User Manual - Gekko - V1.6.3 - 2017-02 PDF

Instruction Manual GEKKO #2
Contact KARL DEUTSCH
From Monday to Thursday: 8.00 to 16.00 o’clock

Friday 8.00 to 14. 00 o’clock
Phone: (+49 -202) 7192-0

Fax: (+49 -202) 714932
E-Mail: info@karldeutsch.de
Homepage: www.karldeutsch.de
Please send postal items to:

KARL DEUTSCH
Pruef- und Messgeraetebau GmbH + Co KG
Postfach 132354
42050 Wuppertal
Germany
Factory Adress:
KARL DEUTSCH
Pruef- und Messgeraetebau GmbH + Co KG
Otto-Hausmann-Ring 101
D-42115 Wuppertal
Version 1.6 English 2017-02 (RW)

Content
1 IMPORTANT NOTES ...................................................................................................................... 5

1.1 Appropriate use ....................................................................................................................... 5
1.2 Definition of the testing task .................................................................................................... 5
1.3 Restrictions during the flaw detection ...................................................................................... 6
1.4 Instrument failure ..................................................................................................................... 6
1.5 CE-Mark / Declaration of Conformity ....................................................................................... 6
1.6 Safety and diligence ................................................................................................................ 6
1.6.1 Due diligence of the operator .......................................................................................... 7
1.6.2 About this manual ............................................................................................................ 7
1.6.3 Safety notes on the GEKKO ............................................................................................ 7
2 PRODUCT DESCRIPTION ............................................................................................................. 9
2.1 Control panel buttons ............................................................................................................ 10
2.2 Main Menu ............................................................................................................................. 11
2.2.1 Navigating the touch screen .......................................................................................... 12
2.2.2 Navigation arrows .......................................................................................................... 12
2.2.3 Touch screen tips .......................................................................................................... 12
Selection buttons ....................................................................................................................... 12
Backward and Validation buttons .............................................................................................. 14
2.3 General Adjustments ............................................................................................................. 15
2.4 Launch a new application ...................................................................................................... 16
2.4.1 Create an application from a wizard .............................................................................. 16
2.4.2 Create an application from an existing application ........................................................ 17
2.5 Import / Export ....................................................................................................................... 19
2.5.1 Import and Export of application or inspection files ....................................................... 19
2.5.2 Export application or inspection files ............................................................................. 20
2.5.3 Export screenshots ........................................................................................................ 21
2.5.4 Export of Error Reports .................................................................................................. 21
2.5.5 Import of photos for the menu “Equipment” ................................................................... 22
3 EQUIPMENT ................................................................................................................................. 23
3.1 Equipment menu ................................................................................................................... 23
3.2 Specimen ............................................................................................................................... 24
3.2.1 Geometry ....................................................................................................................... 24
3.2.2 Weld............................................................................................................................... 26
3.2.3 Material .......................................................................................................................... 28
3.2.4 Import from or save into the material library .................................................................. 29
3.2.5 Velocity calibration wizard ............................................................................................. 29
3.2.6 Specimen library ............................................................................................................ 31
3.3 Probe ..................................................................................................................................... 32
3.3.1 Configuration ................................................................................................................. 32
3.3.2 Tab Dicing for Linear Arrays .......................................................................................... 33
3.3.3 Tab Dicing for Matrix Arrays .......................................................................................... 34
3.3.4 Geometry for mono-element, dual element and TOFD Probes .................................... 35
3.3.5 Geometry for TR configurations with linear and matrix arrays ...................................... 36
3.3.6 Amplitude balancing ...................................................................................................... 37
3.3.7 Delay and Wedge setup ................................................................................................ 38
3.3.8 Velocity wizard for the delay or wedge .......................................................................... 40

3.3.9 References .................................................................................................................... 41
3.3.10 Wizard Angle / Height .................................................................................................... 42
3.3.11 Delay measurement for mono and dual element probes .............................................. 43
3.3.12 Reference point and wedge parameters for TOFD ....................................................... 44
3.3.13 Add or remove a probe .................................................................................................. 44
3.4 Scanner / Encoder ................................................................................................................. 45
4 SETTINGS ..................................................................................................................................... 47
4.1 Parameter Setting for Phased Array ..................................................................................... 47
4.1.1 Phased Array Parameters ............................................................................................. 48
Sectorial Scan............................................................................................................................ 48
Linear Scan (also called Electronical Scan) .............................................................................. 49
4.1.2 Tools for the 3D-Visualization........................................................................................ 50
4.1.3 Probe Position and Orientation ...................................................................................... 50
4.1.4 Focusing ........................................................................................................................ 52
4.1.5 Sector Scans with Matrix Arrays .................................................................................... 55
4.1.6 Gates settings ................................................................................................................ 56
4.1.7 TCG calibration .............................................................................................................. 58
Calibration steps: ....................................................................................................................... 59
TCG checking ............................................................................................................................ 61
4.1.8 DGS Calibration ............................................................................................................. 62
4.2 Parameter-Setting for TOFD ................................................................................................. 63
4.2.1 TOFD Settings (PCS calibration)................................................................................... 64
4.2.2 Further TOFD Calibration Possibilities .......................................................................... 64
4.2.3 Amplitude calibration ..................................................................................................... 65
4.3 Parameter setting for mono-element probes ......................................................................... 65
4.3.1 Gates ............................................................................................................................. 66
4.3.2 Time Corrected Gain (TCG) .......................................................................................... 66
4.3.3 Distance Amplitude Curve (DAC) .................................................................................. 67
4.4 Parameter setting for Dual-Element probes .......................................................................... 67
4.5 Parameter setting for the Total Focusing Method (TFM) ...................................................... 67
4.5.1 Available TFM images ................................................................................................... 71
4.6 Multichannel Setup ................................................................................................................ 72
5 CONFIGURATION ........................................................................................................................ 73
5.1 Menu Motion .......................................................................................................................... 73
5.1.1 Submenu References .................................................................................................... 74
5.1.2 Submenu Trajectory ...................................................................................................... 75
5.1.3 Scan parameters for 2D-Mapping ................................................................................. 76
5.2 Menu Layout .......................................................................................................................... 77
5.2.1 Available views .............................................................................................................. 78
5.3 Job Details ............................................................................................................................. 79
6 INSPECTION ................................................................................................................................. 81
6.1 Current UT settings and real time signal values .................................................................... 81
6.2 Visualization of ultrasonic data .............................................................................................. 83
6.3 Scanning and Acquisition ...................................................................................................... 83
7 DATA ANALYSIS .......................................................................................................................... 85
7.1 Data Analysis ......................................................................................................................... 85
7.2 Analysis boxes ....................................................................................................................... 85
7.3 Tools for the ultrasonic images .............................................................................................. 88

7.3.1 Tool Color Palette .......................................................................................................... 89
7.3.2 Tool for csv-export ......................................................................................................... 89
7.4 Axes colors ............................................................................................................................ 90
8 INSPECTION REPORT ................................................................................................................. 91
9 LIST OF FIGURES ........................................................................................................................ 93
10 LIST OF TABLES ...................................................................................................................... 95
1 IMPORTANT NOTES
All our appliances, installations and accessories are planned, constructed and manufactured in
accordance with the state of the art. We assume that our customers are aware of the state of the art
and of the resulting restrictions on the completeness or security of test processes. We will be pleased
to provide explanations in cases of doubt.
Our products are inspected in accordance with given technical data. Appliances are inspected and
released by specialized staff members. We shall be liable for faults or defects only in the framework of
our Standard Terms and Conditions.
Our products are used for non-destructive material tests for parts whose breakdowns represent a high
risk. This applies, for example, for materials or parts for the automotive industry as well as for aerospace
and atomic energy. All reasonable measures must be taken by operators to prevent workpieces with
deviations passing through unnoticed. We can sup-ply monitoring devices for the test appliances.
Appliance faults can be reduced by regularly checking the appliance, accessories, test media, working
conditions and test personnel. In particularly important cases it may be necessary to provide for a check
before and after each test. Checks can be used to find not only systematic but also sporadically occurring
sys-tem and appliance function faults. If a function fault is discovered, measures must be taken without
delay to prevent parts tested since the previous inspection with perfect results being used before they
have been checked once again.
We are prepared to provide advice on the type and extent of inspection and organizational measures
before release of the inspection and test sequence.
1.1 Appropriate use

The GEKKO is intended to be used for detecting material flaws in sound-conductive materials by means
of ultrasound and designed to operate with accessories provided by KARL DEUTSCH.
Further information on the appropriate use of the measuring instrument can be found in this instruction
manual. Therefore, prior to first start-up, the operator of the instrument should read and understand this
manual.
1.2 Definition of the testing task

Before beginning an ultrasonic testing, it is necessary that the testing task and procedure is defined
completely. This includes appropriate testing equipment and complete instructions for the operator on
how to carry out the testing.
Whether the given testing task can be covered with the available equipment and intended testing
method, needs to be determined before by means of known and comparable no-go parts, if required.
Inadequate definition of the testing task, improper selection of instruments and insufficient briefing of
the personnel can lead to high safety hazards.
1.3 Restrictions during the flaw detection

Flaws can be detected only in those areas of the specimen which are accessible by the sound beam of
the probe(s) and where the flaws are recognisable as additional or damped receiver signal. Moreover
the sound energy reflected by the flaw location must have an amplitude and direction that can be
received by the receiving probe(s) of the instrument and which can be usefully physically evaluated by
the instrument and the tester.
Areas of the specimen which are not scanned by the sound beam must be considered as not tested.
1.4 Instrument failure

KARL DEUTSCH instruments are tested comprehensively prior to delivery according to related test
instructions of the existing quality system. However, it cannot be excluded completely that errors may
occur.
To reduce the negative effects of errors occurring, it must be ensured that the operator checks the
correct working of the unit as often as possible. This may be executed by means of known comparative
measurements (e.g. checking on suitable reference blocks) or reference testing procedures. If in doubt,
you immediately need to stop testing (even if there is only a suspicion of a failure) and start suitable
measures to check the symptom or eliminate the error. When in doubt, re-examine those parts which
were established in the last check as perfect.
1.5 CE-Mark / Declaration of Conformity

