SURPASS HiT7035 R4.2 Acceptance Test Manual

SURPASS hiT 7025 4.
2
Acceptance Test Manual
Product code P42022-A5248-H420
Nokia Siemens Networks
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The information in this document is subject to change without notice and describes only the product defined in the introduction of this documentation. This documentation is intended for the use of Nokia Siemens Networks customers only for the purposes of the agreement under which the document is submitted, and no part of it may be used, reproduced, modified or transmitted in any form or means without the prior written permission of Nokia Siemens Networks. The documentation has been prepared to be used by professional and properly trained personnel, and the customer assumes full responsibility when using it. Nokia Siemens Networks welcomes customer comments as part of the process of continuous development and improvement of the documentation. The information or statements given in this documentation concerning the suitability, capacity, or performance of the mentioned hardware or software products are given as is and all liability arising in connection with such hardware or software products shall be defined conclusively and finally in a separate agreement between Nokia Siemens Networks and the customer. However, Nokia Siemens Networks has made all reasonable efforts to ensure that the instructions contained in the document are adequate and free of material errors and omissions. Nokia Siemens Networks will, if deemed necessary by Nokia Siemens Networks, explain issues which may not be covered by the document. Nokia Siemens Networks will correct errors in this documentation as soon as possible. IN NO EVENT WILL NOKIA SIEMENS NETWORKS BE LIABLE FOR ERRORS IN THIS DOCUMENTATION OR FOR ANY DAMAGES, INCLUDING BUT NOT LIMITED TO SPECIAL, DIRECT, INDIRECT, INCIDENTAL OR CONSEQUENTIAL OR ANY LOSSES, SUCH AS BUT NOT LIMITED TO LOSS OF PROFIT, REVENUE, BUSINESS INTERRUPTION, BUSINESS OPPORTUNITY OR DATA,THAT MAY ARISE FROM THE USE OF THIS DOCUMENT OR THE INFORMATION IN IT. This documentation and the product it describes are considered protected by copyrights and other intellectual property rights according to the applicable laws. The wave logo is a trademark of Nokia Siemens Networks Oy. Nokia is a registered trademark of Nokia Corporation. Siemens is a registered trademark of Siemens AG. Other product names mentioned in this document may be trademarks of their respective owners, and they are mentioned for identification purposes only. Copyright Nokia Siemens Networks 2007. All rights reserved.
Fehler! Formatvorlage nicht definiert.
Statements of compliance
CE statement
The CE conformity declaration for the product is fulfilled when the system is built and cabled in line with the information given in the manual and the documentation specified within it, such as installation instructions, cable lists or the like. Where necessary project-specific documentation should be taken into consideration. Deviations from the specifications or independent modifications to the layout, such as use of cable types with lower screening values for example, can lead to violation of the CE protection requirements. In such cases the conformity declaration is invalidated. The responsibility for any problems which subsequently arise rests with the party responsible for deviating from the installation specifications.
Product code P42022-A5248-H420 Issue 2.0
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Certificate of Customer Acceptance

Project Name: Country: Customer: Station: Product Version: Number of Pages: Remarks: hiT7035 R4.2L4.xx
Customer Acceptance Engineer: NOKIA SIEMENS Networks Engineer: Date: Sign for the customer: Sign for NOKIA SIEMENS Networks:
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Summary of changes
Contents
1 Preface 8 2 Test Preparation ..................................................................................9 2.1 Inventory List.......................................................................................9 2.1.1 Circuit Pack List of hiT7035..............................................................9 2.1.2 Load number of hiT7035 and hiT7035 LCT...................................10 2.2 Tools and Test Equipment List..........................................................10 3 Test result...........................................................................................11 4 Acceptance test procedure................................................................13 4.1 Interface Test....................................................................................13 4.1.1 Test of Battery Voltage...................................................................13 4.1.2 Check of the Management port.......................................................14 4.1.3 Function Test of User Channel (F1)................................................15 4.1.4 Function Test of EOW channels.....................................................16 4.1.5 Function Test of MDI/MDO.............................................................17 4.1.6 E1 (75ohm) Cabling Test................................................................18 4.1.7 E1 (120ohm) Cabling Test..............................................................20 4.1.8 E3/DS3 Cabling Test......................................................................22 4.1.9 STM-1E Cabling Test.....................................................................23 4.1.10 STM-1 Optical Mean Launch Power.............................................25 4.1.11 STM-4 Optical Mean Launch Power.............................................26 4.1.12 STM-16 Optical Mean Launch Power...........................................28 4.1.13 STM-1 Optical Receive Power......................................................30 4.1.14 STM-4 Optical Receive Power......................................................32 4.1.15 STM-16 Optical Receive Power....................................................34 4.1.16 BOA Transmit Power....................................................................36 4.1.17 POA Transmit Power....................................................................37 4.1.18 Ethernet Performance Test RFC2544 test for 8xFE/T...............39 4.1.19 Ethernet Performance Test RFC2544 test for 8xFE/L2.............44 4.1.20 Ethernet Performance Test RFC2544 Test for 1xGE/T.............49 4.1.21 IMA Function Test........................................................................54 4.2 Network Test.....................................................................................55 4.2.1 Bit Error Test on E1 (12h)...............................................................55 4.2.2 Bit Error Test on E3 (12h)...............................................................57 4.2.3 Bit Error Test on DS3 (12h)............................................................58 4.2.4 Bit Error Test on Line Side (12h, STM-1 trib)..................................60 4.2.5 Bit Error Test on Line Side (12h, STM-1E trib)...............................61 4.2.6 Bit Error Test on Line Side (12h, STM-4 trib)..................................63 4.2.7 Bit Error Test on Line Side (12h, STM-16 trib)................................64 4.2.8 Packet Loss Test on Ethernet Card (12h, 8xFE/T).........................66 4.2.9 Packet Loss Test on Ethernet Card (12h, 8xFE/L2)........................67 4.2.10 Packet Loss Test on Ethernet Card (12h, 1xGE/T Card)..............69
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Abbreviations.......................................................................................71 `
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Summary of changes
Summary of changes
Re-issue date 2007-7-13 2007-7-24 2007-7-31 2007-8-6 Reason Initial this document Update RFC2544 reference results for 8xFE/T, 8xFE/L2 and 1xGE/T Add document part number Add IMA test notes Modified by Wang Xiaowei Yan Junhua Yan Junhua Yan Junhua Version 01 02 03 04
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Preface
The purpose of this manual is to provide the necessary test steps and their explanations for an acceptance test of hiT7035 R4.2. The System-acceptance personnel of the customer and/or of the manufacturer will carry out the acceptance tests after installation and commissioning. If the system user wishes to perform the acceptance test procedures, however, he must meet the following conditions:

