1385

1385
 : ) (

) ( :

: 1385

: -
- 15

14395-1336 :

021-61002261-62 :

021-61002222 :

http://www.nanolab.ir :

info@nanolab.ir :


.1

.2 ) (

.3

.4

.5

.6

.7
 .8 ) (

.9

.10

.1

.2 20

.3

.4

.5

2 : -
--
7 ---
---
---
---
---
--
11 --
:
15
-- )(AFM
-- )(STM
-- )(SNOM
-- )(SEM
-- )(ESEM
-- )(TEM
-- ) (AES
-- )( FIB
-- )(RBS
-- )(XRD
- - )(XRF
- - ) XPS ) (ESCA (UPS
-- )(SIMS
-- )(FTIR
-- )(NMR
-- )(RAMAN
- - )(HPLC
-- )(MS
-- )(GC
:A


) (INLN:

(...

1383

. 1383 1384 1385

 100 39 . 5

1385
.

) (http://nanolab.ir

.
.

.
.

.
380 39 10

:


.
) (http://www.nanolab.ir ) (021-88027135 .

14395-1336
nanolab@nano.ir info@nanolab.ir .

) (...

... .

) 021 -35880271
(nanolab@irannano.org .

http://nanolab.nano.ir
)

380( .

 -1

-1-1 :

-1-1-1

. STM AFM

TEM SEM SNOM SCM MFM FIB.

-2-1-1

.
.

.
.

. XRD

XRF.

-3-1-1

. XPS

NMR RBS FTIR SMIS RAMAN.

-4-1-1

-1

-2

-3

-5-1-1

. .

. HPLC GC.

-2-1

. 1
. 1920

. 1 .

] 2.[3

-1

)UVX (IR 3

) UV X( 4
) UVX(

X 7

10

11

12

13

14

-3-1

. .

.
. .

) (SiO2 ) (Al2O3 2SiO2 2H2O ) (3MgO 4SiO2 H2O

. ) (Si ) (Al

) (Mg
. 1 .

) ( ) ( ) (

-1

. .

. .
.

. .

.
.

2 .

) ( .

)(TD
)(DTA

)(TGA

)(TEM
)(SEM
)(OM

)(XRD

)(AAS

)(FES

(XRF) X

)(SIMS

(XPS) X

)(AES
-2

-1 1383 344

-2 1374 544

-3 1374 456

-4 1383 361

STM AFM

NMR FTIR SIMS XPS XRF XRD RBS FIB AES TEM ESEM SEM SNOM

MS HPLC RAMAN GC .

-1-2 )(AFM

1 AFM

AFM

) (1 AFM .

1
-Atomic Force Microscope

-1 AFM

AFM 1

2 .

3 y x Z

1
- Tip

2
- Cantilever

-3 .
.

) .(2

-2

. 5 4 3 6

1
-Scanning

-4 DNA . AFM -3
2 nm DNA AFM

- 5 ) (IC AFM .

) 250 150 (

-6 CD ) AFM 250

75 (

) (

Z .

. ) AFM (

10-9 N

) (



)

2 ( .

1 . )

) (

. 2

) .(8

- 8 2 - 7

1
-Photodiode

2
-Twisting

2000

AFM

). 9 (10

1 )

( .

)(m 90-460 > 10

)(m 35-60 >3

)(m 7/0-7/5 > 0.1

)(N/m 0/01-91 0/001-400

)(kHz 7 -420 3 kHz ~ 10 Mhz

1
- twisting
2
- MikroMasch

-9

-10

AFM .

. ) (DLC

. 1 1SSRM 10 5 N

1
- nano Scratching

9
10N ( )

Cr - Au Pt

2EFM . ) (

TiD C2W TiN DLC 3 .

Ni Fe

Co .

) ( )

(.

-11 T

. ).(13

1
- Scanning Spreading Resistance Microscopy
2
- Flectrostatic Farce Microscopy
3
- doped

-12 T

) (

14

. )( )(

-13 :

: ) (

(1 :

(2 . ) (

6
. ) r

( .

( ) PH ( )

( ) ( .

AFM .

) (

) ( .

AFM

AFM ) 1 5(

) 2 4 30( ) 3 30 150( .

) .( 14

1
Contact Mode
2
Semicontact Mode
3
Noncontact Mode

-14

A.C

D.C. . A.C

. AFM

AFM .

" " .

) (

-15

AFM

) (

. .