We hereby confirm that the device / system complies with the EC directives “Low Voltage Equipment”
(2006/95/EC), and the “Electromagnetic compatibility” (2004/108/EC), also with the correspondent
German safety regulations (ProdSG) dated 01.12.2011 and the German EMC law (EMVG) dated
29.07.2009.
The following harmonized technical standards and regulations have been used for judgement.
EN 61000-4-2:2008; Electromagnetic compatibility (EMC) Immunity – Electrostatic discharge
immunity test
EN 61000-4-3:2006 + A1:2007 + A2:2010; Electro-magnetic compatibility (EMC) Immunity –
Radiated, radiofrequency, electromagnetic field
EN 61000-4-4:2012; Electromagnetic compatibility (EMC) Immunity – Electrical fast transient/burst
im-munity test
EN 61000-4-6:2008; Electromagnetic compatibility (EMC) Immunity – Immunity to conducted
disturbances, induced by radio-frequency fields
EN 55011:2009 + A1:2010; Industrial, scientific and medical equipment – Radio-frequency
disturbance characteristics – Limits and methods of measurement Class A / (industrial standard)
EN 61326-2·2:2006; Electrical equipment for measurement, control, and laboratory use – EMC
requirements – Part 2-2: Particular requirements – Test con-figurations, operational conditions and
performance criteria for portable test, measuring and monitoring equipment used in low-voltage
distribution systems
EN 61326-1:2006; Electrical equipment for measurement, control, and laboratory use – EMC
requirements – Part 1: General requirements
EN 61010-1:2010; Safety requirements for measurement, control, and laboratory use; Part 1:
General requirements
1.6 Safety and diligence

Please pay attention and follow the subsequent references in order to operate the GEKKO with
maximum protection for the user and to obtain the best possible test results.
1.6.1 Due diligence of the operator

Use the UT flaw detector only as directed. Operate the instrument only in perfect, functional state without
electric or mechanical defects. Have the instruction manual ready at the site of use in readable and
complete condition. Ensure that the device is used only by qualified and authorized personnel.
Employing personnel with knowledge that doesn't meet the requirements of application and testing may
result in safety hazards the operator of the testing instrument and the respective planners are
responsible for. You may ask KARL DEUTSCH or the representatives of the German Society of
Nondestructive Testing of Materials (DGZfP) for recommendations to pass a suitable training course.
Qualified use of the instrument, correct assessment of the test results and recognition of incorrect
measurements is based on knowledge you normally can expect with graduates of relevant training
courses, e.g. according to ISO 9712 and courses to the guidelines of the German Society of Non-
Destructive Testing of Materials (Deutsche Gesellschaft für Zerstörungsfreie Werkstoffprüfung (DGZfP))
or similar organizations.
Ensure that the operating personnel are capable of reading and understanding this manual. Non-
observance of the instruction and especially non-observance of the sections marked as important can
lead to wrong test results. Wrong test results can cause damage on person and/or things.
If you have further questions concerning the courses or testing of materials using the GEKKO instrument
or in general, KARL DEUTSCH will be pleased to help you.
1.6.2 About this manual

This operating manual can give only notes on the proper handling of the device and a description of
function of the controls. A solution of test problems is not covered by the operating manual.
Please, follow all safety notes and warnings in this manual carefully.
Read and follow all references marked by so there is no effect on the quality of the test process and
- if given - to ensure that safety relevant aspects will not be neglected.
1.6.3 Safety notes on the GEKKO

No operation in explosive environment
The GEKKO must not be used in an explosive environment. Follow your respective safety rules.
Protection class
The GEKKO complies with the requirements of the EN 61010 (VDE 0411) "Safety regulations for
electrical measuring, control, adjustment and lab devices" and left the factory in perfect state regarding
the safety technique.
Mains unit w/ low voltage output: With mains operation only use the mains unit provided by KARL
DEUTSCH for mains supply. When using a different power source you need to ensure prior to switch-
on that it is designed as a separated low level voltage source according to the current safety directives
and that the output voltage lies within the range which is permissible for the instrument.
Opening the instrument
There is no need to open the instrument with normal operation. There are no user-relevant controls
facilities inside the unit.
Thus, access to this area is only required to adjust, replace parts, maintain and repair the instrument.
This work must be carried out only by experienced and skilled personnel.
Failure and extraordinary use

If it must be assumed that a non-hazardous operation of the unit is no longer possible you need to switch
the instrument off and make sure that no unintentional switch-on is possible. In this case please contact
KARL DEUTSCH.
It must be assumed that a non-hazardous operation of the unit is no longer possible if
 the instrument shows visible damages,

 the instrument does not work anymore,
 the instrument has been stored for a long period under disadvantageous conditions,
 and in case of extraordinary transport conditions
Lithium Ion batteries

The battery powered GEKKO uses Lithium Ion batteries. Transport of these battery types is restricted
with reference to the United Nations Recommendations on the Transport of Dangerous Goods. If you
intend to transport Lithium Ion batteries you should contact your forwarding company regarding the
current directives for transport of Lithium Ion batteries.
2 PRODUCT DESCRIPTION
The GEKKO is a portable ultrasonic testing system which allows the application of standard phased
array methods, TOFD and conventional monoelement techniques. Beside that it is able to drive
matrix arrays and the Total Focusing Method (TFM).
The rugged design and touch-screen make the battery powered GEKKO ideal for field use.
The GEKKO software has been developed for all levels of operators. The step-by-step interface
simplifies the use of menus and reduces the risk of errors.
The GEKKO has been designed to be upgradable and to allow easy integration of new techniques.
Upgrades can be:
 Maintain compliance with International NDT Codes and Standards.
 Ensure compatibility with the latest UT inspection techniques. For example, to handle flexible
probes and other real-time adaptive techniques.
 Allow integration of new applications (Note: KARL DEUTSCH can tailor or develop new
applications on demand).
 Maintain compatibility with the latest CIVA release. For example, to allow CIVA files to be read
by GEKKO and vice versa to take advantage of the powerful CIVA analysis capabilities (release
pending).
2.1 Control panel buttons

On the right side of the touch screen, physical buttons are available:
Alarm
Wifi
Trigger Inc
Stop
Play/Pause
Freeze
Screenshot
Battery Status
On/Off
Fig. 1: Control Panel Buttons
Alarm, Wifi, Trigger: Not yet activated in the firmware version 1.6
Reset encoders: Press this button to reset the encoders to zero.
Stop: Press this button to end an acquisition.
Play/Pause: Press this button to start the acquisition. While acquiring data, push this button to pause
then restart the acquisition.
Freeze: Press this button to freeze the views. This can be used for further screen copies.
Screenshot: Press this button to copy the screen. The pictures are stored on the GEKKO hard drive
and can be retrieved thanks to the screenshots export located in the Preferences panel.
Batt: Press the BATT- button to get the battery charge indicator for each battery.
 Green: battery charge is between 30% and 100%
 Orange: battery charge is between 10% and 30%
 Red: battery charge is below 10%
 Blinking: Charging
On/Off: Press to turn the system on. Press more than 4 seconds to turn off the system.
2.2 Main Menu

When the GEKKO is turned on, the main menu appears:
Fig. 2: Main Menu
Indication of battery status
General Functions:
Call System Information
Store Error-Messages on USB-Stick
Call Picture-Explorer
Call „General Adjustments“
With the tabs you choose a Wizard, an Application or an Inspection Result

2.2.1 Navigating the touch screen

A few simple gestures - tap, swipe, drag - are all you need to operate the GEKKO. The following icons
are used in the manual:
Tap Swipe Drag
2.2.2 Navigation arrows

After a selection of an application setup, the navigation is done always from left to right using the arrows
located in the top banner. The accessibility of the menus depends on the context and their availability is
notified by a color code.
Fig. 3: Navigation Arrows
1. Home Menu: Directly available.

2. Checked: Directly available and validated.
3. Orange: Next step.
4. Grey: Next step not available.
2.2.3 Touch screen tips

Selection buttons
Tap on the triangle button to activate a drop down menu selection list:
Fig. 4: Drop down menu

Tap on any white field box to enter a text or numeric value. Text can be entered using an on-screen
QWERTY keyboard.
Fig. 5: Numeric keyboard

Numbers can be edited using either the on-screen keyboard or an embedded digital scroll wheel, which
is called via the button .
Fig. 6: Scroll function
The embedded digital scroll function can be activated with on the numeric pad and deactivated
with . Swipe the scroll wheel up and down to increase or decrease the value.
Fine tuning can be achieved by tapping the + and – buttons. The fine tuning precision can be achieved
by selecting the 0.1 – 1 – 10 values.
Tap OK to validate or Cancel to reset the value.
A selection is highlighted “dark”:
Fig. 7: Selection
In the GEKKO, each parameter has a validity range and the consistency with other parameters is
checked. An invalid or inconsistent value is highlighted red:
Fig. 8: Red = Invalid value
Orange color is used to guide the operator to the next step. Greyed values cannot be modified nor
selected.
Backward and Validation buttons

In sub panels, modification of parameters subpanels is done using Edit button.
A grey Edit button means that the panel can be accessed and modified. An orange Edit button means
that the subpanel can be edited before moving to the next step.
Fig. 9: Edit button
The changes are activated by pressing the Next button in main panels and OK button in subpanels.
With Cancel the parameters are reset to their previous values.
Fig. 10: Next, Ok and Cancel buttons

2.3 General Adjustments
The menu “General Adjustments” is called by in the main menu. Following system parameters
and preferences can be entered here:
Fig. 11: Tabs for system parameters and UT preferences

