Keysight 102016

Solving Signal Integrity
Problems with Advanced TDR

& VNA Measurements
October 20, 2016
Mike Resso
Signal Integrity
Applications Scientist
Keysight Technologies
Jeff Most
Engineer
Keysight Technologies
Agenda
VNA
Most
Accurate
Most
Simple
VNA Overview: What is it and how it works

VNA uses and applications
VNA Calibration and Advanced Calibration techniques
Multiport Data Mining
Measurement Results
TDR
TDR Overview: What is it and how does it work?
Important TDR Instrument Considerations
TDR vs. VNA: Architectures, Advantages, Disadvantages
TDR uses and applications
TDR Calibration
Measurement Results: TDR vs. VNA
Summary and Q&A

2
Agenda
VNA
Most
Accurate
Most
Simple

Measurement Results
TDR
TDR Calibration
Summary and Q&A

3
What Are Vector Network

Analyzers?
S21
Transmission
DUT
VNAs are stimulus-response test systems
S11
S22
Reflection
S12
Characterize forward and reverse reflection and transmission responses

(S-parameters) of RF and microwave components
Quantify linear magnitude and phase
Magnitude
Are very fast for swept measurements
Provide the highest level

of measurement accuracy
RF Source
Phase
LO
R1
A
Test port 1
R2
B
Test port 2
Low
Integration
High
What Types of Devices are Tested?

Duplexers
Diplexers
Filters
Couplers
Bridges
Splitters, dividers
Combiners
Isolators
Circulators
Attenuators
Adapters
Opens, shorts, loads
Delay lines
Cables
Transmission lines
Resonators
Dielectrics
R, L, C's
Passive
RFICs
MMICs
T/R modules
Transceivers
Receivers
Tuners
Converters
Antennas
VCAs
Amplifiers
Switches
Multiplexers
Mixers
Samplers
Multipliers
VTFs
Modulators
VCAttens
Diodes
Transistors
Device type
Active
Lightwave Analogy to RF Energy
Incident
Reflected
Transmitted
Lightwave
DUT
RF
High-Frequency Device Characterization

Incident
Transmitted
Reflected
A
TRANSMISSION
REFLECTION
Reflected
Incident
VSW
R
S-Parameters
S11, S22
Reflection
Coefficient
G, r
Transmitted
Incident
Return
Loss
Impedance,
Admittance
R+jX,
G+jB
B
R
Group
Delay
Gain / Loss
S-Parameters
S21, S12
Transmission
Coefficient
T,t
Insertion
Phase
Why Use S-Parameters?
l
l
l
l
l
Most accurate method of characterizing components
Can cascade S-parameters of multiple devices to predict system performance

Can compute H-, Y-, or Z-parameters from S-parameters if desired
Can easily import and use S-parameter files in electronic-simulation tools
Flexible and powerful calibration and error correction options
a1
S 21
Incident
b2
S11
Reflected
b1
Transmitted
DUT
Port 1
Transmitted
Port 2
S12
S22
Reflected
a2
Incident
b1 = S11a1 + S12 a 2
b 2 = S21 a1 + S22 a 2
Dynamic Range and Accuracy
Dynamic range is very

important for
measurement
accuracy
Agenda
VNA
Most
Accurate
Most
Simple

Measurement Results
TDR
TDR Calibration
Summary and Q&A

10
Why Do We Need to Test Components?

Verify specifications of building blocks
for more complex telecom systems
Ensure distortionless transmission

of high speed digital signals
Ensure good match between system components
(minimize reflections, maintain amplitude, etc.)
Optimize performance/price
How to Build the Channel Model

Component Vendors
Host
Everyone needs to cascade models from
Device
different vendors together to make a
Cable
full channel!
End User
Mix-and-Match Components
Copyrighted 2016
Keysight
Building the Channel Model
Copyrighted 2016
Keysight
The Physical Layer Challenge
Copyrighted 2016
Keysight
PCB Technology Challenges
Traditional Methods of Measuring Non-coaxial Devices
Probing on the device for measurement

Drawback:
1. Probe station is expensive
2. Need probe cal kit and models for
probe calibration
Building test fixtures for coaxial to

microstrip/stripline transition
Drawback:
1. The fixtures are not electrically transparent, they
have mismatch, loss and delay, they need to be
characterized and removed from the DUT
measurement
2. The fixtures also have non-coaxial connectors
and cannot be measured directly
Well focus on solving fixturing problem in this presentation
Agenda
VNA
Most
Accurate
Most
Simple