10 KHz .

.... .

(.

) 4 30( " " .

. Semicontact

Intermitent Contact Mode Mode .Tapping Mode

. )(A.C.

-16 .

) ( .

. .

) (

" " .

PH

... .

) ( .

) ( . )

) ( .

. .

) (

-17

AFM

.... .

AFM :

-1

-2

AFM .

) ( ) ( ) 2

( .

AFM

. AFM :

) (

) ( )

1
Tribology
2
Lubricant's

AFM

) (

AFM .

. .

. AFM

) (

(.

AFM

AFM

SEM TEM STM AFM

) )

(HRTEM (

200-400 )
500) ( 100-200 ) (
(

-
- ) (Bulk
-
- .
- . -
-
.
.
- .

 -
.
- - .
-

-
.
) .
- .
( - -
-
) 10(

) (
.

.

-
- - )
- ] %90

)(
. (

- -

-
.
. .
[.

 -2-2 )(STM

) 1(STM

-
.

2 ) (

. 3 .

) ( .

. STM

. STM

STM .

STM

1
-Scanning Tunneling Microscopy

-2 0/1

3
- Tunneling Current

.
)

( . )
(

. STM

STM

STM .

( 1 STM
STM 1

1
- Tip


) 1( z, y, x

) 2 ( .

. STM

STM

STM

- 1 .
.

2
- Scanning

1
) IT=F(V) exp(-2kz z k

F .

. k

(LDOS)2. k F .

F . F
LDOS F LDOS.

STM
.

] [

. ) (

1
- Work Function

2
- Local Density Of States

.
.

( 2

STM .

( 4 . STM ( 3 STM

) IT ~ exp (-2kz z

 1k .

( 5

.
)) (IT ~ exp(-2kz k :

k me Ut Us . 2me (us ut ) / h (1

k 2me (U s U t ) / h K

Us , Ut me h

. I :

Us Ut I / Z 2
0.95 ( t )
2 It

Ut Us

. It

I Us

" "

. ( F(V)) F IT .
F ) (LDOS

. LDOS F .

) ( .

dIT df
)DOS( Ef eV
dV dV

 ( 6 ) (LDOS .

" "

. (It F(V)) F

. F .

) (

d 2 IT
) (V
dV 2
(

) ( .

 ( 7 BAC

) A C-H (.

 -3-2 ) ( SNOM

1 1972 Ash

Nicholls . 1991

Betzing . ) (AFM

SNOM .

AFM SNOM . AFM

. SNOM .
AFM SNOM .

) (1 AFM SNOM .

AFM SNOM . SNOM

.

SNOM ) (2 .

. .

SNOM
].[1

1
Scanning Near Field Optical Microscopy

 -1 AFM .SNOM

-2 SNOM

 ][2

-1

-2

-3

-4

-5 SNOM

1- www.twinson.com.cn/downloads/smtz/dme/snom/snom.pdf
2- www.lot-oriel.com/pdf_uk/all/wit_ratliver.pdf

 1
-4-2 )(SEM

) (SEM TEM .

-1-5 ][1

SEM 2-5 .

2-5 ][2

1
-Scaninig Electron microscopy

 ) (

1-30KeV

2-10nm.

-1 10 100000 3 100

) (

-2 back Scattered :

(a (b ) (domains

(c 2 10 (d

) (.

-3

-1

-2

-3

-4

-5 1 m

-6

: .

15 20 4 8

: .

SEM TEM x

 1950

) (microanalysis .

x .

) ( x

. x

-1

300 400 .

-2

- E D Specht, A Goyal, D F Lee, F A List, D M Kroeger, M Paranthaman, R K Williams

and D K Christen, Supercond. Sci. Technol. 11 (1998) 945949.
- http://mse.iastate.edu/microscopy/chamber.html

 -5-2 (ESEM)1

) (SEM

].[1

][2

10-9pa .

) (60kpa

. 2

3 . ESEM

. 1

1
-Environmental Scaninig Electron Microscopy
2
-electron ion window film

3
- pressure-limiting aperture, PLA

 . ESEM

) (PLA1 .

- 1 = PLA1 . = PLA2

=RP(rotary pump) =DP (diffusion pump) =TMP

= LN2 = N(nitrogen trap) = V1, V2, G(airlock)

. 2

. PLA1

X.

- 2 . ESEM

ESEM

 ) (GED Danilatos 1983

GSED .