System settings
Localization
 Language: Available languages are Chinese (CH), German (DE), English (EN), Spanish (ES),
Portuguese (PT), French (FR) and Japanese (JP).
 Date, Time and Time Zone
Screen
 Brightness and Touchscreen adjustment
The touch screen settings can be checked with Test or calibrated with Calib. and linearized with Linear.
If the touch screen is not behaving correctly, the recommendation is to CALIBRATE then LINEARIZE.
During the calibrating and linearization process, a blue cross will appear and flash. It is recommended
to use the stylus to precisely tap the crosses.
UT adjustments
Units
Sound path in mm or inch and Amplitude in % or in dB
A-Scan
Sound path or Depth or Time of flight
Signal: RF, Rectified or Envelope signal.
TCG Calibration
Reference level: Automatic gain setting for desired
amplitude. These settings are used globally in the
GEKKO.
Color palette
Here you can preset the color palettes for amplitude, time
of flight, depth and TOFD images. With the palette

menu is called in which the palette type and the
thresholds for the image contrast and brightness can be
preset. These values can also be modified later by the
tools in the UT images.
Fig. 12: Menu Color Palette
Upgrade (in the lower banner)
 The Upgrade button is used to install new releases of the GEKKO software when available.
The upgrade file *.gek must be stored in the root of a USB flash drive. When the USB drive is
plugged, the detection of the upgrade is automatic and will be installed when confirming
“Upgrade to version Vx.x”
2.4 Launch a new application
2.4.1 Create an application from a wizard

The Wizard panel contains the generic “file source” of techniques from which one application can be
derived. The wizard tab contains various folders:
Conventional UT (with monoelement, TR and TOFD probes)
Beam forming Phased Array (with Linear- und Matrix-Arrays)
Total Focusing Method (TFM, Scanning technique with very high resolution)
Adaptive Total Focusing Method (ATFM)
Multi-Groups Techniques (combination of probes and techniques).
Application Templates (for some selected applications)
In order to create an application from a wizard, the technique or combination of techniques can be
selected. The recommendation is to select the technique or combination of techniques which is the
closest to the final application (in term of number of probes for example).
To create an application from the wizard panel, tap the Wizard panel. Select a technique or a
combination of techniques in the available lists to highlight it in dark grey. The right side of the panel
shows a schematic of associated technique or combination.
After loading the parameter set, the Start button of the bottom banner turns from light grey to orange.
Fig. 13: Wizards Tab with submenu for destination folder and file name
When loading, the destination folder and filename can be entered. The default folder is “Applications”
and the default application name is the Wizard name.
The parameter setups are structured, so that NDT experts can use them directly as templates for test
procedures.
In order to avoid unwanted changes or deletions the parameter sets in the wizard are read-only files
and cannot be edited or deleted.
2.4.2 Create an application from an existing application

In contrast to the Wizards, Applications can be imported, organized, copied, pasted and exported. It is
thus possible to use an application to create another one.
Each folder of the application panel contains a list of application files. When a folder is selected, the
bottom icons are activated and allow:
 To import an application file or folder from your USB stick
 To create a new folder
Fig. 14: Tab Applications
A selected file is highlighted in dark grey. The right part of the panel shows the schematic
representation of the technique or combination of technique issued from the Wizard.
Fig. 15: Selection of a parameter set in the tab Applications
The following file management buttons are available:
 Import an application file or folder from USB flash drive
 Export an application file or folder on USB flash drive
 Create a new folder
 Delete an application file or folder
 Rename an application file or folder
 Copy an application file or folder
 Paste an application file or folder
When a file is selected, the Create button is highlighted orange in the bottom banner. Tap Create to
proceed to the parameters setup.
2.5 Import / Export

The GEKKO allows import and export of pictures, applications, inspections files and inspections reports.
2.5.1 Import and Export of application or inspection files

Applications and Inspection results can be imported/exported from/to USB flash drives. Select the
Application or Inspection tab. Tap the import button to open the file-import popup:
Fig. 16: File Import
Fig. 17: File import popup, to select folder and file
The selected file or a complete folder is then available in the GEKKO main menu.
2.5.2 Export application or inspection files

To export an application or an inspection file, select an application in the list. To export a set of
applications, select the associated folder. Then tap the export button to open the export popup.
Fig. 18: Export of an application or folder
Select the USB flash drive and navigate through the folders to export the application or the set of
applications. Then tap Export.
Fig. 19: File export popup

2.5.3 Export screenshots
The screenshot manager is called via in the main menu. It enables to rename, delete and export
selected screenshots to a USB stick.
With further subfolders can be generated on the USB stick.
Fig. 20: Screenshot Manager
2.5.4 Export of Error Reports
Error reports are stored automatically in the GEKKO. With the button in the main menu they can
be exported to a USB stick, where a folder “GEKKO Errorlogs” is generated. The exported files are then
deleted in the GEKKO. It is recommended to send the error report to the developers.
2.5.5 Import of photos for the menu “Equipment”

In the submenus “Object”, “Probe” and “Scanner” you can enter your own photos in png-format. These
photos will appear later also in your inspection report.
With the pencil icon (see arrow), you open the menu for the selection of photos. You can select a photo
from the Gekko database or download one with from your USB stick.
Fig. 21: Import of photos

3 EQUIPMENT
3.1 Equipment menu

The Equipment menu contains the submenus for the Specimen, Probe and Scanner:
Fig. 22: Equipment menu
With you can load an object, a probe and a scanner from the database.
Tap Edit to modify or check details of equipment. In the subpanels the OK button will validate the
parameters changes and the CANCEL button will reset parameters to their previous values.
If the equipment is correctly set, tap Next to move to the “Settings” panel.
3.2 Specimen
This subpanel contains all the specimen data: geometry, presence and geometry of a weld and material
properties. The specimen subpanel is identical for all selectable inspection techniques. The left part of
the panel resumes the current specimen. The right part of the panel shows the tabs for the Geometry,
Weld and Material.
The specimen data can be saved with or loaded with in the bottom of the panel.
Fig. 23: Specimen tab
3.2.1 Geometry
Tap the Geometry tab to setup the geometrical parameters of the specimen.
With the Shape drop down you can select the basic geometry Cylindrical, Plane, Nozzle or Fillet weld
(T- or Y-joint)
The default geometry type is the plane plate. The left side schematically shows the specimen. The right
part of the panel is dedicated to the plate parameters.
With the touchscreen pencil or a mouse it is possible to rotate the 3D view:
Fig. 24: Rotation of the 3D view

Fig. 25: Specimen geometry “Plate”
Fig. 26: Geometry “Nozzle Weld” Fig. 27: Geometry “Circumferential Tube Weld
Select the tab Weld to access the Weld definition tool.

3.2.2 Weld
:
Fig. 28: Weld tab

In the weld tab you can define:
 With or Without weld
 In the case of tubes: Circumferential or Longitudinal weld. The selected weld orientation
automatically defines the probe orientation – always perpendicular to the weld. In the case of
longitudinal tube welds the foot of the probe is adapted to the tube radius. The Gekko supports
the inspection on curved surfaces.
If a cylinder is selected without weld, the array probe is oriented in circumferential direction.
The thickness of the weld is copied from the Geometry tab, but can be modified here.
The Gap (g) between the two welded plates can be modified and the Cap width is calculated. When
the Gap (g) is unknown, the Cap width value may be used to adjust the Gap value.
As mentioned before, also T-Joints and Nozzle Welds can be configured:
Fig. 29: Configuration of a T-Joint Fig. 30: Configuration of a Nozzle weld

The gap (g) between the plates can be modified. The resulting cap width is indicated.
Cap width
Fig. 31: Definition of the gap and the weld geometry
Tap Modify Weld to access the wizard for weld geometries. In the tab “Symmetry” a symmetric or
unsymmetrical geometry can be chosen.
Fig. 32: Weld Geometry
Fig. 33: Configuration of the weld profile
Click the left or right arrow button to select the weld type. A schematic picture and the according
parameters are shown.
Fig. 34: Invalid value

An invalid or not consistent value is highlighted red and the validation with “OK” is deactivated. When
all parameters are correctly set confirm with “OK” or tap “Cancel” to reset all parameters and to leave
the submenu.
3.2.3 Material
This tab is dedicated to setup the sound velocities and the density of the material.
The following functions are available:
 Direct input of the velocities of the longitudinal and shear wave
 Import from the material library
 Saving into the material library
 Velocity calibration with the calibration wizard
Fig. 35: Material properties

3.2.4 Import from or save into the material library
Tap on the import/save buttons to open the Material popup library. Swipe the list and select
a material. A material can be removed from the list with .
Fig. 36: Material selection
3.2.5 Velocity calibration wizard

This wizard provides step-by-step calibration instructions to measure the sound velocity in a calibration
block with known geometry.
Fig. 37: Calibration blocks with transducer for velocity calibration

Fig. 38: Velocity measurement
 Configuration (top right): presents the data entered in the probe menu and cannot be edited
here.
 Aperture: Enter the number of probe elements used to calibrate the probe. The default value
is the total number of elements of the probe.
 Depth: Enter the soundpath values d1 and d2 in mm.
 Adjust the measurement gate so that two echoes are captured by the gate.
 80 %: Adjusts the gain so that the strongest echo is not saturated and has an amplitude equal
to 80% of the screen height.
 Tap Measure (a successful or unsuccessful measurement then is indicated on the right side)
 Tap OK to apply the calculated velocity values.
Note 1: If the calculation is unsuccessful, adjust the gain and measurement gate and then repeat the
measurement. If it is not possible to capture two echoes in the measurement gate when the amplitude
of the strongest echo is displayed at 80% screen height, then it is possible to make two sequential
measurements. For the strongest echo, set the amplitude to 80% screen height and set the calibration
gate on this echo only; then tap the Measure button. For the second measurement, increase the gain
so that the next echo is visible. Reset the calibration gate on this echo and tap Measure again. Then
validate and apply the calculated velocities by tapping the Validate button.
Note 2: Phased array beam width at the natural refraction angle is related to the number of element
used. Decreasing the aperture number can solve an unsuccessful calibration.
Fig. 39: Reduction of the aperture

3.2.6 Specimen library
With and you can load and save specimen parameters.
Fig. 40: Load a specimen
Fig. 41: List of specimens

3.3 Probe
The probe menu contains 4 submenus: Configuration, Dicing, Wedge and References.
The pictures and parameters are probe dependent (mono-element or phased array) and also depend
on the inspection technique (Phased Array, Pulse/Echo, TOFD).
3.3.1 Configuration
 The left side of the menu presents a graphic of the selected probe type.
 The probe library is called with .
 A new probe configuration can be stored with in the probe library.

