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IEEE Standards Coordinating Committee 21
on Photovoltaics
Abstract: Recommended procedures and specifications for qualification tests that are structured
to evaluate terrestrial flat-plate photovoltaic non-concentrating modules intended for power
generation applications are established.
Keywords: amorphous silicon devices, bypass diode thermal test, crystalline devices, damp heat
test, dry hipot test, dynamic load test, electrical isolation test, electrical performance test, ground-
continuity test, hail-impact test, hot-spot endurance test, humidity-freeze cycle test, mechanical
loading test, outdoor exposure test, photovoltaic (PV) module, power generation, qualification test
report, static load test, surface-cut susceptibility test, thermal-cycle test, twist test, ultraviolet
conditioning test, visual inspection, wet hipot test, wet insulation-resistance test
ISBN 1-55937-586-8
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Introduction
[This introduction is not part of IEEE Std 1262-1995, IEEE Recommended Practice for Qualication of Photovoltaic (PV) Modules.]
This recommended practice provides qualication tests and procedures to evaluate terrestrial photovoltaic
at-plate non-concentrating modules intended for power generation applications. It is based on a Solar
Energy Research Institute (SERI) interim publication. See [B3].
The intent of this recommended practice is to provide the minimum tests and inspections required to evalu-
ate photovoltaic at-plate non-concentrating modules and to provide a common approach (e.g., between
producer and purchaser) in conducting qualication tests. The tests and procedures provided in this recom-
mended practice may be supplemented by additional tests and procedures, established between the producer
and purchaser.
Flat-plate module designs are under development, and new concepts continue to appear. This requires that
qualication tests be exible enough to allow a reasonable assessment of new designs, yet complete enough
to identify weaknesses that would lead to problems in the eld. Ideally, modules that experience early
failures in eld operation should fail qualication tests. Therefore, it is important to note that the design of
this recommended practice and the tests specied were developed to eventually serve as a uniform standard
for the at-plate module photovoltaic industry.
At the time this recommended practice was approved, the Working Group on Photovoltaic Modules had the
following membership:
At the time this recommended practice was completed, the Standards Coordinating Committee on
Photovoltaics (SCC21) of the IEEE had the following membership:
iii
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The following persons were on the balloting committee:
When the IEEE Standards Board approved this standard on December 12, 1995, it had the following
membership:
*Member Emeritus
Also included are the following nonvoting IEEE Standards Board liaisons:
Satish K. Aggarwal
Steve Sharkey
Robert E. Hebner
Chester C. Taylor
Valerie E. Zelenty
IEEE Standards Project Editor
iv
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Contents
CLAUSE PAGE
1. Overview.............................................................................................................................................. 1
1.1 Scope............................................................................................................................................ 1
1.2 Purpose......................................................................................................................................... 1
1.3 Limitations ................................................................................................................................... 1
2. References............................................................................................................................................ 2
6. Bibliography ...................................................................................................................................... 19
ANNEX
A (informative) A suggested test circuit for detecting open circuit and ground fault conditions ... 20
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IEEE Recommended Practice for
Qualication of Photovoltaic (PV)
Modules
1. Overview
1.1 Scope
This recommended practice establishes recommended procedures and specications for qualication tests
that are structured to evaluate terrestrial at-plate photovoltaic non-concentrating modules intended for
power generation applications (see IEEE Std 928-1986).1
1.2 Purpose
The qualication tests provided in this document should assist in evaluating at-plate photovoltaic (PV)
module design performance, safety, and susceptibility to known failure mechanisms.
Emphasis is placed on testing for potential degradation of module performance resulting from environmental
weathering, mechanical loading, corrosion, and shadowing.
The procedures given in this recommended practice provide a common approach for conducting module
qualication tests. While acceptable results from these tests should provide reasonable assurance that the
modules produced by the same processes as those that pass these tests will perform reliably in the eld after
installation, this recommended practice does not address design, safety, or performance of PV systems.
1.3 Limitations
These qualication tests are applicable to crystalline silicon and amorphous silicon modules, and may also
be applicable to modules of other photovoltaic technologies.
This recommended practice will be revised as required to incorporate the latest information on failure
mechanisms and the relationships between accelerated tests and eld reliability.
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IEEE
Std 1262-1995 IEEE RECOMMENDED PRACTICE FOR QUALIFICATION
2. References
This recommended practice shall be used in conjunction with the following standards. When the following
standards are superseded by an approved revision, the revision shall apply.
ASTM E 892-87 (Reaff 1992), Standard Tables for Terrestrial Solar Spectral Irradiance at Air Mass 1.5 for a
37 Tilted Surface.2
ASTM E 927-91, Specication for Solar Simulation for Terrestrial Photovoltaic Testing.
ASTM E 1036-85 (Reaff 1993), Methods for Testing the Electrical Performance of Non-Concentrator
Terrestrial Photovoltaic Modules and Arrays Using Reference Cells.
ASTM E 1038-93, Test Method for Determining Resistance of Photovoltaic Modules to Hail by Impact with
Propelled Ice Balls.
ASTM E 1171-93, Test Method for Photovoltaic Modules in Cyclic Temperature and Humidity
Environments.
