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SUPPORTFOR

TessentScan(DFTAdvisor)
TECHNOTE MG22705,05Nov2005

WhytheclockinputsonsomeDflopflopsareassignedUOfaults?
SYMPTOMS

TECHNOTEID

Whyisthisfaultsonclockinputsconsideredunobservable
UO?

MG22705

TECHNOTETYPE

WhenfaulttestingadesigntheclockinputsonsomeD
flopflopsis
assignedUOfaults.Howtoimprovethecoverageon
thesesites?

Solution
UPDATED

05Nov2005
PRODUCTS

TessentFastScan
FlexTest
TessentTestKompress
ENVIRONMENT

FlexTest
updateimplicationdetection
DetectbyImplicationDIFaults
FastScan

Solution
ThedetectabilityoffaultsonclocklinesofDflipflops.
Todetectafaultonaclocklineoneneedstohavesomewayof
observingtheclocksaffectontheflipflop.Thisisdonewiththe
Dinput.ForexamplestartwiththesimplecaseofaDflopwithjust
aDinput,Qoutputandaclockinput.AssumingthattheDinput
canbefullycontrolledtoa1or0.Inagoodmachinesimulation
a0isplacedontheDinputandtheclockispulsed.Thestateof
theflopisinitiallyXandtheeffectoftheclockcausestheoutput
tobecome0.ThisgivesusaX0transitionontheoutput.Thesame
istruefora1ontheinput,theoutputisaX1transition.The
faultymachinewillmakeneithertransitionbecausetheclockwillbe
tiedtoether0or1.Whensimulatedthiswillnoteffecttheoutput.
TherewillonlybeXXoutput.ATPGwillonlycreateatestwhenit
canmakethegood(notstuck)valueknown,andalsomakethefaulty
valueknown,anddifferentfrom,theexpectedvalue.
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Thisisthemainpartoftheproblem,Atiedclocklinecan't
propagatethedatatotheoutput.Thuswithnochangeontheoutputs,
theclocklinecan'tbeobserved.Thefaultclass
detectedbyimplicationinfersthattheclockisnotstuckwhenitcan
bedeterminedthattheDinputcanbeobservedforstuckat1and0.
Anotherwaytosaythisis,becausethedatahaspropagatedfromthe
Dtotheoutputtheclockmusthavecausedthedatatobelatched
intotheflop.Becausetheclockoperateswithanedgebothstuckat
fortheclockhavebeendetectedbyimplication.
Whentherearesetsand/orresetssignalsthentheproblemof
detectingafaultontheclockismoredifficult.Iftheresetorset
canbeactivated(MentorDFTprimitivesetsandresetsareactiveHI)
thenitcan'tbedeterminediftheclockchangedthestateofthe
outputoriftheset/resetwasresponsibleforthestatechange.So,
onlyifthesedonotexist,oraretiedinactive(to0attheprimitive
level),canadetectbyimplicationbesafelymadeontheclock.
Becausescanpatternscanbereordered,withanypatternbeing
repositionedasthefirstoneapplied,itisnotpossibletocarry
knownstatevaluescreatedinapatternintothenextpattern's
initialstate.Avalidpatternwouldhavetoclockin,thenobserve,
bothvaluescomingoutofastateelementtoproveithadbeenclocked.
However,whenastateelementmustbeclockedtochangestate,itis
possiblethatthefaultsdetectedimplythattheclockmustnotbe
stuck.Thecommand
"UPDateIMplicationDetections"performsananalysisonthe
undetectedandpossiblydetectedfaultstoseeiftheycanbe
classifiedasdetectedbyimplication.Byinvocationdefault,the
tooldoesnotdothisanalysis,andonlyanalyzesscanpathassociated
faultsforthedetectedbyimplicationclassification.Thesearestuck
faultsonthescanpaththatwouldbedetectedbythefirstshiftoutof
anypattern(thechaintestpattern,orthefirstscanpattern)thathas
bothvalues(0and1)asexpectedoutputs.Thisdoesnotincludeclock,
set,orresetlinefaults,butdoesincludeDandQlinefaults.The
toolcanalsoclassifythefollowingfaultsasdetectedbyimplication
iftheuserissuesthe"UpdateImplicationDetections"command:
1)Astuckat1faultonthesetinputlineofatransparent
latch,scanlatch,scanDflipflop,shadow,copy,or
sequentialcellwhenthetooldetectsthestuckat1fault
ontheoutput.Thesetinputstuckat1willbedeclared
detectedbyimplication(DI).Thisisbecauseifitweresa1,
theQwouldalwaysbesetto1,andcouldnoteverbecome
valid0,butdetectingthesa1ontheQoutputmeansthat
aQ=0outputwasobserved.Ifthispassesonthetester,
thenthatimpliesthatthesetcannotbesa1.
2)Astuckat1faultontheresetinputlineofatransparent
latch,scanlatch,scanDflipflop,shadow,copy,or
sequentialcellwhenthetooldetectsthestuckat0fault
ontheoutput.Theresetinputstuckat1willbedeclared
DI,forreasonssimilarto1)above.
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3)Astuckat0faultonaclockinputlineofatransparent
latch,scanlatch,scanflipflop,shadow,copy,or
sequentialcellwhenthetooldetectsboththestuckat0
andstuckat1faultsfortheassociateddataline.The
clockinputstuckat0maybedeclaredDI,ifnoother
inputthantheclockcancausethememoryelementtochange
state.
4)Astuckat0faultonadatainputlineofatransparent
latch,scanlatch,scanDflipflop,shadow,copyor
sequentialcellwhenthetooldetectsthestuckat0fault
onthatmemoryelement'sQoutput,andnootherportscan
causethestate(Qoutput)tobecome1.
5)Astuckat1faultonadatainputlineofatransparent
latch,scanlatch,scanDflipflop,shadow,copy,or
sequentialcellwhenthetooldetectsthestuckat1fault
onthatmemoryelement'sQoutput,andnootherportscan
causethestate(Qoutput)tobecome1.
WhatthiscomesdowntoisthatFastScan&Flextesttakecare
toavoiddeclaringfalseoroptimisticdetections.Ourtools
willnotcreditforfaultswithoutclearjustification.
RelatedtothisTechNote
MG4646ATPGUntestable(AU)faultsonlatchclock/enableinputs(TLAs)

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