Training as a service engineer or equivalent, Sound knowledge of transmission technology, Appropriate device-specific training by the device manufacturer providing him to get the required device and system knowledge for the planned activity, PC operation knowledge, Basic knowledge of handling components, which are sensitive to electrostatic discharges, Knowledge of handling optical fibbers and laser light sources.
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2
2.1
2.1.1
Test Preparation
Inventory List
Circuit Pack List of hiT7035

Slot name SC PWR1 PWR2 CC1_LC CC2_LC LC1 LC2 LC3 LC4 LC5 LC6 LC7 LC8 LC9 LC10 LC11 IO1 CP Type CP Code S/N number
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Slot name IO2 IO3 IO4 IO5 IO6 IO7 ST-CLK
CP Type
CP Code
S/N number
2.1.2
Load number of hiT7035 and hiT7035 LCT

hiT7035 NE Load TNMS-M Surpass hiT7035 LCT Load
2.2
Equipment Bit Error test set IMA test set Ethernet test set Optical test set Multimeter ESD wristband
Tools and Test Equipment List

Type SDH/PDH Analyzer ATM Analyzer IEEE802.3 data Analyzer Optical Power meter Cleaning material Fiber cables According to the delivered cards Range 0-1000V Accuracy +/- 5% SmartBits 600 with FE module and GE module Range 40+10dBm Recommendation Agilent Omni718 with STM-16/4/1 interface Actual Type
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Test result
Test Item Test of Battery Voltage Communication Management Port Function Test of EOW Function Test of MDI/MDO Cabling Test for Connected E1(75ohm) port Cabling Test for Connected E1(120ohm) port Cabling Test for Connected E3/DS3 port Cabling Test for Connected STM-1E port STM-1 Optical Mean Launch Power STM-4 Optical Mean Launch Power STM-16 Optical Mean Launch Power STM-1 Optical Receive Power Test result Pass Fail Memo
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Test Item STM-4 Optical Receive Power STM-16 Optical Receive Power Ethernet Performance Test-FE
Test result Pass Fail
Memo
BOA Transmit Power POA Transmit Power RFC2544 Test for 8xFE/T RFC2544 Test for 8xFE/L2 RFC2544 Test for 1xGE/T Bit Error Test on E1 (12h) Bit Error Test on E3 (12h) Bit Error Test on DS3 (12h) Bit Error Test on Line Side (12h, STM-1 trib) Bit Error Test on Line Side (12h, STM-1E trib) Bit Error Test on Line Side (12h, STM-4 trib) Bit Error Test on Line Side (12h, STM-16 trib) Packet Loss Test on 8xFE/T (12h,) Packet Loss Test on 8xFE/L2 (12h,) Packet Loss Test on 1xGE/T (12h,)
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4
4.1
4.1.1
4.1.1.1
Acceptance test procedure
Interface Test
Test of Battery Voltage

Test Purpose:
To avoid damages caused by the DC voltage outside the specification, the voltage needs to be checked before the initial power up of the system.
4.1.1.2 Test Setup:
Connect Multimeter with Power Distribution Panel, located on the top of the rack
4.1.1.3 Test diagram:
NA
4.1.1.4 Recommended Test Analyzer:
Multimeter
4.1.1.5 Test procedure:
Use the Multimeter to check DC voltage at the Power Distribution Panel of the rack for both power supply feeders.
4.1.1.6 Expected Result:
-40V to 72V
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4.1.1.7
Result Record DC Voltage Comply with table above Complied Complied Not Complied Not Complied
Input1 Input2
4.1.1.8
Estimated Time consumption
0.1 hour
4.1.2
4.1.2.1
Check of the Management port

Test Purpose:
This test checks that the Management port is working correctly.

4.1.2.2 Test Setup:
Connect the Management port on the System Controller to a compatible 10 or 100Mbit Ethernet Interface. Use a cross over LAN cable for this connection.
PC/Laptop computer
MGMT Port
NE
4.1.2.4
Test procedure:
1. 2.
Login to the NE with hiT7035 LCT; Do some configurations via hiT7035 LCT.
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4.1.2.5
Expected result:
NE can be operated via LCT

4.1.2.6 Result Record: C omplied 4.1.2.7 Estimated Time consumption Not Complied
0.5 hour
4.1.3
4.1.3.1
Function Test of User Channel (F1)

Test Purpose:
This procedure tests that User-Channel (F1) is working correctly.
Note This test is only done as field acceptance test if the User channel is used.
4.1.3.2
Test Setup: Loop with 1. Connect a SDH analyzer to one optical interface of NE;
2. Loop connetor EOW port with a RJ45 connector. 3. RJ45 loop-connector should be made as the figure shown:
R
RJ45
R J 4 5
C o n n e c t o r
EOW Port Nokia Siemens Networks o o p w
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h R J 4 5 C o n n e c t o r
o r t
4.1.3.3
Test diagram:
Line Port
SDH Analyzer
o L o Recommended Test Analyzer: o p SDH Analyzer Test procedure: w i t Create OHCC to one line port such as STM-1 port by LCT. h
4.1.3.4
4.1.3.5
1. 2. 3. 4.
4.1.3.6
Insert RJ45 loop-connector to EOW port. Run overhead BER on SDH analyzer for 5 minutes. J
O Check for error free transmission at SDH analyzer. W 4 5 R
4.1.3.7
4.1.3.8
C P o o The overhead BER should run errorr free n n t e Result Record: c t F1 Byte Complied Not Complied o r Estimated Time consumption Expected Result:
0.5 hour
p
4.1.4
4.1.4.1
w Function Test of EOW channels Test Purpose: i t h J 4 5
This procedure tests R EOW-Channels (E1 and E2) are working correctly. that
Note
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C This test is only done as field acceptance test if the User channel is used. o n n e c t o Nokia Siemens Networks Product code P42022-A5248-H420 r
Issue 4.0
4.1.4.2
Test Setup:
1. 2.
4.1.4.3
Connect EOW box to EOW port on NE; Connect phone to EOW phone port.
Test diagram:
EOW BOX
EOW Port
Line Port
Line Port
EOW Port
EOW BOX
7035 Local Station
7035 Remote Station
4.1.4.4
Test procedure:
1. 2. 3.
4.1.4.5
Create OHCC to one line port such as STM-1 port by LCT. Set phone number for every site. Call each other.
Expected Result:
Communication can be established.

