to activate the pulser-
receiver separation.
off
Single-element operation; the probe connection
sockets are connected in parallel.
on
Dual mode for the use with dual-element (TR) probes;
the left-hand socket (red) is connected with the
amplifier input whereas the initial pulse is available at
the right-hand socket (black).
through
Through-transmission mode for the use with two
separate probes; the receiver is connected with left
(red), the pulser is connected with right (black).
Select the function DUAL.
setting.
If the DUAL function is active, the LED D (dual) is on.
PRF-MOD(Pulse repetition frequency)
The pulse repetition frequency indicates the number of
times an initial pulse is triggered per second. You can
determine whether you need the highest possible PRF
value, or whether you are satisfied with a low value. You
have 10 steps available for the setting; step 1 means
the lowest PRF value.
The larger your workpiece, the smaller PRF values are
needed in order to avoid phantom echoes. In the case
of smaller PRF values, however, the A-scan update
rate becomes lower; for this reason, high values are
required if a workpiece should be scanned fast.
The best way to determine the suitable PRF value is by
experimenting: start from the highest step and reduce
the value until there are no more phantom echoes.
Select the function PRF-MOD.
rotary knob.
(function group RECV)
er in the function group RECV.
Select the function group RECV.
H Note:
Double assignment of the function FINE G/dBSTEP
(icon >). Toggle between the two functions by repeated-
ly pressing the corresponding key .
PRF-MOD(Pulse repetition frequency)
The pulse repetition frequency indicates the number of
times an initial pulse is triggered per second. You can
determine whether you need the highest possible PRF
value, or whether you are satisfied with a low value. You
have 10 steps available for the setting; step 1 means
the lowest PRF value.
The larger your workpiece, the smaller PRF values are
needed in order to avoid phantom echoes. In the case
of smaller PRF values, however, the A-scan update
rate becomes lower; for this reason, high values are
required if a workpiece should be scanned fast.
The best way to determine the suitable PRF value is by
experimenting: start from the highest step and reduce
the value until there are no more phantom echoes.
Select the function PRF-MOD.
rotary knob.
(function group RECV)
er in the function group RECV.
Select the function group RECV.
H Note:
Double assignment of the function FINE G/dBSTEP
(icon >). Toggle between the two functions by repeated-
ly pressing the corresponding key .
Operation
FINE G (Fine adjustment of gain)
This function serves for the fine adjustment of the cur-
rent gain value. The fine adjustment is possible over a
range of 40 steps within the range of approx. 4 dB. The
displayed gain value will not change.
Adjustment range: 10 ... +30
Select the function FINE G.
Use the right-hand rotary knob to adjust the value for
the fine gain.
dBSTEP
Use this function to set a step size for the gain vari-
ation by means of the key . The value set here is
subsequently available to you as the sixth step for the
stepwise gain variation. You have a free choice of the
value within the setting range.
Setting range: 6.5 ... 20 dB
Select the function dBSTEP.
Set the value for the gain by means of the right-hand
rotary knob.
REJECT
The function REJECT allows you to suppress unwanted
echo indications, for example structural noise from your
test object.
The % screen height setting indicates the minimum
height that the echoes should attain in order for them to
be displayed on the screen at all. The Reject setting
cannot be higher than the lowest threshold setting
(minus 1 %) of any gate.
A Attention:
You should handle this function with great caution, as it
may of course happen that you suppress echoes from
flaws as well. Many test specifications expressly forbid
using the reject function.
Select the function REJECT.
Set the required percentage value by means of the
The LED R is therefore lit with active REJECT function.
Adjusting the receiver (function group RECV)
Operation
FINE G (Fine adjustment of gain)
This function serves for the fine adjustment of the cur-
rent gain value. The fine adjustment is possible over a
range of 40 steps within the range of approx. 4 dB. The
displayed gain value will not change.
Adjustment range: 10 ... +30
Select the function FINE G.
Use the right-hand rotary knob to adjust the value for
the fine gain.
dBSTEP
Use this function to set a step size for the gain vari-
ation by means of the key . The value set here is
subsequently available to you as the sixth step for the
stepwise gain variation. You have a free choice of the
value within the setting range.
Setting range: 6.5 ... 20 dB
Select the function dBSTEP.
Set the value for the gain by means of the right-hand
rotary knob.
REJECT
The function REJECT allows you to suppress unwanted
echo indications, for example structural noise from your
test object.
The % screen height setting indicates the minimum
height that the echoes should attain in order for them to
be displayed on the screen at all. The Reject setting
cannot be higher than the lowest threshold setting
(minus 1 %) of any gate.
A Attention:
You should handle this function with great caution, as it
may of course happen that you suppress echoes from
flaws as well. Many test specifications expressly forbid
using the reject function.
Select the function REJECT.
Set the required percentage value by means of the
The LED R is therefore lit with active REJECT function.
Adjusting the receiver (function group RECV)
Operation Adjusting the receiver (function group RECV)
FREQU (Frequency range)
In this function, you can adjust the operating frequency
according to the frequency of your probe.
You have a choice between four frequency ranges:
0.2 ... 1 MHz
0.5 ... 4 MHz
0.8 ... 8 MHz
2 ... 20 MHz
Select the function FREQU.
rotary knob.
RECTIFY (Rectification)
You can select the rectification mode of the echo puls-
es according to your application in the function RECTI-
FY. You have the following options to choose from:
full-w (= full-wave)
All half-waves are displayed above the baseline.
pos hw (= positive half-wave)
Only positive half-waves are displayed.
neg hw (= negative half-wave)
Only negative half-waves are displayed.
rf (= radio frequency)
Only applies to the display range up to 50 mm (steel).
Select the function RECTIFY.
Use the right-hand rotary knob to adjust the required
setting.
Operation Adjusting the receiver (function group RECV)
FREQU (Frequency range)
In this function, you can adjust the operating frequency
according to the frequency of your probe.
You have a choice between four frequency ranges:
0.2 ... 1 MHz
0.5 ... 4 MHz
0.8 ... 8 MHz
2 ... 20 MHz
Select the function FREQU.
rotary knob.
RECTIFY (Rectification)
You can select the rectification mode of the echo puls-
es according to your application in the function RECTI-
FY. You have the following options to choose from:
full-w (= full-wave)
All half-waves are displayed above the baseline.
pos hw (= positive half-wave)
Only positive half-waves are displayed.
neg hw (= negative half-wave)
Only negative half-waves are displayed.
rf (= radio frequency)
Only applies to the display range up to 50 mm (steel).
Select the function RECTIFY.
setting.
Operation Setting the gates (function groups aGAT and bGAT)
(function groups aGAT
and bGAT)
All functions for setting the (dual) gate are arranged in
the function group aGAT and bGAT.
Select the function group aGAT or bGAT.
H Note:
If you have an instrument equipped with the Data Logger
option at your disposal, youll be additionally able to use
the C gate including all corresponding functions.
Tasks of the gates
It monitors the range of the test object where you
expect to detect a flaw. If an echo exceeds or falls
below the gate, an alarm signal is output via the
LED A.
The gates A and B are independant of one another.
Gate A can also have the function of an echo-start
gate.
The gate chooses the echo for the digital time-of-
flight or amplitude measurement. The measured
value is indicated in the measurement line.
H Note:
Error alarms can be triggered unter certain circum-
stances. These are caused by intermediate conditions
in instrument operation occuring when the instrument is
Operation Setting the gates (function groups aGAT and bGAT)
(function groups aGAT
and bGAT)
All functions for setting the (dual) gate are arranged in
the function group aGAT and bGAT.
Select the function group aGAT or bGAT.
H Note:
If you have an instrument equipped with the Data Logger
option at your disposal, youll be additionally able to use
the C gate including all corresponding functions.
Tasks of the gates
It monitors the range of the test object where you
expect to detect a flaw. If an echo exceeds or falls
below the gate, an alarm signal is output via the
LED A.
The gates A and B are independant of one another.
Gate A can also have the function of an echo-start
gate.
The gate chooses the echo for the digital time-of-
flight or amplitude measurement. The measured
value is indicated in the measurement line.
H Note:
Operation
used, i.e. when function parameters are changed. Pos-
sible alarms occuring during instrument operation
(setting of functions) are to be ignored.
Display of gates
To make the assignment easier, the gates are displayed
in different colors. You cannot vary the colors of gates
Gate A red
Gate B green
Gate C blue
aLOGIC/bLOGIC
(Evaluation logic of the gates)
This function allows you to choose the method for trig-
gering the gate alarm. The alarm is output to the LED A
on the front panel of the USM 35X. There are four set-
ting options available:
Setting the gates (function groups aGAT and bGAT)
off Evaluation logic off
The alarm and measurement capability are switched
off. The gate is not visible.
pos Coincidence
The alarm (LED A) is on if the preset response
threshold of the gate is exceeded within the dis-
played range.
neg Anticoincidence
threshold of the gate is not reached within the
displayed range.
a trig Triggering by interface echo
When using gate A as echo-start gate (setting of the
evaluation logic for gate B)
Select the function aLOGIC or bLOGIC.
Set the required alarm logic by means of the right-
hand rotary knob.
H Note:
The alarm and measurement function of the gates is
only active within the display range.
Operation
Display of gates
To make the assignment easier, the gates are displayed
in different colors. You cannot vary the colors of gates
Gate A red
Gate B green
Gate C blue
aLOGIC/bLOGIC
(Evaluation logic of the gates)
This function allows you to choose the method for trig-
gering the gate alarm. The alarm is output to the LED A
on the front panel of the USM 35X. There are four set-
ting options available:
off Evaluation logic off
The alarm and measurement capability are switched
off. The gate is not visible.
pos Coincidence
threshold of the gate is exceeded within the dis-
played range.
neg Anticoincidence
threshold of the gate is not reached within the
displayed range.
a trig Triggering by interface echo
When using gate A as echo-start gate (setting of the
evaluation logic for gate B)
Select the function aLOGIC or bLOGIC.
Set the required alarm logic by means of the right-
hand rotary knob.
H Note:
The alarm and measurement function of the gates is
only active within the display range.
Operation
aSTART/bSTART
(Starting points of the gates)
You can fix the starting point of the gates A or B within
the adjustment range of 0 ... 9999 mm/250".
Select the function aSTART or bSTART.
Uuse the right-hand rotary knob to adjust the required
setting.
aWIDTH/bWIDTH (Width of the gates)
You can determine the gate width within the range of
0.2 ... 9999 mm/0.008 ... 250".
Select the function aWIDTH or bWIDTH.
value.
aTHRSH/bTHRSH (Response and mea-
surement threshold of the gates)
You can determine the threshold value of the gates within
the range of 10 to 90 % screen height for triggering the
LED alarm if this value is exceeded or not reached, de-
pending on the setting of the aLOGIC/bLOGIC function.
In the RF mode, the threshold can be additionally set
from 90 % to 10 %.
Select the function aTHRSH or bTHRSH.
Set the required value using the right-hand rotary
knob.
Operation
aSTART/bSTART
(Starting points of the gates)
You can fix the starting point of the gates A or B within
the adjustment range of 0 ... 9999 mm/250".
Select the function aSTART or bSTART.
Uuse the right-hand rotary knob to adjust the required
setting.
aWIDTH/bWIDTH (Width of the gates)
You can determine the gate width within the range of
0.2 ... 9999 mm/0.008 ... 250".
Select the function aWIDTH or bWIDTH.
value.
aTHRSH/bTHRSH (Response and mea-
surement threshold of the gates)
You can determine the threshold value of the gates within
the range of 10 to 90 % screen height for triggering the
LED alarm if this value is exceeded or not reached, de-
pending on the setting of the aLOGIC/bLOGIC function.
In the RF mode, the threshold can be additionally set
from 90 % to 10 %.
Select the function aTHRSH or bTHRSH.
Set the required value using the right-hand rotary
knob.
Operation Calibrating the USM 35X
5.7 Calibrating the USM 35X
Calibrating the display range
Before working with the USM 35X, you have to cali-
brate the instrument: you have to adjust the material
velocity and display range and allow for the probe delay
depending on the material and dimensions of the test
object.
To ensure a safe and proper operation of the USM 35X,
it is necessary that the operator be adequately trained
in the field of ultrasonic testing technology.
Below you will find some examples of common calibra-
tion methods for certain test tasks. In addition, the
USM 35X has a semiautomatic calibration function
which is described as Case B: With unknown material
velocity.
Choosing the measuring point
The sound path measurement in the calibration process
or in the subsequent echo evaluation process depends
on the choice of the measuring point which can be set
either to flank, to jflank or to peak in the USM 35X. In
principle, the peak measurement should be preferred
because the measured distances do not depend on the
echo height in that case. However, there are application
cases in which the flank measurement is either speci-
fied, or it must be applied for technical reasons, e.g. in
many tests using dual-element (TR) probes.
A Attention:
In any case, the setting of the measuring point must
always be identical for the calibration and for the subse-
quent test application. Otherwise measurement errors
might occur.
5.7 Calibrating the USM 35X
Calibrating the display range
Before working with the USM 35X, you have to cali-
brate the instrument: you have to adjust the material
velocity and display range and allow for the probe delay
depending on the material and dimensions of the test
object.
To ensure a safe and proper operation of the USM 35X,
it is necessary that the operator be adequately trained
in the field of ultrasonic testing technology.
Below you will find some examples of common calibra-
tion methods for certain test tasks. In addition, the
USM 35X has a semiautomatic calibration function
which is described as Case B: With unknown material
velocity.
Choosing the measuring point
on the choice of the measuring point which can be set
either to flank, to jflank or to peak in the USM 35X. In
principle, the peak measurement should be preferred
cases in which the flank measurement is either speci-
fied, or it must be applied for technical reasons, e.g. in
many tests using dual-element (TR) probes.
A Attention:
In any case, the setting of the measuring point must
always be identical for the calibration and for the subse-
quent test application. Otherwise measurement errors
might occur.
angle-beam probes
Case A: With known material velocity
Calibration process
Set the known material velocity in MTLVEL (function
group BASE).
Couple the probe to the calibration block.
Set the required display range in RANGE (function
group BASE). The calibration echo must be dis-
played on the screen.
Position the gate on one of the calibration echoes
until the sound path of the echo is indicated in the
measurement line.
After this, change the adjustment of the function
P-DELAY (function group BASE) until the correct
sound path for the selected calibration echo is
indicated in the measurement line.
Example:
You are carrying out the calibration for the calibration
range of 100 mm/5" via the function group BASE using
the calibration block V1 (thickness 25 mm/1") which is
laid flatwise.
Set RANGE to 100 mm/5".
Set the known material velocity of 5920 m/s
(233 "/ms) in MTLVEL.
Set the gate so that it is positioned on the first
calibration echo (from 25 mm/1").
Read the sound path in the measurement line. If this
value is not equal to 25 mm/1", change the adjust-
ment for the function P-DELAY until it is at 25 mm/1".
This completes the calibration of the USM 35X to the
material velocity of 5920 m/s (233 "/ms) with a calibra-
tion range of 100 mm/5" for the probe used.
angle-beam probes
Case A: With known material velocity
Calibration process
Set the known material velocity in MTLVEL (function
group BASE).
Couple the probe to the calibration block.
group BASE). The calibration echo must be dis-
played on the screen.
Position the gate on one of the calibration echoes
until the sound path of the echo is indicated in the
measurement line.
After this, change the adjustment of the function
P-DELAY (function group BASE) until the correct
sound path for the selected calibration echo is
indicated in the measurement line.
Example:
You are carrying out the calibration for the calibration
range of 100 mm/5" via the function group BASE using
the calibration block V1 (thickness 25 mm/1") which is
laid flatwise.
Set RANGE to 100 mm/5".
Set the known material velocity of 5920 m/s
(233 "/ms) in MTLVEL.
Set the gate so that it is positioned on the first
calibration echo (from 25 mm/1").
Read the sound path in the measurement line. If this
value is not equal to 25 mm/1", change the adjust-
ment for the function P-DELAY until it is at 25 mm/1".
This completes the calibration of the USM 35X to the
material velocity of 5920 m/s (233 "/ms) with a calibra-
tion range of 100 mm/5" for the probe used.
Case B: With unknown material velocity
Use the semiautomatic calibration function of the
USM 35X via the function group CAL for this calibration
case.
The distances between 2 calibration echoes must be
entered as default data. The USM 35X will then carry
out a plausibility check, calculate the material velocity
and the probe delay, and automatically set the parame-
ters.
Calibration process
group BASE). The two calibraion echoes selected
must be displayed on the screen. Set the range so
that the second calibration echo is located on the
right edge of the screen.
Select the function group CAL.
Enter the distances of the two calibation echoes in
S-REF1 and S-REF2.
Position the gate (function aSTART) on the first
calibration echo.
Press to record the first calibration echo.
The recording of the first calibration echo is con-
firmed by the message Echo is recorded, and the
function CAL indicates the value 1.
Move the gate to the second calibration echo.
Press to record the second calibration echo.
Case B: With unknown material velocity
Use the semiautomatic calibration function of the
USM 35X via the function group CAL for this calibration
case.
The distances between 2 calibration echoes must be
entered as default data. The USM 35X will then carry
out a plausibility check, calculate the material velocity
and the probe delay, and automatically set the parame-
ters.
Calibration process
group BASE). The two calibraion echoes selected
must be displayed on the screen. Set the range so
that the second calibration echo is located on the
right edge of the screen.
Enter the distances of the two calibation echoes in
S-REF1 and S-REF2.
calibration echo.
The recording of the first calibration echo is con-
firmed by the message Echo is recorded, and the
function CAL indicates the value 1.
The correct calibration is confirmed by the message
Calibration is done.
The USM 35X will now automatically determine the
sound velocity and the probe delay and set the corre-
sponding functions accordingly. The value of the func-
tion CAL jumps back to 0.
H Note:
If the instrument is not able to carry out any valid cali-
bration on the basis of the input values and the echoes
recorded, a corresponding error message is displayed.
In that case, please check the values of your calibra-
tion lines and repeat the process of recording the cali-
bration echoes.
Example
Enter the distances (thicknesses) of the two calibra-
tion lines S-REF1 (20 mm) and S-REF2 (40 mm).
Position the gate on the first calibration echo.
Calibration is done.
The USM 35X will now automatically determine the
sound velocity and the probe delay and set the corre-
sponding functions accordingly. The value of the func-
tion CAL jumps back to 0.
H Note:
If the instrument is not able to carry out any valid cali-
bration on the basis of the input values and the echoes
recorded, a corresponding error message is displayed.
In that case, please check the values of your calibra-
tion lines and repeat the process of recording the cali-
bration echoes.
Example
Enter the distances (thicknesses) of the two calibra-
tion lines S-REF1 (20 mm) and S-REF2 (40 mm).
Position the gate on the first calibration echo.
Position the gate on the second calibration echo:
Press .
The second echo is stored, the calibration is carried
out, and the CAL function is reset to 0. The valid cali-
bration is briefly confirmed and carried out.
If you select the function group BASE, you can read
the material velocity and probe delay.
Calibration with dual-element (TR) probes
Dual-element (TR) probes are especially used for wall
thickness measurement. The following peculiarities
must be taken into account when using these probes:
Echo flank
Most dual-element (TR) probes have a roof angle
(transducer elements with inclined orientation toward
the test surface). This causes mode conversions both
at beam index (sound entry into the material) and at the
reflection from the backwall, which can result in very
jagged echoes.
V-path error
Dual-element (TR) probes produce a v-shaped sound
path from the pulser via the reflection from the backwall
to the receiver element. This so-called V-path error
affects the measuring accuracy. You should therefore
choose two wall thicknesses that cover the expected
thickness measurement range for the calibration. In this
way, the V-path error can be corrected to the greatest
possible extent.
Position the gate on the second calibration echo:
Press .
The second echo is stored, the calibration is carried
out, and the CAL function is reset to 0. The valid cali-
bration is briefly confirmed and carried out.
If you select the function group BASE, you can read
the material velocity and probe delay.
Calibration with dual-element (TR) probes
Dual-element (TR) probes are especially used for wall
thickness measurement. The following peculiarities
must be taken into account when using these probes:
Echo flank
Most dual-element (TR) probes have a roof angle
(transducer elements with inclined orientation toward
the test surface). This causes mode conversions both
at beam index (sound entry into the material) and at the
reflection from the backwall, which can result in very
jagged echoes.
V-path error
Dual-element (TR) probes produce a v-shaped sound
path from the pulser via the reflection from the backwall
to the receiver element. This so-called V-path error
affects the measuring accuracy. You should therefore
choose two wall thicknesses that cover the expected
thickness measurement range for the calibration. In this
way, the V-path error can be corrected to the greatest
possible extent.
Higher material velocity
Due to the V-path error, a higher material velocity than
that of the test material is given during calibration, es-
pecially with small thicknesses. This is typical of dual-
element (TR) probes and serves for compensation of
the V-path error.
With small wall thicknesses, the above-described effect
leads to an echo amplitude drop which has to be espe-
cially taken into account with thicknesses less than
2 mm/0.08".
A stepped reference block having different wall thick-
nesses is required for calibration. The wall thicknesses
must be selected so that they cover the expected read-
ings.
Calibration process:
We recommend to use the semiautomatic calibration
function for the calibration with T/R probes.
Set the required test range.
Increase the probe delay (P-DELAY) until the two
calibration lines are displayed within the range.
Set the pulser and receiver functions according to
the probe used and the test application.
Set the function TOF (function group MEAS) to
flank.
Vary the gain so that the highest echo reaches
approximately the full screen height.
Set the gate threshold to the required height for
measuring the sound paths at the echo flanks.
Enter the distances of the two calibration echoes in
S-REF1 and S-REF2.
calibration echo.
Couple the probe to the calibration block containing
the second calibration line, and set the height so that
its about as high as the first calibration echo.
Higher material velocity
Due to the V-path error, a higher material velocity than
that of the test material is given during calibration, es-
pecially with small thicknesses. This is typical of dual-
element (TR) probes and serves for compensation of
the V-path error.
With small wall thicknesses, the above-described effect
leads to an echo amplitude drop which has to be espe-
cially taken into account with thicknesses less than
2 mm/0.08".
A stepped reference block having different wall thick-
nesses is required for calibration. The wall thicknesses
must be selected so that they cover the expected read-
ings.
Calibration process:
We recommend to use the semiautomatic calibration
function for the calibration with T/R probes.
Set the required test range.
Increase the probe delay (P-DELAY) until the two
calibration lines are displayed within the range.
Set the pulser and receiver functions according to
the probe used and the test application.
Set the function TOF (function group MEAS) to
flank.
Vary the gain so that the highest echo reaches
approximately the full screen height.
Set the gate threshold to the required height for
measuring the sound paths at the echo flanks.
Enter the distances of the two calibration echoes in
S-REF1 and S-REF2.
calibration echo.
Couple the probe to the calibration block containing
the second calibration line, and set the height so that
its about as high as the first calibration echo.
Calibration is done. The material velocity and
probe delay are set. The value of the CAL function
goes back to 0.
If necessary, check the calibration on one or several
known calibration lines, e.g. using the stepped
reference block VW.
H Note:
Always keep in mind that the measured value is deter-
mined at the intersection point of gate and echo flank
when the function TOF was set to flank. A correct set-
ting of the echo height and gate threshold is therefore
decisive for accurate calibration and measurement!
Calibrations or measurements in the peak mode are
mostly not possible when using dual-element (TR)
probes. As the echoes are often very broad and jagged,
a clear echo peak cannot always be found in these
cases.
5.8 Measuring
General notes
Please pay attention to the following notes when mea-
suring with the USM 35X.
Condition for measurements is the correct instrument
calibration (sound velocity, probe delay).
All amplitude measurements are carried out at the
highest or the first signal in the gate.
All distance measurements are carried out at the
intersection point of gate and the first echo flank
(TOF = flank or jflank), or at the peak of the highest
echo (TOF = peak).
If the echo amplitudes do not succeed 5 % screen
height all sound path and amplitude measurements
will be suppressed. Thus, rapidly changing random
measurements caused by the instruments back-
ground noise are avoided.
Calibration is done. The material velocity and
probe delay are set. The value of the CAL function
goes back to 0.
If necessary, check the calibration on one or several
known calibration lines, e.g. using the stepped
reference block VW.
H Note:
Always keep in mind that the measured value is deter-
mined at the intersection point of gate and echo flank
when the function TOF was set to flank. A correct set-
ting of the echo height and gate threshold is therefore
decisive for accurate calibration and measurement!
Calibrations or measurements in the peak mode are
mostly not possible when using dual-element (TR)
probes. As the echoes are often very broad and jagged,
a clear echo peak cannot always be found in these
cases.
5.8 Measuring
General notes
Please pay attention to the following notes when mea-
suring with the USM 35X.
Condition for measurements is the correct instrument
calibration (sound velocity, probe delay).
All amplitude measurements are carried out at the
highest or the first signal in the gate.
All distance measurements are carried out at the
intersection point of gate and the first echo flank
(TOF = flank or jflank), or at the peak of the highest
echo (TOF = peak).
If the echo amplitudes do not succeed 5 % screen
height all sound path and amplitude measurements
will be suppressed. Thus, rapidly changing random
measurements caused by the instruments back-
ground noise are avoided.
Operation Measuring
The following example shows the dependency of dis-
tance measurement on the echo waveform, i.e. on the
height of the gate threshold and thus on the selection of
the intersection point at the signal.
H Note:
The point of amplitude measurement is marked with a
small upward triangle on the corresponding gate bar.
The point of distance measurement is marked with a
small downward triangle.
Gate threshold at 20 %
measured sound path: 24.44 mm
Operation Measuring
The following example shows the dependency of dis-
tance measurement on the echo waveform, i.e. on the
height of the gate threshold and thus on the selection of
the intersection point at the signal.
H Note:
The point of amplitude measurement is marked with a
The point of distance measurement is marked with a
Operation
(function group REF)
You can evaluate reflector echoes by means of refer-
ence echoes. The function group REF makes all func-
tions for the echo comparison between a reflector echo
and a reference echo available to you.
If required, go to the second operating level.
Select the function group REF.
Measurement of dB difference (function group REF)
H Note:
Depending on the setting in the function EVAMOD
(function group CFG2), one of the function groups
AWS, DAC, JDAC, or DGS may also be displayed at
this point. Please also refer to chapter 5.15 General
configuration.
You will find the following function:
REFECHO Storing or deleting the reference echo
REFMOD Activating the measurement of
dB difference
aSTART Positioning the A gate
The functions are described in the order in which you
need them during your work.
Operation
(function group REF)
You can evaluate reflector echoes by means of refer-
ence echoes. The function group REF makes all func-
tions for the echo comparison between a reflector echo
and a reference echo available to you.
Select the function group REF.
H Note:
(function group CFG2), one of the function groups
AWS, DAC, JDAC, or DGS may also be displayed at
this point. Please also refer to chapter 5.15 General
configuration.
You will find the following function:
REFECHO Storing or deleting the reference echo
REFMOD Activating the measurement of
dB difference
aSTART Positioning the A gate
Operation
Recording a reference echo
Before using the measurement of dB difference, you
have to first record a reference echo.
A Attention:
When recording a reference echo, an already stored
reference echo is overwritten after a corresponding
warning.
Peak the reference echo according to the test
specification.
Position the A gate over the reference echo using the
function aSTART.
Select the function REFECHO.
Turn the right-hand rotary knob upward in order to
store the echo in gate A as a reference echo.
If necessary, confirm the warning message in order
to overwrite a stored reference echo.
The reference echo is now recorded. An inverted R is
shown in the measurement line.
Deleting a reference echo
You can delete stored reference echoes.
Turn the right-hand rotary knob downward in order to
delete the reference echo.
to delete the stored reference echo.
Operation
Recording a reference echo
Before using the measurement of dB difference, you
have to first record a reference echo.
A Attention:
When recording a reference echo, an already stored
reference echo is overwritten after a corresponding
warning.
Peak the reference echo according to the test
specification.
Position the A gate over the reference echo using the
function aSTART.
Turn the right-hand rotary knob upward in order to
store the echo in gate A as a reference echo.
to overwrite a stored reference echo.
The reference echo is now recorded. An inverted R is
shown in the measurement line.
Deleting a reference echo
You can delete stored reference echoes.
Turn the right-hand rotary knob downward in order to
delete the reference echo.
to delete the stored reference echo.
Operation
Echo comparison
You can compare the echo of any reflector of your
choice with the reference echo. The displayed result is
the dB difference of the two echoes.
H Note:
The dB difference is independent of any possible gain
variation.
Choose Ha dB or Hb dB as measured value.
Position the A gate over the echo.
Select the function REFMOD.
Activate the function by means of the right-hand
rotary knob.
The dB difference between the reference echo and
the reflector echo is now displayed as the measured
value.
Measurement of dB difference(function group REF)
Operation
Echo comparison
You can compare the echo of any reflector of your
choice with the reference echo. The displayed result is
the dB difference of the two echoes.
H Note:
The dB difference is independent of any possible gain
variation.
Choose Ha dB or Hb dB as measured value.
Position the A gate over the echo.
Select the function REFMOD.
Activate the function by means of the right-hand
rotary knob.
The dB difference between the reference echo and
the reflector echo is now displayed as the measured
value.