ASTM E 1462-94, Test Methods for Insulation Integrity and Ground Path Continuity of Photovoltaic
Modules.
ASTM E 1596-94, Test Methods for Solar Radiation Weathering of Photovoltaic Modules.
ASTM G 53-93, Practice for Operating Light- and Water-Exposure Apparatus (Fluorescent UV-Condensa-
tion Type) for Exposure of Nonmetallic Materials.
IEEE Std 928-1986, IEEE Recommended Criteria for Terrestrial Photovoltaic Power Systems (ANSI).3
3.1 Background
In developing this qualication test document, several sources of information were referenced and utilized in
designing and formulating the majority of the tests given. Primary sources included UL 1703-1993, [B1],
[B3], and [B4].5
Since the publication of these documents, photovoltaic materials technology and module development have
advanced. Efforts in module reliability research have produced a better understanding of known and
potential failure mechanisms associated with photovoltaic modules, especially with regard to the effects of
moisture ingress. The results of these efforts and experience gained have been utilized in formulating new
tests and modifying earlier tests for inclusion in this recommended practice.
2ASTM publications are available from the American Society for Testing and Materials, 100 Barr Harbor Drive, West Conshohocken,
PA 19428-2959, USA.
3IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, P.O. Box 1331, Piscataway,
NJ 08855-1331, USA.
4UL publications are available from Underwriters Laboratories, Inc., 333 Pngsten Road, Northbrook, IL 60062-2096, USA.
5The numbers in brackets correspond to those of the bibliography in clause 6.
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IEEE
OF PHOTOVOLTAIC (PV) MODULES Std 1262-1995
The qualication-test sequence is illustrated in gure 1. Module qualication test requirements, which
provide detailed guidance and minimum requirements for the overall qualication test, are given in clause 4.
Requirements and evaluation of test results necessary for passing the qualication test are provided in 4.4,
and include
Descriptions of the required test and inspection procedures are provided in clause 5.
Initial tests and inspections (see 5.2) establish selection and acceptance of as-received modules as test
module specimens. They also establish baseline visual-inspection information and electrical-performance
measurement data for comparison and determination of the effects on module physical characteristics and
electrical performance following exposure and endurance tests.
Nine test modules are required to complete all the specied tests. If the intrusive hot-spot test (sequence E)
or intrusive bypass diode thermal test (sequence F) is to be performed, specially fabricated modules are
required.
Test sequences A through F subject the modules to a specied sequence of environments and typical or
accelerated stresses similar to those which nal deployed modules should survive (see 4.2).
The tests and inspections (see 4.3) provide data for comparison with initial test and inspection results.
The criteria for passing the qualication tests are provided in 4.4.
This clause species the recommended tests and inspections to be performed and the required test sequence
to be followed to evaluate photovoltaic at-plate modules. The required test sequence is illustrated in the
ow diagram provided in gure 1 along with designated inspection and test identication numbers
corresponding to inspections and test procedures specied in clause 5.
A minimum of nine module test specimens of each module type representative of the modules to be
deployed in the eld is required to conduct all the tests specied in this recommended practice if the non-
intrusive hot-spot test and non-intrusive bypass diode thermal test are performed. It should be noted that the
use of the non-intrusive hot-spot test permits elimination of test sequence E and use of the non-intrusive
bypass diode thermal test eliminates test sequence F. The modules should be randomly selected from a
production batch or identical batches manufactured to the standard procedures and drawings, and approved
by the manufacturers quality control and conform to its acceptance procedures. Modules should not be pre-
conditioned, e.g., light soaked or subject to other special procedures that are not a part of standard
production. When the intrusive hot-spot test is to be conducted, an additional test module should be specially
fabricated with leads brought out for accessing individual cells. When the intrusive bypass diode test is to be
conducted, an additional test module should be constructed with leads brought out for accessing individual
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OF PHOTOVOLTAIC (PV) MODULES Std 1262-1995
diodes. The intrusive hot-spot test requires performance of test sequence E, while the intrusive bypass diode
thermal test requires performance of test sequence F.
Each module test specimen should be labeled with the manufacturers name, the model number of the
module, the maximum system open-circuit voltage for which the module is designed, the power rating of the
module, and a serial number. The label should be capable of surviving the test sequences.
Selection and acceptance of as-received modules as module test specimens should be based on passing the
initial inspections and tests specied in 4.2 and in the sequence shown in gure 1. Any module design or fab-
rication changes (e.g., materials, manufacturing process, or assembly) of a module type previously tested
and evaluated requires reevaluation and may require retesting.
Initial tests and inspections should be performed in the order illustrated in gure 1.
One module should be removed from the test sequence as shown in gure 1, and stored in the dark at room
temperature as a control.
Finally, to provide a consistent performance baseline, all amorphous silicon modules are annealed (see
5.19), with the exception of the control module and the optional modules from sequences E and F.
Data from these initial tests and inspections are critical for establishing the baseline condition and
performance of each module to which subsequent test data will be compared.
