Professional Documents
Culture Documents
Manufacturer
DIN EN ISO/IEC 17025 Calibration lab accredited for certified mass per unit area stan-
dards
© 2016 by Helmut Fischer GmbH Institut für Elektronik und Messtechnik, Germany.
This operator’s manual remains the copyrighted property of Helmut Fischer GmbH. All rights
reserved. This manual may not be reproduced by any means (print, photocopy, microfilm or any
other method) in full or in part, or processed, multiplied or distributed to third parties by electronic
means without the written consent of Helmut Fischer GmbH.
Subject to correction and technical changes.
FISCHERSCOPE® and XDAL® are registered trade marks of the Helmut Fischer GmbH Institut für
Elektronik und Messtechnik in Germany and/or other countries.
Note: The fact, that the trademark characters ® and ™ may be missing does not indicate that such
names are free trademarks.
Table of Contents
Table of Contents
1 Safety Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
1.1 Read the Operator’s Manual Carefully Before Operating. . . . . . . . . . . . . . . . .9
1.2 Warning Notices Used . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9
1.3 Intended Use . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .9
1.4 Safety of the Electrical Equipment . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
1.5 Maintenance and Repair . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
1.6 X-Radiation Safety . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
1.7 Requirements for the Operating Personnel . . . . . . . . . . . . . . . . . . . . . . . . . . 12
1.8 Frequently Asked Questions Concerning X-Radiation Safety . . . . . . . . . . . . . . 13
2 Instrument Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
2.1 Areas of Application . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
2.2 Standard-free Measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
2.3 X-Ray Fluorescence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
2.4 Functional Principle of the Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
2.5 Components . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
3 Set up . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
3.1 Set-up Location . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
3.2 Unpacking the Measuring System . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
3.3 Removing the Shipping Lock. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
3.4 Establishing Connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
3.5 Switching on the Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
3.6 Switching off the Instrument . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
3.7 Communication between Instrument and WinFTM . . . . . . . . . . . . . . . . . . . . . 29
4 Position Specimen . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
4.1 Flat Specimens . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
4.2 Cylindrical or Curved Specimens . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
4.3 Measurements in Recesses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
4.4 Measurements on Inclines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
4.5 Positioning of Specimen . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
4.6 Position the Specimen by Using the Mouse . . . . . . . . . . . . . . . . . . . . . . . . . 34
5 Performing Measurements. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
FISCHERSCOPE® X-RAY 3
Table of Contents
8 Product Administration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
8.1 Creating a Product . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57
8.2 Changing the Properties of a Product . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
8.3 Importing a Product . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58
8.4 Deleting a Product . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59
8.5 Assigning a new Measuring Application to a Product . . . . . . . . . . . . . . . . . . 59
8.6 Modifying a Measuring Application . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
8.7 Copying a Measuring Application . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
8.8 Deleting a Measuring Application . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
8.9 Viewing the Def.MA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
8.10 Importing a Def.MA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61
4 FISCHERSCOPE® X-RAY
Table of Contents
12 Task Programming . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
12.1 Starting a Task . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
12.2 Programming Tool . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 90
12.3 Getting Started with Task Programming . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91
12.4 Syntax of Task Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91
12.5 List of Task Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 91
12.6 Example Specification Limit Commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . 94
13 Data Back-up . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 95
FISCHERSCOPE® X-RAY 5
Table of Contents
16 Def.MA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121
16.1 The Def.MA Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 121
16.2 Creating a new Def.MA. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 122
16.3 Entering Compensation Spectra . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 123
16.4 Display the Measurement Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 125
6 FISCHERSCOPE® X-RAY
Table of Contents
23 Addendum . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 183
23.1 Description of the Characteristic Statistical Parameters. . . . . . . . . . . . . . . . . 183
23.2 Periodic Table of the Elements with X-Ray Properties . . . . . . . . . . . . . . . . . . 192
Data Sheet . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 193
WinFTM Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 197
Index . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . I
EC DECLARATION OF CONFORMITY . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V
FISCHERSCOPE® X-RAY 7
Table of Contents
8 FISCHERSCOPE® X-RAY
Safety Information
1 Safety Information
Make sure to read this Operator’s Manual carefully before taking the instrument into operation.
Keep the manual in a safe place, so that you will be able to consult it whenever necessary.
ATTENTION Indicates a risk that can lead to damage or destruction of the product.
CAUTION Indicates a risk that can lead to light or moderate injuries.
DANGER Indicates a risk that will lead immediately to death or serious injuries.
The FISCHERSCOPE X-RAY is used for coating thicknesses measurements and for materials analy-
sis. The measurement method conforms to DIN 50 987, ASTM B568 and EN ISO 3497.
When used as intended, the FISCHERSCOPE® X-RAY is safe in its operation. When you use the
instrument as intended and observe the safety information, the instrument does not pose any risks.
Only accessories recommended and approved by FISCHER may be connected to this instrument.
Modifications, repairs, maintenance and service work on the instrument and its accessories must
be performed by authorized FISCHER service personnel only.
There is no other intended use. The risk for damage from unintended use lies solely with the user.
FISCHERSCOPE® X-RAY
Safety Information
The instrument is designed as a Protection Class I instrument according to the IEC 348 / VDE 0411
standard. The instrument contains components under line voltage and under high voltage. Observe
the directives and standards IEC 348, VDE 0411.
Repair, maintenance and service work on the instrument and its accessories must be performed by
authorized FISCHER service personnel only.
Exceptions are described in the operator’s manual, as replacing the line fuse.
The design as a fully protected instrument and the functions of several integrated protective devices
protects the operating personnel and the surroundings fully from x-radiation.
Two devices that work independent of each other ensure that x-radiation can be generated only
when the measurement chamber is closed. For the safe operation of the instrument please also note
the intended use; ref. chap. 1.3. on Page 9.
Observe the laws and regulations of the country where the FISCHERSCOPE X-RAY is operated. The
responsible government authority must possibly be informed or consulted about the commissioning
of the FISCHERSCOPE X-RAY .
In addition, we would like to point out the following:
Operate the instrument according to the instructions in this manual and the online help.
Do not attempt any structural alterations on the instrument.
Maintenance and service work on the instrument may be performed only by FISCHER or by
companies authorized by FISCHER for this purpose.
FISCHER recommends to check the instrument by an expert in intervals of no longer than five years.
Observe the laws and regulations of the country where the instrument is operated.
If you prefer to perform the repeat inspection yourself, contact the responsible authority for the ex-
pert responsible for your area.
During the repeat inspection, the expert must be provided with the Certificate of Approval. Store
the Certificate of Approval in a manner that it will be available at the time of the inspection.
The responsible authority must be notified of the result of the repeat inspection without being re-
quested to do so.
10 FISCHERSCOPE® X-RAY
Safety Information
The FISCHERSCOPE X-RAY is a fully protected instrument. A fully protected instrument has the fol-
lowing features:
A protective housing fully encloses the x-ray tube and the object to be examined.
The instrument features two safety devices that are independent of each other. The x-ray tube
can be operated only when the protective housing is fully closed.
The aforementioned technical features are fulfilled by two micro switches that observe the opening
condition of the measuring chamber door. If the door is opened, the x-ray escape will be closed
(shutter closed).
Only specialized service personnel, as a rule the Service of FISCHER, is authorized to carry out
alterations to the measuring instrument.
FISCHERSCOPE® X-RAY
Safety Information
Operators with introductory training can work with the instrument efficiently and safely.
For this purpose, the instrument is prepared such that all settings for the measuring application are
made by trained specialists. Then, the software’s scope of functions is restricted such that only the
functions required for carrying out the measuring application remain accessible (Short menu). This
provides operators with introductory training with a clear workspace and the instrument is protect-
ed from interventions and changes in the software.
Operators with introductory training should have the following knowledge:
Fundamental knowledge about the use of Microsoft® Windows®
Knowledge of the safety information described in this manual
Operators with introductory training must be instructed in the proper use by a person that has
the requisite qualifications.
Trained specialists can utilize the full bandwidth of the technical capabilities of the
FISCHERSCOPE X-RAY.
In addition, trained specialists have the following knowledge:
Knowledge of the physical principle of x-ray fluorescence and of the functional principle of the
FISCHERSCOPE X-RAY instrument
The aforementioned physics knowledge is important for defining the measuring application and for
other settings. Only the most important facts are explained in this Operators Manual. This does not
replace detailed training.
The practice-oriented seminars of FISCHER are a worthwhile opportunity for obtaining the required
knowledge. Several times a year, user seminars that provide insights into the physical fundamentals
of x-ray fluorescence and prepare users for their work with the measuring instruments are conduct-
ed at various locations.
Seminar dates can be found on our website www.helmut-fischer.com.
12 FISCHERSCOPE® X-RAY
Safety Information
Question Answer
Is there a risk that my health will No. The X-RAY instrument is a fully protected instrument.
be impaired by X-radiation due During no phase of your work at the instrument is it possi-
to my work on the X-RAY instru- ble for X-radiation to escape from the measurement cham-
ment? ber. This is also true when the cover of the measuring head
is opened. In such cases, the radiation source will be
switched off immediately through the security devices.
How can I check if the safety de- You can recognize its proper function via the red control
vice of the measuring head func- LED on the front side of the measuring head.
tions properly? Everything is OK as long as the CONTROL LED is not flash-
ing.
Will the specimens that have No. The fluorescence radiation of the specimen subsides
been exposed to X-radiation fully already a split-second after the primary X-radiation is
themselves turn into radiating switched off. You can touch the specimen after the mea-
material due to the X-ray fluores- surement procedure without any problems.
cence effect after the primary ra-
diation has been switched off?
Will the primary X-radiation No. The X-radiation has absolutely no lasting influence on
damage or alter the material the material; it fully retains its quality. The X-ray fluores-
structure of the specimen? cence method is a non-destructive measurement method.
Live animals or plants must not be exposed to the X-radia-
tion in the measurement chamber.
Is the safety or the accuracy of No. Magnets influence neither the measurement results nor
the measurement results influ- the safety. You can use magnets without problems.
enced by magnets on customer-
supplied fixtures in the measure-
ment chamber?
FISCHERSCOPE® X-RAY
Safety Information
14 FISCHERSCOPE® X-RAY
Instrument Overview
2 Instrument Overview
The FISCHERSCOPE® X-RAY is a high performance energy dispersive x-ray fluorescence (EDXRF)
spectrometer.
The WinFTM® (Fischer Thickness Management Software for Windows®) software controls the in-
strument and handles the evaluation of the signals supplied by the instrument.
The measured values (coating thickness, material compositions, mass per unit area) are stored and
displayed on the monitor. Using WinFTM, you can conveniently design the measurement results as
a print form for printout and export them to other applications.
WinFTM runs under Windows®.
The instrument allows for standard-free measurements, that is measurements without calibration
standards. Coating thicknesses and compositions can be determined in one measurement without
the use of calibration standards. This is especially interesting when you develop new multi-layered
systems, where applicable calibration standards are not available.
FISCHERSCOPE® X-RAY 15
Instrument Overview
The specimen is excited with the primary x-radiation. In the process electrons from the inner electron
shells are knocked. Electrons from outer electron shells fill the resultant voids emitting a fluorescence
radiation that is characteristic in its energy distribution for a particular material. This fluorescence
radiation is evaluated by the detector.
The generation of the x-ray fluorescence radiation is shown simplified in Fig. 2.1. One electron
from the K shell is knocked. The resultant void is filled by either an electron from the L shell or an
electron from the M shell. In the process the K and K radiation is generated, which is character-
istic for the particular material.
Primary X-radiation
Electron
Shell M L K
16 FISCHERSCOPE® X-RAY
Instrument Overview
Anode
WinFTM
main window
Primary x-radiation
Primary filter
Optics
Shutter
Mirror
Video camera
Aperture (Collimator)
Spectrum Detector
Coating layer
Functional principle
1. The x-ray tube generates the primary x-radiation (primary radiation). The electrically heated
cathode emits electrons. Accelerated by the applied high voltage to very high speeds, the elec-
trons bombard the anode material. This generates the primary x-radiation.
2. The primary filter optimizes the energy distribution of the primary x-radiation.
3. The shutter serves as a safety device. It is opened during a measurement only. In case of a
malfunction or when opening the measurement chamber, it will be closed automatically. This
ensures, that the user is never exposed to x-radiation.
FISCHERSCOPE® X-RAY 17
Instrument Overview
4. A light source (not shown in Fig. 2.2) illuminates the sample. A mirror and lens direct the image
of the measurement location to a color video camera. The mirror has a hole in its center for the
primary radiation to pass through.
5. The aperture (collimator) limits the cross-section of the primary beam in order to excite a
measurement spot of a defined size.
6. The primary x-radiation impacts the atoms on the sample surface (coating layer and base mate-
rial) and in the process knocks electrons from the inner electron shell. Electrons from outer elec-
tron shells fill the resultant voids emitting a fluorescence radiation that is characteristic in its
energy distribution for a particular material.
7. The energy dispersive detector measures the energy distribution of the fluorescence radiation.
A multistage electronics circuit processes the measurement signals.
8. The measured spectrum shows lines or peaks that are characteristic for the chemical elements
in the sample.
9. The WinFTM Software computes the thickness of the coating(s) and/or the analysis result. The
video image of the sample is shown in the WinFTM window. The precise position of the
measurement location and the measurement spot is possible due to the special design of the
optical and the x-ray guidance systems.
18 FISCHERSCOPE® X-RAY
Components
2.5 Components
The cover of the measurement chamber is part of the safety devices of the instrument. It fully protects
the operator and the environment from x-rays.
The cover of the measurement chamber opens and closes in the vertical direction for easy and time-
saving placement or replacement of the specimen on the measuring stage in the measurement
chamber.
► When closing the cover of the measurement chamber, ensure that the cover is fully closed.
A flashing CONTROL LED indicates that the cover is not fully closed and measurements cannot
be made.
The instrument is equipped with a programmable motor-driven measuring stage with automated
loading function.
You can program coordinates for measurement points in order to let the instrument measure auto-
matically at various locations on the specimen. In this manner, you can define, for example, 100
measurement points and let the measurement run automatically over night at these measurement
points.
The loading function entails the motor-driven measuring stage moving out of the opened measuring
chamber for loading. The loading function is triggered automatically as soon as the cover of the
measuring head is opened. The stage automatically returns to its starting position when the cover
is closed.
With the measuring stage in the extended position, specimens can be positioned conveniently on
the stage using a laser pointer.
A laser pointer marks the measuring spot. This allows for exact positioning of the specimen.
The aperture is used to limit the size of the primary x-ray beam to a defined diameter or cross-sec-
tion.
The aperture is a borehole with defined geometries (rectangular or round) and sizes, through which
part of the primary x-ray beam passes. Thus, a fraction of the primary radiation is suppressed.
A reproducible, controlled and defined primary x-ray beam geometry is an important prerequisite
for good measurement accuracy.
Changeable apertures
To create ideal excitation conditions for every measurement, the instrument is equipped with several
electrically changeable apertures (collimators), see the Technical Data Sheet in the appendix of this
FISCHERSCOPE® X-RAY 19
Components
document. Using the software, you can select the optimum aperture for the respective measurement
application.
2.5.5 Shutter
The shutter is used to keep the primary x-rays from entering the measurement chamber and the en-
vironment.
The shutter is part of the safety system. The shutter closes immediately, when you open the cover
of the measurement chamber or when a malfunction occurs. X-rays can then no longer reach the
measurement chamber and the environment.
The specimen lighting ensures good visibility of the specimen in the video window. The lighting
elements are white LEDs that are located in the area of the aperture.
Use the slide control in the video window to adjust the intensity of the illumination.
The primary filter consists of a thin foil made of nickel, aluminum or plastic, (see Technical Data
Sheet in the appendix of the document), which is located between the x-ray tube and the specimen
to be measured.
By using a primary filter, the composition of the primary X-radiation can be influenced such that it
is optimally suited for the excitation of the respective specimen for x-ray fluorescence. Thus, unde-
sirable components of the fluorescence spectrum can be avoided from the outset.
Using a primary filter is useful for certain applications, however, it is not required in most cases.
The user requires special physical knowledge for a case-by-case evaluation of this question.
The primary filter can be controlled using the software, if the WinFTM extension SUPER is installed.
20 FISCHERSCOPE® X-RAY
Components
With the key switch you turn the high voltage supply of the x-ray tube on and off. Without high
voltage supply to the x-ray tube, x-radiation cannot be generated. Consequently, measurements are
not possible.
Measurements can only be performed when the key is inserted and turned to the right.
For your safety, you should turn off the x-radiation when you are finished using the instrument, then
pull the key and store it in a safe place. This prevents unauthorized use of the instrument and gen-
eration of x-radiation.
Control LEDs of the high voltage supply:
The yellow LED HV ON on the control panel of the instrument lights immediately upon turning
on the high voltage.
The red control LED X-RAY ON on the control panel of the instrument lights when the high
voltage is reached its full level. This may take a few seconds after turning the key switch.
You can use the control panel to control certain functions of the instrument.
Joystick
FISCHERSCOPE® X-RAY 21
Components
LED Function
HV ON Lights yellow when the high voltage is turned on.
X-RAY ON Lights red when the X-radiation is ready.
SHUTTER OPEN Lights yellow when a measurement is in progress.
CONTROL Flashes red when the safety system discovers an error or when the cover
is not fully closed, measurements are not possible.
No malfunction message of the safety system is present if the LED does
not light.
POWER ON Lights green when the instrument is switched on.
X/Y-LIMIT Lights yellow when the measuring stage has been moved to a maximum
position (fully to the right, left, back or front).
Z-LIMITS Lights yellow when the detector unit is at its highest or lowest position.
