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Southern Luzon State University

Colllege of Engineering
ECE Department

Laboratory Experiment 3
FAMILIARIZATION OF DIFFERENT ELECTRONIC
COMPONENTS AND TESTING

Group No:____________ Date performed:_______________

Group Members: Time:_______________

RATING

ENGR. FRANCISCO I. ALANO


INSTRUCTOR
RUBRICS FOR ECE00 LABORATORY

1 - Not 2 – Below 3 - Meets 4 - Exceeds


Attribute Acceptable Expectations Expectations Expectations Score

Laboratory Skills
Members Members
Members do not Members
occasionally occasionally
Manipulative Skills demonstrate demonstrate
demonstrate demonstrate
needed skills additional skills
needed skills needed skills
Damage to Safety
Equipment usage
circuits or Some risk to circuits precautions
safe for both
Safety Precautions equipment due or equipment due to above
circuits and
to improper improper usage requirements
equipment
usage used
Apparatus set
Apparatus
up in a non- Apparatus setup will Apparatus properly
Experimental Set-up enhance for
functional cause data errors setup
better precision
manner
Errors in Error in Documentation Report warns of
Process Skills documentation documentation of complete and difficulties and
of apparatus procedures correct gives alternatives
Conditions for
All data present, but Data presented
Reports logically data and/or Data presented
not in sequence. clearly along with
coherent and graphs not clearly following
Must search for excellent
sequential stated. Unclear each procedure.
items. narrative
report
Work Habits
Measurements
Time Required data beyond
Data points poorly All required data
management/Conduct not taken or not requirements
chosen or missing taken and reported
of Experiment reported made and
reported
Correct
Ability to draw proper Conclusions not Incorrect Correct conclusions
conclusions from lab drawn conclusions drawn conclusions drawn correlated to
other material
Members do not
Members have Members have Members are on
know their task
defined defined task and have
and have no
responsibilities responsibilities responsibilities at
defined
Cooperative and sometimes. Group most of the time. all-time. Group
responsibilities.
teamwork conflicts are Group conflicts are conflicts are
Group conflicts
cooperatively cooperatively cooperatively
have to be
managed most of managed most of managed at all
settled by the
the time the time times
teacher
Clean and
Clean and orderly Clean and orderly
Messy orderly
workplace/papers workplace/papers
Neatness and workplace/paper workplace/papers
with occasional with some mess
orderliness during and after at all times during
mess during and during and after
experiment and after
after experiment experiment
experiments
Members Members require
Members do not Members
Ability to do require occasional
supervised by the demonstrate
independent work supervision by supervision by the
teacher other ability
the teacher teacher
No more than two
Spelling and grammar Many errors Several errors No errors
errors
Computer use
Done correctly but Done correctly
For data analysis Not done Done incorrectly
incomplete and completely
Done correctly but Done correctly
For data presentation Not done Done incorrectly
incomplete and completely
For locating
Done correctly but Done correctly
resources that lab Not done Done incorrectly
incomplete and completely
may require

Laboratory Skills Computer use Work habits Total score

Score
I. OBJECTIVES:
1. To determine different electronic components by their physical appearances and properties.
2. To determine the good and defective condition of the different electronic components using an
ohmmeter.
3. To learn how to use and test the electronic components using an ohmmeter.

II. INTRODUCTORY INFORMATION

Early scientists, who were trying to explain how electricity passed through space, thought that
such an electric current was a steady stream of tiny electrical particles, they called the particles
electrons, and thus every electron is made of countless numbers of electrons. When electricity
passes through space as within a tube, such action is called electronics.

Electronics is the field of science and engineering dealing with the release, transport, control,
collection and energy conversion of subatomic particles having mass and charge acting in materials
with known electromagnetic properties such as vacuum, gaseous media, plasma and
semiconductors. The phenomena of electronics depends upon the number of participating charge
carriers. Their dynamic acts and the properties of the environment in which the chargers (usually
electrons), that may have holes, positive or negative ions. Through the passing of times, man has
created such devices and components to compensate with the progress brought out by the world
of electronics. There are some electronic components that are commonly used that includes
capacitors, which consists of conductors separated by a dielectric for introducing capacitance into
an electric circuit or system for providing for the storage of electric charge; resistors that introduces
resistance into and electronic circuits and may be classified whether fixed or variable resistors,
transformers, diodes, transistors, speakers, fuses and many more. Electronics have dominated the
world with its discoveries and will again and again dominate until the time is through.

III. MATERIALS

Multitester and Multimeter


Different electronic components
(Include resistors, capacitors, potentiometers, transistors, diodes.)
IV. PROCEDURES

Three Basic Steps in Trouble Shooting Electronic Components


A. Checkout

An electronic project that failed the very first time it is switched ON implies that it needs further
checking for wrong or improper connections, components at the wrong place, or even for a defective
component.

B. Circuit Analysis

To find the true cause of a project failure, a construction has to analyze the circuit according to
operation. In doing so, the section of a circuit – i.e., the component failed - -can be identified.