After all modules have passed the initial tests and inspections, and have been annealed, modules should be
assigned to test sequences as follows except for the control module, which will be kept in dark storage at
room temperature following the wet insulation-resistance test (see 5.5) as indicated in gure 1.
(Control module) 1
A 2
B 2
C 2
D 2
At the completion of all the sequences (A through F) and inspections, the nal tests and inspections should
be conducted in the order indicated in gure 1. Note that the control module and the modules from
sequences E and F, if applicable, shall undergo the nal visual inspection and electrical-performance test.
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Std 1262-1995 IEEE RECOMMENDED PRACTICE FOR QUALIFICATION
The criteria for passing the qualication tests are that each module, as allocated, shall pass all of the tests
and inspections. If any of the modules fail a test, the entire qualication test program should be repeated
with new modules.
a) The baseline power output determined in accordance with the electrical-performance test described
in 5.2 for each of the test modules should be within 10% of the average power output of all the
modules selected for the qualication tests. All of the modules should have a power equal to or
greater than the manufacturers specied minimum power rating.
b) Each visual inspection should show no major visual defects, as dened in 5.1.
c) None of the ground continuity resistance measurements should exceed 0.1 W.
d) Both dry and wet hipot tests should show no arcing and no leakage current greater than 100 mA per
square meter of module area, or 10 mA, whichever is greater.
e) Wet insulation resistance should exceed 40 MW divided by the area of the module in square meters,
or 400 MW, whichever is less.
a) Each visual inspection should show no major visual defects, as dened in 5.1.
b) Each electrical-performance test should show a power of 90% or greater of the original baseline or
post annealing performance test.
c) No specic failure as described in clause 5 should have occurred, and any additional requirements
specied in clause 5 should be satised.
d) Dry hipot tests should show no arcing and no leakage current in excess of 100 mA per square meter
of module area, or 10 mA, whichever is greater.
Caution: Since the performance characteristics of most crystalline and amorphous silicon devices are
initially affected by light, care should be exercised in handling, storage, and transportation to
prevent inadvertent light exposure.
Sequence B: Amorphous silicon modules are not required to meet the greater than 90% of original
baseline power criteria for the electrical-performance test following the UV test, but should
meet the manufacturers minimum rated output power. These modules should be annealed in
accordance with 5.19 and again tested for electrical performance. The results of this post-
annealing test should serve as a baseline for all subsequent tests in sequence B. The
annealing procedure may be omitted if the modules are not amorphous silicon.
Sequence C: The dry hipot test following the damp heat test shall be performed between 24 h of removal
of the modules from the damp heat test.
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OF PHOTOVOLTAIC (PV) MODULES Std 1262-1995
Sequence D: For the electrical-performance test following the outdoor exposure test, the amorphous
silicon module is not required to meet the greater than 90% of original baseline power, but
should meet the manufacturers minimum rated output power.
The electrical-performance test following the outdoor exposure test will serve as a new
baseline for all subsequent tests.
Additional visual inspection and/or electrical-performance tests may be conducted at the
testing organizations discretion.
Sequence E: For the electrical-performance test following the intrusive hot-spot endurance test, the
amorphous silicon module is not required to meet the greater than 90% of original baseline
power, but shall meet the manufacturers minimum rated output power.
a) Each visual inspection should show no major visual defects, as dened in 5.1.
b) The nal electrical-performance test should show a power of 90% or greater of the original baseline
or post annealing electrical performance. The amorphous silicon modules that have undergone
sequence D or sequence E are not required to meet this 90% power requirement, but shall meet the
manufacturers specied minimum rated power. This comparison will be made with the measured
power translated to the manufacturers rating conditions.
c) Both dry and wet hipot tests should show no arcing and no leakage current in excess of 100 mA per
square meter of module area, or 10 mA whichever is greater.
d) Wet insulation resistance should exceed 40 MW divided by the area of the module in square meters,
or 400 MW, whichever is less.
e) None of the ground continuity resistance measurements should exceed 0.1 W.
For each module, relevant test data along with appropriate comments will be documented and provided as
part of the qualication test report. A sample module test report form showing all applicable tests is
illustrated in annex B. Note that only selected tests are conducted for each module depending upon the test
sequence for that particular module.
The following module test and inspection procedures provide the detailed steps and specications required
to conduct and meet the overall qualication test requirements given in clause 4. Each of the following
procedures provides a purpose for the test or inspection, detailed steps and specications for conducting the
test or inspection, and criteria for passing each test or inspection when criteria are not specied in clause 4.
This procedure provides guidelines for obtaining the baseline, intermediate, and nal visual inspection
required to identify and determine any physical changes or defects in module construction at the beginning
and after the completion of each required test as specied in clause 4.
Purpose: To determine the physical condition of the module and to document this condition for
comparison with future inspections.
