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A.LAVANYA A.P/EEE
OBJECTIVE
Construction, Principle of operation - Static and
dynamic characteristics of Power MOSFET
Power MOSFET
A power MOSFET is a specific type of metal oxide
semiconductor field-effect transistor (MOSFET) designed to
handle significant power levels.
Construction :
Power MOSFET has three terminals drain, source and gate.
Arrow direction indicates the direction of electron flow.
Symbol
Construction
Planar diffused n-channel MOSFET(DMOS)
structure.
n+ substrate, high resistivity n- layer epitaxially
grown.
Thickness of n- layer-determines voltage blocking
capability of the device.
n+ substrate, a metal layer is deposited to form
drain terminal.
p regions are diffused in the epitaxially grown nlayer.
Regions are diffused in p regions layer.
SiO2is added for metallic source and gate
terminals
Operation
Gate voltage-zero and VDD is present
n-p Junctions-reverse biased-no current flows
from drain to source.
Gate voltage-positive with respect to source,
an electric field is established and electrons
form n channel in the regions.
Current from drain to source is established
With increase in gate voltage drain current also
increases
Transfer characteristics
Output characteristics
Switching characteristics
Construction- IGBT
Static characteristics
Switching characteristics
THYRISTOR
A thyristor is a four layer 3 junction p-n-p-n
semiconductor device consisting of at least three p-n
Thyristor
Modes of operation
Switching characteristics
Delay time td
2.
Rise time tr
3.
Spread time tp
tON = td + tr + tp
td = delay time, tr = rise time, tp or ts = peak time (or) spread time
It is the time taken for the removal of excessive carriers from top and bottom
layer of SCR.
At t2: When nearly 60% of charges are removed from the outer two layers, the
reverse recovery current decreases.
This decaying causes a reverse voltage to be applied across the SCR.
At t3 all excessive carriers from J1 and J3 is removed.
The reverse voltage across SCR removes the excessive carriers from junction J2.
Gate recovery process is the removal of excessive carriers from J2 junction by
application of reverse voltage.
Time taken for removal of trapped charges from J2 is called gate recovery
time(tgr).
At t4 all the carriers are removed and the device moves to the forward blocking
mode.
cheaper
costlier
Now, by the analysis of two transistors model we can get anode current,
From equation (i) and (ii), we get,
If applied gate current is Ig then cathode current will be the summation of anode
current and gate current
By substituting this value of Ik in (iii) we get,
di/dt protection
When SCR is forward biased and is turned ON by the gate signal, the anode current flows.
The anode current requires some time to spread inside the device. (Spreading of charge
carriers)
But if the rate of rise of anode current(di/dt) is greater than the spread velocity of charge
carriers then local hot spots is created near the gate due to increased current density.
dv/dt protection
dv/dt is the rate of change of voltage in SCR.
When a thyristor is in forward blocking state then only J2
junction is reverse biased which acts as a capacitor having
dv/dt protection
dv/dt is the rate of change of voltage in SCR.
When a thyristor is in forward blocking state then only J2
junction is reverse biased which acts as a capacitor having
dv/dt protection
False operation of thyristor circuits.
20-500V/sec
Snubber circuit
Overvoltage protection
Overvoltage transients- main cause for thyristor failure
Internal overvoltages:commutation
The reverse recovery current rises to peak value at which
time the SCR begins to block.
Because of the series inductance L of the SCR circuit, large
transient voltage L di/dt is produced.
External Overvoltages:lightning strokes
When a thyristor converter is fed through a transformer,
voltage transients are likely to occur when the transformer
primary is energised or deenergised.
How it is Protected ?
The effect of over-voltages can be minimized by
using non-linear resistors called voltage clamping
Overcurrent protection
Thyristors have small thermal time constants.
Over current mainly occurs due to different types of
faults in the circuit,short circuits or surge currents.
Due to over current i2R loss will increase and high
generation of heat may take place that can exceed
the permissible limit and burn the device.
How it is Protected ?
: SCR can be protected from over current by
using CB and fast acting current limiting fuses
(FACLF). CB are used for protection of thyristor
against continuous overloads or against surge
currents of long duration as a CB has long
tripping time. But fast-acting fuses is used for
protecting SCR against high surge current of
very short duration.