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10.1109/TCSII.2015.2457792, IEEE Transactions on Circuits and Systems II: Express Briefs
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I. INTRODUCTION
The authors are with the National ASIC System Engineering Research Center,
Southeast University, Nanjing 210096, China (e-mail: wjh@seu.edu.cn;
wzx.asic@gmail.com).
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(a)
1 N
1 N
2
(2)
(TOSi ET )
TOSi 2
N i =1
N i =1
where ET means the expectation of T, which is close to zero
because the offsets approximately follow a standard Gaussian
distribution.
In the proposed STDC, the rising edges of Fdiv and Fref are
interchanged cyclically due to the EIC. The encoder receives
2N outputs from arbiters in a cycle of SC (i.e., two adjacent
cycles of Fref). Therefore, the offsets can be redefined as T:
{TOS1, TOS2, , TOSN, -TOS1, -TOS2, , -TOSN}. The expectation
of the array T vanishes identically due to its symmetry, and the
standard deviation can be determined by
T =
(b)
Fig. 2. The proposed STDC with EIC. (a) Circuit. (b) Key waveform.
2 T
N
(1)
T' =
N
1 N 2
2
TOSi + (TOSi ) =
2 N i =1
i =1
1
N
2
OSi
(3)
i =1
= F ( cos o t
cos 3o t +
cos 5o t K) V ( )
3
5
(4)
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(a)
( 2 TLSB )
N div FDCO
(6)
12
where TLSB is the resolution of TDC, Ndiv is the dividing ratio.
Eq. (5) and (6) reveal that the proposed STDC can achieve a
phase noise improvement of about 6dBc/Hz, comparing with
the traditional STDC with the same amount of arbiters.
Substituting (5) in (6), the phase noise due to the proposed
STDC quantization can be written as
3 T2 N div FDCO
(7)
L
3N 2
In this work, a 2-MHz reference clock and 32 arbiters are used.
Substituting T=25ps, FDCO=2.4GHz, Ndiv=1200, N=32, we
obtain L-110.4dBc/Hz.
L=
C. Divider
In the arbiter circuit, there is an undesirable case when a very
narrow pulse width results at the OR gate output VG, as shown
in Fig. 2(b). Thus, M5 and M6 have insufficient time to charge
their drain terminals prior to the next detection. This probably
results in abnormal situations of STDC operation. Therefore, a
mechanism is necessary to limit the phase difference when the
STDC starts to work.
A divider with zero-phase error starting is used in the DEST
block, as shown in Fig. 4. Ndiv is the dividing ratio. 10-stage D
flip-flops based on current-mode logic structure are cascaded to
achieve a 10-bit down counter. When the count value is down
to zero, |Ndiv/2| and Ndiv-|Ndiv/2| are alternately selected to be the
load value of D flip-flops. Once AFC circuit finishes frequency
locking, FDCO approximates Fref times Ndiv, and the signal
Enable triggered by the falling edge of Fref becomes
low-voltage, which will be seen in Section III. Then the divider
(b)
Fig. 4. The proposed divider with zero-phase error starting. (a) Architecture.
(b) Key waveform.
starts to work and the first rising edge of Fdiv aligns with that of
Fref when the divider finishes the first down-counting, as shown
in Fig. 4(b). The zero-phase error starting is achieved and the
locking time is reduced, although there is still a tiny phase
difference that is much less than .
III. DCO
A. DCO core
The LC-based DCO, shown in Fig. 5, consists of three tuning
stages: a 5-bit binary-coded coarse array, a 7-bit binary-coded
medium array and a 7-bit thermometer-coded fine array. An
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0.98mm
(a)
(b)
Fig. 9. Single shot measurement. (a) With EIC. (b) Without EIC.
