0752 Net Analyst GUI Basics V2dot0

© Acterna. All rights reserved.
Centralized Testing Using NetAnalyst

NetAnalyst GUI Basics
Participant Guide
0752 - NetAnalyst GUI Basics - v2.0 1

Notes:

Centralized Testing: The Big Picture

Page 3
Copyright © 2005 Acterna. All rights reserved.
NetAnalyst provides:
• An operations and maintenance (OAM) interface for the CT-650
• A user interface for the test setup and results
• A northbound interface for other OSS
• Other useful features such as scripting, scheduling, etc.
The test head provides:
• Test technology
• Test access control
• The management of simultaneous tests.
A Test Access Unit (TAU) is required to provide access to circuits under test. Test access units are usually a digital
cross-connect system (DCS) or a test access switch/digital test access unit (DTAU).Access to the TAU can be either
via a serial link or an Ethernet interface. The CT-650 generally allows two types of test access depending on the
element: non-intrusive (monitor) and intrusive (split).
The CT-650 system, in conjunction with NetAnalyst 4.0, remotely monitors and tests circuits for provisioning as
well as ongoing maintenance, so the service provider can quickly identify network trouble spots and efficiently
direct maintenance resources from one centralized location.
The CT-650 and NetAnalyst enable service providers to reduce field dispatches and respond more quickly to
customers. Together, these products offer a complete SONET/SDH and E1 testing solution for service providers in
a single chassis.
The figure on this slide illustrates how NetAnalyst communicates with CENTEST for TAU-based testing. The TAU
provides the access point for the CENTEST 650/650-S.
Legend: RTU remote test unit
NIU network interface unit
CSU channel service unit
DSX digital signal cross connect
LAN local area network
WAN wide area network

Session Objectives

At the conclusion of this training, participants will be able
to:
¾ Have gained an understanding of logging-in,
navigating the NetAnalyst Graphical User Interface
(GUI) and menus, and exiting test sessions for basic
testing operations using the NetAnalyst GUI
¾ Identify the four major sections of the NetAnalyst GUI
¾ Understand basic OAM functions using the
NetAnalyst GUI
¾ List the steps in the centralized testing process using
NetAnalyst
Page 4

Log In

Page 5
To launch NetAnalyst and log in:

1. Double-click the NetAnalyst icon on the desktop.
The NetAnalyst Login window displays. The figure on this slide illustrates
the Login window.
2. Type the user name.
3. Type the password.
4. Select a host from the drop-down list,
or
Type a host name or IP address in the Host field.
5. Click the OK button.

Navigate

Page 6
After logging in, the NetAnalyst window displays. The figure on this slide
illustrates the NetAnalyst window.
Menu Bar
The options on the NetAnalyst menu bar include:
• File – provides the options to exit NetAnalyst and save files.
• Session – provides options for controlling a test or OAM session.
• Help – provides access to detailed on-line help.
Tool Bar
The icons on the tool bar provide access to frequently used functions. Table 1 (next
3 slides) describes the icons.

Tool Bar

Test
Configure and Maintain Resources
Test Scheduling
Results Reporting
Results Report Viewer
Telnet Terminal
Session Exit
Start Journal
Page 7
Table 1 displays the icons found on the NetAnalyst tool bar. These provide access to
frequently used functions. When activated, each of the tool bar icons will:
• Test icon initiates a test session.
• Configure and Maintain Resources icon initiates an OAM session.
• Test Scheduling icon accesses the test scheduler for automated testing.
• Results Reporting icon creates an HTML report of the test results.
• Results Report Viewer opens and displays an existing report.
• Telnet Terminal initiates a Telnet session to a test head.
• Session Exit disconnects a test or OAM session.
• Start Journal creates a text file of the test session details. This icon changes to
Stop Journal once the journal function is activated.

Tool bar

Filter Results
View Results
Start Recorder
Detach Session Window
Help
Page 8
Table 1 displays the icons found on the NetAnalyst tool bar. These provide access to
frequently used functions. When activated, each of the tool bar icons will:
• Filter Results creates filters for viewing specific test results required for analysis.
• View Results displays test results.
• Start Recorder Records a test for easy creation of scripts. This icon changes to Stop
Recorder once the recorder function is activated.
• Detach Session Window Detaches the test session window from the Workspace so
that the test session window may be positioned anywhere on the desktop.
• Help Accesses the on-line help system.

