Test

Target Tester: All GR228X testers except the GR2288
Generated by: xpse:PTS.r.320 [pse:Arena:sv386] Sat Feb 3

00:20:39 EDT 1996
Template Ver: 3.2.1
Generated on: Tue Jul 9 09:43:38 1996
Supply voltages should be wired to power buses in the
fixture.
NOTE
GenRad software requires that all power nodes begin with VCC
and all reference nodes begin with GND. For example: VCC5
would be +5V VCCN5_2 would be -5.2v; GND would be digital
ground and be analog ground.
----------------------------------------------------------Target Testers with Alliance supplies require:
PS(1) 5.00 Volts 2.00 Amps
Target Testers with Non-Alliance supplies require:
SVS(1) 5.00 Volts 2.00 Amps
----------------------------------------------------------Power Supply Wiring Information for PS(1) / SVS(1):
5.00 Volt Power Node=VCC 5.00 Volt Reference Node=GND
Connect 03-A17 to 5.00 Volt Reference Bus (LO)
Connect 03-A20 to 5.00 Volt Reference Bus (LO Sense)
Connect 03-A21 to 5.00 Volt Power Bus (HI Sense)
Connect 03-A22 to 5.00 Volt Power Bus (HI)
*** SVS1 Programming Resistor Wiring:
Connect 01-B32 to 01-B33
Connect 01-B28, 01-A28, 01-A29, 01-A30, and 01-A31 together
Connect 19955 Ohm resistor between 01-B30 and 01-A30
Used to define variables, which customize the generated output

files to specific target testers and power supply hardware
configurations.
To get detailed information on the power supply options
variables, read the file pseopt.tpl in the GenRad templates
directory or use on-line help for PSE.
/** Power Supply Programming Statements generated

automatically by GenRad software on Mon Oct 21 15:39:25 1996.
Executable: pse.exe:PTS..40 [pse:Arena:nt386]
Fri Aug 23 22:33:55 1996
Template: 3.2.1 **/
/** Subroutines needed for Power Programming **/
DECLARE SYSTEM CNTRL_C(CSTRING CONTROL(8));
DECLARE DISCHARGE_POWER(); /* Power Discharge Subroutine */
DECLARE PWRUP(); /* Power-up Subroutine */
DECLARE PWRDN(); /* Power-down Subroutine */
/** LOAD Subroutine and LOAD Variables for
Power Programming **/
DECLARE LOAD PROGRAM_INITIALIZATION();
/** Executed at RTS Init **/
DECLARE LOAD CSTRING GR_TARGET(8);
/** Contains Target Tester **/
DECLARE LOAD POWER_TYPE;
/** Alliance or Non-Alliance **/
/*** Global String variables for Power Programming ***/
DECLARE GLOBAL CSTRING CONTROL(8);
/** For CNTRL_C Sys Sub **/
DECLARE GLOBAL CSTRING SUPPLY_SETTING(15);
/** Voltage Setting **/
DECLARE GLOBAL CSTRING SUPPLY_NAME(15);
/** Power Supply Name **/
2
DECLARE GLOBAL CSTRING UUT_POWER_STATUS(3) = 'OFF';