Measurement Results
TDR
TDR Calibration
Summary and Q&A

17
Typical Error Correction Techniques
2016 Copyright
Keysight
New Error Correction Method

Automatic Fixture Removal (AFR)
Based on simple cal standards, using time domain
gating and signal flow calculations to extract
fixtures and do de-embedding.
Much simpler but same accuracy with TRL
calibration.
Yesterday was TRL
Today is AFR
SE Thru
Or
Diff Thru
Or
Open
2016 Copyright
Keysight
Family Members of the AFR Techniques

2 One-port AFR
1 AFR with 2xThru
Extract fixture S-parameters from

the Open or Short fixtures
Extract left and right fixtures from a

2xThru, the fixtures need to have
the same delay and insertion loss
3 AFR for Asymmetric

Fixtures
When the two fixtures have
different electrical lengths
4 Bandpass AFR
5 Non-50 Ohm AFR
When the DUT and fixtures are

band-limited (such as for mmWave
and waveguide)
When the DUT and fixture

reference impedance are not 50
Ohm
AFR
Agenda
VNA
Most
Accurate
Most
Simple

Measurement Results
TDR
TDR Calibration
Summary and Q&A

21
Multiport VNA for Manufacturing Applications
Up to 32-ports
Up to 26.5GHz
PXI-based modular
SCPI automation
October 18, 2016
22
Measure *.s32p Touchstone file in 3 s
Why *.s32p is important?

For todays internet infrastructure, many physical layer gigabit Ethernet
channels (pipes) consist of 8 differential pairs
2016 Copyright
Keysight
More Data Mining is Needed
2016 Copyright
Keysight
How to Manage Large S-parameter Files?

Physical Layer Test System (PLTS)
2016 Copyright
Keysight
Agenda
VNA
Most
Accurate
Most
Simple

Measurement Results
TDR
TDR Calibration
Summary and Q&A

26
Typical Measurement Results (USB 3.0)
October 18, 2016
27
Agenda
VNA
Most
Accurate
Most
Simple

Measurement Results
TDR
TDR Calibration
Summary and Q&A

28
TDR Overview: What is TDR?

Time Domain Reflectometry (TDR)
1. Launch a fast step into the Device Under Test (DUT)
2. See what REFLECTS back from the DUT.
Example measurements:
Impedance - locate the position and nature of each
discontinuity
Propagation/Time delay
Excess Reactance
(Capacitance or Inductance)
TDR (Impedance Profile)

2
4
FFT
1.
2.
3.
4.
5.
6.
Reference Plane
Connector Launch
Uncoupled TX Line
Coupled Diff TX Line
Connector
Open Circuit
S-parameters (Return Loss)
For validation/development look here for insight

regarding what in the device is causing reflections
29
TDR Overview: What is TDT?

Time Domain Transmission
(TDT)
1.Launch a fast step into the Device
Under Test (DUT)
2.See what is transmitted THROUGH
the DUT.
For development and validation, look
here for loss data to support simulation
or for de-embedding.
Example Measurements:
Step Response
Propagation/Time delay
Rise time degradation
FFT
TDT (Step Response)
S-parameters (Insertion Loss)
30
Agenda
VNA
Most
Accurate
Most
Simple

Measurement Results
TDR
TDR Calibration
Summary and Q&A

31
TDR, Important Instrument Considerations:

TDR Calibration, not all calibration is the same
Limited, Waveform Subtraction: This is a two-step process:
1. First an ideal DUT (a 50 calibration standard) is measured and the waveform saved. This is
the reference trace.
2. A DUT is measured and the reference trace is subtracted from the DUT trace.
This helps but leaves many error sources unaddressed.

Complete, True SOLT TDR Calibration:
Ideal TDR Module
Vi
Z0
+
VM
Vr
Signal incident to
DUT (VDI)
Error
Block
Signal reflected
from DUT(VDR)
VM
You want to measure D = VDR/VDI

BUT because the Error Block changes
BOTH signals you measure M = Vr/Vi
October 18, 2016
DUT
Error
Block
Vf
r
Vr
r
The error block has forward and reverse

reflection and transmission coefficients
that change the signals going to and
from the DUT
SOLT TDR Calibration characterizes the

Error Block so its effects can be
removed.
32
TDR, Important Instrument Considerations: Resolution
Important Instrument Specification
Impedance accuracy
Minimum Separation = (c * trise)/2 SQRT()
Discontinuity count
October 18, 2016
33
Agenda
VNA
Most
Accurate
Most
Simple

Measurement Results
TDR
TDR Calibration
Summary and Q&A

34
TDR vs. VNA, Different Architectures

From our previous discussion on resolution:
In FR4 resolution < 1mm requires a TDR

system rise time of approx. 10 ps
For a TDR system with a 50 GHz receiver, the step rise time must be 7 ps to provide a
system rise time of 10 ps. This means the step generator has frequency content to
50GHz (or higher).
TDR Architecture: For good resolution both the source and receiver are very wide band.
VNA Architecture: Uses a swept sinewave source and a narrow-band tuned receiver.
Question: Which architecture has a lower noise receiver?
October 18, 2016
VNA
35
TDR vs. VNA, Advantages & Disadvantages