Measurement of dB difference(function group REF)
Operation
5.10 Classification of welds
(function group AWS)
You can rate flaws in welds according to the specifica-
tion AWS D1.1. You will find the corresponding functions
in the function group AWS.
If necessary, change to the second operation level.
Select the function group AWS.
Classification of welds (function group AWS)
H Note:
Double assignment of the function INDICA/aSTART.
Press the corresponding key repeatedly to toggle
between the functions.
H Note:
(function group CFG2), one of the function groups REF,
DAC, JDAC, or DGS may also be displayed at this
point. Please also refer to chapter 5.15 General configu-
ration.
Rating of welds according to AWS
The rating of flaws in welds according to the AWS
specifications is based on an evaluation of the signal
amplitude. In this process, the echo amplitude of the
flaw echo is compared with the echo amplitude of a
known reference reflector. In addition, the sound attenu-
ation in the workpiece is also taken into consideration.
The result is a dB value which is called flaw rating. The
flaw rating D is calculated according to the formula:
Operation
5.10 Classification of welds
(function group AWS)
You can rate flaws in welds according to the specifica-
tion AWS D1.1. You will find the corresponding functions
in the function group AWS.
If necessary, change to the second operation level.
Select the function group AWS.
H Note:
Double assignment of the function INDICA/aSTART.
H Note:
(function group CFG2), one of the function groups REF,
DAC, JDAC, or DGS may also be displayed at this
point. Please also refer to chapter 5.15 General configu-
ration.
The rating of flaws in welds according to the AWS
specifications is based on an evaluation of the signal
amplitude. In this process, the echo amplitude of the
flaw echo is compared with the echo amplitude of a
known reference reflector. In addition, the sound attenu-
ation in the workpiece is also taken into consideration.
The result is a dB value which is called flaw rating. The
flaw rating D is calculated according to the formula:
Operation
D = A B C
with:
A = Indication (in dB)
Absolute instrument gain with which the maximum
flaw echo is at 50 % (5 %) echo height
B = Reference (in dB)
reference echo (1.5 mm side-drilled hole from the
reference block 1) is at 50 % (5 %) echo height
C = Attenuation (in dB)
This value is calculated according to the formula
C = 0.079 dB/mm (s 25.4 mm). With s = sound
path of the flaw echo.
The sound attenuation correction is automatically
calculated and displayed by the instrument. For
sound paths smaller than or equal to 25.4 mm
(1 inch), the value is set to zero.
D = D 1.1 Rating (in dB)
This is the result of the evaluation according to AWS.
The evaluation is carried out in the USM 35X accord-
ing to the formula indicated above.
H Notes:
Make sure that all instrument options for the special
test are calibrated before starting with the rating ac-
cording to AWS.
Pay attention to peaking an echo with an amplitude
between 45 % and 55 % screen height. A rating is not
possible with other amplitudes.
Apply couplant, and couple the probe to the refer-
ence block 1. Peak the echo from the 1.5 mm side-
drilled hole.
Select the function aSTART, and set up the A gate
on the reference echo.
Vary the gain so that the reference echo is displayed
at 50 % screen height.
Choose the function REFRNCE, and confirm the
choice in order to save the reference gain.
Operation
D = A B C
with:
A = Indication (in dB)
flaw echo is at 50 % (5 %) echo height
B = Reference (in dB)
reference echo (1.5 mm side-drilled hole from the
reference block 1) is at 50 % (5 %) echo height
C = Attenuation (in dB)
This value is calculated according to the formula
C = 0.079 dB/mm (s 25.4 mm). With s = sound
path of the flaw echo.
The sound attenuation correction is automatically
calculated and displayed by the instrument. For
sound paths smaller than or equal to 25.4 mm
(1 inch), the value is set to zero.
D = D 1.1 Rating (in dB)
This is the result of the evaluation according to AWS.
The evaluation is carried out in the USM 35X accord-
ing to the formula indicated above.
H Notes:
Make sure that all instrument options for the special
test are calibrated before starting with the rating ac-
cording to AWS.
Pay attention to peaking an echo with an amplitude
between 45 % and 55 % screen height. A rating is not
possible with other amplitudes.
Apply couplant, and couple the probe to the refer-
ence block 1. Peak the echo from the 1.5 mm side-
drilled hole.
on the reference echo.
Vary the gain so that the reference echo is displayed
at 50 % screen height.
Choose the function REFRNCE, and confirm the
choice in order to save the reference gain.
Operation
Couple the probe to the test object in order to evalu-
ate a flaw echo.
on the flaw echo.
Vary the gain so that the flaw echo is displayed at
50 % screen height.
Go to the function group AWS.
Save the current gain using the function INDICA. The
current gain is saved. The USM 35X will automatical-
ly determine the values of the AWS variables C and
D. You can then evaluate the rating D using the
corresponding requirements from AWS.
Operation
Couple the probe to the test object in order to evalu-
ate a flaw echo.
on the flaw echo.
Vary the gain so that the flaw echo is displayed at
50 % screen height.
Go to the function group AWS.
Save the current gain using the function INDICA. The
current gain is saved. The USM 35X will automatical-
ly determine the values of the AWS variables C and
D. You can then evaluate the rating D using the
corresponding requirements from AWS.
Operation
5.11 Calculation of flaw position
(function group TRIG)
In the function group TRIG you will find the functions for
setting the flaw position calculation when using angle-
beam probes.
Select the function group TRIG.
Calculation of flaw position (function group TRIG)
H Note:
Double assignment of the function X-VALU/COLOR.
The functions in the group TRIG enable to automatically
calculate the (reduced) projection distance and the real
depth of the flaw in addition to the sound path S, and to
digitally display them in the measurement line.
Projection distance PD:
distance of probe index (sound exit point) from the
position of the flaw, projected on the surface
Reduced projection distance rPD:
distance of the probes leading face from the position
of the flaw, projected on the surface
Depth d:
Distance between flaw position and surface
Operation
5.11 Calculation of flaw position
(function group TRIG)
In the function group TRIG you will find the functions for
setting the flaw position calculation when using angle-
beam probes.
Select the function group TRIG.
H Note:
Double assignment of the function X-VALU/COLOR.
The functions in the group TRIG enable to automatically
calculate the (reduced) projection distance and the real
depth of the flaw in addition to the sound path S, and to
digitally display them in the measurement line.
Projection distance PD:
distance of probe index (sound exit point) from the
position of the flaw, projected on the surface
Reduced projection distance rPD:
distance of the probes leading face from the position
of the flaw, projected on the surface
Depth d:
Distance between flaw position and surface
Operation
When using angle-beam probes, the instrument can
additionally calculate the sound path section or so-
called leg L up to the next reflection point. This sound
path section or leg can be displayed as the measured
value La, Lb, or Lc.
ANGLE (Angle of incidence)
The ANGLE function enables you to adjust the angle of
incidence of your probe for the material used. This val-
ue is required for the automatic calculation of the flaw
position.
Adjustment range: 0 ... 90
Select the ANGLE function.
Use the right-hand rotary knob to select the required
setting.
X-VALUE (X-value of the probe)
The function X-VALUE enables you to set the X-value
(distance between the probes leading face and probe
index/sound exit point) of the probe used. This value is
required for the automatic calculation of the reduced
projection distance.
Adjustment range: 0 ... 100 mm/0 ... 40"
Select the function X-VALUE.
Use the right-hand rotary knob to set the required value.
Operation
When using angle-beam probes, the instrument can
additionally calculate the sound path section or so-
called leg L up to the next reflection point. This sound
path section or leg can be displayed as the measured
value La, Lb, or Lc.
ANGLE (Angle of incidence)
The ANGLE function enables you to adjust the angle of
incidence of your probe for the material used. This val-
ue is required for the automatic calculation of the flaw
position.
Adjustment range: 0 ... 90
Select the ANGLE function.
setting.
X-VALUE (X-value of the probe)
The function X-VALUE enables you to set the X-value
(distance between the probes leading face and probe
index/sound exit point) of the probe used. This value is
required for the automatic calculation of the reduced
projection distance.
Adjustment range: 0 ... 100 mm/0 ... 40"
Select the function X-VALUE.
Operation Calculation of flaw position (function group TRIG)
COLOR
To make the orientation easier, the instrument is able to
display the different sound path sections or legs in dif-
ferent ways. You can choose between two display modes:
1 The A-scan is shown in another color in every leg.
Leg 1 in magenta
Leg 2 in blue
Leg 3 in magenta
2 The legs are shown as background shadings.
off No legs are displayed.
Select the function COLOR.
mode.
THICKNE (Material thickness)
Use the THICKNE function to set the materials wall
thickness. This value is required for the automatic cal-
culation of the real depth.
Adjustment range: 1 ... 1000 mm/0.05 ... 400"
Select the THICKNE function.
DIAMET (Outside diameter of the test object)
You will need the DIAMET function for tests on circular
curved surfaces, for example when testing longitudinal-
ly welded tubes. In order to make the USM 35X carry
out the corresponding correction of (reduced) projection
distance and depth, you should enter the outside diam-
eter of your test object in this function.
If you plan to carry out the flaw position calculation for
plane-parallel (flat) test objects, the DIAMET function
should be set to flat.
Adjustment range:
10 ... 2000 mm/0.4 ... 800"
flat
Select the DIAMET function.
value.
Operation Calculation of flaw position (function group TRIG)
COLOR
To make the orientation easier, the instrument is able to
display the different sound path sections or legs in dif-
ferent ways. You can choose between two display modes:
1 The A-scan is shown in another color in every leg.
Leg 1 in magenta
Leg 2 in blue
Leg 3 in magenta
2 The legs are shown as background shadings.
off No legs are displayed.
Select the function COLOR.
mode.
THICKNE (Material thickness)
Use the THICKNE function to set the materials wall
thickness. This value is required for the automatic cal-
culation of the real depth.
Adjustment range: 1 ... 1000 mm/0.05 ... 400"
Select the THICKNE function.
DIAMET (Outside diameter of the test object)
You will need the DIAMET function for tests on circular
curved surfaces, for example when testing longitudinal-
ly welded tubes. In order to make the USM 35X carry
out the corresponding correction of (reduced) projection
distance and depth, you should enter the outside diam-
eter of your test object in this function.
If you plan to carry out the flaw position calculation for
plane-parallel (flat) test objects, the DIAMET function
should be set to flat.
Adjustment range:
10 ... 2000 mm/0.4 ... 800"
flat
Select the DIAMET function.
value.
Operation
5.12 Data saving
(function group MEM)
You will find all functions for storing, recalling and delet-
ing complete data sets in the function group MEM.
Select the function group MEM.
Data saving (function group MEM)
A data set contains all instrument settings as well as
the A-scan. This means that whenever you recall a
stored data set, your instrument is again set up exactly
the same as it was at the moment when the data set
was stored. This makes each one of your tests repro-
ducible.
You will find the following functions:
SET-# selecting number of a data set
RECALL recalling a stored data set
STORE storing a data set
DELETE deleting a data set
Operation
5.12 Data saving
(function group MEM)
You will find all functions for storing, recalling and delet-
ing complete data sets in the function group MEM.
Select the function group MEM.
A data set contains all instrument settings as well as
the A-scan. This means that whenever you recall a
stored data set, your instrument is again set up exactly
the same as it was at the moment when the data set
was stored. This makes each one of your tests repro-
ducible.
You will find the following functions:
SET-# selecting number of a data set
RECALL recalling a stored data set
STORE storing a data set
DELETE deleting a data set
Operation
Storing a data set
You can save your current setup to a data set.
Select the function SET-#.
Use the right-hand rotary knob to set the number
where you would want to store the current data set
(1 to 200).
Select the function STORE.
Use the right-hand rotary knob to set it to on.
The USM 35X stores the current data set. When the
storage process is completed, the function STORE is
automatically reset to off.
H Note:
The asterisk (*) before a selected data set number indi-
cates that this data set is already occupied. It is not
possible to overwrite an occupied data set; select an-
other data set which is still empty, or delete the occu-
pied data set. To avoid loss of data e.g. in case of a
software update you should save the data sets to a PC.
All active entries in the information table (TESTINF) are
automatically allocated to the data set being stored
(see chapter 5.13 Dataset management).
Deleting a data set
An occupied data set is marked with an asterisk (*)
before the data set number. You can delete these data
sets if you no longer need them.
Use the right-hand rotary knob to set the number of
the data set that you want to delete.
Select the function DELETE.
Use the right-hand rotary knob to set it to on. The
measurement line will then prompt: Delete data set?
Confirm by pressing the corresponding key one
more time (all other keys would abort the process).
The data set is now deleted; the asterisk preceding
the data set number is no longer there. The function
DELETE is automatically reset to off.
Operation
Storing a data set
You can save your current setup to a data set.
Use the right-hand rotary knob to set the number
where you would want to store the current data set
(1 to 200).
Select the function STORE.
Use the right-hand rotary knob to set it to on.
The USM 35X stores the current data set. When the
storage process is completed, the function STORE is
H Note:
The asterisk (*) before a selected data set number indi-
cates that this data set is already occupied. It is not
possible to overwrite an occupied data set; select an-
other data set which is still empty, or delete the occu-
pied data set. To avoid loss of data e.g. in case of a
software update you should save the data sets to a PC.
All active entries in the information table (TESTINF) are
automatically allocated to the data set being stored
(see chapter 5.13 Dataset management).
Deleting a data set
An occupied data set is marked with an asterisk (*)
before the data set number. You can delete these data
sets if you no longer need them.
the data set that you want to delete.
measurement line will then prompt: Delete data set?
The data set is now deleted; the asterisk preceding
the data set number is no longer there. The function
DELETE is automatically reset to off.
Operation
Deleting all data set
You can delete all data sets if you no longer need them.
H Note:
Double assignment of the function DELETE/DELALL.
measurement line will then prompt: Delete all data
sets?
All data sets are now deleted. The function DELETE is
Recalling a stored data set
You can recall a stored data set; your instrument will
then be provided with all the test-relevant technical
features that existed at the moment of the setup. A
frozen display of the stored A-scan appears.
A Attention:
If a saved data set is loaded, the current instrument
setup is lost. If necessary, save the current instrument
setup to a new data set before loading a saved data
set.
Operation
Deleting all data set
You can delete all data sets if you no longer need them.
H Note:
Double assignment of the function DELETE/DELALL.
measurement line will then prompt: Delete all data
sets?
All data sets are now deleted. The function DELETE is
Recalling a stored data set
You can recall a stored data set; your instrument will
then be provided with all the test-relevant technical
features that existed at the moment of the setup. A
frozen display of the stored A-scan appears.
A Attention:
If a saved data set is loaded, the current instrument
setup is lost. If necessary, save the current instrument
setup to a new data set before loading a saved data
set.
Operation
the data set that you want to recall.
Select the function RECALL.
measurement line will then prompt: Recall data set?
The data set is now loaded and the current setup is
overwritten. When the loading process is completed, the
function RECALL is automatically reset to off.
H Note:
The gate for surveying the echo can be moved in the
recalled A-scan. However, as the evaluation is made in
the frozen A-scan, the measurement resolution is only
0.5 % of the adjusted calibration range.
Operation
the data set that you want to recall.
Select the function RECALL.
measurement line will then prompt: Recall data set?
The data set is now loaded and the current setup is
overwritten. When the loading process is completed, the
function RECALL is automatically reset to off.
H Note:
The gate for surveying the echo can be moved in the
recalled A-scan. However, as the evaluation is made in
the frozen A-scan, the measurement resolution is only
0.5 % of the adjusted calibration range.
Operation
5.13 Dataset management
(function group DATA)
The USM 35X offers comprehensive functions for an
easy dataset management.
Select the function group DATA.
The functions in the function group DATA enable you to
easily manage the data sets stored in the USM 35X.
The following functions are available:
TESTINF You can save a lot of additional informa-
tion for every data set, e.g. data on the
test object, on the flaw detected, or com-
ments.
PREVIEW In this dataset preview you will see the
A-scan, the dataset name and the storage
date of each data set.
DIR This function enables you to display a list
of all stored data sets, including the corre-
sponding dataset names.
SETTING This is where you will see a list of func-
tions including all settings of the current
data set.
Dataset management (function group DATA)
Operation
5.13 Dataset management
(function group DATA)
The USM 35X offers comprehensive functions for an
easy dataset management.
Select the function group DATA.
The functions in the function group DATA enable you to
easily manage the data sets stored in the USM 35X.
The following functions are available:
TESTINF You can save a lot of additional informa-
tion for every data set, e.g. data on the
test object, on the flaw detected, or com-
ments.
PREVIEW In this dataset preview you will see the
A-scan, the dataset name and the storage
date of each data set.
DIR This function enables you to display a list
of all stored data sets, including the corre-
sponding dataset names.
SETTING This is where you will see a list of func-
tions including all settings of the current
data set.
Operation
TESTINF (Storing additional information)
For every data set, you can store additional information
which will support you in the easy management of the
data sets. You have 9 fields at your disposal for this
purpose.
You can enter a maximum of 24 alphanumeric charac-
ters in the following fields:
DATNAME Dataset name
OBJECT Object description
FLAWIND Flaw indication
OPERAT Name of the person carrying out the test
SURFACE Surface quality
COMMENT Comments
You can enter numerical values in these fields:
FLAWLEN Flaw length
X-POS x-position coordinate
Y-POS y-position coordinate
You can
save the current settings together with the edited
additional information at a new and still empty
dataset number (analogously to function STORE in
the function group MEM),
subsequently enter and save additional information
for an already stored data set,
overwrite the already saved additional information of
a data set.
Use the right-hand rotary knob to select and acitvate
the function TESTINF. The table will now show the
additional information saved for the currently select-
ed data set.
Use (INFO 3) and to select the field SET-#.
Use the right-hand rotary knob to view the additional
information for other data sets and to edit this
information if required.
Operation
TESTINF (Storing additional information)
For every data set, you can store additional information
which will support you in the easy management of the
data sets. You have 9 fields at your disposal for this
purpose.
You can enter a maximum of 24 alphanumeric charac-
ters in the following fields:
DATNAME Dataset name
OBJECT Object description
FLAWIND Flaw indication
OPERAT Name of the person carrying out the test
SURFACE Surface quality
COMMENT Comments
You can enter numerical values in these fields:
FLAWLEN Flaw length
X-POS x-position coordinate
Y-POS y-position coordinate
You can
save the current settings together with the edited
additional information at a new and still empty
dataset number (analogously to function STORE in
the function group MEM),
subsequently enter and save additional information
for an already stored data set,
overwrite the already saved additional information of
a data set.
Use the right-hand rotary knob to select and acitvate
the function TESTINF. The table will now show the
additional information saved for the currently select-
ed data set.
Use (INFO 3) and to select the field SET-#.
Use the right-hand rotary knob to view the additional
information for other data sets and to edit this
information if required.
Operation
H Note:
All stored data are displayed for data sets which are
already occupied. An occupied data set is marked with
an asterisk (*) before the data set number. If you have
selected an empty data set, the field data of the previ-
ously displayed data set are automatically transferred.
However, the data in the numerical fields FLAWLEN,
X-POS and Y-POS are deleted. This means that you
only have to edit the variable fields in test applications
which include continuous saving of results. All alpha-
numerical field data are automatically transferred but
can also be edited if necessary.
Editing additional information
You can edit all items with additional information.
A Attention:
As long as the field data edited in this table have not
been saved, the previous entries remain valid. Please
keep this in mind, e.g. before selecting a new dataset
number: all changes in the current data set are lost!
Select the required field.
Use the left-hand rotary knob to mark the required
character position.
Use the right-hand rotary knob to select the charac-
ter for this position. You only need the right-hand
rotary knob to enter the numerical values in
FLAWLEN, X-POS and Y-POS.
H Note:
You cannot edit the field SET-#. The number of the cur-
rent data set is displayed here.
Operation
H Note:
All stored data are displayed for data sets which are
already occupied. An occupied data set is marked with
an asterisk (*) before the data set number. If you have
selected an empty data set, the field data of the previ-
ously displayed data set are automatically transferred.
However, the data in the numerical fields FLAWLEN,
X-POS and Y-POS are deleted. This means that you
only have to edit the variable fields in test applications
which include continuous saving of results. All alpha-
numerical field data are automatically transferred but
can also be edited if necessary.
Editing additional information
You can edit all items with additional information.
A Attention:
As long as the field data edited in this table have not
been saved, the previous entries remain valid. Please
keep this in mind, e.g. before selecting a new dataset
number: all changes in the current data set are lost!
Select the required field.
Use the left-hand rotary knob to mark the required
character position.
Use the right-hand rotary knob to select the charac-
ter for this position. You only need the right-hand
rotary knob to enter the numerical values in
FLAWLEN, X-POS and Y-POS.
H Note:
You cannot edit the field SET-#. The number of the cur-
rent data set is displayed here.
Operation
Storing additional information
A Attention:
If you have edited already existing additional informa-
tion, all previous additional information is overwritten
when the data are stored.
Select the field STO-INF.
Use the right-hand rotary knob to set this function
on. The currently displayed data of the fields are now
stored. The function STO-INF is automatically reset
to off at the end of data storage.
If necessary, press one of the keys , or to
go back to the A-scan without storing the data.
H Note:
In the case of previously empty data sets, all instru-
ment settings and the current A-scan are stored simul-
taneously with the edited field data. Only the edited
field data are stored for the previously occupied data
sets. Previously stored instrument settings and
A-scans are kept.
PREVIEW (Dataset preview)
This function enables you to view the A-scans of all
stored data sets.
Select the PREVIEW function.
Use the right-hand rotary knob to set the function to
on. The A-scan and the name of the first data set are
displayed.
Viewing other data sets:
Select the SET-# function.
Use the right-hand rotary knob to select the number
of the required data set.
Select the RECALL function.
on. The selected data set is displayed.
If necessary, confirm the message using the corre-
sponding key .
go back to the currently active A-scan.
Operation
Storing additional information
A Attention:
If you have edited already existing additional informa-
tion, all previous additional information is overwritten
when the data are stored.
Select the field STO-INF.
Use the right-hand rotary knob to set this function
on. The currently displayed data of the fields are now
stored. The function STO-INF is automatically reset
to off at the end of data storage.
go back to the A-scan without storing the data.
H Note:
In the case of previously empty data sets, all instru-
ment settings and the current A-scan are stored simul-
taneously with the edited field data. Only the edited
field data are stored for the previously occupied data
sets. Previously stored instrument settings and
A-scans are kept.
PREVIEW (Dataset preview)
This function enables you to view the A-scans of all
stored data sets.
Select the PREVIEW function.
on. The A-scan and the name of the first data set are
displayed.
Viewing other data sets:
Select the SET-# function.
Use the right-hand rotary knob to select the number
of the required data set.
Select the RECALL function.
on. The selected data set is displayed.
If necessary, confirm the message using the corre-
sponding key .
Operation
DIR (Dataset directory)
This function enables you to get an overview of all
stored data sets, including their names and numbers.
Select the DIR function.
on.
The directory list of the stored data sets is displayed
(dataset numbers and names). The display shows
12 data sets at a time. Occupied data sets are
marked with an asterisk (*).
Turn the right-hand rotary knob to have other data
sets displayed. The list always advances by one line
each.
SETTING (Function list)
This function provides you with an overview of all set
functions of the current data set.
Select the SETTING function.
on. The list of the currently set functions is displayed.
Turn the right-hand rotary knob to have other lines
displayed. The list is advanced by one line each.
Operation
DIR (Dataset directory)
This function enables you to get an overview of all
stored data sets, including their names and numbers.
Select the DIR function.
on.
The directory list of the stored data sets is displayed
(dataset numbers and names). The display shows
12 data sets at a time. Occupied data sets are
marked with an asterisk (*).
Turn the right-hand rotary knob to have other data
sets displayed. The list always advances by one line
each.
SETTING (Function list)
This function provides you with an overview of all set
functions of the current data set.
Select the SETTING function.
on. The list of the currently set functions is displayed.
Turn the right-hand rotary knob to have other lines
displayed. The list is advanced by one line each.
Operation
5.14 Configuring the USM 35X for
a test application
Besides the default settings for the instrument opera-
tion, you have to configure the USM 35X for calibration
and test tasks. You will find the corresponding functions
in the function groups MEAS, MSEL and LCD.
In addition, you have to check the current time and
date, and set them if required, so that they are correctly
stored together with the test results. Please look up the
function groups CFG1 and CFG2 for more functions for
the general instrument setup (please refer to chapter
5.15 General configuration).
If required, go to the third operating level.
Select the function group MEAS.
Configuring the USM 35X for a test application
Operation
5.14 Configuring the USM 35X for
a test application
Besides the default settings for the instrument opera-
tion, you have to configure the USM 35X for calibration
and test tasks. You will find the corresponding functions
in the function groups MEAS, MSEL and LCD.
In addition, you have to check the current time and
date, and set them if required, so that they are correctly
stored together with the test results. Please look up the
function groups CFG1 and CFG2 for more functions for
the general instrument setup (please refer to chapter
5.15 General configuration).
Select the function group MEAS.
Operation
TOF (Selecting the measuring point)
on the selected measuring point which can be adjusted
either to flank, to peak or to jflank in the USM 35X.
The point of amplitude measurement is marked by a
The point of distance measurement is marked by a
H Note:
While DAC, TCG or JISDAC is active you can change
the TOF mode from peak to flank.
When adjusted to flank or jflank the sound path mea-
surement is made at the point of intersection of the
monitor gate with the rising flank of the highest echo in
the gate.
measured soundpath: 19,44 mm
amplitude: 94 %
A Attention:
The highest echo in the gate does not have to be the
echo for which the sound path has been measured. This
may lead to false echo evaluation!
Operation
TOF (Selecting the measuring point)
on the selected measuring point which can be adjusted
either to flank, to peak or to jflank in the USM 35X.
The point of amplitude measurement is marked by a
The point of distance measurement is marked by a
H Note:
While DAC, TCG or JISDAC is active you can change
the TOF mode from peak to flank.
When adjusted to flank or jflank the sound path mea-
surement is made at the point of intersection of the
monitor gate with the rising flank of the highest echo in
the gate.
amplitude: 94 %
A Attention:
The highest echo in the gate does not have to be the
echo for which the sound path has been measured. This
may lead to false echo evaluation!
Operation
In order to identify the points of measurement and to
avoid misinterpretation two indicators were introduced
per gate: The first triangle pointing downwards indicates
the position of the measured sound path (distance),
whereas the triangle pointing upwards marks the posi-
tion of the measured amplitude.
In TOF mode peak the sound path and amplitude mea-
surement is made at the maximum of the highest echo
in the gate.
amplitude: 95 %
In TOF mode jflank the sound path measurement is
made at the point of intersection of the monitor gate
with the rising flank of the first echo in the gate. The
amplitude is measured at the maximum of the first
echo in the gate even if there are further signals with
higher amplitudes in the gate.
amplitude: 33 %
Operation
In order to identify the points of measurement and to
avoid misinterpretation two indicators were introduced
per gate: The first triangle pointing downwards indicates
the position of the measured sound path (distance),
whereas the triangle pointing upwards marks the posi-
tion of the measured amplitude.
In TOF mode peak the sound path and amplitude mea-
surement is made at the maximum of the highest echo
in the gate.
amplitude: 95 %
In TOF mode jflank the sound path measurement is
made at the point of intersection of the monitor gate
with the rising flank of the first echo in the gate. The
amplitude is measured at the maximum of the first
echo in the gate even if there are further signals with
higher amplitudes in the gate.
amplitude: 33 %
Operation
In principle, the peak measurement should be preferred
cases in which the flank measurement is either specified,
or it must be applied for technical reasons, e.g. in many
tests using dual-element (TR) probes.
A Attention:
In any case, the adjustment of the measuring point for
calibration and for the subsequent test use must al-
ways be identical. Otherwise measurement errors may
occur.
Select the TOF function.
setting.
S-DISP (Zoomed display of reading)
You can have a selected reading zoomed in the A-scan
display. The following readings can be selected for the
zoomed display (in the second column the indication of
the readings in the measurement line):
Sa Sa Sound path for gate A
Sb Sb Sound path for gate B
Sb-a ba Difference of single measurements for
sound path gate B gate A
Ha % Ha Echo height gate A in % screen height
Hb % Hb Echo height gate B in % screen height
Ha dB ha Echo height gate A in dB
Hb dB hb Echo height gate B in dB
R-start Rs Range start
R-end Re Range end
La La Number of legs in gate A
Lb Lb Number of legs in gate B
Lc Lc Number of legs in gate C
Only for flaw position calculation:
Da Da Depth for gate A
Operation
In principle, the peak measurement should be preferred
cases in which the flank measurement is either specified,
or it must be applied for technical reasons, e.g. in many
tests using dual-element (TR) probes.
A Attention:
In any case, the adjustment of the measuring point for
calibration and for the subsequent test use must al-
ways be identical. Otherwise measurement errors may
occur.
Select the TOF function.
setting.