/*** Declarations needed for BasicSCAN Diagnostics ***/
DECLARE BASSCAN_FAILBIT; /** BASICSCAN fail bit **/
DECLARE BASSCAN_FAILCNT; /** BASICSCAN fail count **/
DECLARE CSTRING PINNAME(5); /** Alpha-numeric pin name **/
/** Translates PINORDER number to Alphanumeric pin name **/
DECLARE SYSTEM GET_PINNAME(FLOAT PINORDER,
CSTRING PINSTRING(5));
DECLARE BSTRING FAIL(1100);
ENDDEC:
ON ABORT CALL PWRDN();
/****************************************************/
/** Call UUT Power-Up Subroutine **/
/*********************************************************/
CALL PWRUP();
IF FAIL(6) THEN BRANCH DDONE;
/* if power up fails skip digital tests */
/** Default ASSIGN LOGIC Statement - Modify as needed **/
ASSIGN LGC VCDH=3.5 VCDL=.2 VCST=1.5 VTT=1.5
VIHA=3.5 VILA=0.1 VOHA=2.4 VOLA=0.8 LVLA(1-3840);
END_DIGINIT:
DDONE: CALL PWRDN();
END;
SUBROUTINE PROGRAM_INITIALIZATION();
/** This Load Subroutine is executed once during program
initialization. It is used to determine and store system
hardware configuration information in system variables
that can then be accessed during UUT Power-up and
Power-down sections... **/
/********************* NOTE*****************************/
/** The PROGRAM_INITIALIZATION(), PWRUP(), PWRDN(), and**/
/** DISCHARGE_POWER() Subroutines contain Test Language**/
/** Statements that will allow them to control both **/
/** Alliance and Non-Alliance GR228X power supplies. **/
/** The PROGRAM_INITIALIZATION() Subroutine determines **/
/** the target tester capabilities at Run-Time **/
/** initialization and executes the appropriate **/
/** Programming statements based on the target tester **/
/** configuration. **/
/*********************************************************/
/********************* WARNING!!*************************/
/** "Alliance" PS Power supplies on UNIX based testers **/
/** do not program negative. Negative voltages are **/
/** obtained by reversing the polarity of the leads in **/
/** the test fixture. The only exception to this is **/
3
/** PS(13), which is wired in some 228X testers to **/