 Central frequency (same for all activated probes)
 For Phased Arrays: 0.4 to 20 MHz
 For Monoelement Probes: 0.4 to 25 MHz
 Filtering: Bandpass Filter, with indication of the upper and lower frequencies
 Configuration: Pulse-Echo or TOFD (TOFD is only activated, if an application for multiple
probes has been defined).
 Sampling frequency: 10 to 100 MHz (same for all activated probes)
 Averaging: Signal averaging 1 to 32 (same for all activated probes)
 Pulser Voltage: For Phased Arrays: 12 to 100 V / For Monoelement Probes: 12 to 200 V. The
battery consumption depends on the selected voltage. A lower voltage reduces the battery
discharge
 Pulse Width: The value is set automatically for the selected central frequency. It can be
changed manually. With “Init” it will be reset.
Fig. 42: Menu Probe / Configuration

3.3.2 Tab Dicing for Linear Arrays

In this submenu you can enter the following values: Number of elements, Pitch, Gap and the passive
length (elevation) of the elements.
For multiple probe configurations the channels must be selected sequentially, e.g. channel 1 to 32 for
the first array and 33 to 64 for the second array.
Fig. 43: Dicing menu for linear arrays
In this example the probe PA2 is selected and the channel of the first element is set to 33.
3.3.3 Tab Dicing for Matrix Arrays

The selectable parameters for matrix arrays are:
 Number of elements per width and length
 Pitch (p) and Gap (g)
The total number of elements (rows x columns) cannot exceed 64.
For matrix arrays a wizard is available for the numbering of the elements. Tap Numbering in the tab
Dicing to open the wizard.
Fig. 44: Dicing menu for matrix arrays
A change of the numbering is for example important, if the matrix probe is rotated on its angular wedge.
3 numbering types are available: Horizontal and vertical symmetry and the change between rows and
lines. The selected numbering is indicated in the wizard graphic.
Fig. 45: Wizard for numbering the elements of matrix arrays

3.3.4 Geometry for mono-element, dual element and TOFD Probes

For monoelement probes a circular or rectangle transducer and the Lemo-Connector can be selected.
In case of dual element and TOFD probes 2 connections must be selected.
Fig. 46: Geometry menu for monoelement probes
Fig. 47: Geometry tab for dual element probes

3.3.5 Geometry for TR configurations with linear and matrix arrays

Select in Wizards under 2-Beam forming phased array the wizard Dual Linear Array.
Then choose DUAL in Equipment / Probe / Configuration /Configuration
and set the Footprint to Linear in the tab Dicing.
The maximum element number is 2 x 32 = 64 elements.
With the button you enter into the menu which enables the arrangement of the
transmitting and receiving arrays:
Fig. 48: Dicing menu for TR arrangement with Fig. 49: Submenu for the element arrangement
Linear Arrays
The TR configuration for matrix arrays is performed accordingly. For this purpose select the Wizard
2 Beam forming array and then the configuration Dual matrix array.
Fig. 50: TR probe with matrix arrays

3.3.6 Amplitude balancing

Set your probe on a plane parallel block. Tap the button Amplitude Balancing in the menu Dicing for
Array probes to enter into the according wizard.
Fig. 51: Amplitude balancing for linear and matrix arrays
To balance the probe elements, perform the following steps:

1. Set the gate in the A-scan window to capture the backwall echo
2. Adjust the gain so that no channel is saturated
3. Tap the button 80% to set the response of the largest amplitude signal to 80% FSH
4. Tap the Balance button.
Via Info the balance values are shown.
The lower diagram on the left side shows the balanced amplitudes for all elements.
The balancing values are accepted with OK.
3.3.7 Delay and Wedge setup

From this screen, the operator chooses either with or without wedge.
If a wedge is selected you can choose L0 or angled. (L0 stands for Longitudinal wave with 0°.
Width
Height
Length
Fig. 52: Geometry of a plane delay block
Fig. 53: Wedge Geometry
Fig. 54: Plane delay

Fig. 55: Angled wedge
Here the following properties can be entered:

 With or Without wedge
 Plane delay or angled wedge
 Wedge or refraction angle (the other value is calculated automatically)
 Longitudinal or Shear Wave (concerning the refraction angle)
 Wedge data: Height, Length, Width, LW-Velocity
The wedge velocity is indicated by the manufacturer. The standard materials are Polystyrene (c = 2350
m/s) and Plexiglas (c = 2730 m/s)
The actual sound velocity can also be measured using the wizard Sound Velocity in the menu Wedge.
3.3.8 Velocity wizard for the delay or wedge

For Arrays a wizard is available in the submenu References for the measurement of the delay or wedge
velocity.
Fig. 56: Wizard for the velocity measurement

Steps for the velocity measurement:
 Enter the wedge thickness (an accurate value is essential)
 Place the probe on one of the wedge faces
 Set the gate over the first two echoes
 Adjust the gain of the strongest echo to 80% FSH using the button 80%
 Tap Measure
 Confirm with OK or tap Reset to repeat the measurement
The wedge database is called by and . With a selected wedge is deleted. This action
must be confirmed with OK.
Note: If it is not possible to capture two echoes in the measurement gate when the amplitude of the
strongest echo is displayed at 80% screen height, then it is possible to make two sequential
measurements. For the strongest echo, set the amplitude to 80% screen height and set the
measurement gate on this echo only; then tap the Measure button. Next, increase the gain to make the
next echo visible. Reset the calibration gate on this echo and tap Measure again.
With “OK” the velocity value is confirmed.
3.3.9 References
Here the reference point of the delay or wedge is defined: Beam exit point or Wedge Front.
Fig. 57: Submenu References
On the right side the wedge parameters H and I can be entered. 3 Modes are available:
A) Sound path from central element to sound exit point (CIVA)
B) Height of central element
C) Height of first element
Furthermore it is possible to turn the array on the wedge, which can be necessary in case of spatial
limitations. Under First element location you can define the position of the first element Down or Up.
3.3.10 Wizard Angle / Height

With the wizard Angle / Height in the submenu References the angle and the height of the wedge can
be measured automatically.
Fig. 58: Wedges which can be calibrated
Fig. 59: Automatic measurement of wedge height and angle
Top left: B-Scan with the echoes of the wedge bottom

Bottom left: A-Scan for the vertical cursor in the B-Scan, here for element 11.
The gate must be adjusted in such a way that all echoes from the wedge bottom are captured correctly,
which is marked by +. If this is not the case you can adjust the gate and gain settings.
3.3.11 Delay measurement for mono and dual element probes

For mono and dual element probes a wizard for the delay measurement is available in the menu
References / Zero Calibration:
Fig. 60: Zero calibration
On the right side you find instructions for the measurement. For the measurement the first 2 echoes are
used. On the right side at the bottom the measured value is shown.
Steps:
 Position the gate over the first 2 echoes
 Adjust the gain using the button 80%
 Tap Measure
 Confirm with OK
 Tap Reset to repeat the measurement

3.3.12 Reference point and wedge parameters for TOFD

For TOFD arrangements the reference point is generally defined as the middle between the 2 TOFD
probes. The wedge height can be determined with the wizard References / Zero Calibration.
Fig. 61: Reference point for TOFD
3.3.13 Add or remove a probe

The GEKKO supports multichannel applications if you have selected a multichannel combination in Main
Menu / Wizards. Up to 4 array probes are possible. A TOFD pair is counted as 1 probe.
The multichannel application is configured in the menu Equipment / Probe.
With probes are added. The parameters of subsequent probes are by default the same as for the
first probe. Then you can edit the parameters, e.g. probe position and orientation.
The GEKKO checks the number of elements and channels. If something is not compatible the number
of elements will be highlighted Red.
If a probe is highlighted “Orange”, the probe parameters still must be edited or loaded from the probe
library.
With a probe will be deleted.

Fig. 62: Add or Remove a Probe
3.4 Scanner / Encoder

With position encoders scan results are presented spatially correct. The GEKKO supports 3 encoders,
e.g. for the axes x, y, z.
Fig. 63: Scanner Menu
With and a scanner is loaded or stored.

In the configuration menu you can select:
 With or Without scanner
 The encoder channel 1 to 3 (Information concerning plug and wiring are presented in the
technical documentation of the GEKKO)
 The encoder resolution
 The scan direction
For different inspection tasks multiple scanner types are available – with 1, 2 or 3 encoders. Some
examples are presented in the following:
Fig. 66: Probe holder with wheel Fig. 65: 2D scanner Fig. 64: 2D scanner with wire
encoder encoders
Fig. 69: 2D scanner with Sinus arm Fig. 67: Scanner for circumferential Fig. 68: 3D scanner for nozzle
tube welds welds
With Calibration in the menu Scanner you enter into

the calibration menu:
1. Enter a distance in the Length box
2. Start the calibration with and move the

encoder over the above mentioned distance.
Stop the measurement with .

