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SKiiP 3

Testing of SKiiP modules is service department

Joachim Lamp, Semikron Elektronik GmbH & Co. KG

Lamp 21.03.2013
28. Jan 2010
J.J.Lamp

The SKiiP module

3 in 1
Cooling
Power section + Sensors
Gate driver + protection

J. Lamp

28. Jan 2010

The SKiiP module - Pressure Technology


Mounting Screws

G/E Springs
Driver PCB
Pressure part with steel inlay
Spring Pad
Current sensor
AC/ DC - Terminal
Isolation foil
Bridge element
Case
DCB
Thermal Paste
Heatsink

Lamp 21.03.2013
28. Jan 2010
J.J.Lamp

The SKiiP module - SKiiP types


2GB
SKiiP1203GB123

GD
SKiiP603GD123

4GB
SKiiP2403GB123

3GB
SKiiP1803GB123

Lamp 21.03.2013
28. Jan 2010
J.J.Lamp

The SKiiP module - Driver board

Driver features

Two isolated output stages for driving TOP and BOT IGBT
AC Current sensing including over current trip
DC voltage measurement including over voltage trip (min 900V)
Temperature measurement including temperature trip (115C DCB)
Supply voltage monitoring

IGBT desaturation monitoring


Interlock logic (high / low side IGBT)
Dead time generation (3,3s)
Short pulse suppression (750ns)

Lamp 21.03.2013
28. Jan 2010
J.J.Lamp

The SKiiP module - Driver board


tTD = Dead time,

td(on/off)IO = Driver input output propagation delay time

Pulse pattern - Dead time generation


The propagation delay of the driver is the sum of
interlock dead time (tTD) and driver Input output signal
propagation delay of the driver (td(on/off)IO)

Signal Logic behavior for both input


pulses in ON state.
The interlock circuit prevents that the TOP and the
BOT IGBT of one half bridge are switched on at the
same time

Lamp 21.03.2013
28. Jan 2010
J.J.Lamp

The SKiiP module - Driver board


Error management
Any error condition will cause the error signal to go to high on the open collector
output.
Error type

Failure causes

Trip levels
1700 / 1200

Over current protection (OCP)

Load short circuit

GD = 625A / 750A

Too high load

2GB = 1250A / 1500A,


3GB = 1875A / 2250A,
4GB = 2500A / 3000A
Corresponds to 10V on pin 7

Temperature protection

DC-link overvoltage protection

VCE protection

Too high load

115C

Not efficient cooling

Corresponds to 10V on pin 14

Surge currents from rotor in


case of grid short circuit

1200V (1300V) / Min 900V

Load or grid switch off


Unstable operation

ERROR (pin 2) and TEMP


ERROR (pin3) are set.

Terminal short circuit.

VCE=7V

Corresponds to 9V on pin 14

IGBT defect, end of life


Driver board malfunction.
Internal supply voltage error

Too low input voltage


Driver defect components

<13V
J.J.Lamp
Jan 2010
Lamp 28.
21.03.2013

Test of SKiiP module


Testing of SKiiP modules in service
1. Test of power part with digital volt meter in diode mode (DVM)
Goal: Detection of defect on power part (short circuit, burned chips)
Good criteria: All voltages within specified range and low differences between halfbridges.
Limitation of this test method: The internal power supply of the DVM is used for the test which
has only battery voltage and milliampere for forward current. So this test shows not that the
SKiiP has the full blocking capability and that the diodes are o.k.
But a short circuit can clear be detected.
Measured value depends on the type of the used DVM
2. Test of driver input current and error LED with SKiiP test box
Goal: Detection of IGBT defects and driver board errors which causes too high input current
Good criteria: Input current in specified range and no switching and switching.
Green error signal.
Limit of this test method: Driver sensing failures can not be detected.

From experiences we know that this test method detects


failures in more than 90% of the cases.
Failures in driver sensing circuit or sporadic failures can not be detected in this test. This has
to be done in SKiiP test facility at Semikron.
Failures in power part can not be detected if just some bond wires of diodes are burned. But
these are seldom cases.
Lamp 21.03.2013
28. Jan 2010
J.J.Lamp

Test of SKiiP module


1.