-1 .

-2

) (SE/BSE 1

. SE/BSE

- .

1
- high voltage field

 1
-3 -

" - -"

. .

).( 4

SEM

. ESEM

1
- gaseous secondary electron detection

 1 .

) (4 . ) (Softening

X .

- 4 .

PLA

ESEM

. )

( .

1
- electron skirt

1 50 torr .

SEM

. ESEM

) ( ESEM .

. - - .

ESEM )60 90(

. .

SE 2E-T .

10000 12000 . 10-2pa

. E-T

1
- gaseous secondary electron detectors, GSED
2
- Evehart-Thornley

1 .

. CO2 Ar N2

1- L Reimer Meas. Sci. Technol; 2000:11 1826

- .

3- http://www.utoronto.ca/forest/termite

1
-imaging gass

 -6-2 )(TEM

) (AFM X .

. X

0.9
=D
cos

. .

) (High-Resolution .

) (

)(SAD

Phase-Contrast )(HRTEM

Z-Contrast

(EDS) X

)(EBLS

] [1

. -

EDS.

) ( Thermoionic Emission .

2800 .

-1

 LaB6 .

. .

) (Ultra High Vacuum .

) (

) (3

) (Scattering :

X .

: .

 ) (3

 . ) (4

. ) (4

) (7 .

-7

) (Bright-Field

. ) (8 .

) (9 .

) (9

. TEM/STEM

-8
-9
1. www.matter.org.uk

2. B. Fultz and J.M. Howe, Transmission Electron Microscopy and Electron Diffraction
of Materials, Springer, 2001.

 -7-2 )(AES

1 .

2 .

) ( .

].[4

AES

. 3 .

1000eV 15 A.

AES 10-30 A .

) (2 . 2-5keV

) k (L .

1
- Auegr Electron Spectroscopy (AES).
2
- Ultra High Vacuum (UHV).
3
- Cylindrical Mirror Analyzer (CMA).

. X

. .

-2 x

E Kin Ek E L1 E L 2

K 1 L

2 L .

 ].[4

. )(3

. .

-3 ][1

) (4 .

2-5kev .

( . CMA .

. ) (5

-4 . CMA

-5

 ) (

) (

I A

I
C A A
100 %
Ii

i I i

I A I A

35 10 KeV .

) (7 3KeV .[ 3].

-7 3KeV

1 CMA

1
- depth profiling

 ) (

. ) (9 .

-9( SEM )( Cu-Ag-Sn-Bi

UHV

. 30 nm

XPS XRD ].[5

1-http://www.jeoleuro.com.

2-http://www.cea.com

3 -http://www.siu.edu

4-Seah and et.al "Practical surface analysis" john wiley and sons, 1975.

5- A. Azens, C.G. Granqvist J. Solid State. Electrochem, (2003) 7: 64 68

-8-2 )(FIB

10 .

FIB

FIB

. )(1

Ga

].[1

. .

-1 FIB

 ) (2 FIB

SEM

. .

FIB .

: .TEM

FIB

. FIB

1
- etchant

FIB ][2

-1 XeF XeCl

-2

-3

-4

-5

-6

-7

1- http://www.fibics.com

2- http://www.iisb.fraunhofer.de/

 -9-2 )(RBS

( .

/ .

. ) (

)(

RBS .

RBS

1 RBS . 4N+2C+4He+

1 .

2 .

1-Van de Graaff

-Ion mass selection

15KeV .

RBS

. ) (2 RBS .

1 .[2] RBS

 ) (2 .[3] RBS

RBS

RBS

. ) (3 RBS PdCu/Si .

%5

 ) (3 RBS [3] PbCu/Si

RBS

Li

4
. He+

. 4He+ 2MeV

M =1 40 . RBS

) (MeV

RBS . 20

2 .

RBS RBS

2MeV 1 m . 4
)( He+

2 5 m . 3
MeV He+

RBS

RBS

-1

-2 ) (

-3 ) (.

-4 ) (.

-5

-6 .

-7 ].[4

-Milton Ohring, The Materials Science of Thin Films , Academic Press, New York, 1992.
-http://www.ae.gatech.edu/labs/windtunl/expaero/nrwake.html
-http://etigo.nagaokaut.ac.jp/english/machine/rbs.htm
- www.masatest.com

 1
-10-2 )(XRD

x .

x ].[1

x .

max Ve=hV = hc/ min

hc 12400
min = = A
Ve V

V e h C

. 1/5 A

] .[2

1-X-Ray Diffraction

. L x

. x

k . :

E= L E- E

M K

K].[3

x .

x x

. 1 x

. 1

AB+BC=n

AB=BC= d Sin

= 2d Sin n

1
- Bragg

 ].[4

1 x

-1 x

) . (2

-2 .