22 FISCHERSCOPE® X-RAY
Set up
3 Set up
The instrument is designed as a lab unit. Due to its sturdy construction, it is also possible to run it
in a production hall.
The set-up location influences the product life and maintenance effort directly.
Corrosive environments cause corrosion on mechanical and electronic components. This can lead
to the following problems:
Rough-running or total breakdown of mechanical adjustment mechanisms
Contact problems on plug connectors or total breakdown of electronic components
Salt acid steams or salt aerosols (salt spray test) in the ambient air cause defects on x-ray tubes,
proportional counters and silicon detectors in short intervals. Salt acid corrodes the Beryllium win-
dow of these components. Thus, the components will be damaged rapidly.
If the instrument is located in a room, separated from the electroplating, make sure that the exit air
of the electroplating cannot reach the room via doors, windows or extraction of air systems.
Heavy ambient air pollution causes the ventilation ducts getting clogged. Thus, the maximum per-
missible temperature of components can be exceeded. Additional damage can be caused by de-
posits of aggressive dirt.
FISCHERSCOPE® X-RAY 23
Set up
1. Open all containers of the shipment and take out the components.
NOTE:
To save space, place the PC under the table and not on top of it. However, consider that you will
need front access to the PC for inserting or removing CD-ROMs and for turning the unit on and off.
24 FISCHERSCOPE® X-RAY
Set up
1. Unscrew the four hex socket screws that connect the red shipping lock with the measuring
stage. Make sure, that the screws do not drop into the instrument.
2. Remove the red shipping lock.
3. Store the shipping lock and the screws at a safe place for future transport.
FISCHERSCOPE® X-RAY 25
Set up
Check the supply voltage before connecting the instrument to the voltage supply. The nominal line
voltage is shown on the name plate and is either 110 V or 230 V (AC).
1 2 3 4
1 Main switch
3 USB interface, to PC
4 Main fuse
5 Voltage supply for instrument
26 FISCHERSCOPE® X-RAY
Set up
1. USB: The USB cable has two different connectors: a quadratic one and a flat one. Connect the
quadratic connector to the instrument and the flat connector to a USB 2 socket at the PC. If no
free USB 2 socket is available, connect the mouse or the keyboard to a USB 3 socket.
The following table helps to distinguish between USB 2 and USB 3 sockets. Please note that not
all characteristics need to apply, e.g. a USB 3 socket may also be black.
FISCHERSCOPE® X-RAY 27
Set up
The following activities must not be performed immediately after power up, but only after
about half an hour of measuring time:
Calibration/Normalization
Monitoring measurement devices including corrective measures
28 FISCHERSCOPE® X-RAY
Set up
Communication between instrument and WinFTM is necessary to obtain measurements with the
instrument.
FISCHERSCOPE® X-RAY 29
Set up
30 FISCHERSCOPE® X-RAY
Position Specimen
4 Position Specimen
There are some basic rules for positioning specimens. For each measurement it must be ensured
that the x-ray fluorescence radiation can reach the detector without obstruction. Otherwise, the
measurement result may be falsified.
Bolts, rods or other cylindrical specimens must be positioned such that they are not shadowed or
that the curvature does not influence the measurement result.
► Position cylindrical specimens on the table in the manner shown in the following figure.
Figure 4.1: Positioning of the specimen for cylindrical or curved specimens
Regardless of the positioning, cylindrical or curved specimens must always have a minimum diam-
eter or a minimum curvature diameter. If the diameters are smaller than this minimum value, then
a greater coating thickness than the actual value will be displayed. This is caused by the effectively
inclined radiation through the coating at the measurement location, which causes a higher fluores-
cence intensity.
The following applies to simple measuring applications (e.g., single coating applications) and in
one plane cylindrical or curved objects):
This means that the diameter of the specimen must be at least four times as large as the diameter
of the measurement spot.
FISCHERSCOPE® X-RAY 31
Position Specimen
For multi-coating measuring applications that are curved in more than one direction (many curved
and bent contacts), this minimum value may be increased by a factor of up to 10 for top coatings,
depending on the measuring application. This factor may be even higher for interim coatings.
In addition, when making such measurements ensure that the position of the measurement spot cor-
responds to the position in the video image in order to ensure accurate positioning and measure-
ments. If you have questions in this regard, please contact FISCHER.
Information about measurements on thin wires can be obtained from your authorized dealer or
from FISCHER.
When making measurements in recesses, it is important that the X-radiation and the x-ray fluores-
cence radiation are not shadowed by the specimen, see the Figure below.
The primary x-radiation must strike the measurement location at a right angle. Otherwise measure-
ment errors will occur.
► Use aids (devices, modeling clay and the like), to orient the plane of the measurement location
horizontally.
32 FISCHERSCOPE® X-RAY
Position Specimen
Observe the rules for positioning different specimen in Chap. 4 on Page 31.
Procedure
1. Open the door of the measurement chamber.
The measuring stage will automatically move out of the measurement chamber.
2. Position the specimen with the measurement location pointing up. Orient the specimen such that
the laser pointer points at the measurement location.
3. Close the door of the measurement chamber.
The measuring stage will automatically move back into the measurement chamber.
4. Focus the video image by clicking the Autofocus icon in the video image.
If the auto-focus function doesn’t work, because the specimen’s contrast is too low, focus the
video image by using the slide control at the left in the video image:
a Position the mouse pointer over the handle of the slide control at the middle of the slide
control.
b Press and hold down the left mouse button. Slide the handle up or down.
The Z-axis moves to the desired direction. The speed of the movement is controlled by the
distance between the handle and the middle of the slide control.
c To stop the movement, release the left mouse button.
If the video image is too bright or too dark, change the brightness using the slide control at the
bottom left in the video image.
If the crosshairs in the video image is not very visible, change the color of the crosshairs by
clicking (several times) the icon Change color (crosshair).
FISCHERSCOPE® X-RAY 33
Position Specimen
The instrument is equipped with a motor-driven measuring stage. You can position the specimen by
using the mouse, while the measurement chamber door is closed (Point & Shoot).
Procedure
To position the specimen by using the mouse:
1. Position the mouse pointer in the video field on the desired measurement spot.
2. Press the left mouse button.
The measuring stage moves to the desired measurement location.
To position the specimen by using joystick function of the mouse:
1. Position the cursor at the center of the crosshairs in the video image.
2. Press and hold down the right mouse button. Moving the mouse will now control the X/Y/Z
stage drive:
The angle position of the cursor relative to the center of the crosshairs controls the direction of
the X/Y/Z stage movement.
The distance of the cursor from the center of the crosshairs controls the speed of the X/Y/Z
stage movement.
3. To stop the movement, release the right mouse button.
The speed of the stage movement can be set by the Service engineer.
34 FISCHERSCOPE® X-RAY
Performing Measurements
5 Performing Measurements
To perform measurements you need a product. A product is a file, which contains all settings for a
specific measurement task.
When the instrument is delivered by FISCHER, products that cover your measurement tasks are usu-
ally available. With these products you can perform measurements immediately.
If you need new measurement tasks, you can request products from FISCHER. The products are then
send to you by email or on a data carrier. Before you can use the new products, you need to import
and calibrate them.
This section describes how to perform measurements.
For further information see the following chapters:
Importing a product: Chap. 8.3 on Page 58
Performing a calibration: Chap. 18 on Page 139
Procedure
FISCHERSCOPE® X-RAY 35
Performing Measurements
36 FISCHERSCOPE® X-RAY
User Interface of the WinFTM Software
The WinFTM® (Fischer Thickness Management Software for Windows®) software controls the in-
strument and handles the evaluation of the signals supplied by the instrument.
The measured values (coating thickness, material compositions, mass per unit area) are stored and
displayed on the monitor. Using WinFTM, you can conveniently design the measurement results as
a print form for printout and export them to other applications.
WinFTM runs under Windows®.
Title bar
Menu bar
(WinFTM main menu)
Tool bar
Product bar
Statistics field
Calibration status
line
Measurement
value field
Video window
Status bar
Instruction field
Item Function
Title bar Shows the current folder.
Menu bar Contains all menus. Many of the functions available from the menu bar are
also available from the tool bar.
Tool bar The tool bar offers quick access to the most frequently used functions. You
can adapt the tool bar according to your needs.
FISCHERSCOPE® X-RAY 37
User Interface of the WinFTM Software
Item Function
Product bar Here you can select a product by clicking the button Select. In the center
the number and name of the current product are displayed, here No. 60
Au/Pd/Ni/Cu.
Video window Here you can see the specimen, see Chap. 6.2 on Page 39
Instruction field Here you can start a measurement or a sequence of automatic measure-
ments. Hints and error messages are displayed in this field (e.g. messages
during calibration).
Statistics field Here the statistical results of the last block are displayed, see Chap. 6.3 on
Page 41.
Calibration status If the measurement application is calibrated, the name of the calibration
line standard set is displayed here. If the measurement application is not cali-
brated, the message Calibration: Standard-free is displayed.
Measurement val- The measurement readings are displayed here. The field displays either the
ue field last measurement reading or a list of all readings of the current product, see
Chap. 6.4 on Page 41.
Status bar Here important information is displayed, e.g. measurement distance, XYZ
coordinates, and the mq-value of the last measurement.
38 FISCHERSCOPE® X-RAY
User Interface of the WinFTM Software
With the help of the video image you can position and focus the specimen exactly (see Chap. 4
on Page 31). If you don‘t see the video image, it is switched off.
Figure 6.2: Video image, 1) only available at instruments equipped with motor-driven
measuring stage
Item Function
Auto focus button1 Adjusts the focus automatically, if the specimen‘s contrast is sufficient.
Measurement unit Displays the measurement unit for the crosshairs and the measurement spot.
Crosshairs To scale presentation of the crosshairs.
To scale presenta- Displays the form and size of the actual measurement spot. Aperture shape
tion of the mea- and size as well as the measurement distance are considered.
surement spot
Brightness slide Changes the brightness of the video image.
control
Z-axis slide con- Moves the Z-axis up or down. The more the slider is scrolled, the faster the
trol1 Z-axis moves.
Button for chang- Changes the color of the crosshairs in order to optimize the contrast be-
ing the color of tween specimen and crosshairs.
the crosshairs
1. only available at instruments equipped with motor-driven measuring stage
FISCHERSCOPE® X-RAY 39
User Interface of the WinFTM Software
You can enlarge and zoom the video image to have a better view of the specimen and the mea-
surement spot and for focusing the video image.
If you have programmed coordinates for automated measurements, you can show them in the video
image. The programmed coordinates appear as crosses in the video image.
To increase the contrast between specimen and crosshairs, you can change the color of the cross-
hairs. Each click on the button (see Fig. 6.2 on Page 39) changes the color of the crosshairs. You
can choose between three different colors: black, white and one user-defined color.
40 FISCHERSCOPE® X-RAY
User Interface of the WinFTM Software
When at instruments equipped with motor-driven measuring stage the stage is travelled to its limit,
the X/Y or Z limits LED on the control panel lights. In addition, an indicator in the video image
appears, see the following table:
Indicator Explanation
The XY measuring stage is travelled to its front stop.
The statistical results of the last block are displayed in this field (see Fig. 6.1 on Page 37). A block
is a test series. The test series has a first and a last value. The last value marks the end of the block.
An additional measurement value belongs to the next test series.
The following features of a block are displayed in the statistics field: Number of the block, Mean
value, Standard deviation, Coefficient of variation, Number of measurements, Order no. and Op-
erator.
This field either displays the last measurement value or a list of all measurement values acquired
with the current product.
You can choose between three different display modes:
Large number presentation
List presentation
SPC chart presentation (Statistical Process Control Chart)
FISCHERSCOPE® X-RAY 41
User Interface of the WinFTM Software
In this display mode the current measurement value (or the last values, if several characteristics are
measured) is displayed in large digits. In addition to the measurement value, the measurement un-
certainty is displayed as well. The measurement uncertainty depends on the measurement condi-
tions (measurement time, measurement distance, measurement application).
If you have set up tolerance limits, the measurement value is displayed with colored background.
If the measurement value is within the tolerance limits, the measurement value is displayed on green
background, otherwise on red background.
The list of measurement values are presented in the order of the measurements. In addition to the
measurement values, the date and time, the name of the operator and the tolerance limits are dis-
played as well. The name of the operator and the tolerance limits are displayed, if they were pre-
viously entered.
If you have set up tolerance limits, the measurement value is displayed with colored background.
If the measurement value is within the tolerance limits, the measurement value is displayed on green
background, otherwise on red background.
42 FISCHERSCOPE® X-RAY
User Interface of the WinFTM Software
In this display mode the SPC chart (Statistical Process Control chart) is displayed in the statistics
field. The measurement values are displayed in the list presentation in the measurement value field.
Within the statistical process control chart you can identify trends in automated measuring proce-
dures with large lot sizes. Thus, you can easily determine changes with regard to coating thickness
and other process parameters. Furthermore, the SPC chart presentation simplifies the monitoring of
the measurement devices.
Figure 6.3: SPC chart presentation, the upper image shows the mean value over time,
the lower image shows the standard deviation over time
FISCHERSCOPE® X-RAY 43
User Interface of the WinFTM Software
3. In the area Presentation, select the display mode to Large numbers, Listing or SPC. SPC can
only be selected, if the Block definition is set to fix.
The status bar is located at the bottom of the WinFTM window and displays the following:
Display Explanation
Help text If you hover with the mouse pointer over a command button, additional help
text will be displayed here.
Measurement dis- Measurement distance between the specimen measurement spot and colli-
tance mator minus 15 mm, when the video image is focused.
XYZ coordinates1 Coordinates of the current position of the measurement stage.
44 FISCHERSCOPE® X-RAY
User Interface of the WinFTM Software
Display Explanation
mq value Quality factor of the last measurement value. The mq value is a measure for
the agreement of the measured spectrum with the theoretical spectrum, see
Chap 6.6 on Page 45.
CAP The caps lock key of the computer keyboard was pressed.
NUM The number pad of the keyboard is activated.
1. only available at instruments equipped with motor-driven measuring stage
6.6 mq Value
The mq value (measurement quality value) is a quality factor of the measurement value. It is dis-
played in the status bar.
The mq value is a measure for the agreement of the measured spectrum with the theoretical spec-
trum. The mq value is an indication for the confidence level and the trueness of the measurement
value. The smaller the mq-value of a reading is, the more correct is the measurement result. The
optimal value for mq is 0.
General recommendation:
mq = 0 – 5 The measurement is OK.
mq > 5 The measurement must be discarded.
The factory default for the upper limit of the mq value is set to 5. You do have the option to change
this upper limit.
When the upper limit of the mq value is exceeded during a measurement, the measurement will be
terminated and the error message ERROR: Spectrum not suitable! will be issued. The related mea-
surement value will not be added to the result list.
FISCHERSCOPE® X-RAY 45
User Interface of the WinFTM Software
You can adapt the menu functions to the needs of the operator and disable functions. You can hide
the functions, which are not needed. In this manner, sensitive data such as measuring time and
calibration parameters can be protected from overwriting, and the operator is presented with a
simplified menu. The full menu with full functionality is accessible only with a password.
46 FISCHERSCOPE® X-RAY
User Interface of the WinFTM Software
X-ray fluorescence radiation is emitted from the irradiated sample. The detector receives this radi-
ation, the instrument amplifies it and presents it as a spectrum.
You can evaluate the measured spectrum in the spectrum window. With unknown samples you can
analyse, which components comprise the sample.
Cursor
Spectral lines
The spectrum window shows the channels [Chan] at the X axis and the count rates [cps, counts per
second] at the Y axis. Each channel corresponds to an energy value.
The spectrum of the X-ray fluorescence radiation is displayed as a distribution curve of count rate
contents (in cps) of a certain number of channels.
At your instrument, this number is between:
Channel # 0 (corresponding to an energy of 0 keV) and
Channel # 1023 (corresponding to an energy of approx. 33 keV).
You can change the display of the X axis to show the energies directly.
FISCHERSCOPE® X-RAY 47
User Interface of the WinFTM Software
You can use a saved spectrum to re-evaluate it with a different measurement application, without
the need of performing the measurement again.
You can load a saved spectrum for evaluation purposes at any time. You can also load several
spectra to compare them.
1. In the window Spectrum click .
The window Open appears.
2. Select the spectrum and click Open.
If a spectrum is already displayed in the spectrum window, then the newly loaded spectrum will be
displayed in a different color.
48 FISCHERSCOPE® X-RAY
User Interface of the WinFTM Software
With this function you can remove one spectrum or several spectra from the spectrum window. It
does not make a difference whether you have just generated the spectrum by a measurement or
you have loaded a saved spectrum.
This function doesn‘t delete a saved spectrum file, but removes it from the spectrum window only.
You can load a saved spectrum into the spectrum window again at any time.
► In the window Spectrum select Spectrum > Delete.
If you have loaded several spectra, only one spectrum is deleted with this step. You can delete ev-
ery single spectrum one after the other.
You can print all spectra, displayed in the spectrum window together with the spectral lines of the
clicked elements.
► In the window Spectrum select Spectrum > Print.
Please note that the printout will not go directly onto paper but first into the printer buffer. The
printout will go onto paper when the printer buffer is full or when you close the Spectrum
window and click the printer icon in the WinFTM main window.
Procedure
1. To start a measurement, click .
The measurement runs until you terminate it.
2. To terminate a measurement, click
FISCHERSCOPE® X-RAY 49
User Interface of the WinFTM Software
Procedure
1. Select in the Spectrum window View > Elements.
You can display the extended elements list. To do so, select in the Spectrum window
View > Full element list.
2. Click into the spectrum window, keep the mouse button pressed and move the cursor to a peak
of the spectrum.
A list of radiation components of one or more elements is displayed on the left next to the spec-
trum window.