S-DISP (Zoomed display of reading)
You can have a selected reading zoomed in the A-scan
display. The following readings can be selected for the
zoomed display (in the second column the indication of
the readings in the measurement line):
Sa Sa Sound path for gate A
Sb Sb Sound path for gate B
Sb-a ba Difference of single measurements for
sound path gate B gate A
Ha % Ha Echo height gate A in % screen height
Hb % Hb Echo height gate B in % screen height
Ha dB ha Echo height gate A in dB
Hb dB hb Echo height gate B in dB
R-start Rs Range start
R-end Re Range end
La La Number of legs in gate A
Lb Lb Number of legs in gate B
Lc Lc Number of legs in gate C
Only for flaw position calculation:
Da Da Depth for gate A
Operation
Db Db Depth for gate B
Pa Pa Projection distance for gate A
Pb Pb Projection distance for gate B
Ra Ra Reduced projection distance for gate A
Rb Rb Reduced projection distance for gate B
Only for DGS:
ERS ER Equivalent reflector size
Gt dB Gt DGS test sensitivity
GrdB Gr DGS reference gain (= instrument gain
for the reference echo on 80 % screen
height)
Only for DGS and DAC:
Ha %crv Ca Echo height gate A in % referred to curve
Hb %crv Cb Echo height gate B in % referred to curve
DGS-Crv Dc Diameter of the DGS curve
class cl Flaw class according to JIS Z3060-2002
DAC dB db dB-value by which the DAC gain has
been changed related to the reference
gain (= instrument gain for the DAC
echo on 80 % screen height)
General:
Alarm Al Choice of gates for alarm triggering:
gate A, B or A+B
H Note:
If you use the Data Logger option, values for the C gate
as well as a few special values for the Data Logger are
added to the existing ones, see chapter Option Data
Logger.
Select the function S-DISP.
value for the zoomed display.
H Note:
You can likewise configure all readings to be displayed
below the A-scan at the four corresponding positions.
Please refer to Configuring the measurement line.
Operation
Db Db Depth for gate B
Pa Pa Projection distance for gate A
Pb Pb Projection distance for gate B
Ra Ra Reduced projection distance for gate A
Rb Rb Reduced projection distance for gate B
Only for DGS:
ERS ER Equivalent reflector size
Gt dB Gt DGS test sensitivity
GrdB Gr DGS reference gain (= instrument gain
for the reference echo on 80 % screen
height)
Only for DGS and DAC:
Ha %crv Ca Echo height gate A in % referred to curve
Hb %crv Cb Echo height gate B in % referred to curve
DGS-Crv Dc Diameter of the DGS curve
class cl Flaw class according to JIS Z3060-2002
DAC dB db dB-value by which the DAC gain has
been changed related to the reference
gain (= instrument gain for the DAC
echo on 80 % screen height)
General:
Alarm Al Choice of gates for alarm triggering:
gate A, B or A+B
H Note:
If you use the Data Logger option, values for the C gate
as well as a few special values for the Data Logger are
added to the existing ones, see chapter Option Data
Logger.
Select the function S-DISP.
value for the zoomed display.
H Note:
You can likewise configure all readings to be displayed
below the A-scan at the four corresponding positions.
Please refer to Configuring the measurement line.
Operation
MAGNIFY (Gate spreading)
The setting of the MAGNIFY function causes a spreading
of the gate over the entire display width. You can choose
the gate to be used for the magnify function.
Select the function MAGNIFY.
aGATE or bGATE if you want to spread the range of
gate A or B over the entire display range.
A-Scan (Setting the A-scan)
This function offers you several options for setting your
A-scan.
stndard
Normal A-scan setting. The key effects a static
freeze.
compare (A-scan comparison)
You can compare a current echo display with a
stored one. The display last stored using either
from the current application or from a stored data set
is displayed in the background as a dotted line.
H Note:
Read chapter 5.12 to learn how to load a saved data
set. As a restored data set is displayed with a frozen
A-scan, press the key first.
envelop (echo dynamics)
The echo envelope is shown as a dotted line addi-
tionally to the A-scan.
peak b (maximum display)
You can use this function to record and document
(as well as to save if required) the peaked, maximum
echo display. With the B gate active, the A-scan with
the highest echo amplitude (recording of maximum
display) is shown as a dotted line additionally to the
live A-scan when peaking an echo display (in B
gate). This A-scan becomes the statically frozen
A-scan by pressing the key, and it can then be
evaluated accordingly.
Operation
MAGNIFY (Gate spreading)
The setting of the MAGNIFY function causes a spreading
of the gate over the entire display width. You can choose
the gate to be used for the magnify function.
Select the function MAGNIFY.
aGATE or bGATE if you want to spread the range of
gate A or B over the entire display range.
A-Scan (Setting the A-scan)
This function offers you several options for setting your
A-scan.
stndard
Normal A-scan setting. The key effects a static
freeze.
compare (A-scan comparison)
You can compare a current echo display with a
stored one. The display last stored using either
from the current application or from a stored data set
is displayed in the background as a dotted line.
H Note:
Read chapter 5.12 to learn how to load a saved data
set. As a restored data set is displayed with a frozen
A-scan, press the key first.
envelop (echo dynamics)
The echo envelope is shown as a dotted line addi-
tionally to the A-scan.
peak b (maximum display)
You can use this function to record and document
(as well as to save if required) the peaked, maximum
echo display. With the B gate active, the A-scan with
the highest echo amplitude (recording of maximum
display) is shown as a dotted line additionally to the
live A-scan when peaking an echo display (in B
gate). This A-scan becomes the statically frozen
A-scan by pressing the key, and it can then be
evaluated accordingly.
Operation
afreeze/bfreeze (automatic freeze)
Whenever you select this function, an echo display
connected with the A or B gate will automatically
switch over to A-scan freeze (automatic freeze). This
setting is especially well suited e.g. for high-tempera-
ture measurements, for measurements involving
difficult coupling conditions, or for spot weld testing.
H Note:
If you are using a Data Logger option, you also have
the function cfreeze (for C gate) at your disposal.
Select the function A-SCAN.
setting.
Pay attention to the additional information referring to
the corresponding setting options (see preceeding
page).
Configuring the measurement line
The configuration of your measurement line is carried
out in the function group MSEL, this means that you
can choose the reading for one of the four possible
positions of the measurement line for direct measured-
value display during the test.
Select the function group MSEL.
Functions of the function group MSEL:
MEAS-P1 MEAS-P2 MEAS-P3 MEAS-P4
Measured values at positions 1 to 4
Operation
afreeze/bfreeze (automatic freeze)
Whenever you select this function, an echo display
connected with the A or B gate will automatically
switch over to A-scan freeze (automatic freeze). This
setting is especially well suited e.g. for high-tempera-
ture measurements, for measurements involving
difficult coupling conditions, or for spot weld testing.
H Note:
If you are using a Data Logger option, you also have
the function cfreeze (for C gate) at your disposal.
Select the function A-SCAN.
setting.
Pay attention to the additional information referring to
the corresponding setting options (see preceeding
page).
Configuring the measurement line
The configuration of your measurement line is carried
out in the function group MSEL, this means that you
can choose the reading for one of the four possible
positions of the measurement line for direct measured-
value display during the test.
Select the function group MSEL.
Functions of the function group MSEL:
MEAS-P1 MEAS-P2 MEAS-P3 MEAS-P4
Measured values at positions 1 to 4
Operation
All measured values which have also been described
for the zoomed display of the function S-DISP are
availabe to you at each position.
H Note:
As an alternative, you can display a scale in the mea-
surement line (ref. function SCALE).
Select the function MEAS-P1 to MEAS-P4.
measured value for each position in the correspond-
ing function.
Setting the display
In the function group LCD, you will find setting options
for the display screen itself and for the echo display.
Select the function group LCD.
H Note:
Double assignment of the function FILLED/VGA. Toggle
between the two functions by repeatedly pressing the
corresponding key .
Operation
All measured values which have also been described
for the zoomed display of the function S-DISP are
availabe to you at each position.
H Note:
As an alternative, you can display a scale in the mea-
surement line (ref. function SCALE).
Select the function MEAS-P1 to MEAS-P4.
measured value for each position in the correspond-
ing function.
Setting the display
In the function group LCD, you will find setting options
for the display screen itself and for the echo display.
Select the function group LCD.
H Note:
Double assignment of the function FILLED/VGA. Toggle
corresponding key .
Operation
FILLED (Echo display mode)
The function FILLED toggles between the filled and the
normal echo display mode. The filled echo display mode
improves the echo perceptibility due to the strong con-
trast, especially in cases where workpieces are scanned
more quickly.
H Note:
If the function COLOR is active, the filled area is also
displayed in different colors.
Select the function FILLED.
on or off.
VGA
You can switch the VGA output on and off.
H Note:
You should only switch the VGA output on if you aim to
transfer the display contents to an external instrument.
If the VGA output is switched off, the current consump-
tion is reduced and the operating time is extended in
battery operation.
Select the function VGA.
on or off.
SCHEME
You have a choice between four color schemes. The
color scheme determines the color of all displays and
that of the background. You cannot vary the colors of
gates because they are fixed as follows:
Gate A red
Gate B green
Gate C blue
Operation
FILLED (Echo display mode)
The function FILLED toggles between the filled and the
normal echo display mode. The filled echo display mode
improves the echo perceptibility due to the strong con-
trast, especially in cases where workpieces are scanned
more quickly.
H Note:
If the function COLOR is active, the filled area is also
displayed in different colors.
Select the function FILLED.
on or off.
VGA
You can switch the VGA output on and off.
H Note:
You should only switch the VGA output on if you aim to
transfer the display contents to an external instrument.
If the VGA output is switched off, the current consump-
tion is reduced and the operating time is extended in
battery operation.
Select the function VGA.
on or off.
SCHEME
You have a choice between four color schemes. The
color scheme determines the color of all displays and
that of the background. You cannot vary the colors of
gates because they are fixed as follows:
Gate A red
Gate B green
Gate C blue
Operation
H Note:
Select the function SCHEME.
color scheme.
LIGHT (LCD backlight)
You can choose between a lighting in the economy
mode min. and a brighter lighting max. for the display
lighting. The economy mode is the default setting.
H Note:
tery operation.
Select the function LIGHT.
lighting.
SCALE (Configuring the measurement line)
As an alternative to the measured values, the USM35X
enables to display a scale in the measurement line. The
scale gives you an overview of the position of echoes.
You have a choice between a dimensionless ten-divi-
sion scale and a scale showing the real position of the
echoes.
The following settings are possible:
measval Display of measured values
snd-pth Display of sound path scale
div. Display of a dimensionless scale
Select the function SCALE.
display mode.
Operation
H Note:
Select the function SCHEME.
color scheme.
LIGHT (LCD backlight)
You can choose between a lighting in the economy
mode min. and a brighter lighting max. for the display
lighting. The economy mode is the default setting.
H Note:
tery operation.
Select the function LIGHT.
lighting.
SCALE (Configuring the measurement line)
As an alternative to the measured values, the USM35X
enables to display a scale in the measurement line. The
scale gives you an overview of the position of echoes.
You have a choice between a dimensionless ten-divi-
sion scale and a scale showing the real position of the
echoes.
The following settings are possible:
measval Display of measured values
snd-pth Display of sound path scale
div. Display of a dimensionless scale
Select the function SCALE.
display mode.
Operation
5.15 General configuration
More functions for the basic configuration of the USM35X
may be found in the function groups CFG1 and CFG2.
Select the function group CFG1 or CFG2.
Functions of
CFG1 CFG2:
Dialog language Date
Unit Time
Baud rate Analog output
Printer selection Horn
Assignment of the key Evaluation mode
H Note:
Double assignment of the functions DIALOG/UNIT and
DATE/TIME. Toggle between the two functions by re-
peatedly pressing the corresponding key .
DIALOG (Selecting the language)
In this function you can select the language for dis-
playing the function names on the screen and for the
test report.
The following languages are available:
German
French
Italian
General configuration
Operation
5.15 General configuration
More functions for the basic configuration of the USM35X
may be found in the function groups CFG1 and CFG2.
Select the function group CFG1 or CFG2.
Functions of
CFG1 CFG2:
Dialog language Date
Unit Time
Baud rate Analog output
Printer selection Horn
Assignment of the key Evaluation mode
H Note:
Double assignment of the functions DIALOG/UNIT and
DATE/TIME. Toggle between the two functions by re-
peatedly pressing the corresponding key .
DIALOG (Selecting the language)
In this function you can select the language for dis-
playing the function names on the screen and for the
test report.
The following languages are available:
German
French
Italian
Operation
Spanish
Portuguese
Dutch
Swedish
Slovenian
Romanian
Finnish
Czech
Danish
Hungarian
Croatian
Russian
Slovakian
Norwegian
Polish
Japanese
H Note:
Select the function DIALOG.
language.
UNIT (Selecting units of measurement)
You can choose the required units between mm or inch
in the function UNIT.
A Attention:
You should always make your decision on the units
immediately when starting to work with the USM 35X. If
you change the unit, all current settings are deleted,
and the basic setup is loaded.
Select the function UNIT.
unit.
To avoid any accidental deleting of values, the
measurement line will display a safety prompt:
Change unit?
If you are sure that you want to change the unit of
measurement, press the corresponding key of the
function UNIT. Any other key would abort the process.
The unit of measurement is now changed; the current
data are deleted.
Operation
Spanish
Portuguese
Dutch
Swedish
Slovenian
Romanian
Finnish
Czech
Danish
Hungarian
Croatian
Russian
Slovakian
Norwegian
Polish
Japanese
H Note:
Select the function DIALOG.
language.
UNIT (Selecting units of measurement)
You can choose the required units between mm or inch
in the function UNIT.
A Attention:
You should always make your decision on the units
immediately when starting to work with the USM 35X. If
you change the unit, all current settings are deleted,
and the basic setup is loaded.
Select the function UNIT.
unit.
To avoid any accidental deleting of values, the
measurement line will display a safety prompt:
Change unit?
If you are sure that you want to change the unit of
measurement, press the corresponding key of the
function UNIT. Any other key would abort the process.
The unit of measurement is now changed; the current
data are deleted.
Operation
BAUD-R (Baud rate for transmission)
In this function you can select the baud rate for the
serial port transmission. You have a choice between
300, 600, 1200, 2400, 4800, 9600, 19200, 38400, and
57600 Baud.
Select the function BAUD-R.
baud rate.
PRINTER (Printer for test report)
In this function you can select the connected printer for
printing out your test report.
You have a choice between the following printer types:
Epson
HP LaserJet
HP DeskJet
Seiko DPU
HP LaserJet 1200 series
HP DeskJet 1200 series
H Note:
For more details on the how to print out a test report,
please refer to chapter 6 Documentation.
Select the function PRINTER.
printer.
COPYMOD (Assignment of the key)
When the key is pressed, data are output to the
RS232 interface and transferred to a printer or a PC.
You can use the function COPYMOD to choose the
data to be transferred when the key is pressed. You
have the following setting options:
hardcpy
Hardcopy of the screen contents
report
Test report with A-scan, all relevant settings for the
inspection and space for hand-written remarks
meas P5
The magnified value given at the right upper corner
of the A-scan
Operation
BAUD-R (Baud rate for transmission)
In this function you can select the baud rate for the
serial port transmission. You have a choice between
300, 600, 1200, 2400, 4800, 9600, 19200, 38400, and
57600 Baud.
Select the function BAUD-R.
baud rate.
PRINTER (Printer for test report)
In this function you can select the connected printer for
printing out your test report.
You have a choice between the following printer types:
Epson
HP LaserJet
HP DeskJet
Seiko DPU
HP LaserJet 1200 series
HP DeskJet 1200 series
H Note:
For more details on the how to print out a test report,
please refer to chapter 6 Documentation.
Select the function PRINTER.
printer.
COPYMOD (Assignment of the key)
When the key is pressed, data are output to the
RS232 interface and transferred to a printer or a PC.
You can use the function COPYMOD to choose the
data to be transferred when the key is pressed. You
have the following setting options:
hardcpy
Hardcopy of the screen contents
report
Test report with A-scan, all relevant settings for the
inspection and space for hand-written remarks
meas P5
The magnified value given at the right upper corner
of the A-scan
Operation
meas P1
The measured value given at position 1 in the
measurement line
pardump
All instrument functions with the current settings
PCX
Screen contents as a PCX-format file. To transfer the
data to the PC, you will need a terminal program.
store
The current instrument setting is stored to the
selected (free) data set, and the data set number
(DAT-#) is automatically increased.
datalog (only with Data Logger option)
The selected job is printed out as a report including
all measured values.
off
The key is deactivated.
special
as setting hardcpy. After printout of the screen
contents no form feed, every press on the key prints
out the next hardcopy on the same page (three or
four hardcopies depending on the printer).
H Note:
Please also refer to chapter 6 Documentation.
Select the function COPYMOD.
assignment for the key.
TIME/DATE (Setting the time and date)
You have to check the current date and time and, if
required, set them so that these data are correctly
saved together with the test results.
Operation
meas P1
The measured value given at position 1 in the
measurement line
pardump
All instrument functions with the current settings
PCX
Screen contents as a PCX-format file. To transfer the
data to the PC, you will need a terminal program.
store
The current instrument setting is stored to the
selected (free) data set, and the data set number
(DAT-#) is automatically increased.
datalog (only with Data Logger option)
The selected job is printed out as a report including
all measured values.
off
The key is deactivated.
special
as setting hardcpy. After printout of the screen
contents no form feed, every press on the key prints
out the next hardcopy on the same page (three or
four hardcopies depending on the printer).
H Note:
Please also refer to chapter 6 Documentation.
Select the function COPYMOD.
assignment for the key.
TIME/DATE (Setting the time and date)
You have to check the current date and time and, if
required, set them so that these data are correctly
saved together with the test results.
Operation
H Note:
A Attention:
Always make sure that you are using correctly set
time and date values. Otherwise test results might be
corrupted. Be aware that the USM 35X displays the
year as a two digit number!
Select the function TIME.
Use the left-hand rotary knob to highlight the value
that you want to change, e.g. the hour.
Use the right-hand rotary knob to change the high-
lighted value.
Select the function DATE.
that you want to change, e.g. the day.
lighted value.
ANAMOD
You can output results of measurements at the analog
output for external further processing. Use the function
ANAMOD to configure the analog output in case there
is no echo in the evaluation gate and the analog voltage
has been selected for the sound path at the output.
You have the following setting options:
lo volt
The analog output supplies 0 volt.
hi volt
The analog output supplies 5 volts.
Select the function ANAMOD.
value.
Operation
H Note:
A Attention:
Always make sure that you are using correctly set
time and date values. Otherwise test results might be
corrupted. Be aware that the USM 35X displays the
year as a two digit number!
Select the function TIME.
that you want to change, e.g. the hour.
lighted value.
Select the function DATE.
that you want to change, e.g. the day.
lighted value.
ANAMOD
You can output results of measurements at the analog
output for external further processing. Use the function
ANAMOD to configure the analog output in case there
is no echo in the evaluation gate and the analog voltage
has been selected for the sound path at the output.
You have the following setting options:
lo volt
The analog output supplies 0 volt.
hi volt
The analog output supplies 5 volts.
Select the function ANAMOD.
value.
Operation
HORN
In this function, you can decide whether or not an
acoustic alarm should be given in addition to the visual
alarm (LED A).
Select the function HORN.
Use the left-hand rotary knob to set the horn to on or
off.
H Note:
EVAMOD (Echo evaluation)
This is where you can choose a method for the evalua-
tion of the measured reflector echo. Depending on the
instrument version used, you have various methods to
choose from.
REF (default setting)
Evaluation using the measurement of dB difference,
available for all instrument versions
AWS
DAC (only USM 35X DAC and USM 35X S)
Evaluation using the Distance-Amplitude Curve
JISDAC (only USM 35X DAC and USM 35X S)
according to JIS Z3060-2002
DGS (only USM 35X S)
Evaluation using the DGS method
Select the function EVAMOD.
method.
Operation
HORN
In this function, you can decide whether or not an
acoustic alarm should be given in addition to the visual
alarm (LED A).
Select the function HORN.
Use the left-hand rotary knob to set the horn to on or
off.
H Note:
EVAMOD (Echo evaluation)
This is where you can choose a method for the evalua-
tion of the measured reflector echo. Depending on the
instrument version used, you have various methods to
choose from.
REF (default setting)
Evaluation using the measurement of dB difference,
available for all instrument versions
AWS
DAC (only USM 35X DAC and USM 35X S)
JISDAC (only USM 35X DAC and USM 35X S)
DGS (only USM 35X S)
Evaluation using the DGS method
Select the function EVAMOD.
method.
Operation
5.16 Other functions with
special keys
H Note:
You will find a description of the key (setting of the
dB incrementation for gain) on page 5-5; the key,
which you will need for printing out your test report, is
described in chapter 6 Documentation.
Freeze
The key enables you to store (freeze) the displayed
image on the screen. Gate parameters may still be
changed in order to evaluate any signal being displayed
in the frozen screen. The measurement resolution is
only 0.5 % of the displayed range.
Press if you want to store (freeze) a current
display.
Press again in order to return to normal mode.
Other functions with special keys
Zooming the echo display
If you press the key , the echo display is zoomed (zoom
function) and is superimposed on the function group.
The functions are not accessible in this mode, except
for the gain. It can still be set by means of the left-hand
rotary knob.
H Note:
You cannot switch on the zoom function with gate
widths smaller than 0.5 mm/0.02" (5920 m/s).
Press the button in order to change to the zoom
mode.
Press the button one more time in order to return
to the normal mode.
The key
You can use this key to save measured values and A-
scans. In addition, it serves for recording echoes, for
example as a reference echo.
Press the key in order to save a measured value
or to record an echo.
Operation
5.16 Other functions with
special keys
H Note:
You will find a description of the key (setting of the
dB incrementation for gain) on page 5-5; the key,
which you will need for printing out your test report, is
described in chapter 6 Documentation.
Freeze
The key enables you to store (freeze) the displayed
image on the screen. Gate parameters may still be
changed in order to evaluate any signal being displayed
in the frozen screen. The measurement resolution is
only 0.5 % of the displayed range.
Press if you want to store (freeze) a current
display.
Press again in order to return to normal mode.
Other functions with special keys
Zooming the echo display
If you press the key , the echo display is zoomed (zoom
function) and is superimposed on the function group.
The functions are not accessible in this mode, except
for the gain. It can still be set by means of the left-hand
rotary knob.
H Note:
You cannot switch on the zoom function with gate
widths smaller than 0.5 mm/0.02" (5920 m/s).
Press the button in order to change to the zoom
mode.
Press the button one more time in order to return
to the normal mode.
The key
You can use this key to save measured values and A-
scans. In addition, it serves for recording echoes, for
example as a reference echo.
Press the key in order to save a measured value
or to record an echo.
Operation
5.17 Status symbols and LEDs
Status symbols can be displayed in the line below the
screen display to inform about certain settings and
conditions of the USM 35X. The LEDs above the dis-
play give you further information.
Status symbols
Symbol Description
* Display memory is enabled (freeze),
display is stored.
! Data transfer active,
(printing or remote control).
B Battery indicator; appears with low battery
charge, batteries must be charged.
F Function TOF is set to flank.
P Function TOF is set to peak.
J Function TOF is set to jflank.
T Function T-CORR is active.
R Reference echo has been recorded (DGS).
A Function ATT-OBJ/ATT-REF (sound
attenuation) is active.
Staus symbols and LEDs
H Note:
If you are using the Data Logger option, youll find more
status symbols, see chapter Option Data Logger.
LEDs
Symbol Description
A Gate alarm.
R Function REJECT is active.
D Function DUAL (pulser-receiver separation)
is active.
H Note:
Error alarms can be triggered unter certain circumstanc-
es. These are caused by intermediate conditions in instru-
ment operation occuring when the instrumet is used, i.e.
when function parameters are changed. Possible alarms
occuring during instrument operation (setting of
functions) are to be ignored.
Operation
5.17 Status symbols and LEDs
Status symbols can be displayed in the line below the
screen display to inform about certain settings and
conditions of the USM 35X. The LEDs above the dis-
play give you further information.
Status symbols
Symbol Description
* Display memory is enabled (freeze),
display is stored.
! Data transfer active,
(printing or remote control).
B Battery indicator; appears with low battery
charge, batteries must be charged.
F Function TOF is set to flank.
P Function TOF is set to peak.
J Function TOF is set to jflank.
T Function T-CORR is active.
R Reference echo has been recorded (DGS).
A Function ATT-OBJ/ATT-REF (sound
attenuation) is active.
Staus symbols and LEDs
H Note:
If you are using the Data Logger option, youll find more
status symbols, see chapter Option Data Logger.
LEDs
Symbol Description
A Gate alarm.
R Function REJECT is active.
D Function DUAL (pulser-receiver separation)
is active.
H Note:
Error alarms can be triggered unter certain circumstanc-
es. These are caused by intermediate conditions in instru-
ment operation occuring when the instrumet is used, i.e.
when function parameters are changed. Possible alarms
occuring during instrument operation (setting of
functions) are to be ignored.
Operation Distance-amplitude curve (only USM 35X DAC and USM 35S)
5.18 Distance-amplitude curve
(only USM 35X DAC and
USM 35S)
H Note:
The DAC function is available as a fixed function in the
second operating level on the USM 35X DAC. With the
USM 35X S, the DAC function can be additionally
switched over to DGS evaluation mode.
Due to the angle of the sound beam spread and to the
sound attenuation in the material the echo height of
reflectors of equal size depends on the distance to the
probe.
A distance-amplitude curve, which is recorded with
defined reference reflectors, graphically displays these
influences.
If you use a reference block having artificial flaws when
recording a DAC you will be able to apply these echo
amplitudes for the evaluation of discontinuities without
any further correction. The reference block should be
made of the same material as the test object.
You will find the functions for the distance-amplitude
curve in the function group DAC. If required, select the
setting DAC in the function group EVAMOD first.
Select the function group CFG2.
Switch the function EVA-MOD over to the setting
DAC.
Go to the second operating level.
Select the function group DAC.
USM 35S)
H Note:
The DAC function is available as a fixed function in the
second operating level on the USM 35X DAC. With the
USM 35X S, the DAC function can be additionally
switched over to DGS evaluation mode.
Due to the angle of the sound beam spread and to the
sound attenuation in the material the echo height of
reflectors of equal size depends on the distance to the
probe.
A distance-amplitude curve, which is recorded with
defined reference reflectors, graphically displays these
influences.
If you use a reference block having artificial flaws when
recording a DAC you will be able to apply these echo
amplitudes for the evaluation of discontinuities without
any further correction. The reference block should be
made of the same material as the test object.
curve in the function group DAC. If required, select the
setting DAC in the function group EVAMOD first.
DAC.
Select the function group DAC.
Operation
H Note:
Double assignment of the function T-CORR/OFFSET.
DACMOD (Activating DAC/TCG)
You can use this function to activate the DAC. The fol-
lowing settings are available:
off
No DAC is active.
DAC
The already saved distance-amplitude curve is
displayed on the screen, or a new DAC is recorded.
TCG
An existing DAC (at least 2 reference points) is
displayed as a horizontal TCG line.
H Note:
No reference echoes can be recorded with
DACMODE = TCG. TCG can only be activated if the
reference echoes recorded are situated within a dynam-
ic range of 40 dB. Otherwise an error message is out-
put. If the TCG setting should be nevertheless be used
in this case, then the DAC must be reduced (by delet-
ing the last reference points) until TCG can be switched
on.
Select the function DACMOD.
Use the right-hand rotary knob to select the DAC
setting.
If there is a DAC stored, it will now be active.
Select the TCG setting.
The TCG function is activated so that the DAC
becomes a horizontal recording threshold. This
means: all reference echoes recorded are brought
(lifted or lowered) to the same echo height.
Use the right-hand rotary knob to select the setting
off in order to deactivate the DAC again.
Distance-amplitude curve (only USM 35X DAC and USM 35S)
Operation
H Note:
Double assignment of the function T-CORR/OFFSET.
DACMOD (Activating DAC/TCG)
off
No DAC is active.
DAC
The already saved distance-amplitude curve is
displayed on the screen, or a new DAC is recorded.
TCG
An existing DAC (at least 2 reference points) is
displayed as a horizontal TCG line.
H Note:
No reference echoes can be recorded with
DACMODE = TCG. TCG can only be activated if the
reference echoes recorded are situated within a dynam-
ic range of 40 dB. Otherwise an error message is out-
put. If the TCG setting should be nevertheless be used
in this case, then the DAC must be reduced (by delet-
ing the last reference points) until TCG can be switched
on.
setting.
DACECHO (Recording reference curve)
A Attention:
Before starting to record a reference curve, the instru-
ment must be correctly calibrated (ref. section
5.7 Calibrating the USM 35X).
The moment a new curve is recorded, a possibly al-
ready existing curve must be deleted. If necessary,
make sure that the old curve has been stored in a free
data set before starting to record a new curve!
DAC. The function DACECHO is set to 0 since there
is no previously recorded echo.
Couple the probe to the reference block, and peak
the first reference echo. Use the left-hand rotary knob
to bring the echo to an amplitude between 70 % and
100 % screen height.
Select the function aSTART, and then move the gate
so that the selected echo is the highest of the echo
sequence within the gate range.
Press to record the first reference echo. The
instrument gain will automatically change until the
DAC echo in gate A reaches 80% screen height
(+/0,3 dB). The function DACECHO is set to 1 to
indicate that the first reference echo has been
successfully recorded. Simultaneously the status
symbol R appears (= reference echo stored).
