Professional Documents
Culture Documents
Historical Perspective
George E. P. Box (born 1919)
was a student of R. A. Fisher.
He made several advances to
Fishers work in DOE theory
and statistics. The founding
chair of the University of
Wisconsins Department of
Statistics, Box was appointed
the R. A. Fisher Professor of
Statistics at UW in 1971.
QE Overview
Objective of this Lecture:
To explore the basic ideas of two-level factorial design of experiments (DOE) and
the connection of QE to statistical process control (SPC)
Key Points:
DOE can help uncover significant variables and interactions among variables.
SPC can help uncover process shifts.
Quality engineering tools help the investigator to discover a path for process
improvement.
Typical QE Applications
In manufacturing improve performance of a manufacturing
process.
In process development improve yields, reduce variability and
cost.
In design evaluation and comparison of basic configurations,
materials and parameters.
The method is called Taguchi Methods.
The key tool is DOE (Design of Experiment).
C. R. Rao
Youd know Rao from his Cramer-Rao
Inequality. Rao is recognized
worldwide as a pioneer of modern
multivariate theory and as one of the
worlds top statisticians, with
distinctions as a mathematician,
researcher, scientist and teacher.
Taught Taguchi. Author of 14 books
and over 300 papers.
Genichi Taguchi
An engineer who developed an
approach (now called Taguchi
Methods) involving statistically
planned experiments to reduce
variation in quality. Learned DOE from
Professor Rao. In 1960s he applied his
learning in Japan. In 1980s he
introduced his ideas to US and AT&T.
LOW (-)
regular
beer
3-piece
HIGH (+)
oversized
water
balanta
-++
-+-
++-
Avg
Response
67
79
61
75
65
60
77
87
---
+-+
Standard D
Order
--+
+++
D
+-1
77
61
B
87
75
65
60
O
67
79
D
On target production is
more important than
producing within Specs
Conventional view
Product/Process
Actual
Performance (P)
Center
Screening
Factorial Orthogonal
FF
Fractional
Factorial
B
Response
C
Array Columns
-AB
-ABC
-BC
-AC
Expt #1
A1 B1 C1
D1
E1 F1
G1
16/100
A1 B1 C1
D2
E2 F2
G2
17/100
A1 B2 C2
D1
E1 F2
G2
12/100
A1 B2 C2
D2
E2 F1
G1
6/100
A2 B1 C2
D1
E2 F1
G2
6/100
A2 B1 C2
D2
E1 F2
G1
68/100
A2 B2 C1
D1
E2 F2
G1
42/100
A2 B2 C1
D2
E1 F1
G2
26/100
Variable Level
% Defective
A1
12.75
A2
35.50
B1
26.75
B2
21.50
C1
25.25
C2
23.00
D1
19.00
29.25
E1
30.50
E2
17.75
F1
13.50
F2
31.75
G1
33.00
G2
15.25
% Defective
A1
B2
C1
D2
E1
F2
G1
Fishers Original
X1
X2
X3
Yates
Group Theory
Taguchi
X1
X2
X3
ab
ac
bc
abc
L N (2k)
Total Number of Runs
Number of Levels per Factor
1
5
3
2
3
4
7
6
5
4
23
Taguchi
26-3
24
23-1 L3
L12
L18
27-1 L8
25
215-11 L36
27-1
L27
Assumes most interactions are small and those that arent are known
ahead of time
Taguchi claims that it is possible to eliminate interactions either by
correctly specifying the response and design factors or by using a sliding
setting approach to those factor levels.
Doesnt guarantee that we get highest resolution design.