3. Validate the calibration with OK or tap Reset to
recalibrate it or Cancel to navigate back to the
encoder main panel.
Fig. 70: Menu for the encoder calibration

4 SETTINGS
In the menu Settings all acoustic parameters are set. It comprises the acoustic coverage in the
inspection plane as well as gate and gain setting.
The panel Settings is divided into subpanels which differ according to the NDT technique:
 Phased array
 TFM (Total Focusing Method)
 ATFM (Adaptive Total Focusing Method)
 Pulse Echo with mono and dual element probes
 TOFD
4.1 Parameter Setting for Phased Array

The menu Phased Array Parameters contains the following submenus:
 Phased Array parameters
 Gates
 Amplitude Calibration
Fig. 71: Parameter Submenus for Arrays

4.1.1 Phased Array Parameters

The traditional B-Scan methods (Sector Scan and Linear Scan) can be selected here:
Sectorial Scan
Fig. 72: Focal Law adjustment and calculation for Sector Scans
In this example a setup for a sector-scan with shear waves for a weld inspection is presented.
Adjustable are:
 Wave mode (LW = Longitudinal Wave, TW = Transverse or Shear Wave)
 Definition of the sector scan: Aperture, Start and final angle, definition of 1 st element and the
angular step width
 Focus adjustment
 Probe position and orientation
 Calculation of the focal laws
With OK the parameters are confirmed. With Cancel you leave the menu without changes.
The start angle can be set to 0°. However, it is recommended to begin a 35°, because below 35°
longitudinal waves will occur.
The maximum final angle can be set to 89.9°. Thus it is possible to generate Rayleigh Waves.
If you select a shear wave angle of 33°, you generate Longitudinal Waves with 90° - the so-called
Creeping Wave.
In the field Options you can select the focus depth.
In the field Probe Position you can select the probe offset and orientation in relation to the weld.
The real-time presentation on the right side allows the live checking of the parameter settings.
Linear Scan (also called Electronical Scan)
Fig. 73: Focal Law adjustment and calculation for linear scans
This example presents the adjustment of a linear scan with longitudinal waves for a weld inspection.
Adjustable are:
 Wave mode (LW = Longitudinal Wave, TW = Transverse or Shear Wave)
 Definition of the linear scan: Aperture, angle, definition of the 1st and last element and element
step width
 Focus adjustment
 Probe position and orientation
 Calculation of the focal laws
With OK the parameters are confirmed. With Cancel you leave the menu without changes.
4.1.2 Tools for the 3D-Visualization

For 3D-Views the following tools are available:
Symbol Action
Zoom
Center the view and adapt the size
Move
Rotate
Fold the soundfield at the backwall
3D-View Manager
Table 1: Tools for 3D views
With the 3D-View Manager different views, e.g. top view, side view, etc. can be chosen:
Fig. 74: 3D-View Manager
4.1.3 Probe Position and Orientation

The positioning of the probe over the specimen to be inspected is also managed in the motion subpanel
of the setting panel. Nevertheless, two axis boxes allow positioning a probe with respect to a weld bevel.
These boxes are available for welded specimen only and are disabled for un-welded plates or cylinders.
The Offset axis box manages the distance or offset between a weld centre line and the probe reference
(represented by the red dot in the 3D view – see section Submenu References. Negative values can be
used. Basically, the offset depends on the geometry of the specimen:
Distance between the red and green spots along Distance between the red and green spots
X axis along Y axis
Distance between the red and green spots of the cylinder (rotation around Y axis)
Fig. 75: Offset and Orientation
For plane butt welds also the orientation angle can be adjusted. This angle describes the rotation around
the z-axis.
Fig. 76: Orientation angle on a plane butt weld

4.1.4 Focusing
The focusing of Phased Array sound fields is calculated by means of the CIVA algorithm.
Tap under options, to enter into pop-up menu for Focusing:
Fig. 77: Focusing submenu
 Here you can choose With or Without focusing.

 In case of “with focusing” the start and end of the focal depth range can be entered.
 Please note that focusing is only possible in the nearfield. Using a bigger aperture e.g. 64
elements or a larger pitch increases the focusing capabilities because the near field gets longer.
Sector scan focalization algorithm

The algorithm used for focalization is the same as CIVA optimized Focalization and Depth focusing. It
considers the beam angle and the focal depth.
The initial angle is associated to the Start depth and the Final angle to the End depth. The Angle range
and the depth range is discretized in equal steps.
Constant Final angle End depth

angle steps
Constant
depth steps
Start depth
Initial angle
Fig. 78: Angle/Depth range
The next picture shows a cylindrical example. Here the depth is defined as the normal distance to the
cylinder surface. The Start depth is chosen equal to the End depth in this example.
Final angle
Initial angle
Start depth
Constant angle steps (according to the normal End depth
to the cylinder in the middle of the wedge)
Fig. 79: Focusing in a cylinder (tube)

Note: A reflection at the inner wall of a tube is not always possible:
Fig. 80: No reflection of the beam marked by the arrow
Focusing in Linear scans

The algorithm used considers the beam angle and the focal depth for plane and cylindrical objects:
Fig. 81: Focusing in Linear Scans

4.1.5 Sector Scans with Matrix Arrays
Fig. 82: Skewed Sector Scans with a matrix array
The submenu Sector Scan for Matrix Arrays contains:

 Wave mode (Longitudinal or Shear Wave)
 Adjustments
o Active Aperture and first element
o Angle Range for the sector scan
o The number of shots is calculated automatically (Maximal 200 shots)
 Options
o For Focusing
o For sideward skewed Sector Scans
If you choose With Skew under Options you can define Sector Scans with sideward skew angles –
with the parameters selected for the 1st Sector Scan. Enter here the start skew angle, the final angle
and the angle step width. The number of the Sector Scans is calculated automatically.
Fig. 83: Options for Matrix Arrays

4.1.6 Gates settings
Fig. 84: Gate Adjustments
Click Edit to enter into the menu Gates. One signal gate, containing the A-Scan data, is automatically
set and displayed white.
Fig. 85: Submenu “Gates”

The parameters Start, Width and Threshold of the gate can be defined by
 Input of the values into the text boxes in the lower banner
 Or by striping the gate on the touchscreen
The corrected view is automatically updated.
Fig. 86: Gate configuration
5 peak gates (saving amplitude and time of flight) can be added by tapping the “+” button.
Each gate can be configured also afterwards by tapping .
removes the selected gate.

In the detection mode you can select:
 Max Echo: Highest echo in the gate
 First Echo: First echo in the gate
 Last Echo: Last Echo in the gate
 Max Threshold: Highest echo in the gate above the threshold
 First Threshold: First echo in the gate above the threshold
Under Threshold you can select: Positive, Negative or Absolute value of the signal
The first gate can acquire the complete echo signal. That enables the acquisition of A- and B-Scans.
The signal gate can also be used to synchronize the other gates.
The 4 additional gates work in the peak modus for the acquisition of amplitude and time of flight.
With the drop-down menu for the color you can change the color of the selected gate.
With the A-Scan and B-Scan are exchanged.

4.1.7 TCG calibration

By default the Amplitude calibration is set to Off. Click On and Edit to enter into the submenus. Select
TCG calibration.
Fig. 87: Amplitude calibration
TCG calibration is a Time-Corrected Gain wizard which is designed to equalize the amplitudes of all A-
scans or focal laws over the sound path range with a series of reference reflectors. This is the same
function as known from conventional single channel instruments with the exception that it is performed
on all angles within a sector scan.
For the calibration a calibration block with side drilled holes is required.
Move the array probe over the reflectors. The echoes for all distances and angles are set to the same
amplitude, which is by default 80% FSH. This value can be changed in the menu General Adjustments
in the Home menu.
Fig. 88: Example for the TCG calibration

Calibration steps:
 Amplitude acquisition:
The echo amplitudes are acquired up to 800 % FSH. The amplitude values can be reduced
afterwards via digital gain setting.
 TCG signal acquisition:
Tap and move the array probe to obtain the cumulated signals in the sector scan. Stop
the acquisition with and click Continue to get to the next step.
 TCG calculation:
o With the button Zone rectangle zones can be defined and placed over the indications.
With you can delete a selected zone.

o The echo dynamic curve (bottom left) presents the maximum amplitudes over the
angles (shots).
o The selection Zone # activates the according echo dynamic curve.
o With Calculate the GEKKO calculates the TCG values. When successful, the
indication TCG computed appears.
The maximum compensation is 20 dB.
Fig. 89: TCG signal acquisition

Fig. 90: TCG calculation

Via Info the gain settings are shown in a table. In order to see all gain values you can scroll the table.
Fig. 91: Gain setting information table

TCG checking
Fig. 92: TCG checking

With TCG checking the amplitude values can be acquired once more with the computed TCG
correction. Tap and move the array probe. After tapping and Next you can check the TCG
setting in the echo dynamic curve. The amplitude values should now lie within the window 80 % ± 5 %.
Fig. 93: Echo dynamic curve after Fine Tuning

Now tap OK to go back to the menu Parameter.
4.1.8 DGS Calibration

Select in the menu Settings / Amplitude Calibration the submenu DGS Calibration.
Note: The DGS function is only activated, when Focusing is switched off in the menu Settings / Phased
Array Parameters.
A side drilled hole (SDH) is used as reference reflector. The sound path must be larger than 2 nearfield
lengths.
Swipe the cross cursor in the sector scan (or linear scan, if selected) and the gate in the A-Scan on the
echo. The insonification angle and the depth of the SDH are measured automatically.
Enter the diameter of the SDH and adjust the amplitude to 80 % FSH using the button 80 % in the lower
banner of the menu. With Compute the equivalent disk diameter (equivalent reflector size ERS) is shown
top right in the A-Scan.
Continue with OK and Continue.
Fig. 94: DGS calibration
DGS measurement in the mode Inspection:

Swipe the cross cursor in the sector scan (or linear scan, if selected) on the echo indication and then
the cross cursor in the A-Scan on the echo peak. The equivalent reflector size will now be computed
with CIVA and indicated in the A-Scan picture top right, here: DGS: 1.9 ERS.
Fig. 95: ERS measurement in the mode “Inspection”
4.2 Parameter-Setting for TOFD

The TOFD parameter menu contains 3 submenus:
 TOFD Settings (PCS calibration)
 Gates
 Amplitude calibration
Fig. 96: TOFD parameter menus

4.2.1 TOFD Settings (PCS calibration)

Here the PCS value is defined. (PCS = Probe Center Separation = Distance between sound exit point
and sound receiving point on the 2 probes)
 Place the TOFD probe pair on the test object with the actual thickness d. A position beside the
weld is recommended. A probe distance shall be adjusted so that the main axes of the sound
beams meet at a depth of 2/3 d. The required PCS value is calculated automatically and
indicated. The value can be changed manually if needed.
 For the definition of the lateral wave and the backwall echo two gates are available. They can
be activated or deactivated. For both gates you can define the detection mode and the
threshold. For this purpose tap .