/** provide a negative voltage to match the -15V or 12V**/
/** FIXED Power Supply. Therefore, to obtain a positive**/
/** voltage on PS13, the polarity of the leads must be **/
/** reversed. **/
/********************** NOTE *****************************/
/** If you require negative supply voltages and the UUT **/
/** fixture is to be used on testers equipped with both **/
/** Alliance and Non-Alliance power supplies, then PVS **/
/** Supplies should be programmed to a positive voltage **/
/** and the HIGH side of the Supply should be wired to **/
/** the reference bus (usually GND) and the LOW side of **/
/** the supply should be wired to the negative supply **/
/** bus. This approach will allow the fixture to be **/
/** used with PS or PVS type supplies. **/
/** **/
/** Common PS / UPS fixture wiring is not possible when **/
/** supplying negative voltages. The wiring must be **/
/** swapped in the fixture when moving between testers **/
/** with different supplies! **/
/*********************************************************/
/************************NOTE******************************
This program uses the following 1 GenRad
power supplies to power up the Unit-Under-Test:
GR Supply Type: PS(1)/SVS1
UUT Power: 5.00 volts, 2.00 amps
Power Nodes: VCC, GND
Power Nails: 383, 249
***********************************************************/
/** First, Declare local variables and System Subroutines **/
DECLARE SYSTEM SYSTYPE(CSTRING TEMP_STRG(8));
DECLARE SYSTEM CONFIG(CSTRING ARG1(8), ARG2, ARG3);
/** Now, Make sure operator cannot ABORT this Subroutine **/
CALL CNTRL_C(CONTROL='OFF'); /* disable control C processing */
/** Get Target Tester Type **/
GET_TARGET_TYPE:
CALL SYSTYPE(TEMP_STRG=GR_TARGET);
WRITE ID=MESFILE'GenRad Target is %S%%NL%'GR_TARGET;
/** Now find out if the tester has Alliance Supplies.**/
/** The variable POWER_TYPE will be set to 0 if the **/
/** target tester has Alliance Supplies, otherwise **/
/** it will be set to the ID of the PS Controller. **/
CALL CONFIG(ARG1='PSC', ARG2=1, ARG3=POWER_TYPE);
/** If the target tester has Alliance supplies, then load
Power Supply Sequence statements...**/
4
IF POWER_TYPE = 0 THEN [
LOAD_PS_SEQUENCES:
/** This section will "load" sequences into the
** Alliance Power Supply controller. Programming
** the Alliance Supplies using Sequences will
** produce the fastest UUT test throughput
** because the test programming statements are loaded
** into the Alliance controller only once, at Run-time
** initialization.
** The purpose of each sequence is:
** SET PS SEQUENCE = 1; Power up the UUT
** SET PS SEQUENCE = 2; Power down the UUT
** SET PS SEQUENCE = 3; Disconnect PS Relays **/
SEQUENCE1:
/** Sequence #1 will TURN ON the power supplies. Supplies
are turned on in the order they appear within the sequence.
Remember, PS supplies cannot be programmed to negative
voltages. Negative voltages are obtained by wiring
the HIGH output to the negative supply bus and the LOW
output to the reference bus. **/
SET PS START SEQUENCE = 1;
SET PS(1) V=5 I=2.00 ;
SET PS END SEQUENCE = 1;
SEQUENCE2:
/** Sequence #2 TURNS OFF the power supplies. Supplies
are powered down in the opposite order in which they
were powered up. **/
SET PS(1) V=0.0 I=2.00;
SEQUENCE3:
/** Sequence #3 DISCONNECTS the power supply relays.
It must be preceded by a call to sequence 2 and a
call to DISCHARGE_POWER to ensure that the power nodes
are completely discharged prior to disconnecting
the relays. **/
SET PS(1) DISCONNECT;
]; /* End of IF POWER_TYPE = 0 conditional */
/** Finished Initialization, enable control-C processing **/
CALL CNTRL_C(CONTROL='ON');
END SUBROUTINE PROGRAM_INITIALIZATION;
SUBROUTINE PWRUP();
/** This Subroutine is called to Power-up the UUT **/
5
DECLARE VVAL1;
TEST_FOR_POWER:
/* Do not execute this Subroutine if UUT is already
powered up! */
IF UUT_POWER_STATUS = 'ON' THEN RETURN;
PWRON:
CALL CNTRL_C(CONTROL='OFF');
/* disable control C processing */
WRITE 'POWER UP FOR DIGITAL TESTING%NL%';
NOLOG; /* disable logging during power up */
SET PIO(0) HRLY(CLOSE 3); /* GROUND THE PCB */
CHECK_ID:
/* Branch to Alliance or Non-Alliance power-up
statements based on tester power configuration. */
IF POWER_TYPE > 0 THEN BRANCH NA_PWRUP;
ELSE BRANCH A_PWRUP;
NA_PWRUP:
/* This section contains power up statements for
testers with Non-Alliance power supplies. */
SVS_CONNECT_RELAY: /* CONNECT SVS TO UUT, Required on 2282 Only */
IF GR_TARGET = '2282' THEN SET PIO(0) HRLY(CLOSE 7);
SVS1_ON:
SET SVS(1) VB DLY=50M
[
WRITE 'SVS(1) OVERLOAD. CURRENT LIMIT FAILURE.%NL%';
BITSET(FAIL,6);
RETURN;
];
GO_TO_TEST:
/* Now that the Non-Alliance Supplies have been programmed,
branch to measure the supply voltages. Skip the Alliance
power-up section.
*/
BRANCH TEST_POWER;
A_PWRUP:
/* This section calls the Alliance Power Supply
Sequence that will turn on the PS Supplies.
To understand what power supply commands are
executed by each Sequence, refer to the
Sequence definitions in the PROGRAM
INITIALIZATION Load Subroutine.
*/
/*** POWER UP SEQUENCE ***/
PS_ON: /* Turn on UUT Power Supplies...*/
/* Turn on the Alliance power supplies...*/
6
SET PS SEQUENCE = 1;
TEST_POWER:
/** MEASURE OUTPUT VOLTAGE OF ALL POWER SUPPLIES AT THE UUT **/
POWER1: SET SCAN AT(383:249);
SET MUX AT(CHA=DCMVHI:CHB=DCMVLO);
/* Connects Voltage Meter */
MEAS DCV INTO VVAL1 MAX=5.00 VAL=5.00 TOL=5 RDLY=2M FAIL(6)[
IF POWER_TYPE > 0 THEN SUPPLY_NAME='SVS(1)';
ELSE SUPPLY_NAME='PS(1)';
LET SUPPLY_SETTING='5.00 VOLT';
BRANCH PWR_FAIL;
];
CLEAR MUX; CLEAR SCAN;
PWRUP_DONE:
/* If program gets here, then power up is OK. */
BRANCH PWROK;
/****************************************************/
/** IF any power supply voltage measurement FAILs, **/
/** generate diagnostic message and ABORT testing. **/
/** If power is OK, Branch to PWROK. **/
/****************************************************/
PWR_FAIL:
WRITE ID=MESFILE'%NL% %NL%';
WRITE ID=MESFILE '%037%%S%%NL%%036%UUT %S% SUPPLY
FAILED.%NL%'
SUPPLY_NAME,SUPPLY_SETTING;
WRITE ID=MESFILE'VOLTAGE WAS %F%V. %NL%'VVAL1;
WRITE ID=MESFILE'TESTING ABORTED. %NL% %035%%NL%';
PWROK:
CLEAR MUX;
CLEAR SCAN;
LET UUT_POWER_STATUS = 'ON';
LOG; /* re-enable logging */
/* enable control C processing */
END SUBROUTINE PWRUP;
SUBROUTINE PWRDN(); /* POWER DOWN ROUTINE */
/** This Subroutine is used to turn UUT Power off. **/
/** If power is already off, then don't execute this subroutine! **/
IF UUT_POWER_STATUS = 'OFF' THEN RETURN;
PWRD:
CALL CNTRL_C(CONTROL='OFF'); /* disable control C processing */
/* Determine whether to execute Alliance or Non-Alliance
power-down statements.
*/
7
IF POWER_TYPE > 0 THEN BRANCH NA_ZERO;

