What is CMM

y CMM is an abbreviation of Coordinate Measuring Machine.

y Measuring is an importan engineering topic (Production, Revers
E i
Engineering,
i Quality
Q lit Control-Insurance)
C t lI )
y If we dont measure that we produced, how can we sure is it ok &
in the tolerances or not?
 CMM
y On todays global competitive area , producers should
produce

y High quality
y Low cost
y Fast
y Competitive
y
y products . As a result, the companies that want to
change this obligation to advantage ,should reduce
th product
the d t development
d l t time
ti b using
by i R id
Rapid
prototyping and reverse engineering approach
(Concurrent/Simultaneous Engineering).
 CMM
Reverse Engineering Quality control Quality Insurance
 CMM
y A 'coordinate
coordinate measuring machine
machine' (CMM) is a device for measuring the physical
geometrical characteristics of an object. This machine may be manually controlled by an
operator or it may be computer controlled. Measurements are defined by a probe
attached to the third moving axis of this machine. This probe touches the part of interest
and allows collecting discrete points on the object's surface.

y Th typical
The i l CMM is
i composed
d off three
h axes, an X,
X Y and
d Z.
Z These
Th axes are orthogonal
h l to
each other in a typical three dimensional coordinate system. Each axis has a very accurate
scale system that indicates the location of that axis. All three axes are displayed on a
digital readout. The probe is used to touch different spots on the part being measured. The
machine then uses the X,Y,Z coordinates of each of these points to determine size and
position.
ii
 CMM
Coordinate-measuring machines include three main
components:

y The main structure which include three axes of motion

y Probing system (head&stylus)
( )
y Data collection and Reduction system - typically includes a machine
controller, desktop computer&printer and application software.

They are often used for:

y Dimensional measurement (length, width,depth,hole,dia)
y Profile measurement (roundness, concentricity,
cylindricity,flatness,centricity)
y Angularity or orientation measurement
y Depth mapping
y Digitizing or imaging
y Shaft measurement
y High precision contours and surfaces
 CMM
y There are newer models that have probes that drag along (track-scan)
(track scan) the
surface of the part taking points at specified intervals. This method of
CMM inspection is more accurate than the conventional touch-probe
method and most times faster as well.

y A coordinate measuring machine (CMM) is also a device used in

manufacturing and assembly processes to test a part or assembly against
the design intent.
intent By precisely recording the X,
X Y,
Y and Z coordinates of the
target, points are generated which can then be analyzed via regression
algorithms for the construction of features.
features These points are collected by
using a probe that is positioned manually by an operator or automatically
p
via Direct Computer Control ((DCC).
)
CMM
y Thee first
st C
CMM was developed
eve ope by tthee Ferranti
e a t cocompany
pa y o
of Scot
Scotland
a in tthee
1950s as the result of a direct need to measure precision components in their
military products. One of the subsequent coordinate measuring devices was
the UMS 500 (Zeiss/Germany). Leitz/Germany subsequently produced a
fixed machine structure with moving table.

Air bearings are the chosen method for ensuring friction free travel. In these,
compressed air is forced through a series of very small holes in a flat bearing
surface to provide a smooth but controlled air cushion (air layer to ease) the
on which the CMM can move.
 TYPES of CMM

y an articulated arm,
y bridge, cantilever, gantry type,
y horizontal arm
y portable CMM

NOTE: An articulated arm is very common for portable, or tripod mounted

style machines.
machines The articulating arm allows the probe to be placed in many
different directions.
TYPES of CMM
 CMM Apparatus
Theyy are offered in various configurations
g
such as benchtop, free-standing, handheld
and portable.
CMM Apparatus
Handheld Benchtop
Controller Controller

Racks

Controller
Suitable
work with
I++DME
protocol
CMM Apparatus
The extremely high rigidity of tungsten
carbide greatly reduces the elastic
deformation of the smaller diameter sphere by
the probe contact force, and yields a reduced
bending moment of the support stem.

Tungsten carbide is orders of magnitude

more wear-resistant than hard steel.

This material is very corrosion resistant, it

will not rust.