F C x . E

P . 1 d 2 d .

 -2 .

-3

x .

) .(3 1 Z

].[56

-3 x

1
- Goniometer

XRD

) ( 4 .

. 1

0 .9
D
Bp

D Bp

-4

XRD

1
- Scherrer

 -1 .

-2 .

-3 .

-4 :

-5 XRD

-6 .

-7 ].[78

1-Braun, R. D., Introduction to Instrumental Analysis, McGraw-Hill, New York, 1987.

2-Christian, G. D., O'Reilly, J. E. (eds.), Instrumental Analysis, Prentice-Hall, New Jersey,
1986.
3-Ewing, G. W., Instrumental Methods of Chemical Analysis, Mc Graw-Hill, Singapore,
1985.
4-Freiser, H., Concepts and Calculations in Analytical Chemistry, CRC, Florida, 1992.
5-Skoog, D. A., West, D. M., Principles of Instrumental Analysis, Holt-Saunders, Tokyo,
1987.

-7 . 1374

-8
. 1383

 -11-2

(XRF) X

)( .

) ( . .

1 .

)(

 -1 )(XRF

. .

XRF

-1

XRF .

. 2 . XRF

-2

 -2

) (NiF XRF .

) (320 ) (200 . .

. ) (111

. XRF

XRF

-3 XRF

-3

3cm 0/5mm .

. .

XRF

. .

) (

-4

XRF .

. )(

. .

XRF

5 .

4 .

. K K

L .

2 dsin= .

d .

 -4 XRF 19/4 9/5 1/5
1/4 1

)(

. ) (

. .

. .

. .

ZAF Z A F .

XRF ppm .

WDS ) 9 ( .

XRF

XRF ) (WDS ) (EDS . WDS

. EDS

. EDS 5 .

) Si(Li .

) (MCA

MCA

EDS WDS .

WDS .

EDS 5

. WDS 30-60

. EDS

WDS.

-5 ( XRF) X ) (EDS

XRF .

) (

. 6 XRF

 . EDS .

-6 XRF

XRF

XRF .

. XRF

. XRF

XRF .

 . XRF

. EDS

. WDS

XRF EDS WDS

-1 1383 361

 -12-2 XPS ) (ESCA) 1 (UPS

(XPS) X

) (UPS )(ESCA

. X .

X Siegbahn .

1
- Electron Spectroscopy for Chemical Analysis

 Siegbahn 1981 .

) (Shift .

) (Chemical Shift

EB ( B E= h - ) X E .

X E

n n-1 .

)(n- F E1 (n) i E .

k -E .

Koopmans (K) B E = - k E .

. 1

].[1-6

 -1 .

-1

-2

-3

-4

-5

-6 ][7

: ) (

: 6/25 3 cm

-1

-2 .

-3

-4 .

-5 ][10 9

5 10 .

][10

1-Brandon, D. and Kaplan, W. "Microstructural characterization of Materials" John Wiley

& Sons (1999).

2-Goodhew, P. J., Humphreys, F. J. "Electron and Analysis" Taylor and Francis (2000).

3-Eberhart, J. P. "Structural and Chemical Analysis of Materials" J. Wiley (1991).

4-Bunshah, R. F. editor "Techniques of Metals Research" Vol. 2, Techniques for the Direct
Observation of Structure and Imperfections, Interscience Publishers (1969).

5-Gates, B. C. and Knozinger H. Editors "Impact of Surface Science on Catalysis"

Academicb Press (2000).

6-Kolasinski, K. W. "Surface Science, Foundations of Catalysis and Nanoscience" (2002).

7-Vickerman, J. C. Editor "Surface Analaysis, The Principal Techniques" John Wiley &
Sons (1997).

8-Woodruff, D. P. and Delchar, T. A. "Modern Techniques of Surface Science" 2nd Ed.,

Cambridge University Press (1994).

9-Amelinckx, S., van Dyck, D., van Landuyt, J. and van Tenderloo, G. (eds) Handbook of
Microscopy. Weinheim: VCH (1997).