Peak the next reference echo, and repeat the record-
ing process for other curve points. The number in the
function DACECHO is increased by 1 with each
recording.
H Note:
If the message Echo is not valid appears, the refer-
ence point could not be recorded. Check the gate posi-
tion as well as the height of the reference echo and
repeat the recording.
As soon as you have recorded at least two curve refer-
ence points. Your DAC is already active (please see
previous section). You can record a maximum of
10 curve reference points.
A Attention:
ment must be correctly calibrated (ref. section
5.7 Calibrating the USM 35X).
(+/0,3 dB). The function DACECHO is set to 1 to
recording.
H Note:
As soon as you have recorded at least two curve refer-
ence points. Your DAC is already active (please see
previous section). You can record a maximum of
10 curve reference points.
Operation Distance-amplitude curve (only USM 35X DAC and USM 35X S)
Deleting reference points or the complete DAC
You can delete the reference point which was recorded
last in each case, or the complete DAC.
Select the function DACECHO.
Turn the right-hand rotary knob downward (counter-
clockwise). The message Do you want to delete
the DAC echo? appears in the measurement line.
Press the key in order to delete the last echo, or
press another key in order to cancel the process of
deleting.
In this way, you can record one or several new refer-
ence points.
In order to delete the complete DAC, turn the right-
hand rotary knob upward (clockwise). The message
Do you want to delete all DAC echoes? appears
in the measurement line.
Press the key in order to delete all echoes, or
deleting.
T-CORR (Sensitivity correction)
This function enables you to compensate for the trans-
fer losses in the material under test. This correction is
necessary if test object and reference block have differ-
ent surface qualities.
You have to find out the adjustment value for the com-
pensation of transfer losses by experiments. The gain
is varied accordingly in this connection, the curve line
remains the same.
Select the function T-CORR.
setting.
Operation Distance-amplitude curve (only USM 35X DAC and USM 35X S)
deleting.
ence points.
deleting.
remains the same.
setting.
Operation
OFFSET (Distance of multiple DAC)
You can activate a multiple DAC and at the same time
determine the distance from the registration curve. The
default setting 6.0 dB generates four other curves at
12 dB, 6 dB, +6 dB, and +12 dB from the registration
curve. The setting 0 generates only the registration
curve. Any setting different from 0 generates four other
curves at a set distance from the original curve. For a
better distinction in multiple DACs the registration curve
is displayed as a bold line.
Adjustment range: 0 dB ... 14 dB in steps of 0.5 dB
Select the function OFFSET.
setting.
Echo evaluation with DAC
In order to be able to evaluate a flaw indication by
means of the DAC, certain conditions must be met:
The distance-amplitude curve must already be
recorded.
It only applies to the same probe that was used
when recording the curve. Not even another probe of
the same type must be used!
The DAC only apply to the material corresponding to
the material of the reference block.
All functions affecting the echo amplitude must be
set the same way as they were when the curve was
recorded. This applies in particular to the following
functions: POWER, FREQU, RECTIFY, MTLVEL and
REJECT.
Operation
curve. The setting 0 generates only the registration
curve. Any setting different from 0 generates four other
curves at a set distance from the original curve. For a
better distinction in multiple DACs the registration curve
is displayed as a bold line.
setting.
recorded.
REJECT.
Operation
USM 35S)
H Note:
The JISDAC function for echo evaluation with the
dictance-amplitude curve and additional classification
according to JIS Z3060-2002 is available in the
USM35X DAC and USM35X S.
curve according to JIS Z3060-2002 in the function
group JDAC. If required, select the setting JDAC in the
function group EVAMOD first.
Switch the function EVAMOD over to the setting
JDAC.
DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S)
Select the function group JDAC.
H Note:
Double assignment of the functions DACMOD/BOLDLI
and T-CORR/OFFSET. Toggle between the two functions
by repeatedly pressing the corresponding key .
Operation
USM 35S)
H Note:
The JISDAC function for echo evaluation with the
dictance-amplitude curve and additional classification
according to JIS Z3060-2002 is available in the
USM35X DAC and USM35X S.
curve according to JIS Z3060-2002 in the function
group JDAC. If required, select the setting JDAC in the
function group EVAMOD first.
Switch the function EVAMOD over to the setting
JDAC.
Select the function group JDAC.
H Note:
Double assignment of the functions DACMOD/BOLDLI
and T-CORR/OFFSET. Toggle between the two functions
by repeatedly pressing the corresponding key .
Operation DAC according to JIS Z3060-2002 (only USM 35X DAC and USM 35S)
DACMOD (Activating DAC according to JIS)
off
No DAC is active.
DAC
DAC according to JIS with 6 curves. The first 4 curves
are identified with the letters L, M, H and U dedicated
to these curves, and therefore move with any gain
change.
In JISDAC also the echo evaluation in classes can be
performed. The flaw class depends on the position of
the echo peak within the first 4 curves:
class I: amplitude < curve L
class II: curve L < amplitude < curve M
class III: curve M < amplitude < curve H (registra-
tion level)
class IV: amplitude > curve H
setting.
DACMOD (Activating DAC according to JIS)
off
No DAC is active.
DAC
DAC according to JIS with 6 curves. The first 4 curves
are identified with the letters L, M, H and U dedicated
to these curves, and therefore move with any gain
change.
In JISDAC also the echo evaluation in classes can be
performed. The flaw class depends on the position of
the echo peak within the first 4 curves:
class I: amplitude < curve L
class II: curve L < amplitude < curve M
class III: curve M < amplitude < curve H (registra-
tion level)
class IV: amplitude > curve H
setting.
A Attention:
ment must be correctly calibrated (ref. section 5.7
Calibrating the USM 35X).
(+/ 0,3 dB). The function DACECHO is set to 1 to
H Note:
The dB-value by which the gain has been changed re-
lated to the reference gain can be displayed using the
new parameter DAC dB.
A Attention:
ment must be correctly calibrated (ref. section 5.7
Calibrating the USM 35X).
(+/ 0,3 dB). The function DACECHO is set to 1 to
H Note:
The dB-value by which the gain has been changed re-
lated to the reference gain can be displayed using the
new parameter DAC dB.
Operation
The function DACECHO displays the number 1.
recording.
H Note:
deleting.
deleting.
ence points.
Operation
The function DACECHO displays the number 1.
recording.
H Note:
deleting.
deleting.
ence points.
Operation
BOLDLI (Choice of a registration curve)
One of the four curves marked with a character (L, M,
H, U) can be selected as the registration curve. This
registration curve will then be displayed as a bold line
and an echo amplitude evaluation (dB-to-curve) will be
made for this curve.
Select the function BOLDLI.
setting.
remains the same.
setting.
curve, and additionally two other curves at +18 dB and
+24 dB. The setting 0 generates only the registration
curve and the two fixed curves. Any setting different
from 0 generates four other curves at a set distance
from the original curve. For a better distinction in multi-
ple DACs the registration curve is displayed as a bold
line.
setting.
Operation
BOLDLI (Choice of a registration curve)
One of the four curves marked with a character (L, M,
H, U) can be selected as the registration curve. This
registration curve will then be displayed as a bold line
and an echo amplitude evaluation (dB-to-curve) will be
made for this curve.
Select the function BOLDLI.
setting.
remains the same.
setting.
curve, and additionally two other curves at +18 dB and
+24 dB. The setting 0 generates only the registration
curve and the two fixed curves. Any setting different
from 0 generates four other curves at a set distance
from the original curve. For a better distinction in multi-
ple DACs the registration curve is displayed as a bold
line.
setting.
Operation
recorded.
REJECT.
5.20 Evaluation according to the
DGS method (only USM 35X S)
With the USM 35X S, you can use both the DAC and
the DGS method of amplitude evaluation.
Measuring with DGS
Using the DGS function (Distance Gain Size), you can
compare the reflecting power of a natural flaw in the
test object with that of a theoretical flaw (circular disk-
shaped equivalent reflector) at the same depth.
A Attention:
You are comparing the reflecting power of a natural flaw
with that of a theoretical flaw. No definite conclusions
may be drawn on the natural flaw (roughness, inclined
position, etc.).
The so-called DGS diagram forms the basis for this
comparison of the reflecting power. This diagram con-
sists of a set of curves showing the correlation of three
influencing variables:
Operation
recorded.
REJECT.
5.20 Evaluation according to the
DGS method (only USM 35X S)
With the USM 35X S, you can use both the DAC and
the DGS method of amplitude evaluation.
Measuring with DGS
Using the DGS function (Distance Gain Size), you can
compare the reflecting power of a natural flaw in the
test object with that of a theoretical flaw (circular disk-
shaped equivalent reflector) at the same depth.
A Attention:
You are comparing the reflecting power of a natural flaw
with that of a theoretical flaw. No definite conclusions
may be drawn on the natural flaw (roughness, inclined
position, etc.).
The so-called DGS diagram forms the basis for this
comparison of the reflecting power. This diagram con-
sists of a set of curves showing the correlation of three
influencing variables:
Operation Evaluation according to the DGS method (only USM 35X S)
Distance D between the probe and circular disk-
shaped equivalent reflector
Difference in gain G between various large circular
disk-shaped equivalent reflectors and an infinitely
large backwall
Size S of the circular disk-shaped equivalent reflec-
tor. The influencing variable S always remains
constant for one curve of the set of curves
The advantage of the DGS method lies in the fact that
you can carry out reproducible evaluations of small
discontinuities. The reproducibility is most of all impor-
tant, for example, whenever you aim to carry out an
acceptance test.
Apart from the influencing variables already mentioned,
there are other factors determining the curve shape:
sound attenuation
transfer losses
amplitude correction value
probe.
The following probe parameters affect the curve shape:
element or crystal diameter
frequency
delay length
delay velocity
You can adjust these parameters on the USM 35X S in
such a way that you can use the DGS method with
many different probes and on different materials.
H Note:
Before setting the DGS function, the instrument must
first be calibrated because all functions affecting the
DGS evaluation mode (MTLVEL, P-DELAY, DAMPING,
POWER, FINE G, FREQU, RECTIFY) can no longer be
changed after the reference echo has been recorded.
Please also refer to chapter 5.7 Calibrating the
USM35X on this subject.
Distance D between the probe and circular disk-
shaped equivalent reflector
Difference in gain G between various large circular
disk-shaped equivalent reflectors and an infinitely
large backwall
Size S of the circular disk-shaped equivalent reflec-
tor. The influencing variable S always remains
constant for one curve of the set of curves
The advantage of the DGS method lies in the fact that
you can carry out reproducible evaluations of small
discontinuities. The reproducibility is most of all impor-
tant, for example, whenever you aim to carry out an
acceptance test.
Apart from the influencing variables already mentioned,
there are other factors determining the curve shape:
sound attenuation
transfer losses
amplitude correction value
probe.
The following probe parameters affect the curve shape:
element or crystal diameter
frequency
delay length
delay velocity
You can adjust these parameters on the USM 35X S in
such a way that you can use the DGS method with
many different probes and on different materials.
H Note:
Before setting the DGS function, the instrument must
first be calibrated because all functions affecting the
DGS evaluation mode (MTLVEL, P-DELAY, DAMPING,
POWER, FINE G, FREQU, RECTIFY) can no longer be
changed after the reference echo has been recorded.
Please also refer to chapter 5.7 Calibrating the
USM35X on this subject.
Selecting the DGS mode
DGS.
Select the function group DGS.
Double assignment of functions:
The following functions are double assigned. Toggle
corresponding key .
DGSMEN> DGSMEN>
Calling the DGS menu Switching on/off the
DGS evaluation mode
T-CORR> OFFSET>
Setting the transfer Activating the multi-curve
correction display mode
Default settings for the DGS measurement
In the next step, the DGS menu is called enabling to
select the corresponding probe and to set the other
DGS parameters:
Select the function DGSMEN.
Use the right-hand rotary knob to call the DGS menu.
Selecting the DGS mode
DGS.
Select the function group DGS.
Double assignment of functions:
The following functions are double assigned. Toggle
corresponding key .
DGSMEN> DGSMEN>
Calling the DGS menu Switching on/off the
DGS evaluation mode
T-CORR> OFFSET>
Setting the transfer Activating the multi-curve
correction display mode
Default settings for the DGS measurement
In the next step, the DGS menu is called enabling to
select the corresponding probe and to set the other
DGS parameters:
Select the function DGSMEN.
Use the right-hand rotary knob to call the DGS menu.
Operation
Define your settings:
PROBE-#: probe number
Fixed-programmed probes with all settings (PRB-
NAME, DEL-VEL, D eff and PRBFREQ cannot be
changed in the case of these probes);
PROBE-# = 0 is user-programmable with reference
to all parameters.
PRBNAME: probe name
The name belongs to the selected probe number and
cannot be changed; the individual probe name can be
entered only with PROBE-# = 0.
DGS-CRV: registration curve for DGS evaluation
This enables you to select the circular disk-shaped
equivalent reflector diameter to be used for displaying
the DGS curve and used as recording threshold for
echo evaluations.
DEL-VEL: delay material velocity of the probe
Predefined with programmed probes.
D eff: effective element diameter of the probe used
PRBFREQ: probe frequency
Frequency of the transducer; predefined with pro-
grammed probes.
REFECHO: type of the reference reflector used
BW backwall
SDH side drilled hole
FBH flat bottom hole
REFSIZE: size of the reference reflector
ATT-REF: sound attenuation in the reference block
ATT-OBJ: sound attenuation in the test object
AMPLCOR: value for the amplitude correction.
This is required whenever you are using an angle
probe and the quadrant echo from the calibration
standards K1 or K2 as a reference reflector.
To return to the A-scan, press one of the following
keys: , or .
Evaluation according to the DGS method (only USM 35X S)
Operation
Define your settings:
PROBE-#: probe number
Fixed-programmed probes with all settings (PRB-
NAME, DEL-VEL, D eff and PRBFREQ cannot be
changed in the case of these probes);
PROBE-# = 0 is user-programmable with reference
to all parameters.
PRBNAME: probe name
The name belongs to the selected probe number and
cannot be changed; the individual probe name can be
entered only with PROBE-# = 0.
DGS-CRV: registration curve for DGS evaluation
This enables you to select the circular disk-shaped
equivalent reflector diameter to be used for displaying
the DGS curve and used as recording threshold for
echo evaluations.
DEL-VEL: delay material velocity of the probe
D eff: effective element diameter of the probe used
PRBFREQ: probe frequency
Frequency of the transducer; predefined with pro-
grammed probes.
REFECHO: type of the reference reflector used
BW backwall
SDH side drilled hole
FBH flat bottom hole
REFSIZE: size of the reference reflector
ATT-REF: sound attenuation in the reference block
ATT-OBJ: sound attenuation in the test object
AMPLCOR: value for the amplitude correction.
This is required whenever you are using an angle
probe and the quadrant echo from the calibration
standards K1 or K2 as a reference reflector.
To return to the A-scan, press one of the following
keys: , or .
Operation
Example
In this example, the probe MB 4 S is selected. Reference
reflector = backwall, the 3 mm circular disc is to be
displayed as curve. The sound attenuation corrections
ATT-REF and ATT-OBJ and the amplitude correction
AMPLCOR (for angle probes and calibration standard
K1/K2) remain at 0.
displaying the DGS curve
To be able to display the required DGS curve, you have
to first record the reference echo.
You have to start by optimizing the echo of the
reference reflector, in this case the backwall echo
from the test object.
Continue by positioning the gate on the reference echo.
Select the function DGS-REF, and use the right-hand
rotary knob to switch the function on. The message:
Do you want to change the DGS reference echo?
appears.
Operation
Example
In this example, the probe MB 4 S is selected. Reference
reflector = backwall, the 3 mm circular disc is to be
displayed as curve. The sound attenuation corrections
ATT-REF and ATT-OBJ and the amplitude correction
AMPLCOR (for angle probes and calibration standard
K1/K2) remain at 0.
displaying the DGS curve
To be able to display the required DGS curve, you have
to first record the reference echo.
You have to start by optimizing the echo of the
reference reflector, in this case the backwall echo
from the test object.
Continue by positioning the gate on the reference echo.
Select the function DGS-REF, and use the right-hand
rotary knob to switch the function on. The message:
Do you want to change the DGS reference echo?
appears.
Operation
If required, confirm by pressing again.
After the successful recording of the reference echo, a
highlighted R will be displayed in the measurement line.
Set the function DGSMOD> to on, to switch on DGS
curve.
Taking the general DGS diagram as a basis, the instru-
ment calculates the required test sensitivity for display-
ing the 3 mm curve with its maximum at 80 % screen
height, and sets this value. The current gain is set to 0
during this. In the case of subsequent gain variations,
the curve is automatically adapted.
Evaluation of reflectors
Every echo situated within the gate can be immediately
evaluated:
The measurement line has been configured in such a
way that the sound path S, the echo height in dB
referred to the DGS curve, the equivalent reflector
size (ERS) of the flaw echo and the calibration range
are displayed.
The measured value to be zoomed in the A-scan is
chosen by means of the function S-DISP in the func-
tion group MEAS. ERS was chosen in the above exam-
ple. (Also refer to Configuring the measurement line,
p. 5-49.)
Operation
If required, confirm by pressing again.
After the successful recording of the reference echo, a
highlighted R will be displayed in the measurement line.
Set the function DGSMOD> to on, to switch on DGS
curve.
Taking the general DGS diagram as a basis, the instru-
ment calculates the required test sensitivity for display-
ing the 3 mm curve with its maximum at 80 % screen
height, and sets this value. The current gain is set to 0
during this. In the case of subsequent gain variations,
the curve is automatically adapted.
Evaluation of reflectors
Every echo situated within the gate can be immediately
evaluated:
The measurement line has been configured in such a
way that the sound path S, the echo height in dB
referred to the DGS curve, the equivalent reflector
size (ERS) of the flaw echo and the calibration range
are displayed.
The measured value to be zoomed in the A-scan is
chosen by means of the function S-DISP in the func-
tion group MEAS. ERS was chosen in the above exam-
ple. (Also refer to Configuring the measurement line,
p. 5-49.)
Operation
S-DISP = Ha%, i.e. echo height evaluation as a per-
centage.
At the same time, the multiple-curve display mode is
also active with a curve distance of OFFSET = 6 dB.
S-DISP = Ha%Crv, the evaluation result is now the
value exceeding the curve in %.
S-DISP = Gt is a special case: the value displayed is
the DGS test sensitivity with which the maximum of the
specified curve is at 80 %.
This value serves for the purpose of checking and doc-
umenting.
Operation
S-DISP = Ha%, i.e. echo height evaluation as a per-
centage.
At the same time, the multiple-curve display mode is
also active with a curve distance of OFFSET = 6 dB.
S-DISP = Ha%Crv, the evaluation result is now the
value exceeding the curve in %.
S-DISP = Gt is a special case: the value displayed is
the DGS test sensitivity with which the maximum of the
specified curve is at 80 %.
This value serves for the purpose of checking and doc-
umenting.
Operation
Transfer correction
The transfer correction is activated by means of the
function T-CORR. The test sensitivity is varied by this
value without recalculating the curve.
This means that the test sensitivity is increased by
6 dB in the example in order to compensate for a possi-
bly existing surface roughness. The echo is conse-
quently drawn higher by 6 dB on the left, i.e. evaluated
with ERS 3.2. Status indicator in the measurement line:
a highlighted T.
Sound attenuation
If necessary, the DGS curve can take the components
effective sound attenuation (ATT-OBJ) into account.
With the value set here, the curve shape is recalculat-
ed so that the effect of sound attenuation is now taken
into consideration when evaluating reflectors.
The DGS curve now includes the effect of sound at-
tenuation. An active sound attenuation correction is
indicated in the measurement line by a highlighted A.
The sound attenuation in the reference block can only
be set prior to recording the reference echo. Therefore,
an error message is displayed here if an attempt is
Operation
Transfer correction
The transfer correction is activated by means of the
function T-CORR. The test sensitivity is varied by this
value without recalculating the curve.
This means that the test sensitivity is increased by
6 dB in the example in order to compensate for a possi-
bly existing surface roughness. The echo is conse-
quently drawn higher by 6 dB on the left, i.e. evaluated
with ERS 3.2. Status indicator in the measurement line:
a highlighted T.
Sound attenuation
If necessary, the DGS curve can take the components
effective sound attenuation (ATT-OBJ) into account.
With the value set here, the curve shape is recalculat-
ed so that the effect of sound attenuation is now taken
into consideration when evaluating reflectors.
The DGS curve now includes the effect of sound at-
tenuation. An active sound attenuation correction is
indicated in the measurement line by a highlighted A.
The sound attenuation in the reference block can only
be set prior to recording the reference echo. Therefore,
an error message is displayed here if an attempt is
Operation
made to change the value because, in fact, a valid
reference echo already exists.
In addition, a different reference reflector type has been
used in the DGS menu below: instead of a backwall, a
circular disk (flat-bottom hole) having a diameter of
3 mm has been set in this case. In this case, of course,
the reference echo has to be received from a 3 mm
circular disk.
After switching on the DGS curve, the reference echo
must therefore clearly touch the 3 mm curve.
A side-drilled hole can also be used as a further refer-
ence reflector with some limitations. It must have a
diameter corresponding to at least 1.5 times the wave-
length used, and the distance must be 1.5 times the
near-field length. The USM 35X S will check these con-
ditions if you aim to use a side-drilled hole as reference
reflector, and will issue an error message if required.
The table on the next page indicates these minimum
data for the existing probes in steel.
Conditions for the use of side-drilled holes as reference
reflectors in steel. For other materials, the values must
be converted accordingly.
Operation
made to change the value because, in fact, a valid
reference echo already exists.
In addition, a different reference reflector type has been
used in the DGS menu below: instead of a backwall, a
circular disk (flat-bottom hole) having a diameter of
3 mm has been set in this case. In this case, of course,
the reference echo has to be received from a 3 mm
circular disk.
After switching on the DGS curve, the reference echo
must therefore clearly touch the 3 mm curve.
A side-drilled hole can also be used as a further refer-
ence reflector with some limitations. It must have a
diameter corresponding to at least 1.5 times the wave-
length used, and the distance must be 1.5 times the
near-field length. The USM 35X S will check these con-
ditions if you aim to use a side-drilled hole as reference
reflector, and will issue an error message if required.
The table on the next page indicates these minimum
data for the existing probes in steel.
Conditions for the use of side-drilled holes as reference
reflectors in steel. For other materials, the values must
be converted accordingly.
Operation
Probe Wavelength Minimum Diameter Near Field Length Minimum Distance
in steel side-drilled hole in steel in steel
[mm] [mm] [mm] [mm]
B 1 S 6.0 9.0 23 35
B 2 S 3.0 4.5 45 68
B 4 S 1.5 2.3 90 135
MB 2 S 3.0 4.5 8 12
MB 4 S 1.5 2.3 15 23
MB 5 S 1.2 1.8 20 30
MWB ...-2 1.6 2.4 15 23
MWB ...-4 0.8 1.2 30 45
SWB ...-2 1.6 2.4 39 59
SWB ...-5 0.7 1.1 98 147
WB ...-1 3.3 5.0 45 68
WB ...-2 1.6 2.4 90 135
Operation
Probe Wavelength Minimum Diameter Near Field Length Minimum Distance
in steel side-drilled hole in steel in steel
[mm] [mm] [mm] [mm]
B 1 S 6.0 9.0 23 35
B 2 S 3.0 4.5 45 68
B 4 S 1.5 2.3 90 135
MB 2 S 3.0 4.5 8 12
MB 4 S 1.5 2.3 15 23
MB 5 S 1.2 1.8 20 30
MWB ...-2 1.6 2.4 15 23
MWB ...-4 0.8 1.2 30 45
SWB ...-2 1.6 2.4 39 59
SWB ...-5 0.7 1.1 98 147
WB ...-1 3.3 5.0 45 68
WB ...-2 1.6 2.4 90 135
Locks, error messages
As long as a valid reference echo is stored, no func-
tions can be changed which could cause an incorrect
DGS evaluation. If an attempt is made to change such
a function, the corresponding error message will appear,
e.g.
P-DELAY locked by DGS-REF = on
The DGS evaluation must likewise be switched off and
the reference echo deleted in the case of selecting a
new probe, e.g. for a new test application.
Validity of the DGS method
Echo amplitude evaluations according to the DGS
method are only reliable and reproducible in cases
when:
The reference echo is received from the test object if
possible. If this is not possible, it should be ensured
that the reference block is made of the same materi-
al as the test object.
The evaluation is carried out using the same probe
which was also used for recording the reference
echo. Another probe of the same type can be used
after recording a new reference echo.
Echo amplitudes for reflector distances smaller than
half of the probes near-field length are subject to
heavy variation for physical reasons due to interfer-
ence phenomena effecting the area. Thus, evaluation
results may fluctuate more as the usually permissi-
ble 2 dB. An evaluation according to the DGS
method is possible but not recommended for this
cases.
Locks, error messages
As long as a valid reference echo is stored, no func-
tions can be changed which could cause an incorrect
DGS evaluation. If an attempt is made to change such
a function, the corresponding error message will appear,
e.g.
P-DELAY locked by DGS-REF = on
The DGS evaluation must likewise be switched off and
the reference echo deleted in the case of selecting a
new probe, e.g. for a new test application.
Validity of the DGS method
Echo amplitude evaluations according to the DGS
method are only reliable and reproducible in cases
when:
The reference echo is received from the test object if
possible. If this is not possible, it should be ensured
that the reference block is made of the same materi-
al as the test object.
The evaluation is carried out using the same probe
which was also used for recording the reference
echo. Another probe of the same type can be used
after recording a new reference echo.
Echo amplitudes for reflector distances smaller than
half of the probes near-field length are subject to
heavy variation for physical reasons due to interfer-
ence phenomena effecting the area. Thus, evaluation
results may fluctuate more as the usually permissi-
ble 2 dB. An evaluation according to the DGS
method is possible but not recommended for this
cases.
Documentation 6
Documentation 6
Documentation Printing data
6.1 Printing data
Direct printing of the following data via the RS 232
interface is possible using the USM 35X:
test report containing the A-scan and the adjustment
data
A-scan
single reading (position 1 of the measurement line)
function list (including all current settings)
Data Logger (if the version is available)
To do this, you need
a printer with serial interface RS 232
a printer cable (please see chapter 2)
Preparing the printer
The transfer parameter settings for the serial port are:
Baud rate 0 (no transmission), 300, 600, 1200,
2400, 4800, 9600 (default), 19200,
38400, and 57600
Word length 8 data bits (fixed)
Parity none (fixed)
Stop bits 2 (fixed)
In order to ensure a perfect communication, set the
printer to the parameters of the USM 35X.
Preparing the USM 35X
You decide on the type of printout by assigning the
key.
Select the function PRINTER, and then use the right-
hand rotary knob to select the correct printer driver.
6.1 Printing data
Direct printing of the following data via the RS 232
interface is possible using the USM 35X:
test report containing the A-scan and the adjustment
data
A-scan
single reading (position 1 of the measurement line)
function list (including all current settings)
Data Logger (if the version is available)
To do this, you need
a printer with serial interface RS 232
a printer cable (please see chapter 2)
Preparing the printer
The transfer parameter settings for the serial port are:
Baud rate 0 (no transmission), 300, 600, 1200,
2400, 4800, 9600 (default), 19200,
38400, and 57600
Word length 8 data bits (fixed)
Parity none (fixed)
Stop bits 2 (fixed)
In order to ensure a perfect communication, set the
printer to the parameters of the USM 35X.
Preparing the USM 35X
You decide on the type of printout by assigning the
key.
Select the function PRINTER, and then use the right-
hand rotary knob to select the correct printer driver.
Use to select the function COPYMOD, and then
use the right-hand rotary knob to select the setting:
hardcpy, report, meas P5 (enlarged value in A-scan),
meas P1 (measured value at position 1), pardump
(function list), datalog (Data Logger job including
measured values), special (several A-scans on one
page).
H Note:
The setting PCX generates a PCX-format file which you
can transfer to a PC by means of a suitable program
capable of receiving and storing data.
Printing
If you have connected, prepared and activated the
printer, just press the key.
The report is printed out.
If you have selected the setting special, press the
key again for each A-scan that you want to print out.
Use to select the function COPYMOD, and then
use the right-hand rotary knob to select the setting:
hardcpy, report, meas P5 (enlarged value in A-scan),
meas P1 (measured value at position 1), pardump
(function list), datalog (Data Logger job including
measured values), special (several A-scans on one
page).
H Note:
The setting PCX generates a PCX-format file which you
can transfer to a PC by means of a suitable program
capable of receiving and storing data.
Printing
If you have connected, prepared and activated the
printer, just press the key.
The report is printed out.
If you have selected the setting special, press the
key again for each A-scan that you want to print out.
Documentation
6.2 Documentation with UltraDOC
The special application program UltraDOC from GE
Inspection Technologies enables you to remote-control
the USM 35X and to include instrument settings in
ASCII format or screen contents in PCX or IMG format
in your test report.
All data can be further processed using commerical
word processing or DTP programs.
You will receive information about the reliable use of the
program in a detailed operating manual.
Documentation with UltraDOC
Documentation
6.2 Documentation with UltraDOC
The special application program UltraDOC from GE
Inspection Technologies enables you to remote-control
the USM 35X and to include instrument settings in
ASCII format or screen contents in PCX or IMG format
in your test report.