ELSE BRANCH A_ZERO;
NA_ZERO:
/*** PROGRAM NON-ALLIANCE POWER SUPPLIES TO ZERO VOLTS ***/
SVS1_OFF:
SET SVS(1) OFF;
/** Now that Power is turned off - Discharge any
capacitive voltage on the power nodes... **/
CALL DISCHARGE_POWER();
BRANCH OPEN_NA_RELAYS;
A_ZERO:
/*** PROGRAM ALLIANCE POWER SUPPLIES TO ZERO VOLTS ***/
PS_OFF:
/** Now that Power is turned off - Discharge any
capacitive voltages on the power nodes... **/
CALL DISCHARGE_POWER();
/* Branch to open the Non_Alliance power supply relays...*/
BRANCH OPEN_A_RELAYS;
OPEN_NA_RELAYS:
/**********************************************************/
/* CAUTION: */
/* */
/* The next several test statements open "connect relays" */
/* for testers with Non-Alliance power supplies. */
/* */
/* Please make sure the board is DISCHARGED before these */
/* relays are opened. */
/* */
/**********************************************************/
SVS1_OPEN:
CLEAR SVS(1);
/* ISOLATION RELAY SVS IN SLOTS 1-3 */
IF GR_TARGET = '2282' THEN SET PIO(0) HRLY(OPEN 7);
BRANCH PWRDN_MSG;
OPEN_A_RELAYS:
/* Disconnect the Alliance power supply relays. Please make
sure UUT voltages are discharged before executing the
following test programming statements. UUT power voltages
can be discharged by calling the DISCHARGE_POWER subroutine. */
PS_OPEN: /** Disconnect Alliance Supplies...**/
PWRDN_MSG:
WRITE'POWER REMOVED FROM PC BOARD.%NL%%NL%';
SET PIO(0) HRLY(OPEN 3); /* GND RLY */
8
LET UUT_POWER_STATUS = 'OFF';