-10

. 1383

 1
-13-2 )(SIMS

) ( . )(SIMS

20

. .

Static SIMS

. 0/1 .

. Dynamic SIMS

. 1

X .

Imaging . .

) (ppm ) (PPb ].[123

1
- Secondary Ion Mass Spectrometry

 -1

-1 5 10

-2

-3 ) (trace ppt ppm

-4

-5

) (leached

-6 ) ( 1000 PPm) (dopants

) (implanted

-7 ) (embrittled

) (Vapor- deposited

 -8

-9

-10 ) (

-11

-12 ][4

) ( .

) ( ) (Pellet .

: . 1cm 1 cm 1mm

: .

].[5

) (

].[67

[67]

1-Brandon, D. and Kaplan, W. "Microstructural characterization of Materials" John Wiley

& Sons (1999).
2-Gates, B. C. and Knozinger H. Editors "Impact of Surface Science on Catalysis"
Academicb Press (2000).
3-Kolasinski, K. W. "Surface Science, Foundations of Catalysis and Nanoscience" (2002).
4-Vickerman, J. C. Editor "Surface Analaysis, The Principal Techniques" John Wiley &
Sons (1997).
5-Woodruff, D. P. and Delchar, T. A. "Modern Techniques of Surface Science" 2nd Ed.,
Cambridge University Press (1994).
6-Amelinckx, S., van Dyck, D., van Landuyt, J. and van Tenderloo, G. (eds) Handbook of
Microscopy. Weinheim: VCH (1997).
-7
1383

 -14-2 )(FTIR

. ).

( .

].[1

0/8 -400 m

0/8 -50 m.

:1 ][1

50 m 1 0/8-2/5 m 2

8-25 m 3 .

) (2

1
-Far in frared
2
-Near in frared
3
-Finger print

 -2 ][1

IR .

IR .

. FT-IR

IR ].[2

( FT-IR)

.[3] [ 2]

1- D. A. Skoog, D. M. West Holt, "Principle of Instrumental Analysis", Saunders College

Publishing, Sixth edition, 1994.

2- E. Vidal, Augusta, E-MRS Meeting, 2003.

3- M. Praisler, S. Gosav, J. Van Bocxlaer, A. De Leenheer, and D.L. Massart."Exploratory

analysis for the identification of amphetamines using neural networks and GC-FTIR data",
The Annals of the University "Dunrea de Jos", Fascicle II, 83-96, 2002.

 -15-2 (NMR) 1

) (NMR

].[1

1946

1952 .

] .[2 1999

1
-Nuclear Magnetic Resonance

 Beta

BetaNMR

].[3

. O 16 C 12

NMR .

1
. 3H 19F 13C
2

1
. 1H 31 15
P N
2

) ( .

P 31 F 19 H 1 . NMR H 1

. C 13

O 17 N 15 . ) (H 1

=2/7927

1

2

P 31 F 19 C 13 1/1305 2/6873 0/7022

 ].[4

13
C

HNMR 1 .

. NMR

NMR ) (PMR

NMR

. .

PMR

PMR

NMR . PMR

10PPM . C 13 200 PPM

F 19 P 31 300 400 PPM.

NMR )( ) (

)( ) (T )( ) (

)( [5] .

NMR

NMR ) (1

-1 NMR

(1:

NMR

. 14000

12 .

. 108

 -2

. 60 1000 )235

( .

-3

)(

60 .

10 8 .

-4 :

10 5 .

-5 :

 NMR 5 0/4

. ][2

-2 NMR

-1 ].[4

-2 NMR ].[5

-3 NMR ].[5

-4 NMR ].[5

-5 ].[6

-6 NMR

 . 1018

Beta 10

].[3

-7 ].[7

-1 1374 544

-2 1374 456
3-ww.triumf.info/public/repository/Hb/Hb200309.pdf "The Basis of Nanotechnology
Development at TRIUMF: How Application Begin ", Canada's Nanotechnology Laratory
For Particle And nuclear Physics
4-www.Cem.msu.edu/~reusch/virtual.tekd/Spectrpy/nmr/nmr1.ntm-
5-http://www.cis.rit.edu/htbooks /nmr/inside.htm the Basic of NMR

6- the application of nuelear magnetic resonance to the Study of cellular phjsioligg" ,

1984, American Physiological Soeiety,
-7 1383 344

 -16-2 )(RAMAN

. 1982

) . ( .