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IEEE
Std 1262-1995 IEEE RECOMMENDED PRACTICE FOR QUALIFICATION
Procedure: Modules should be visually inspected without magnication for any observed defects or
abnormalities, which should be documented with appropriate sketches or photographs to
show the location of any defects. Inspectors should look for but not be limited to the
following:
a) Poor workmanship, shipping damage, mechanical mounting defects
b) Cracking, shrinkage, or distortion of a polymeric material used for electrical insulation
or isolation
1) Failure of adhesive bonds
2) Tacky surfaces of plastic modules
c) Corrosion of fasteners, mechanical members, or electrical circuit elements
1) Discoloration of the superstrate, encapsulating material, or active PV device
surfaces
2) Voids in, or visible corrosion of any thin-lm layers of the active circuitry of the
module
d) Bubbles, delaminations, or the presence of foreign material
e) Mechanical distortion, buckling, or evidence of yielding
f) Broken, cracked, or torn external surfaces
g) Broken cells or cracked cells
h) Cells touching one another or the frame
i) Terminals not bonded to the module or terminal box
j) Faulty interconnects or joints
k) Any other condition that may affect performance
Requirements: If a module exhibits any major defect during any of the visual inspections, it is considered to
have failed the qualication test. Major visual defects are dened as
a) Broken or cracked window
b) Voids in, or visible corrosion of any thin-lm layers of the electrical circuit of the
module, extending over more than 10% of the active area of the cell
c) Bubbles or delamination forming a continuous path between any part of the electrical
circuit and the edge of the module
d) Loss of mechanical integrity, to the extent that the installation and/or operation of the
module would be impaired
If a module exhibits initial defects that are not due to the manufacturing process, a new
module may be substituted before beginning the test sequence.
Purpose: Information obtained in 5.1 should be well documented and formulated for use in comparing
baseline observations with the results of all intermediate and nal inspections, and for use in
establishing a sound basis to determine the effects on module physical characteristics
following each test.
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OF PHOTOVOLTAIC (PV) MODULES Std 1262-1995
Purpose: To identify and document any observable changes from the initial visual inspection.
Procedure: Same as 5.1. Observations regarding damage or degradation observed during inspections
should be documented for comparison with baseline inspection results. The focus of
inspection should be on forms of damage or degradation expected after each test. Any
change in the modules physical appearance should be documented in the same detail
required for baseline inspection.
Purpose: To identify and document any observable changes from the initial visual inspection.
Procedure: Modules should be thoroughly inspected after testing. Any damage, degradation, or
abnormalities that might affect long-term reliability should be documented. Observations
regarding damage or degradation observed during baseline and intermediate inspections
should be included with the documentation for the nal inspection. Cuts made by the
surface-cut susceptibility test are not considered reportable damage unless the module failed
one of the subsequent electrical tests.
Requirement: Same as 5.1. Further detailed inspection acceptance criteria may be developed between the
module manufacturer and the module purchaser.
Purpose: To characterize the electrical performance of test modules and to determine each modules
peak output power.
Procedure: Clean and dry the modules optical surface prior to the electrical performance measurements.
Determine the modules maximum power point according to ASTM E 1036-85. Correct the
performance data to the following standard reporting conditions (SRC): 25 C module
temperature, 1000 W/m2 total irradiance, and ASTM E 892-87 global spectral irradiance.
The light source may be natural sunlight or a Class A solar simulator as specied by ASTM
E 927-91. For modules that use series-connected tandem multijunction subcells, the light
source must be a Class A solar simulator in order to reduce measurement variations due to
changing spectral irradiance. Because these qualication tests depend on the electrical
performance measurements to determine the magnitude of any degradation of module output
power, it is recommended that the same measurement system (including the light source and
reference devices) be used for current-voltage (I-V) curve measurements throughout the test
sequences.
Requirement: Initial test data should be recorded to establish a baseline electrical-output power that will
serve as the comparison value for determination of the effects of qualication testing on elec-
trical performance.
For intermediate and nal performance tests, the maximum power measured for each module
tested should not be less than 90% of the initial (measured) baseline power.
Exception: Amorphous silicon modules shall meet the manufacturers minimum rated power output,
following the UV test, outdoor exposure test, and intrusive hot-spot endurance test.
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Std 1262-1995 IEEE RECOMMENDED PRACTICE FOR QUALIFICATION
Purpose: To verify that electrical continuity exists between accessible conductive parts (i.e., frame,
structural members, or edge enclosures) and the module frame or grounding point. If there
are no accessible conductive parts, this test may be omitted.
Procedure: The resistance between the manufacturers specied module grounding point and all
accessible conductive parts should be determined according to ASTM E 1462-94,
section 7.3.
Requirement: The resistance between the manufacturers specied grounding point and any accessible
conductive part should be 0.1 W or less.
Purpose: To ensure electrical isolation of the PV circuit from any externally exposed conductive parts
and to promote electrical safety for personnel.
Procedure: Each test module should be subjected to dc hipot testing conducted at room temperature with
the output terminations short-circuited, as specied in ASTM E 1462-94, section 7.1.
Requirement: The module should be observed during the test and there should be no signs of arcing.
Leakage current should not exceed 100 mA/m2 of module area or 10 mA, whichever is
greater. AC leakage current resulting from power supply ripple and dc current resulting from
capacitive charging should not be considered.
Purpose: To evaluate the modules electrical insulation system under wet operating conditions and to
verify that moisture will not enter the active portions of the module circuitry, where it may
cause corrosion or ground faults, or pose an electrical safety hazard to personnel.