Control Center and Workspace

Page 9
The figure on this slide illustrates the main NetAnalyst window. The NetAnalyst
window contains two panes:
• Control Center on the left
• Workspace on the right
Use the Control Center to access a test session, OAM session, or various tools, such
as the Scheduler, Recorder, and Report Viewer, etc.
The Workspace display changes depending on the option selected in the Control
Center. For example, if you select Test Services in the Control Center, the
Workspace displays a list of available Test Access Units (TAUs).
Sizing icons enable you to adjust the size of a pane.

Start a Test Session

Page 10
The figure on this slide illustrates an expanded view of the Control Center portion
of the NetAnalyst window.
To start a test session:
1. Expand the Create Sessions option from within the Control Center.
2. Select Test Services, as shown in the figure on this slide.

Start a Test Session

Page 11
The figure on this slide illustrates an expanded view the left portion of the
workspace in NetAnalyst window. The configurable selections made in this area are
necessary to create and start NetAnalyst sessions.
After selecting Test Services from the control center, NetAnalyst displays a list of
available test heads and TAUs in the Workspace, as shown in the figure on this
slide.
3. Select a test head from the Vender/Version Selection drop-down list. Use
pointer tool, arrow tool, etc. to draw viewer/student attention to the location of the
Vendor/Version Selection drop-down menu parameter within the control center.
4. Double-click on a TAU on the Location View tab. Available TAUs will list
under the Service Navigator folder. Use pointer tool, arrow tool, etc. to draw
viewer/student attention to the location of the TAUs.
5. Select a test service, such as DS1.

Access Identifier

Page 12
Upon selecting the test service, the Parameters tab automatically displays in the
Workspace, as illustrated in the figure on this slide.
6. Type the Access Identifier (AID) for the circuit.
7. Select additional parameters, as required, for the circuit to be tested.
8. Click the Create Session button at the bottom of the window.
NetAnalyst initiates the test session and displays the circuit diagram. In addition,
buttons and icons for performing different test applications display in the
Workspace.

Circuit Diagram

Page 13
The circuit diagram view provides a graphical representation of the circuit to be

tested, as illustrated in the figure on this slide. Clicking on the Diagram button
permits viewing of just the circuit diagram.
The elements on the circuit diagram include:
• RTU – test head
• TAU – DCS port
• NIU – Customer Premises Equipment
The selected side represents the portion of the circuit corresponding to the entered
AID. The connected side represents the other side of the circuit. Typically, the
entered AID should be the identifier for the portion of the circuit between the DCS
and the customer premises.

Test Information

Page 14
The circuit test information view displays detailed test session information, as illustrated
in the figure on this slide.
Clicking on the Info button permits viewing of detailed circuit and test device
information. Test circuit diagram is not viewed.
The elements detailed in the test info view include:
• Circuit Information – location, service type, AID, and if SLC Framed or not
• Device Information – title, type, state, vendor, and version
Clicking the Both button displays compacted versions of the circuit diagram and test
information views.

Perform Test

Page 15
The figure on this slide illustrates the NetAnalyst Test Session window. The bottom section of
the Workspace provides various buttons, icons, and tabs used to perform test applications.
The buttons and icons display in the Operation List section on the left.
The tabs display on the right.
Users have the option to resize the workspace area by using the resizing icons viewable in the
upper lefthand corner. Workspace expands up and in front of the circuit test views and to the
left in front of the control center.

Perform Test

Page 16
To perform a test application:

1. Click the network element (e.g., TAU, Selected RTU, Selected NIU) for the
test on the circuit diagram.
The corresponding tab displays the setup parameters at the bottom of the
Workspace. In addition, the buttons in the Operation List change depending on the
network element selected for testing and the stage of the application. The icons also
change depending on the stage of the application.
2. Select the required test parameters on the Setup tab.
3. Click the application type button (e.g., Monitor, TAP Loopback, Split) in the
Operation List. See Table 2 for a description of these buttons.
4. Click the Start icon.
5. See Table 2 for a description of the various icons.

Test Application Buttons Using CT-650

for DS1
Element Button Description

Intrusive Initiates an intrusive test and enables error
Test insertion.
Inject Accesses the Setup tab for specifying the type
Errors of error and either single or continuous errors
to be inserted.
RTU Self Test Verifies that the RTU within the test head is
functioning properly.
Insert Inserts a single bit error.
Single
Error
Restart Restarts a test and clears accumulated
Test results.
Page 17
Table 2 describes the test application buttons that display for the various network
elements during different stages of a test application using the CT-650 for DS1
testing.