All data can be further processed using commerical
word processing or DTP programs.
You will receive information about the reliable use of the
program in a detailed operating manual.
Documentation with UltraDOC
Maintenance and care 7
Maintenance and care 7
Maintenance and care Care of the instrument
7.1 Care of the instrument
Clean the instrument and its accessories using a moist
cloth. Only use the following recommended instrument
cleaners:
water,
a mild household cleaner or
alcohol (no methyl alcohol).
A Attention:
Do not use any methyl alcohol, solvents, or dye pen-
etrant cleaners!
The plastic parts can be damaged or embrittled by this.
Maintenance and care Care of the instrument
7.1 Care of the instrument
Clean the instrument and its accessories using a moist
cloth. Only use the following recommended instrument
cleaners:
water,
a mild household cleaner or
alcohol (no methyl alcohol).
A Attention:
Do not use any methyl alcohol, solvents, or dye pen-
etrant cleaners!
The plastic parts can be damaged or embrittled by this.
Maintenance and care
Care of the batteries
7.2 Care of the batteries
Capacity and life of batteries mainly depend on the
correct handling. Please therefore observe the tips be-
low.
You should charge the batteries in the following cases:
before the initial startup
after a storage time of 3 months or longer
after frequent partial discharge
the instrument or by means of the external battery
charger DR36 (order number 35 297) recommended by
us. You always need an external battery charger to
charge standard C-cells. In this regard, please pay at-
tention to the information on the operation of the battery
charger.
A Attention:
You should only use the batteries recommended by us
and the corresponding battery charger. An improper
handling of the batteries and of the battery charger may
cause explosion hazard.
Charging of partially discharged NiCd batteries
If batteries are only partially discharged (less than
50 % of operating time), the full capacity is not reached
by normal charging.
Start by fully discharging the batteries. You can use
the discharging function of the charger for this. For
more details, please read the notes on the operation
of the battery charger.
The batteries are automatically charged after that.
Charging of exhausted NiCd batteries
If batteries are exhausted, e.g. after a prolonged stor-
age time in empty state, they often reach their full ca-
pacity only after repeated discharge/charge cycles.
7.2 Care of the batteries
Capacity and life of batteries mainly depend on the
correct handling. Please therefore observe the tips be-
low.
You should charge the batteries in the following cases:
before the initial startup
after a storage time of 3 months or longer
after frequent partial discharge
the instrument or by means of the external battery
charger DR36 (order number 35 297) recommended by
us. You always need an external battery charger to
charge standard C-cells. In this regard, please pay at-
tention to the information on the operation of the battery
charger.
A Attention:
You should only use the batteries recommended by us
and the corresponding battery charger. An improper
handling of the batteries and of the battery charger may
cause explosion hazard.
Charging of partially discharged NiCd batteries
If batteries are only partially discharged (less than
50 % of operating time), the full capacity is not reached
by normal charging.
Start by fully discharging the batteries. You can use
the discharging function of the charger for this. For
more details, please read the notes on the operation
of the battery charger.
The batteries are automatically charged after that.
Charging of exhausted NiCd batteries
If batteries are exhausted, e.g. after a prolonged stor-
age time in empty state, they often reach their full ca-
pacity only after repeated discharge/charge cycles.
Maintenance and care Care of the batteries
The charger identifies defective batteries. In that case,
replace the batteries by a new set. Otherwise there is
the danger that individual cells have different capacities
so that you will no longer obtain the normal operating
time with the instrument in battery operation.
How to handle alkaline batteries
Please remove the batteries from the instrument if it
has not been operated for a longer time.
A Attention:
Leaking batteries may cause severe damages to the
instrument! You should always only use leak-proof
batteries and remove them from the instrument after
turning it off.
H Note:
Used batteries are special waste and have to be
disposed of according to legal requirements!
In the interest of environmental protection, we recom-
mend that you only use rechargeable batteries.
Maintenance and care Care of the batteries
The charger identifies defective batteries. In that case,
replace the batteries by a new set. Otherwise there is
the danger that individual cells have different capacities
so that you will no longer obtain the normal operating
time with the instrument in battery operation.
How to handle alkaline batteries
Please remove the batteries from the instrument if it
has not been operated for a longer time.
A Attention:
Leaking batteries may cause severe damages to the
instrument! You should always only use leak-proof
batteries and remove them from the instrument after
turning it off.
H Note:
Used batteries are special waste and have to be
disposed of according to legal requirements!
In the interest of environmental protection, we recom-
mend that you only use rechargeable batteries.
7.3 Maintenance
The USM 35X requires basically no maintenance.
A Attention:
Repair work may only be carried out by members of
authorized Service staff of GE Inspection Technologies.
Maintenance
7.3 Maintenance
The USM 35X requires basically no maintenance.
A Attention:
Repair work may only be carried out by members of
authorized Service staff of GE Inspection Technologies.
Maintenance
7.4 Recycling
General view of the device
In the following you find an instrument overview as well as guidelines and notes for recycling and waste disposal of
the components.
8
9
1
3
5
4
2
7
6
Recycling
7.4 Recycling
General view of the device
In the following you find an instrument overview as well as guidelines and notes for recycling and waste disposal of
the components.
8
9
1
3
5
4
2
7
6
Recycling
No. Recycling/material code Description
1 Lithium-ion battery Battery inside the battery compartment at the bottom of the instrument. In
order to open the compartment the quick acting closures have to be
actuated.
2 LCD - display Fluorescent lamps of the LCD display contain trance amounts (0 0.5 mg)
of Mercury (Hg)
3 >PC< / Brass Upper equipment cover Polycarbonat >PC< with pressed in brass thread
insert.
4 Stainless steel Handle complete
5 Aluminium Rotary control button
6 >PC< Holder for handle
7 Stainless steel Ratchet disk
8 >PC< Housing lower part
9 Aluminium Div. mounting brackets
Recycling
1 Lithium-ion battery Battery inside the battery compartment at the bottom of the instrument. In
order to open the compartment the quick acting closures have to be
actuated.
of Mercury (Hg)
insert.
4 Stainless steel Handle complete
5 Aluminium Rotary control button
6 >PC< Holder for handle
7 Stainless steel Ratchet disk
8 >PC< Housing lower part
9 Aluminium Div. mounting brackets
Recycling
Materials for separate disposal
In the following you find guidelines and notes for removing materials/components, which must be removed and
treated separately.
1
4
3
2
Recycling
Materials for separate disposal
In the following you find guidelines and notes for removing materials/components, which must be removed and
treated separately.
1
4
3
2
Recycling
1 In order to remove the LCD-Display the upper housing has to be withdrawn
first. After loosing 6 screws on the bottom side and one further in battery-
compartment, the complete upper housing can be taken away.
2 In order to open the compartment at the bottom of the equipment, the quick
acting closures have to be actuated.
3 Lithium-ion battery Inside the battery compartment. Can easily be removed after opening the
battery cover.
of Mercury (Hg).
Recycling
1 In order to remove the LCD-Display the upper housing has to be withdrawn
first. After loosing 6 screws on the bottom side and one further in battery-
compartment, the complete upper housing can be taken away.
2 In order to open the compartment at the bottom of the equipment, the quick
acting closures have to be actuated.
3 Lithium-ion battery Inside the battery compartment. Can easily be removed after opening the
battery cover.
of Mercury (Hg).
Recycling
Further materials and components
In the following you find notes for dismantling materials/components, which can disturb several recycling pro-
cesses, and materials/components for which benefits can normally be achieved.
3
1
2 5
4
Recycling
Further materials and components
In the following you find notes for dismantling materials/components, which can disturb several recycling pro-
cesses, and materials/components for which benefits can normally be achieved.
3
1
2 5
4
Recycling
insert.
2 Circuit boards Circuit board in lower housing, under it battery-PCB
3 Aluminium Two rotary control buttons
4 Stainless steel Handle, rubber tube can be removed
5 >PC< Lower housing and battery-cover
Recycling
insert.
2 Circuit boards Circuit board in lower housing, under it battery-PCB
3 Aluminium Two rotary control buttons
4 Stainless steel Handle, rubber tube can be removed
5 >PC< Lower housing and battery-cover
Recycling
Recycling data of master device
Recycling/material code Weight Description
approx. (kg)
Materials/components, which must be removed and treated separately:
LCD - display 0.22 Fluorescent lamps of the LCD display contain trance amounts
(0 0.5 mg) of Mercury (Hg)
Lithium-ion battery 0.49 Located inside the battery compartment
subtotal 0.71
Materials/components, which can disturb certain recycling processes:
>PC< / brass 0.16 Upper equipment cover Polycarbonat >PC< with pressed in
brass thread insert.
Circuit boards 0.33 Under LC display unit
subtotal 0.49
Materials/components, through which benefits can normally be achieved:
Stainless steel 0.18 Handle, ratchet disk,
Aluminium 0.15 Rotary control button, mounting sheets,
>PC< 0.42 Lower housing, holder for handle, battery-cover
Rubber 0.05 O-Rings, rubberbase, rubber tube of handle, keypad sealing
subtotal 0.80
Recycling
Recycling data of master device
approx. (kg)
Materials/components, which must be removed and treated separately:
LCD - display 0.22 Fluorescent lamps of the LCD display contain trance amounts
(0 0.5 mg) of Mercury (Hg)
Lithium-ion battery 0.49 Located inside the battery compartment
subtotal 0.71
Materials/components, which can disturb certain recycling processes:
>PC< / brass 0.16 Upper equipment cover Polycarbonat >PC< with pressed in
brass thread insert.
Circuit boards 0.33 Under LC display unit
subtotal 0.49
Materials/components, through which benefits can normally be achieved:
Stainless steel 0.18 Handle, ratchet disk,
Aluminium 0.15 Rotary control button, mounting sheets,
>PC< 0.42 Lower housing, holder for handle, battery-cover
Rubber 0.05 O-Rings, rubberbase, rubber tube of handle, keypad sealing
subtotal 0.80
Recycling
approx. (kg)
Composite materials*:
Membrane keypad 0.20 Foil/aluminium/glass/spring steel/stainless steel
subtotal 0.20
Total 2.20
Mounting material, cables, 0.16
clamps, screws ...
Total weight (incl. battery) 2.36
Special notes: none
* Materials/components, which cannot be separated into mono materials by destructive mechanical processes
Recycling
approx. (kg)
Composite materials*:
Membrane keypad 0.20 Foil/aluminium/glass/spring steel/stainless steel
subtotal 0.20
Total 2.20
Mounting material, cables, 0.16
clamps, screws ...
Total weight (incl. battery) 2.36
Special notes: none
* Materials/components, which cannot be separated into mono materials by destructive mechanical processes
Recycling
Interfaces and peripherals 8
Interfaces and peripherals 8
Interfaces and Peripherals
8.1 Interfaces
The USM 35X presents different interfaces for the con-
nection of external units and for the data exchange. All
interfaces are located at the instrument front. The fol-
lowing figure gives an overview of the position of inter-
faces.
Interfaces
8.1 Interfaces
The USM 35X presents different interfaces for the con-
nection of external units and for the data exchange. All
interfaces are located at the instrument front. The fol-
lowing figure gives an overview of the position of inter-
faces.
Interfaces
Interfaces and Peripherals Interfaces
1 BNC or LEMO-1-TRIAX socket for the connection of
the transmitter probe (black ring)
the receiver probe (red ring)
3 RS 232
serial interface, 9-way Sub-D socket
4 I/O
analog interface, 8-way LEMO-1-B socket
5 RGB-OUT
VGA interface, 10-way LEMO-1-B socket
6 12V DC
Mains connection socket, 4-way LEMO-0-B socket
Interfaces and Peripherals Interfaces
the transmitter probe (black ring)
the receiver probe (red ring)
3 RS 232
serial interface, 9-way Sub-D socket
4 I/O
analog interface, 8-way LEMO-1-B socket
5 RGB-OUT
VGA interface, 10-way LEMO-1-B socket
6 12V DC
Mains connection socket, 4-way LEMO-0-B socket
8.2 I/O interface
The USM 35X has an 8-way I/O interface (LEMO-1-B
socket) for different input and output signals:
SAP output (transmitter trigger pulse)
Alarm output (TTL): switching delay approx. 50 ms,
hold time approx. 500 ms.
TDR input (test data release)
Analog output
H Note:
You are able to externally process the alarm condition
with the alarm output, e.g. for sorting and other control
purposes. Error alarms can be triggered under certain
circumstances. These are caused by intermediate con-
ditions in instrument operation occuring when the in-
strument is used, i.e. when function parameters are
changed. Possible alarms occuring during instru-
ment operation (setting of functions) are to be ig-
nored.
I/O interface
View of the 8-way LEMO-1-B socket
8.2 I/O interface
The USM 35X has an 8-way I/O interface (LEMO-1-B
socket) for different input and output signals:
SAP output (transmitter trigger pulse)
Alarm output (TTL): switching delay approx. 50 ms,
hold time approx. 500 ms.
TDR input (test data release)
Analog output
H Note:
You are able to externally process the alarm condition
with the alarm output, e.g. for sorting and other control
purposes. Error alarms can be triggered under certain
circumstances. These are caused by intermediate con-
ditions in instrument operation occuring when the in-
strument is used, i.e. when function parameters are
changed. Possible alarms occuring during instru-
ment operation (setting of functions) are to be ig-
nored.
I/O interface
View of the 8-way LEMO-1-B socket
Contact assignment of the LEMO-1-B socket
Contact Description Signal direction Level Colour (UM 25*)
1 SAP output TTL white
2 alarm A output TTL grey
3 alarm B output TTL yellow
4 unassigned pink
5 unassigned black
6 TDR input TTL active high blue
7 Analog output, amplitude or time of flight output 0 5 V green
(selectable via remote-control code, see
chapter 8.4 Remote Control)
8 GND ground brown
*UM 25: analog cable (35 268)
I/O interface
Contact assignment of the LEMO-1-B socket
Contact Description Signal direction Level Colour (UM 25*)
1 SAP output TTL white
2 alarm A output TTL grey
3 alarm B output TTL yellow
4 unassigned pink
5 unassigned black
6 TDR input TTL active high blue
7 Analog output, amplitude or time of flight output 0 5 V green
(selectable via remote-control code, see
chapter 8.4 Remote Control)
8 GND ground brown
*UM 25: analog cable (35 268)
I/O interface
8.3 RS 232 interface
The USM 35X has a RS 232 interface for remote con-
trol and documentation (report printout).
Contact assignment of the Sub-D socket
Contact Designation Signal direction Level
1 unassigned
2 RXD input RS 232
3 TXD output RS 232
4 DTR output RS 232
5 ground RS 232
6 DSR input RS 232
7 RTS output RS 232
8 CTS input RS 232
9 unassigned
H Note:
Switch off the instrument before connecting a cable to
the RS 232 socket or before withdrawing any plugs.
RS 232 interface
View of the 9-way Sub-D socket
8.3 RS 232 interface
The USM 35X has a RS 232 interface for remote con-
trol and documentation (report printout).
Contact assignment of the Sub-D socket
Contact Designation Signal direction Level
1 unassigned
2 RXD input RS 232
3 TXD output RS 232
4 DTR output RS 232
5 ground RS 232
6 DSR input RS 232
7 RTS output RS 232
8 CTS input RS 232
9 unassigned
H Note:
Switch off the instrument before connecting a cable to
the RS 232 socket or before withdrawing any plugs.
RS 232 interface
View of the 9-way Sub-D socket
8.4 RGB interface
The RGB interface serves for the output of the VGA
signal. You can use this interface to connect the
USM 35X with a monitor or with a VGA projector
(beamer). The current display contents are then trans-
ferred to the external unit and can be further used
accordingly.
H Note:
For technical reasons it is unfortunately not possible to
maintain a stable synchronisation of both displays if
the VGA output is active. The external signal for the
connected monitor or beamer is entirely synchronised.
A flickering of the internal display has to be accepted
though. The internal display will be synchronous as
soon as the VGA output has been deactivated.
The interface is a 10-way socket type Lemo-0-B. The
standard contact assignment makes it suitable for all
VGA output units. Use the VGA adapter UM 31 (order
number 35 653) in order to connect a VGA output unit.
H Note:
Before you are able to use the RGB interface, you
have to activate the function VGA in the function group
LCD first.
RGB interface
8.4 RGB interface
The RGB interface serves for the output of the VGA
signal. You can use this interface to connect the
USM 35X with a monitor or with a VGA projector
(beamer). The current display contents are then trans-
ferred to the external unit and can be further used
accordingly.
H Note:
For technical reasons it is unfortunately not possible to
maintain a stable synchronisation of both displays if
the VGA output is active. The external signal for the
connected monitor or beamer is entirely synchronised.
A flickering of the internal display has to be accepted
though. The internal display will be synchronous as
soon as the VGA output has been deactivated.
The interface is a 10-way socket type Lemo-0-B. The
standard contact assignment makes it suitable for all
VGA output units. Use the VGA adapter UM 31 (order
number 35 653) in order to connect a VGA output unit.
H Note:
Before you are able to use the RGB interface, you
have to activate the function VGA in the function group
LCD first.
RGB interface
8.5 Data exchange
The USM 35X is equipped with the serial interface
RS 232 for bi-directional data communication with a PC.
When you connect the instrument with a PC you can:
remote control the instrument via the PC,
transfer A-scans for documentation,
transfer instrument settings in ASCII format,
transfer reports from stored datasets,
transfers Datalogger jobs in ASCII format (option)
read and write datasets in binary format.
Connecting a printer or a PC
You can connect the USM 35X to a printer or a PC
using the special Krautkramer cables:
PC: UD 20 (25-way) or UD 31 (9-way)
Printer: UD 31 (Seiko DPU) or UD 32 (Epson)
Please refer to chapter 2.
Activation of serial communication
After connecting the instrument to the PC you must
run a software that opens the serial port. This can ei-
ther be a commercial terminal program (e.g. Microsoft
Hyper Terminal) or a customised program like
UltraDOC. Make sure that the serial communication
parameters on the PC are identical to those of the
instrument.
The data transmission parameters are as follows:
Baud rate: 0 (no transmission), 300, 600, 1200,
2400, 4800, 9600 (default), 19200,
38400, and 57600
Word length: 8 data bits (fixed)
Parity: none (fixed)
Stop bits: 2 (fixed)
The baud rate can be set in the function BAUD-R in
the menu CFG1 from the third operating level.
The settings on the USM 35X apply to most of the
printers and PCs. To ensure a perfect communication,
please check the settings of the connected peripherals
and adjust them to the parameters of the USM 35X.
Data exchange
8.5 Data exchange
The USM 35X is equipped with the serial interface
RS 232 for bi-directional data communication with a PC.
When you connect the instrument with a PC you can:
remote control the instrument via the PC,
transfer A-scans for documentation,
transfer instrument settings in ASCII format,
transfer reports from stored datasets,
transfers Datalogger jobs in ASCII format (option)
read and write datasets in binary format.
Connecting a printer or a PC
You can connect the USM 35X to a printer or a PC
using the special Krautkramer cables:
PC: UD 20 (25-way) or UD 31 (9-way)
Printer: UD 31 (Seiko DPU) or UD 32 (Epson)
Please refer to chapter 2.
Activation of serial communication
After connecting the instrument to the PC you must
run a software that opens the serial port. This can ei-
ther be a commercial terminal program (e.g. Microsoft
Hyper Terminal) or a customised program like
UltraDOC. Make sure that the serial communication
parameters on the PC are identical to those of the
instrument.
The data transmission parameters are as follows:
Baud rate: 0 (no transmission), 300, 600, 1200,
2400, 4800, 9600 (default), 19200,
38400, and 57600
Word length: 8 data bits (fixed)
Parity: none (fixed)
Stop bits: 2 (fixed)
The baud rate can be set in the function BAUD-R in
the menu CFG1 from the third operating level.
The settings on the USM 35X apply to most of the
printers and PCs. To ensure a perfect communication,
please check the settings of the connected peripherals
and adjust them to the parameters of the USM 35X.
Data exchange
Printing data
The USM 35X enables a direct printout of data, for
example a report including the echo display and the
instrument settings.
To do this, select the printer driver in the function
PRINTER (function group CFG1) and just press the
key after having initialized and activated the printer.
The data selected by you in the function COPYMOD
(function group CFG1) are printed.
For more details on this, please refer to chapter 6.
Data exchange
8.6 Remote control
You can use a connected PC for the remote control of
the USM35X.
The data transfer is carried out by means of a remote
control program and the corresponding remote control
commands. These commands represent instructions
referring to the individual functions of the USM 35X.
The program Crosstalk can for example be used as
remote control program under DOS. In Windows based
systems it is possible to use e.g. the Terminal program.
After the remote control program has been started and
the program interface has been configured, the com-
mands are input via the keyboard of the computer. In
this connection, please observe the following differen-
tiation:
Interrogation of a value or state of a USM 35X
function using the command structure:
<ESC> <COMMAND> <RETURN>
The USM 35X transmits the value of the current setting.
Printing data
The USM 35X enables a direct printout of data, for
example a report including the echo display and the
instrument settings.
To do this, select the printer driver in the function
PRINTER (function group CFG1) and just press the
key after having initialized and activated the printer.
The data selected by you in the function COPYMOD
(function group CFG1) are printed.
For more details on this, please refer to chapter 6.
Data exchange
8.6 Remote control
You can use a connected PC for the remote control of
the USM35X.
The data transfer is carried out by means of a remote
control program and the corresponding remote control
commands. These commands represent instructions
referring to the individual functions of the USM 35X.
The program Crosstalk can for example be used as
remote control program under DOS. In Windows based
systems it is possible to use e.g. the Terminal program.
After the remote control program has been started and
the program interface has been configured, the com-
mands are input via the keyboard of the computer. In
this connection, please observe the following differen-
tiation:
Interrogation of a value or state of a USM 35X
function using the command structure:
<ESC> <COMMAND> <RETURN>
The USM 35X transmits the value of the current setting.
Entry of a new value or state of a function using the
command structure:
<ESC> <COMMAND> <SPACE> <VALUE> <RE TURN>
All values are entered or transmitted by the USM 35X
without a comma or a point. The resolution of the func-
tion should therefore be observed with all values. The
resolution of a function applies to the entire value
range of that function.
A resolution of 0.01 means:
The USM 35X transmits the value of a function multi-
plied by the factor of 100. The entry of a value must be
done multiplied by the factor of 100.
Examples
Setting of the display delay to 72.39 mm:
<ESC>dd 7239 <RETURN>
Setting of the display width to 72.3 mm:
<ESC>dw 7230 <RETURN>
Remote control
Setting of the display width to 192 mm:
Example:
Setting of the gain to 51.5 dB
<ESC>db 515 <RETURN>
A resolution of 1 means:
The USM 35X transmits the value of a function without
multiplication. The entry of a value must be done with-
out any multiplication.
Example:
Setting the response threshold of gate a to 41 %:
<ESC>at 41 <RETURN>
Entry of a new value or state of a function using the
command structure:
<ESC> <COMMAND> <SPACE> <VALUE> <RE TURN>
All values are entered or transmitted by the USM 35X
without a comma or a point. The resolution of the func-
tion should therefore be observed with all values. The
resolution of a function applies to the entire value
range of that function.
Examples
Setting of the display delay to 72.39 mm:
<ESC>dd 7239 <RETURN>
Setting of the display width to 72.3 mm:
Remote control
Setting of the display width to 192 mm:
Example:
Setting of the gain to 51.5 dB
<ESC>db 515 <RETURN>
A resolution of 1 means:
The USM 35X transmits the value of a function without
multiplication. The entry of a value must be done with-
out any multiplication.
Example:
Setting the response threshold of gate a to 41 %:
<ESC>at 41 <RETURN>
Interfaces and Peripherals Remote control
Syntax and timing
The syntax and timing of the communication with the
instrument is as follows:
With:
ESC = escape (ASCII CHR 27)
* = star (ASCII CHR 42)
AB = remote code of an instrument function
CR = carriage return (ASCII CHR 13)
|_| = Space (ASCII CHR 32)
n Bytes = function value of function AB
ETX = end of text (ASCII CHR 3)
LF = line feed (ASCII CHR 10)
Syntax and timing
The syntax and timing of the communication with the
instrument is as follows:
With:
ESC = escape (ASCII CHR 27)
* = star (ASCII CHR 42)
AB = remote code of an instrument function
CR = carriage return (ASCII CHR 13)
|_| = Space (ASCII CHR 32)
n Bytes = function value of function AB
ETX = end of text (ASCII CHR 3)
LF = line feed (ASCII CHR 10)
Transmission timing
As soon as the instrument has received the ESC
command, is will return the * which then will be
displayed on PC screen.
Then you key in the wanted remote code according
to the given table. The instrument echoes your
entries.
Finally you hit the [CR]-key on your keyboard or
send the CR-command (closing the remote
command).
The instrument will now return a blank, then the
related function value which may consist of several
Bytes, then the end of text character, and finally
the carriage return and the line feed character.
Remote control
Transmission timing
As soon as the instrument has received the ESC
command, is will return the * which then will be
displayed on PC screen.
Then you key in the wanted remote code according
to the given table. The instrument echoes your
entries.
Finally you hit the [CR]-key on your keyboard or
send the CR-command (closing the remote
command).
The instrument will now return a blank, then the
related function value which may consist of several
Bytes, then the end of text character, and finally
the carriage return and the line feed character.
Remote control
Example:
Request RANGE value from the USM 35X
Remote code of the range function is DW (display
width). Please note that numerical function values are
always returned as integer values with the given maxi-
mum resolution, here DW = 5000 means 50.00 mm.
Example:
Request reading at position 2 in the measurement line
Remote code of measurement position 2 is E2 (evalu-
ation 2). E2 = 10.81 means 10.81 mm (here sound
path of the echo in gate A had been displayed). Please
note that all readings are shown in that applicable
decimal format where the decimal separator is a dot.
Example:
Request RANGE value from the USM 35X
Remote code of the range function is DW (display
width). Please note that numerical function values are
always returned as integer values with the given maxi-
mum resolution, here DW = 5000 means 50.00 mm.
Example:
Request reading at position 2 in the measurement line
Remote code of measurement position 2 is E2 (evalu-
ation 2). E2 = 10.81 means 10.81 mm (here sound
path of the echo in gate A had been displayed). Please
note that all readings are shown in that applicable
decimal format where the decimal separator is a dot.
Changing a function value
Key in [ESC] DW [Space] 2000 [CR] in order to set
the range to 20.00 mm:
Please note that you must key in the function value as
an integer with the maximum given resolution, here
2000 for the range of 20 mm.
Alphanumerical entries
Key in [ESC] DN [Space] Weld inspection B 45/2
[CR] in order to enter the dataset name (DATNAME)
Weld inspection B 45/2. All alphanumerical entries
may have a maximum length of 24 characters. In case
the string length exceeds 24 characters, it will auto-
matically be cut to 24 characters.
With the other alpahnumerical fields in the TESTINF
table you may easily describe the dataset.
Remote control
Changing a function value
Key in [ESC] DW [Space] 2000 [CR] in order to set
the range to 20.00 mm:
Please note that you must key in the function value as
an integer with the maximum given resolution, here
2000 for the range of 20 mm.
Alphanumerical entries
Key in [ESC] DN [Space] Weld inspection B 45/2
[CR] in order to enter the dataset name (DATNAME)
Weld inspection B 45/2. All alphanumerical entries
may have a maximum length of 24 characters. In case
the string length exceeds 24 characters, it will auto-
matically be cut to 24 characters.
With the other alpahnumerical fields in the TESTINF
table you may easily describe the dataset.
Remote control
Transfer of datasets
A total of 800 datasets (complete instrument setup
including A-scan) can be stored in the instrument. The
stored datasets including the actual setting (dataset # 0)
can be transferred to the PC in compressed binary
format for archiving purposes. If required, the datasets
may be downloaded back to the insturment for re-use
or echo comparison. This bi-directional dataset trans-
fer is part of the software UltraDOC.
Actual dataset (# 0) from the instrument to the PC:
v
1
... v
n
describes the software version of the USM, bytes
b
1
... b
n
contain the instrument setting including A-scan.
In order to store this information you must write the
transferred bytes v
1
... v
n
, CR, LF, b
1
... b
n
into a file.
Transfer of datasets
A total of 800 datasets (complete instrument setup
including A-scan) can be stored in the instrument. The
stored datasets including the actual setting (dataset # 0)
can be transferred to the PC in compressed binary
format for archiving purposes. If required, the datasets
may be downloaded back to the insturment for re-use
or echo comparison. This bi-directional dataset trans-
fer is part of the software UltraDOC.
Actual dataset (# 0) from the instrument to the PC:
v
1
... v
n
describes the software version of the USM, bytes
b
1
... b
n
contain the instrument setting including A-scan.
In order to store this information you must write the
transferred bytes v
1
... v
n
, CR, LF, b
1
... b
n
into a file.
Dataset file from the PC to the instruments dataset
#1:
*) at this time the instruments waits for the reception of
the bytes v
1
... v
n
CR LF b
1
... b
n
. The instrument now
checks whether received dataset is compatible with
the current software version of the instrument, and
whether the dataset is valid (correct checksum).