/* enable control C processing */
END SUBROUTINE PWRDN;
SUBROUTINE DISCHARGE_POWER();
/**********************************************************/
/** This discharge routine will remove any existing **/
/** capacitive voltage from the UUT prior to test **/
/** completion and opening of the power supply relays. **/
/** **/
/** NOTE: In some instances, the UUT should have **/
/** its capacitive voltage discharged at the **/
/** start of the test program. **/
/**********************************************************/
/** Declare variables local to this Subroutine **/
DECLARE CNT;
DECLARE VVAL3;
NOLOG; /* Turn off Logging during this Subroutine */
DISCHARGE1:
SET SCAN AT(383:249); /* Connect Scanner to Power nodes */
SET MUX AT(CHA=DCMVHI:CHB=DCMVLO); /* Connect Voltage Meter */
MEAS DCV DCM INTO VVAL3 MAX=60; /* Measure Voltage */
IF ABS(VVAL3) < 10 THEN
[
/* Absolute Voltage <10V. Use 10 ohm Resistor to Discharge
*/
IF GR_TARGET = '2282' THEN SET STM RLY(27,47,48);
ELSE SET STM RLY(1,2,21,23);
];
IF ABS(VVAL3) >= 10 THEN
[
IF ABS(VVAL3) <= 60 THEN
[
/* Absolute Voltage >10V and <60V. Use 82 ohm STM Resistor */
IF GR_TARGET = '2282' THEN SET STM RLY(23,47,48);
ELSE SET STM RLY(1,2,18,20);
];
ELSE
[
WRITE ID=MESFILE 'WARNING: MEASURED VOLTAGE ACROSS
383:249 > 60V!%NL%';
WRITE ID=MESFILE 'DISCHARGE VOLTAGE USING FIXTURE
RESISTOR!%NL%%NL%';
];
];LET CNT=0; /* Set Counter to 0 */
9
DSCHG_M1:
MEAS DCV DCM INTO VVAL3 HI=+.05 LO=-.05 DLY=50M MAX=50
FAIL()
[
LET CNT=CNT+1;
IF CNT<100 THEN BRANCH DSCHG_M1;
IF POWER_TYPE > 0 THEN LET SUPPLY_NAME='SVS(1)';
ELSE LET SUPPLY_NAME='PS(1)';
WRITE ID=MESFILE 'FAILED TO DISCHARGE %S%%NL%' SUPPLY_NAME;
WRITE ID=MESFILE 'POWER NODE=VCC, REFERENCE NODE=GND%NL%';
WRITE ID=MESFILE 'MEASURED %F%%035%%NL%%NL%' VVAL3;
];
DSCHG_CLR1:
CLEAR MUX; CLEAR STM; CLEAR SCAN;
LOG; /* Turn on Logging again */
END SUBROUTINE DISCHARGE_POWER;
Practice using the Power Editor, generate the test program and
fixture data, and then release the fixture reports.
1. Select Power Supply Editor from the toolbar.
2. Load System Configuration as 2286sys.
3. Load Circuit Data (IDD).
4. Enter required information: +5 Volts, 2 Amps, PS1.
5. Generate a Power Test Program and FWI file.
6. Review program and report.
Generating a Test Program

After completing this module, you should be able to:
Generate a test program (TPG).
Describe the purpose of each of the files used as input by ATG
and each file generated by ATG.
Describe how the ATP, DTP, HTP, and BTP files are
generated.
Use ATO to modify the ATG processing.
Merge ATP, DTP, PTP, HTP and BTP files to create the TPG.
10
ATG Input Filename

AtoWithTemporaryNails
Contains
Test program statements, routines and
instructions for ATG to customize the test
program.
11
AtgInternalWork
Circuit Description file that has been

compiled into a machine usable format.
IddWithTemporaryNails
Component pin data, temporary node lists
and Driver/Sensor Data.
PowerTestProgram
Power test data which can be translated
and run on the system to check power
node wiring and voltages being applied to
the UUT.
ATG Output Filename
Contains
AnalogTestProgram
Analog Test Program created by ATG to

test analog components.
DigitalTestProgram
Digital Test Program created by ATG to
test Digital components.
HybridTestProgram
Hybrid Test Program created by ATG to
test Hybrid components.
BscanTestProgram
Boundary Scan Test Program created by
ATG to test Boundary Scan components.
TpgWithTemporaryNails
Source test program that combines the
results of all test program files.
AnalogAtgResults
Result data for all analog components
tested, showing libraries used and problems
generating test.
DigitalAtgResults
Result data for all digital components
generating test.
HybridAtgResults
Result data for all hybrid components
generating test.
BScanAtgResults
Result data for all boundary scan
components tested, showing libraries used
and problems generating test.
MergeResults
Combined results of all message files.
Practice using the ATG Monitor Page, generate the test program
files, and review files.
1. Set up and run ATG Step 2.
2. Review the importance of all generated files.
In-circuit Test Fixtures

Describe different types of fixtures.
Determine which type of test fixture should be built based on
manufacturing needs and cost factors.
12
Choose a fixture vendor from GenRads current vendor list.