Test Application Buttons Using CT-650

for DS1

Monitor Non-intrusively monitors the traffic on a circuit.
Split Disconnects live connections on the circuit and
performs and EF, AB, or shared split,
depending on the options available on the TAU.
TAU TAP Loops back the Test Access Port (TAP) on the
Loopback TAU for testing the test access wiring between
the test head and the TAU.
TAU Communicates directly to the DCS for retrieval
Direct of cross-connect assignments and port
information.
NIU Loop Sends loop-up or loop-down codes to the CPE.
Page 18
elements during different stages of a test application using the CT-650 for DS1
testing.

Test Application Buttons Using T3AS

for DS1
TX Test Accesses the Parameters tab for configuring the
Signal test signal elements (e.g., pattern, framing,
coding), and transmits the test signal.
Measure Measures the transmitted and received signals and
displays test results.
RTU
Inject Errors Inserts multiple bit errors.
Telnet Connects directly to the test head.
Reach Thru
Report Reports circuit performance measurements.
Inject Single Inserts a single bit error.
Error
Page 19
elements during different stages of a test application using the T3AS for DS1
testing.

Test Application Buttons Using T3AS

for DS1
Connect Test Establishes a connection between the TL1
Access Gateway and the circuit.
Change Selects the test mode and the side of the circuit
TAU
Access Mode to be tested e.g., split E, Loop E, Split A, etc.).
DCS Control Communicates directly to the DCS for retrieval of
cross-connect assignments and port information.
NIU Loop Sends loop up or loop down codes to the CPE.
Page 20
elements during different stages of a test application using the T3AS for DS1
testing.

Test Application Buttons Using BRTU

for DS1
TX Test Signal Accesses the Parameters tab for configuring the
test signal elements (e.g., pattern, framing, coding),
and transmits the test signal.
Change Keep- Changes signal sent out on connected side of
Alive Signal circuit.
RTU Measure Measures the transmitted and received signals and
displays test results.
Inject Errors Inserts multiple bit errors.
Test for Checks for pre-existing loops on the circuit.
Loopback
Round-Trip Measures Round-Trip Delay on circuit.
Delay
Page 21
elements during different stages of a test application using the BRTU for DS1
testing.

Test Application Buttons Using BRTU

for DS1
Measure PM Measures the PM data on the circuit.
Measurement Accesses the Report tab for configuring the test
Parameters signal measurement (e.g., Test Duration, and Error
RTU Type.
Report PRM Lists Performance Report Messages for circuit
under test.
Telnet Reach Connects directly to the test head.
Thru
Connect Test Establishes a connection between the TL1
Access Gateway and the circuit.
TAU
Change Selects the test mode and the side of the circuit to
Access Mode be tested e.g., split E, Loop E, Split A, etc.).
NIU Loop Sends loop up or loop down codes to the CPE.
Page 22
elements during different stages of a test application using the BRTU for DS1
testing.

Test Status Icons

Test Status
Indicates that a test application is ready to begin.
Indicates that the test head is attempting to establish

the connection and begin the application.
Indicates that an application has begun.
Indicates that an application has been stopped.
Page 23
Table 5 describes the test status icons available on the Workspace during different
stages of the test application.

Test Operation Icons

Test Operation
Starts an application.
Stops an application.
Accesses setup parameters for an

application.
Page 24
Table 6 describes the test operation icons available on the Workspace during
different stages of the test application.

Test Results Icons

Test Results
Indicates that results are currently unavailable.
Indicates that errors are detected on the circuit.
Indicates that all results are OK.
Page 25
Table 7 describes the test results icons available on the Workspace during different
stages of the test application.

Test Results Using CT-650 for DS1

Page 26
After starting a test application, the circuit diagram displays a graphical

representation of the application and results tabs display at the bottom of the
Workspace.
The figure on this slide illustrates the results display.

Test Results Using T3AS for DS1

Page 27

Workspace.
The figure on this slide illustrates the results display.

Test Results Using BRTU for DS1

Page 28

Workspace.
The figure on this slide illustrates the results display for a DS1 test.

