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a r t i c l e i n f o
abstract
Article history:
Received 3 November 2011
Received in revised form
16 April 2012
Accepted 1 June 2012
Available online 12 June 2012
Keywords:
Thermography
Emissivity measurement
Temperature measurements
1. Introduction
Infrared thermography is a technique that allows one to map
the radiative thermal eld coming from a scene. By this technique, it is possible to evaluate the two-dimensional temperature
eld on the target surface in a non-destructive manner. For this
purpose, target emissivity and surroundings radiation have to be
considered. Emissivity depends on many factors such as temperature, surface roughness, wavelength, and viewing angle.
Knowledge of total emissivity (hemispherical or directional) is
necessary to characterize the radiative behavior of the target,
while for temperature measurements, the equivalent target
emissivity in the IR detector spectrum must be known. Reected
temperature, depending mainly on the surrounding radiation, is
another factor which affects the thermographic temperature
measurement accuracy.
In the last years, both experimental and analytical studies on
the emissivity measurement have been done, and nowadays
different approaches are possible. Especel and Matte [1]
proposed an absolute method for emissivity measurement via
periodic radiometry. They rst implemented the direct and
indirect ordinary methods by separating a modulated emitted
and a non-modulated reected uxes for the direct one, and vice
versa for the indirect one. It is worth noting that both of these
methodologies require the use of an emissivity reference, while
the proposed absolute method did not require any reference, but
involved modulating the temperature of both a sample and a
hemispherical IR source. In the same work, measurements of the
total directional emissivity have been carried out and validated
Corresponding author. Tel.: 39 049 829 5882; fax: 39 049 829 5728.
E-mail addresses: sergio.marinetti@itc.cnr.it (S. Marinetti),
piergiorgio.cesaratto@gmail.com (P.G. Cesaratto).
0963-8695/$ - see front matter & 2012 Elsevier Ltd. All rights reserved.
http://dx.doi.org/10.1016/j.ndteint.2012.06.001
128
Nomenclature
Ll,bb
Ll,e
l
T
Tsurr
Tt
TIR
TPt100
Tair
Tapp
DT
DTt
DTIR
DTPt100
R(l)
Ibb
Iatm
Smeas
Se
Sr
Sa
Stot
t
tatm
e
el
s
OS
129
el T
Ll,e T
Ll,bb T
2. Theoretical approach
IR
[14]).
given
given
Ll,bb T
2pc1
5
l ec2 =lT 1
3. Experimental procedure
Ibb T
A
expB=TD
13.8
13.6
Stot [W/m2]
130
13.4
Stot = 0.901 * Ibb + 0.908
13.2
R2 = 0.9990
13
12.8
12.6
13.2
13.4
13.6
13.8
14
14.2
14.4
Ibb [W/m2]
Fig. 2. Plot of Stot vs. Ibb(Tt).
single test
mean value
0.96
0.92
0.88
0.84
0.8
131
5
6
test number
10
Table 1
Results of emissivity measurements with FLIR SC6000 IR camera.
Material
Black paper
Black PVC tape
White paper
Aluminum (polished)
0.901
0.902
0.719
0.022
0.004
0.006
0.002
0.003
Table 2
Results of emissivity measurements with FLIR SC3000 IR camera.
Material
Black paper
White paper
0.910
0.908
0.006
0.002
Table 3
Emissivity data for the considered samples from the infrared literature and measurements made by FLIR Systems (ThermaCAMTM
Researcher).
Material
Spectrum
Reference
temperature (1C)
Black paper
Black, dull paper
Paper coated with black lacquer
Black, dull paper
Black, dull paper
White paper
White paper, 3 different glosses
White paper, 3 different glosses
White bond paper
Polished aluminum
Aluminum sheet, 4 samples differently scratched
Aluminum sheet, 4 samples differently scratched
Heavily weathered aluminum
Total
Total
Total
814 mm
25 mm
Total
814 mm
25 mm
Total
Total
814 mm
25 mm
25 mm
70
70
20
70
70
20
50100
70
70
17
0.90
0.94
0.93
0.89
0.86
0.700.90
0.880.90
0.760.78
0.93
0.040.06
0.030.06
0.050.08
0.830.94
132
Table 4
Results of the sensitivity analysis for absolute temperature measurements.