Procedure: Prior to testing, provide wire and wire connections as specied by the module manufacturer
for eld wiring installation. Immerse the laminate portion of the module in a liquid agent
(surfactant) solution. Terminal boxes, pigtail-leads, or other connectors should, if possible,
be maintained above the solution level, but should be thoroughly wetted by pouring the
solution over these areas. Bare terminations should not be wetted.
The resistivity of the solution should be 3500 Wcm or less and the surface tension of the
solution should be 0.03 N/m (30 dyn/cm) or less. The temperature of the module and the
solution should be 22 C 3 C.
The insulation resistance should be measured between the shorted output terminations of the
module and the solution by applying a voltage of 500 Vdc6 in each polarity. Apply the test
voltage. Record the insulation resistance reading after an immersion time of 2 min.
Requirement: Wet insulation resistance should exceed 40 MW divided by the area of the module in square
meters, or 400 MW, whichever is less.
6such as a Megger
10
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OF PHOTOVOLTAIC (PV) MODULES Std 1262-1995
Purpose: To ensure electrical isolation of the PV circuit from any externally exposed conductive parts
when the module is wet.
Procedure: Prior to testing, provide wire and wire connections as specied by the module manufacturer
for eld wiring installation. Immerse the laminate portion of the module in a liquid agent
(surfactant) solution. Terminal boxes, pigtail-leads, or other connectors should, if possible,
be maintained above the solution level, but should be thoroughly wetted by pouring the
solution over these areas. Bare terminations should not be wetted.
The resistivity of the solution should be 3500 Wcm or less and the surface tension of the
solution should be 0.03 N/m (30 dyn/cm) or less. The temperature of the module and the
solution should be 22 C 3 C. A voltage equal to twice the manufacturers specied
maximum system voltage plus 1000 Vdc should be applied at a rate not to exceed 500 V/s up
to the test voltage and then held at the required test voltage for 1 min in each polarity
between the shorted output terminations of the module and the solution.
Requirement: The module should be observed during the test and there should be no signs of arcing or
ashover. Leakage current should not exceed 100 mA/m2 of module area or 10 mA,
whichever is greater. AC leakage current resulting from power supply ripple and dc current
resulting from capacitive charging should not be considered.
Purpose: To determine whether test modules have adequate resistance to failure resulting from
differential thermal expansion of component parts and bonding materials.
Procedure: This test should be conducted in accordance with ASTM E 1171-93, section 6.5. The
modules should be instrumented and monitored throughout the test to detect any open
circuits or ground faults. Refer to annex A for a suggested procedure to monitor open circuit
and ground fault conditions. Modules in sequence A shall undergo 200 cycles. Modules in
sequence B shall undergo 50 cycles.
Requirement: The modules should not have exhibited either open or short-circuit conditions during the test.
The modules are also required to pass the visual inspection (see 5.1.2) and electrical-
performance (see 5.2) tests.
Purpose: To determine whether test modules have adequate resistance to the detrimental effects of
humidity, condensation, and freezing and the resultant expansion of component materials.
Procedure: This test should be performed in accordance with ASTM E 1171-93, section 6.6. The
modules should be instrumented and monitored throughout the test to detect any open
circuits or ground faults during the test. Refer to annex A for a suggested procedure to
monitor open circuit and ground fault conditions. Ten complete cycles should be performed.
Requirement: The modules should not have exhibited either open or short-circuit conditions during the test.
The modules should pass the electrical isolation test (dry hipot) (see 5.4) when nished with
this test. The modules are also required to pass the visual inspection (see 5.1.2) and
electrical-performance (see 5.2) tests.
11
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Std 1262-1995 IEEE RECOMMENDED PRACTICE FOR QUALIFICATION
Purpose: To determine that the terminations and the attachment of the terminations to the body of the
module will withstand such stresses as are likely to be applied during normal assembly or
handling operations.
Procedure: Terminations should be tested in accordance with UL 1703-1993, section 28, for terminal-
type connectors and with UL 1703-1993, section 22, for pigtails or other external wire
terminations. All terminations should be tested. Tensile force should never exceed the
module weight.
Requirement: There should be no evidence of mechanical damage to any of the wires or connections after
completion of the test. The module is required to pass the visual inspection (see 5.1.2) and
electrical-performance (see 5.2) tests.
Purpose: To detect defects to the module that might be caused when it is mounted on a non-planar
surface.
Procedure: Mount modules in accordance with the manufacturers specications. Modules should be
subjected to a displacement of one mounting point by a distance h while three mounting
points of the module remain in the same plane.
1
---
2 2 2
h = 0.021 ( L + W ) (1)
where
Hold the module in the twisted position for 1 h. The modules should be instrumented and
monitored throughout the test to detect any open circuits or ground faults during the test.
Refer to annex A for a suggested procedure to monitor open circuit and ground fault
conditions.
Requirement: The module should not have exhibited either open or short-circuit conditions during the test.
Purpose: To ensure that the test module can withstand static and dynamic mechanical loading typical
of wind buffeting or snow loading.