A. STDC Measurement
To measure the performance of STDC, a replica circuit has
been designed in the chip. The resolution of the proposed
STDC is about 0.98ps, which means T25ps and the range of
STDC is about 75ps. To measure the linearity, two inputs with
0.05Hz difference in frequency at 2MHz are applied to generate
a ramp input. Differential nonlinearity (DNL) and integral
nonlinearity (INL) within linear region are measured from code
density analysis with 105 hits. As shown in Fig. 8, the DNL is
-0.7 to 0.5 LSB and the INL is -1.7 to 0.5 LSB.
Fig. 9 shows the comparison of single-shot measurement
between STDC with and without EIC for a constant input of
20ps repeated 105 times. Thanks to the dynamic element
matching of EIC, the proposed STDC exhibits a more
centralized code distribution (standard deviation = 0.48LSB)
than the STDC without EIC (standard deviation = 0.81LSB).
B. ADPLL Measurement
The phase-noise plots of the ADPLL with and without EIC
are shown in Fig. 10. The in-band phase noise is about
-83.0127dBc/Hz @10kHz when EIC is on while the measured
result is about -77.0726dBc/Hz @10kHz when EIC is off. A
5.9401dBc/Hz improvement is achieved by using EIC, which
corresponds to the analysis in Section II. A -118.9556dBc/Hz
@1MHz out-band phase noise with EIC is achieved thanks to
the high-resolution DCO while the out-band phase noise
without EIC is -119.9772dBc/Hz@1MHz.
Fig. 11 shows the jitter performance of the ADPLL. When
operating at 2.4GHz output, the RMS jitter is 4.6ps and the
peak-to-peak jitter is 25.7ps. Table I summarizes the
performance comparison among similar works. This work has
the best out-band phase noise performance, and better jitter
performance and lower power except [2]. However, on in-band
phase noise performance, this work lags some distance from
some other excellent works, such as [2] and [4], which mainly
results from the slowest reference clock used in the ADPLL.
1549-7747 (c) 2015 IEEE. Personal use is permitted, but republication/redistribution requires IEEE permission. See
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This article has been accepted for publication in a future issue of this journal, but has not been fully edited. Content may change prior to final publication. Citation information: DOI
10.1109/TCSII.2015.2457792, IEEE Transactions on Circuits and Systems II: Express Briefs
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TABLE I
Performance Comparison with Prior Works
130
40
130
180
This
work
130
20
26
75
60
1.93.1
2.4
1.2
0.91.25
2.392.55
-75.49
@10kHz
-90.3
@10kHz
-96.9
@1MHz
N/A
-83
@10kHz
-104.6
@10MHz
-109.3
@10MHz
-109
@10MHz
N/A
-118.9
@1MHz
4.01
3.29
6.9
5.03
4.6
60
N/A
56
35.6
25.7
2MHz
200kHz
4MHz
N/A
100kHz
14.4
6.4
17
12.24
[1]
tech. (nm)
ref clock
(MHz)
output
(GHz)
in-band
phase noise
(dBc/Hz)
(a)
out-band
phase noise
(dBc/Hz)
RMS jitter
(ps)
pk-pk jitter
(ps)
Bandwidth
power
(mW)
[2]
[4]
[7]
V. CONCLUSION
This brief presented a 2.4G ADPLL for Zigbee application.
An EIC was proposed to solve the contradiction between
resolution and power in traditional STDC. A 1-ps resolution
was achieved using only 32 arbiters, which means a 30% power
reduction was achieved, comparing with a traditional STDC
that has the same resolution. In addition, a good linearity and a
more centralized code distribution was also achieved due to the
usage of EIC. A divider with zero-phase error staring was used
to assist the operation of STDC. The frequency resolution of
DCO and out-band phase noise of ADPLL was improved due to
the DSM. The chip was fabricated in a 0.13-m CMOS
technology and the measured results showed that the ADPLL
featured a 4.6-ps RMS jitter and a -118.95dBc/Hz out-band
phase noise and consumed 9mW under a 1.2-V supply.
ACKNOWLEDGMENT
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