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lntemationalConference on Robotics 8 Automation
Washington, DC May 2002
Reaction Force Inspection System Using Wavelet Transforms and Neural Networks
Yasuhiro Yamada Yoshiaki Komura Masanobu Masuda Yuuichi Ookubo
Fukui University Fukui University Industrial Technology Center Sanki, Inc.
of Fukui Prefecture
3-9-1 Bunkyo, 3-9-1 Bunkyo, 6 1 Kawaiwashizuka-choy 2 Kugamorinomiya,
Fukui-shi, Fukui-shi, Fukui-shi, Fushimi-ku,
Fukui 910-8507 Fukui 910-8507 Fukui 9 10-0 102 Kyoto 6 12-8495
JAPAN JAPAN JAPAN JAPAN
yyamada@mech.&kui-z4.ac.jp komura@mech.fikui-u.ac.jp
and reliability. For example, automatic vision inspection Fig. 1. Structure of probe
systems have been developed for defect detection of glass
panels [I], sheet steel [2], aluminium strips [3] and web Measurement head
materials [4], with many of the systems in practical use.
In this paper, an inspection method is described for the
analysis of the quality of a probe's reaction force
characteristics. Its aim is to classify reaction force signals, as
the recognition of such signals is of particular interest in the
field of inspection. The classification we perform is based on
wavelet transform and a neural network, an approach needed
for inspections by probes in real time. The inspection system Con ter
evaluates the operative feeling of probes. Experimental system
results show that this method is suitable for such inspections. Fig. 2.Configuration of the inspection system
3 0.8 I 1
2.5 1 0.7 1 I
0.6
h
g 0.5
-
0.4
8 0.3
-
.g 0.2
-
; 0.1
42
-
= O J
-0.1 10 20 30 40 50 60 ?O
20 40 60 80 100 120 140
-0.5 A l
".L
Time (msec) Time (msec)
(a) Inspector'sjudgment for probe A02 : non-defective (a) Inspector'sjudgment for probe B10 :non-defective
3 0.8
0.7
2.5 }
0.6
h
0.5
v
W 0.4
8
8 0.3
Y
.4
E 0.2
2 0.1
$ 0
-0.5
20 40 60
Time (msec)
80 100 120 140
-0.1
5
h
0.5
8 0.4
8
s 0.3
.A
%
U
0.2
0.1
W O
-0.5
20 40 60 80 100 120 140
-0.1
-0.2 '
10 20 30 40 50 60
II
lo
Time (msec) Time (msec)
(c) Inspector'sjudgment for probe A03 : defective (c) Inspector'sjudgment for probe BO8 : defective
Fig. 3. Examples of inspection results of probe A Fig. 4. Examples of inspection results of probe B
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After the measurement head has moved to the limit of its
stroke it then recedes. The reaction force decreases as the
measurement head recedes, and moves to zero when the
measurement head parts from the plunger.
A test signal database is used to train a neural network for
automated inspection.
Wavelet transforms
Wavelet transformation is now recognized as a useful
tool for various signal processing applications [SI.
In this paper, the Spline-Wavelet fhction is used to
process the reaction force signals, and is given by
where m is the wavelet order and mEZ (an integral set). The
force sensor produced a reaction force signal F(Q at the t th
time instant. The gradient of the reaction force is expressed
as follows:
dF(t) = F ( t )- F(t - 1)
'p
.)
1
output
I
Table I Test results of probe A
Neural network
Features of the signal are selected from three wavelet
coefficients (j=4,5,6). We provided an input layer of NN
with 33 nodes that corresponded to the features of a time
series of reaction forces of the probe and the output layer
with one node corresponding to the judgment. Three time *: nondefective (0.0) ,unable to judge (OS), defective (1 .O)
series data (j=4,5,6) are classified into 11 classes by their
amplitudes. Then the number of data in each class forms the
input for the 33 nodes of the input layer of the NN (see Fig. Table 2 Test results of probe B
i=O
i=1
i=2
i=3
i=4
j=5
i=6
j= 7
*: nondefective (0.0) , unable to judge (0.5), defective (I .O)
i=8
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IV. CONCLUSIONS REFERENCES
In this paper we have considered reaction force [l] J. Wilder, "Finding and evaluating defects in glass",
inspections utilizing probes. The inspection results of Machine Vision for Inspection and Measurement,
skilled inspectors were leamed by the proposed Academic Press, 1989, pp. 231-255.
wavelet-neural network system. The leamed wavelet-neural [2] J. Olsson and S . Gruber, "Web process inspection
network system arrived at the same inspection results as a using neural classification of scattering light",
skilled inspector in 95% of inspections. In time better Proceedings of the IEEE Intemational Conference on
trained neural networks will M e r improve the speed and Industrial Electronics, Control, Instrumentation and
accuracy of probe inspections, thereby reducing inspection Automation (IECON'92), San Diego, 1992, pp.
costs. 1443-1448.
[3] C. Femandez, C. Platero, P. Campoy, and R. Aracil,
ACKNOWLEDGMENT "Vision system for on-line surface inspection in
aluminium casting process", Proceedings of the IEEE
This research has been supported in part by the Japan Intemational Conference on Industrial Electronics,
Society for the Promotion of Science. Control,Instrumentation and Automation (IECON'93),
Maui, HA, 1993, pp. 1854-1859.
[4] D. Brzakovic and N. Vujovic, "Designing defect
classification system : a case study", Pattem
Recognition, 29, 1996, pp. 1401-1419.
[5] G. Strang and T. Nguyen, Wavelets and Filter Banks.
Cambridge, U.K.: Wellesley-Cambridge Press, 1996.
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