Understand the process used for building a test fixture.
Understand how to attach a test fixture to the receiver and
attach the UUT to the test fixture.
Describe the tools and the process used to verify that the
fixture functions properly.
Each different printed circuit board requires its own test fixture.
You have 2 options in developing your fixture:
Buying an assembled test fixture from a fixture
manufacturer.
Assembling a fixture from a kit purchased from a fixture
manufacturer. GenRad does not recommend building your
own fixture unless you have a precision drill machine.
Most users purchase an assembled fixture from a fixture
manufacturer.
Nails are assigned to UUT test points without regard to
physical nail and testpoint locations
Advantages: does not require UUT testpoint X-Y data. Uses
the minimum number of D/S boards.
Disadvantages: debug and ECOs are may take more time.
UUT test points are assigned to nails which are as close as
possible.
Advantages: greater measurement accuracy and easier digital
debug and ECOs. Fewer wires must be added during debug.
Disadvantages: more D/S boards are required.
Nails are in direct contact with the interface board.
Advantages: high signal integrity, low maintenance,
minimal debug, physically smaller. Higher degree of
uniformity between fixtures.
Disadvantages: ECOs are not easy to implement and fixtures
13
are somewhat more expensive, except when you are having

multiple identical fixtures built.
Two types of Opens Xpress fixture hardware
OFM board is located on the fixture overclamp and is
connected to the interface board with a ribbon cable.
Opens probes are placed directly over the device under test
and connected to the OFM board by a wire.
The Buffer/MUX type fixture has the Buffer board mounted
on the overclamp connected to the Mux board with a ribbon
cable.
The Mux board is mounted on the interface board.
Opens probes are placed directly over the device under test
and connected to the Buffer board by a wire.
Composed of two separately controlled sides.
Allows placement of two boards on the fixture.
Made to work in conjunction with the specific type of
handler you have.
Used in automated production lines
Two different length nails used. One set of nails makes
contact in only one position, the other set of nails makes
contact in both positions.
Use to disconnect nails from sensitive circuits on the UUT.
Made to test many boards built in a panel, all at one time.
14
Generating Fixture Data

Describe how the Nail Assignment Monitor Page works.
Use the Nail Assignment Monitor Page to assign permanent
nails and generate the fixture reports.
Describe the purpose of and interpret the sections of each
fixture report.
Use the Translate Monitor Page to generate an object code,
which verifies that no MUX conflicts exist.
Generates all of the reports necessary to produce the UUT
fixture.
Assigns target nails to the test program files if necessary.
Generates a FixtureTestProgram file for verifying the fixture.
15
Generates reports.
Translate generates an object code and symbol table.
The Power Test Program and Fixture Test Program can also be
translated and run as stand-alone tests.
Allows you to specify how to assign permanent nails to your test

program.
Performs the most compact and efficient assignment of nail
resources.
Performs a geographic nail assignment for use with short-wire
fixtures.
Report
FixtureAtgResults
FixtureTestProgram
Contains
Fixture section of the
AnalogTestReport file.
Program generated to check that
16
each nail in the fixture makes

proper contact.
NailAssignmentListing
Lists errors and warnings found
during Nail Assignment.
NailAssignmentReport
All Nail Assignment information
sorted by assigned nail.
NailContactList
A one line description of each nail
and its connection information.
NailFixtureReport
Nail information in a fixture
wiring format.
NailWireLength
Output report generated for short
wire nail assignment.
NailDatabase
Temporary nail mapping to actual
nails, sorted by temporary nail
number.
/* Target system: 2286 Adaptor: 2286 */
/* atg.exe__40 t1 8-NOV-96 10:31 PAGE 1.1 */
/* FIXTURE VERIFICATION TEST PROGRAM */
DECLARE BSTRING FAIL(1);
DECLARE CSTRING YN(1);
ORG: WRITE '%033%H%033%J';
WRITE 'DO YOU HAVE A FIXTURE SHORTING PLATE ( Y OR N ) ? ';
READ '%S%' YN;
IF YN='Y' THEN BRANCH TSTOPEN;
IF YN='N' THEN BRANCH TSTSHRTN;
WRITE '%033%H%033%JPLEASE ANSWER "Y" OR "N"';
DELAY 1.5;
BRANCH ORG;
TSTOPEN:WRITE '%033%H%033%J';
WRITE 'PRESS START/CONTINUE WHEN THE SHORTING PLATE IS PROPERLY';
WRITE ' MOUNTED.%NL%';
READ '%S%' YN;
TEST OPENS DISJ AT(1-124,129-132,137-140,145-148,153-156,161,162,
169,170,177,178,185,186,193)
[WRITE '%NL%%NL%TSTOPEN ';
WRITE 'FIXTURE FAILURE ........ SEEK ASSISTANCE';
BRANCH DONE;];
WRITE 'PRESS START/CONTINUE WHEN THE SHORTING PLATE IS';
WRITE ' REMOVED.%NL%';
READ '%S%' YN;
BRANCH TSTSHRT;
TSTSHRTN:WRITE '%033%H%033%J%NL%';
WRITE 'REMOVE UUT OR SHORTING PLATE FROM FIXTURE IF';
WRITE ' PRESENT.%NL%%NL%';
WRITE 'PRESS START/CONTINUE TO RUN FIXTURE SHORTS TEST. ';
17
READ '%S%' YN;