3. Click in the elements list on one radiation component.
The energy lines associated with this element appear as colored lines in the spectrum window.
You can compare the peaks of the measured spectrum with the superimposed lines to identify
the elements that comprises the sample.
4. Repeat steps 2 to 3 to determine further elements of the sample.
You can change the colors of the spectra and the energy lines. To do so, select in the spectrum
window View > Color….
6.8.7 Energy
The energy distribution contained in the spectrum informs about the composition of the sample, be-
cause each occurring element of the sample reflects the qualitative composition through its peak
position (at the horizontal position specified for this element).
The higher the X-ray fluorescence energy of an element, the further to the right the corresponding
line will be in the spectrum.
According to Moseley’s Law, the energy increases as the atomic number of the respective element
increases, i.e., the lines of the “heavier” elements (those with a higher atomic number) are further
to the right in the spectrum.
The energy is measured in keV = kilo electron volts. 1 eV is the energy that an electron gains as it
moves through a field with a potential difference of 1 V.
50 FISCHERSCOPE® X-RAY
User Interface of the WinFTM Software
6.8.8 Intensity
The intensity of a radiation is the amount of radiation that strikes a certain unit of area in a specified
time period.
In X-ray spectroscopy, the intensity of the radiation is measured as the count rate in counts per
second (cps).
Each peak in the spectrum corresponds to a relative maximum referenced to its surrounding. This
maximum correlates to the amount of radiating atoms of the corresponding element.
The higher the peak, the more atoms of the respective element are present in the sample, i.e., the
higher the concentration of the respective element in the sample.
Thus, the intensity of the spectral line is a measure for the quantitative composition of the sample.
FISCHERSCOPE® X-RAY 51
User Interface of the WinFTM Software
52 FISCHERSCOPE® X-RAY
WinFTM File Structure
To ensure correct measurements, a set of specific files needs to be set up. The process flow for set-
ting up the files needed for measurements, is the same on all FISCHERSCOPE X-RAY instruments:
The essential content of the files product, measurement application and Def.MA and their relations
among each other is shown in the following figure:
Product
Measurement results and their presentation
Image of the specimen
Measurement time and number of measurements
Export masks, block protocol etc.
Measurement Application
Calibration data (Calibration standard set)
Measurement time during calibration
Number of measurements during calibration
Anode current, aperture
Def.MA
Measurement mode
Type and order of the coatings
Tube voltage
Type and composition of the calibration standards
Treatment of interfering spectra
Special evaluation methods
Figure 7.2: Content of the files Def.MA, measurement application and product
FISCHERSCOPE® X-RAY 53
WinFTM File Structure
7.1 Def.MA
The Def.MA Definition of the Measurement Settings of the Application) is a file, in which the basic
settings for a measurement are saved, like:
Measurement mode
Tube voltage used
Type and order of the coatings
Type and composition of the substrate material of the specimen and of the calibration standards
Treatment of interfering spectra
Special evaluation methods
To create a Def.MA you need the WinFTM extension SUPER. The usage of the SUPER software re-
quires knowledge about the physics of x-ray fluorescence and the functionality of the instrument.
If you don’t have the knowledge, do not use the SUPER software, but request a new measurement
application from FISCHER instead. FISCHER offers a professional service for the creation of custom-
er’s Def.MA.
The measurement application is a file, which contains everything that is necessary for the trueness
of a measurement:
Local copy of the Def.MA
Calibration data (Calibration standard set)
Measurement time during calibration
Number of measurements during calibration
Anode current, aperture
7.3 Product
The product is a file, which serves for the data organization and the measurement control.
Everything you define and enter for solving a measurement task is saved in the product file:
Measurement results and their presentation
Image of the product
Measurement time and number of measurements
Export masks
54 FISCHERSCOPE® X-RAY
WinFTM File Structure
Product
1. In this context a calibration standard set is a particular data set, which contains the characteristics of the used
calibration standards.
FISCHERSCOPE® X-RAY 55
WinFTM File Structure
56 FISCHERSCOPE® X-RAY
Product Administration
8 Product Administration
The instrument needs certain basic information to generate measurements. This information is con-
tained in the product file, see also Chap. 7 on Page 53. For this reason a product that fits your
specimen must be selected or created before performing a measurement.
Procedure
1. Select in the menu bar Product > New… .
The window Select an application appears.
2. Shall the new product base on an existing measuring application or on a new one?
Existing measuring application: continue with Step 9.
New measuring application: continue with Step 3.
3. In the window Select an application click New.
The window Select a Def.MA appears.
4. Select the Def.MA and click OK.
The window Input of the application name appears.
5. Enter in the fields the Name and No. of the measuring application and click OK.
The window Select collim. + meas. dist. appears.
6. Select the collimator (aperture), the anode current and click OK.
The window Input Calibr. Std. Set appears.
7. Do not enter anything in the window Input Calibr. Std. Set and click OK.
The window End of calibration. Accept? appears.
8. Click Yes. Continue with Step 10
9. Select the measuring application and click OK.
The window Create new product appears.
10.Enter in the fields the Name and No. of the product. Further options:
• To rename the folder, click .
• To create a new folder, click .
11.Click OK.
The new product is now created and active.
FISCHERSCOPE® X-RAY 57
Product Administration
When creating a new product, many properties are automatically taken from the product that is
active at the beginning of a new product creation. You can change these properties at any time
afterwards.
Procedure
1. In the WinFTM main window select Product > Modify… .
The window Modify product appears.
2. You can change many properties of the product, e.g.:
If you have received a new product file from FISCHER, you need to import it. The file name has the
extension *.sav, *.sv1 or *.sv3.
Procedure
1. If you have received the product file by email as a file attachment, save the file in a directory
that does not belong to WinFTM, e.g. C:\temp.
2. If you have received the product file by CD, insert the CD into the CD drive.
3. In the WinFTM main window select Product > Copy to/from File….
The window Copy from/to file appears.
4. Select the tab File >>> Product.
5. Click Select.
The window Select file appears.
58 FISCHERSCOPE® X-RAY
Product Administration
Procedure
1. In the WinFTM main window select Product > Delete… .
The window Delete product appears.
2. Select the product file you want to delete and click Delete.
If the message Current product cannot be deleted! appears, activate another product first
(Product > Select). The currently active product cannot be deleted.
You can assign a new measuring application to a product, if the new measuring application has
the same measurement mode as the existing measuring application.
Changes performed in the measuring application, are effective in all products assigned with this
measuring application.
Procedure
1. In the WinFTM main window select Product > Modify… .
The window Modify product appears.
2. Select the tab Application.
3. Click Other Application.
The window Modify application appears.
4. Select the measuring application and click OK.
FISCHERSCOPE® X-RAY 59
Product Administration
Procedure
1. In the WinFTM main window select Calibrate > Modify application… .
The window Modify application appears.
2. Select the measuring application and click OK.
3. Change the properties of the measuring application and click OK.
Procedure
1. In the WinFTM main window select Calibrate > Copy application… .
The window Copy application appears.
2. Select the measuring application, enter a name in the field Name and click Copy.
If you delete a measuring application that is assigned to a product, the assigned product will be
deleted, too. If several products are assigned to the measuring application, all assigned products
will be deleted.
Procedure
1. In the WinFTM main window select Calibrate > Delete application… .
The window Delete application appears.
2. Select the measuring application you need to delete and click OK.
If the measuring application is assigned to one or several products, the following message
appears for each assigned product: Application is used in: <Folder Name>, Product No.
<Product Number> <Product Name> Delete this product?
To delete the product assigned to the measuring application, click Yes.
60 FISCHERSCOPE® X-RAY
Product Administration
You can easily view the Def.MA, e.g. to check, whether the Def.MA is suitable for a new product.
For more information about Def.MA, see Chap. 16 on Page 121.
If you have received a new Def.MA file from FISCHER, you need to import it. The file name has
the extension *.pb0. After this you create a new measurement application and a product based
on the imported Def.MA.
For more information about Def.MA, see Chap. 16 on Page 121.
Procedure
1. If you have received the Def.MA file by email as a file attachment, save the file in a directory
that does not belong to WinFTM, e.g. C:\temp.
2. If you have received the Def.MA file by CD, insert the CD into the CD drive.
3. In the WinFTM main window select Product > Copy to/from File….
The window Copy from/to file appears.
4. Select the tab File >>> Def.MA.
5. Click Select.
The window Select file appears.
6. Select the Def.MA file and click Open.
The selected path appears in the field File.
7. Click Start copy.
The file will be copied. After this the report The Def.MA was copied successfully appears.
8. Click OK.
9. To close the window, click cancel.
FISCHERSCOPE® X-RAY 61
Product Administration
62 FISCHERSCOPE® X-RAY
Handling of Measurement Readings and Statistical Evaluations
9.1 Block
A block is a test series that combines several readings that have been made under the same con-
ditions or that belong to the same order.
All single readings of a block are numbered consecutively and each block, in turn, has a consec-
utive number as well.
Table 9-1: The various block definitions
To set the block definition (variable block size, fixed block size, autom. block closing, variable)
1. Click .
The window Modify product appears.
2. In the tab Presentation, area Block Definition choose the required option, see table 9-1.
If you have chosen fix or autom. Block closing, variable, enter the block size additionally.
FISCHERSCOPE® X-RAY 63
Handling of Measurement Readings and Statistical Evaluations
If you have set fix, then the block will be closed automatically after the bock size is reached and
has no function.
If you have set variable or autom. Block closing, variable, then you close a block as follows:
► To close a block, click .
The icon has been changed to grey. The next measurement reading is part of the next block
and gets the number 1.
To label a block
1. In the WinFTM main window select Evaluation > Order No. / Operator….
The window Order No. / Operator appears.
2. Fill in the fields. All blocks will be labelled with your entered values from now on. In doing so,
the values are taken as long as you enter new values.
64 FISCHERSCOPE® X-RAY
Handling of Measurement Readings and Statistical Evaluations
FISCHERSCOPE® X-RAY 65
Handling of Measurement Readings and Statistical Evaluations
Usually, WinFTM saves all readings automatically in blocks within product files. Sometimes it can
be useful not to save the measurement readings, for example, if during a test series you wish to
measure samples that are not part of the test series.
66 FISCHERSCOPE® X-RAY
Handling of Measurement Readings and Statistical Evaluations
Sometimes it can be useful for certain reasons to measure a specimen again and to overwrite the
old measurement reading with the new one.
You can evaluate a single a block. You can evaluate the statistical data of the block (mean value,
standard deviation, coefficient of variation, range, max and min values) and see the labels of the
block (Order No., Lot No., Label 1, Label 2, Operator).
Procedure
1. In the WinFTM main window select Evaluation > Evaluate Single Block….
The window Block Result appears.
2. You can now read the statistical data, move quickly between blocks or delete blocks.
FISCHERSCOPE® X-RAY 67
Handling of Measurement Readings and Statistical Evaluations
You can evaluate the statistical data of all blocks or specific blocks of the product.
Procedure
1. In the WinFTM main window select Evaluation > Evaluate All Blocks….
The window EVALUATION appears.
68 FISCHERSCOPE® X-RAY
Statistical Evaluation and Documentation Using the Supplementary Software PDM Setting Up the Print Form Using PDM
The simple block and final evaluation of the basic WinFTM software
continues to be available. In addition, product-related
documentation is possible
FISCHERSCOPE® X-RAY 69
Setting Up the Print Form Using PDM Editing Print Form Templates Using PDM
Functions:
Insert variable
Enter any desired text
Insert Bitmap graphics (e.g., company logo)
Insert content of the Windows clipboard
Format print form (font, font color and font attributes, graphics ele-
ments, tabs and indents, paragraph formats)
The inserted text and the graphics remain stored in the print form
template as well.
If changes have been made to the current print form template prior
to exiting the editor, the user will be prompted in a dialog window to
confirm or discard these changes:
70 FISCHERSCOPE® X-RAY
Inserting Variables for Print Form Templates Setting Up the Print Form Using PDM
1. You will find a list of all variables that can be inserted into the print
form template to the right of the editing field.
2. Double-click a variable in the list and it will be inserted into the print
form template.
FISCHERSCOPE® X-RAY 71
Setting Up the Print Form Using PDM Variables Available for Block Evaluation
72 FISCHERSCOPE® X-RAY
Variables Available for Block Evaluation Setting Up the Print Form Using PDM
@DF1Density of the coating that has been entered into the current
product. This applies only to coatings with a fixed
composition.
FISCHERSCOPE® X-RAY 73
Setting Up the Print Form Using PDM Variables Available for Block Evaluation
@RG1Range
Difference between the largest (maximum) and smallest
(minimum) single reading of the selected block.
74 FISCHERSCOPE® X-RAY
Variables Available for Block Evaluation Setting Up the Print Form Using PDM
The standard deviation s is a measure for the distribution of Regarding the numerals
the single readings of the measurement series around their 1; 2; 3 … after certain
variables:
common mean value. It equals the mean square deviation of A measurement consists
the single readings from the mean value and is computed of one or more single
readings (“channels”) that
according to the equation found in the appendix “Statistical are identified by consecu-
formulas of measurement technology for the tive numbers (1,2,3).
FISCHERSCOPE X-RAY”
Example “Dual coating
measurement”
@STFThe text “Calibration standard-free” Top coating thickness = 1
appears in the print form at that location where the variable Intermediate coating
thickness = 2
@STF has been inserted in the print form template.
Prerequisite:
The current product accesses a measurement application
that has been calibrated standard-free.
This means:
No calibration standards have been entered into the
calibration standard set of this measurement application and
used for the calibration.
FISCHERSCOPE® X-RAY 75
Setting Up the Print Form Using PDM Variables Available for the Final Evaluation
To a large degree, the variables for the final evaluation are identical
to those of the block evaluation.
The following variables differ in their meaning from those of the
block evaluation or are available for print form templates for the
final evaluation in addition to those for the block evaluation:
76 FISCHERSCOPE® X-RAY
Variables Available for the Final Evaluation Setting Up the Print Form Using PDM
FISCHERSCOPE® X-RAY 77
Setting Up the Print Form Using PDM Variables Available for the Final Evaluation
78 FISCHERSCOPE® X-RAY
Products with a Variable or Fixed Block Size Setting Up the Print Form Using PDM
Evaluation mode for products with variable block size: Products with variable
block size
For products with variable block size, all single readings of the
current product, or the single readings of the blocks to be evaluated
selected from the block selection, are used to determine the final
result.
Select block:
Menu command “Evaluation -> Block selection”
FISCHERSCOPE® X-RAY 79
Setting Up the Print Form Using PDM Products with a Variable or Fixed Block Size
80 FISCHERSCOPE® X-RAY
Special Features for SPC Charts Setting Up the Print Form Using PDM
When the option box “all” is checked, the SPC charts of all
quantities to be measured (attributes) will be inserted in the print
form template one after the other.
“Height” or “Width”
Use these fields to enter the height, or the width, of the SPC chart
to be printed.
The size specifications will appear in square brackets immediately
following the variable after inserting the variable in the print form
template
FISCHERSCOPE® X-RAY 81
Setting Up the Print Form Using PDM Printing the Print Form Using the Supplementary Software PDM
(e.g., @SP1[150,90]).
NOTE: Note: You can only enter numbers in these fields if
the option box “Size user-defined” is checked.
Call using the menu command: Call using the menu command:
“Evaluation > Print form block “Evaluation > Print form final
evaluation” evaluation”
The final print form evaluates only those blocks that have been
selected before for the final print form using “Evaluation”, sub-menu
“Block selection” or the command button “Block selection” (cf. figure
on the side).
Before printing, the print form can still be edited (e.g., removing the
video image: Click the image and press the Del key) or text entered.
These changes disappear once the Print window is exited and
“Print form block evaluation” or “Print form final evaluation” is
selected again.
82 FISCHERSCOPE® X-RAY
Printing the Print Form Using the Supplementary Software PDM Measurement Uncertainty and Measuring Ranges
FISCHERSCOPE® X-RAY 83
Measurement Uncertainty and Measuring Ranges Meaning of the Measurement Uncertainty
84 FISCHERSCOPE® X-RAY
Random Error Measurement Uncertainty and Measuring Ranges
FISCHERSCOPE® X-RAY 85
Measurement Uncertainty and Measuring Ranges Systematic Error
86 FISCHERSCOPE® X-RAY
Display of the Measurement Uncertainty Measurement Uncertainty and Measuring Ranges
standard set, cf. figure below. For the confidence interval, the
general provision according to Section 1 applies here as well.
Setting of the error display for screen output and export in the
"Calibration standard set". Default setting: Systematic portion.
FISCHERSCOPE® X-RAY 87
Measurement Uncertainty and Measuring Ranges Display of the Measurement Uncertainty
88 FISCHERSCOPE® X-RAY
Display of the Measurement Uncertainty Measurement Uncertainty and Measuring Ranges
FISCHERSCOPE® X-RAY 89
Task Programming Starting a Task
12 Task Programming
The commands are similar (or in some cases equal to) the import
commands. The list of commands represents a TXT file which can
be edited by common programs. WinFTM supports this
"programming" by a tool which inserts the selected commands with
a double-click in the command list of the task.
90 FISCHERSCOPE® X-RAY
Getting Started with Task Programming Task Programming
There are some predefined examples which are helpful for testing.
The user should start his task programming by a modification of
these examples. The "Save as .." option can be used to create new
task files. The commands and examples are described below.
3. The command (cf. list of task commands below) starts with a "|" -
except from the first command.
Please note! If there is no vertical line "|" in front of the first com-
mand, the task will not be operable!
4. Characters following a ";" are ignored - up to the next "|".
Hence, all what follows a semicolon is a comment.
5. The commands, variables, and arguments have to be separated
by a TAB. Otherwise they are ignored.