Dia of spheres: Hardened

H d d Stainless
St i l St l
Steel
10.0000mm Ceramic
0.3937"
25.4001mm 1.0000" Silicon Nitride
19.0500mm 0.7500" Aluminum Oxide
12.7000mm 0.5000" Zirconium Oxide
apply innovation

Scanning probe calibration

Constant force does not equal

constant stylus deflection F

although active sensors

provide constant contact force,
stylus bending varies,
depending on the contact F
vector
stylus stiffness is very different
in Z direction (compression) to High deflection
in the XY plane (bending) when bending
Deflection
if you are scanning in 3 Low deflection in
dimensions (i.e. not just in the compression
XY plane), this is important
e.g. valve seats

e.g. gears 0 90 180
 CMM Faults and Calibration
y The machine calibration technology - such as the automobile industry- becomes
global, the way of calibration and evaluation of uncertainty are necessary as to
make traceability. It aims at the international standardization of this field through
the international joint research to cope with such flow.
flow

y In response to requests from firms and organisations, various national

calibration organisations are studying the calibration of Coordinate Measuring
Machines (CMMs) and the use of CMMs to calibrate components. Some
organisations have issued accreditations for the calibration of Components already.
already
In order to harmonize these efforts, a WECC working group was established,
which held its first meeting on 4 April 1990.
CMM Faults and Calibration (Virtual CMM Method)
Method)
 Language of CMM : DMIS
DMIS
y The Consortium for Advanced Manufacturing
International created the Dimensional Measuring
Interface Standard (DMIS) to enable coordinate
measuringg machines ((CMMs)) to communicate
seamlessly with each other. Traditionally, each CMM
manufacturer developed its own programming
language and embedded it within its measuring
measuring-
application software. Many CMM producers offered
more than one software package, and each utilized a
unique programming language.
language As a result,
result most
installed CMMs (sometimes even those from the
same vendor) were unable to execute each other's
i
inspection
ti partt programs.
y DMIS development began in February 1985 . The first
version,, DMIS 1.0,, was completed
p in March 1986
Language of CMM : DMIS
DMIS
DMIS offers the following advantages:

y Allows portability of the CMM inspection program

y Gives users the freedom to purchase from the marketplace the
optimum technical and commercial solutions for adding CMM
capacity rather than requiring users to buy only CMMs that can
run software identical to that of the current CMM supplier.
y Eli i t the
Eliminates th "locked-in"
"l k d i " equipment-purchasing
i t h i mentalityt lit
y Eliminates the problem of software obsolescence.
y Provides the flexibilityy to change
g as component
p outsourcingg
strategies change.
y Enables colleges to train student in a nonbrand-specific
pprogramming
og a g language,
a guage, making
a g a readily
ea y ava
available
ab e ttrained
a e C CMM
workforce a reality.
y Ensures that inspection programs will never become obsolete
even as the CMM supply base consolidates.
Probes
y Scaning Probes
y Touch-trigger Probes
y Laser, Optical Probes (non-contact)
apply innovation

Why change sensors?

Not all parts can be measured with one

sensor:
Scanning probe
ideal for features with functional fits
where form is important
digitising contoured surfaces
Touch-trigger probe
ideal for discrete point inspection, for
size and position control
compact for easy access to deep
features
Optical probes
ideal for pliable surfaces
inspection of printed circuit boards
apply innovation
Ideal applications
Scanning
Measurement of size, position
and form of precision
geometric features
Measurement of profiles of
complex surfaces
Touch-trigger
Inspection of 3D prismatic
parts and known surfaces
Size and position process
control applications where
form variation is not
significant
apply innovation
Speed and accuracy
Scanning
High speed data capture - up
to 500 points per second
Large volume of data gives an
understanding of form
High point density gives
greater datum stability
Dynamic effects due to
accelerations during
measurement must be
compensated if high speed
scans are to produce accurate
measurement results
Touch-trigger
Slower data capture rate
Less information about the
surface
Simple calibration of probe
and machine yields accurate
point data
Dynamic performance of the
machine has little impact on
measurement accuracy since
probing is performed at
constant velocity
apply innovation
Complexity and cost
Scanning
More complex sensors, data
analysis and motion control
Higher costs than basic touch-
trigger systems
Conventional systems have
higher purchase and
maintenance costs
Renishaw scanning systems
are more cost-effective and
robust
Touch-trigger
Simple sensors with a wide
range of application software
Lower costs than scanning
systems
Robust sensors
Easy programming
Simple to maintain
Cost-effective replacement
for lower lifetime costs
apply innovation
Flexibility
Scanning
Renishaw scanning probes
are supported by a range of
articulating heads, probe and
stylus changers
Head and quill-mounted
sensor options
Conventional scanning probes
cannot be articulated and
suffer restricted part access
Touch-trigger
Renishaw touch-trigger
probes are supported by a
wide range of heads and
accessories
long extension bars for easy
part access
wide range of touch-trigger
sensors