 Two views can be selected: A- or B-Scan.
 With TOFD Calibration the real PCS value is measured and the non-linear TOFD depth scale
is generated. If no TOFD calibration has been carried out, the depth scale is not available.
Fig. 97: PCS calibration
4.2.2 Further TOFD Calibration Possibilities

Normally, the PCS value and the depth scale are evaluated by means of the lateral wave and the
backwall echo.
If no backwall echo is available, the non-linear depth scale can be computed using the lateral wave
position and the manually entered PCS value. Select in the A-Scan only the gate for the lateral wave
and tap TOFD Calibration.
If no lateral wave signal is available, the non-linear depth scale can be computed using the backwall
echo position and the manually entered PCS value. Select in the A-Scan only the gate for the backwall
echo and tap TOFD Calibration.
4.2.3 Amplitude calibration

An amplitude calibration normally is not applied for TOFD, because diffraction signals are determined
by means of the time of flight and not the amplitude. Indications of reflected echoes only appear in the
case of lacks of fusion parallel to the surface between weld layers and in the case of side drilled holes
as reference reflectors.
The amplitude calibration function is not deactivated, as it might be useful sometimes.
4.3 Parameter setting for mono-element probes

The menu Settings for mono-element probes contains 2 active submenus for Gate adjustment and
Amplitude calibration:
Fig. 98: Submenus for mono-element probes

4.3.1 Gates
The GEKKO provides 5 data acquisition gates. The gate parameter setting is the same as described
for Phased Array Probes, see Gates settings.
Fig. 99: Gate Definition
4.3.2 Time Corrected Gain (TCG)
Fig. 100: TCG calibration for mono-element probes

4.3.3 Distance Amplitude Curve (DAC)
Fig. 101: DAC-curve for monoelement probe
4.4 Parameter setting for Dual-Element probes

The menu Settings for dual-element probes contains the submenus Gates and DAC/TCG. In both
menus the parameter setting is done as described for mono-element probes, see Parameter setting for
mono-element probes.
4.5 Parameter setting for the Total Focusing Method (TFM)

The TFM method provides ultrasonic images with very high resolution. The algorithm contains 2 steps:
Data acquisition:
Every element transmits a pulse and all other elements receive every pulse sequentially (Full Matrix
Capture, FMC)
Calculation:
A defined Region of Interest (ROI) is subdivided in pixels. For every pixel and every element the signals
are integrated according to the TOF (time of flight).
Fig. 102: Principle of the TFM method
The menu Settings for TFM contains only 1 active submenu TFM Parameters. (The menus Gates and
Amplitude Calibration are deactivated):
Fig. 103: TFM parameter setting
With Edit you enter into the menu TFM settings:

Fig. 104: TFM adjustment
 Top left the wave mode is selected: L = Longitudinal Wave, T = Transversal or Shear Wave and
sound paths with mode conversion. With the diagrams below that you can select the
appropriated sound path: direct or indirect.
 In the part Zone the Region of Interest (ROI) is defined. You can edit the width, height, depth
and the offset. The x-offset describes the distance between the zone centre and the reference
point of the probe as defined in the menu Equipment / Probe.
Fig. 105: Definition of the ROI
 When all settings are entered correctly tap Calculate to start the CIVA calculation and real time
visualization of the TFM-B-Scan.
 Tap Adjust Gain to optimize the contrast according to the highest and smallest indication in the
ROI. Before doing that place the probe on a block with reference reflectors. (If no useful echo
signal is available a noisy image is obtained).
 In the upper banner of the menu you can further edit the values for the analogue and digital
gain. (The maximum analogue gain is 40 dB).
 The TFM method provides image resolutions in the range of the wavelength if 64 elements are
available. The following parameters must be very exact and should be measured with the
calibration wizards in order to obtain best results:
o Probe properties (pitch, gap, wedge angle, wedge height)
o Sound velocity
o Object thickness, when one of the TFM modes with sound reflection was selected.
Tap to call the option for the image resolution. A lower resolution permits a higher scanning
speed and vice versa.
Fig. 106: Adjsutment of the TFM resolution

4.5.1 Available TFM images

For TFM different views can be configured:
Fig. 107: Different TFM views
In this example the following views were selected:
D-Scan (Depth versus

Scan Path, mechanical B-
TFM-B-Scan (intersection) Vertical echo dynamic
Scan for the vertical
curve of the TFM-B-Scan
cursor position in the C-
Scan)
Horizontal echo dynamic C-Scan (top view) Cumulated D-Scan (Side

curve of the TFM-B-Scan View)
4.6 Multichannel Setup

In the EN 16018 standard dedicated to phased array terminology, a salvo stands for an acquisition
sequence carried out with a phased array probe in one position dedicated to one application. It is also
mentioned as acquisition cycle.
Table 2 shows the possible combinations. (PE stands for Pulse-Echo with mono-element or dual-
element probes)
Combination PA TFM TOFD PE
PA x x x
TFM
TOFD x x x
PE x x x
Table 2: Possible combinations
Due to the special data acquisition TFM cannot be combined with other probes or salvos. Multiple probes
can be defined in the menu Equipment / Probe. Multiple salvoes can be defined in the Settings panel
when the buttons and are available at the bottom banner of the Settings panel. These
functions are active if you have selected before a multichannel parameter setup.
Fig. 108: Multichannel selection
Tap to add a salvo or to delete a salvo. The new salvo will automatically copy the previously
selected phased array parameters. Then select the salvo and edit the delay laws to change the
parameters.
5 CONFIGURATION
In this panel the scan parameters, the window layout, the pulse repetition frequency and the
configuration of the inspection report are configured.
Fig. 109: Configuration panel
5.1 Menu Motion

Here you can edit the Pulse Repetition Frequency PRF (bottom left).
With Edit you enter into the submenus References and Scan Parameters.
5.1.1 Submenu References
Fig. 110: Reference points
In this subpanel the zero-point position of a probe is defined. In case of multiple probe configurations
this point is used as Group Reference.
Right from the 3D view following parameters can be defined:
 the individual probe position
 the Group or probe holder position
 the reference line on the specimen
Probe positioning
Select a probe. It will be highlighted dark in the 3D view. (A TOFD pair is counted as 1 probe).
The probe reference point is marked red in the graphics. If the values for Offset, Scan Offset and
Orientation are changed, the probe positions are actualized in the 3D graphic.
Green dot for specimen reference
Yellow dot for group reference
Red dot for probe reference
Fig. 111: Graphical display for probe positions
Probe group positioning

Select a probe. Tap “Define as Scan Reference” button to define the probe that will be used as the
reference of the probe group or probe holder. The yellow dot for group reference will be fused with the
associated red dot. The Scanning offset value can be modified and this will affect the whole group of
probe.
5.1.2 Submenu Trajectory

In the tab Trajectory the following scan parameters can be defined:
 The trigger type (Encoder or Time base)
 The scanning distance or time and scanning step width
 The scan orientation and direction

Fig. 112: Tab Trajectories
5.1.3 Scan parameters for 2D-Mapping
Fig. 113: Trajectory menu for 2D-Mapping

If 2D-Mapping has been selected, two encoders for the main and increment axes are available. For
both axes you can define the scan direction and scan path. For the main axis the step width can be
edited. For the increment axis the increment value is given by the increment encoder.
5.2 Menu Layout

In this menu the types and arrangements of the images are defined.
Fig. 114: Layout menu
Top left: Up to 4 tabs are available in the acquisition panel to display a large variety of ultrasonic images
dispositions. Tap “+” tab to add a layout panel.
removes a layout panel.

The text box renames the layout panel.
Each tab can be managed individually and
divided into a maximum of 6 windows as shown
in the two next screen captures (tap „>“ or „<“
to switch the available layouts):
The right-hand side of the subpanel is dedicated
to the data attached to each window of the layout.
A color code is associated to each window and
the different salvoes available can be associated
to each window with the left drop down menus.
Tap and then select the probe, the salvo, the

gate and the data type.
Fig. 115: Data Selection for a data window

5.2.1 Available views

The table shows the available data, depending on the probe and the gate types:
Linear Array Matrix Array TFM TOFD PE
A-Scan,
A-scan, TFM-B-Scan A-Scan, A-Scan,
Signal E-Scan,
S- and C- Top, Side and Mechanical Mechanical
Gate S-Scan,
Scans for each End View, B-Scan B-Scan
C-Scan
skewed plane, Echo dynamic
D-Scan
3D-View
3D-View
- - -
Peak C-Scan C-Scan
Gate
Table 3: Available views
C-Scan
A-Scan
D-Scan
S-Scan
Fig. 116: Example for a layout with A-, S-, C- and D-Scan
 The C-Scan presents the sector scan angles versus the scan path. The amplitude is color coded.
 The D-Scan presents the sound path versus the scan path. The amplitude is color coded.
In case of a multiple probe configuration only one 3D-View is available.
5.3 Job Details

In this submenu the inspection report is configured and also the management of the data handling.
Fig. 117: Configuration of the Inspection Report
Here you can enter the information for your inspection task. With Edit the menu Inspection Report is
opened.
Fig. 118: Popup for the definition of the input boxes

Here you can check, edit or delete the input boxes.

With Ok you go back to the menu Information, where the data are entered into the selected input boxes.
On the left side the logo, which shall appear in the inspection report, is shown. Tap the pencil icon
bottom right in the graphics window in order to select your own logo. If your logo is stored in the Gekko,
you can directly choose it. If this is not the case, you can load your logo in png-format from a USB stick.
Fig. 119: Tab Recording
In the tab Recording can be defined:

 The file name of the inspection report
 Checking concerning automatic numbering in case of serial inspections
 The folder where the reports shall be stored
 Checking concerning automatic storing after finishing an inspection
Tap OK to enter into the menu Inspection.