].[1

 -1 .

He-Ne 1 L

. .

1 M .

. ) 2

(L . ) 2 (M

) (P .

) (PM .

) (A . )(CR

) (D .

. .

-1 ][2

-2 ][2

-3 ][3

-4 ] [4

[5] DNA ] [6 .

-5 ] [7 ]) [8

( ] [8 .

1- D. A. Skoog, D. M. West Holt, "Principle of Instrumental Analysi"s, Saunders

College Publishing, Sixth edition, 1994.

2- B. Dragnea, "Near Filed Scanning Optical Microscopy": Chemical Imaging,

Encyclopedia of Nanoscience and Nanotechnology, Dekker Publication, 2004.

3- Hallen H.D. Ayars E.J. Jahncke C.L., "The effects of probe boundary conditions and
propagation on nano-Raman spectroscopy", Journal of Microscopy, vol. 210, no. 3,
pp. 252-254(3), 2003.

4- Y. Inouye, N. Hayazawa, K. Hayashi, Z. Sekkat and S. Kawata, Proc. SPIE, 3791, 40

(1999).

5- N. Hayazawa, Y. Inouye, Z. Sekkat, and S. Kawata, J. Chem. Phys., 117, 1296 2002.

6- N. Hayazawa, T.Yano, H. Watanabe, Y. Inouye, and S. Kawata, Chem. Phys.

Lett.,376, 174, 2003.

7-. D. Roy a, Manish Chhowalla b,*, H. Wang c, N. Sano c, I. Alexandrou c, T.W.

Clyne a, G.A.J. Amaratunga , Characterisation of carbon nano-onions using Raman
spectroscopy, Chemical Physics Letters 373, 2003, 5256, 2003.

8- Tomoya Ohno, Daisuke Suzuki, and Hisao Suzuki Size Effect for Barium Titanate
Nano-particles, KONA, No.22, 2004.

 )(HPLC -17-2

1952 .

- .

1 .

 -1 ].[1

- . - - -

1 .

HPLC .

HPLC .

. HPLC

].[1

1
- Chromatogram

 .[1] HPLC -1

. -

.[2]

[2] ( ) -2

[3] -3

[4] -4

1- D. A. Skoog, D. M. West Holt, "Principle of Instrumental Analysis", Saunders College

Publishing, Sixth edition, 1994.

2- Goran Mitulovi Marek Smoluch Jean-Pierre Chervet Ines Steinmacher Andreas

Kungl, "An improved method for tracking and reducing the void volume in nano HPLC
MS with micro trapping columns", Analytical and Bioanalytical Chemistry , 2047,2, 2003.

3- Kevin Killeen, Hongfeng Yin, Dan Sobek, Reid Brennen and T. van de Goor, CHIP-
LC/MS: HPLC-MS USING POLYMER MICROFLUIDICS, 7th international Conference
on Miniaturized Chemical and Blochemlcal Analysts Systems, Squaw Valley, California
USA, October 5-9, 2003.

4- Martin Vollmer. Edgar Nagele, Patric Horth, "Different Proteome Analysis: Two-
Dimensional Nano-LC/MS of E. Coil Proteome Grown on Different Carbon Sources", J.
Bimolecular Techniques, 14, 128-135, 2003.

 -18-2 )(MS

10 5 -10mmHg 6 . ) (1 l

) ( 50-70 ev

. ) 0/1( .

M+ e
M+ 2
e

) (m/e

. ) (1

-1 ][1

GC- MS

. GC-MS

. ] 2[3

MS .

1/5 nm

) (ESI ].[4

]. [5-9

] [10-16

].[17

IR UV-Vis XRD TEM

TGA

. MS ][18

1-. D. A. Skoog, D. M. West Holt, "Principle of Instrumental Analysis", Saunders College

Publishing, Sixth edition, 1994.

2-.E. Stenhagen, S. Abrahamsson ,F. W. Mclafferty, "Registry of Mass Spectral Data",

Wiley New York, Vol. 4, 1974.

3- Aldermaston, Eight Peak Index of Mass Spectra, 2 ed, Mass Spectroscopy Data Center,
Reading, United Kingdom, 1974.