Purpose: To ensure that the test modules can withstand a static load of 2400 Pa (50 lb/ft2).
Procedure: The module should be mounted to a rigid test structure in accordance with the
manufacturers specications. The module should be instrumented and monitored
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OF PHOTOVOLTAIC (PV) MODULES Std 1262-1995
throughout the test to detect any open circuits or ground faults during the test. Refer to
annex A for a suggested procedure to monitor open circuit and ground fault conditions. An
essentially uniform load of 2400 Pa should be applied normal to the module surface and left
in place for 30 min. The load should be removed and reapplied to the opposite surface for
30 min. These two loadings should be repeated for three cycles. Refer to UL 1703-1993,
section 39.
Requirement: The modules should not have exhibited either open or short-circuit conditions during the test.
The module is required to pass the visual inspection (see 5.1.2) and electrical-performance
(see 5.2) tests.
Purpose: To ensure that the test modules can withstand simulated wind gust loading of alternating
1440 Pa (30 lb/ft2) loads.
Procedure: The module should be mounted to a rigid test structure in accordance with the
manufacturers specications. The module should be instrumented and monitored through-
out the test to detect any open circuits or ground faults during the test. Refer to annex A for a
suggested procedure to monitor open circuit and ground fault conditions. Modules should be
subjected to a dynamic load test using 10 000 cycles of front and back surface loading with a
uniform load of 1440 Pa. The cycle rate should not exceed 20 cycles/min. Refer to [B2].
Requirement: The module should not have exhibited either open or short-circuit conditions during the test.
The module is also required to pass the visual inspection (see 5.1.2) and electrical-
performance (see 5.2) tests.
Purpose: To ensure that the test module is capable of withstanding the application of a sharp object
drawn across its non-glass surfaces (front and back) without creating a risk of electrical
shock. If the module has only glass surfaces, this test may be omitted.
Procedure: This test should be performed in accordance with UL 1703-1993, section 24.
Requirement: The cutting tool should make no contact with the module circuitry during the test.
Purpose: To determine the ability of the module to withstand the effects of long-term penetration of
humidity.
Procedure: The test modules should be subjected to a test in an environmental chamber in which the
humidity should be controlled to 85% 5% relative when the temperature is 85 C 2 C.
The test should be performed for 1000 h but may be continued for up to an additional 60 h to
permit the following dry hipot test to be performed.
Requirement: The module should pass the dry hipot test (see 5.4) between 2h and 4 h of removal from the
damp heat chamber. The module is also required to pass the visual inspection (see 5.1.2) and
electrical-performance (see 5.2) tests.
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Std 1262-1995 IEEE RECOMMENDED PRACTICE FOR QUALIFICATION
Purpose: To verify that the module will withstand a simulated hail impact without damage.
Procedure: This test should be performed in accordance with ASTM E 1038-93. The modules should be
subjected to the impact normal to the surface of 25.4 mm (1 in) diameter ice balls traveling at
an impact velocity of 23.2 m/s (52 mi/h). At least 10 of the test modules most sensitive
points should be selected for impact. The candidate points selected should include (where
applicable) the following:
Requirement: The module is required to pass the visual inspection (see 5.1.2) and electrical-performance
(see 5.2) tests.
Purpose: To assess the adequacy of thermal design and relative long-term reliability of bypass diodes
used to limit the detrimental effects of module hot-spot susceptibility.
Measuring the diodes case temperature while the diode(s) are conducting current
equivalent to the modules short-circuit current with a modules front surface
temperature of 75 C 5 C and a minimum ambient temperature of 45 C, and then
Increasing the current to 1.25 times the short-circuit current for an additional hour at the
same temperature. This method only applies if the diode case can be accessed. If not,
then the intrusive method should be used.
The test procedure consists of the following steps in the order given.
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OF PHOTOVOLTAIC (PV) MODULES Std 1262-1995
Requirement: Each diode case temperature should not exceed the diode manufacturers maximum junction
temperature rating on the diode during step c). No physical damage should occur during
step d). The diode shall conduct the required current for the duration of the test. The module
is required to pass the visual inspection (see 5.1.2) and electrical-performance (see 5.2) tests.
Procedure: This test is required only if bypass diode(s) are part of the module construction and only if
access to the bypass diode(s) is not possible without compromising the integrity of the
module. The intrusive bypass diode thermal test requires the fabrication of a special test
module. This module should be manufactured with accessible 30 gauge thermocouple wire
attached to the case(s) of the bypass diode(s) to measure the case temperatures. The
thermocouple wires should be attached in a way to ensure a minimum of disturbance to the
diode and its thermal environment. In all other respects, this module should be manufactured
as close as possible to the standard production module.
The remainder of this test follows the procedure in 5.15.1. except for the mounting of the
thermocouple.
Requirement: Each diode case temperature should not exceed the diode manufacturers maximum junction
temperature rating on the diode during step c). No physical damage should occur during
step d). The diode shall conduct the required current for the duration of the test. The module
is required to pass the visual inspection (see 5.1.2) and electrical-performance (see 5.2) tests.