6 INSPECTION
When all parameters are configured the inspection can be carried out.
Fig. 120: Acquisition panel
In the upper banner the current UT settings are shown. This banner is also used to display real time
signal values for specified gates.
In the middle the ultrasonic data according to the defined layout are visualized.
With the tools in the bottom banner the encoder can be set to zero and an acquisition is started and
stopped.
6.1 Current UT settings and real time signal values

The default banner shows the current UT settings: Start and length of the inspection range and the
analogue and digital gain. In this menu only the digital gain can be changed with +/-.
Fig. 121: Default banner
Tap the switch button to access measurement values.
Fig. 122: Measurement values
Tap on a measurement field to open the menu Indicator settings:

Fig. 123: Measurement selection

The following measurement types can be selected:
 The salvo, e.g. PA1-S1
 The gate, e.g. G1
 The measurement type:
 Amplitude in % (until 800 %) or in dB in relation to 100 % FSH
 Amplitude in dB in relation to a threshold (TCG, DAC or gate threshold)
 Time of flight in µs or sound path in mm
 Depth of an indication in mm
 Distance of an indication to the reference point of the probe (Projection Distance PD or Reduced
Projection Distance rPD)
 Distance of an indication to the weld centre line ( - or + p )
 With the check box Current shot you can select whether a measurement value shall be indicated
for the maximum value in the complete B-Scan or only for the selected shot which is defined by
the angle cursor in the B-Scan.
PD
rPD
Fig. 124: Distances PD, rPD and +/- p
Salvo # Measurement type
Gate # Measurement value
Shot Number and angle
Fig. 125: Informations in a measurement box
For matrix probes additionally the skew angle is indicated:
Fig. 126: Measurement values for a matrix array configuration

6.2 Visualization of ultrasonic data

The layout is defined in the menu Settings / Layout.
Fig. 127: Visualization of ultrasonic data

For every window tools are available, which enable the selection of properties like color scale, cursors,
zoom etc., see Tools for the ultrasonic images.
6.3 Scanning and Acquisition

The bottom banner is dedicated to data acquisition, including start/pause/stop acquisition.
Fig. 128: Data acquisition banner
The following buttons are available:
Scan Start Pause .Stop
Store Inspection Report Freeze Zero Encoder Go back

For the data acquisition also the hardware buttons on the Gekko can be used.
When a scan was stopped or finished, a pop up asks to save the acquired data in an inspection file.
Rename eventually the name of the inspection file and tap yes or cancel to re-start the acquisition.
Fig. 129: Saving the inspection data

If yes is pressed, the acquired data are saved in the inspection file. Then it is possible to:
 Go back to the home page,
 Go back to the inspection settings,
 Start a new acquisition,
 Or proceed to Analysis of Data.
Fig. 130: Actions after saving

The stored inspection files can be accessed from the Inspection tab in the Home page. They can be
loaded and analysed from this tab.
If an inspection file has not be stored, it cannot be analysed.
7 DATA ANALYSIS
The analysis window is comparable to the inspection window. Only the lower banner is different.
Fig. 131: Data Analysis window

The GEKKO analysis comprises:
 Measurement data
 Analysis boxes
 Tools for every view (Color scale, Zoom, Cursors, etc.)
 Inspection Report
7.1 Data Analysis

The upper banner with the measurement data is comparable with the banner in the inspection window,
see Current UT settings and real time signal values.
7.2 Analysis boxes

Each indication can be selected and evaluated concerning amplitude, length, height.
Automatic sizing tools will be available in the GEKKO with new releases.
The GEKKO files are compatible with CIVA and CIVA analysis for further and more powerful sizing
techniques, processing of data and advanced reporting.
Tap to add a box.
Fig. 132: Tool banner

Swipe a box on an indication in the ultrasonic image. (In A-Scans a box cannot be marked).
Fig. 133: Selection of a box in a C-Scan
Tap to open the indication list.
Tap to enter a precise description of the indication and to attach a screenshot.
Fig. 134: Indication list

Select the type of indication (flaw, geometry, etc.) and add a remark and a screenshot in png-format. A
picture can also be loaded from a USB-Stick.
Fig. 135: Description of an indication
Fig. 136: Selection of a screenshot

7.3 Tools for the ultrasonic images
With in every ultrasonic image (bottom left) you can access a tool bar, see following table:
Tool Operation Available in Available for
Amplitude in % A-Scan For all configurations
Amplitude in dB A-Scan For all configurations
Rectified signal A-Scan For all configurations except TOFD
HF-Signal A-Scan For all configurations except TOFD
Deactivate EchoMax In Calibration Wizards and only for

A-Scan
Indication Rectified Signal
In Calibration Wizards and only for
Activate EchoMax Indication A-Scan
Rectified Signal
In Calibration Wizards and only for
Delete EchoMax Indication A-Scan
Rectified Signal
Zoom in All Views For all configurations
Zoom out All Views For all configurations
A-, S- and E-Scan in

Gate ON / OFF For all configurations, except TFM
Inspection Mode
Activate Full Screen Mode All Views For all configurations

Deactivate Full Screen All Views For all configurations
Mode
Show Cursors (0, 1 or 2) All Views For all configurations
Activate or deactivate sound S- and E-Scans in

For Phased Array-configurations
field folding Analysis Mode
Activate or deactivate sound S- and E-Scans For Phased Array-configurations
field skip presentation
TCG-Curve ON / OFF A-Scan If TCG is computed
DGS Indication ON / OFF A- Scan If DGS is computed
Indication of Amplitude, C- Scan For all configurations

Time of flight or Depth
Select color scale E-, S- and C- Scan For all configurations except TOFD
Scaling in mm or µs A-Scan and For TOFD, if PCS is computed

mechanical B- Scan
Exchange the axes C-Scan For all configurations
Horizontal mirror C-Scan For all configurations
Vertical mirror C-Scan For all configurations
Saves UT image as csv-file, A-, B-, C- and D-

In analysis mode
for further image processing Scan
Table 4: Tools for the ultrasonic images

7.3.1 Tool Color Palette
With the menu for the color palette is called. You can select the palette type.
Under Threshold the values for Contrast and Brightness can be edited.
When Show is selected in the upper part of the menu, the color scale is shown on the right side of the
UT image. The brightness and contrast values can also be changed by scrolling the cursors in the scale.
Fig. 137: Menu Color Palette
7.3.2 Tool for csv-export
With it is possible to export A-, B-, C- and D-Scans as csv-file to USB sticks, which enables
further individual image processing.
Fig. 138: Example of an exported csv-file

7.4 Axes colors
Color Information View
Black x- and z-position TFM
Green depth A-, S- and E-Scan
A- Scan and mechanical B-

Blue Time of Flight and Sound Path
Scan
Dark yellow Amplitude A- Scan
Red x-position S- and E- Scan
C- Scan and mechanical B-

Violet Mechanical Scan and Time
Scan
Shot number in S-Scan and
Yellow C-Scan
Sequence number in E-Scan
Pink Index Index axis in C-Scan
Table 5: Axes Colors

8 INSPECTION REPORT
Tap to generate a report.
Fig. 139: Report generation
Tap the green check signs to add or remove an item of the left list from the report.
Fig. 140: Report configuration

Scroll the report to check it.
Fig. 141: Report preview
With and in the lower banner you can save the report or export it to the USB stick.
9 LIST OF FIGURES
Fig. 1: Control Panel Buttons ............................................................................................................. 10
Fig. 2: Main Menu ................................................................................................................................ 11
Fig. 3: Navigation Arrows ................................................................................................................... 12
Fig. 4: Drop down menu...................................................................................................................... 12
Fig. 5: Numeric keyboard.................................................................................................................... 12
Fig. 6: Scroll function .......................................................................................................................... 13
Fig. 7: Selection ................................................................................................................................... 13
Fig. 8: Red = Invalid value .................................................................................................................. 14
Fig. 9: Edit button ................................................................................................................................ 14
Fig. 10: Next, Ok and Cancel buttons ................................................................................................ 14
Fig. 11: Tabs for system parameters and UT preferences .............................................................. 15
Fig. 12: Menu Color Palette ................................................................................................................ 15
Fig. 13: Wizards Tab with submenu for destination folder and file name ..................................... 16
Fig. 14: Tab Applications .................................................................................................................... 17
Fig. 15: Selection of a parameter set in the tab Applications ......................................................... 18
Fig. 16: File Import ............................................................................................................................... 19
Fig. 17: File import popup, to select folder and file ......................................................................... 19
Fig. 18: Export of an application or folder ........................................................................................ 20
Fig. 19: File export popup ................................................................................................................... 20
Fig. 20: Screenshot Manager ............................................................................................................. 21
Fig. 21: Import of photos .................................................................................................................... 22
Fig. 22: Equipment menu .................................................................................................................... 23
Fig. 23: Specimen tab.......................................................................................................................... 24
Fig. 24: Rotation of the 3D view ......................................................................................................... 24
Fig. 25: Specimen geometry “Plate” ................................................................................................. 25
Fig. 26: Geometry “Nozzle Weld” ...................................................................................................... 25
Fig. 27: Geometry “Circumferential Tube Weld ............................................................................... 25
Fig. 28: Weld tab .................................................................................................................................. 26
Fig. 29: Configuration of a T-Joint ..................................................................................................... 26
Fig. 30: Configuration of a Nozzle weld ............................................................................................ 26
Fig. 31: Definition of the gap and the weld geometry ...................................................................... 27
Fig. 32: Weld Geometry....................................................................................................................... 27
Fig. 33: Configuration of the weld profile ......................................................................................... 27
Fig. 34: Invalid value ........................................................................................................................... 27
Fig. 35: Material properties ................................................................................................................. 28
Fig. 36: Material selection ................................................................................................................... 29
Fig. 37: Calibration blocks with transducer for velocity calibration .............................................. 29
Fig. 38: Velocity measurement ........................................................................................................... 30
Fig. 39: Reduction of the aperture ..................................................................................................... 30
Fig. 40: Load a specimen .................................................................................................................... 31
Fig. 41: List of specimens................................................................................................................... 31
Fig. 42: Menu Probe / Configuration .................................................................................................. 32
Fig. 43: Dicing menu for linear arrays ............................................................................................... 33
Fig. 44: Dicing menu for matrix arrays .............................................................................................. 34
Fig. 45: Wizard for numbering the elements of matrix arrays ........................................................ 34
Fig. 46: Geometry menu for monoelement probes .......................................................................... 35
Fig. 47: Geometry tab for dual element probes ................................................................................ 35
Fig. 48: Dicing menu for TR arrangement with Linear Arrays ........................................................ 36
Fig. 49: Submenu for the element arrangement ............................................................................... 36
Fig. 50: TR probe with matrix arrays ................................................................................................. 36
Fig. 51: Amplitude balancing for linear and matrix arrays .............................................................. 37
Fig. 52: Geometry of a plane delay block .......................................................................................... 38
Fig. 53: Wedge Geometry ................................................................................................................... 38
Fig. 54: Plane delay ............................................................................................................................. 38
Fig. 55: Angled wedge......................................................................................................................... 39
Fig. 56: Wizard for the velocity measurement .................................................................................. 40
Fig. 57: Submenu References ............................................................................................................ 41
Fig. 58: Wedges which can be calibrated ......................................................................................... 42
Fig. 59: Automatic measurement of wedge height and angle ........................................................ 42