4.1.4.6 Result Record: E1 byte E2 byte 4.1.4.7 Complied Complied Not Complied Not Complied
1 hour
4.1.5
4.1.5.1
Function Test of MDI/MDO

Test Purpose:
This procedure tests that MDI/MDO function of NE is working correctly.
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Note
This test is only done, if MDI/MDO is connected to a distributor (external equipment).
4.1.5.2
Test Setup:
Connect hiT7035 MDI/MDO interface with a distributor (external equipment). For MDI, the active voltage range is -18V ~ -75V. For MDO, the active activity is shortcut.
4.1.5.3 Test Diagram:
NA
1. 2.
Configure MDI/MDO interface as required; Check with test-equipment values on distributor.
For MDI, the active voltage range is -18V ~ -75V. For MDO, the active activity is shortcut. 3.
4.1.5.5
Additionally check alarms via hiT7035 LCT in MDI/MDO group.
Expected Result:
1. 2.
4.1.5.6
Test-equipment values on distributor will be changed according to specification; Alarms of hiT7035 NE will be changed according to the setting.
Result Record MDO MDI Complied Complied Not Complied Not Complied
4.1.5.7
1 hour
4.1.6
4.1.6.1
E1 (75ohm) Cabling Test

Test Purpose:
This test gives the steps required to check the E1 (75ohm) port cabling of the hiT7035 63xE1 75ohm card.
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4.1.6.2
Test Setup:
1. 2.
4.1.6.3
Connect SDH/PDH Analyzer to the E1 port; Loop Line port with external fiber, using a 10dB attenuator if needed.
Test diagram:
4.1.6.4
Recommended Test Analyzer:
SDH/PDH Analyzer
1. 2. 3.
4.1.6.6
Create cross-connection from every E1 port to line port looped by external fiber;
Do a short (few seconds) bit error test with the SDH/PDH analyzer for all E1 ports; Use PRBS15 for 2 Mbit/s tribs.
Expected Result:
No bit errors.
L i n
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4.1.6.7
Result record: C omplied Not Complied
4.1.6.8
1 hour
4.1.7
4.1.7.1
E1 (120ohm) Cabling Test

Test Purpose:
This test gives the steps required to check the E1 (120ohm) port cabling of the hiT7035 63xE1 120ohm card.
4.1.7.2 Test Setup:
1. 2.
Connect SDH/PDH Analyzer to the E1 port; Loop Line port with external fiber, using a 10dB attenuator if needed.
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4.1.7.3
Test diagram:
4.1.7.4
SDH/PDH Analyzer
L i n e
1. 2. 3.
4.1.7.6
Create cross-connection from every E1 port to line port looped by external fiber; Do a short (few seconds) bit error test with the SDH/PDH analyzer for all E1 ports; Use PRBS15 for 2 Mbit/s tribs.
Expected Result:
No bit errors.
4.1.7.7 Result record: Complied 4.1.7.8 Estimated Time consumption Not Complied
1 hour
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4.1.8
4.1.8.1
E3/DS3 Cabling Test

Test Purpose:
This test gives the steps required to check the E3/DS3 port cabling of the hiT7035 E3/DS3 card.
4.1.8.2 Test Setup:
1. 2.
4.1.8.3
Connect SDH/PDH Analyzer to the E3/DS3 port; Loop Line port with external fiber, using a 10dB attenuator if needed.
Test diagram:
4.1.8.4
SDH/PDH Analyzer
L i n e
1. 2.
Create cross-connection from every E3/DS3 port to line port looped by external fiber; Do a short (few seconds) bit error test with the SDH/PDH analyzer for all E3/DS3 ports;
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3.
4.1.8.6
Use PRBS23 for 34 Mbit/s and PRBS15 for 45 Mbit/s tribs.
Expected Result:
No bit errors.
1 hour
4.1.9
4.1.9.1
STM-1E Cabling Test

Test Purpose:
This test gives the steps required to check the STM-1E port cabling of the hiT7035 STM-1E card.
4.1.9.2 Test Setup:
1. 2.
Connect SDH/PDH Analyzer to the STM-1E port; Loop Line port with external fiber, using a 10dB attenuator if needed.
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4.1.9.3
Test diagram:
4.1.9.4
SDH/PDH Analyzer
1. 2. 3.
4.1.9.6
Create VC4 cross-connection from every STM-1E port to line port looped by external fiber;
Do a short (few seconds) bit error test with the SDH/PDH analyzer for all STM-1E ports; Use PRBS23 for STM-1E test.
Expected Result:
No bit errors.
1 hour
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L i n e
4.1.10
4.1.10.1
STM-1 Optical Mean Launch Power

Test Purpose:
The test verifies that the optical mean launched power of STM1 port is within specification. The specification is based on the recommendations ITU-T G.957.
4.1.10.2 Test setup:
Connect Optical Power Meter to the optical output interface of STM-1.

PC/Laptop computer MGMT Port
L i n e STM -1 optical. ODF NE
L i n e
Power Meter
4.1.10.4
Optical power meter

1. 2.
Disable Auto laser shutdown function of the appropriate STM-1 port; Record value of optical transmit power.
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4.1.10.6
Expected Result: SFP Type 1310 nm short haul 1310 nm long haul 1550 nm long haul 1550 nm long haul ITU S1.1 L1.1 L1.2 V.1.2 Order number S42025-L5135A1 S42025-L5134A1 S42025-L5133A1 S42025-L5149-A1 Mean launch power -15dBm . -8dBm -5dBm . 0dBm -5dBm . 0dBm 0dBm . 4dBm
4.1.10.7
Result Record: Slot Mean launch Power in dBm Port1 Port2 Port3 Port4 Complied Complied Not Complied Not Complied Comply with table above
4.1.10.8
0.1 hour
4.1.11
4.1.11.1

Test Purpose:
The test verifies that the optical mean launched power of STM-4 port is within specification. The specification is based on the recommendations ITU-T G.957.
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4.1.11.3
Test diagram:
4.1.11.4
Optical power meter

1. 2.
4.1.11.6
Expected Result: SFP Type 1310 nm short haul 1310 nm long haul 1550 nm long haul 1550 nm long haul ITU S4.1 L4.1 L4.2 V4.2 Order number S42025-L5132A1 S42025-L5131A1 S42025-L5130A1 S42025-L5148A1 Mean launch power -15dBm . -8dBm -3dBm . 2dBm -3dBm . 2dBm 0dBm . 4dBm
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4.1.11.7
4.1.11.8
0.1 hour
4.1.12
4.1.12.1

Test Purpose:
The test verifies that the optical mean launched power of STM-16 port is within specification. The specification is based on the recommendations ITU-T G.957.
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4.1.12.3
Test diagram:
4.1.12.4
Optical power meter

