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Switching algebra. Minimizing functions using maps, Minimization using QM method, Different logic families: TTL, ECL, I2L. NMOS, CMOS. Pass
transistor logic. Combinational logic circuits: adders/subtractors, fast adder, magnitude comparator, multiplexer demultiplexers, encoders,
decoders, ROMs, PLAs etc. Sequential logic circuits: flip flops and latches, shifters, counters. Finite state machine state transition diagrams
and state transition tables. HDL implementation. Asynchronous sequential Logic. Memory elements: ROM, PROM, RAM-SRAM, DRAM. Case
studies: a simple computer, RTL micro-instruction, instruction decoders timing and controller circuits, data path unit.
EC30004 VLSI Engineering (3-0-0) Credits: 3
Pre-requisites: EC21007, EC21002 and EC31003
Introduction: Design hierarchy, layers of abstraction, integration density and Moores law, VLSI design styles, packaging styles, design
automation principles; Fabrication Technology: Basic steps of fabrication, bipolar, CMOS and Bi-CMOS fabrication processes, layout design
rules; MOS and Bi-CMOS characteristics and circuits: MOS transistor characteristics, MOS switch and inverter, Bi-CMOS inverter, latch-up in
CMOS inverter, super-buffers, propagation delay models, switching delay in logic circuits, CMOS analog amplifier; Logic Design: switch logic,
gate restoring logic, various logic families and logic gates, PLA; Dynamic Circuits: Basic concept, noise considerations, charge sharing,
cascading dynamic gates, domino logic, np-CMOS logic, clocking schemes; Sequential Circuits: Basic regenerative circuits, bistable circuit
elements, CMOS SR latch, clocked latch and flip-flops; Low-power Circuits: low-power design through voltage scaling, estimation and
optimization of switching activity, reduction of switched capacitance, adiabatic logic circuits; Subsystem Design: design of arithmetic building
blocks like adders, multipliers, shifters, area-speed-power tradeoff; Semiconductor Memories: SRAM, DRAM, non-volatile memories; Bipolar ECL
Inverter: Features of ECL gate, robustness and noise immunity, logic design in ECL, single-ended and differential ECL gates; Testability of VLSI:
Fault models, scan-based techniques, BIST, test vector generation; Physical Design: Brief ideas on partitioning, placement, routing and
compaction.
Dept of Electronics & Electrical Communication Engineering (E & ECE), Indian Institute of Technology, Kharagpur, WB 721302, India
Phone: (+91) 3222 - 282263; Fax: (+91) 3222 - 282264 / 255303; Email: ece_office@ece.iitkgp.ernet.in
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