Purpose: To evaluate the ability of a module to endure the long-term effects of periodic hot-spot
heating associated with common fault conditions such as severely cracked or mismatched
cells, single-point open circuit failures, or non-uniform shadowing (partial shadowing).
Exemption: A module is exempt from this test if it has one bypass diode for each cell.
a) Install bypass diodes according to the manufacturers instructions. Bypass diodes will be
installed only if required by the manufacturer for all applications.
b) Expose the unshadowed module to an irradiance of not less than 700 W/m2 with a non-
uniformity of not more than 2% and a temporal stability within 5% and measure the I-V
characteristics. Based on the electrical circuitry of the cells in the module, perform one
of the following:
1) For series connection of cells in a single string, determine the current at maximum
power.
2) For a series-parallel connection of cells, determine IHS, the short-circuit current
corresponding to the condition of maximum hot-spot power dissipation, given by the
following equation:
I HS = I SC ( p 1 ) p + I MP p (2)
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Std 1262-1995 IEEE RECOMMENDED PRACTICE FOR QUALIFICATION
where
c) Short-circuit the module with the same irradiance as in step b) and select a cell by one of
the following methods. For a series or series-parallel connected module, method 1), 2),
or 3) below may be used. For a series-parallel-series connected module, method 3)
below shall be used.
1) Determine the hottest cell using an appropriate temperature detector. An infrared
(IR) camera is recommended.
2) Completely shadow each cell in turn and select one of the cells that gives the largest
decrease in short-circuit current when shadowed.
3) Take at random at least 30% of the cells in the module, fully shadow each cell in
turn, and measure this cells temperature using an appropriate temperature detector.
Select the hottest cell.
d) Under the same irradiance as used in step b), completely shadow the selected cell and
check that the ISC of the module is less than IMP for a series connected module or less
than IHS for a series-parallel connected module. If this condition does not occur, the
condition of maximum power dissipation cannot be set by shadowing a single cell. In
this case, proceed with the selected cell fully shadowed, omitting step e).
e) Under the same irradiance as used in step b), gradually decrease the shadowed area of
the selected cell until:
1) For a series connected module, the ISC of the module coincides as closely as possible
with IMP.
2) For a series-parallel connected module, the ISC of the module coincides as closely as
possible with IHS.
In this condition, the maximum power is dissipated within the selected cell.
f) Expose the module to an irradiance of 1000 W/m2 10% and module temperature of
50 C 10 C. Note the value of ISC and keep the module in the condition of maximum
power dissipation, readjusting the shadow, if necessary, to maintain the ISC at the same
level.
g) After 1 h, shade the module from the light source.
h) After 30 min, repeat step f).
i) Repeat steps f), g), and h) a total of ve times.
Requirement: The module is required to pass the visual inspection (see 5.1.2) and electrical-performance
(see 5.2) tests.
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OF PHOTOVOLTAIC (PV) MODULES Std 1262-1995
Procedure: Install bypass diodes according to the manufacturers recommendation. Bypass diodes will
be installed only if required by the manufacturer for all applications. The intrusive hot-spot
test requires the fabrication of a special test module. If the module construction allows the
cells to be accessed and measured before encapsulation, each cells shunt resistance should
be measured. Ten cells or 35% of the cells in the module, whichever is greater (use all of the
cells if the module has fewer than 10 cells), should be selected at random positions under the
constraint that at least two of the cells should
During module manufacture, each of the test cells should be provided with positive and
negative electrical leads to allow them to be individually connected to a power supply. The
leads are required to carry SRC one-sun (1000 W/m2) short-circuit current and shall
distribute the current into the cells without causing excessive current crowding near the lead
attachment and without shunting the cells. In the case of modules with parallel strings of
cells, parallel paths around the selected test cells should be eliminated by severing cross ties
between the parallel strings, including those at the output terminals of the module.
Measure the dark I-V characteristics of each of the test cells. Determine whether each cell is
a type A or type B cell based on the following criteria:
Type A. The cell reaches a voltage equal to the average peak power voltage of one cell
times the number of cells in series protected by a bypass diode, before it reaches the
SRC short-circuit current of an average cell in the module.
Type B. The cell reaches the SRC short-circuit current of an average cell in the module
before the voltage equals the average peak power voltage of one cell times the number
of cells in series protected by a bypass diode.
If the manufacturer does not recommend the use of or build bypass diodes into the module,
use the total number of cells in series within the module instead of the number between
bypass diodes.
The intrusive hot-spot test is run under the worst-case conditions for each of the test cells.
The worst-case conditions depend on whether the cell is a type A or type B cell.
For type A cells. The maximum power is dissipated in a type A cell when it is operated at
the maximum reverse voltage. Therefore, the test voltage, Vtest, is set to the average
peak power voltage of one cell times the number of cells in series protected by a bypass
diode, or times the number of cells in series in the module if there are no bypass diodes
in the module. With the test cell at Vtest, monitor the power dissipated in the test cell as
the irradiance is increased up to 1000 W/m2. The irradiance level that produces a current
equal to the average maximum power current of an individual cell is the level selected
for the hot-spot test.