1. 2.
4.1.12.6
Expected Result: SFP Type 1310 nm short haul 1310 nm long haul 1550 nm long haul 1550 nm long haul 1550 nm long haul ITU S16.1 L16.1 L16.2 V16.2 U16.2 Order number S42025-L5129A1 S42025-L5128A1 S42025-L5127A1 S42025-L5141A1 S42025-L5142A1 Mean launch power -5dBm . 0dBm -2dBm . 3dBm -2dBm . 3dBm -2dBm . 3dBm -2dBm . 3dBm
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4.1.12.7
4.1.12.8
0.1 hour
4.1.13
4.1.13.1
STM-1 Optical Receive Power

Test Purpose:
The test verifies that the optical receive power of STM1 port is within specification. The specification is based on the recommendations ITU-T G.957.
Connect STM-1 optical input to the optical power meter.
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4.1.13.3
Test diagram:
4.1.13.4
Optical power meter

1. 2.
4.1.13.6
Disable Auto laser shutdown function of the appropriate STM-1 port on the remote station; Record value of optical receive power in the table below.
Expected Result: SFP Type 1310 nm short haul 1310 nm long haul ITU S1.1 L1.1 Order number S42025-L5135A1 S42025-L5134A1 Receiving power -28dBm . -8dBm -34dBm . -10dBm
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SFP Type 1550 nm long haul 1550 nm long haul
ITU L1.2 V1.2
Order number S42025-L5133A1 S42025-L5149-A1
Receiving power -34dBm . -10dBm -34dBm . -10dBm
4.1.13.7
Expected Result: Slot Receive Power in dBm Port1 Port2 Port3 Port4 omplied C Complied Not Complied Not Complied Comply with table above
4.1.13.8
0.1 hour
4.1.14
4.1.14.1

Test Purpose:
The test verifies that the optical receive power of STM-4 port is within specification. The specification is based on the recommendations ITU-T G.957.
Connect STM-4 optical input to optical power meter.
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4.1.14.3
Test diagram:
4.1.14.4
Optical power meter

1. 2.
4.1.14.6
Expected Result: SFP Type 1310 nm short haul 1310 nm long haul 1550 nm long haul 1550 nm long haul ITU S4.1 L4.1 L4.2 V4.2 Order number S42025-L5132A1 S42025-L5131A1 S42025-L5130A1 S42025-L5148A1 Receiving power
PC/Lapto
-28dBm . -8dBm -28dBm . -8dBm -28dBm . -8dBm -34dBm . -18dBm
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4.1.14.7
Result Record: Slot Receive Power in dBm Port1 Port2 Port3 Port4 Complied Complied Not Complied Not Complied Comply with table above
4.1.14.8
0.1 hour
4.1.15
4.1.15.1

Test Purpose:
The test verifies that the optical receive power of STM-16 port is within specification. The specification is based on the recommendations ITU-T G.957.
Connect STM-16 optical input to optical power meter.
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4.1.15.3
Test diagram:
4.1.15.4
Optical power meter

1. 2.
4.1.15.6
Expected Result: SFP Type 1310 nm short haul 1310 nm long haul 1550 nm long haul 1550 nm long haul 1550 nm long haul ITU S16.1 L16.1 L16.2 V16.2 U16.2 Order number S42025-L5129A1 S42025-L5128A1 S42025-L5127A1 S42025-L5141A1 S42025-L5142A1 Receiving power
PC/Lapto
-18dBm . 0dBm -27dBm . -9dBm -28dBm . -9dBm -28dBm . -9dBm -28dBm . -9dBm
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4.1.15.7
Result Record: Slot Receive Power in dBm Port1 Port2 Port3 Port4 Complied Complied Not Complied Not Complied Comply with table above
4.1.15.8
0.1 hour
4.1.16
4.1.16.1
BOA Transmit Power

Test Purpose:
The test verifies that the BOA card transmit power.

Connect one optical card Tx into BOA Rx. If necessary, add an adjustable attenuator to make the received optical power of BOA card in the allowed range.
Optical power meter Tx

BOA
Rx Attenuator Tx
Line card
Local station
4.1.16.4
Optical power meter
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4.1.16.5
Test procedure:
1. 2.
Disable Auto laser shutdown function of the appropriate optical port on the local station; Adjust the attenuator to make the received optical power of BOA is in range. About input optical power range, please refer to the table list below:
BOA Type 13dBm BOA 15dBm BOA 18dBm BOA Optical power range -10dBm . 3dBm -10dBm . 3dBm -10dBm . 3dBm
3.
4.1.16.6
Record values of BOA launch power.
Expected Result: BOA Type 13dBm BOA 15dBm BOA 18dBm BOA Order number S42024-L5465-A1 S42024-L5466-A1 S42024-L5467-A1 launch power 13dBm 15dBm 18dBm
4.1.16.7
Result Record: BOA Type 13dBm BOA 15dBm BOA 18dBm BOA launch power
4.1.16.8
0.1 hour
4.1.17
4.1.17.1
POA Transmit Power

Test Purpose:
The test verifies that the POA card transmit power.
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4.1.17.2
Test setup:
Connect one optical card Tx into POA Rx. If necessary, add an adjustable attenuator to make the received optical power of POA card in the allowed range.
Optical power meter Tx

POA
Rx Attenuator Tx
Line card
Local station
4.1.17.4
Optical power meter

4. 5.
Disable Auto laser shutdown function of the appropriate optical port on the local station; Adjust the attenuator to make the received optical power of BOA is in range. About input optical power range, please refer to the table list below:
POA Type 20dB POA Optical power range -35dBm . -15dBm
6.
4.1.17.6
Record values of POA launch power.
Expected Result: BOA Type 20dB POA Order number S42024-L5468-A1 launch power -15dBm . 5dBm
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4.1.17.7
Result Record: POA Type 20dB POA launch power
4.1.18
4.1.18.1
Ethernet Performance Test RFC2544 test for 8xFE/T