Outdoor
Absolute
error
DTt
(1C)
Indoor
e known;
uncertainty on
Tsurr: 7 2 1C
Tsurr known;
uncertainty on
e7 7 0.05
e known;
uncertainty on
Tsurr: 7 2 1C
Tsurr known;
uncertainty
on e7 70.05
0.15
0.16
1.07
0.98
0.35
0.38
0.06
0.06
1.5
Tsurr=12C
Tsurr=11C
Tsurr=10C
Tt [C]
Tsurr=9C
Tsurr=8C
0.5
0.5
1
0.8
0.82
0.84
0.86
0.88
0.9
1.5
Tsurr=18C
Tsurr=19C
Tsurr=20C
Tt [C]
Tsurr=21C
Tsurr=22C
0.5
0.5
1
0.8
0.82
0.84
0.86
0.88
0.9
Tsurr=19C
0.03
(Tt2Tt1) [C]
Table 7
Results of temperature measurements on black paper samples.
Tsurr=18C
0.04
Sample 1
Tsurr=20C
Tsurr=21C
0.02
133
Tsurr=22C
0.01
0
Sample 2
TPt100 (1C)
TIRTPt100 (1C)
e 0.90; Tsurr Tair
TPt100 (1C)
TIRTPt100 (1C)
e 0.90; Tsurr Tair
29.41
29.41
31.74
38.92
0.03
0.00
0.06
0.08
29.72
32.78
32.06
39.88
0.03
0.04
0.03
0.10
0.01
Table 8
Results of DT measurements on black paper samples.
0.02
DTPt100 (1C)
0.03
0.8
0.82
0.84
0.86
0.88
0.9
DTIRDTPt100 (1C)
0.31
3.37
0.31
0.96
0.03
0.03
0.02
0.02
6. Conclusions
Table 5
Results of temperature measurements on white paper samples.
Sample 1
Sample 2
TPt100 (1C)
TIRTPt100 (1C)
e 0.72; Tsurr Tair
TPt100 (1C)
TIRTPt100 (1C)
e 0.72; Tsurr Tair
27.62
30.61
33.07
36.92
0.32
0.35
0.35
0.38
28.01
33.67
37.55
44.92
0.29
0.38
0.38
0.38
Table 6
Results of DT measurements on white paper
samples.
DTPt100 (1C)
DTIRDTPt100 (1C)
0.03
0.03
0.02
0.01
134
and a contact sensor used as reference. In such a way, the twodimensional thermal eld on a wall can be measured with a high
accuracy. Research is going on to exploit this method for in-situ
emissivity estimation.
References
[1] Especel D, Matte S. Total emissivity measurements without use of an
absolute reference. Infrared Phys Technol 1996;37:77784.
[2] Schurer K. A method for measuring infrared emissivities of near-black
surfaces at ambient temperatures. Infrared Phys 1976;16:15763.
[3] Walach T. Emissivity measurements on electronic microcircuits. Measurement 2008;41:50315.
[4] Mazikowski A, Chrzanowski K. Non-contact multiband method for emissivity
measurement. Infrared Phys Technol 2003;44:919.
[5] Chrzanowski K. Problem of determination of effective emissivity of some
materials in MIR range. Infrared Phys Technol 1995;36(3):67984.
[6] ASTM E 1862-97. Standard test methods for measuring and compensating for
reected temperature using infrared imaging radiometers; 2002.
[7] Datcu S, Ibos L, Candau Y, Matte S. Improvement of building wall surface
temperature measurements by infrared thermography. Infrared Phys Technol
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