6. Each command returns a logic argument TRUE or FALSE.
Normally, TRUE is for O.K. and FALSE is for Error.
Other meanings are possible, please see below.
All task commands are listed in the right part of the dialog window
"Create task". They are listed within functional groups and are
accessible within a hierarchic order. Click the knot symbol left of the
functional group's name. This will give you direct access to the
single task commands.
CodeVariable(s)Description
Measurement
f40 N measuring time = N sec.
f01 - Starts a single a measurement
f02 - Starts a XY-RUN
f41 - Ready for measuring ?
Returns TRUE (OK) or FALSE (Error)
f60 - Switch ON "Measuring calibration standards"
f61 - Switch OFF "Measuring calibration standards"
Product handling
FISCHERSCOPE® X-RAY 91
Task Programming List of Task Commands
Block handling
f20 S Sets Order No.= S
f21 S Sets Lot No.= S
f22 S Sets Operator = S
f25 - Closes block
XY(Z)-stage
f30 x,y,zTable moves to x,y,z (abs. coordinates)
f31 x,y,zTable moves to x,y,z (rel. coordinates)
f32 - Sets offset
f33 - Deletes offset
f35 - Deletes all XY(Z) coordinates
f36 x,y,zAppends XY(Z) coordinates (abs.)
f37 x,y,zAppends XY(Z) coordinates (rel.)
f38 - Test coordinates
f39 - Resets the test counter
Evaluation
p01- Opens block report
p02- Print key (in block report)
p05- Closes block report
p10- Deletes last block
p15 -Deletes last measurement
f62 - Online export ON
f63 - Online export OFF
92 FISCHERSCOPE® X-RAY
List of Task Commands Task Programming
FISCHERSCOPE® X-RAY 93
Task Programming Example Specification Limit Commands
S Meaning
(“i” represents the number of the measurement data column)
Task:
The values of the “current measurement data set” in the three-line
table shown below are sought.
! Caution
The placeholder i does not stand for the consecutive number of
the measurement data set within the test series!
(Note: correctly, this would be the designation n)
94 FISCHERSCOPE® X-RAY
Example Specification Limit Commands Data Back-up
Solution: The values below from the third line (where n=3) were
sought:
13 Data Back-up
Save the complete installation regularly with a backup program like Protect your data - back
Acronis. them up!
You can also copy the complete folder C:\FischerProg to a separate
data medium (network drive, external hard disk).
Thus, you are able to restore the data in case of a disk crash or
accidental erasure of important files.
FISCHERSCOPE® X-RAY 95
Mass per Unit Area and Geometric Coating Thickness Example Specification Limit Commands
The number of atoms or the mass per unit area can be determined
from the fluorescence spectrum. However, this area-related mass
AM (e.g., in g per m² or mg per cm2) is not the typically preferred
unit of measurement in coating technology - rather, the coating
thickness Th (e.g., in μm) is normally used for the designation of the
coating process or for the specification of the coated product and is
usually requested in the supplier’s document.
Thus, the mass per unit area needs to be converted into the coating
thickness.
The correlation between mass per unit area AM and the geometric
coating thickness Th is
Th = AM / (1)
Physical background
An XRF coating thickness test instrument evaluates the intensities
of the radiation of the coating and substrate materials. The intensity
96 FISCHERSCOPE® X-RAY
Example Specification Limit Commands Mass per Unit Area and Geometric Coating Thickness
FISCHERSCOPE® X-RAY 97
Mass per Unit Area and Geometric Coating Thickness Correlation between Mass per Unit Area and Coating Thickness
! Important:
The thickness measurement using X-ray fluorescence assumes a
well-defined and constant density .
98 FISCHERSCOPE® X-RAY
Correlation between Mass per Unit Area and Coating Thickness Mass per Unit Area and Geometric Coating Thickness
Examples:
FISCHERSCOPE® X-RAY 99
Mass per Unit Area and Geometric Coating Thickness Calibration Standards from FISCHER
The user has the duty to check and monitor each individual
measurement application in the instrument, not only the instrument
as a whole. The instrument manufacturer cannot satisfy this task.
He may provide a calibration service but cannot continuously pay
attention to the trueness of the measurements. The basic
requirements of measurement device monitoring are that they are
carried out regularly and that they are documented. Thus,
measurement device monitoring is a task of the user who should
delegate this task to a trustworthy person with sufficient expertise.
The displayed value of any measuring instrument will not be exactly Repeatability
the same when repeating a measurement, instead it will vary, even Conditions
under otherwise equal measurement conditions (repeatability
conditions), due to random influences of the instrument. If repeated
measurements do not exhibit variations, either the resolution
(decimal places) is too low such that the variations are not visible
or the instrument is defective and shows the same value at all
times. The resulting deviations are considered random because it
cannot be predicted whether the next measurement is bigger or
smaller than the result of the test series up to that moment.
This can be observed, for example, with round robin tests on the
same sample with a marked reference area, even if each
instrument is correctly calibrated and checked. The reasons are the
random deviations of each single reading, and thus of each mean
value of a test series, the random deviations at each calibration,
and also the fact that each calibration standard is labeled with a
nominal value that through its measurement is also afflicted with an
unavoidable deviation from the true value (expressed by the
uncertainty of the standard). The sum of these deviations is
expressed in the comparative precision of the measurement
method. The repeatability precision characterizes the random
deviations of the results that are obtained at one instrument by one
person with one and the same sample at the same measurement
location at repeated measurements, i.e., under repeatability
conditions. Comparative precision describes the random deviations
between different instruments, calibrated with different calibration
standards, at repeated measurements performed by different
persons at the same sample using the same measurement
locations (measurements under comparable conditions).
How to test?
A measurement application that is calibrated and checked using
calibration standards and if necessary corrected and documented,
is considered secure. Measurements with a secure measurement
application provide correct measurement readings. This condition
should essentially continue for a long period, however, as
mentioned above, the measurement application can change,
because inevitably sooner or later the instrument changes. Users
must, therefore, check and if necessary correct each measurement
application regularly and as often as is economically feasible.
NOTE: For the Fischerscope XRAY with the WinFTM Soft-
ware, each product file contains in addition to the
measurement application for the sample a parallel
measurement application for the calibration stan-
dards (with an identical calibration but with a poten-
tially different substrate material). The parallel
measurement application can be used to measure
the calibration standards. Thus, the problem men-
tioned does not exist: a substrate material correction
when re-measuring is unnecessary and the test is,
therefore, simpler.
We recommend performing the checks using reference samples or
calibration standards. They are well suited for long-term monitoring
because one can assume that the samples do not change over a
long period as opposed to the measurement application and thus
one can easily recognize changes of the measurement application.
A reference sample is a coated storage sample from the production
that corresponds in its structure (order and composition of the
coatings and substrate material) to the measurement application to
be checked, and that exhibits a marked measurement spot
(reference area) and that is positively identifiable. Within the
reference area, the reference sample should exhibit essentially no
coating thickness differences, referenced to the mean value.
Checks with reference samples offer the advantage that the
reference samples are less expensive, that they can always be
replaced by new samples, that the standards are spared and that
the check may therefore be carried out more easily. Reference
NOTE: Note: The equations and factors used here are all de-
scribed in the equation collection of the operator’s
manual for the Fischerscope XRAY. The control limits
can be calculated using the ”calculator” functions in
the control chart of WinFTM. Beyond that a spread-
sheet that contains the equations beneath for the cal-
culation of the control limits can be used for the pre-
run.
The pre-run consist of a minimum of m = 10 groups each with
n = 5 single readings, i.e., a total of 50 measurements. The
measurement application and the identity designations must be
documented.
This overall mean value forms the estimated value x_est for the
mean value of the quality control chart.
The limit values calculated in this manner are accepted into the
quality control chart and serve the purpose of deciding whether the
measurement application must be corrected or not. Violation of the
upper or of the lower control limit means that a control correction of
the measurement application is required. The WinFTM software of
the Fischerscope XRAY facilitates (like its predecessor program
FTM for DOS) the set-up of products using quality control charts
specifically for monitoring the measurement devices and to
calculate the control limits automatically from the pre-run.
Example of a pre-run
10 groups, each with 5 measurement readings, have been
measured under repeatability conditions using a nickel-plated and
copper-plated reference sample (substrate material iron). For this
purpose, the number of single readings per group (in the ”Figure”)
is set to a fixed number (here n=5) in the product ”Ni/Cu/Fe
reference sample 10-245”.
All printed values are available in the print form of WinFTM PDM as
variables (including the control charts). They can re-calculate the
printed control limits by using the original values (mean value x. and
standard deviations s) and the equations specified in the previous
section. Please note that the pre-run has been concluded within a
short period (here: 17 minutes) in order to ensure the stability of the
instrument during the pre-run.
The protocol shows the video image of the reference sample that
the camera of the Fischerscope XRAY has recorded. The
measurement area is identified by an orange-colored ring, the
measurement spots where the instrument made individual
measurements during the pre-run are identified by yellow crosses.
Even though the reference area is small compared to the
dimensions of the sample, the distribution of the coatings within the
reference area can be non-uniform. Because during the check
measurement any measurement spot may be selected within the
reference area, a potential inhomogeneity of the coating
thicknesses must already be taken into account during the pre-run.
If the lower and upper limits are too far apart in reference to the
confidence interval, then the reference sample is not suitable due
to a non-uniform coating thickness within the reference area or
because the sample cannot be positioned and measured in a
reproducible fashion. It is then recommended to use a different
specimen as a reference sample.
16 Def.MA
If you have activated the SUPER software, you can create a Def.MA by yourself.
The usage of the SUPER software requires deep knowledge of the physics of x-ray fluorescence and
the functionality of the instrument.
Alternatively, you can request a new measurement application from FISCHER. FISCHER offers a
professional service for the creation of customer’s Def.MA.
When you create a new Def.MA, you can choose between different modes. The mode determines
the measurement method and the presentation of the measurement readings.
Mode Application
Material analysis For the analysis of bulk material (massive specimens).
Analysis with bal- For the analysis of bulk material (massive specimens), if the specimen can-
ance not be defined completely by 100 percent.
Typical applications: recycling, RoHS, soil specimens, biological specimens
Thickness mode For coating thickness measurements. The measurement results for the coat-
ing thickness are displayed in the typical units of length such as μm. The
analysis results are shown in percent units.
The density values of the elements are taken from internal tables. You do
have the option to change these values.
Mass per unit For coating thickness measurements. The overall area mass is displayed as
area (relative) well as the percentage portion of the individual elements.
Mass per unit For coating thickness measurements. The overall area mass is displayed as
area (absolute) well as the individual area masses of the respective elements.
Solution analysis You fill the measuring cell with the solution to be analyzed, see Chap. 19.2
on Page 148.
ROI-Mode ROI = Region of interest
Only a defined portion of the measures spectra is evaluated. You define
one or more regions (ROI) of energy channels. The portion of the spectra
that is located in the defined region is evaluated only.
Counting rates are issued, the fundamental parameter method is not used.
Used for special applications, where the fundamental parameter method is
not applicable.
Mode Application
Component mode For the analysis of specimens, which are not only composed of pure ele-
ments, but also contain chemical compounds (e. g. oxides). WinFTM offers
a list of components, which can be used like elements.
The result display shows the measurement readings of the complete compo-
nents, not only the elements the components are composed of.
Component mode For the analysis of bulk material (massive specimens), if the specimen can-
with balance not be defined completely by 100 percent and the specimen is not only
composed of pure elements, but also contain chemical compounds (e. g.
oxides).
The result display shows the measurement readings of the complete compo-
nents, not only the elements the components are composed of.
Typical applications: recycling, RoHS, soil specimens, biological specimens
The creation of a new Def.MA in the thickness mode (see Table 16-1 on Page 121) is described
here. If you create a new Def.MA in another mode, the steps may differ.
Procedure
1. In the WinFTM main menu select Calibrate > Def.MA new… > <Mode, see
see Table 16-1 on Page 121>.
The window Definition of measuring conditions… appears.
2. In the field Label enter an explicit name for the new Def.MA file.
3. In the field located right above select the high voltage and the primary filter (if present). The
high voltage and the primary filter has to fit your measurement task.
Enter the layer composition of your specimen as follows:
Start with the top layer, continue with all other layers and end with the base material (substrate
material) as the last layer.
4. Click New Layer.
The window Definition of Elements New Layer appears.
5. In the area Thickness select an option.
6. In the area Composition select an option.
7. Click Periodic system.
The window Periodic system appears.
8. In the window Periodic system click the element that the layer is composed of.
The element, the percentage and the density are displayed in the lower area of the window
Definition of Elements New Layer.
In case of a complex layer (mixture of materials or alloy) enter more elements and their percent-
ages.
9. Click Elem.+ to transfer the values to the display field.
The values of the entered layer appear in the large display field.
10.Repeat steps 8 to 9 for each element of the current layer.
11.Click OK to finish the value entry for the current layer and to save the data.
The window Definition of Elements New Layer disappears. The values of the layer appear in
the large display field of the window Definition of measuring conditions….
12.Repeat steps 4 to 11 for each layer of the coating system until all layers are entered.
Enter the base material (substrate material) like another layer with the following options:
a In the area Thickness check the option The thickness of the layer is fixed (known).
b Check the option Massive (Sat.)
13.Click OK to close the window Definition of measuring conditions….
By entering compensation spectra you can increase the accuracy of the measurement.
Procedure
1. In the WinFTM main menu select Calibrate > Def.MA modify….
The window Def.MA modify appears.
2. Select the Def.MA and click OK.
The window Definition of measuring conditions… appears.
3. In the window Definition of measuring conditions… click Compens.Spectra.
The window Spectrum Background appears.
4. You can select one or more of the following options:
• Compensation Elements
In the area Compensation Elements you can enter up to four elements. The entered compen-
sation elements are filtered out of the spectrum. If the relevant element area not shown in
the list field, check full Element list.
Example tin on glass: The glass contains Strontium (Sr) in variable concentration. If you
enter Sr as compensation element, the spectral lines caused by Sr are filtered out. The vari-
able amount of Sr does not influence the measurement reading.
• Compensation Spectrum
If a suitable compensation spectrum is available, you can activate the option yes in the in
the area Compensation Spectrum and enter a name for the spectrum, e. g. glass or plastics.
At a later moment during the calibration you will be prompted to position the compensation
spectrum. The name entered here will then be displayed.
Example tin on glass: The glass causes a scattering spectrum (also referred to as back-
ground spectrum or base spectrum). If a sample is available that is comparable with the
specimen and has no tin coating, you can enter here glass. At a later moment during the
calibration you will be prompted to position the glass sample. WinFTM measures then the
compensation spectrum and takes it into account when evaluating the spectrum.
• Base Spectrum
If a suitable base spectrum is available, you can activate the option yes in the in the area
Compensation Spectrum and enter a name for the spectrum, e. g. glass or plastics. At a
later moment during the calibration you will be prompted to position the base spectrum.
The name entered here will then be displayed.
• Background correction
If the theoretical characteristics (measured or calculated) of the compensation spectrum
differs from the actual characteristics, you can reach a correction by using this option. You
can choose from three options: no correction, with supporting points and by polynomial.
5. To close the window Spectrum Background click OK.
6. To close the window Definition of measuring conditions… click OK.
In the window Def.MA there is a field that displays the measurement mode.
Depending on the used Def.MA mode (see Table 16-1 on Page 121), this field has the name
Mode, Analysis Mode, Thickness Mode, Mass per unit area (relative/absolute), Components‘s
Mode or Solution Analysis. The meaning of the individual symbols is:
c Measurement of the concentration
d Measurement of the coating thickness
g Measurement of the area mass
Capital letters at the beginning of a series of symbols indicate the beginning of the substrate ma-
terial (base material).
Example: dCcc
d The coating thickness of the top layer (consisting of one element) is being
measured and
Ccc the concentrations of the substrate material, which contains three elements,
are being analyzed.
The instrument is equipped with a motor-driven measuring stage. You can program coordinates for
measurement points in order to let the instrument measure automatically at various locations on the
specimen. In this manner, you can define, for example, 100 measurement points and let the meas-
urement run automatically over night at these measurement points.
The following table describes the various programming options for the coordinates and references
the respective chapters.
Using the Point & Shoot method, you can travel very quickly to the desired measurement location
on the specimen.
Procedure
1. On the video image, position the mouse pointer at the desired measurement location.
2. Press the left mouse button.
The mouse pointer assumes the form of crosshairs and the measuring stage travels until the
clicked measurement point is precisely in the crosshairs.
Using the Point & Save method, you can travel very quickly to a desired measurement location on
the specimen and save the associated coordinates. This function is not active when programming
an array.
Procedure
1. On the video image, position the mouse pointer at the desired measurement location.
2. Press the center mouse button.
The measuring stage travels until the clicked measurement point is precisely in the crosshairs.
The instrument stores the coordinates automatically into the coordinates list.
Using the Point & Measure method, you can travel very quickly to a desired measurement location
on the specimen and immediately make a measurement at this measurement location.
Using the window Go to XY(Z) position, you can control the measuring stage from the screen.
Moving the measuring stage using the control field XY-Axis and Z-Axis
1. Enter the desired travel path in the entry field in the center of the four direction arrow command
buttons.
2. Click on a direction arrow button.
With every click on a direction arrow button, the measuring stage travels the desired distance
in the respective direction, measured relative to the last current position.
1 2 3 4
No Element Function
1 Video field Here you can see the specimen
2 Programming Here you select, what you intend to program (individual points, circle,
field etc.), enter the coordinates and save the values.
No Element Function
3 Measuring Here, the programmed points on the measuring stage are shown.
stage field
4 Table field Here, the coordinates are displayed.
You can delete individual coordinates or all coordinates. Always delete all stored coordinates be-
fore programming new coordinates.