Test Purpose:
This test gives the steps required to measure the Ethernet performance of the 8xFE/T card of hiT 7035.
Connect the port1 and port2 of Data analyzer to port1 and port2 of FE card on local station.
4.1.18.4
Data Analyzer
Set up a 100M Ethernet traffic according to the test diagram, the step is as followed: 1. 2. 3. Create 46 VC12 cross-connection from Ethernet card FE port1 to CC_LC1 port. Create 46 VC12 cross-connection from Ethernet card FE port2 to CC_LC2 port Use fiber to connect CC_LC1 port and CC_LC2 port.
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4. 5.
4.1.18.6
Confirm the traffic can transfer along FE1(local)CC_LC1 port(local) CC_LC2 port(local)FE2(local), and the reverse direction is as well. Run the Data analyzer to measure the RFC2544.
Reference Result:
Throughput:
Frame Size 64 128 256 512 1024 1280 1518 1522 1536 Initial rate: 100 % Passed Rate (%) 100 100 100 100 100 100 100 100 100 P1 to P2(pks /sec) 148810 84459 45290 23496 11973 9615 8127 8106 8033 Number of trials: 1 Maximum rate: 100 % Total 148810 84459 45290 23496 11973 9615 8127 8106 8033
Test duration (sec): 10
Back-to-Back:
Frame Size 64 128 256 512 1024 1280 1518 1522 1536 Initial rate: 100 % Passed Rate (%) 100 100 100 100 100 100 100 100 100 P1 to P2(Frames) 1488100 844590 452900 234960 119730 96150 81270 81060 80330 Number of trials: 1 Maximum rate: 100 % Total 1488100 844590 452900 234960 119730 96150 81270 81060 80330
40 (72)
Latency
Frame Size 64 128 256 512 1024 1280 1518 1522 1536 Initial rate: 100 % Rate Tested (%) 100 100 100 100 100 100 100 100 100 P1 to P2(us)-S&F 526.2 532.0 541.3 564.5 606.4 625.0 640.7 641.5 641.9 Number of pairs: 1 Maximum rate: 100 % Average 526.2 532.0 541.3 564.5 606.4 625.0 640.7 641.5 641.9
Frame Packet Loss:

Frame Size 64 128 256 512 1024 1280 1518 1522 1536 Rate Tested (%) 100 100 100 100 100 100 100 100 100 P1 to P2 (%) 0.000 0.000 0.000 0.000 0.000 0.000 0.000 0.000 0.000 Average 0.000 0.000 0.000 0.000 0.000 0.000 0.000 0.000 0.000
Test duration (sec): 10 Initial rate:100 %
Number of trials: 1 Maximum rate: 100 %
41 (72)
4.1.18.7
Result Record:
Throughput:
Frame Size 64 128 256 512 1024 1280 1518 1522 1536 Test duration (sec): 10 Initial rate: 100.00% Resolution rate: 1.00% Passed Rate(%) P1 to P2 (pks/sec) Total Comply with table above Complied Complied Complied Complied Complied Complied Complied Complied Complied Number of trials: 1 Maximum rate: 100.00% Not Complied Not Complied Not Complied Not Complied Not Complied Not Complied Not Complied Not Complied Not Complied
Back-to-Back:
Frame Size 64 128 256 512 1024 1280 1518 1522 1536 Test duration (sec): 10 Initial rate: 100.00% Resolution rate: 1.00% Passed Rate(%) P1 to P2 (Frames) Total Comply with table above Complied Complied Complied Complied Complied Complied Complied Complied Complied Number of trials: 1 Maximum rate: 100.00% Not Complied Not Complied Not Complied Not Complied Not Complied Not Complied Not Complied Not Complied Not Complied
42 (72)
Latency
Frame Size 64 128 256 512 1024 1280 1518 1522 1536 Test duration (sec): 10 Initial rate: 100 % Number of trials: 1 Maximum rate: 100 % Rate Tested (%) P1 to P2(us)S&F Average Comply with table above Complied Complied Complied Complied Complied Complied Complied Complied Complied Not Complied Not Complied Not Complied Not Complied Not Complied Not Complied Not Complied Not Complied Not Complied
Frame Packet Loss:

Frame Size 64 128 256 512 1024 1280 1518 1522 1536 Test duration (sec): 10 Initial rate: 100% 4.1.18.8 Estimated Time consumption Rate Tested (%) P1 to P2 (%) Average Comply with table above Complied Complied Complied Complied Complied Complied Complied Complied Complied Not Complied Not Complied Not Complied Not Complied Not Complied Not Complied Not Complied Not Complied Not Complied
Number of trials: 1 Maximum rate: 100%
4 hours
43 (72)
4.1.19
4.1.19.1
Ethernet Performance Test RFC2544 test for 8xFE/L2

Test Purpose:
This test gives the steps required to measure the Ethernet performance of the 8xFE/L2 card of hiT 7035.
Connect the port1 and port2 of Data analyzer to port1 and port2 of FE card on local station.
4.1.19.4
Data Analyzer
Set up a 100M Ethernet traffic according to the test diagram, the step is as followed: 1. 2. 3. 4. 5. 6. Configure both 8FE/L2 cards work on DoubleTag mode. Configure LAN1 and LAN2 work on detag mode. Configure WAN1 and WAN2 work on detag mode. Configure both LAN1 and WAN1 with the same PVID such as 11, and in the same VLAN list 11. Configure both LAN2 and WAN2 with the same PVID such as 22, and in the same VLAN list 22. Create 46 VC12 cross-connection from Ethernet card WAN1 to CC_LC1 port.
44 (72)
7. 8. 9. 10.
4.1.19.6
Create 46 VC12 cross-connection from Ethernet card WAN2 to CC_LC2 port. Use fiber to connect CC_LC1 port and CC_LC2 port Confirm the traffic can transfer along FE1(local)CC_LC1 port(local) CC_LC2 port(local)FE2(local), and the reverse direction is as well. Run the Data analyzer to measure the RFC2544.
Reference Result:
Throughput:
Frame Size 64 128 256 512 1024 1280 1518 1522 1536 Initial rate: 100 % Passed Rate (%) 100 100 100 100 100 100 100 100 100 P1 to P2(pks /sec) 148810 84459 45290 23496 11973 9615 8127 8106 8033 Number of trials: 1 Maximum rate: 100 % Total 148810 84459 45290 23496 11973 9615 8127 8106 8033
Back-to-Back:
Frame Size 64 128 256 512 1024 1280 1518 1522 1536 Initial rate: 100 % Passed Rate (%) 100 100 100 100 100 100 100 100 100 P1 to P2(Frames) 1488100 844590 452900 234960 119730 96150 81270 81060 80330 Number of trials: 1 Maximum rate: 100 % Total 1488100 844590 452900 234960 119730 96150 81270 81060 80330
45 (72)
Latency
Frame Packet Loss:

Test duration (sec): 10 Initial rate:100 %
46 (72)
4.1.19.7
Result Record:
Throughput:
Throughput:
47 (72)
Latency
Frame Packet Loss:

4 hours
48 (72)
4.1.20
4.1.20.1
Ethernet Performance Test RFC2544 Test for 1xGE/T

