<<GenRad 228x debug technique>>

*Be careful not to reverse--bias polarized capacitors.

*Use the SWAP command only on non--polarized capacitors.
*Use the RER=NN Debug command to determine the stability of the test.
*Use the SURROUND command to obtain a list of surrounding components.
*Guarding components connected to the source side of the measurement usually
produces
desired results. Guarding components on the measure side usually makes things
worse. This is not always the case, so try as many combinations as possible.
*If changing guard points does not improve stability, try switching from a CS to a
CP
The diode forward voltage value defaults to 650 mV and the dynamic resistance
defaults to 20 ohms unless you specify a different value in the diode circuit
description files.
The SWAP and GUARD commands permit you to easily swap the source and
measure nodes
and modify the guard node list for 4--terminal tests. SWAP swaps the Channel A
(Source node) and Channel B (Measure node) nail lists and removes any guard
nails. Use the GUARD command to easily add guard nails to the Channel C and
GND channels.

The + character is an indicator to the Run--Time System (RTS) that the specified
nail or nails are to be added to the current list of nails. Using this character is a
shorthand method of adding nails and nodes to an existing list without having to
enter all the nails. The RTS also accepts the minus (--) character as a shorthand
method of specifying that the nails or nodes are to be removed from an existing
list.
Channel A (Source node), Channel B (Measure node), Channel C/D guard.
Use the GUARD command to easily add guard nails to the Channel C and GND
channels.
Use SWAP swaps the Channel A (Source node) and Channel B (Measure node)
nail lists and removes any guard nails.
To display the test program statements that correspond to the steps of
the digital display, type:
UNTRA
These test statements display:
1: IC(66,11) IL(66,11) OS(7) OH(7);
2: IH(11);
3: IH(66) OL(7);
4: IL(11);
DEBUG]>
To rerun the burst n times, you can type the following at the Debug prompt:
RER=n
Correct statement 4 by typing the following debug command:
4 OH(7)
Debug command:
Rer n,
rerun
Ctrl+z, abrot
Ctrl+e
ABSOLUTE,

ACCEPT

Force

PU, PD, PB, and PN

ALLFAULT
ALLFAULT [[/DELAY=msecs] | [/MAXDLY=msecs]] [/FULL] [/OR_BIDIR]
[/DIAG][/APPEND] [/NOBUS] [/NODIGF]
[/NORERUN] [RERUNS=nn] [/SHOWRERUNS][/NOFAULT]
[/NODIAG][file_name]

FAULT
[/PIN=pnum,pnum...][/ALL][/DEVICE=component name] [DELAY=msecs][/OR_BIDIR]
[/DIAG] [/NOAPPEND] [/NOFAULT] [/NODIAG] [file-name]

ARITH

ASSIGN LGC

BSDEBUG

BURST
BURST = ntimes

BUSTEST

BUSUNTRA
CALLS

CANCEL

CHECKPOINT = number
CHECKPOINT = number

CLOCK
CLOCK [TSn]

COF
Takes all subsequent bursts out of SOF (stop--on--failure) mode

COMPONENT
COMPONENT = name

CONTACT
FREE
This command prints to the MESfile a list of nails that are not being used in the
current test and
that do not cause mux conflicts with any nails in the current test. The FREE nail
command,

HD (Hold)
HD (nail[s])
Allows the specified nails to remain in their last assigned runtime state.
MONITOR

NAIL
NAIL = nail number

NN

NODE
NODE = nodename

NOS

OL (Output Low)
OL (nail[s])

OH (Output High)
OH (nail[s])
Example:
OH(78,89)
Makes the expected output state high for the specified nail(s).

OPENS
The TEST OPENS statement checks to make sure that all nails in the specified nail
list are shorted together, that is, the impedance between the nails must be less
than the value pecified
by R=. A failure is reported if any of the nails in the list are not shorted.

OS (Output Sense)
OS (nail[s])
PROBE
PROBE = name

PS
! 7 volts at 15 amps
! 20 volts at 8 amps
! 60 volts at 2.5 amps
GR228X software allows the programmer to control them using high level SET PS,
TEST PS,
MEAS PS, and CLEAR PS programming statements.

PWRCHK
The PWRCHK test measures the voltage on the power nodes at the beginning of
test execution to make sure the voltage is less than 200 mV. If the measured
voltage is greater than 200 mV, the RTS branches to the end of the program and
asks you to make sure UUT voltages are discharged properly before testing
begins. Executing analog tests with voltages above 200 mV may cause damage to
the tester’s scanner relays.

RESET
Causes the test program to halt, and returns the system to the Reset or Waiting--
for--Start state.
Press the Reset key for the same effect. Unlike the MONITOR and ABORT
commands, this
command does not return you to the monitor.
SHORTS
The TEST SHORTS statement checks to make sure that all nails in the specified
nail list are not shorted together; the impedance between the nails must be
greater than the value specified by R=. A failure is reported if any of the nails in
the list are shorted.
SIC Command
(Single Input Connect)
25 SIC 93<RET> connects nail 93 at step 25 and disconnect it at step 26:
SID Command
(Single Input Disconnect)
SIH Command
(Single Input High)
SIL Command
(Single Input Low)
SHD Command
(Single Hold)
SOH Command
(Single Output High)
SOL Command
(Single Output Low)

SOI Command
(Single Output Ignore)
SOS Command
(Single Output Sense)
SOF Command
(Stop--On--Fail)

STM
The STM commands allow you to control and monitor the various devices on the
system’s self
test module.

SURROUND
SURROUND nail#
Prints the names of all the components connected to the specified nail and lists
the nails connected to the other pins of the components. For example, if nail 5
connects to U31 pin 1 and U12 pin 2, nail 2 connects to U31 pin 2, and so on, the
following command prints a message that lists the U31--1 and U12--2 connections
to pin 5, and so on.
DEBUG]> SUR = 5

SWAP
SYNC

TIME

UNTRANSLATE
Changes the display from digital debug timing display to the burst display. The
Untranslate mode allows you to make changes to any of the digital test
statements.

WD
WD [UP,DOWN,LEFT,RIGHT,PRINT,PRIALL,<test step>]