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6 Explain DC transfer characteristics of CMOS inverter and mark all the regions
of operations with necessary expression of Vout in each region.
11 With the truth table draw the schematic of 2:1 mux and XOR gate using
transmission gate.
12 Discuss the origin of latch up problems in CMOS circuits with necessary
diagrams. Explain the remedial measures.
13 Explain the importance of static timing analysis in the VLSI Design? What
do you mean by pre layout and post layout static timing analysis?
17 Explain the effect of scaling on gate capacitance and transistor delay and power
dissipation.
18 What are the types of scaling? Draw MOSFET scaling model. When the device
dimensions are scaled down how does the depletion regions around the source
and drain affected.
24 What is the latch up problem that arises in bulk CMOS technology? How the
latch up problem can be overcome?
There are several approaches to reduce the tendency of Latch-up. Some of the important
techniques are mentioned below:
1. Use guard ring around p- and/or n-well with frequent contacts to the rings
2. To reduce the gain product B1XB2
3. Moving the n-well and the n+ source/drain further apart
4. Buried n+ layer in well to reduce gain of Q1
5. Higher substrate doping level to reduce R-sub
6. Reduce R-well by making low resistance contact to GND
Ans: Photolithography: The purpose of this is to open windows whenever diffusion is to be done and
retaining Sio2 remaining areas. During manufacturing, this step (photographic printing) process is used
to transfer the layout patterns from the masks to the Wafer. The pattern left by the mask are used to
selectively change the wafer: Impurities are added at selected locations in the wafer, done by diffusion
and insulating materials by Oxidation (Sio2 ), the conducting materials are added at the top of the wafer
as well ( Metallization).