Test Purpose:
This test gives the steps required to measure the Ethernet performance of the GE card (1xGE/T) of hiT 7035.
1. Connect the GE1 port of Data analyzer to GE card1 on local station. 2. Connect the GE2 port of Data analyzer to GE card2 on local station. 3. Use fiber to connect the line card ports. If necessary, use a attenuator.
4.1.20.4
Data Analyzer
Set up a GE Ethernet traffic according to the test diagram, the step is as followed: 1. 2. 3. 4. Create 4 VC4 cross-connection from GE card1 port to CC_LC1 port. Create 4 VC4 cross-connection from GE card2 port to CC_LC2 port. Use fiber to connect CC_LC1 port and CC_LC2 port. Configure the local station Ethernet card , then we can confirm the traffic can transfer along GE(local)CC_LC1 port(local)CC_LC2 port(local) GE(local). Run the Data analyzer to measure the RFC2544.
5.
49 (72)
4.1.20.6
Reference Result:
Throughput:
Frame Size 64 128 256 512 1024 1280 1518 1522 1536 Initial rate: 50 % Passed Rate (%) 68.85 64.91 62.44 61.29 60.63 59.96 59.98 60.00 59.43 P1 to P2(pks /sec) 1024590 548246 282805 144009 72590 57657 48752 48638 47746 Number of trials: 1 Maximum rate: 70 % Total 1024590 548246 282805 144009 72590 57657 48752 48638 47746
Back-to-Back:
Frame Size 64 128 256 512 1024 1280 1518 1522 1536 Initial rate: 100 % Passed Rate (%) 100.00 100.00 100.00 100.00 100.00 100.00 100.00 100.00 100.00 P1 to P2(Frames) 29061 16493 9946 5161 2336 1874 1583 1582 1565 Number of trials: 1 Maximum rate: 100 % Total 29061 16493 9946 5161 2336 1874 1583 1582 1565
50 (72)
Latency
Frame Packet Loss:

Test duration (sec): 10 Initial rate: 60 %
51 (72)
4.1.20.7
Result Record:
Throughput:
Back-to-Back:
52 (72)
Latency
Frame Packet Loss:

4 hours
53 (72)
4.1.21
4.1.21.1
IMA Function Test

Test Purpose:
The test verifies that the IMA basic function.

Connect the ATM analyzer 155M optical port to IMA IO port 1. Use fiber to loop the line card such as STM-1 port. Notes: Please restart the correlative IMA group, after the loop is removed.
4.1.21.4
ATM analyzer
1. 2.
Assign an IMA group with 8 links. Create a point to point VP/VC connection between IMA group and IMA uplink. Such as IMA group related VPI/VCI is 255/300; IMA uplink related VPI/VCI is 255/400 Create VC-12 cross connections between the IMA group related 8 IMA E1 ports and line card stm-1 port. Set up an ATM stream with VPI/VCI 255/400 on ATM analyzer, and run with 16M bandwidth.
3. 4.
54 (72)
4.1.21.6
Expected Result:
Traffic is error free.

4.1.21.7 Result Record: Complied Not Complied
4.1.21.8
30minutes
4.2
Network Test
4.2.1
4.2.1.1
Bit Error Test on E1 (12h)

Test Purpose:
This test gives the steps required to measure the line between two terminal NEs. The following item will be tested: Bit error measurement of E1 (12hours)
4.2.1.2 Test Setup:
1. 2.
Connect SDH/PDH Analyzer with hiT7035 E1 port on Local station; Loop E1 port with external cable on remote station.
55 (72)
4.2.1.3
Test diagram:
PC/Laptop com puter
Q-F
Remote Station
NE
NE
L i n e
Local Station
L i n e
L i n e
Remote Station
L i n e
E1
E1
DDF
DDF
SDH Analyser
4.2.1.4
SDH/PDH Analyzer
1.
Create a VC12 level cross-connection from an appropriate E1 port to the Line side on local station and remote station. A chain of more than one Multiplex-section in line- or ring configuration is possible; Do a bit error-measurement with the SDH/PDH analyzer and perform a bit error-measurement with an injected payload of 2MBit/s during 12h (PRBS15).
2.
4.2.1.6
Expected Result
Error free.
4.2.1.7 Result Record Complied 4.2.1.8 Not Complied
13 hours
56 (72)
4.2.2
4.2.2.1
Bit Error Test on E3 (12h)

Test Purpose:
This test gives the steps required to measure the line between two terminal NEs. The following item will be tested: Bit error measurement of E3 (12hours)
4.2.2.2 Test Setup:
1. 2.
4.2.2.3
Connect SDH/PDH Analyzer with hiT7035 E3 port on Local station; Loop E3 port with external cable on remote station.
Test diagram:
PC/Laptop com puter
Q-F
Remote Station
NE
NE
L i n e
Local Station
L i n e
L i n e
Remote Station
L i n e
E3
E3
DDF
DDF
SDH Analyser
4.2.2.4
SDH/PDH Analyzer
1.
Create a VC3 level cross-connection from an appropriate E3 port to the Line side on local station and remote station. A chain of more than one Multiplex-section in line- or ring configuration is possible; Do a bit error-measurement with the SDH/PDH analyzer and perform a bit error-measurement with an injected payload of 34MBit/s during 12h (PRBS23).
2.
57 (72)
4.2.2.6
Expected Result
Error free.
13 hours
4.2.3
4.2.3.1
Bit Error Test on DS3 (12h)

Test Purpose:
This test gives the steps required to measure the line between two terminal NEs. The following item will be tested: Bit error measurement of DS3 (12hours)
4.2.3.2 Test Setup:
1. 2.
Connect SDH/PDH Analyzer with hiT7035 DS3 port on Local station; Loop DS3 port with external cable on remote station.
58 (72)
4.2.3.3
Test diagram:
PC/Laptop com puter
Q-F
Remote Station
NE
NE
L i n e
Local Station
L i n e
L i n e
Remote Station
L i n e
DS 3
DS 3
DDF
DDF
SDH Analyser
4.2.3.4
SDH/PDH Analyzer
1.
Create a VC3 level cross-connection from an appropriate DS3 port to the Line side on local station and remote station. A chain of more than one Multiplex-section in line- or ring configuration is possible; Do a bit error-measurement with the SDH/PDH analyzer and perform a bit error-measurement with an injected payload of 45MBit/s during 12h (PRBS15).
2.
4.2.3.6
Expected Result
Error free.
13 hours
59 (72)
4.2.4
4.2.4.1
Bit Error Test on Line Side (12h, STM-1 trib)