For type B cells. Type B cells have such a low shunt resistance that the maximum reverse
voltage is set by the I-R drop across the cell. In this case, the worst-case heating occurs
when the test cell is totally shadowed and the current level is set at the average SRC
short-circuit current of a cell.
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Std 1262-1995 IEEE RECOMMENDED PRACTICE FOR QUALIFICATION
a) Apply IR heating to the module, adjusting until the module has reached a uniform cell
temperature equal to 50 C 2 C.
b) Connect a dual limiting constant-current constant-voltage power supply to each test cell,
with polarity arranged to drive the cells with reverse voltage. Adjust the voltage and
current limits as determined for each cell above.
c) For type A cells, illuminate the test cell to the level that results in maximum power
dissipation as determined above. For type B cells, make sure that the illumination level
is below 50 W/m2.
d) Leave the power supplies, IR heater, and illumination source on for 1 h. Shut them off
after 1 h and allow the module to cool to within 10 C of ambient.
e) Repeat the cycle until each test cell has been exposed to a total of 100 h of stress
conditions.
Requirement: The module is required to pass the visual inspection (see 5.1.2) and electrical-performance
(see 5.2) tests.
Purpose: To precondition the module with ultraviolet (UV) radiation in the spectral region below
400 nm and to evaluate the cumulative effects of accelerated UV exposure with the
subsequent thermal, humidity, and mechanical cycling tests. This test also addresses physical
and electrical module integrity due to limited UV exposure.
The test requires exposure to one or more of the following sources of UV radiation:
Testing using uorescent UV-A or UV-B lamps is based on ASTM G 53-93, without water/
condensation exposure.
Testing using xenon-arc lamps or natural sunlight is based on ASTM E 1596-94, without
water/condensation exposure.
Procedure: Expose the modules to a total accumulated (UV) dosage of 15 kWh/m2 10% of UV
radiation in the wavelength range below 400 nm. Any one or combination of the four light
sources from the required light source list are acceptable providing the total UV dosage and
wavelength requirements are met.
The module(s) temperature should be maintained at 60 C 5 C for the duration of the test
for indoor tests.
Requirement: The visual inspection procedure (see 5.1.2) should be applied with special attention given to
module construction materials, which may be susceptible to UV degradation. Modules
should pass the subsequent electrical-performance test (see 5.2).
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IEEE
OF PHOTOVOLTAIC (PV) MODULES Std 1262-1995
Purpose: To make a preliminary assessment of the ability of the module to withstand exposure to
outdoor conditions and to reveal any synergistic degradation effects which may not be
detected by laboratory tests.
Procedure: The modules should be short-circuited and mounted outdoors, as recommended by the
manufacturer, co-planar with an irradiation monitor. Any hot-spot protective devices
recommended by the manufacturer should be installed before the modules are mounted.
Subject the modules to 60 kWh/m2 of total irradiance, as measured by a solar irradiation
monitor accurate to 10%.
Requirement: After completion of this test, the modules should pass the electrical isolation test (dry hipot)
(see 5.4). The module is also required to pass the visual inspection (see 5.1.2) and electrical-
performance (see 5.2) tests.
Purpose: To return amorphous silicon modules to as close as practical to initial performance level
(electrically). This is not a test, but rather a procedure. Annealing may be omitted for
modules other than amorphous silicon modules.
Procedure: Check the modules electrical performance before and after a 24 h annealing period at 90 C
2 C. If there are no changes, within the repeatability of the test greater than 1% in output
power, the modules may continue with the test sequences. If there is a power change greater
than 1% from the previous electrical check, repeat the 24 h annealing procedure.
Requirement: None.
6. Bibliography
[B1] Block V Solar Cell Module Design and Test Specication for Intermediate Load Applications, JPL/
5101-161, Jet Propulsion Laboratory, Pasadena, CA, 1981.
[B2] Cyclic Pressure-Load Development Testing for Solar Panels, JPL/5101-19, Jet Propulsion
Laboratory, Pasadena, CA, 1979.
[B3] Interim Qualication Tests and Procedures for Terrestrial Photovoltaic Thin-Film Flat-Plate Modules,
TR-213-3624, Solar Energy Research Institute (SERI), Golden, CO, 1990.
[B4] Technical Specications for PV for Utility Scale Applications, PVUSA, 1992.
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Std 1262-1995 IEEE RECOMMENDED PRACTICE FOR QUALIFICATION
Annex A
(informative)
Exception: Modules that do not have any accessible conductive parts do not need to be monitored for
ground fault conditions.
Warning: The circuit of gure A.1 holds modules in forward bias. Certain modules (i.e., amorphous
silicon based) may experience degradation not germane to the test. In these cases, the use of
alternative circuitry that does not bias the modules in the forward direction is recommended.
IBIAS
+
TP2
PV +
1MW IBIAS POWER
MODULE
SUPPLY
MODULE
GROUNDING
POINT
TP1
RCIRCUIT = 1/IBIAS
Figure A.1Test circuit for detecting open circuit and ground fault conditions
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OF PHOTOVOLTAIC (PV) MODULES Std 1262-1995
Annex B
(informative)
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