Fig. 60: Zero calibration ...................................................................................................................... 43
Fig. 61: Reference point for TOFD ..................................................................................................... 44
Fig. 62: Add or Remove a Probe ........................................................................................................ 45
Fig. 63: Scanner Menu ........................................................................................................................ 45
Fig. 64: 2D scanner with wire encoders ............................................................................................ 46
Fig. 65: 2D scanner .............................................................................................................................. 46
Fig. 66: Probe holder with wheel encoder ........................................................................................ 46
Fig. 67: Scanner for circumferential tube welds .............................................................................. 46
Fig. 68: 3D scanner for nozzle welds................................................................................................. 46
Fig. 69: 2D scanner with Sinus arm ................................................................................................... 46
Fig. 70: Menu for the encoder calibration ......................................................................................... 46
Fig. 71: Parameter Submenus for Arrays .......................................................................................... 47
Fig. 72: Focal Law adjustment and calculation for Sector Scans .................................................. 48
Fig. 73: Focal Law adjustment and calculation for linear scans .................................................... 49
Fig. 74: 3D-View Manager ................................................................................................................... 50
Fig. 75: Offset and Orientation ........................................................................................................... 51
Fig. 76: Orientation angle on a plane butt weld................................................................................ 51
Fig. 77: Focusing submenu ................................................................................................................ 52
Fig. 78: Angle/Depth range ................................................................................................................. 53
Fig. 79: Focusing in a cylinder (tube) ................................................................................................ 53
Fig. 80: No reflection of the beam marked by the arrow ................................................................. 54
Fig. 81: Focusing in Linear Scans ..................................................................................................... 54
Fig. 82: Skewed Sector Scans with a matrix array ........................................................................... 55
Fig. 83: Options for Matrix Arrays ..................................................................................................... 55
Fig. 84: Gate Adjustments .................................................................................................................. 56
Fig. 85: Submenu “Gates” .................................................................................................................. 56
Fig. 86: Gate configuration ................................................................................................................. 57
Fig. 87: Amplitude calibration ............................................................................................................ 58
Fig. 88: Example for the TCG calibration .......................................................................................... 58
Fig. 89: TCG signal acquisition .......................................................................................................... 59
Fig. 90: TCG calculation...................................................................................................................... 60
Fig. 91: Gain setting information table .............................................................................................. 60
Fig. 92: TCG checking ......................................................................................................................... 61
Fig. 93: Echo dynamic curve after Fine Tuning................................................................................ 61
Fig. 94: DGS calibration ...................................................................................................................... 62
Fig. 95: ERS measurement in the mode “Inspection” ..................................................................... 63
Fig. 96: TOFD parameter menus ........................................................................................................ 63
Fig. 97: PCS calibration ...................................................................................................................... 64
Fig. 98: Submenus for mono-element probes .................................................................................. 65
Fig. 99: Gate Definition ....................................................................................................................... 66
Fig. 100: TCG calibration for mono-element probes ....................................................................... 66
Fig. 101: DAC-curve for monoelement probe ................................................................................... 67
Fig. 102: Principle of the TFM method .............................................................................................. 68
Fig. 103: TFM parameter setting ........................................................................................................ 68
Fig. 104: TFM adjustment ................................................................................................................... 69
Fig. 105: Definition of the ROI ............................................................................................................ 69
Fig. 106: Adjsutment of the TFM resolution ..................................................................................... 70
Fig. 107: Different TFM views ............................................................................................................. 71
Fig. 108: Multichannel selection ........................................................................................................ 72
Fig. 109: Configuration panel ............................................................................................................. 73
Fig. 110: Reference points .................................................................................................................. 74
Fig. 111: Graphical display for probe positions ............................................................................... 75
Fig. 112: Tab Trajectories ................................................................................................................... 76
Fig. 113: Trajectory menu for 2D-Mapping ....................................................................................... 76
Fig. 114: Layout menu ......................................................................................................................... 77
Fig. 115: Data Selection for a data window ....................................................................................... 77
Fig. 116: Example for a layout with A-, S-, C- and D-Scan .............................................................. 78
Fig. 117: Configuration of the Inspection Report ............................................................................. 79
Fig. 118: Popup for the definition of the input boxes ...................................................................... 79
Fig. 119: Tab Recording ...................................................................................................................... 80

Fig. 120: Acquisition panel ................................................................................................................. 81
Fig. 121: Default banner ...................................................................................................................... 81
Fig. 122: Measurement values ........................................................................................................... 81
Fig. 123: Measurement selection ....................................................................................................... 82
Fig. 124: Distances PD, rPD and +/- p ............................................................................................... 82
Fig. 125: Informations in a measurement box .................................................................................. 82
Fig. 126: Measurement values for a matrix array configuration ..................................................... 82
Fig. 127: Visualization of ultrasonic data .......................................................................................... 83
Fig. 128: Data acquisition banner ...................................................................................................... 83
Fig. 129: Saving the inspection data ................................................................................................. 84
Fig. 130: Actions after saving............................................................................................................. 84
Fig. 131: Data Analysis window ......................................................................................................... 85
Fig. 132: Tool banner .......................................................................................................................... 85
Fig. 133: Selection of a box in a C-Scan ........................................................................................... 86
Fig. 134: Indication list ........................................................................................................................ 86
Fig. 135: Description of an indication ............................................................................................... 87
Fig. 136: Selection of a screenshot ................................................................................................... 87
Fig. 137: Menu Color Palette .............................................................................................................. 89
Fig. 138: Example of an exported csv-file ......................................................................................... 89
Fig. 139: Report generation ................................................................................................................ 91
Fig. 140: Report configuration ........................................................................................................... 91
Fig. 141: Report preview ..................................................................................................................... 92
10 LIST OF TABLES
Table 1: Tools for 3D views ................................................................................................................ 50
Table 2: Possible combinations ......................................................................................................... 72
Table 3: Available views ..................................................................................................................... 78
Table 4: Tools for the ultrasonic images .......................................................................................... 88
Table 5: Axes Colors ........................................................................................................................... 90

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Instruction Manual GEKKO #2

Contact KARL DEUTSCH

From Monday to Thursday: 8.00 to 16.00 o’clock

Phone: (+49 -202) 7192-0

Please send postal items to:

Version 1.6 English 2017-02 (RW)

1 IMPORTANT NOTES ...................................................................................................................... 5

3.3.8 Velocity wizard for the delay or wedge .......................................................................... 40

7.3 Tools for the ultrasonic images .............................................................................................. 88

1.1 Appropriate use

1.2 Definition of the testing task

1.3 Restrictions during the flaw detection

1.4 Instrument failure

1.5 CE-Mark / Declaration of Conformity

1.6 Safety and diligence

1.6.1 Due diligence of the operator

1.6.2 About this manual

1.6.3 Safety notes on the GEKKO

Failure and extraordinary use

 the instrument shows visible damages,

Lithium Ion batteries

2.1 Control panel buttons

Fig. 1: Control Panel Buttons

2.2 Main Menu

Fig. 2: Main Menu

Indication of battery status

Call System Information

Store Error-Messages on USB-Stick

Call „General Adjustments“

With the tabs you choose a Wizard, an Application or an Inspection Result

2.2.1 Navigating the touch screen

Tap Swipe Drag

2.2.2 Navigation arrows

Fig. 3: Navigation Arrows

1. Home Menu: Directly available.

2.2.3 Touch screen tips

Fig. 4: Drop down menu

Fig. 5: Numeric keyboard

is called via the button .

Fig. 6: Scroll function

Fig. 8: Red = Invalid value

Backward and Validation buttons

Fig. 9: Edit button

Fig. 10: Next, Ok and Cancel buttons

2.3 General Adjustments

Fig. 11: Tabs for system parameters and UT preferences

of flight, depth and TOFD images. With the palette

2.4 Launch a new application

2.4.1 Create an application from a wizard

2.4.2 Create an application from an existing application

Fig. 14: Tab Applications

Fig. 15: Selection of a parameter set in the tab Applications

The following file management buttons are available:

 Import an application file or folder from USB flash drive

 Export an application file or folder on USB flash drive

 Create a new folder

 Delete an application file or folder

 Rename an application file or folder

 Copy an application file or folder

 Paste an application file or folder

2.5 Import / Export

2.5.1 Import and Export of application or inspection files

Fig. 16: File Import