E1
E2
Design factors: I 1, I 2, I 3
Noise factors: E 1 and E 2
Objective: Maximize
response while minimizing its
variance
I3
I2
I1
Starter Torque
E1
-1
-1
Output
Output
E2
-1
-1
Mean
Std. Dev.
f1
f2
f3
-1
-1
-1
75
86
67
98
81.5
13.5
-1
-1
87
78
56
91
78.0
15.6
-1
-1
77
89
78
63.0
37.1
-1
95
65
77
95
83.0
14.7
-1
-1
78
78
59
94
77.3
14.3
-1
56
79
67
94
74.0
16.3
-1
79
80
66
85
77.5
8.1
71
80
73
95
79.8
10.9
2
= 10log( 2 )
= 10log(
1/2
)
= 10log(
2
)
25
20
15
10
25
20
15
10
% Defective
% Defective
% Defective
A1
B2 C1
D2
Inner Array Factor Settings
B2 C1
D2
Inner Array Factor Settings
0.0015
0.001
0.0005
0
Robustness is maximized
when S/N ratio is
maximized
Design (inner array) factor
settings that maximize S/N
ration are:
I1 (turns) = - 1
I2 (gage) = + 1
I3 (ferric %) = - 1
Note: This system is not
additive => Results are
approximatey OK.
A1
B2
C1
D2
Epilogue
Designers should embrace Taguchis philosophy of quality engineering. It makes
very good sense.
Note, however, that a key weakness of Taguchi method is its assumption of a main
factor only (or additive model) Taguchi ignores interactions
Therefore, rather than use inner outer arrays, we may use more efficient and
exact methods that are no more difficult to learn and apply to carry Taguchis
robust design philosophy into practice
You may use any of the various experimental and optimization techniques available
in the literature such as multiple regression/RSM to develop robust designs.
An example of such extension is shown in next slides.
Design
Factor A
Product
Design
Factor B
Variable
Response
Weather Psychology
Economy
Engineering
Medicine
Chemistry
Electronics
D=
2 + 3 + 3.
2 2 + . 3. .
= 6.84 hz
||
[ 2 + + 3 + 3]
= 3.0 inches
Variance of c Estimated
Variance of
c
R3 Values
Variance of D Estimated
Variance
of D
R3 Values
Chromosome buidler
R2
010010010
R3
100010011
001101010
The Nondominated
Sorting Multiobjective
GA produces Paretooptimal solutions
Variance
of D
R2
C (farad)
Avg (Hz)
Var
Avg (D)
(in)
Var (D)
311.78881
22.43919
0.000462
6.841476
0.08788
3.00349
0.0112
156.2765
157.7785
0.000434
6.844165
0.09586
3.00323
0.0105
306.0652
25.66875
0.000458
6.841552
0.08803
3.00347
0.0111
195.026
111.5562
0.000426
6.8434
0.09281
3.00325
0.0105
225.7759
82.24873
0.000426
6.842843
0.09110
3.00328
0.0106
195.1129
111.4653
0.000424
6.843399
0.09280
3.00325
0.0105
299.6366
29.40162
0.000454
6.841641
0.08821
3.00345
0.0111
References
Taguchi, G., Introduction to Quality Engineering, APO, Tokyo, 1986.
Pieset, J. and Singhal, K., Tolerance Analysis and Design, Elsevier, 1980.
Phadke, M.S., Quality Engineering and Robust Design, Prentice-Hall 1989.
Bagchi, Tapan P., Taguchi Methods Explained. Practical Steps to Robust Design, PrenticeHall (India), 1983.
Filippone, J., Using Taguchi Methods to Apply to the Axioms of Design, Robot, Computer
Integrated Manufacturing 6(2) 1989 133 142
Bagchi, Tapan P., Kumar, Mahdu Ranjan, Multiple-Criteria Robust Design of Electronic
Devices, J of Electronic Manufacturing 3, 1993, 31- 38.
Montgomery, Douglas C., Design and Analysis Experiments 3rd Edition Wiley, 1993.
Bagchi, Tapna P., Templeton, J.G.C. ,Multiple-criteria Robust Design using Constrained
Optimization, J. Design and Manufacturing, 4, 1994, 21 30.
Myers, J., Carter, Jr. W. H., Response Surface Techniques for Dual Response Systems,
Technometrics, 26, 1973, 301 317.
Khattree, Ravindra, Robust Parameter Design: A Response Surface Approach, J. Quality
Technology, 1996, 28 (2) 187 195.
Voss, Stetan, Metaheuristics: The State of the Art, In Local Search for Planning and
Scheduling, Alexander Nareyek (ed) Springer, 2001.
Goldberg, G. E., Genetic Algonrithm on Search. Optimization and Machine Learning,
Addison-Wesley, 1989, 147 215.