Procedure
To delete all stored coordinates:
1. From the window XY(Z) coordinates select Coordinates > Delete All.
The window WARINING: All items will be deleted! appears.
2. Click OK.
To delete one stored coordinate:
► From the window XY(Z) coordinates select Coordinates > Delete.
You can program any desired points on the XY(Z) stage, travel to each individual point and then
store its coordinates.
Procedure
1. From the programming field select the option Points.
2. Travel to the desired measurement point: In the video image, use the mouse to click the desired
location or use the joystick at the front of the instrument.
3. Click Store.
4. Repeat steps 2 to 3 for each desired measurement point.
To program a line, define the starting point and the end point and the number of interim points on
the line.
Procedure
1. From the programming field select the option Points.
2. Travel to the starting point of the line: In the video image, use the mouse to click the desired
location or use the joystick at the front of the instrument.
3. Click Store.
4. In the field No. of intermediate pos., enter the number of points on the line.
5. Travel to the end point of the line: In the video image, use the mouse to click the desired loca-
tion or use the joystick at the front of the instrument.
6. Click Store.
The line is generated from the starting point, the end point and the entered interim points. The
interim points are distributed evenly over the distance.
To program an array, define the upper left and the lower right point of the array as well as the
points that shall be contained in the array.
Procedure
1. From the programming field select the option Array.
2. Travel to the top left point: In the video image, use the mouse to click the desired location or
use the joystick at the front of the instrument.
3. Click 1. Pos >>.
4. Travel to the bottom, right point: In the video image, use the mouse to click the desired location
or use the joystick at the front of the instrument.
5. Click 2. Pos >>.
6. Enter the number of columns and rows of the array in the fields Columns N (x) and Rows N (y).
7. From the field Route for RUN, select the order in which the individual points of the array shall
be visited.
You define a single point and any desired number of points in relation to this point. You can repeat
this arrangement of points (pattern) any number of times. In this manner, you can travel to the same
coordinate sequence on different parts or at different locations.
Procedure
1. From the programming field select the options Points + Pattern.
The following Figure shows a section of the window for coordinates programming.
Pattern
Individual Points
You define a center of a circle, the number of measurement points on the circumference of the circle
and the starting point.
Procedure
1. From the programming field select the option Points.
2. Travel to the desired center of the circle: In the video image, use the mouse to click the desired
location or use the joystick at the front of the instrument.
3. In the field Radius enter the radius of the circle in mm.
4. In the field Nb. of meas. points enter the number of measurement points on the circumference
of the circle.
5. In the field Start point enter the starting point. Example: 0° means that the first measurement
point is at “12 o’clock”.
6. Click Calculate.
The measurement points are being calculated.
In addition to the measurement points (individual points, lines, arrays or circular coordinates), you
can also program one or two datum points. You can then change parts, or place parts anew and
ensure that always the correct coordinates are visited, even if the specimen is not positioned 100%
at the same place.
You can program one or two datum points.
Program one datum point, if you can be certain that the placed parts cannot be turned,
ref. Fig. 17.2.
Figure 17.2:Working with one datum point (1: Datum point, X: Measurement points)
Program two datum points, if the parts can be turned as well when they are placed, ref. Fig. 17.3.
Figure 17.3:Working with two datum points (1,2: Datum points, X: Measurement points)
Procedure
1. From the programming field select the options 1 Datum Point or 2 Datum Points.
2. Travel to the first datum point: In the video image, use the mouse to click the desired location
or use the joystick at the front of the instrument.
3. Click Dat.1.
The datum point is stored.
4. If you work with only one datum point, skip the steps 5 and 6.
5. Travel to the second datum point: In the video image, use the mouse to click the desired location
or use the joystick at the front of the instrument.
6. Click Dat.2.
The second datum point is stored.
Procedure
1. To store the coordinates and close the window XY(Z) coor-
dinates click Save + Exit.
2. Perform the following steps if you programmed datum points:
a Travel to the first datum point: In the video image, use the mouse to click the desired
location or use the joystick at the front of the instrument.
b Set the first datum point: Select XY(Z)-Axis > Set Offset (1.Datum).
c If you work with only one datum point, skip the steps d and e.
d Travel to the second datum point: In the video image, use the mouse to click the desired
location or use the joystick at the front of the instrument.
e Set the second datum point: Select XY(Z)-Axis > Set Offset (2.Datum).
3. Click RUN to start the automatic measurement.
The programmed points are visited automatically and the measurements are performed at
these points.
A base correction (also referred to as substrate material correction) is only possible, if the base is
an alloy.
A base correction is required whenever the base composition changes from one specimen to the
next.
Au/Ni/(CuSn6)
The Au coating and the Ni coating on bronze
shall be measured.
Measurement mode: d d -
Dual coating
The base is CuSn6
A base correction affects only the current measurement application. All other measurement appli-
cations remain unaffected.
Procedure
1. To start the base correction, select Calibrate > Base correction.
The window Element: Measure product‘s base material appears.
2. Position the base material, then click OK.
18.2 Calibration
Calibration standard set Consists of a calibration standard set with several calibration
(Cal-NS) standards of a specific coating/base material combination.
Individual calibration Individual calibration standard of a certain coating/base material
standard combination
(Cal-N)
Calibration foil Calibration foil consisting of a free carrying layer of a certain ele-
(Cal-F) ment. Universally usable on many different base materials.
Customer-specific
standards
Procedure
1. In the WinFTM main window select Calibrate > Calibration Standard Set….
The window
Standard No. 1 appears.
4. Enter the name of the
standard (e. g., AAMGW).
5. Enter the values of the cali-
bration standard. Click the
field three times in order to
enter a value.
Typically, the default setting applies but you do have the option of changing the values.
The following applies to the measuring time T_cal:
• The longer the measurement, the better the repeatability precision. Do not select a meas-
uring time that is too short; 30 or 60 seconds is a typical value.
The following rules apply to the number of individual measurements N_cal:
• Pure elements, base materials or scatter spectra need to be measured only once.
• Calibration standards must be measured several times on each standard, at least three
times but typically five times. Perform the measurements at different locations on the calibra-
tion standard.
Depending on the measuring application, different prompts will appear that have the following
meaning:
Scatt A scatter spectrum shall be measured. As a rule, it is already
saved in the software and can be opened automatically from the
menu General > Load Spectrum and Evaluate…. Measure a
scatter spectrum (e.g., plastic) if the spectrum does not exist.
Element: Ni The pure element Ni from the pure element board shall be
measured.
Base material Cal. Std. The base material of the calibration standard set shall be
Set (Analysis) measured.
Example: If you calibrate using the calibration standard set
Ni/Cu alloy, Cu is the base material of the calibration
standard set.
Base material specimen The base material of the real part shall be measured. An
(Analysis) uncoated real part must be used for this purpose.
Base (specimen) The base material of the real part shall be measured. An
uncoated real part must be used for this purpose.
Ni-Zn/Fe 5.0 15.0 0.0 A calibration standard made of NiZn/Fe with a coating thickness
of 5 μm and a Ni content of 15 % shall be measured.
13.Position the standard, close the measuring chamber, adjust the focus and click Start.
The instrument will perform the measurement.
After the measurement, you will be prompted either to measure a new standard or to measure
the same standard one more time. If you measure the same standard again, move it slightly to
measure it at a different location.
1 2 3 1 2 3
The calibration was successful if all re-measurements are within the respective ranges and you are
able to use the measuring application.
If a standard is outside the range, check to see of this measurement range is relevant for your meas-
uring application. If the measurement range is not relevant for your measuring application, you can
still use the measuring application.
If several re-measurements are outside the range, check the data and potential error sources. Then
perform a new calibration.
For special measuring applications, other conditions may apply for a successful calibration. How-
ever, these will be stated separately.
19 Solution Analysis
For the solution analysis you need a measuring cell. You fill the measuring cell with the solution to
be analyzed, position the measuring cell and perform the measurement.
The measuring cells are available with different reference plates. When selecting the measuring
cell, note that the characteristic x-ray lines of the sample to be measured may not be too close to
the x-ray lines of the reference plate material. Otherwise, problems may arise during the evaluation
of the spectrum.
Procedure
Procedure
1. Place the measuring cell into the measuring chamber. Depending on the instrument type, the
cup opening must face upwards or downwards:
• Instrument with measuring direction from top to bottom: Cup opening must face upwards.
• Instrument with measuring direction from bottom to top: Cup opening must face down-
wards.
To make the focusing easier, position the measuring cell such that the measurement beam does
not point to the center, but to the edge curvature of the measuring cell, see the following figure:
Procedure
Usually you obtain either a product file or a Def.MA file for the solution analysis from FISCHER.
If you obtain a product file from FISCHER, you need to import the product file (see Chap. 19.5.1
on Page 151). The product file contains all relevant settings.
If you obtain a Def.MA file from FISCHER, you need to import the Def.MA file (see Chap. 19.5.2
on Page 151) and then you need to set up a new product file based on this Def.MA file (see
Chap. 19.5.3 on Page 152).
If you have installed the SUPER software, you can create a Def.MA for the solution analysis by your-
self.
The usage of the SUPER software requires deep knowledge of the physics of x-ray fluorescence and
the functionality of the instrument.
Alternatively, you can request a new measurement application from FISCHER. FISCHER offers a
professional service for the creation of customer’s Def.MA.
If you have received a new product file from FISCHER, you need to import it. The file name has the
extension *.sav, *.sv1 or *.sv3.
Procedure
1. If you have received the product file by email as a file attachment, save the file in a directory
that does not belong to WinFTM, e.g. C:\temp.
2. If you have received the product file by CD, insert the CD into the CD drive.
3. In the WinFTM main window select Product > Copy to/from File….
The window Copy from/to file appears.
4. Select the tab File >>> Product.
5. Click Select.
The window Select file appears.
6. Select the product file and click Select.
The selected path appears in the field File.
7. Click Start copy.
The file will be copied. After this the report The product was copied successfully appears.
8. Click OK.
9. To close the window, click cancel.
If you have received a new Def.MA file from FISCHER, you need to import it. The file name has
the extension *.pb0. After this you create a new measurement application and a product based
on the imported Def.MA.
Procedure
1. If you have received the Def.MA file by email as a file attachment, save the file in a directory
that does not belong to WinFTM, e.g. C:\temp.
2. If you have received the Def.MA file by CD, insert the CD into the CD drive.
3. In the WinFTM main window select Product > Copy to/from File….
The window Copy from/to file appears.
4. Select the tab File >>> Def.MA.
5. Click Select.
The window Select file appears.
6. Select the Def.MA file and click Open.
The selected path appears in the field File.
Procedure
1. In the WinFTM main menu select Product > New….
The window Select an application appears.
2. Click New.
The window Select a Def.MA appears.
3. Select the Def.MA and click OK.
The window Input of the application name appears.
4. Enter in the field Name an identifier for the new measurement application and click OK.
If your instrument is equipped with changeable apertures (collimators), the window Select
collim. + meas. dist. appears. Select the standard collimator No. 2 and click OK.
The window Input Calibr. Std. Set appears.
5. Do not enter anything in this window and click OK.
6. If your are prompted to measure scatt, do not perform a measurement, but perform the
following steps instead:
a In the WinFTM main menu select Tools > Load Spectrum and Evaluate….
b If the window Open appears, select the file scatt and click Open.
The window End of calibration. Accept? appears.
7. Click Yes.
8. The window Create new product appears.
9. Enter a name, directory and number for the new product and click OK.
10.To check the measurement time and the number of measurements click Info.
The window Modify product appears.
11.Click the tab Product.
12.Check the values for the measurement time and the number of measurements. Change the
values, if necessary.
The longer the measurement time, the better the repeatability precision. Do not select a meas-
uring time that is too short; 30 or 60 seconds is a typical value.
13.Click OK.
The new product file is set up and the related measurement application is normalized.
If you have installed the SUPER software, you can create a Def.MA for the solution analysis by your-
self.
The usage of the SUPER software requires deep knowledge of the physics of x-ray fluorescence and
the functionality of the instrument.
Alternatively, you can request a new measurement application from FISCHER. FISCHER offers a
professional service for the creation of customer’s Def.MA.
You cannot switch to the calibration standard set of the product and cannot modify it.
A maximum of 22 elements can be written into the analysis task (excluding the material of the
reference plate and oxygen).
NOTE:
You can set up more complex Def.MAs for solution analyses using the standard Def.MA window.
However, doing so requires more background knowledge and greater diligence.
You can export the measured values, their XYZ coordinates, statistical evaluations and other data
to other applications like spreadsheets, statistical evaluation tools or process control systems.
All settings for the measurement data export are assigned to one product. For each product, you
can define different settings for the data export.
Basically there are two modes for exporting measurement data: online export and export on de-
mand.
A simple data export in the Export on demand mode is described here to explain the basics of data
export.
Procedure
1. To define the export settings, select in the WinFTM main menu
Evaluation > Export > Export Setup….
The window Exporting Data appears.
3. To start the data export, select in the WinFTM main menu Evaluation > Evaluate All Blocks….
The window Evaluation appears.
4. In the window Evaluation select the blocks, whose data shall be exported and click Export.
The data will be exported.
5. Click OK.
Each product has its own data export settings, i. e., the export settings in this dialog window apply
only to the current Product.
► To open the window Exporting Data, select in the WinFTM main menu
Evaluation > Export > Export Setup….
Control Explanation
Online-Export ON The measurement data is exported continuously when measurement data
is acquired by the instrument.
The reading is exported directly after a measurement is made.
The block statistics are exported upon block closure.
With product selection, the header is exported.
Template and No. The name and the number of the export template are displayed if an ex-
port template is assigned to the current Product.
► To assign an export template, click Select….
Deletes the assignment of an export template to the product.
Export destination
append to file Data is successively written to a file.
Complete file- WinFTM waits until the handshake file NET_EXPT.END is deleted. This
handshake (NET_- control box should be enabled only, if the technology of the target com-
EXPT.END) puter is capable of handling it.
overwrite file The export file contains only the last exported values, i. e. the old data
will be overwritten.
Destination file Displays the destination file, if already assigned.
► To assign a destination file for the data export, click Select….
Filename variable By clicking the list box you can select a rule, how the file name of the ex-
ported data will be created.
send to serial port Data is sent directly to the RS232 interface.
The parameters of the RS232 interface and of the WinFTM software of
the receiving instrument must be the same. Otherwise the receiving instru-
ment will not be able to read the data exported via the RS232 interface.
► To set the parameters of the RS232 interface select
Evaluation > Export > Define export interface….
to OLE-Automation WinFTM can be remote controlled via OLE and can transfer data via
OLE. A Visual-Basic (Version 6) program example is included on the Win-
FTM installation CD in the directory Service\OLE_Import_Sample_Visual-
Basic_6.0\AutomationDemo. This sample program can be used as a
template for the customers own remote control software.
Control Explanation
to Excel The data will be directly sent to an Excel file.
A new Excel workbook (Workbook 1) opens with the first exported value.
Even if Excel is already opened, a new workbook will open with the first
exported value. In the field Startposition Column Row enter the cell,
where the table shall start, e.g. C4.
@TAB must be inserted in the export template as column separators. In
addition, a period (.) and not a comma (,) must be selected as the deci-
mal character. Depending on the country setting, Excel might still display
the comma (,) as the decimal separator character. At the end, the Excel
workbook (Workbook 1) must be saved.
► Do not close Excel as long as WinFTM is still open.
to OPC-DA1..3 For the connection of the PC to a programmable logic control via Profib-
us, Profinet
to TCP-IP For the connection of the PC via TCP/IP
The format in which measurement data and other data is written to a file during data export is spec-
ified in an export template. With the export template you control, which data is exported and the
layout, into which the data is exported.
An export template can be assigned to one or several products. For each product you can set up
a specific export template.
Procedure
Do one of the following:
To create a new export template select Evaluation > Export > new template.
The window New export template appears.
In the field Name enter a name for the new export template and click OK.
To modify an existing export template select Evaluation > Export > modify template.
The window Select export template appears.
Select the template you want to change and click OK.
The three sub-windows on the left define the different sections of data to be exported: single read-
ings, block statistics and header info. With the check boxes in the area Export Mode you can ac-
tivate or deactivate the sections.
In the figure above only Single reading is checked, that is, only the section for single readings is
exported, the code in the other sub-windows will be ignored.
Table 20-3: The meaning of the sub-windows for Online Export and Export on demand
The sub-window on the right shows all variables with a short explanation.
To explain the general principle for setting up an export template and the effect of the variables,
the syntax of the default export template is described in this section.
The default export template consists of three parts:
Template for single readings
Template for block statistics
Template for block statistics
General rules for export templates:
An export template can have any chosen length.
An export template must be defined in one row. Carriage returns and line feeds must be
entered by using the variables @CRX and @LFX, not by pressing the enter key.
For more clarity the syntax is shown here in two lines. In the window Definition of Export
Template the template must be written in one line to avoid unwanted carriage returns and
line feeds.
Variable Explanation
@NBR Contains the number of the reading
@TAB A tabulator will be inserted.
@PRF Contains the nam of the operator
@VA Contains the value of the reading, must always be supplemented with the number
of the respective reading, e. g. @VA1
@CRX A carriage return will be inserted.
@LFX A line feed will be inserted.
@END Ends the template
For more clarity the syntax is shown here in two lines. In the window Definition of Export
Template the template must be written in one line to avoid unwanted carriage returns and
line feeds.
Variable Explanation
Block # The text Block # will be displayed.
@TAB A tabulator will be inserted.
@BLK Contains the number of the block
@ANB Contains the value of the field Order No.
@LOT Contains the value of the field Lot No.
@BM1 Contains the value of the field Label 1.