Results Tabs Using CT-650 for DS1

Results Contents
Tab
Displays frequently viewed results for a test, such as
Summary signal present, frame sync, pattern sync, etc. that
summarize the overall status of the circuit.
Displays information about logic, frame, BPV, and CRC
Errors
errors.
Displays the current status of the signal and the line, as
Status
well as historical indicators of losses and alarms.
Displays G.821 performance statistics, such as number
G.821
and percent of error free seconds, etc.
Page 29
The available result tabs vary according to the application performed. The Summary
tab always displays by default. Table 8 summarizes the information on the different
results tabs using the CT-650 for DS1 testing.
If all results are good, the green OK icon displays on the left-hand side of the
window. If errors are detected, the red error icon displays on the left-hand side.

Results Tabs using the T3AS for DS1

Results Tab Contents
Selected Displays the current status of the signal (e.g. alarms,
errors, loss of signal, etc.), as well as historical
indicators alarms for the selected side of the circuit.
Connected Displays the current status of the signal (e.g. alarms,
indicators alarms for the connected side of the circuit.
Error Summary Summarizes errors currently detected.
Status Displays the current status of the signal and the line,
and G.821 performance statistics.
Errors Displays information about logic, frame, BPV, and
CRC errors.
Page 30
tab always displays by default. Table 9 summarizes the information on the different
results tabs for using the T3AS for DS1 testing.

Results Tabs Using BRTU for DS1

Results Tab Contents
Selected Displays the current status of the signal (e.g. alarms,
indicators alarms for the selected side of the circuit.
Connected Displays the current status of the signal (e.g. alarms,
indicators alarms for the connected side of the circuit.
Error Summary Summarizes errors currently detected.
Page 31
tab always displays by default. Table 10 summarizes the information on the
different results tabs for using the BRTU for DS1 testing.

Exit Session

Page 32
After completing the test:

1. Click the Exit Session icon on the tool bar,
or
Select Exit Session from the Session menu.
The figure on this slide illustrates NetAnalyst Tool Bar portion of the NetAnalyst
window.
A confirmation message displays asking if you want to end the session.

2. Click the OK button on the confirmation message.
The testhead returns the circuit to the idle state.

Start an OAM Session

Page 33
An OAM session displays information about the status of RTUs and TAUs. Prior to
starting a test application, it is helpful to view the OAM information to ensure that the
desired RTU and TAU are available.
To start an OAM Session:
1. Expand the Create Sessions option in the Control Center.
2. Select OAM Services.
3. Expand the OAM option on the Service Type View tab in the Workspace.
NetAnalyst displays a list of available test heads in the Workspace, as shown in the
figure on this slide.
4. Select the desired testhead (CT-650) or TL1 Gateway (T3AS & BRTU).
5. Click the Create Session button.

OAM Window Using CT-650

Page 34
Note: A supervisor password is not required to view OAM information.
An error message displays, indicating that the supervisor password entered is incorrect.
3. Click the OK button on the error message.
The OAM details for the selected test head display. Several tabs provide different types of
status information. The default tab is the Dial Out Seq tab. The figure on this slide illustrates
the default view of the OAM window.

OAM Window Using T3AS

Page 35
The OAM details for the TL1 Gateway display.
• User ID – identifier for the users currently running test sessions.
• Test Device TID – T3AS identifier.
• TAU TID – DCS port identifier
• AID – access (circuit) identifier
• Service – service type supported by the circuit (e.g., DS1, DS3, etc.).
• Session State – current status of the test session.

OAM Window Using BRTU

Page 36
The OAM details for the TL1 Gateway display.
• User ID – identifier for the users currently running test sessions.
• Test Device TID – T3AS identifier.
• TAU TID – DCS port identifier
• AID – access (circuit) identifier
• Service – service type supported by the circuit (e.g., DS1, DS3, etc.).
• Session State – current status of the test session.

View Slot Configuration

Page 37
To view each card slot on the test head:

1. Click the All Devices tab.
The figure on this slide illustrates the All Devices tab. The All Devices tab indicates which
slots are available and which RTUs are ready for testing.
The fields on the Device tab include:
• Device – device identifier. For RTUs, the information includes the shelf, slot, and
card side.
• Device Type – type of RTU or TAU
• Device State – status of the RTU
The possible RTU states include:

• Available – the RTU is ready to perform a test
• Not Configured – the RTU is not associated with a test port or is not configured
• Empty Slot – no RTU is installed in the indicated slot
• In Use – the RTU is currently performing a test

Port Status

Page 38
To view the port status:

1. Click the Port tab.
The figure on this slide illustrates the Port tab. The Port tab provides the configuration
information for each test port on the test head. This information identifies which ports are
available for testing and how they are configured.
The fields on the Port tab include:
• Port Number – port number on the test head
• Configured For – port use (e.g., DCS Port, Terminal)
• System Name – identifier assigned to the port
• Baud Rate – transmission speed allocated to the port
• Parity – indicator of whether or not parity error-detection is used on this port.
• Data Bits – number of bits transmitted in a byte.