C. Replacing the Defective Component

Once the suspected component is pinpointed, it should be taken out of the circuit and verified
again. Component failed for a variety of in avoidable reasons. Don’t blame anyone. When you but
anything, particularly electronic components, the price you’re paying does not risk of buying a
component that will fail in a short time course of soldering or assembly. Nobody can accurately predict
when a particular component will fail
How to Test Electronic Components

RESISTORS

Procedure:

1. Read the indicated (color- code) value on the resistor’s body.


2. Set the multi tester to the ohm-scale, the range within but not way below the indicated value.

Good Indication:

- A resistor is good if its resistance is close to the indicated value. Tolerance should considered
with the ohmmeter reading.

Defective Indication:

- No resistance reading at all the Ohm scale settings- Resistor is open.


- Zero resistance reading at all Ohm scale settings- Resistor is shorted.

CAPACITORS

Procedure:

1. Momentarily short the terminals of the electrolytic capacitor to discharge it. Be careful in doing
these steps to avoid electric shock.
2. Set the multi tester to the Rx10 or Rx1K ohm scale.
3. Connect the tester negative probe to the capacitor positive terminal, the positive probe to the
negative terminal.

Good Indication for Electrolytic Capacitor:

- The meter needle will deflect towards zero and move back again to infinite resistance position.

Good Indication for Ceramic, Mylar or Other Capacitor with a Capacitance Less than 1.0µF:

- The meter will not deflect at all.

Defective Indication:

- The meter needle will rest on zero or remain stationary at point. – The electrolytic capacitor is
shorted.
- The meter needle won’t deflect at al. – The electrolytic capacitor is open.
- The meter will not deflect at all.

Leakage Test:

Leakage test of an electrolytic capacitor is tested by applying cross it the specified operating
voltage where it is used. Then the voltage stored by the capacitor is measured with a DC voltmeter.
The leakage is the difference between the previous V applied voltage across the capacitor and the
actual voltage (charge stored) reading. The percent leakage is usually tolerable in many circuits.

POTENTIOMETERS

Procedure:

1. Set the Multi tester knob to the appropriate resistance range.


2. Place the two tester probes at the exterior terminals. These two terminals are fixed resistance
terminals; the needle remains stationary even if the shaft is rotated clockwise or
counterclockwise. The middle terminal is the wipe arm. The rightmost terminal is the one used
together with the terminal in most application.
3. Rotate the shaft fully clockwise. The needle should be at the highest resistance reading.
4. Slowly rotate the shaft counterclockwise; the resistance reading should gradually fall to zero.

Defective Indication:

- The needle suddenly defects to infinity and back again to a certain point while the shaft is
being rotated. –There is poor or defective wiper contact.
- No resistance reading between exterior terminals. –Open resistive element.

DIODES

Procedure:

1. Set the multi tester knob to any of the resistance position (x1, x10, or x10K ohm).
2. Connect the Positive (+) probe to the anode and the –COM probe to the cathode.
3. Connect the positive (+) probe to the cathode and the –COM probe to the anode.

Good Indication:

- The multi tester needle should deflect considerably toward the zero position. The actual
resistance reading is the forward resistance of the diode.

Common Defective Indication:

- The multi tester needle does not deflect even when the probes are reversed – The diode is open.
- The multi tester needle deflects at the same or almost the same resistance point (reading) for
both 2 and 3.

LIGHT EMITTING DIODES

Procedure:

1. Follow the writing guide.


2. The anode (A) of the LED is connected to the positive terminal of the 9-volt battery.

Good Indication:

- The LED glows as an indication.

Defective Indication:

- If the LED failed to glow, reverse the connection of the LED to the battery.
- If it still failed to glow, directly (without the resistor connect the LED to the battery. Try reversing
the connection also if it failed to glow.
- If the LED does not glow yet, conclude that it is defective. –It is open.

TRANSFORMERS

A transformer is checked for continuity just like a straight wire.

Procedure:

1. Identify the terminals of the transforming windings.


2. Set the multi tester to the x1 or x10 OHM scale for continuity test of the secondary windings(x10
or x1K for primary windings).

Good Indication:

- Low resistance reading (about 4 ohms for a 750 mA 6-volt secondary transformer).
- The needle should not deflect at all.
Defective Indication:

- The meter needle does not deflect at all. –The transformer winding is open or the wrong terminal
is chosen.
- The needle deflects to zero position. – The windings are shorted.

TRANSISTORS

Procedure:

1. To test a transistor, simply observe if the reading is within the value being indicated.
2. If the ohmmeter reading is way out of the specified range, the transistor may be defective.

Determining if the Transistor is NPN or PNP:

1. Determine the correct terminals of the transistor.


2. Set the multitester to the Rx1 or Rx10 ohm range.
3. Connect the positive probe of the meter to the emitter and the –COM (negative) probe to the base
of the transistor. Note the reading.
4. Interchange the connection of the probes to the leads of the transistor. Note the reading.

Defective Indication:

- Resistance between any pair of terminals is less than 1 ohm. –Transistor is shorted.
- Resistance between base and emitter or base and collector for both the forward and reverse
application of ohmmeter probes is infinity (meter needle don’t deflect). – Transistor is open.
- Transistor overheats (except power transistors during normal operating condition. – Transistor
is shorted.

V. ANALYSIS
PICTURES OF TESTING
Table 1.1

COMPONENTS VALUE READING REMARKS

VI. CONCLUSION:

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