Test Purpose:
This test gives the steps required to measure the line between two terminal NEs. The following item will be tested: Bit error measurement of line side (12hours, measured via STM-1trib)
4.2.4.2 Test Setup:
1. 2.
4.2.4.3
Connect SDH/PDH Analyzer with hiT7035 STM1 port on Local station; Loop STM1 port with external fiber on remote station.
Test diagram:
PC/Laptop computer
Q-F
Rem Station ote

NE
NE
L i n e
Local Station
L i n e
L i n e
Rem Station ote
L i n e
STM - 1
STM - 1
DDF
SDH Analyser
4.2.4.4
SDH/PDH Analyzer
1.
Create a VC4 level cross-connection from an appropriate STM-1 port to the Line side on local station and remote station. A chain of more than one Multiplex-section in line- or ring configuration is possible; Do a bit error-measurement with the SDH/PDH analyzer and perform a bit error-measurement with an injected payload of 140MBit/s during 12h (PRBS23).
2.
60 (72)
4.2.4.6
Expected Result
Error free.
13 hours
4.2.5
4.2.5.1
Bit Error Test on Line Side (12h, STM-1E trib)

Test Purpose:
This test gives the steps required to measure the line between two terminal NEs. The following item will be tested: Bit error measurement of line side (12hours, measured via STM-1E trib)
4.2.5.2 Test Setup:
1. 2.
Connect SDH/PDH Analyzer with hiT7035 STM1E port on Local station; Loop STM1E port with external cable on remote station.
61 (72)
4.2.5.3
Test diagram:
PC/Laptop com puter
Q-F
Remote Station
NE
NE
L i n e
Local Station
L i n e
L i n e
Remote Station
L i n e
STM - 1E
STM - 1E
DDF
DDF
SDH Analyser
4.2.5.4
SDH/PDH Analyzer
1.
Create a VC4 level cross-connection from an appropriate STM-1E port to the Line side on local station and remote station. A chain of more than one Multiplex-section in line- or ring configuration is possible; Do a bit error-measurement with the SDH/PDH analyzer and perform a bit error-measurement with an injected payload of 140MBit/s during 12h (PRBS23).
2.
4.2.5.6
Expected Result
Error free.
13 hours
62 (72)
4.2.6
4.2.6.1

Test Purpose:
This test gives the steps required to measure the line between two terminal NEs. The following item will be tested: Bit error measurement of line side (12hours, measured via STM-4 trib)
4.2.6.2 Test Setup:
1. 2.
4.2.6.3
Connect SDH/PDH Analyzer with hiT7035 STM4 port on Local station; Loop STM4 port with external fiber on remote station.
Test diagram:
PC/Laptop com puter
Q-F
Rem Station ote

NE
NE
L i n e
Local Station
L i n e
L i n e
Rem Station ote
L i n e
STM - 4
STM - 4
ODF
SDH Analyser
4.2.6.4
SDH/PDH Analyzer
1.
Create a VC4 level cross-connection from an appropriate STM-4 port to the Line side on local station and remote station. A chain of more than one Multiplex-section in line- or ring configuration is possible;
63 (72)
2.
Do a bit error-measurement with the SDH/PDH analyzer and perform a bit error-measurement with an injected payload of 140MBit/s during 12h (PRBS23).
4.2.6.6
Expected Result
Error free.
13 hours
4.2.7
4.2.7.1

Test Purpose:
This test gives the steps required to measure the line between two terminal NEs. The following item will be tested: Bit error measurement of line side (12hours, measured via STM-16 trib)
4.2.7.2 Test Setup:
1. 2.
Connect SDH/PDH Analyzer with hiT7035 STM-16 port on Local station; Loop STM-16 port with external fiber on remote station, if necessary add a 10dB attenuator when loop the STM-16 port.
64 (72)
4.2.7.3
Test diagram:
PC/Laptop com puter
Q-F
Remote Station
NE
NE
L i n e
Local Station
L i n e
L i n e
Remote Station
L i n e
STM - 16
STM - 16
ODF
SDH Analyser
4.2.7.4
SDH/PDH Analyzer
1.
Create a VC4 level cross-connection from an appropriate STM-16 port to the Line side on local station and remote station. A chain of more than one Multiplex-section in line- or ring configuration is possible; Do a bit error-measurement with the SDH/PDH analyzer and perform a bit error-measurement with an injected payload of 140MBit/s during 12h (PRBS23).
2.
4.2.7.6
Expected Result
Error free.
13 hours
65 (72)
4.2.8
4.2.8.1
Packet Loss Test on Ethernet Card (12h, 8xFE/T)

Test Purpose:
This test gives the steps required to measure the line between two terminal NEs. The following item will be tested: Packet Loss measurement of line side (12hours, measured via 8xFE/T)
4.2.8.2 Test Setup:
Connect Data Analyzer port1 and port2 with hiT 7035 8xFE/T card FE port1 and port2 on Local station.
PC/Laptop com puter
MGMT Port
R ote Station em
NE
NE
L i n e
Local Station
L i n e
L i n e
R emote Station
L i n e
FE1
FE2
FE1
FE2
Data Analyzer
4.2.8.4
Data Analyzer
1. 2.
Create two VC12-46v cross-connection from an appropriate 8xFE/T card to the Line side on local station and remote station; Confirm the traffic can transfer along FE1(local)STM-N port1(local)STM-N port1(remote)FE1(Remote) FE2(Remote) STM-N port1(remote) STM-N port1(local) FE2(local).
66 (72)
3.
Do a packet loss measurement on the Data analyzers and perform a packet loss measurement with 90MBit/s signal during 12h (Packet length is 64Byte).
4.2.8.6
Expected Result
No Packet Loss
4.2.8.7 Result Record Complied 4.2.8.8 Estimated Time consumption Not Complied
13 hours
4.2.9
4.2.9.1
Packet Loss Test on Ethernet Card (12h, 8xFE/L2)