RTU Status

Page 39
Before performing a test application, you should verify that the desired RTU is available for testing.
To view detailed RTU status information:
1. Click the RTU tab.
The figure on this slide illustrates the RTU tab.
The fields on the RTU tab include:
• RTU Name – identifier for the RTU. The naming convention is shelf_slot and card side.
• State – status of the RTU (e.g., available, not configured, empty slot, in use)
• Card Type – type of card installed (e.g. DT1, DT3, DTU)
• Test Port Type – type of test access (e.g., Dual FAD, Single FAD, TAD)
• TAU Name – identifier of the Test Access Unit associated with the RTU.
• SW Version – version of software installed on the TAU.
• HW Version – version of hardware installed on the TAU.
The possible RTU states include:
• Available – the RTU is ready to perform a test
• Not Configured – the RTU is not associated with a test port or is not configured
• Empty Slot – no RTU is installed in the indicated slot
• In Use – the RTU is currently performing a test

TAU Status

Page 40
To view the status of connected TAUs:

1. Click the TAU tab.
The figure on this slide illustrates the TAU tab.
The information on the TAU tab includes:
• TAU Name – identifier for the TAU
• State – status of the TAU (e.g., On Line)
• TAU Model – manufacturer and model number of the TAU

Exit an OAM Session

Page 41
After completing the OAM session:

1. Click the Exit Session icon on the tool bar,
or
Select Exit Session from the Session menu.
The figure on this slide illustrates NetAnalyst Tool Bar portion of the NetAnalyst
window.
A confirmation message displays asking if you want to end the session.

2. Click the OK button on the confirmation message.
The testhead returns the circuit to the idle state.

NetAnalyst Help

Page 42
NetAnalyst 4.0 provides a comprehensive on-line help system that is very easy to
use.
To access on-line help:
1. Click the Help icon on the tool bar.
NetAnalyst launches a browser window and displays the on-line help options. The
figure on this slide illustrates the NetAnalyst Help window.
The on-line help provides the ability to search for a specific piece of information
and displays links to several different categories of information.
The Search field displays in the upper left-hand section of the window. The links to
NetAnalyst-specific categories of information display in purple just beneath the
Search field. Links to documentation for other components of a centralized testing
system, such as test heads and the TL1 Gateway, display in blue at the bottom of the
window.
2. To search for a specific topic:
3. Type key words about the topic in the Search field.
4. Click the Go button.
5. To view a category of information, click the applicable link.

Eight-Step Testing on CT-650

Self Test Test the test system, RTUs, and TAPs.
Look for: AIS, Yellow, Freq., CRCs, Framing

Monitor Slips, BERT pattern on line.
Split Split Circuit for Intrusive Testing.
Check for pre-existing loops, test equipment on

Intrusive Test line.
Loop Up NIU, CSU, HLU-C, HLU-R, Doubler 1 & 2, USER.
Check for continuity or stress failures using:

Intrusive Test Pseudorandom, 3 in 24, 1 & 7, all 1s, all 0s.
Loop Down Restore circuit.
Monitor Optional – Ensure that circuit is restored.
Release the CENTEST so available for other

Disconnect tests.
Page 43
In order to maximize the potential of NetAnalyst, Acterna recommends an eight-

step strategy to guide centralized testing. Performed in sequence, this eight-step
process forms an efficient and practical approach to centralized testing. The
procedures can be used for any test device supported by NetAnalyst.
The figure on this slide illustrates the eight-step strategy of centralized testing with
NetAnalyst using a CT-650 testhead.
The optional Monitor step is included before the disconnect in order to ensure that
the circuit has in fact been restored to normal operating conditions.

Seven-Step Testing on T3AS & BRTU

Page 44
In order to maximize the potential of NetAnalyst and the TL1 Gateway, Acterna
recommends a seven-step strategy to guide centralized testing on a T3AS or BRTU
testhead.
Performed in sequence, this seven-step process forms an efficient and practical

approach to of centralized testing.
The figure on this slide illustrates the seven-step strategy of centralized testing with
NetAnalyst using either a T3AS or BRTU testhead.