Test of power part with digital volt meter in diode mode (DVM)
1.1 Test of TOP and BOT diode forward voltage of each halfbridge
Good: Voltage between 0,200 to 0,400V.
Low variation of voltage between halfbridges of the same switch (<0,05mV)
DC+
COM

Good:

Driver
board

V 0.200V to

TOP

0.400V

Fail:
0V

AC

BOT

DC -

DC+

Driver
board

TOP

AC

COM

V
+

BOT

Good:
0.200V to
0.400V
Fail:
0V

DC -

Lamp 21.03.2013
28. Jan 2010
J.J.Lamp

Test of SKiiP module


1.

Test of power part with digital volt meter in diode mode (DVM)
1.2 Test of TOP and BOT switch blocking capability of each halfbridge
Good: OL (overload, that means that the switch blocks the voltage from the DVM)
DC+
+

Driver
board

TOP

Good:
OL

COM

Fail:
0V

AC

BOT

DC -

DC+

Driver
board

TOP

AC

V
BOT

COM

Good:
OL
Fail:
0V

DC -

Lamp 21.03.2013
28. Jan 2010
J.J.Lamp

Test of SKiiP module


The Billmann SKiiP test box
Developed and produced by
Ing. Bro M.Billmann, Lerchensteige 10
91448 Emskirchen,
e-mail: m.billmann@t-online.de
The functionality is described in the
manual L23005_SKiiPTester_Bed_Anleitung_v1.10_eng_oce
Designed for all standard SKiiP modules.
Has therefore different interfaces
(GB=14pol, GH=20pol and GD=26pol
flatwire) as well as fiber optic.
Test functions
Supply current measurement via 0,1Ohm
resistor in suppply path.
10mV correspond to 100mA
10KHz generator for input signals
Measurement of analogue values
Internal current source of 1,3A for
measuring of diode forward voltage and
IGBT saturation voltage.
Voltage generator of 170V to measure
blocking capability.

Semikron recommends to use only the


supply current measurement because this
values are specified in the data sheet and
reproducible.
The diode forward voltage and IGBT
saturation voltage measurement at 1,3A is
not specified in the data sheet.
Lamp 21.03.2013
28. Jan 2010
J.J.Lamp

Test of SKiiP module


2. Test of driver input current and error LED with SKiiP test box
2.1 Test

setup
SKiiP tester connected to SKiiP via D-SUB -> 14pol flat wire adapter
Digital volt meter (DVM) connected to SKiiP test box via special cable

Lamp 21.03.2013
28. Jan 2010
J.J.Lamp

Test of SKiiP module


2.2 Setting of SKiiP test box and DVM
Set DVM to mV range
Read value: Good <1mV

Supply select

off

Supply monitor
signal path

24V

Primary side

off

I_supply
Primary signals

Six switches
HB1, HB2, HB3

All upper position

J. Lamp

28. Jan 2010

J. Lamp 21.03.2013

Test of SKiiP module


2.2.1 Input current test at no switching
Set Supply select switch to +24V
Check: LED TEMP and HB1 are green.
Read DVM value

2.2.2 Input current test at switching


> Press botton A, applies 10kHz to TOP
Read DVM value
> Press botton B, applies 10kHz to TOP
Read DVM value
> Set Supply select switch to off

J. Lamp

28. Jan 2010

J. Lamp 21.03.2013

Test of SKiiP module


Input current caules for different SKiiP types with Billmann SKiiP Tester
Values in mA. No data sheet values. The table shown Semikron experiences values with this tester including margin.
Reading of DVM is one tenth of these values because of the used 0,1Ohm shunt resistor for measurements.

1200V SKiiP
GD
2-fold
3-fold
4-fold

603GB123
613GB123
1203GB123
1213GB123
1803GB123
1813GB123
2413GB123
2403GB123

1700V SKiiP
GD
2-fold
3-fold
4-fold

603GB173
513GB173
1203GB173
1013GB173
1803GB173
1513GB173
2013GB173
2403GB173

No switching (2.2.1)

Switching (2.2.2)

Min

Max

Min

Max

300

400

400

600

200

300

250

450

230

330

350

550

250

360

450

650

No switching (2.2.1)

Switching (2.2.2)

Min

Max

Min

Max

300

400

500

700

200

300

300

500

230

330

400

600

250

360

500

700

Lamp 21.03.2013
28. Jan 2010
J.J.Lamp

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