4- J. J. Gaumet, G. A. Khitrov, and G. F. Strouse, Mass Spectrometry Analysis of the 1.5

nm Sphalerite-CdS Core of [Cd2S14(SC6H5)36DMF4], NANO LETTERS, 2, 375-379 ,
2002
5- H. Inoue, H.; Ichiroku, N.; Torimoto, T.; Sakata, T.; Mori, H.; Yoneyama, H. Langmuir,
10, 4517, 1994
6- Gaumet, J. J.; Strouse, G. F. J. Am. Soc. Mass Spectrom. 2000, 11, 338.
7- Trager, J. C. Int. J. Mass Spectrom., 200, 387, 2000
8- Plattner, D. A. Int. J. Mass Spectrom., 207, 125, 2001
9- Pryzybylski, M.; Glocker, M. O. Angew. Chem., Int. Ed. Engl., 35, 806, 1996
10- H. Inoue, N. Ichiroku, T. Torimoto, T. Sakata, H. Mori, H. . Yoneyama, Langmuir,
10, 4517, 1994
11- M.A. Hines, P. Guyot-Sionnest, J. Phys. Chem. B, 102, 3655, 1998
12- J.R. Sachleben, V.L. Colvin, L. Emsley, E.W. Wooten, A.P. . Alivisatos, J. Phys.
Chem. B 10210117, 1998
13- M. Tomaselli, J.L. Yarger, M. Bruchez, R.H. Halvin, D. DeGraw, . A. Pines, A.P.
Alivisatos, J. Chem. Phys. 110 8861,1999
14- J.R. Sachleben, E.W. Wooten, L. Emsley, A. Pines, V.L. Colvin, . A.P. Alivisatos,
Chem. Phys. Lett. 198 431,1992
15- X. Peng, J. Wickham, A.P. Alivisatos, J. Am. Chem. Soc. 120 5343, 1998
16- R.J. Arnold, J.P. Reilly, J. Am. Chem. Soc. 1201528, 1998
17- N. Herron, J.C. Calabrese, W.E. Farneth, Y. Wang, Science 259, 1426, 1993
18- Jean-Jacques Gaumet and Geoffrey F. Strouse , Electrospray Mass Spectrometry of
Semiconductor Nanoclusters: Comparative Analysis of Positive and Negative Ion Mode, J
Am Soc Mass Spectrom, 11, 338344, 2000

 -19-2 )(GC

1952

GC .

. ) (80/1 C ) (80/8 C

. 200

].[1

- ) (GSC - )(GLC

. GLC .

GLC .

. ].[1

 :1 ].[1

. 0/1-5L

. .

400 C

10-100 cm 0/25-0/32 cm

GC .

].[1

) (GC :

-1 ][2

-2 ][2

-3 ][3

1- D. A. Skoog, D. M. West Holt, Principle of Instrumental Analysis, Saunders College

Publishing, Sixth edition, 1994.

2- E. Vidal, Augusta, E-MRS Spring Meeting 2003 June 10 - 13, 2003.

3- M. Praisler, S. Gosav, J. Van Bocxlaer, A. De Leenheer, and D.L. Massart. Exploratory

analysis for the identification of amphetamines using neural networks and GC-FTIR data,
The Annals of the University "Dunrea de Jos", Fascicle II, p. 83-96, ISSN 1221-4531,
2002.

 : A

AAS Atomic Absorption Spectrometer

AFM Atomic Force Microscopy

Atomic Fluorescence
AFS
Spectrometer

CHNOSP
Elemental Analyzers

DMA Dynamical Mechanical Analysis

DSC Differential Scanning Calorimetry

FIB Focused Ion Beam

Fourier Transform Infrared
FT-IR
Spectroscopy

GC Gas Chromatography

GPC Gel Permeation Chromatography

High Performance Liquid

HPLC
Chromatography

 : A

IC Ion Chromatography

ICP Inductively Coupled Plasma

IR Infrared Spectroscopy

MS Mass Spectroscopy

NMR Nuclear Magnetic Resonance

PCR-TC Real Time PCR Thermal Cyclers

Raman Raman Spectrometry

Scanning Capacitance
SCM
Microscopy

SEM Scanning Electron Microscope

SIMS Secondary Ion Mass Spectrometry

Scanning Near-Field Optical
SNOM
Microscopy

 : A

STM Scanning Tunneling Microscopy

Transmission Electron
TEM
Microscope

TGA Thermo Gravimetric Analysis

TMA Thermo Mechanical Analysis

UV-VIS UV-Visible spectrophotometer -

XRD X-Ray Diffraction spectrometer

XRF X-Ray Fluorescence spectrometer