Question: Which architecture has a lower noise receiver? VNA
Question: What is the impact of receiver noise?
More noise = less Dynamic Range
The TDR has more noise but uses averaging to reduce the effect of the noise:
A good VNA can provide

> 100 dB dynamic range
at 50GHz!
One important consideration when choosing your measurement instrument is dynamic

range how much do you need? For many applications either instrument is sufficient.
October 18, 2016
36
Agenda
VNA
Most
Accurate
Most
Simple

Measurement Results
TDR
TDR Calibration
Summary and Q&A

37
TDR Applications:
Trouble-shooting: No TDR calibration
required, just connect and measure, find
opens, shorts and large impedance
discontinuities AND where they are with
fast, live updates. The TDR is very intuitive
Characterization: Characterize a device to
evaluate performance. Characterize a
channel and save the touchstone file. Use
the channel characterization data for deembedding the channel from transmitter
measurements, etc., made later.
Scope Measurements: Turn off the step
generators and use the TDR channels as
Equivalent Time Oscilloscope channels for
standard scope measurements, eye diagram
analysis and jitter analysis.
38
Agenda
VNA
Most
Accurate
Most
Simple

Measurement Results
TDR
TDR Calibration
Summary and Q&A

39
Modern TDR Calibration Capabilities:

Basic: True SOLT TDR Calibration
Advanced:
Advanced: De-embedding
Automatic Fixture Removal

Same as Keysight N1930B PLTS
(Physical Layer Test System software)
Agenda
VNA
Most
Accurate
Most
Simple

Measurement Results
TDR
TDR Calibration
Summary and Q&A

41

The board
Si goes here
42

Probing
Station
TDR or
VNA
Probe Tips
Goal: Characterize the channel WITHOUT including effects of nonideal instrument performance, cables and probes!
Three Measurement Approaches Evaluated to address the probes:
1. Calibrate at the probe tips using a Calibration Substrate.
2. Calibrate at the connection to the probe and De-embed the probes.
3. Do not use the probes and characterize the DUT using One-Port AFR.
43
Measurement Results: TDR vs. VNA, Case Study #1

Calibration Substrate
Calibrate at
connectors
Probing
Station
VNA
or TDR
Calibrate at
Probe Tips
Process with the calibration Substrate:

1. SOLT calibration at VNA/TDR connectors 1&2.
2. SOLT calibration at the probe tips using a calibration substrate
Reference Planes
3. Measure the DUT:
1
VNA or
TDR
Probing
Station
2
3
44

Probe De-Embedding
Calibrate at
connectors
Probing
Station
VNA
or TDR
2
3
Process with Probe De-embedding:

1. SOLT calibration at VNA/TDR connectors 1,2,3&4
2. Measure the DUT + Probes
3. De-embed the probes
Measurement Planes
1
VNA or
TDR
Probing
Station
2
3
Reference Planes
45

One-Port AFR
Calibrate at
connectors
VNA
or TDR
Probing
Station
2
3
Process with One-Port AFR:

1. SOLT calibration at VNA/TDR connectors 1&2
2. Do not use VNA/TDR channels 3&4 or the probes
3. Measure SDD11 of the channel into an open and/or short.
4. Use One-Port AFR to calculate the .s4p file
Measurement Planes
Shorted
1
VNA or
TDR
Reference Plane
46
Channel Characterization, Insertion Loss

SOLT calibration at probe tips
TDR in blue
VNA in red
to 25GHz
Summary:
Challenged getting a good cal beyond 25 GHz
on both instruments.
Very good correlation of TDR and VNA results.
1
VNA or
TDR
Probing
Station
2
3
October 18, 2016
47

SOLT calibration at connectors, de-embed probes
TDR in blue
VNA in green
Summary:
Freq to 50GHz
3 dB/div
1
VNA or
TDR
Probing
Station
2
3
48

What is the frequency limit of one-port AFR?
Summary:
Insertion loss trace

crosses return loss
At 43GHz
1
VNA or TDR
October 18, 2016
PNA in blue
TDR in red
Short
Freq to 43 GHz
2 dB/div
49
De-embedding the channel using the TDR/Scope

