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2SK3878
Switching Regulator Applications
Unit: mm
Symbol
Rating
Unit
Drain-source voltage
VDSS
900
VDGR
900
Gate-source voltage
VGSS
30
DC
(Note 1)
ID
Pulse
(Note 1)
IDP
27
PD
150
EAS
778
mJ
Avalanche current
IAR
EAR
15
mJ
TOSHIBA
Channel temperature
Tch
150
Tstg
55~150
Drain current
1. GATE
2. DRAIN (HEATSINK)
3. SOURCE
JEDEC
JEITA
SC-65
216C1B
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate
reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (Handling Precautions/Derating Concept and
Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Thermal Characteristics
2
Characteristic
Symbol
Max
Unit
Rth (ch-c)
0.833
C/W
Rth (ch-a)
50
C/W
Note 1: Ensure that the channel temperature does not exceed 150C
during use of the device.
2006-11-13
2SK3878
Electrical Characteristics (Ta = 25C)
Characteristic
Symbol
Typ.
Max
Unit
VGS = 30 V, VDS = 0 V
10
V (BR) GSS
IG = 10 A, VDS = 0 V
30
IDSS
100
Min
IGSS
Test Condition
V (BR) DSS
ID = 10 mA, VGS = 0 V
900
Vth
VDS = 10 V, ID = 1 mA
2.0
4.0
RDS (ON)
VGS = 10 V, ID = 4 A
1.0
1.3
Yfs
VDS = 15 V, ID = 4 A
3.5
7.0
Input capacitance
Ciss
2200
Crss
45
Output capacitance
Coss
190
25
65
20
120
60
34
26
Rise time
tr
0V
ton
4.7
Turn-on time
Switching time
Fall time
tf
Turn-off time
VOUT
RL = 100
Duty <
= 1%, tw = 10 s
toff
ID = 4 A
10 V
VGS
Qgs
Qgd
ns
VDD
400 V
Qg
Gate-source charge
pF
VDD
400 V, VGS = 10 V, ID = 9 A
nC
Symbol
Test Condition
Min
Typ.
Max
Unit
IDR
IDRP
27
(Note 1)
VDSF
IDR = 9 A, VGS = 0 V
1.7
trr
IDR = 9 A, VGS = 0 V,
1.4
Qrr
16
Marking
TOSHIBA
K3878
2006-11-13
2SK3878
ID VDS
ID VDS
20
COMMON SOURCE
Tc = 25C
PULSE TEST
COMMON SOURCE
Tc = 25C
PULSE TEST
15
10
10
6
5.5
5.25
4.75
2
VGS = 4.5 V
16
15
10
12
5.5
VGS = 4.5 V
0
10
16
25
8
Tc = 55C
100
4
8
4.5
4
2.3
12
16
20
(V)
RDS (ON) ID
10
COMMON SOURCE
DRAINSOURCE ON RESISTANCE
RDS (ON) ()
ID = 9 A
COMMON SOURCE
VDS = 20 V
PULSE TEST
Tc = 55C
100
25
12
(V)
10
1
0.1
COMMON SOURCE
Tc = 25C
PULSE TEST
16
10
Yfs ID
100
20
VDS VGS
20
COMMON SOURCE
VDS = 20 V
PULSE TEST
12
16
ID VGS
20
12
10
Tc = 25C
PULSE TEST
VGS = 10 V
1
0.1
100
10
100
2006-11-13
2SK3878
RDS (ON) Tc
IDR VDS
100
COMMON SOURCE
VGS = 10 V
PULSE TEST
3
ID = 9 A
2
4.5
2.3
0
80
40
40
80
CASE TEMPERATURE
120
COMMON SOURCE
Tc = 25C
PULSE TEST
10
VGS = 0 V
3
0.1
160
10
0.4
Tc (C)
0.8
C VDS
Vth Tc
Vth (V)
1000
Coss
100
Crss
COMMON SOURCE
VGS = 0 V
f = 1 MHz
Tc = 25C
1
0.1
10
COMMON SOURCE
VDS = 10 V
ID = 1 mA
PULSE TEST
0
80
100
40
200
500
PD (W)
40
160
120
80
40
40
80
120
CASE TEMPERATURE
80
120
160
Tc (C)
DYNAMIC INPUT/OUTPUT
CHARACTERISTICS
PD Tc
CASE TEMPERATURE
160
Tc
400
(C)
VDS
300
VDS = 400 V
200
20
16
12
100
200
VGS
100
0
0
200
COMMON SOURCE
ID = 9 A
Tc = 25C
PULSE TEST
(V)
CAPACITANCE C
(pF)
Ciss
0
0
1.6
10000
10
1.2
20
40
60
80
DRAINSOURCE ON RESISTANCE
RDS (ON) ()
0
100
2006-11-13
2SK3878
rth tw
10
Duty = 0.5
0.2
0.1
0.1
0.05
0.02
0.01
PDM
0.01
SINGLE PULSE
T
Duty = t/T
Rth (ch-c) = 0.833C/W
0.001
10
100
1m
10 m
100 m
PULSE WIDTH tw
(S)
EAS Tch
100
1000
ID max (PULSE) *
10
100 s *
ID max (CONTINUOUS)
1 ms *
DC OPERATION
Tc = 25C
0.1
10
100
1000
800
600
400
200
0
25
VDSS max
increase in temperature.
0.01
1
10
10000
50
75
100
125
150
Tch (C)
15 V
BVDSS
IAR
15 V
VDD
TEST CIRCUIT
RG = 25
VDD = 90 V, L = 17.6 mH
VDS
WAVE FORM
AS =
1
B VDSS
L I2
B
V
VDSS
DD
2006-11-13
2SK3878
20070701-EN
2006-11-13