@BM2 Contains the value of the field Label 2.
@CRX A carriage return will be inserted.
@LFX A line feed will be inserted.
x= The text x = will be displayed.
@MW Contains the mean value, must always be supplemented with the number of the
respective reading, e. g. @MW1
s= The text s = will be displayed.
@S_ Contains the standard deviation, must always be supplemented with the number of
the respective reading, e. g. @S_1
@END Ends the template
For more clarity the syntax is shown here in two lines. In the window Definition of Export
Template the template must be written in one line to avoid unwanted carriage returns and
line feeds.
Variable Explanation
@CAL Contains the product name.
@TAB A tabulator will be inserted.
# The character # will be displayed.
@PRN Contains the product number.
@CRX A carriage return will be inserted.
Operator The text Operator will be inserted.
@LFX A line feed will be inserted.
@EL Contains the name of the result channel (element, coating thickness, ppm etc. ),
must always be supplemented with the number of the respective channel, e. g.
@EL1
@DM Contains the unit of the result channel (mils, nm, % etc.), must always be supple-
mented with the number of the respective channel, e. g. @DM1
@END Ends the template
21 Pattern Recognition
The instrument is equipped with a motor-driven XY-stage. Pattern recognition allows you to place
specimens reliably even under difficult conditions. The WinFTM software saves a search item (pat-
tern) and looks for it during the measurement. It then adjusts the XY-stage so that the search item is
found and the measurement is done at the correct position. Advantages:
Reduction of operator influence when the specimens are positioned
Reduction of the influence of the dimensional tolerances of the specimens
Time-saving measurement of e.g. bulk material and plug contacts
You can use the pattern recognition e.g. when measuring the coating thickness on the following
objects:
Contacts on printed circuit boards
Plug contacts
SMD components
To use the pattern recognition function, the WinFTM extension SUPER must be activated.
Videos with pattern recognition applications can be found on the following website:
www.helmut-fischer.com/pattern-recognition
You can combine the pattern recognition with XY programming and task programming. The two
following typical scenarios are explained in this chapter:
The coating thickness on the contact pads of SMD components is to be determined. The position
of the SMD components varies greatly, but the instrument still finds the exact measuring posi-
tion. The clever arrangement of the search item and the search area produces an automatic
feed. In this way, you do not have to carry out any XY programming but can still automatically
measure at several measuring points, see Chap. 21.3 on page 166.
Process control or incoming goods inspections of printed circuit boards: For a printed circuit
board panel with several individual PCB's, the coating of the contact pads is to be checked.
Fluctuations in the positioning and manufacturing tolerances have a strong effect on small struc-
tures. You can roughly pre-position the measuring points with the XY programming and then
move to the exact measuring position with the pattern recognition. You can automate the
complete sequence of measurements with a task, see Chap. 21.4 on page 170.
All settings for the pattern recognition are valid for one product. You can assign every
product its own settings for pattern recognition.
The settings apply to the current image number, i.e. you can make separate settings for
each image.
To start the pattern recognition, select Video > Pattern matching in the menu bar or click the
icon.
The pattern recognition window appears. The settings have the following meaning:
Setting/parameter Meaning
Move to saved xy-coordinates When you have programmed XY coordinates and activated
With progr. XY-Pos., move to a measuring position with these
1. Position
command buttons. You can make all the pattern recognition
Next Pos. settings for this measuring position.
Prev. Pos All pattern recognition settings apply to the current measuring
position/image number, i.e. you can save a separate image
Pos. and separate settings for the measuring position.
Find Starts the pattern recognition, searches for the next image.
Take new picture Transfers the video image of the camera to the pattern recog-
nition.
Error value Shows the error, the deviation between the defined search
item and the found search item.
With progr. XY-Pos. When you have programmed XY coordinates, activate this
option to save a search item for each XY position.
On measure, find automatically When this is activated, the pattern recognition is started
before each measurement, and the icon of the command
button changes:
Algorithms
Mode Selection of the search algorithm; you can find the right one
for your measuring application through trial and error.
Center weight If the search area contains several similar images, you can set
whether and how much the item near the crosshairs should be
preferred.
Error check Defines the threshold for the permissible deviation between
the defined search item and the found item. When the
threshold is exceeded, a window with a warning appears.
Use picture no. / Change Shows the currently saved, valid image number for the XY
position. Change Allows you to assign a different image to
the current XY position.
Setting/parameter Meaning
Replay at Pos.No. If the specimen has repetitive structures (e.g. a panel with sev-
eral individual printed circuit boards), then you can use this to
define the position at which the pattern recognition is to start
again from the beginning.
Max. rotation If the measuring item is arranged so that it is skewed in rela-
tion to the defined search item (e.g. due to skewed posi-
tioning), then the measuring item can still be detected. Enter
the maximum expected rotation angle here; it should not be
larger than necessary though, because this increases the cal-
culation time.
Previous angle Setting: If you have measuring items with sev-
eral measuring positions that could have a skewed position.
Set the angle for the first measuring point, e.g. +/- 120
degrees, and Previous angle for the other measuring points.
This saves calculation time.
Angle= Shows the actual rotation angle that was found; see also
Max. Rotation.
Pattern definition
Total video area When activated, the search item is searched for in the entire
video image.
Show search item Shows the search item (the image that is to recognized). Acti-
vate this option to define the search item.
Show search area Shows the search area (the area of the video image in which
the search item is searched for). Activate this option to define
the search area.
Show cross hair Shows the crosshairs of the video image.
Saved pictures Deletes the current reference image with the corresponding
parameters or all reference images and all parameters.
Clear current
Clear all pict.
Correction / X / Y When the found position is not exactly in the crosshairs, you
can correct it here. Entry in pixels. The correction has a global
effect on the instrument and not just the product.
In the following, the pattern recognition is explained using contact pads of SMD components as an
example. The clever arrangement of the search item and the search area produces an automatic
feed. In this way, you do not have to carry out any XY programming but can still automatically
measure at several measuring points.
All settings for the pattern recognition are valid for one product. You can assign every product its
own settings for pattern recognition.
Procedure
1. Place the SMD components equally spaced on a line, see Fig 21.1 on page 167.
2. Move the XY-stage so that the first component is in the middle of the video image; see Fig 21.1
on page 167.
3. Select Video > Pattern matching in the menu bar.
The Define pattern matching area window appears.
4. In the Saved pictures area, click Clear all pict..
Any video images saved previously in the product are deleted.
5. Click Take new picture.
The video image appears in the Define pattern matching area window.
Measuring position
Search item
Figure 21.1: Pattern recognition window: The hatched rectangle shows the search item, and the
cross shows the measuring position
6. In the Pattern definition area, click Show search item. If the Total video area option is activated,
deactivate it.
A hatched rectangle appears. This rectangle marks the search item, i.e. the area of the image
that is to be found again.
7. Define the search item:
Position of the search item: Place the cursor in the rectangle, keep the left mouse button
pressed and move the rectangle.
Size of the search item: Place the cursor on one of the eight black points, keep the left
mouse button pressed and change the size of the rectangle.
8. Define the measuring position by clicking on the measuring position with the right mouse
button. The measuring position can be inside or outside of the search item rectangle.
9. Set the parameters according to the following table:
Parameter Value
On measure, find automatically Activated
Algorithms area
Mode 2 = Norm.Corr
Center weight 0.0 = no
Error check 2% error
Max. rotation +/- 110 degree
Search area
Figure 21.2: Pattern recognition window: The hatched rectangle shows the search area
In the following, the pattern recognition is explained using contact pads of SMD components as an
example, see Fig. 21.3.
Datum point 1
1
Panel
Individual printed
circuit board
Datum point 2
2
Figure 21.3: Printed circuit board panel with several individual printed circuit boards, datum points
1 and 2 serve as positioning aids
All settings for the pattern recognition are valid for one product. You can assign every product its
own settings for pattern recognition.
Procedure
1. Program the XY coordinates for automatic measurement. Use the following options for this:
Same programming on multiple parts (points + pattern), see Chap. 17.10 on page 133.
Datum points (two datum points), see Chap. 17.12 on page 136. If you program two
datum points, then the programmed XY coordinates will be reliably approached even with
a skewed positioning.
2. Select Video > Pattern matching in the menu bar.
The pattern recognition window appears.
3. In the Saved pictures area, click Clear all pict..
Any video images saved previously in the product are deleted.
4. Activate the With progr. XY-Pos. option.
5. In the Move to saved xy-coordinates area, click 1. Position.
The XY-stage moves to the first measuring position.
Measuring position
Search item
Figure 21.4: Pattern recognition window: The hatched rectangle shows the search item
9. Define the measuring position by clicking on the measuring position with the right mouse
button. The measuring position can be inside or outside of the search item rectangle.
10.Set the parameters according to the following table:
Parameter Value
With progr. XY-Pos. Activated
On measure, find automatically Activated
Algorithms area
Mode 2 = Norm.corr
Center weight 0.0 = no
Error check 5% error
Max. rotation +/- 110 degree
Search area
Figure 21.5: Pattern recognition window: The hatched rectangle shows the search area
6 similar pads
4 different pads
For the printed circuit board panel, a total of 10 pads are to be measured on each individual
printed circuit board; see Fig. 21.6. Of these, 6 pads are very similar. Only one search photo
is defined for them. The 4 lower pads are very different; one photo is defined for each of these.
13.In the Move to saved xy-coordinates area, click Next position.
The XY-stage moves to the next measuring position, to the next pad that is very similar to the
first one. For this measuring position, a separate search photo is not defined but the first search
photo is used.
14.To assign the search photo of the previous measuring position for this measuring position, enter
1 in the Use picture no. field and click Change.
Search image no. 1 is now used for XY position no. 2.
15.Repeat steps 13 to 14 for all 6 pads that are very similar.
16.In the Move to saved xy-coordinates area, click Next position.
The XY-stage moves to the next measuring position, to the next pad. This pad and the following
three pads are different. For this reason, a separate search image is defined for each of these
four pads.
17.Repeat steps 6 to 13 for each of the four different pads. During step 13, make sure that you
define a separate search photo for each pad this time.
18.You have now defined the 10 measuring positions for an individual printed circuit board on
the printed circuit board panel. To define the measuring positions for the other individual
printed circuit boards, you have two possibilities:
You can transfer the programmed search images to the other individual printed circuit
boards with the pattern recognition: Continue with step 19.
You can automate the measurement with a task: Continue with Chap. 21.4.1 on
page 174.
19.To transfer the search images programmed for the first individual printed circuit board to the
other individual printed circuit boards, enter 10 in the Replay at Pos.No. field.
To avoid having to define the search images and search areas for all individual printed circuit
boards, you can automate the measurement with a task. In the following, a task is described that
executes the steps listed below:
1. Setting the first datum point (+1)
2. Setting the second datum point (+2)
3. Loop: Execute the following steps for each individual printed circuit board:
a Move to the next XY position
b Perform pattern recognition: For the first six XY positions, search image no. 1 (definition in
command f58) is used, and for the next four XY positions, search images 7 to 10 are used.
c Start a measurement
Line Fuse
Figure 22.1:Position of the line fuse at the right side of the instrument
Procedure
1. Switch off the instrument and disconnect the power plug.
2. Pull the fuse holder out. This is best done by carefully lifting up the holder using the tip of a
screwdriver as a lever.
Procedure
1. Disconnect and remove all connections.
2. Re-install the shipping lock of the measuring stage. Proceed in the reverse order as described
in Chap. 3.3 on Page 25.
3. Open the cover of the measurement chamber and re-install the shipping lock made of foam.
4. Remove the key for turning on the x-ray energy and place it in the case with the accessories.
5. Store the instrument in its original shipping container. If you no longer have access to the orig-
inal shipping container, rent a container from FISCHER.
22.5 Troubleshooting
23 Addendum
[1] Graf, Henning, Stange und Wilrich: Formeln der angewandten mathematischen Statistik
(Equations in Applied Mathematical Statistics); Springer Verlag (Springer Publishing
Company)
Automatic block creation (Block definition fix) is enabled for the application.
n
1 Bl
2
s = ----------------- x – x i
n Bl – 1 i = 1
n Bl : Numbers of blocks
x : Mean value of the block mean
values
xi: Block mean values
Mean The mean standard deviation is a
standard measure of the dispersion of the n
1 Bl
n Bl
1-
R = ------- Ri
n Bl i = 1
n
1 - Bl s 2
n Bl i
̂ = ------- i
=1
n Bl : Number of blocks
si: Standard deviations of the
blocks
Cpk Process capability index
C pk = Min C pu ,C po
Computed and displayed only if
specification limits are enabled
x – LSL
C pu = ------------------
-
3̂
USL –
C po = -------------------x-
3̂
n
1 Bl
̂ = -------- s i2
n Bl i =1
n Bl : Number of blocks
si: Standard deviations of the
blocks
[1] Graf, Henning, Stange und Wilrich: Formeln der angewandten mathematischen Statistik
(Equations in Applied Mathematical Statistics); Springer Verlag (Springer Publishing
Company)
Manual block creation (Block definition variable) is enabled for the application.
1 n
x = --- x i
n i =1
1 m
s I = ---- s i
m i =1
m: Number of blocks
s i: Standard deviation of the block
i
sII Standard deviation of the mean
values 1 m 2
s II = ------------- x i – x
m – 1 i=1
m: Number of blocks
x i : Mean value of the block i
x : Mean value of the block mean
values
[1] Graf, Henning, Stange und Wilrich: Formeln der angewandten mathematischen Statistik
(Equations in Applied Mathematical Statistics); Springer Verlag (Springer Publishing
Company)
3 6.94 4 9,01 Atomic Number 79 197,0 Atomic weight 5 10.81 6 12.01 7 14.01 8 15.99 9 18.99 10 20.18
Lithium Berylium Gold Name ( IUPAC ) GAS LIQUID SOLID Boron Carbon Nitrogen Oxygen Fluorine Neon
Li Be Au B C N O F Ne
0,05 0,11 K-alpha 68,79 9,71 L-alpha 0,19 0,28 0,39 0,52 0,68 0,85
K-beta 77,97 11,44 L-beta
M-alpha 2,12 13,38 L-gamma
11 22.99 12 24.31 13 26.98 14 28,09 15 30,97 16 32,07 17 35,45 18 39,95
Sodium Magnesium Aluminium Silicon Phosphorus Sulfur Chlorine Argon
Na Mg Al Si P S Cl Ar
1,04 1,25 1,49 1,74 2,02 2,31 2,62 2,96
1,55 1,84 2,14 2,46 2,82 3,19
19 39,10 20 40,08 21 44,96 22 47,88 23 50,94 24 52,00 25 54,94 26 55,85 27 58,93 28 58,69 29 63,55 30 65,39 31 69,72 32 72,61 33 74,92 34 78,96 35 79,90 36 79,90
Potassium Calcium Scandium Titanium Vanadium Chromium Manganese Iron Cobalt Nickel Copper Zinc Gallium Germanium Arsenic Selenium Bromine Krypton
K Ca Sc Ti V Cr Mn Fe Co Ni Cu Zn Ga Ge As Se Br Kr
3,31 3,69 4,09 4,51 4,95 5,41 5,90 6,40 6,93 7,48 8,05 8,64 1,01 9,25 1,10 9,89 1,19 10,54 1,28 11,22 1,38 11,92 1,48 12,65 1,59
3,59 4,01 4,46 4,93 5,43 5,95 6,49 7,06 7,65 8,26 8,90 9,57 1,03 10,26 1,12 10,98 1,21 11,73 1,32 12,50 1,52 13,29 1,53 14,11 1,64
37 85,47 38 87,62 39 88,91 40 91,22 41 92,91 42 95,94 43 97,91 44 101,1 45 102,9 46 106,4 47 107,9 48 112,4 49 114,8 50 118,7 51 121,8 52 127,6 53 126,9 54 131,3
Rubidium Strontium Yttrium Zirconium Niobium Molybdenum Technetium Ruthenium Rhodium Palladium Silver Cadmium Indium Tin Antimony Tellurium Iodine Xenon
Rb Sr Y Zr Nb Mo Tc Ru Rh Pd Ag Cd In Sn Sb Te I Xe
13,39 1,69 14,16 1,81 14,96 1,92 15,77 2,04 16,61 2,17 17,48 2,29 18,41 2,42 19,28 2,56 20,21 2,70 21,18 2,84 22,16 2,98 23,17 3,13 24,21 3,29 25,27 3,44 26,36 3,61 27,47 3,77 28,61 3,94 29,80 4,11
14,96 1,75 15,83 1,87 16,74 2,00 17,67 2,12 18,62 2,26 19,61 2,40 20,59 2,54 21,66 2,68 22,72 2,83 23,82 2,99 24,94 3,15 26,09 3,32 27,27 3,49 28,48 3,66 29,72 3,84 30,99 4,03 32,29 4,22 33,64 4,42
2,30 2,46 2,62 2,79 2,96 3,14 3,33 3,52 3,72 3,92 4,13 4,35 4,57 4,80 5,04
55 132,9 56 137,3 72 178,5 73 181,0 74 183,9 75 186,2 76 190,2 77 192,2 78 195,1 79 197,0 80 200,6 81 204,4 82 207,2 83 209,0 84 209,0 85 210,0 86 222,0
Caesium Barium Hafnium Tantalum Tungsten Rhenium Osmium Iridium Platinum Gold Mercury Thallium Lead Bismuth Polonium Astatine Radon
Cs Ba 57-71 Hf Ta W Re Os Ir Pt Au Hg Tl Pb Bi Po At Rn
30,97 4,29 32,19 4,47 Lanthanides 55,76 7,90 57,52 8,15 59,31 8,40 61,13 8,65 62,99 8,91 64,89 9,19 66,82 9,44 68,79 9,71 70,82 9,99 72,86 10,27 74,96 10,55 77,10 10,84 79,30 11,13 81,53 11,42 83,80 11,72
34,98 4,62 36,38 4,83 63,21 9,02 65,21 9,34 67,23 9,67 69,30 10,01 71,40 10,35 73,54 10,71 75,74 11,07 77,97 11,44 80,26 11,82 82,56 12,21 84,92 12,61 87,34 13,02 89,81 13,44 92,32 13,87 94,88 14,32
23.2 Periodic Table of the Elements with X-Ray Properties
5,28 5,53 1,65 10,51 1,71 10,89 1,78 11,28 1,84 11,68 1,91 12,09 1,98 12,51 2,05 12,94 2,12 13,38 2,20 13,83 2,27 14,29 2,35 14,76 2,42 15,24 15,74 16,25 16,77
87 223,0 88 226,0 89 227,0 90 232,0 91 231,0 92 238,0 93 237,1 94 244,1 95 243,1 96 247,1 97 247,1 98 251,1 99 252,1 100 257,1 101 258,1 102 259,1 103 260,1 104 261,1
Francium Radium Acitinium Thorium Protactinium Uranium Neptunium Plutonium Americium Curium Berkelium Californium Einsteinium Fermium Mendelevium Nobelium Lawrencium Rutherford.