Test Purpose:
This test gives the steps required to measure the line between two terminal NEs. The following item will be tested: Packet Loss measurement of line side (12hours, measured via 8xFE/L2)
4.2.9.2 Test Setup:
Connect Data Analyzer port1 and port2 with hiT 7035 8xFE/L2 card FE port1 and port2 on Local station.
67 (72)
4.2.9.3
Test diagram:
PC/Laptop com puter
MGMT Port
R ote Station em
NE
NE
L i n e
Local Station
L i n e
L i n e
R emote Station
L i n e
FE1
FE2
FE1
FE2
Data Analyzer
4.2.9.4
Data Analyzer
1. 2. 3. 4. 5. 6. 7.
Configure 8FE/L2 cards work on DoubleTag mode. Configure LAN1 and LAN2 work on detag mode. Configure WAN1 and WAN2 work on detag mode. Configure both LAN1 and WAN1 with the same PVID such as 11, and both LAN1 and WAN1 are in the same VLAN list such as 11. Configure both LAN2 and WAN2 with the same PVID such as 22, and both LAN2 and WAN2 are in the same VLAN list such as 22. Create two VC12-46v cross-connection from WAN1 to CC_LC1 and WAN2 to CC_LC2 on local station and remote station; Confirm the traffic can transfer along FE1(local)CC_LC1 port(local) CC_LC1 port(remote)FE1(Remote) FE2(Remote) CC_LC2 port(remote) CC_LC1 port(local) FE2(local). Do a packet loss measurement on the Data analyzers and perform a packet loss measurement with 90MBit/s signal during 12h (Packet length is 64Byte).
8.
68 (72)
4.2.9.6
Expected Result
No Packet Loss
13 hours
4.2.10
4.2.10.1
Packet Loss Test on Ethernet Card (12h, 1xGE/T Card)

Test Purpose:
This test gives the steps required to measure the line between two terminal NEs. The following item will be tested: Packet Loss measurement of line side (12hours, measured via 1GE/T)
4.2.10.2 Test Setup:
1. 2.
Connect Data Analyzer with hiT 7035 GE card GE port on Local station. Use fiber to loop the GE port on remote station. If necessary.
69 (72)
4.2.10.3
Test diagram:
PC /Laptop com puter
M M Port G T N E
NE
L i n e
Local Station
L i n e
L i n e
Remote Station
L i n e
GE
G E
D Analyzer ata
4.2.10.4
Data Analyzer
1. 2. 3.
Create a VC4-4v cross-connection from an appropriate 1xGE/T card to the Line side on local station and remote station; Confirm the traffic can transfer along GE(local)STM-N port1(local)STM-N port1(remote)GE(local)loopback. Do a packet loss measurement on the Data analyzers and perform a packet loss measurement with 540MBit/s signal during 12h (Packet length is 64Byte).
4.2.10.6
Expected Result
No Packet Loss
13 hours
70 (72)
Abbreviations
Abbreviations
ACO Bw7R CD-ROM DB DC DCC EGB EMC EN EOW ESD ETS ETSI F FAULT FO GMT GND GUI GUIMN HS HW IEC LCAS LCT LED LWL MSP NCT NUBAT OK OSN Alarm Cut Off Style 7R Compact Disc Read Only Memory Data Base Direct Current Data Communication Channel Elektrostatisch Gefhrdete Bauteile Electromagnetic Compatibility European Standard Engineering Order Wire Electrostatic Sensitive Device European Telecommunication Standard European Telecommunications Standards Institute Standardized interface for connection of a local terminal Fault Alarm LED Fiber Optic Greenwich Mean Time Ground Graphical User Interface Graphical User Interface Manual Handset Hardware International Electrotechnical Commission Link Capacity Adjustment Scheme Local Craft Terminal Light Emitting Diode Lichtwellenleiter (optical fiber) Multiplex Section Protection Network Craft Terminal Negative Power Supply Voltage Service LED Optical Service Node
71 (72)
Abbreviations
PDF PE PPP PUBAT RAM Rx SDI SEC SELV SFP SNCP SW T3 T4 TIF TNMS Tx UMN VCDB
Portable Document Format Protective Earth (Ground) Point to Point Protocol Positive Power Supply Voltage Random Access Memory Received signal Serial Debug Interface SDH Equipment Clock Separate Extra-Low Voltage Small Form Factor Pluggable (Module) Sub-Network Connection Protection Software Clock input Clock output Telemetry Interface Telecommunication Network Management System Transmitted signal User Manual Variable Configuration Data Block
72 (72)

SURPASS HiT7035 R4.2 Acceptance Test Manual

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SURPASS HiT7035 R4.2 Acceptance Test Manual

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SURPASS hiT 7025 4.

Nokia Siemens Networks

Fehler! Formatvorlage nicht definiert.

Product code P42022-A5248-H420 Issue 2.0

Nokia Siemens Networks

Fehler! Formatvorlage nicht definiert.

Certificate of Customer Acceptance

Nokia Siemens Networks

Product code P42022-A5248-H420 Issue 4.0

Product code P42022-A5248-H420 Issue 2.0

Nokia Siemens Networks

Fehler! Formatvorlage nicht definiert.

Nokia Siemens Networks

Product code P42022-A5248-H420 Issue 4.0

Product code P42022-A5248-H420 Issue 2.0

Nokia Siemens Networks

Fehler! Formatvorlage nicht definiert.

Nokia Siemens Networks

Product code P42022-A5248-H420 Issue 4.0

Fehler! Formatvorlage nicht definiert.

Circuit Pack List of hiT7035

Product code P42022-A5248-H420 Issue 2.0

Nokia Siemens Networks

Fehler! Formatvorlage nicht definiert.

Slot name IO2 IO3 IO4 IO5 IO6 IO7 ST-CLK

Load number of hiT7035 and hiT7035 LCT

Tools and Test Equipment List

Nokia Siemens Networks

Product code P42022-A5248-H420 Issue 4.0

Fehler! Formatvorlage nicht definiert.

Product code P42022-A5248-H420 Issue 2.0

Nokia Siemens Networks

Fehler! Formatvorlage nicht definiert.

Test result Pass Fail

Nokia Siemens Networks

Product code P42022-A5248-H420 Issue 4.0

Fehler! Formatvorlage nicht definiert.

Acceptance test procedure

Test of Battery Voltage

Product code P42022-A5248-H420 Issue 2.0

Nokia Siemens Networks

Fehler! Formatvorlage nicht definiert.

Estimated Time consumption

Check of the Management port

This test checks that the Management port is working correctly.

Nokia Siemens Networks

Product code P42022-A5248-H420 Issue 4.0

Fehler! Formatvorlage nicht definiert.

NE can be operated via LCT

Function Test of User Channel (F1)

This procedure tests that User-Channel (F1) is working correctly.

EOW Port Nokia Siemens Networks o o p w

Fehler! Formatvorlage nicht definiert.

w Function Test of EOW channels Test Purpose: i t h J 4 5

Fehler! Formatvorlage nicht definiert.

7035 Local Station

7035 Remote Station

Communication can be established.

Estimated Time consumption

Function Test of MDI/MDO

This procedure tests that MDI/MDO function of NE is working correctly.

Product code P42022-A5248-H420 Issue 2.0

Nokia Siemens Networks