Session Objectives Review

At the conclusion of this training, participants will be able
to:
¾ Have gained an understanding of logging-in,
navigating the NetAnalyst Graphical User Interface
(GUI) and menus, and exiting test sessions for basic
testing operations using the NetAnalyst GUI
¾ Identify the four major sections of the NetAnalyst GUI
¾ Understand basic OAM functions using the
NetAnalyst GUI
¾ List the steps in the centralized testing process using
NetAnalyst
Page 45

Centralized Testing: The Big Picture

Page 46
NetAnalyst provides:
• An operations and maintenance (OAM) interface for the CT-650
• A user interface for the test setup and results
• A northbound interface for other OSS
• Other useful features such as scripting, scheduling, etc.
The test head provides:
• Test technology
• Test access control
• The management of simultaneous tests.
A Test Access Unit (TAU) is required to provide access to circuits under test. Test access units are usually a digital
cross-connect system (DCS) or a test access switch/digital test access unit (DTAU).Access to the TAU can be either
via a serial link or an Ethernet interface. The CT-650 generally allows two types of test access depending on the
element: non-intrusive (monitor) and intrusive (split).
The CT-650 system, in conjunction with NetAnalyst 4.0, remotely monitors and tests circuits for provisioning as
well as ongoing maintenance, so the service provider can quickly identify network trouble spots and efficiently
direct maintenance resources from one centralized location.
The CT-650 and NetAnalyst enable service providers to reduce field dispatches and respond more quickly to
customers. Together, these products offer a complete SONET/SDH and E1 testing solution for service providers in
a single chassis.
The figure on this slide illustrates how NetAnalyst communicates with CENTEST for TAU-based testing. The TAU
provides the access point for the CENTEST 650/650-S.
Legend: RTU remote test unit
NIU network interface unit
CSU channel service unit
DSX digital signal cross connect
LAN local area network
WAN wide area network

0752 Net Analyst GUI Basics V2dot0

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Centralized Testing Using NetAnalyst

0752 - NetAnalyst GUI Basics - v2.0 1

Centralized Testing Using NetAnalyst

0752 - NetAnalyst GUI Basics - v2.0 2

Centralized Testing: The Big Picture

Centralized Testing Using NetAnalyst

0752 - NetAnalyst GUI Basics - v2.0 3

Centralized Testing Using NetAnalyst

0752 - NetAnalyst GUI Basics - v2.0 4

Centralized Testing Using NetAnalyst

To launch NetAnalyst and log in:

0752 - NetAnalyst GUI Basics - v2.0 5

Centralized Testing Using NetAnalyst

0752 - NetAnalyst GUI Basics - v2.0 6

Centralized Testing Using NetAnalyst

Configure and Maintain Resources

Results Report Viewer

0752 - NetAnalyst GUI Basics - v2.0 7

Centralized Testing Using NetAnalyst

Detach Session Window

0752 - NetAnalyst GUI Basics - v2.0 8

Control Center and Workspace

Centralized Testing Using NetAnalyst

Sizing icons enable you to adjust the size of a pane.

0752 - NetAnalyst GUI Basics - v2.0 9

Start a Test Session

Centralized Testing Using NetAnalyst

0752 - NetAnalyst GUI Basics - v2.0 10

Start a Test Session

Centralized Testing Using NetAnalyst

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Centralized Testing Using NetAnalyst

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Centralized Testing Using NetAnalyst

The circuit diagram view provides a graphical representation of the circuit to be

0752 - NetAnalyst GUI Basics - v2.0 13

Centralized Testing Using NetAnalyst

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Centralized Testing Using NetAnalyst

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Centralized Testing Using NetAnalyst

To perform a test application:

0752 - NetAnalyst GUI Basics - v2.0 16

Test Application Buttons Using CT-650

Centralized Testing Using NetAnalyst

Element Button Description

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Test Application Buttons Using CT-650

Centralized Testing Using NetAnalyst

Element Button Description

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Test Application Buttons Using T3AS

Centralized Testing Using NetAnalyst

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Test Application Buttons Using T3AS

Centralized Testing Using NetAnalyst

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Test Application Buttons Using BRTU

Centralized Testing Using NetAnalyst

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Test Application Buttons Using BRTU