Fr Ra Ac Th Pa U Np Pu Am Cm Bk Cf Es Fm Md No Lr Rf
86,12 12,03 88,49 12,34 90,89 12,65 93,33 12,97 95,85 13,29 98,43 13,61 101,0 13,95 103,7 14,28 106,4 14,62 109,1 14,96 111,9 15,31 114,7 15,66 117,7 16,02 120,6 16,38
97,48 14,77 100,1 15,23 102,9 15,71 105,6 16,20 108,4 16,70 111,3 17,22 114,9 17,74 117,2 18,28 120,2 18,83 123,2 19,39 126,4 19,97 129,5 20,56 132,8 21,17 136,1 21,79
17,30 17,85 18,41 3,0 18,98 3,08 19,56 3,17 20,16 3,26 20,78 3,35 21,42 22,07
57 138,9 58 140,1 59 140,9 60 144,2 61 144,9 62 150,4 63 152,0 64 157,3 65 158,9 66 162,5 67 164,9 68 167,3 69 168,9 70 173,0 71 175,0
Lanthanum Cerium Praseodym. Neodymium Promethium Samarium Europium Gadolinium Terbium Dysprosium Holmium Erbium Thulium Ytterbium Lutetium
57-71 La Ce Pr Nd Pm Sm Eu Gd Tb Dy Ho Er Tm Yb Lu
Lanthanides 33,44 4,65 34,72 4,84 36,02 5,03 37,36 5,23 38,65 5,43 40,12 5,64 41,53 5,85 42,98 6,06 44,47 6,28 45,99 6,50 47,53 6,72 49,10 6,95 50,73 7,18 52,36 7,41 54,06 7,65
37,80 5,04 39,26 5,26 40,75 5,49 42,27 5,72 43,95 5,96 45,40 6,21 47,03 6,46 48,72 6,71 50,39 6,98 52,18 7,25 53,93 7,53 55,69 7,81 57,58 8,10 59,35 8,40 61,28 8,71
0,83 5,79 0,88 6,05 0,93 6,32 0,98 6,60 6,89 1,08 7,18 1,13 7,48 1,19 7,79 1,24 8,10 1,29 8,42 1,35 8,75 1,41 9,09 1,46 9,42 1,52 9,78 1,58 10,14
FISCHERSCOPE® X-RAY
DATA SHEET
Description
The FISCHERSCOPE X-RAY XDAL 237 is universally applicable energy dispersive x-ray
fluorescence measuring instrument. It is especially well suited for non-destructive meas-
urements and analysing very thin coatings, even with very complex compositions or
small concentrations as well as automated measurement tasks.
With the fast, programmable XY-stage, it is the fitting measuring instrument for auto-
mated measurements in quality assurance and production monitoring.
To create ideal excitation conditions for every measurement, the instruments feature
electrically changeable apertures and primary filters.
The modern silicon PIN detector achieves a high accuracy and a good detection sensi-
tivity. For even higher demands, the instrument can be equipped with a silicon drift
detector (SDD). This will result in higher resolution for light elements.
The fundamental parameter method by FISCHER allows for the analysis of solid and
liquid specimens as well as coating systems without calibration.
Design
The FISCHERSCOPE X-RAY XDAL 237 is designed as user-friendly bench-top instru-
ment. It is equipped with a high-precision, programmable XY-stage and an electrically
driven Z-axis. A gap in the housing allows for measurements on large flat specimens,
which do not fit in the measuring chamber, e.g. large printed circuit boards. The
sample stage moves into the loading position automatically, when the protective hood
is opened.
A laser pointer serves as a positioning aid and supports the quick alignment of the
sample to be measured. A high-resolution colour video camera simplifies the precise
determination of the measurement spot.
The entire operation and evaluation of measurements as well as the clear presentation
of measurement data is performed on a PC, using the powerful and user-friendly
WinFTM® software.
The FISCHERSCOPE XDAL 237 fulfills DIN ISO 3497 and ASTM B 568. It is a fully
protected instrument with type approval according to the German regulations
„Deutsche Röntgenverordnung-RöV“
194
General Specification
Intended use Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to determine thin
coatings, trace elements and alloys
Design Bench-top unit with hood opening upwards
XY-stage and Z-axis electrically driven and programmable
Motor-driven changeable apertures and filters
Video camera and laser pointer (class 1) for orienting the sample
Measuring direction Top down
X-Ray Source
X-ray tube Micro-focus tungsten tube with beryllium window
High voltage Three steps: 10 kV, 30 kV, 50 kV
Apertures (Collimators) 4x changeable: Ø 0.1 mm (3.9 mils), Ø 0.3 mm (11.8 mils), Ø 0.6 mm (23.6 mils),
slot 0.5 x 0.15 mm (19.7 x 5.9 mils), others on request
Primary filter 3x changeable (Standard configuration: Nickel, Aluminum, no filter)
Measurement spot Depending on the measuring distance and on the aperture, the actual measurement
spot size is shown in the video image. Smallest measurement spot:
approx. Ø 0.15 mm (5.9 mils) with aperture 0.1 mm (3.9 mils)
Sample Alignment
Video microscope High-resolution CCD colour camera for optical monitoring of the measurement loca-
tion along the primary beam axis, manual focusing and auto-focus, crosshairs with a
calibrated scale (ruler) and spot-indicator, adjustable LED illumination, laser pointer
(class 1) to support accurate sample placement
Zoom factor Digital 1x, 2x, 3x, 4x
Electrical Data
Power source AC 115 V or AC 230 V 50 / 60 Hz
Power consumption max. 120 W, without evaluation PC
Protection class IP40
Dimensions
External dimensions Width x depth x height [mm]: 570 x 760 x 650 mm, [in]: 22 x 30 x 26
Interior dimensions Width x depth x height [mm]: 460 x 495 x 146 mm, [in]: 18 x 19.5 x 5.7
measurement chamber
Weight approx. 115 kg (52 lb)
Sample Stage
Design Programmable, motor-driven XY-stage
Maximum travel X/Y-axis: 255 x 235 mm (10 x 9 in); Z-axis: 140 mm (5 in)
Max. travel speed 80 mm/s (3.2 in/s)
Repeatability precision XY ≤ 0.01 mm (0.4 mils), direction-independent
Usable sample placement area Width x depth [mm]: 300 x 350 mm, [in]: 12 x 14
Max. sample weight 5 kg, with reduced approach travel precision 20 kg
Max. sample height 140 mm (5.5 in)
Environmental Conditions
Operating temperature 10 °C – 40 °C / 50 °F – 104 °F
Storage/Transport temperature 0 °C – 50 °C / 32 °F – 122 °F
Relative humidity ≤ 95 %
Evaluation Unit
Computer Windows® PC with extension cards
Software Standard: Fischer WinFTM® BASIC inklusive PDM®
Optional: Fischer WinFTM® SUPER
Standards
CE approval EN 61010
X-Ray standards DIN ISO 3497 and ASTM B 568
Approval Fully protected instrument with type approval according to the German regulations
„Deutsche Röntgenverordnung-RöV“.
Order
FISCHERSCOPE X-RAY XDAL 237
• Standard (PIN detector) 604-348
• Option SDD 605-567
Special XDAL product modification and technical consultation on request
7. December 2016
FISCHERSCOPE®, XDAL®, WinFTM®, PDM® are registered trademarks of Helmut Fischer GmbH Institut für Elektronik und
Messtechnik, Sindelfingen - Germany.
Windows® is a registered trademark of Microsoft Corporation in the United States and other countries.
952-061
www.helmut-fischer.com
WinFTM®
1 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 199
1.1 WinFTM Versions: BASIC and LIGHT. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 199
1.2 WinFTM Extensions: PDM and SUPER . . . . . . . . . . . . . . . . . . . . . . . . . . . . 199
1.3 FISIM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 200
1 Overview
The WinFTM® (Fischer Thickness Management Software for Windows®) software controls the in-
strument and handles the evaluation of the signals supplied by the instrument.
The measured values (coating thickness, material compositions, mass per unit area) are stored and
displayed on the monitor. Using WinFTM, you can conveniently design the measurement results as
a print form for printout and export them to other applications.
WinFTM runs under Windows®.
WinFTM is available in two versions: BASIC and LIGHT. The versions differ in the number of meas-
urable elements, see the following table:
For both WinFTM versions BASIC and LIGHT the extensions PDM (Product Data Management) and
SUPER are available. The features the extensions are described in the following table:
The usage of the SUPER software requires deep knowledge of the physics of x-ray fluorescence and
the functionality of the instrument.
Alternatively, you can request a new measurement application from FISCHER. FISCHER offers a
professional service for the creation of customer’s Def.MA.
1.3 FISIM
The different versions and extensions of WinFTM are activated by different FISIMs (Fischer Software
Identification Module). A FISIM is a dongle, which is plugged into the computer’s USB socket, be-
fore WinFTM is started. Look at the data sheet of your instrument to find out, which WinFTM version
and extension is running on your system by default. If you need to extend the features of your Win-
FTM software, contact FISCHER.
The following section describes the features of the software versions BASIC and LIGHT. If there are
restrictions in the LIGHT version, they are indicated in the text.
Coating thickness measurement and material analysis can be performed in one run.
Both operate standard-free as well.
During the measurement the substrate material is analyzed automatically. Thus, measurements
on different substrate materials can be performed without normalization in many cases. This
makes work much easier and saves time.
The reliability of the measurement result is increased, because the coating thickness is measured
correctly, even with hidden changes of the substrate material.
Even materials underneath the top coating can be analyzed without removing the top coating.
Function for taking into account the spectral background. The user can define the spectral back-
ground in the Def.MA. This function increases the accuracy of the analysis as long as a suitable
underground spectrum is available.
With the BASIC version max. 24 individual parameters of a specimen can be measured (thickness,
composition, element).
Examples:
A component is to be measured, that has 24 layers each consisting of one element.
A component is to be measured, that has one coating, which consists of a mixture of 24
elements.
With the LIGHT version max. 4 or 5 individual parameters of a specimen can be measured (thick-
ness: 4 elements, composition: 5 elements).
Examples:
A component is to be measured that has 4 layers each consisting of one element.
A component is to be measured that has one coating, which consists of a mixture of 5 elements.
Even individual elements, which may occur several times in different coatings of the coating system,
can be measured.
Quantitative material analysis of complex layers. Individual layers may consist of several
elements. The total number of measured quantities amounts up to 24 with WinFTM BASIC and
4 with WinFTM LIGHT.
Quantitative analysis of solid, powder or paste materials as well as solutions for up to 24
elements. The range of analysable elements depends on the detector (see Technical Data
Sheet).
Even buried layers can be analysed.
Analysis with balance: It is not required to completely define the composition of the specimen
by 100 percent. The analysis is performed by matching the peak areas, without the need for
the sum of concentrations amounting to 100 percent. Applicable for recycling, analysis of trace
elements in plastics, soil specimens, biological specimens and non-homogeneous composites.
Solid specimens with unknown compositions can be easily analyzed in the spectrum mode of
WinFTM. Instead of defining the composition via Def.MA, only the relevant elements need to
be highlighted. A calibration is not necessary. Specimens can consist of a maximum of 24
elements with WinFTM BASIC or 5 elements with WinFTM LIGHT.
Matrix effects and cross-excitation are taken into account.
The residual is displayed. The residual is the spread between the calculated sum spectrum and
the measured spectrum. You receive references to a potentially wrong selection of the elements
to be measured.
The direct analysis is not feasible for the analysis of light elements, solutions or coating systems.
You can easily sort specimens with different compositions and/or coating thicknesses in different
classes of materials. You don’t need to perform reference measurements for each composition or
coating thickness. Each class of materials covers a range of composition and/or coating thickness.
Example: You need to sort the following specimens:
5 – 8 μm Zn/Fe
10 – 20 μm Zn/Fe
5 – 12 μm NiZn/Fe
In WinFTM you define three classes of materials, perform one measurement and WinFTM displays,
what class of materials the specimen belongs to.
Additionally, you can assign a product to each class of materials. The exact composition is meas-
ured. This has the following advantages:
The right product containing the appropriate parameters and calibration is loaded automati-
cally.
Measurement errors, caused by wrong product selection, are avoided.
Function Description
Video image of the speci- The specimen is shown in the video window inside the WinFTM
men main window.
Scaled crosshairs Scaled crosshairs are electronically inserted into the video image.
They show the real size and position of the measurement spot on
the surface of the specimen. The color of the crosshairs is selecta-
ble.
Auto-focus (on models with The detector unit moves up and down automatically. The auto-fo-
motor-driven z-axis) cus function allows a significantly more precise setting of the meas-
urement distance than subjective manual focusing. Thus, the
reproducibility of the measurement result is increased.
Measurement of the dis- Focusing the video image provides the correct measuring distance.
tance between the test spot WinFTM takes into account these distance values, when comput-
and the detector / DCM ing the coating thickness measurement data, using the DCM Meth-
method od (Distance Controlled Measurement).
This allows for automated testing of complex surface geometries
and measurements in recesses.
Displaying programmed You can display programmed points in the video image.
points in the video image
(on models with motor-driv-
en XY-stage)
Software-based video You can zoom the video image in steps of 100, 200, 300 and
zoom function 400 percent. Additionally, you can display the video image in full
screen mode.
Saving video images to- You can edit the video image with a graphic program of your
gether with the measured choice e.g. for adding comments or dimensions. When you save
values the video image, it will be assigned to your measured values. Ad-
ditional text notes will be stored, linked to the video image.
Recognition of vertical or The instrument can recognize strip structures on specimens and re-
horizontal strips (on models adjust the XY position along this structure. Thus, you can make sure
with motor-driven XY-stage) that on specimens with geometric tolerances, the measurement is
always performed at the correct position.
Image/Pattern Recognition The instrument can recognize a predefined structure and readjust
(on models with motor-driv- the XY position of the XY-stage along this structure automatically.
en XY-stage and WinFTM Thus, you can compensate deviations in positioning during meas-
extension SUPER activated) urements on more specimen (e. g. for routine tests in production).
Function Description
Standard Windows® user Users with basic knowledge of Windows® will very quickly be fa-
interface miliar with the program’s user interface.
Product functions You can set up, select, delete, edit and copy products.
Additionally, you can search for products, using different search
criteria.
Definition of the spectral In the Def.MA (Definition of the Measurement Settings of the Appli-
background cation) the spectral background can be defined. This function in-
creases the accuracy of the analysis as long as a suitable
underground spectrum is available.
Multiple Excitation For each application, the excitation parameters “high voltage”
and “primary filter” are set to produce the best possible results. For
some applications, however, it may be necessary to work with dif-
ferent excitations in order to measure all parameters optimally.
You can use multiple excitations within a single measurement, so
that all parameters are measured under the best possible condi-
tions; the collected results are then presented in one combined
evaluation.
Application example: Determination of the thickness of a NiP
coating with simultaneous determination of the Phosphorus
concentration
Control field and joystick In addition to the operation via the Software WinFTM you can con-
on the measuring head trol program and instrument functions with the control field and the
(joystick on models with joystick on the measuring head.
motor-driven XY-stage only)
Automatic searching and You can search for products by name (designation) using a bar-
selecting of products code reader. An optional bar-code keyboard (order no. 602-296)
(option) with a bar-code reader pen (order no. 602-292) is available.
Short menu The supervisor can reduce the menu functions available for the op-
erator. In this manner, sensitive data such as measuring time and
calibration parameters can be protected from overwriting, and the
operator is presented with a simplified menu. The long menu with
full functionality is accessible only with a password.
Quick selection of products You can select products and tasks quickly by using command but-
and tasks tons (on the monitor), which can be edited.
Additionally, you can allocate products or tasks to the keys of the
control field on the measuring head.
mq value (measurement The mq value is a measure for the quality of a measurement result.
quality) It is displayed for every measurement and allows for a plausibility
check of the result. The mq value can be displayed or printed for
every individual result. A warning appears in case of a limit viola-
tion.
Function Description
Calculating the random The measurement uncertainty, which is based on natural count sta-
measurement uncertainty u tistics, is an important quantity in measurement technology.
of a measured quantity The measurement uncertainty u of the current single reading
can be displayed.
The anticipated measurement uncertainty can be calculated
individually for each measured quantity.
A measured quantity can be varied in a wide range.
The calculated result for u is presented graphically as a chart:
either as theoretically anticipated standard deviation (SD) or as
relative standard deviation (RSD). This allows for an estimation
of the measurement range.