Remote control
Dataset file from the PC to the instruments dataset
#1:
*) at this time the instruments waits for the reception of
the bytes v
1
... v
n
CR LF b
1
... b
n
. The instrument now
checks whether received dataset is compatible with
the current software version of the instrument, and
whether the dataset is valid (correct checksum).
Remote control
Functions and remote control codes
Presettings are in bold-face type. You will find a brief
description of all functions in chapter 9.1 Function
directory.
If not otherwise stated, all values refer to steel,
C = 5920 m/s.
The functions marked with * are only available in the
USM 35X DAC and USM 35X S (DAC evaluation), the
functions marked with ** are only available in the
USM 35X S (DGS evaluation).
Functions which are only availabe in connection with
the Data Logger option are marked with *** (please
also refer to the section Remote control in chapter
Option Data Logger on this subject).
Read only functions are marked with
R
.
Remote control
Function Code Range/Default Resolution
aLOGIC AM 0 = off 1
1 = pos
2 = neg
AMPLCOR** AC -25 to +25 dB / 0 0.1
ANAMODE AQ 0 = 0 volt
1 = 5 volts
ANGLE PA 0 - 90 / 0 0.1
A-SCAN AS 0 = stndard 1
1 = compare
2 = envelop
3 = peak b
4 = afreeze
5 = bfreeze
6 = cfreeze***
aSTART AD 0 - 9999 mm / 35 0.01
0 - 250" / 1.500 0.001
aTHRSH AT 10 - 90 % / 40 1
-90 - -10 % additionally with rf
ATTEN
R
BC 0 - 1101 dB 0.1
Functions and remote control codes
Presettings are in bold-face type. You will find a brief
description of all functions in chapter 9.1 Function
directory.
If not otherwise stated, all values refer to steel,
C = 5920 m/s.
The functions marked with * are only available in the
USM 35X DAC and USM 35X S (DAC evaluation), the
functions marked with ** are only available in the
USM 35X S (DGS evaluation).
Functions which are only availabe in connection with
the Data Logger option are marked with *** (please
also refer to the section Remote control in chapter
Option Data Logger on this subject).
Read only functions are marked with
R
.
Remote control
aLOGIC AM 0 = off 1
1 = pos
2 = neg
AMPLCOR** AC -25 to +25 dB / 0 0.1
ANAMODE AQ 0 = 0 volt
1 = 5 volts
ANGLE PA 0 - 90 / 0 0.1
A-SCAN AS 0 = stndard 1
1 = compare
2 = envelop
3 = peak b
4 = afreeze
5 = bfreeze
6 = cfreeze***
aSTART AD 0 - 9999 mm / 35 0.01
0 - 250" / 1.500 0.001
aTHRSH AT 10 - 90 % / 40 1
ATTEN
R
BC 0 - 1101 dB 0.1
ATT-OBJ** AO 0 - 100 dB/m / 0 0.1
ATT-REF** AR 0 - 100 dB/m / 0 0.1
aWIDTH AW 0.1 - 9999 mm / 40 0.01
0.004 - 250" / 1.500 0.001
BAUD-R BR 0 = 0
1= 300
2 = 600
3 = 1200
4 = 2400
5 = 4800
6 = 9600
7 = 19200
8 = 38400
9 = 57600
bLOGIC 2L 0 = off 1
1 = pos
2 = neg
3 = a trig
BOLDLI DV 0 = off
1 = L
2 = M
3 = H
4 = U
5 = T
6 = a
bSTART 2D 0 - 9999 mm / 85 0.01
0 - 250" / 3.500 0.001
bTHRSH 2T 10 - 90 % / 30 1
bWIDTH 2W 0.1 - 9999 mm / 40 0.01
0.004 - 250" / 1.500 0.001
CAL CA read only
COLOR CH 0 = off
1 = 1
2 = 2
COMMENT CO alphanumerical input
Remote control
ATT-OBJ** AO 0 - 100 dB/m / 0 0.1
ATT-REF** AR 0 - 100 dB/m / 0 0.1
aWIDTH AW 0.1 - 9999 mm / 40 0.01
0.004 - 250" / 1.500 0.001
BAUD-R BR 0 = 0
1= 300
2 = 600
3 = 1200
4 = 2400
5 = 4800
6 = 9600
7 = 19200
8 = 38400
9 = 57600
bLOGIC 2L 0 = off 1
1 = pos
2 = neg
3 = a trig
BOLDLI DV 0 = off
1 = L
2 = M
3 = H
4 = U
5 = T
6 = a
bSTART 2D 0 - 9999 mm / 85 0.01
0 - 250" / 3.500 0.001
bTHRSH 2T 10 - 90 % / 30 1
bWIDTH 2W 0.1 - 9999 mm / 40 0.01
0.004 - 250" / 1.500 0.001
CAL CA read only
COLOR CH 0 = off
1 = 1
2 = 2
COMMENT CO alphanumerical input
Remote control
COPYMOD CM 0 = hardcpy 1
1 = report
2 = meas P1
3 = pardump
4 = PCX
5 = store
6 = datalog***
7 = off
8 = special
DACECHO* TE 0 - 10 / 0 1
DACMOD* TM 0 = off 1
1 = DAC
2 = TCG
DAMPING PG 0 = low 1
1 = high
DATE DE numerical input
e.g. 26-01-99
DATNAME DN alphanumerical input
DBSTEP ST 6.5 ... 20 dB 0.1
D eff** XD 3 - 35 mm / 9.7 0.01
0.120 - 1.400" / 0.380 0.001
(only for probe-# 0)
D-DELAY DD -10 - 1024 mm / 0 0.01
-0.3 - 40" / 0 0.001
DELALL EX 0 = off
1 = on
DELETE EA 0 = off 1
1 = on
DEL-VEL** VV 1000 - 15000 m/s / 2730 1
DGS-CRV** DU 0.5 - 35 mm / 3.0 0.01
0.02 - 1.400 / 0.1 0.001
DGSMENU T5 0 = off
1 = on
DGSMOD** DS 0 = off 1
1 = on
DGS-REF** DR 0 = off 1
1 = on
Remote control
COPYMOD CM 0 = hardcpy 1
1 = report
2 = meas P1
3 = pardump
4 = PCX
5 = store
6 = datalog***
7 = off
8 = special
DACECHO* TE 0 - 10 / 0 1
DACMOD* TM 0 = off 1
1 = DAC
2 = TCG
DAMPING PG 0 = low 1
1 = high
DATE DE numerical input
e.g. 26-01-99
DATNAME DN alphanumerical input
DBSTEP ST 6.5 ... 20 dB 0.1
D eff** XD 3 - 35 mm / 9.7 0.01
0.120 - 1.400" / 0.380 0.001
D-DELAY DD -10 - 1024 mm / 0 0.01
-0.3 - 40" / 0 0.001
DELALL EX 0 = off
1 = on
DELETE EA 0 = off 1
1 = on
DEL-VEL** VV 1000 - 15000 m/s / 2730 1
DGS-CRV** DU 0.5 - 35 mm / 3.0 0.01
0.02 - 1.400 / 0.1 0.001
DGSMENU T5 0 = off
1 = on
DGSMOD** DS 0 = off 1
1 = on
DGS-REF** DR 0 = off 1
1 = on
Remote control
DIALOG DG 0 = German 1
1 = English
2 = French
3 = Italian
4 = Spanish
5 = Portuguese
6 = Dutch
7 = Swedish
8 = Slovenian
9 = Romanian
10 = Finnish
11 = Czech
12 = Danish
13 = Hungarian
14 = Croatian
15 = Russian
16 = Slovakian
17 = Norwegian
18 = Polish
19 = Japanese
DIAMET OD 10 - 2000 mm / 0.4 - 800" 0.1 / 0.01
800.01" = flat
DIR T3 0 = off
1 = on
DUAL DM 0 = off 1
1 = on
EVAMOD EM 0 = DAC 1
1 = DGS
2 = REF
5 = JISDAC
FILLED FI 0 = off 1
1 = on
FINE G FG 10 - +30 / 0 1
FLAWIND FB alphanumerical input
FLAWLEN FL 0 - 999 mm / 0 0.01
0 - 40" / 0 0.001
FREQU FR 0 = 0.5 - 4 MHz 1
1 = 2 - 20 MHz
2 = 0.8 - 8 MHz
3 = 0.2 - 1 MHz
GAIN DB 0 - 110 dB / 30 0.1
HORN HO 0 = off 1
1 = on
Remote control
DIALOG DG 0 = German 1
1 = English
2 = French
3 = Italian
4 = Spanish
5 = Portuguese
6 = Dutch
7 = Swedish
8 = Slovenian
9 = Romanian
10 = Finnish
11 = Czech
12 = Danish
13 = Hungarian
14 = Croatian
15 = Russian
16 = Slovakian
17 = Norwegian
18 = Polish
19 = Japanese
DIAMET OD 10 - 2000 mm / 0.4 - 800" 0.1 / 0.01
800.01" = flat
DIR T3 0 = off
1 = on
DUAL DM 0 = off 1
1 = on
EVAMOD EM 0 = DAC 1
1 = DGS
2 = REF
5 = JISDAC
FILLED FI 0 = off 1
1 = on
FINE G FG 10 - +30 / 0 1
FLAWIND FB alphanumerical input
FLAWLEN FL 0 - 999 mm / 0 0.01
0 - 40" / 0 0.001
FREQU FR 0 = 0.5 - 4 MHz 1
1 = 2 - 20 MHz
2 = 0.8 - 8 MHz
3 = 0.2 - 1 MHz
GAIN DB 0 - 110 dB / 30 0.1
HORN HO 0 = off 1
1 = on
Remote control
INDICA
R
BA -1101 - 1101 dB 0.1
LIGHT LT 0 = off 1
1 = on
MAGNIFY MA 0 = off 1
1 = aGAT
2 = bGAT
MEAS-P1 M1 Setting range see S-DISP 1
MEAS-P2 M2
MEAS-P3 M3
MEAS-P4 M4
MTLVEL SV 1000 - 15000 m/s / 5920 1
40 - 600 "/ms / 233 0.1
OBJECT OB alphanumerical input
OFFSET* TO 0 - 14 dB / 0 0.5
OPERAT PE alphanumerical input
P-DELAY PD 0 - 199.99 s / 0 0.01
POWER PI 0 = low 1
1 = high
Remote control
PRBFREQ** XF 0.5 - 10.0 MHz 0.04
PRBNAME** PN alphanumerical input
PREVIEW T2 0 = off
1 = on
PRF-MOD PF 10 steps:
0 = step 1 1
1 = step 2
2 = step 3
3 = step 4
4 = step 5
5 = step 6
6 = step 7
7 = step 8
8 = step 9
9 = step 10
PRINTER PR 0 = Epson 1
1 = HP Laserjet
2 = HP Deskjet
3 = DPU-41x
4 = HP Laserjet 1200 series
5 = HP Deskjet 1200 series
INDICA
R
BA -1101 - 1101 dB 0.1
LIGHT LT 0 = off 1
1 = on
MAGNIFY MA 0 = off 1
1 = aGAT
2 = bGAT
MEAS-P1 M1 Setting range see S-DISP 1
MEAS-P2 M2
MEAS-P3 M3
MEAS-P4 M4
MTLVEL SV 1000 - 15000 m/s / 5920 1
40 - 600 "/ms / 233 0.1
OBJECT OB alphanumerical input
OFFSET* TO 0 - 14 dB / 0 0.5
OPERAT PE alphanumerical input
P-DELAY PD 0 - 199.99 s / 0 0.01
POWER PI 0 = low 1
1 = high
Remote control
PRBFREQ** XF 0.5 - 10.0 MHz 0.04
PRBNAME** PN alphanumerical input
PREVIEW T2 0 = off
1 = on
PRF-MOD PF 10 steps:
0 = step 1 1
1 = step 2
2 = step 3
3 = step 4
4 = step 5
5 = step 6
6 = step 7
7 = step 8
8 = step 9
9 = step 10
PRINTER PR 0 = Epson 1
1 = HP Laserjet
2 = HP Deskjet
3 = DPU-41x
4 = HP Laserjet 1200 series
5 = HP Deskjet 1200 series
PROBE-#** PB 0 = variable / alphanumerical input
1 = B1-S 13 = SWB45-2
2 = B2-S 14 = SWB60-2
3 = B4-s 15 = SWB70-2
4 = MB2-S 16 = SWB45-5
5 = MB4-S 17 = SWB60-5
6 = MB5-S 18 = SWB70-5
7 = MWB45-2 19 = WB45-1
8 = MWB60-2 20 = WB60-1
9 = MWB70-2 21 = WB70-1
10 = MWB45-4 22 = WB45-2
11 = MWB60-4 23 = WB60-2
12 = MWB70-4 24 = WB70-2
RANGE DW 0.5 - 4 MHz / 0.2 - 1 MHz:
0.5 - 9999 mm / 250 0.01
0.02 - 390" / 10 0.001
2 - 20 / 0.8 - 8 MHz:
0.5 - 1420 mm / 250 0.01
0.02 - 56" / 10 0.001
RATING
R
BD -1101 - 1101 db 0.1
RECALL RD 0 = off 1
1 = on
RECTIFY RF 0 = full-w 1
1= pos hw
2 = neg hw
3 = rf
REFECHO RC 0 = no ref.
1 = ref. stored
REFECHO** RE 0 = BW 1
1 = SDH
2 = FDH
REFMODE RO 0 = off
1 = on
REFRNCE
R
BB 0 - 1101 dB 0.1
REFSIZE** RS 0.5 - 10 mm / 3 0.01
REJECT RJ 0 - 80 % / 0 1
SCALE SE 0 = measval
1 = snd-pth.
2 = div.
Remote control
PROBE-#** PB 0 = variable / alphanumerical input
1 = B1-S 13 = SWB45-2
2 = B2-S 14 = SWB60-2
3 = B4-s 15 = SWB70-2
4 = MB2-S 16 = SWB45-5
5 = MB4-S 17 = SWB60-5
6 = MB5-S 18 = SWB70-5
7 = MWB45-2 19 = WB45-1
8 = MWB60-2 20 = WB60-1
9 = MWB70-2 21 = WB70-1
10 = MWB45-4 22 = WB45-2
11 = MWB60-4 23 = WB60-2
12 = MWB70-4 24 = WB70-2
RANGE DW 0.5 - 4 MHz / 0.2 - 1 MHz:
0.5 - 9999 mm / 250 0.01
0.02 - 390" / 10 0.001
2 - 20 / 0.8 - 8 MHz:
0.5 - 1420 mm / 250 0.01
0.02 - 56" / 10 0.001
RATING
R
BD -1101 - 1101 db 0.1
RECALL RD 0 = off 1
1 = on
RECTIFY RF 0 = full-w 1
1= pos hw
2 = neg hw
3 = rf
REFECHO RC 0 = no ref.
1 = ref. stored
REFECHO** RE 0 = BW 1
1 = SDH
2 = FDH
REFMODE RO 0 = off
1 = on
REFRNCE
R
BB 0 - 1101 dB 0.1
REFSIZE** RS 0.5 - 10 mm / 3 0.01
REJECT RJ 0 - 80 % / 0 1
SCALE SE 0 = measval
1 = snd-pth.
2 = div.
Remote control
SCHEME CS 0 = green/black
1 = orange/black
2 = black/white
3 = black/yellow
S-DISP VS 0=off 1=Sa 1
2=Sb 3=Sc***
4=Sc-a*** 5=Sc-b***
6=Sb-a*** 7=Ha %
8=Hb % 9=Hc %***
10=Ha dB 11=Hb dB
12=Hc dB*** 13=R-start
14=R-end 15=Da
16=Db 17=Dc***
18=Pa 19=Pb
20=Pc*** 21=Ra
22=Rb 23=Rc***
24=ERS 25=Gt dB
26=Ha %crv 27=Hb %crv
28=Hc %crv*** 29=Alarm
30=DGS-Crv 31=freeJob***
32=freeLoc*** 33=freeAsc***
34=freeLoJ 35=lastLoc
36=La 37=Lb
38=Lc 39=Gatewid
40=Defdpth 41=class
42=DAC dB 43=LOC-#
44=Gr dB
SETTING T4 0 = off
1 = on
SET-# ND 1 - 800 / 1 1
S-REF1 R1 0 - 5000 mm / 50 0.01
0 - 200" / 2.0 0.001
S-REF2 R2 0 - 5000 mm / 100 0.01
0 - 200" / 4.0 0.001
STO-INF SC 0 = off 1
1 = on
STORE SD 0 = off 1
1 = on
SURFACE SU alphanumerical input
T-CORR * DC -24 - +24 dB / 0 0.5
TESTINF T1 0 = off
1 = on
THICKNE TH 1 - 9999 mm / 25 0.01
0.05 - 400" / 1 0.001
Remote control
SCHEME CS 0 = green/black
1 = orange/black
2 = black/white
3 = black/yellow
S-DISP VS 0=off 1=Sa 1
2=Sb 3=Sc***
4=Sc-a*** 5=Sc-b***
6=Sb-a*** 7=Ha %
8=Hb % 9=Hc %***
10=Ha dB 11=Hb dB
12=Hc dB*** 13=R-start
14=R-end 15=Da
16=Db 17=Dc***
18=Pa 19=Pb
20=Pc*** 21=Ra
22=Rb 23=Rc***
24=ERS 25=Gt dB
26=Ha %crv 27=Hb %crv
28=Hc %crv*** 29=Alarm
30=DGS-Crv 31=freeJob***
32=freeLoc*** 33=freeAsc***
34=freeLoJ 35=lastLoc
36=La 37=Lb
38=Lc 39=Gatewid
40=Defdpth 41=class
42=DAC dB 43=LOC-#
44=Gr dB
SETTING T4 0 = off
1 = on
SET-# ND 1 - 800 / 1 1
S-REF1 R1 0 - 5000 mm / 50 0.01
0 - 200" / 2.0 0.001
S-REF2 R2 0 - 5000 mm / 100 0.01
0 - 200" / 4.0 0.001
STO-INF SC 0 = off 1
1 = on
STORE SD 0 = off 1
1 = on
SURFACE SU alphanumerical input
T-CORR * DC -24 - +24 dB / 0 0.5
TESTINF T1 0 = off
1 = on
THICKNE TH 1 - 9999 mm / 25 0.01
0.05 - 400" / 1 0.001
Remote control
TIME TI numerical input, e.g. 12:30:00
TOF AF 0 = flank 1
1 = peak
2 = jflank
UNIT UN 0 = mm 1
1 = inch
VGA VG 0 = off
1 = on
X-POS XP 0 - 999 mm / 0 0.01
0 - 40" / 0 0.001
X-VALUE XV 0 - 100 mm / 0 0.01
0 - 40" / 0 0.001
Y-POS YP 0 - 999 mm / 0 0.01
0 - 40" / 0 0.001
Other remote control codes
Code Function/description
< Select the next left sided menu
> Select the next right sided menu
AG dB-Difference from the reference gain (ref. echo
at 80 %) to the registration gain (maximum of
selected DGS curve at 80 %), read only
AP Analog output setting
0 = amplitude
1 = time of flight
DA A-scan amplitudes transferred as binary data
DV Send the DAC points in tics and dB, DAC, read only
E1 Read value form measurement line (position 1)
E5 Read value displayed in the A-scan
EL Send the contents of the LCD as binary data
stream, read only
Remote control
TIME TI numerical input, e.g. 12:30:00
TOF AF 0 = flank 1
1 = peak
2 = jflank
UNIT UN 0 = mm 1
1 = inch
VGA VG 0 = off
1 = on
X-POS XP 0 - 999 mm / 0 0.01
0 - 40" / 0 0.001
X-VALUE XV 0 - 100 mm / 0 0.01
0 - 40" / 0 0.001
Y-POS YP 0 - 999 mm / 0 0.01
0 - 40" / 0 0.001
Other remote control codes
< Select the next left sided menu
> Select the next right sided menu
AG dB-Difference from the reference gain (ref. echo
at 80 %) to the registration gain (maximum of
selected DGS curve at 80 %), read only
AP Analog output setting
0 = amplitude
1 = time of flight
DA A-scan amplitudes transferred as binary data
DV Send the DAC points in tics and dB, DAC, read only
E5 Read value displayed in the A-scan
EL Send the contents of the LCD as binary data
stream, read only
Remote control
EV Read alarm LED status:
0 = no alarm
1 = alarm in A
2 = alarm in B
3 = alarm in A+B
HD Editable header data from report transferred as
ASCII-format data
I1 Set information line in the startup screen
(up to 39 characters)
ID Read instrument software version
RG Reference gain (reference echo at 80 %), read only
SL Scroll home: selection of the first function in every
function group and of the left function group in every
function group line.
TF Freeze on/off:
0 = off
1 = on
TZ Zoom on/off:
0 = off
1 = on
UD Send data set as binary data
UR Read data set as binary data
Remote control
EV Read alarm LED status:
0 = no alarm
1 = alarm in A
2 = alarm in B
3 = alarm in A+B
HD Editable header data from report transferred as
ASCII-format data
(up to 39 characters)
ID Read instrument software version
RG Reference gain (reference echo at 80 %), read only
SL Scroll home: selection of the first function in every
function group and of the left function group in every
function group line.
TF Freeze on/off:
0 = off
1 = on
TZ Zoom on/off:
0 = off
1 = on
UD Send data set as binary data
UR Read data set as binary data
Remote control
function keys
Function Key Code Range
Left-hand G+ increment
rotary knob/ G- decrement
gain
Right-hand K+ increment
rotary knob K- decrement
dB-STEP P 0 = 0.0
1 = 0.5
2 = 1.0
3 = 2.0
4 = 6.0
5 = 6.5 20
FREEZE F off / on
ZOOM Z off / on
COPY C off / on
ENTER R off / on
level 10 1st/2nd operation level
Remote control
function keys
Left-hand G+ increment
rotary knob/ G- decrement
gain
Right-hand K+ increment
rotary knob K- decrement
dB-STEP P 0 = 0.0
1 = 0.5
2 = 1.0
3 = 2.0
4 = 6.0
5 = 6.5 20
FREEZE F off / on
ZOOM Z off / on
COPY C off / on
ENTER R off / on
level 10 1st/2nd operation level
Remote control
Function Key Code
BASE 5
PULS 6
RECV 7
aGAT 8
bGAT 9
CAL 5
REF/DAC/ 6
DGS/JDAC
TRIG 7
MEM 8
DATA 9
Function Key Code
MEAS 5
MSEL 6
LCD 7
CFG1 8
CFG2 9
Function Key Code
first 1
second 2
third 3
fourth 4
Remote control
Function Key Code
BASE 5
PULS 6
RECV 7
aGAT 8
bGAT 9
CAL 5
REF/DAC/ 6
DGS/JDAC
TRIG 7
MEM 8
DATA 9
Function Key Code
MEAS 5
MSEL 6
LCD 7
CFG1 8
CFG2 9
Function Key Code
first 1
second 2
third 3
fourth 4
Remote control
A Attention:
In rare cases concerning remote control sequences,
reading measurement values directly after changing a
function value in the USM 35X, there could be errors as
long as the instrument has not ended setting the value.
In such cases, additional commands must be inserted
into the remote control sequence before the measure-
ment values are read.
Example:
If you create a remote control sequence, by which the
sound path of an echo is read after freezing the A-
scan, the command chain would be as follows:
Command Answer Description
<ESC>F<RETURN> A-scan freeze
<ESC>E3<RETURN> 50,74 Read sound path
<ESC>F<RETURN> Disable A-scan freeze
...
In the interests of security, insert additional read com-
mands before reading the sound path, e.g.:
...
<ESC>DB<RETURN> 580 Read dB setting
...
With these measures you ensure that sufficient time
has passed in order to completely execute the previ-
ous command (display freeze) before transferring the
sound path. Finally, check your remote control se-
quence to see that the measurement values can be
correctly read, and add further read commands if nec-
essary.
Remote control
A Attention:
In rare cases concerning remote control sequences,
reading measurement values directly after changing a
function value in the USM 35X, there could be errors as
long as the instrument has not ended setting the value.
In such cases, additional commands must be inserted
into the remote control sequence before the measure-
ment values are read.
Example:
If you create a remote control sequence, by which the
sound path of an echo is read after freezing the A-
scan, the command chain would be as follows:
...
In the interests of security, insert additional read com-
mands before reading the sound path, e.g.:
...
...
With these measures you ensure that sufficient time
has passed in order to completely execute the previ-
ous command (display freeze) before transferring the
sound path. Finally, check your remote control se-
quence to see that the measurement values can be
correctly read, and add further read commands if nec-
essary.
Remote control
Appendix 9
Appendix 9
Appendix Function directory
9.1 Function directory
The functions marked with * are only available on the
USM 35X DAC / USM 35X S (DAC evaluation mode),
those market with ** are exclusively available on the
USM35X S (DGS evaluation mode).
Function Function group Description
aLOGIC aGAT Evaluation logic of the gate A
AMPLCOR** DGS Amplitude correction
ANAMOD CFG2 Setting of the analog output
ANGLE TRIG Entry of the angle for calculating
the (reduced) projection
distance (angle-beam probes)
A-SCAN MEAS Settings of the A-scan
aSTART aGAT Starting point of the gate A
aTHRSH aGAT Threshold of the gate A
ATTEN DGS Sound attenuation in the test
piece
ATT-REF** DGS Sound attenuation in the
reference block
ATT-OBJ** DGS Sound attenuation in the
test object
aWIDTH aGAT Width of the gate A
BAUD-R CFG1 Baud rate for serial port
transmission
bLOGIC bGAT Evaluation logic in the gate B
BOLDLI JDAC Selection and emphasizing of
registration curve
bSTART bGAT Starting point of the gate B
bTHRSH bGAT Starting point of the gate B
bWIDTH bGAT Width of the gate B
CAL CAL Semiautomatic calibration
COLOR TRIG Marking of legs
COMMENT DATA Comment
9.1 Function directory
The functions marked with * are only available on the
USM 35X DAC / USM 35X S (DAC evaluation mode),
those market with ** are exclusively available on the
USM35X S (DGS evaluation mode).
aLOGIC aGAT Evaluation logic of the gate A
AMPLCOR** DGS Amplitude correction
ANAMOD CFG2 Setting of the analog output
ANGLE TRIG Entry of the angle for calculating
the (reduced) projection
distance (angle-beam probes)
A-SCAN MEAS Settings of the A-scan
aSTART aGAT Starting point of the gate A
aTHRSH aGAT Threshold of the gate A
ATTEN DGS Sound attenuation in the test
piece
ATT-REF** DGS Sound attenuation in the
reference block
ATT-OBJ** DGS Sound attenuation in the
test object
aWIDTH aGAT Width of the gate A
BAUD-R CFG1 Baud rate for serial port
transmission
bLOGIC bGAT Evaluation logic in the gate B
BOLDLI JDAC Selection and emphasizing of
registration curve
bSTART bGAT Starting point of the gate B
bTHRSH bGAT Starting point of the gate B
bWIDTH bGAT Width of the gate B
CAL CAL Semiautomatic calibration
COLOR TRIG Marking of legs
COMMENT DATA Comment
COPYMOD CFG1 Assignment of the key
DACECHO* DAC/JDAC Recording of a reference echo
for the DAC
DACMODE* DAC/JDAC Activating/Deactivating the DAC
DAMPING PULS Damping of the probes
oscillating circuit
DATE CFG2 Current date
dBSTEP RECV User-programmable gain step
D-DELAY BASE Setting of the display start
D eff** DGS Effective element diameter of
the probe used
DELALL MEM Deleting all stored data sets
DELETE MEM Deleting a stored data set
DEL-VEL** DGS Material velocity for probe delay
DGS-CRV** DGS Recording curve for DGS
evaluation mode
DGSMENU** DGS Activating/Deactivating the DGS
menu table for selecting the
probe and further DGS settings
DGSMODE** DGS Activating/Deactivating DGS
evaluation mode
DGS-REF** DGS Recording of DGS reference
echo
DIALOG CFG1 Selecting the language
DIAMET TRIG Change between plane-parallel
and circular curved test
components
DIR DATA Dataset directory
DUAL PULS Separation of pulser and
receiver
EVAMOD CFG2 Switchover REF DAC DGS
JDAC
COPYMOD CFG1 Assignment of the key
DACECHO* DAC/JDAC Recording of a reference echo
for the DAC
DACMODE* DAC/JDAC Activating/Deactivating the DAC
DAMPING PULS Damping of the probes
oscillating circuit
DATE CFG2 Current date
dBSTEP RECV User-programmable gain step
D-DELAY BASE Setting of the display start
D eff** DGS Effective element diameter of
the probe used
DELALL MEM Deleting all stored data sets
DELETE MEM Deleting a stored data set
DEL-VEL** DGS Material velocity for probe delay
DGS-CRV** DGS Recording curve for DGS
evaluation mode
DGSMENU** DGS Activating/Deactivating the DGS
menu table for selecting the
probe and further DGS settings
DGSMODE** DGS Activating/Deactivating DGS
evaluation mode
DGS-REF** DGS Recording of DGS reference
echo
DIALOG CFG1 Selecting the language
DIAMET TRIG Change between plane-parallel
and circular curved test
components
DIR DATA Dataset directory
DUAL PULS Separation of pulser and
receiver
EVAMOD CFG2 Switchover REF DAC DGS
JDAC
FILLED LCD Selecting the echo display mode
(filled or normal)
FINE G RECV Fine adjustment of gain within a
range of approx. 4 dB in 40 steps
FLAWLEN DATA Flawlength
FREQU RECV Selecting the frequency range
for the connected probe
GAIN left-hand Setting of the gain
rotary knob
HORN CFG2 Switching the acoustic alarm
signal on/off
INDICA AWS Flaw gain in dB
for AWS evaluation
LIGHT LCD Choice of lightning for
the display
MAGNIFY MEAS Gate spreading
MEAS-P1 MSEL Selection of measured values
MEAS-P2 at four positions of the
MEAS-P3 measurment line
MEAS-P4
MTLVEL BASE Setting of the material sound
velocity
OBJECT DATA Object description
OFFSET* DAC/JDAC Offset for multiple DAC
OPERAT DATA Name of the operator
P-DELAY BASE Compensating for the probe
delay line
POWER PULS Setting the power of the initial
pulse
PRBFREQ** DGS Probe frequency
PRBNAME** DGS Probe name
PREVIEW DATA Dataset preview with A-scan
FILLED LCD Selecting the echo display mode
(filled or normal)
FINE G RECV Fine adjustment of gain within a
range of approx. 4 dB in 40 steps
FLAWLEN DATA Flawlength
FREQU RECV Selecting the frequency range
for the connected probe
GAIN left-hand Setting of the gain
rotary knob
HORN CFG2 Switching the acoustic alarm
signal on/off
INDICA AWS Flaw gain in dB
for AWS evaluation
LIGHT LCD Choice of lightning for
the display
MAGNIFY MEAS Gate spreading
MEAS-P1 MSEL Selection of measured values
MEAS-P2 at four positions of the
MEAS-P3 measurment line
MEAS-P4
MTLVEL BASE Setting of the material sound
velocity
OBJECT DATA Object description
OFFSET* DAC/JDAC Offset for multiple DAC
OPERAT DATA Name of the operator
P-DELAY BASE Compensating for the probe
delay line
POWER PULS Setting the power of the initial
pulse
PRBFREQ** DGS Probe frequency
PRBNAME** DGS Probe name
PREVIEW DATA Dataset preview with A-scan
PRF-MOD PULS Setting the pulse repetition
frequency
PROBE-#** DGS Probe number
PRINTER CFG1 Selecting the printer for the test
report
RANGE BASE Setting of the range in which the
measurement is made.