Eye Width
Raw
Tx Only
Eye Height
43 GHz AFR
50 GHz De-Embed
25 GHz Cal at Tips
Summary:
Significant improvement in EYE opening with deembedding, as expected (10% width, >100% height).
Eye Width correlation across instruments and methods
within 2.5% of Tx only.
Eye Height for probe at cal tips method low.
Eye Height for AFR and Probe De-embed within 2.5% of
Tx only.
50 GHz de-embed
43 GHz AFR
25 GHz cal at tips
Tx ONLY
Raw at channel end
50 GHz de-embed
43 GHz AFR
25 GHz cal at tips
Tx ONLY
October 18, 2016
Raw at channel end
50
Agenda
VNA
Most
Accurate
Most
Simple

Measurement Results
TDR
TDR Calibration
Summary and Q&A

51
Summary
Both VNAs and TDRs can provide time domain and frequency domain
measurement results and in many cases results are comparable.
Keysight designs and manufactures BOTH high performance VNAs and
high performance TDRs. If you dont know which instrument is best for
your application, contact your Keysight Field Engineer for an honest
discussion on the benefits of each.
Automatic Fixture removal (AFR) is an easy and accurate way to
characterize your fixtures and probes and works well with both VNAs
and TDRs
RF Source
LO
R1
A
Test
port 1
R2
B
Test
port 2
Have a plan for managing data when testing high port-count devices.
Keysight PLTS can help!
October 18, 2016
52
Solutions Discussed Today
50 GHz PNA-X VNA: N5245A,

www.keysight.com/find/PNA
Equivalent Time Sampling Oscilloscope

Mainframe: 86100D DCA-X, http://www.keysight.com/find/dca
TDR Module: N1055A 50 GHz 4-port, www.keysight.com/find/tdr
32-port PXI-VNA PLTS System:

www.keysight.com/find/diref
PLTS: N1930B with options:

www.keysight.com/find/PLTS
Papers and Videos

One-Port AFR: http://literature.cdn.keysight.com/litweb/pdf/5990-8443EN.pdf?id=2061639
One-Port AFR: http://literature.cdn.keysight.com/litweb/pdf/5992-0656EN.pdf?id=2589631
One-Port AFR : https://www.youtube.com/watch?v=cXF6mJaHfyc
TDR video, calibration, AFR &De-embedding:
https://www.youtube.com/watch?v=nVPNm7GdCqQ&cc=US&lc=eng
53
Acronyms and Names

DUT: Device Under Test
SOLT: In this paper refers to a TDR/VNA calibration
technique using Short, Open, Load and Thru mechanical

standards.
ECal: In this paper refers to a TDR/VNA calibratino
technique based on an electronic Calibration module

characterized over a wide frequency range
AFR: In this paper refers to Automatic Fixture Removal.

TRL: Thru, Reflect, Line
LRM: Line, Reflect, Match
54
QUESTIONS??
55

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Solving Signal Integrity

Problems with Advanced TDR

VNA Overview: What is it and how it works

Summary and Q&A

VNA Overview: What is it and how it works

Summary and Q&A

What Are Vector Network

VNAs are stimulus-response test systems

Characterize forward and reverse reflection and transmission responses

Are very fast for swept measurements

Provide the highest level

What Types of Devices are Tested?

Lightwave Analogy to RF Energy

High-Frequency Device Characterization

Why Use S-Parameters?

Most accurate method of characterizing components

Can cascade S-parameters of multiple devices to predict system performance

Dynamic Range and Accuracy

Dynamic range is very

VNA Overview: What is it and how it works

Summary and Q&A

Why Do We Need to Test Components?

Ensure distortionless transmission

How to Build the Channel Model

Building the Channel Model

The Physical Layer Challenge

PCB Technology Challenges

Traditional Methods of Measuring Non-coaxial Devices

Probing on the device for measurement

Building test fixtures for coaxial to

VNA Overview: What is it and how it works

Summary and Q&A

Typical Error Correction Techniques

New Error Correction Method

Family Members of the AFR Techniques

Extract fixture S-parameters from

Extract left and right fixtures from a

3 AFR for Asymmetric

5 Non-50 Ohm AFR

When the DUT and fixtures are

When the DUT and fixture

VNA Overview: What is it and how it works

Summary and Q&A

Multiport VNA for Manufacturing Applications

October 18, 2016

Measure *.s32p Touchstone file in 3 s

Why *.s32p is important?

More Data Mining is Needed

How to Manage Large S-parameter Files?

VNA Overview: What is it and how it works

Summary and Q&A

Typical Measurement Results (USB 3.0)

October 18, 2016

VNA Overview: What is it and how it works

Summary and Q&A

TDR Overview: What is TDR?

TDR (Impedance Profile)

S-parameters (Return Loss)

For validation/development look here for insight

TDR Overview: What is TDT?

TDT (Step Response)

S-parameters (Insertion Loss)

VNA Overview: What is it and how it works