If several measurement quantities are to be measured inde-
pendent of one another, the calculation will require specifica-
tions for the size of the other variables that will not have the
measurement uncertainty calculated. For example, when deter-
mining the measurement uncertainty of a buried coating (for
example Ni in Au/Ni/Cu), the thickness of the top coating(s)
must be known.
The final result chart can be printed.
Traceability of the measurement result is possible by calcu-
lating the random and systematic portions of the measurement
uncertainty.
Random and systematic portion can be presented separately
(both the single readings and the mean values).
Uncertainties of the calibration standards can be entered.
The display of the measurement uncertainty(ies) can be shown
or hidden.
Convenient copying of Copying of Def.MA files is supported by a convenient data admin-
Def.MA istration tool.
Two overview windows (source directory and target directory)
allow for a convenient and clear control of the copy proce-
dure. A Def.MA file can be opened and checked prior to
copying.
Available Def.MA files can be taken from one folder.
The Search/Sort function is helpful in finding the desired
Def.MA file.
Easily viewable Def.MA notepad contents support searching.
Function Description
Programmed measurement You can simply program routinely repeating measurement se-
sequences (Tasks) quences and execute them automatically.
Even very complex measurement sequences can be simplified.
Dialogs for operators can be shown on the screen (e.g. infor-
mation about positioning of the specimen).
The sequence of a Task is started with the click of a soft key
(icon) on the monitor or with the push of a button on the control
panel of the instrument.
Can be used even by semiskilled laborers.
Remote control You can operate WinFTM by remote control via your company net-
work.
Network operation Beside the operator at the measuring station one or several other
employees with linked computers can monitor the readings or can
do evaluations. On each of the client computers, WinFTM has to
be installed in the same version (e.g. BASIC or BASIC+PDM) like
on the host computer.
International units of meas- You can display the readings in international units of measurement
urement (μm / mils …) and define special individual units of measurement.
Multitasking Many software functions can be operated simultaneously to the
measurement e.g. toggling the SPC channel, scrolling the list scroll
field, performing an evaluation, changing the current product,
working on the video menu, help functions.
However, some other menu areas are locked during the measure-
ment (e.g. product selection, XY programming, calibration …).
Operating manual and The operating manual explains all essential facts of the program in
context-sensitive online a clear manner.
help The context-sensitive online help offers fast, direct access to easily
understandable operational information.
Language selection You can select different languages for the menus and dialogues of
the WinFTM software. Available languages: English, German,
French, Italian, Spanish, Turkish, Polish, Czech, Swedish, Finnish,
Portuguese. Selected Asian languages on request.
Function Description
Block function A block is a concluded series of measurements. Measurement data
is stored and evaluated as blocks, including the date and time of
the measurement, a notepad, the continuous number of the block
as well as block-related data. The content of additional data fields
such as order number, batch number, and operator name can be
defined freely.
Tagging and commenting Blocks can be tagged with event marks and can receive com-
blocks ments. For example, in the course of a process that is to be con-
trolled, you can tag certain events by adding event marks and
adding comments to the related block.
Deleting measurement data Measurement data and blocks can be deleted, overwritten and un-
and blocks deleted.
Function Description
Displaying the measure- You can display the measurement results in list form, as SPC chart
ment results or as a large number display (with optional display of the meas-
urement uncertainty). The resolution (Number of decimal places)
can be set.
BASIC: Up to 24 result You can control the representation for each channel individually.
channels,
LIGHT: Up to 3 result chan-
nels
Editing the video image You can edit the video image with a graphic program of your
and storing it together with choice e.g. for adding comments, dimensions and explanatory
the product text. The edited video image is stored together with the product.
Print functions With black and white printers, color values are printed in gray-
scale automatically. For larger page widths, the printer is switched
automatically to landscape format and reduction of the type size.
SPC presentation of the The SPC chart can directly be displayed on the monitor as x-bar/
measurement results s chart or x-bar/r chart. For automated measurement sequences
with large batch sizes, you can easily recognize long-term chang-
es of the coating thickness and of other process parameters
through the presentation of a trend line. This enables, among other
things, the testing of the measurement device capability.
Function Description
Specification limits: Graph- BASIC: You can define specification limits for each of max. 24 re-
ical distinction (in color) for sult channels.
exceeding or falling short LIGHT: You can define specification limits for each of max. 3 result
channels.
Single readings and statisti- Display and printout of single readings as well as statistical evalu-
cal evaluation ation of the measurement data in the form of block results or final
results.
Displaying statistical evalu- Histograms, probability charts, statistical process control charts
ations (SPC), C_p and C_pk values can be displayed and printed.
Print forms for the block You can print the block and final evaluation with editable print
and final evaluation form header, measurement data, statistical results, histogram,
probability chart, etc.
Exporting data You can export measurement results via the USB interface or via
your company network. You can define the format via export tem-
plates.
Two- and three-dimensional You can display the coating thickness distribution in two- or three-
display of the coating thick- dimensional charts.
ness distribution (on mod-
els with motor-driven XY-
stage)
Storing and displaying of You can store and display the following additional information:
additional information date and time of the last change to a product, the last measure-
ment, normalization or calibration of the current product, the last
reference measurement, the time of operation etc.
Storing XY(Z)-coordinates, The XY(Z)-coordinates, video images and spectra are stored to-
video images and spectra gether with the measurement data for future use and documenta-
(XY(Z) coordinates on mod- tion.
els with motor-driven XY-
stage)
Copying products includ- You can copy products including related measurement data e.g.
ing measurement data for data backup.
Automatic, time-controlled You can select folders, which will be backed up automatically.
backup Thus, you can back up your measurement applications, products
including measurement data, spectra etc. automatically.
Function Description
Calibration of new or exist- The obtained calibration data are stored.
ing products
Standard-free calibration You can calibrate without calibration standards by means of the
fundamental parameter method.
Standard-based calibration You can correct the standard-free calibration by calibrating with
with the use of up to 64 calibration standards. Thus, the accuracy of the analysis and thick-
standards ness measurements is improved.
Matrix-specific calibration standards and pure element calibration
standards are available. Up to 64 calibration standards can be
used for each measurement application.
Function Description
Calibration standard set Input and storing of nominal values of the used calibration stand-
ards is performed in the Calibration standard set in the measure-
ment application of the product. After the calibration has been
performed, the Calibration standard set contains, in addition to the
nominal values, the calculated actual values including the correc-
tion. You can use this data to create a document for monitoring the
measuring equipment.
Calculating and saving Measurement parameters like measuring time, calibration time,
measurement parameters correction data, data of the last normalization and calibration, etc.
and calibration results can be calculated and saved.
Library of pure element The library of pure element spectra makes measurement of pure el-
spectra ements unnecessary when performing a calibration. This is impor-
tant in cases, where pure elements are not available.
Spectra library During the installation of the instrument the spectra of 12 or 14 el-
ements (depending on the detector type) are measured and saved
in the spectra library. Using these spectra all further spectra are
calculated by the instrument.
You can control whether the elements are measured or the spectra
of the spectra library are used during calibration.
Reference measurement The Reference measurement checks and adjusts the drift of the in-
strument. It is also used for monitoring the measuring equipment.
Stability test of the tube and The instrument performs automatic long-term self tests to check the
of the detector primary radiation, the resolution and gain of the spectrometer (de-
tector and electronics).
Automatic reduction of the After several minutes of instrument idle the x-ray tube current is re-
x-ray tube current duced automatically. Thus, the service life of the tube is increased
and energy is saved.
Drift compensation A shift of the peak position in the spectrum is compensated by the
software. This avoids wrong results especially when there are crit-
ical peak overlaps.
Function Description
Clear display of the sum For the evaluation of measured spectra you can overlay the
spectra with colored ele- spectrum lines of up to 24 elements in different colours.
ment spectra You can compare spectra in order to identify materials, e.g.,
for material sorting.
You can compare the spectrum of an unknown material with
the reference spectra of known materials, which are stored in
a spectra library. The number of stored spectra in the library
can be increased or reduced.
Saving spectra You can save measured spectra for subsequent re-use (e.g., for
subsequent evaluation when the measurement application chang-
es). The spectra can be stored manually or automatically.
Loading of spectra into the You can load spectra into the background of the spectra window
background to compare measured and stored spectra.
Zooming spectra ranges You can zoom into an area of the spectra window by using the
right mouse button.
If your instrument is equipped with a motor-driven XY(Z) stage you can use the following functions
to control the measuring stage:
Function Description
Moving the XY(Z) stage You can control the move of the XY(Z) stage accurately by clicking
the mouse button in the video image.
Joystick function of the The right mouse button offers additional joystick functionality in the
mouse video field.
Travel to absolute or rela- You can enter absolute or relative coordinates to travel the stage.
tive coordinates The zero point of an operation can be specified individually.
Laser light pointer The red laser point points to the subsequent measurement position
in the retracted condition and thus significantly simplifies a quick
sample positioning
Point & Shoot You can travel to the desired position by clicking the left mouse
button.
Point & Measure You can travel to the desired position and perform a measurement
at this position by clicking the middle mouse button.
Point & Save You can travel to the desired position and save the related coordi-
nates by clicking the right mouse button.
Function Description
Joystick at measuring head You can easily control the XY(Z) stage with the joystick at the meas-
uring head.
In addition, you can control the XY(Z) stage with the mouse.
Measurement point over- The measurement point overview windows offer you a full over-
view view of all programmed points of the current measurement coordi-
nates and of the entire travel range.
Programming individual You can program arbitrary individual coordinates, on which meas-
coordinates urements will be performed.
Programming lines You can define a start point and an end point of a line and a num-
ber interim points. On these points measurements will be per-
formed.
Programming arrays You can define two corner coordinates of an array and the num-
ber of points within the array (columns and rows). Furthermore you
can define the sequence, in which the points will be travelled. On
these points, measurements will be performed.
Programming patterns You can define a freely programmable geometric pattern of meas-
urement points. You can replicate this pattern as often as you
want. Thus, you can travel the same points on different specimens
or on different parts of the same specimen.
Programming offset In addition to the measuring points (line, array or pattern) you can
define one or two reference points. Thus, you can change speci-
mens and make sure the measurements are performed at the same
coordinates, while the specimen is not located at the same posi-
tion.
PDM (Product Data Management) is a supplementary software module to WinFTM BASIC or LIGHT.
The PDM software features the following functions:
Function Description
Setting up new products A measurement application may be linked to any number of
linked to an existing products (1:n assignment). Thus, each edit of a measurement
measurement application application affects all products that are linked to it.
With PDM, each product (a file that contains, among other
things, the measurement results) is saved in a freely selectable
folder. You can copy your products into different folders and
sort them according to supplier, customer and part number.
The operator only needs the product designation for the test
order, and not necessarily knowledge of the measurement
application.
PDM saves measurement data product-related and not meas-
urement application related.
Convenient administration You can set up new measurement applications based on an
of measurement existing definition file (Def.MA).
applications You can edit, copy and delete measurement applications.
With PDM, these procedures affect all products that are linked
to a measurement application. When copying a product, the
measurement application is not duplicated, instead it is
retained.
You can normalize and calibrate measurement applications.
These procedures affect all products that are linked to a meas-
urement application.
Function Description
Result documentation You can assign individual print form templates to each product
for block and final evaluation.
You can evaluate the measurement readings of several or even
all products of a measurement application simultaneously in
one template.
You can freely set up, copy and edit product-related print forms
(print form templates).
A portion of the print form template may include special
dummies (variables) for measurement results and field
contents. These dummies take the place of user-entered data.
You can present your measurement results in a clear manner
with graphical effects. Additionally, various information
elements can be integrated like the image of the specimen,
your company logo etc.
You can create and insert statistical characteristics.
You can save the print form in data files for future use or for
documentation purposes.
Free block selection Enables final evaluation and the subsequent export of selected
(Search function with filter) measurement data blocks. The filter criteria applied may
concern, for example, date and time, block number, order no.,
batch no., operator name.
You can combine arbitrary blocks to a final evaluation and
export the data of arbitrary blocks.
Overview image (on You can create an overview image of the specimen automatically.
models with motor-driven If you have programmed measurement points, they are displayed
XY-stage) in the overview image.
You can simply navigate and measure using the overview image
(see Point & Measure on Page 212).
XY-Scan mode (on models You can travel the XY-stage while a measurement is running. Thus,
with motor-driven XY-stage) you can measure the mean value over a defined area of the spec-
imen.
WinFTM PDM (Product Data Management) as a supplemental software is suitable for both WinFTM
BASIC and for WinFTM LIGHT. In both cases, the functional scope of WinFTM PDM is identical.
The following table presents an overview of the available functions with and without PDM.
For both WinFTM versions BASIC and LIGHT the extension SUPER is available. With WinFTM SU-
PER you can change the following parameters:
Measurement mode
Tube voltage used
Type and order of the coatings
Type and composition of the substrate material of the specimen and of the calibration standards
Treatment of interfering spectra
Special evaluation methods
These parameters are stored in the Def.MA file (Definition of the Measurement Settings of the
Application).
The usage of the SUPER software requires deep knowledge of the physics of x-ray fluorescence and
the functionality of the instrument.
Alternatively, you can request a new measurement application from FISCHER. FISCHER offers a
professional service for the creation of customer’s Def.MA.
In addition, the SUPER software features the following functions:
Function Description
Convenient entering of ele- Convenient entering of elements, e.g., in the Def.MA using the
ments window Periodic System.
Pool of Def.MA files You can establish a pool of Def.MA files. Several users can access
to this pool.
Image/Pattern Recognition The instrument can recognize a predefined structure and readjust
(on models with motor-driv- the XY position of the XY-stage along this structure automatically.
en XY-stage and WinFTM Thus, you can compensate deviations in positioning during meas-
extension SUPER activated) urements on more specimen (e. g. for routine tests in production).
TRAINING PROTOCOL
Installation and Training of a
FISCHERSCOPE® X-RAY with WinFTM®
Instrument model: WinFTM® Version:
Serial No.:
Customer: Supplier:
Participants:
1. 2. 3.
4. 5. 6.
7. 8. 9.
Topics executed
1 Installation and connection of the instrument
2 Radiation security instructions
3 Theoretical basic instructions for the measuring principle
4 Explanation of the main components
5 Switching the instrument on and off
6 Control elements and displays of the instrument
7 Screen structure
8 Operation of the Sample positioning
instrument: Focusing with Z axis
Focusing with optics (Md)
Z axis security function
XY-table
Security device
9 Measurements: Selecting product
Starting measurements
Closing a block
10 Evaluation of Printing protocol
measurement series: Block evaluation
Final evaluation of several blocks
Deleting single readings and blocks
Re-measure
Subsequent correction of entries
11 Structure of WinFTM®: Product
Application with
Calibration standard set
Def MA
12 Product Creation via Copy or New
Directory structure
Product settings via Info
XY-table programming
13 Video image Control elements
Travel measurement location
Video settings
Creating overview image (XY-table)
Product video
Printing
14 Settings Definition Order No./Operator
Assigning the function keys
Customising the tool bar
Creating individual protocols
Data export
Short menu
15 Data backup Copying product to/from file
Complete installation via file explorer
Automatic backup to a network
16 Monitoring of the Constance over time
instrument (Calibration) Stability
Corrections:
Reference Measurement
Calibration
Normalisation
Base Correction
Density correction
Documentation
17 Creating an application via copy
18 Measuring and evaluating the spectrum
19 Deleting products etc.
........................................... .........................................
Customer Supplier
…………………………………
Date and location
Index
Index
A Contact pads of SMD components, pattern
recognition 166
Administration, Product 57 Control Panel 21
Analysis with balance 121 Coordinates, programming 127
Aperture 19 Copying
Areas of application 15 Measuring application 60
Array 127 Cover of the Measurement Chamber 19
ASTM B568 9 Creating
Autom. Block closing, variable 63 a Def.MA 122
a product 57
B Curved specimens 31
Background correction 124 Cylindrical specimens 31
Base correction 139
Base spectrum 124 D
BASIC 199 Data export 155
Block 63, 208 Datum points 127
Definitions 63 Declaration of conformity V
Evaluation 82 Def.MA 53, 54
Block size Creating of 122
Fixed 63 Importing 61
variable 63 Modes 121
Bolts 31 Viewing 61
Breakdown, communication 27 Deleting
Measuring application 60
C Product 59
Calibration 139, 140 Determining the elements of a sample 50
Changing DIN 50 987 9
Measuring application 60 Disable the communication 29
Product 58 Dongle 200
Characteristic statistical parameters 183 Dual Function of a Product 55
Circular coordinates 127
Class of Materials 203 E
Cleaning 177 EC declaration of conformity V
Calibration standards 177 EN ISO 3497 9
Instrument 177 Enable the communication 29
Measuring cell 150 Energy 50
Collimator 19 Environmental conditions 23
Communication Establishing connections 26
between instrument and WinFTM 29 Evaluations
disable 29 statistical 63
enable 29 Event marks 208
Communication breakdown 27 Export template 158
Compensation spectra 123
Component mode 122 F
with balance 122
Component mode with balance 122 FAQ x-radiation safety 13
Components 19 File Structure of WinFTM 53
Connections 26 Final evaluation 82
FISCHERSCOPE® X-RAY I
Index
II FISCHERSCOPE® X-RAY
Index
T
Temperature 23
Thickness mode 121
Trained specialists 12
Transporting the instrument 179
Traveling to any position 129
IV FISCHERSCOPE® X-RAY
HELMUT FISCHER GMBH INSTITUT FÜR ELEKTRONIK UND MESSTECHNIK
Industriestraße 21, D-71069 Sindelfingen, Germany
EC DECLARATION OF CONFORMITY
www.helmut-fischer.de mail@helmut-fischer.de