RATING AWS Flaw rating as dB value
RECALL MEM Retrieving a stored data set
RECTIFY RECV Selection of rectification
REFECHO REF For storing a reference echo
for the measurement of
dB difference
REFECHO** DGS Type of the reference reflextor
used
REFMOD REF Activation of echo comparison
REFRNCE AWS Reference gain in dB
for AWS evaluation
REFSIZE** DGS Size of the reference reflector
REJECT RECV Suppression of unwanted or
spurious echo indications
SCALE LCD Choice of display mode
for the measurement line
SCHEME LCD Choice of a color scheme for
the screen display
S-DISP MEAS Zoomed display of a selected
parameter
SET-# MEM Number of the data set
SETTING DATA Display of a function list
S-REF1 CAL Reference echo 1 for calibration
S-REF2 Reference echo 2 for calibration
STO-INF DATA Saving the current additional
information
PRF-MOD PULS Setting the pulse repetition
frequency
PROBE-#** DGS Probe number
PRINTER CFG1 Selecting the printer for the test
report
RANGE BASE Setting of the range in which the
measurement is made.
RATING AWS Flaw rating as dB value
RECALL MEM Retrieving a stored data set
RECTIFY RECV Selection of rectification
REFECHO REF For storing a reference echo
for the measurement of
dB difference
REFECHO** DGS Type of the reference reflextor
used
REFMOD REF Activation of echo comparison
REFRNCE AWS Reference gain in dB
for AWS evaluation
REFSIZE** DGS Size of the reference reflector
REJECT RECV Suppression of unwanted or
spurious echo indications
SCALE LCD Choice of display mode
for the measurement line
SCHEME LCD Choice of a color scheme for
the screen display
S-DISP MEAS Zoomed display of a selected
parameter
SET-# MEM Number of the data set
SETTING DATA Display of a function list
S-REF1 CAL Reference echo 1 for calibration
S-REF2 Reference echo 2 for calibration
STO-INF DATA Saving the current additional
information
Appendix
STORE MEM Saving the data set
SURFACE DATA Condition of surface
T-CORR* DAC/AVG/ Sensitivity correction, e.g. to
JDAC compensate for transfer losses
TESTINF DATA Saving additional information
THICKNE TRIG Entry of workpiece thickness
for calculation of real flaw depth
TIME CFG2 Current time
TOF MEAS Selection of the measuring
point for the gate
UNIT CFG1 Selecting the unit of
measurement mm or inch
VGA LCD Activating/Deactivating the VGA
output
X-POS DATA X-position coordinate
Function directory
X-VALUE TRIG Entry of the distance between
probe index (sound exit point)
and leading face of the
angle-beam probe
Y-POS DATA Y-position coordinate
Appendix
STORE MEM Saving the data set
SURFACE DATA Condition of surface
T-CORR* DAC/AVG/ Sensitivity correction, e.g. to
JDAC compensate for transfer losses
TESTINF DATA Saving additional information
THICKNE TRIG Entry of workpiece thickness
for calculation of real flaw depth
TIME CFG2 Current time
TOF MEAS Selection of the measuring
point for the gate
UNIT CFG1 Selecting the unit of
measurement mm or inch
VGA LCD Activating/Deactivating the VGA
output
X-POS DATA X-position coordinate
Function directory
X-VALUE TRIG Entry of the distance between
probe index (sound exit point)
and leading face of the
angle-beam probe
Y-POS DATA Y-position coordinate
Appendix
9.2 EC declaration of conformity
We declare that the USM 35X conforms to the following
European directives:
89/336EEC (Electromagnetic compatibility)
The conformity of the above-mentioned product with the
regulations of the directive 89/336EEC is proven by the
observance of the standard specifications
EN 55011: 1998 Class A, Group 2 and
EN 61000-6-2: 1997
EN 61000-6-4: 1997.
regulations of the directive 73/23/EEC, amended by the
directive 93/68/EEC, is proven by the observance of
the standard specification
EN 61010-1: 2001.
EC declaration of conformity
Appendix
9.2 EC declaration of conformity
We declare that the USM 35X conforms to the following
European directives:
89/336EEC (Electromagnetic compatibility)
regulations of the directive 89/336EEC is proven by the
observance of the standard specifications
EN 55011: 1998 Class A, Group 2 and
EN 61000-6-2: 1997
EN 61000-6-4: 1997.
regulations of the directive 73/23/EEC, amended by the
directive 93/68/EEC, is proven by the observance of
the standard specification
EN 61010-1: 2001.
EC declaration of conformity
Appendix
9.3 Manufacturer/
Service addresses
The Krautkramer USM 35X is manufactured by:
GE Inspection Technologies GmbH
Robert-Bosch-Str. 3
D 50354 Hrth
Phone +49 (0) 22 33 - 601 111
Fax +49 (0) 22 33 - 601 402
The USM 35X is manufactured according to state-of-the-
art methods using high-quality components. Thorough
in-process inspections or intermediate tests and a quality
management system certified to DIN EN ISO 9001
ensure an optimum quality of conformance of the
instrument.
Should you nevertheless detect an error on your
instrument, switch the instrument off and remove the
batteries. Inform your local GE Inspection Technologies
Service indicating the error and describing it.
Keep the shipping container for any repairs possibly
required which cannot be made on the spot.
Manufacturer/Service addresses
If there is anything special that you would like to know
about the use, handling, operation and specifications of
the instruments, please contact your nearest GE
Inspection Technologies representative or directly:
Service-Center
Robert-Bosch-Str. 3
D 50354 Hrth
or:
Postfach 1363
D 50330 Hrth
Phone +49 (0) 22 33 - 601 111
Fax +49 (0) 22 33 - 601 402
Appendix
9.3 Manufacturer/
Service addresses
The Krautkramer USM 35X is manufactured by:
Robert-Bosch-Str. 3
D 50354 Hrth
Phone +49 (0) 22 33 - 601 111
Fax +49 (0) 22 33 - 601 402
The USM 35X is manufactured according to state-of-the-
art methods using high-quality components. Thorough
in-process inspections or intermediate tests and a quality
management system certified to DIN EN ISO 9001
ensure an optimum quality of conformance of the
instrument.
Should you nevertheless detect an error on your
instrument, switch the instrument off and remove the
batteries. Inform your local GE Inspection Technologies
Service indicating the error and describing it.
Keep the shipping container for any repairs possibly
required which cannot be made on the spot.
If there is anything special that you would like to know
about the use, handling, operation and specifications of
the instruments, please contact your nearest GE
Inspection Technologies representative or directly:
Service-Center
Robert-Bosch-Str. 3
D 50354 Hrth
or:
Postfach 1363
D 50330 Hrth
Phone +49 (0) 22 33 - 601 111
Fax +49 (0) 22 33 - 601 402
Appendix
France
GE Inspection Technologies Scs
SAC Sans Souci
68, Chemin des Ormeaux
F 69760 Limonest
Phone +33 47 - 217 92 20
Fax +33 47 - 847 56 98
Great Britain
GE Inspection Technologies
892 Charter Avenue
Canley
GB Coventry CV4 8AF
Phone +44 845 - 130 - 3925
Fax +44 845 - 130 - 5775
USA
GE Inspection Technologies, LP
50 Industrial Park Road
USA Lewistown, PA 17044
Phone +1 717 - 242 03 27
Fax +1 717 - 242 26 06
Appendix
France
GE Inspection Technologies Scs
SAC Sans Souci
68, Chemin des Ormeaux
F 69760 Limonest
Phone +33 47 - 217 92 20
Fax +33 47 - 847 56 98
Great Britain
GE Inspection Technologies
892 Charter Avenue
Canley
GB Coventry CV4 8AF
Phone +44 845 - 130 - 3925
Fax +44 845 - 130 - 5775
USA
GE Inspection Technologies, LP
50 Industrial Park Road
USA Lewistown, PA 17044
Phone +1 717 - 242 03 27
Fax +1 717 - 242 26 06
Appendix
5
33
24
25
34
32 23 31
4
35
Spare parts list
9.4 Spare parts list
Appendix
5
33
24
25
34
32 23 31
4
35
Spare parts list
9.4 Spare parts list
Appendix Spare parts list
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Changes 10
Changes 10
Changes
This chapter contains information about changes and
additions made at short notice and not yet included in
the operating manual.
If none exist, the chapter remains blank.
Changes
This chapter contains information about changes and
additions made at short notice and not yet included in
the operating manual.
If none exist, the chapter remains blank.
Index 11
Index 11
Index
A
a trig
Triggering by an interface echo ........................... 5-15
A-Scan
Setting the A-scan .............................................. 5-48
Accessories ............................................................. 2-5
Additions ................................................................ 10-2
Addresses ................................................................ 9-8
Adjustment range
Function directory ................................................. 9-2
Adustment
Coarse and fine..................................................... 4-9
aGAT (function group) ............................................. 5-14
Alkaline batteries ...................................................... 7-4
aLOGIC
Evaluation logic gate A ....................................... 5-15
Alphanumerical entries ........................................... 8-14
Analog output ................................................. 5-57, 8-5
ANAMOD................................................................ 5-57
ANGLE
Angle of incidence .............................................. 5-32
Anticoincidence ...................................................... 5-15
aSTART .................................................................. 5-25
Starting point of gate A....................................... 5-16
aTHRSH
Threshold of gate A ............................................ 5-16
aWIDTH
Width of gate A ................................................... 5-16
B
Backlight ................................................................ 5-52
BASE (function group) .............................................. 5-6
Basic settings ........................................................ 4-10
Batteries ................................................................... 1-2
Care ...................................................................... 7-3
Charging the NiCd batteries .................................. 7-3
BAUD-R .................................................................. 5-55
Index
A
a trig
Triggering by an interface echo ........................... 5-15
A-Scan
Setting the A-scan .............................................. 5-48
Accessories ............................................................. 2-5
Additions ................................................................ 10-2
Addresses ................................................................ 9-8
Adjustment range
Adustment
Coarse and fine..................................................... 4-9
aGAT (function group) ............................................. 5-14
Alkaline batteries ...................................................... 7-4
aLOGIC
Evaluation logic gate A ....................................... 5-15
Alphanumerical entries ........................................... 8-14
Analog output ................................................. 5-57, 8-5
ANAMOD................................................................ 5-57
ANGLE
Angle of incidence .............................................. 5-32
Anticoincidence ...................................................... 5-15
aSTART .................................................................. 5-25
Starting point of gate A....................................... 5-16
aTHRSH
Threshold of gate A ............................................ 5-16
aWIDTH
Width of gate A ................................................... 5-16
B
Backlight ................................................................ 5-52
BASE (function group) .............................................. 5-6
Basic settings ........................................................ 4-10
Batteries ................................................................... 1-2
Care ...................................................................... 7-3
Charging the NiCd batteries .................................. 7-3
BAUD-R .................................................................. 5-55
Index
bGAT (function group) ............................................. 5-14
bLOGIC
Evaluation logic gate B ....................................... 5-15
BOLDLI (Choice of a registration curve) ................. 5-70
bSTART
Starting point of gate B....................................... 5-16
bTHRSH
Threshold of gate B ............................................ 5-16
bWIDTH
Width of gate B ................................................... 5-16
C
CAL
Semiautomatic calibration......................... 5-19, 5-22
Calibration .............................................................. 5-17
Dual-element (TR) probes ................................... 5-21
Straight-beam probes .......................................... 5-18
With unknown materials ...................................... 5-19
CFG1 (function group) ............................................ 5-53
Changes ................................................................. 10-1
Changing a function value ...................................... 8-14
Codes
Codes for function keys ...................................... 8-26
Function codes ................................................... 8-17
Remote control ..................................................... 8-9
Coincidence ............................................................ 5-15
Configuration .......................................................... 5-53
For test applications ........................................... 5-43
Connecting a probe................................................... 3-7
Controls .................................................................... 4-2
COPYMOD....................................................... 6-3, 8-9
Assignment of the COPY key............................. 5-55
D
D-DELAY (Display starting point) ............................. 5-7
DAC (function group) .............................................. 5-61
DACECHO
Recording reference curve ........................ 5-63, 5-68
Index
bGAT (function group) ............................................. 5-14
bLOGIC
Evaluation logic gate B ....................................... 5-15
BOLDLI (Choice of a registration curve) ................. 5-70
bSTART
Starting point of gate B....................................... 5-16
bTHRSH
Threshold of gate B ............................................ 5-16
bWIDTH
Width of gate B ................................................... 5-16
C
CAL
Semiautomatic calibration......................... 5-19, 5-22
Calibration .............................................................. 5-17
Dual-element (TR) probes ................................... 5-21
Straight-beam probes .......................................... 5-18
With unknown materials ...................................... 5-19
Changes ................................................................. 10-1
Changing a function value ...................................... 8-14
Codes
Codes for function keys ...................................... 8-26
Function codes ................................................... 8-17
Remote control ..................................................... 8-9
Coincidence ............................................................ 5-15
Configuration .......................................................... 5-53
For test applications ........................................... 5-43
Connecting a probe................................................... 3-7
Controls .................................................................... 4-2
COPYMOD....................................................... 6-3, 8-9
Assignment of the COPY key............................. 5-55
D
D-DELAY (Display starting point) ............................. 5-7
DAC (function group) .............................................. 5-61
DACECHO
Recording reference curve ........................ 5-63, 5-68
Index
DACMOD
Activating DAC according to JIS ........................ 5-67
Activating DAC/TCG ........................................... 5-62
DACMOD (Activating DAC) ................. 5-61, 5-66, 5-73
DAMPING (Probe matching) ..................................... 5-9
DATA (function group) ............................................. 5-38
Data exchange ......................................................... 8-8
Data saving ............................................................ 5-34
Data set
Deleting............................................................... 5-35
Deleting all .......................................................... 5-36
Management ....................................................... 5-38
Recalling ............................................................. 5-36
Storing ................................................................ 5-35
DATE
Setting the gate .................................................. 5-56
dBCORR (Sensitivity correction) .................. 5-64, 5-70
DBSTEP................................................................. 5-12
Defects ..................................................................... 1-3
Deleting a reference echo ....................................... 5-27
Depth ...................................................................... 5-31
DGS evaluation (USM 35S) .................................... 5-71
DIALOG
Selecting the language ....................................... 4-10
DIALOG (Selecting the language) .......................... 5-53
DIR
Directory of stored data sets .............................. 5-38
DIR (Dataset directory) ........................................... 5-41
Display ..................................................................... 4-3
Display range............................................................ 5-6
Display starting point ................................................ 5-7
Distance-amplitude curve ....................................... 5-61
according to JIS Z3060-2002 .............................. 5-66
Double assignment ................................................... 4-9
DUAL
Pulser-receiver separation .................................. 5-10
Index
DACMOD
Activating DAC according to JIS ........................ 5-67
Activating DAC/TCG ........................................... 5-62
DACMOD (Activating DAC) ................. 5-61, 5-66, 5-73
DAMPING (Probe matching) ..................................... 5-9
DATA (function group) ............................................. 5-38
Data exchange ......................................................... 8-8
Data saving ............................................................ 5-34
Data set
Deleting............................................................... 5-35
Deleting all .......................................................... 5-36
Management ....................................................... 5-38
Recalling ............................................................. 5-36
Storing ................................................................ 5-35
DATE
Setting the gate .................................................. 5-56
dBCORR (Sensitivity correction) .................. 5-64, 5-70
DBSTEP................................................................. 5-12
Defects ..................................................................... 1-3
Deleting a reference echo ....................................... 5-27
Depth ...................................................................... 5-31
DGS evaluation (USM 35S) .................................... 5-71
DIALOG
Selecting the language ....................................... 4-10
DIALOG (Selecting the language) .......................... 5-53
DIR
Directory of stored data sets .............................. 5-38
DIR (Dataset directory) ........................................... 5-41
Display ..................................................................... 4-3
Display range............................................................ 5-6
Display starting point ................................................ 5-7
Distance-amplitude curve ....................................... 5-61
according to JIS Z3060-2002 .............................. 5-66
Double assignment ................................................... 4-9
DUAL
Pulser-receiver separation .................................. 5-10
Index
E
EC declaration .......................................................... 9-7
Echo display ........................................................... 5-51
Enlarged echo display......................................... 5-59
Zoom mode........................................................... 4-3
Enlarged display
Measurement value .............................................. 4-5
Errors........................................................................ 1-3
Evaluation logic of the gates .................................. 5-15
EVAMOD................................................................ 5-58
F
FILLED
Echo display ....................................................... 5-51
FINE G (Fine adjustment of gain) ........................... 5-11
Flaw evaluation......................................................... 1-6
Flaw position calculation ........................................ 5-31
Freeze function ....................................................... 5-59
FREQU
Frequency range ................................................. 5-13
Frequency range ..................................................... 5-13
Function directory ..................................................... 9-2
Function groups ........................................ 4-4, 4-8, 5-3
Functions.................................................................. 4-4
Overview............................................................... 5-2
Setting the functions ............................................. 4-9
Special keys ....................................................... 5-59
G
Gain .......................................................................... 5-5
Fine adjustment .................................................. 5-12
Incrementation ...................................................... 5-5
Gate setting ............................................................ 5-14
Gates...................................................................... 5-14
Starting point ...................................................... 5-16
Width .................................................................. 5-16
Index
E
EC declaration .......................................................... 9-7
Echo display ........................................................... 5-51
Enlarged echo display......................................... 5-59
Zoom mode........................................................... 4-3
Enlarged display
Measurement value .............................................. 4-5
Errors........................................................................ 1-3
Evaluation logic of the gates .................................. 5-15
EVAMOD................................................................ 5-58
F
FILLED
Echo display ....................................................... 5-51
FINE G (Fine adjustment of gain) ........................... 5-11
Flaw evaluation......................................................... 1-6
Flaw position calculation ........................................ 5-31
Freeze function ....................................................... 5-59
FREQU
Frequency range ................................................. 5-13
Frequency range ..................................................... 5-13
Function directory ..................................................... 9-2
Function groups ........................................ 4-4, 4-8, 5-3
Functions.................................................................. 4-4
Overview............................................................... 5-2
Setting the functions ............................................. 4-9
Special keys ....................................................... 5-59
G
Gain .......................................................................... 5-5
Fine adjustment .................................................. 5-12
Incrementation ...................................................... 5-5
Gate setting ............................................................ 5-14
Gates...................................................................... 5-14
Starting point ...................................................... 5-16
Width .................................................................. 5-16
Index
H
HORN
Acoustic alarm.................................................... 5-58
I
Instrument
Care of the instrument .......................................... 7-2
Instrument versions .................................................. 1-8
Intefaces
RS 232 interface ................................................... 8-6
Interface echo ........................................................ 5-15
Interfaces
I/O interface .......................................................... 8-4
J
JDAC (function group) ............................................ 5-66
K
Keys ......................................................................... 4-6
Special keys ....................................................... 5-59
L
Language ................................................................ 4-10
LCD
Color scheme...................................................... 4-14
LCD (function group) ............................................... 5-50
Lemo socket ............................................................. 8-5
LIGHT
LCD backlight ..................................................... 5-52
Limits........................................................................ 1-5
Line........................................................................... 4-5
M
MAGNIFY
Gate spreading ................................................... 5-48
Index
H
HORN
Acoustic alarm.................................................... 5-58
I
Instrument
Care of the instrument .......................................... 7-2
Instrument versions .................................................. 1-8
Intefaces
RS 232 interface ................................................... 8-6
Interface echo ........................................................ 5-15
Interfaces
I/O interface .......................................................... 8-4
J
JDAC (function group) ............................................ 5-66
K
Keys ......................................................................... 4-6
Special keys ....................................................... 5-59
L
Language ................................................................ 4-10
LCD
Color scheme...................................................... 4-14
LCD (function group) ............................................... 5-50
Lemo socket ............................................................. 8-5
LIGHT
LCD backlight ..................................................... 5-52
Limits........................................................................ 1-5
Line........................................................................... 4-5
M
MAGNIFY
Gate spreading ................................................... 5-48
Index
Maintenance ............................................................. 7-5
Manufacturer ............................................................ 9-8
MEAS-P1 to P4 ........................................................ 4-5
Measurement line ........................................... 4-5, 5-46
Configuration ....................................................... 5-49
Measuring ............................................................... 5-23
Measuring point ...................................................... 5-17
MEM (function group) ............................................. 5-34
MSEL (function group) ............................................ 5-49
MTLVEL (Sound velocity) ......................................... 5-7
Multiple DAC................................................. 5-65, 5-70
O
OFFSET
Distance of multiple DAC .......................... 5-65, 5-70
OFFSET (Distance of multiple DAC) ............ 5-65, 5-70
Operating levels
Overview............................................................... 5-2
Operator training ....................................................... 1-4
Operator's controls ................................................... 4-2
P
P-DELAY (Probe delay) ............................................ 5-8
Power supply ............................................................ 3-2
PREVIEW
Dataset preview .................................................. 5-38
PRF-MOD
Pulse repetition frequency .................................. 5-11
PRINTER
Selecting the printer driver .................................. 5-55
Printer
Preparing .............................................................. 6-2
PRINTER (Printer for test report) ........................... 5-51
Printer connection .................................................... 8-8
Printing ..................................................................... 8-9
Printing data ............................................................. 6-2
Index
Maintenance ............................................................. 7-5
Manufacturer ............................................................ 9-8
MEAS-P1 to P4 ........................................................ 4-5
Measurement line ........................................... 4-5, 5-46
Configuration ....................................................... 5-49
Measuring ............................................................... 5-23
Measuring point ...................................................... 5-17
MEM (function group) ............................................. 5-34
MSEL (function group) ............................................ 5-49
MTLVEL (Sound velocity) ......................................... 5-7
Multiple DAC................................................. 5-65, 5-70
O
OFFSET
Distance of multiple DAC .......................... 5-65, 5-70
OFFSET (Distance of multiple DAC) ............ 5-65, 5-70
Operating levels
Overview............................................................... 5-2
Operator training ....................................................... 1-4
Operator's controls ................................................... 4-2
P
P-DELAY (Probe delay) ............................................ 5-8
Power supply ............................................................ 3-2
PREVIEW
Dataset preview .................................................. 5-38
PRF-MOD
Pulse repetition frequency .................................. 5-11
PRINTER
Selecting the printer driver .................................. 5-55
Printer
Preparing .............................................................. 6-2
PRINTER (Printer for test report) ........................... 5-51
Printer connection .................................................... 8-8
Printing ..................................................................... 8-9
Printing data ............................................................. 6-2
Index
Probe connection...................................................... 3-7
Probe delay .............................................................. 5-8
Probe matching ........................................................ 5-9
Projection distance ................................................. 5-31
PULS (function group) .............................................. 5-9
Pulse repetition frequency ...................................... 5-11
Pulser adjustment .................................................... 5-9
Pulser-receiver separation ...................................... 5-10
R
RANGE (Display range) ............................................ 5-6
Recalling a data set ................................................ 5-36
Receiver adjustment ............................................... 5-11
RECORD (Recording reference curve) ......... 5-62, 5-67
RECTIFY................................................................ 5-13
RECTIFY (Rectification) ......................................... 5-13
RECV (function group) ............................................ 5-11
Recycling.................................................................. 7-6
Reduced projection distance .................................. 5-31
REFECHO.............................................................. 5-25
REFMOD................................................................ 5-25
Registration curve .................................................. 5-70
REJECT ................................................................. 5-12
Remote control ......................................................... 8-9
Reset ........................................................................ 3-8
Rotary knobs ............................................................ 4-6
S
S-DISP ..................................................................... 4-5
S-DISP (Zoomed display of reading) ...................... 5-46
Safety information .................................................... 1-2
SCALE ................................................................... 5-52
Screen ...................................................................... 4-3
Semiautomatic calibration ............................ 5-19, 5-22
Index
Probe connection...................................................... 3-7
Probe delay .............................................................. 5-8
Probe matching ........................................................ 5-9
Projection distance ................................................. 5-31
PULS (function group) .............................................. 5-9
Pulse repetition frequency ...................................... 5-11
Pulser adjustment .................................................... 5-9
Pulser-receiver separation ...................................... 5-10
R
RANGE (Display range) ............................................ 5-6
Recalling a data set ................................................ 5-36
Receiver adjustment ............................................... 5-11
RECORD (Recording reference curve) ......... 5-62, 5-67
RECTIFY................................................................ 5-13
RECTIFY (Rectification) ......................................... 5-13
RECV (function group) ............................................ 5-11
Recycling.................................................................. 7-6
Reduced projection distance .................................. 5-31
REFECHO.............................................................. 5-25
REFMOD................................................................ 5-25
Registration curve .................................................. 5-70
REJECT ................................................................. 5-12
Remote control ......................................................... 8-9
Reset ........................................................................ 3-8
Rotary knobs ............................................................ 4-6
S
S-DISP ..................................................................... 4-5
S-DISP (Zoomed display of reading) ...................... 5-46
Safety information .................................................... 1-2
SCALE ................................................................... 5-52
Screen ...................................................................... 4-3
Semiautomatic calibration ............................ 5-19, 5-22
Index
Sensitivity correction .................................... 5-64, 5-70
Serial communication activation............................... 8-8
Service ..................................................................... 9-8
SETTING
Function list ........................................................ 5-42
setting
Function list ........................................................ 5-38
Setting of gain .......................................................... 4-8
Sound attenuation (DGS) ........................................ 5-78
Sound velocity.......................................................... 5-7
Spare parts list ....................................................... 9-10
Standard package .................................................... 2-3
Start-up .................................................................... 3-8
Storing a data set ................................................... 5-35
Sub-D socket ............................................................ 8-6
SVEL1 (Fixed sound velocity) ................................ 5-47
Switching on/off ........................................................ 3-8
Symbols
In this manual ..................................................... 1-11
LED..................................................................... 5-60
Status symbols ................................................... 5-60
Syntax .................................................................... 8-11
T
T-CORR
Sensitivity correction (DAC) ................................ 5-64
Sensitivity correction (JDAC) .............................. 5-70
Transfer correction (DGS) ................................... 5-78
TCG........................................................................ 5-62
Registration curve ............................................... 5-70
Temperature .............................................................. 1-6
Test report ................................................................ 6-3
Test requirements ..................................................... 1-4
TESTINF
Additional information for stored data sets ......... 5-38
THICKNE
Material thickness............................................... 5-32
Index
Sensitivity correction .................................... 5-64, 5-70
Serial communication activation............................... 8-8
Service ..................................................................... 9-8
SETTING
Function list ........................................................ 5-42
setting
Function list ........................................................ 5-38
Setting of gain .......................................................... 4-8
Sound attenuation (DGS) ........................................ 5-78
Sound velocity.......................................................... 5-7
Spare parts list ....................................................... 9-10
Standard package .................................................... 2-3
Start-up .................................................................... 3-8
Storing a data set ................................................... 5-35
Sub-D socket ............................................................ 8-6
SVEL1 (Fixed sound velocity) ................................ 5-47
Switching on/off ........................................................ 3-8
Symbols
In this manual ..................................................... 1-11
LED..................................................................... 5-60
Status symbols ................................................... 5-60
Syntax .................................................................... 8-11
T
T-CORR
Sensitivity correction (DAC) ................................ 5-64
Sensitivity correction (JDAC) .............................. 5-70
Transfer correction (DGS) ................................... 5-78
TCG........................................................................ 5-62
Registration curve ............................................... 5-70
Temperature .............................................................. 1-6
Test report ................................................................ 6-3
Test requirements ..................................................... 1-4
TESTINF
Additional information for stored data sets ......... 5-38
THICKNE
Material thickness............................................... 5-32
Index
Threshold of the gates............................................ 5-16
TIME
Setting the time .................................................. 5-56
TOF
Selecting the measuring point ............................. 5-44
Transfer correction (DGS) ....................................... 5-78
Transfer of datasets ................................................ 8-15
Transmission timing ................................................ 8-12
TRIG (function group) ............................................. 5-31
U
Ultrasonic testing...................................................... 1-3
UNIT
Units of measurement ......................................... 5-54
Units ....................................................................... 4-11
W
Wall thickness .......................................................... 1-6
Waste disposal ......................................................... 7-6
Width of the gates .................................................. 5-16
X
X-position ............................................................... 5-40
X-VALUE
Of the probe ........................................................ 5-32
Z
Zoom mode .............................................................. 4-3
Index
Threshold of the gates............................................ 5-16
TIME
Setting the time .................................................. 5-56
TOF
Selecting the measuring point ............................. 5-44
Transfer correction (DGS) ....................................... 5-78
Transfer of datasets ................................................ 8-15
Transmission timing ................................................ 8-12
TRIG (function group) ............................................. 5-31
U
Ultrasonic testing...................................................... 1-3
UNIT
Units of measurement ......................................... 5-54
Units ....................................................................... 4-11
W
Wall thickness .......................................................... 1-6
Waste disposal ......................................................... 7-6
Width of the gates .................................................. 5-16
X
X-position ............................................................... 5-40
X-VALUE
Of the probe ........................................................ 5-32
Z
Zoom mode .............................................................. 4-3
Technical specifications according to EN 12668-1
USM 35X
USM 35X DAC
USM 35X S
GE Inspection Technologies USM 35X S_TM036060001_D - 1
Technical specifications according to EN 12668-1
USM 35X
USM 35X DAC
USM 35X S
GE Inspection Technologies USM 35X S_TM036060001_D - 1
Technical specifications according to EN 12668-1 Technical specifications according to EN 12668-1 Technical specifications according to EN 12668-1 Technical specifications according to EN 12668-1
Description Description Description Description Symbol Symbol Symbol Symbol Dimension Dimension Dimension Dimension Min Min Min Min Average Average Average Average Max Max Max Max Comment Comment Comment Comment
USM 35X S_TM036060001_D-2 GE Inspection Technologies
- - - Spike pulse
Spectrum Spectrum Spectrum Spectrum Picture: 1
Damping Damping Damping Damping -
342
45
1000
50
- DUAL = off
DAMPING = low
DAMPING = high
DUAL = on
DAMPING = low
DAMPING = high
Capacity Capacity Capacity Capacity pF - 220
1000
- POWER = low
POWER = high
Pulse Repetition Frequency Pulse Repetition Frequency Pulse Repetition Frequency Pulse Repetition Frequency Hz 20% 4-1000 20%
PRF Mode - - - Manual,
automatically linked
to range in 10 steps
PRF step Hz - 4
100
- >1,5m
<1,5m
Operating Modes Operating Modes Operating Modes Operating Modes - - - Single-,
dual mode
through
Characteristics of Transmitter Pulse Characteristics of Transmitter Pulse Characteristics of Transmitter Pulse Characteristics of Transmitter Pulse - - -
Pulse voltage V -346 -315 -283 1000 Hz
DAMPING = low
POWER = high
- - - Spike pulse
Damping Damping Damping Damping -
342
45
1000
50
- DUAL = off
DAMPING = low
DAMPING = high
DUAL = on
DAMPING = low
DAMPING = high
Capacity Capacity Capacity Capacity pF - 220
1000
- POWER = low
POWER = high
Pulse Repetition Frequency Pulse Repetition Frequency Pulse Repetition Frequency Pulse Repetition Frequency Hz 20% 4-1000 20%
PRF Mode - - - Manual,
automatically linked
to range in 10 steps
PRF step Hz - 4
100
- >1,5m
<1,5m
Operating Modes Operating Modes Operating Modes Operating Modes - - - Single-,
dual mode
through
Characteristics of Transmitter Pulse Characteristics of Transmitter Pulse Characteristics of Transmitter Pulse Characteristics of Transmitter Pulse - - -
DAMPING = low
POWER = high
GE Inspection Technologies USM 35X S_TM036060001_D-3
Pulse rise time ns 8,19 9,64 11,08
Pulse duration ns 120,4 133,7 147,1
Effective output impedance 23 29 35
DAMPING = high
POWER = high
DAMPING = low
POWER = low
DAMPING = high
POWER = low
DAMPING = high
POWER = high
DAMPING = low
POWER = low
DAMPING = high
POWER = low
Receiver Receiver Receiver Receiver
Amplifier Amplifier Amplifier Amplifier - - -
Setting Range Setting Range Setting Range Setting Range dB - 110 -
Increments dB - 0,5
1
2
6
12
-
Attenuator uncal. range dB - 4 -
Accuracy of calibrated attenuator dB -2 0 2
Uncalibrated increments dB - ~0,1 -
Amplifier Frequency Amplifier Frequency Amplifier Frequency Amplifier Frequency - - -
Frequency spectrum (-3dB) MHz - 0,2 - 20 - (-3dB)
Frequency ranges MHz - - - 0,2 - 1 MHz Filter 4
Lower frequency range MHz 0,177 0,197 0,216
Upper frequency range MHz 1,138 1,265 1,391
Center frequency MHz 0,473 0,498 0,523
Bandwidth MHz 0,962 1,069 1,175
Maximum frequency MHz 0,394 0,526 0,657
Dynamic range dB - >110 -
Noise level nV 1 - 80
Gain for 80% SH dB 24,0 25,0 26,0
Minimum input voltage V 60 90 120
Receiver Receiver Receiver Receiver
Amplifier Amplifier Amplifier Amplifier - - -
Setting Range Setting Range Setting Range Setting Range dB - 110 -
Increments dB - 0,5
1
2
6
12
-
Attenuator uncal. range dB - 4 -
Accuracy of calibrated attenuator dB -2 0 2
Uncalibrated increments dB - ~0,1 -
Amplifier Frequency Amplifier Frequency Amplifier Frequency Amplifier Frequency - - -
Frequency spectrum (-3dB) MHz - 0,2 - 20 - (-3dB)
Bandwidth MHz 0,962 1,069 1,175
Gain for 80% SH dB 24,0 25,0 26,0
Maximum input voltage V - - 40
Bandwidth MHz 3,551 3,946 4,340
Gain for 80% SH dB 23,5 24,5 25,5
Bandwidth MHz 9,167 10,186 11,204
Gain for 80% SH dB 24,0 25,0 26,0
Bandwidth MHz 3,551 3,946 4,340
Gain for 80% SH dB 23,5 24,5 25,5
Bandwidth MHz 9,167 10,186 11,204
Gain for 80% SH dB 24,0 25,0 26,0
Frequency ranges MHz - - - 2 - 20 MHz Filter 2
Bandwidth MHz 16,653 18,504 20,354
Gain for 80% SH dB 24,5 25,5 26,5
Deadtime after transmitter pulse s - <5 us - 1nF,125 Ohm,0,5-4MHz
Receiver input impedance
Single probe (combined transmitter and receiver) Single mode
Rmax - 338 - Rmax
Rmin - 338 - Rmin
Cmax pf - 52 - Cmax
Cmin pf - 52 - Cmin
Dual-probe (separate transmitter and receiver) Dual mode
- 511 -
- 511 -
Frequency ranges MHz - - - 2 - 20 MHz Filter 2
Bandwidth MHz 16,653 18,504 20,354
Gain for 80% SH dB 24,5 25,5 26,5
Deadtime after transmitter pulse s - <5 us - 1nF,125 Ohm,0,5-4MHz
Receiver input impedance
Single probe (combined transmitter and receiver) Single mode
Rmax - 338 - Rmax
Rmin - 338 - Rmin
Cmax pf - 52 - Cmax
Cmin pf - 52 - Cmin
Dual-probe (separate transmitter and receiver) Dual mode
- 511 -
- 511 -
pf - 33 -
pf - 33 -
Signal Mode Signal Mode Signal Mode Signal Mode - - -
Full Wave - yes
Negative Halfwave - yes -
Positive Halfwave - yes -
RF yes To 50 mm steel
Suppression Suppression Suppression Suppression - yes -
Adjustable % - 1 - 80 -
pf - 33 -
pf - 33 -
Signal Mode Signal Mode Signal Mode Signal Mode - - -
Full Wave - yes
Negative Halfwave - yes -
Positive Halfwave - yes -
RF yes To 50 mm steel
Suppression Suppression Suppression Suppression - yes -
Adjustable % - 1 - 80 -
Monitor Monitor Monitor Monitor
Number of Gates Number of Gates Number of Gates Number of Gates - 2 -
Alarm logic Alarm logic Alarm logic Alarm logic - off,
pos,
neg,
trigger
-
for gate B (C)
Start Start Start Start mm - 0
to
9999
-
Width Width Width Width mm - 0,2
to
9999
-
Threshold Threshold Threshold Threshold % - 10 - 90 -
Measurement points Measurement points Measurement points Measurement points - flank,
peak
jflank
-
JIS Z3060
Magnifier Magnifier Magnifier Magnifier - yes - Display of A-scan
on full screen width
Alarm Alarm Alarm Alarm - LED,
horn
- Horn
switchable
Interface echo start Interface echo start Interface echo start Interface echo start - yes - Control of
Gate B by Gate A
Switch output Switch output Switch output Switch output - yes - See interfaces
Monitor Monitor Monitor Monitor
Number of Gates Number of Gates Number of Gates Number of Gates - 2 -
Alarm logic Alarm logic Alarm logic Alarm logic - off,
pos,
neg,
trigger
-
for gate B (C)
Start Start Start Start mm - 0
to
9999
-
Width Width Width Width mm - 0,2
to
9999
-
Threshold Threshold Threshold Threshold % - 10 - 90 -
Measurement points Measurement points Measurement points Measurement points - flank,
peak
jflank
-
JIS Z3060
Magnifier Magnifier Magnifier Magnifier - yes - Display of A-scan
on full screen width
Alarm Alarm Alarm Alarm - LED,
horn
- Horn
switchable
Interface echo start Interface echo start Interface echo start Interface echo start - yes - Control of
Gate B by Gate A
Switch output Switch output Switch output Switch output - yes - See interfaces
Display Display Display Display
Type Type Type Type - active
color-LCD
-
Dimensions of the Display Dimensions of the Display Dimensions of the Display Dimensions of the Display mm - 86 x 115 - (HxW)
Resolution Resolution Resolution Resolution - 240 x 320- Number of pixels
Backlight Backlight Backlight Backlight - yes - 2 steps
A-scan display A-scan display A-scan display A-scan display
Linearity of time base % -0,5 0,5
Sampling error % -2 0 2 bei 2 MHz
Display jitter - - -
Amplitude % -2 0 2 Amplitude
Position % -1 0 1 Position
Measurement resolution Measurement resolution Measurement resolution Measurement resolution - - -
Sound path mm 0,01 - 1 0,01:
0 to 99 mm
0,1:
100 mm to 999 mm
1:
ab 1000 mm
Amplitude % - 0,5 -
,
ns - 100 -
ns - 250 - Following an
interface echo
Display Display Display Display
Type Type Type Type - active
color-LCD
-
Dimensions of the Display Dimensions of the Display Dimensions of the Display Dimensions of the Display mm - 86 x 115 - (HxW)
Resolution Resolution Resolution Resolution - 240 x 320- Number of pixels
Backlight Backlight Backlight Backlight - yes - 2 steps
A-scan display A-scan display A-scan display A-scan display
Linearity of time base % -0,5 0,5
Sampling error % -2 0 2 bei 2 MHz
Display jitter - - -
Amplitude % -2 0 2 Amplitude
Position % -1 0 1 Position
Measurement resolution Measurement resolution Measurement resolution Measurement resolution - - -
Sound path mm 0,01 - 1 0,01:
0 to 99 mm
0,1:
100 mm to 999 mm
1:
ab 1000 mm
Amplitude % - 0,5 -
,
ns - 100 -
ns - 250 - Following an
interface echo
Display width Display width Display width Display width mm - 0,5
to
9999
-
Fixed ranges mm - 55 -
Display start mm - -10
to
900
- Display start
Probe delay s - 0
to
199,99
-
Automatic Calibration - yes - 2 step
calibration
Material velocity Material velocity Material velocity Material velocity m/s - 1000
to
15000
- Resulation 1m/s
Unit of measurement Unit of measurement Unit of measurement Unit of measurement - mm,
inch
-
Linearity of time base Linearity of time base Linearity of time base Linearity of time base % 0,5 0 0,5
Trigonometry Trigonometry Trigonometry Trigonometry - - -
Angle of incidence - 0 - 90 - Resulation 0,1
Increments - 0,1 - Increments
X-value mm - 0 - 100 - Distance:
index point to
probe front edge
Object thickness mm - 1 - 9999 - To calculate
Sound Reflection
Display width Display width Display width Display width mm - 0,5
to
9999
-
Fixed ranges mm - 55 -
Display start mm - -10
to
900
- Display start
Probe delay s - 0
to
199,99
-
Automatic Calibration - yes - 2 step
calibration
Material velocity Material velocity Material velocity Material velocity m/s - 1000
to
15000
- Resulation 1m/s
Unit of measurement Unit of measurement Unit of measurement Unit of measurement - mm,
inch
-
Linearity of time base Linearity of time base Linearity of time base Linearity of time base % 0,5 0 0,5
Trigonometry Trigonometry Trigonometry Trigonometry - - -
Angle of incidence - 0 - 90 - Resulation 0,1
Increments - 0,1 - Increments
X-value mm - 0 - 100 - Distance:
index point to
probe front edge
Object thickness mm - 1 - 9999 - To calculate
Sound Reflection
Diameter mm/inch 10 - 2000 flat
0,40 - 800 flat
mm
inch
Image processing Image processing Image processing Image processing - - -
Readings to be displayed - 5 -
Time of flight - yes - For Gate A, B
Sound path difference - B-A - For Gate A, B
Surface distance - yes - For Gate A, B
Red. surface distance - yes - For Gate A, B
Depth position - yes - For Gate A, B
Amplitude in % - yes - For Gate A, B
Amplitude in dB - yes -- to gate threshold
to reference (REF)
for USM 35X DAC/S
to reference curve
Amplitude in % curve - yes - * Only USM 35X DAC
and S
for gate A,B
to reference curve
Amplitude as ERS - yes - * Only USM 35X S
for gate A
Alarm - yes - For Gate A,B
Evaluation curve (DGS) - yes - * only for USM 35X S
Test sensitivity - yes - * only for USM 35X S
Diameter mm/inch 10 - 2000 flat
0,40 - 800 flat
mm
inch
Image processing Image processing Image processing Image processing - - -
Readings to be displayed - 5 -
Time of flight - yes - For Gate A, B
Sound path difference - B-A - For Gate A, B
Surface distance - yes - For Gate A, B
Red. surface distance - yes - For Gate A, B
Depth position - yes - For Gate A, B
Amplitude in % - yes - For Gate A, B
Amplitude in dB - yes -- to gate threshold
to reference (REF)
for USM 35X DAC/S
to reference curve
Amplitude in % curve - yes - * Only USM 35X DAC
and S
for gate A,B
to reference curve
Amplitude as ERS - yes - * Only USM 35X S
for gate A
Alarm - yes - For Gate A,B
Evaluation curve (DGS) - yes - * only for USM 35X S
Test sensitivity - yes - * only for USM 35X S
Number of legs yes addional possible
change of A-scan
color according to
skips
Flaw class yes Flaw class
db-difference to reference yes for DAC
Reference gain Gr yes for DGS
Signal display mode Signal display mode Signal display mode Signal display mode - standard,
filled
-
Signal processing Signal processing Signal processing Signal processing - - -
Screen freeze - yes - Freeze
Auto freeze - yes - Auto freeze
A-scan Compare - yes -
Echo dynamic - yes - Echo envelope
Peak Freeze - yes - For Gate B
Zoom Zoom Zoom Zoom - yes - A-scan on full
screen width
Status information Status information Status information Status information - yes -
Dialog languages Dialog languages Dialog languages Dialog languages - 20 -
Function lock Function lock Function lock Function lock - yes - In zoom mode
Number of legs yes addional possible
change of A-scan
color according to
skips
Flaw class yes Flaw class
db-difference to reference yes for DAC
Reference gain Gr yes for DGS
Signal display mode Signal display mode Signal display mode Signal display mode - standard,
filled
-
Signal processing Signal processing Signal processing Signal processing - - -
Screen freeze - yes - Freeze
Auto freeze - yes - Auto freeze
A-scan Compare - yes -
Echo dynamic - yes - Echo envelope
Peak Freeze - yes - For Gate B
Zoom Zoom Zoom Zoom - yes - A-scan on full
screen width
Status information Status information Status information Status information - yes -
Dialog languages Dialog languages Dialog languages Dialog languages - 20 -
Function lock Function lock Function lock Function lock - yes - In zoom mode
Amplitude evaluation Amplitude evaluation Amplitude evaluation Amplitude evaluation
DAC DAC DAC DAC yes - * Only USM 35X DAC
and S
Distance amplitude curve
Number of reference echoes - 10 - Reference echoes
Dynamic range dB - 40 - For TCG
Slope maximum dB/s 6 - For TCG
DGS DGS DGS DGS - yes - * Only USM 35X S
Number of probes - 24 - In memory
Free programmable probe - yes - One probe per data set
Reference reflectors - SDH
BE
FBH
-
Attenuation correction - yes -
Transfer correction - yes -
Quadrant correction - yes -
DAC Mode DAC Mode DAC Mode DAC Mode - yes - * Only USM 35X DAC
and S
display of curve
Curve - yes - Evaluation curve
TCG - yes - Depth compensation
Additional curves - 4 -
Curve offset dB - 0,1 - 14 - Additional curves
JIS-DAC yes
Amplitude evaluation Amplitude evaluation Amplitude evaluation Amplitude evaluation
DAC DAC DAC DAC yes - * Only USM 35X DAC
and S
Distance amplitude curve
Number of reference echoes - 10 - Reference echoes
Dynamic range dB - 40 - For TCG
Slope maximum dB/s 6 - For TCG
DGS DGS DGS DGS - yes - * Only USM 35X S
Number of probes - 24 - In memory
Free programmable probe - yes - One probe per data set
Reference reflectors - SDH
BE
FBH
-
Attenuation correction - yes -
Transfer correction - yes -
Quadrant correction - yes -
DAC Mode DAC Mode DAC Mode DAC Mode - yes - * Only USM 35X DAC
and S
display of curve
Curve - yes - Evaluation curve
TCG - yes - Depth compensation
Additional curves - 4 -
Curve offset dB - 0,1 - 14 - Additional curves
JIS-DAC yes
Data processing Data processing Data processing Data processing
Analog-to-Digital Conversion Analog-to-Digital Conversion Analog-to-Digital Conversion Analog-to-Digital Conversion - - -
Sample frequency MHz 30 - 240
Storage of data Storage of data Storage of data Storage of data - yes - From internal memory
Number of datasets - 800 -
Contents of datasets - - - A-scan + instrument
setup
Dataset description - - - Numerical and alpha-
numerical
String Length (Dataset name) - 24 -
Notes, No. of fields - 9 - 6 alphanumerical +
3 numerical
Memo, No. of characters - 24 -
Date and time - yes -
Measurement results Measurement results Measurement results Measurement results
Sound path (TOF) - yes - For Gate A and B
Trigiometric values - selectable-
Amplidute - selectable-
Hardcopy - yes - Format PCX
Function list - yes -
Test Report - yes -
Data processing Data processing Data processing Data processing
Analog-to-Digital Conversion Analog-to-Digital Conversion Analog-to-Digital Conversion Analog-to-Digital Conversion - - -
Sample frequency MHz 30 - 240
Storage of data Storage of data Storage of data Storage of data - yes - From internal memory
Number of datasets - 800 -
Contents of datasets - - - A-scan + instrument
setup
Dataset description - - - Numerical and alpha-
numerical
String Length (Dataset name) - 24 -
Notes, No. of fields - 9 - 6 alphanumerical +
3 numerical
Memo, No. of characters - 24 -
Date and time - yes -
Measurement results Measurement results Measurement results Measurement results
Sound path (TOF) - yes - For Gate A and B
Trigiometric values - selectable-
Amplidute - selectable-
Hardcopy - yes - Format PCX
Function list - yes -
Test Report - yes -
Interfaces Interfaces Interfaces Interfaces
Outputs Outputs Outputs Outputs - - -
Alarms - TTL -
Horn - yes -
Alarm gate A/B - yes - Logical OR
Switching voltage U V= - 3 - HCT level with 100 Ohm
serial
Max. switching current I mA 6 - Max. switching current
Hysteresis % 0,5 0 0,5 Hysteresis
Accuracy of the threshold % 2 - 2 Correspondig to actual
threshold
Hold time t ms 20% 500 20% Hold time
Analog output
Amplitude Gate A or B U V= - 0 - 5 - Corresponding to
100% SH
Time of flight Gate A or B U V= - 0 - 5 - Corresponding to
gate width
Max. switch current mA - 0,5 - Max. switch current
Output impedance - 100 - Output impedance
Linearity % 0,5 0 0,5 8 Bit +/- 1/2 LSB
Rise time V/s - 2,5 - Rise time
Fall time V/s - 2,5 - Fall time
Hold time ms - 8 - 250 - Depending on PRF
Digital input Digital input Digital input Digital input
Interfaces Interfaces Interfaces Interfaces
Outputs Outputs Outputs Outputs - - -
Alarms - TTL -
Horn - yes -
Alarm gate A/B - yes - Logical OR
Switching voltage U V= - 3 - HCT level with 100 Ohm
serial
Max. switching current I mA 6 - Max. switching current
Hysteresis % 0,5 0 0,5 Hysteresis
Accuracy of the threshold % 2 - 2 Correspondig to actual
threshold
Hold time t ms 20% 500 20% Hold time
Analog output
Amplitude Gate A or B U V= - 0 - 5 - Corresponding to
100% SH
Time of flight Gate A or B U V= - 0 - 5 - Corresponding to
gate width
Max. switch current mA - 0,5 - Max. switch current
Output impedance - 100 - Output impedance
Linearity % 0,5 0 0,5 8 Bit +/- 1/2 LSB
Rise time V/s - 2,5 - Rise time
Fall time V/s - 2,5 - Fall time
Hold time ms - 8 - 250 - Depending on PRF
Digital input Digital input Digital input Digital input
Control
Test data release - yes - TTL
Digital interface Digital interface Digital interface Digital interface
Types
RS-232 - yes - RS-232
Printer
Output/type - - - RS 232
Driver - - - Epson
HP
Seiko
HP DeskJet 1200
HP LaserJet 1200
Data Redable about
RS232
Time of flight - yes - Time of flight
Amplitude - yes - Amplitude
Alarms - yes - Alarms
A-Scan yes A-Scan
Trigger - TTL -
Remote control Remote control Remote control Remote control - - - RS 232
VGA output VGA output VGA output VGA output yes
Horizontal frequency kHz 31,3
Vertical frequency Hz 85
Control
Test data release - yes - TTL
Digital interface Digital interface Digital interface Digital interface
Types
RS-232 - yes - RS-232
Printer
Output/type - - - RS 232
Driver - - - Epson
HP
Seiko
HP DeskJet 1200
HP LaserJet 1200
Data Redable about
RS232
Time of flight - yes - Time of flight
Amplitude - yes - Amplitude
Alarms - yes - Alarms
A-Scan yes A-Scan
Trigger - TTL -
Remote control Remote control Remote control Remote control - - - RS 232
VGA output VGA output VGA output VGA output yes
Horizontal frequency kHz 31,3
Vertical frequency Hz 85
General General General General
Instrument Instrument Instrument Instrument - - -
Size (HxWxD) mm - 176 x 255 x 105 -
Weight kg - 2,2 - incl. Batteries
Storage temperature C -20 +60
Temperate range for mains operation C 0 40
Temperature range for battery operation C 0 60
Warm-up period h - - - 10 minutes at 25 C
Possible power supplies - - - Battery, mains
(external power supply)
Voltage range for battery operation V= 8,6
5,4
13
8
Li Ionen Battery
6 NiCD, NiMH
Cells
Voltage range with power supply V= 9,5 13
Power consumption VA 5,5 - 8 Min (ECO)
Max (FULL)
Low battery warning - yes - Status display
Environmental Protection - IP 66 --
Shock resistivity - - - Shock resistance
according to DIN
IEC 68, 6 ms, 60g
shocks per axis
Vibration Vibration resistance
according to DIN IEC 68,
1-150 Hz, 2g, 20 cycles
per axis
General General General General
Instrument Instrument Instrument Instrument - - -
Size (HxWxD) mm - 176 x 255 x 105 -
Weight kg - 2,2 - incl. Batteries
Storage temperature C -20 +60
Temperate range for mains operation C 0 40
Temperature range for battery operation C 0 60
Warm-up period h - - - 10 minutes at 25 C
Possible power supplies - - - Battery, mains
(external power supply)
Voltage range for battery operation V= 8,6
5,4
13
8
Li Ionen Battery
6 NiCD, NiMH
Cells
Voltage range with power supply V= 9,5 13
Power consumption VA 5,5 - 8 Min (ECO)
Max (FULL)
Low battery warning - yes - Status display
Environmental Protection - IP 66 --
Shock resistivity - - - Shock resistance
according to DIN
IEC 68, 6 ms, 60g
shocks per axis
Vibration Vibration resistance
according to DIN IEC 68,
1-150 Hz, 2g, 20 cycles
per axis
Stability against temperature change Stability against temperature change Stability against temperature change Stability against temperature change - - -
Amplitude %/10 C -5 0 5
Echo position %/10 C -1 0 1
Stability against voltage change Stability against voltage change Stability against voltage change Stability against voltage change - - -
Amplitude % -2 0 2
Time of flight % -1 0 1
Power supply Power supply Power supply Power supply - - - Li Ion Battery
6 NiMH cells
Battery operation time h - 14
3
- Li Ion Battery
6 NiMH cells
Stability after warm-up time Stability after warm-up time Stability after warm-up time Stability after warm-up time - - - After 30 minutes
Low battery display - - - Statussymbol
Amplitude %/10 C -2 0 2 +/-0,5%
Time of flight % -1 0 1 +/- 0,5mm
Change in amplitude over time base position
with battery c
% - - -
Types of Sockets Types of Sockets Types of Sockets Types of Sockets
Probe connection - Lemo,
BNC
- On order
I/O interface - Lemo - 8-pin
RS-232 - DSUB - 9-pin
External power supply - Lemo - 4-pin
VGA output VGA output VGA output VGA output Lemo 10-pins
Case Case Case Case - Plastic
Stability against temperature change Stability against temperature change Stability against temperature change Stability against temperature change - - -
Amplitude %/10 C -5 0 5
Echo position %/10 C -1 0 1
Stability against voltage change Stability against voltage change Stability against voltage change Stability against voltage change - - -
Amplitude % -2 0 2
Time of flight % -1 0 1
Power supply Power supply Power supply Power supply - - - Li Ion Battery
6 NiMH cells
Battery operation time h - 14
3
- Li Ion Battery
6 NiMH cells
Stability after warm-up time Stability after warm-up time Stability after warm-up time Stability after warm-up time - - - After 30 minutes
Low battery display - - - Statussymbol
Amplitude %/10 C -2 0 2 +/-0,5%
Time of flight % -1 0 1 +/- 0,5mm
Change in amplitude over time base position
with battery c
% - - -
Types of Sockets Types of Sockets Types of Sockets Types of Sockets
Probe connection - Lemo,
BNC
- On order
I/O interface - Lemo - 8-pin
RS-232 - DSUB - 9-pin
External power supply - Lemo - 4-pin
VGA output VGA output VGA output VGA output Lemo 10-pins
Case Case Case Case - Plastic
Documentation Documentation Documentation Documentation - - - Technical reference
manual
Documentation Documentation Documentation Documentation - - - Technical reference
manual
Other Other Other Other
Software update procedure Software update procedure Software update procedure Software update procedure - - - Download via RS 232
Options Options Options Options - - - Data logger
Other Other Other Other
Software update procedure Software update procedure Software update procedure Software update procedure - - - Download via RS 232
Options Options Options Options - - - Data logger
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Krautkramer USM 35X Issue 01, 04/2005 0-1

3-2 Issue 01, 04/2005 Krautkramer USM 35X

Krautkramer USM 35X Issue 01, 04/2005 3-3

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