TSTSHRT:TEST SHORTS AT(1-124,129-132,137-140,145-148,153156,161,162,169,170,177,178,185,186,193)
[WRITE '%NL%%NL%TSTSHRT ';
WRITE 'FIXTURE FAILURE ........ SEEK ASSISTANCE';];
DONE: WRITE '%NL%%033%Y%067%%040%*** TEST COMPLETED *** ';
WRITE 'PRESS START/CONTINUE TO REPEAT THIS PROGRAM';
END;
GENRAD 2286 TEST LANGUAGE TRANSLATOR
USER OPTIONS:
CONFIGURATION FILE: C:\GenRad\228X\config\2286sys
GENERAL WARNINGS ARE NOT DISABLED
TARGET ANALOG SUBSYSTEM IS NON_ICA
IDENTIFY ICA ONLY TESTS WITH ERRORS
programs\FixtureTestProgram
THU 07-NOV-96 13:27:41
BEGINNING SYNTAX PASS FOR programs\FixtureTestProgram

BEGINNING OBJECT CODE GENERATION PASS
GENRAD 2286 TEST LANGUAGE TRANSLATOR tlc.exe__40
***TESTS THAT WILL ONLY EXECUTE ON ICA TESTERS: 0
TRANSLATION ERRORS: 0
TRANSLATION WARNINGS: 0
2286 NAIL ASSIGNMENT IN PROGRESS
Target Machine: 2286
Software ID: nas.exe__40
Mode: NEW
Board Name: board1
Date: 07-NOV-96 13:27:06
Process: Copying Input TPG File
Process completed: 0 errors detected
0 warnings detected
Process: Creating Nail Record File (.VPN)
0 warnings detected
Process: Creating Nail Assignment File (.VPR)
0 warnings detected
Process: Mapping old nails to new
0 warnings detected
Process: Creating Nail Database File (.NDB)
18

0 warnings detected
Process: Updating TPG File
0 warnings detected
Process: Copying Input CKT File
0 warnings detected
Process: Updating CKT File
0 warnings detected
Process: Copying Output CKT File
0 warnings detected
Process: Creating Nail Fixture Report File (.NFR)
0 warnings detected
Process: Creating Nail Assignment Report File (.NAR)
0 warnings detected
Process: Creating Nail Connection Report File (.NCL)
0 warnings detected
Process: Updating IDD File
0 warnings detected
Process: Copying Output TPG File
0 warnings detected
NAIL ASSIGNMENT COMPLETED
Cumulative errors: 0
Cumulative warnings: 0
The NailDatabase file can be used to control (customize) how Nail

Assign assigns nails. The NailDatabase file contains the following
sections.
Section
Purpose
%NAILMAP
Specifies actual nails to be used in the test
program and to force nails to specific nodes.
Can also be used to run Nail Assign on a board
that already has a wired fixture.
%NAILLOC
Forces nail assignment to locate a probe under
a particular device pin.
%NAILNOT
Notifies nail assignment not to use particular
nails.
19
%NONAIL
%HIPRIO
%LOPRIO
Specifies nodes from the CircuitDescription

which are not going to be nailed.
Specifies high priority nodes for short wires.
Specifies low priority nodes for short wires.
/*
2286 NAIL DATABASE REPORT Page 1
Generated by nas_r_310
Nail Assignment Mode NEW
.TPG Filename sy:demo.tpx
Report Date 16-OCT-95 16:47:27
Report Name sy:demo.ndb
Number of Nails Required by TPG
Clock Drive 2
Clock Sync 1
Fast 188
Nail Range Assigned Requested
Clock Drive 9 - 10 1 - 16
Clock Sync 1 - 1 1 - 8
Fast 1 - 608 1 - 640
-----------------------------------------------------------*/
%NAILNOT;
/* leave free for OX */
F3-F16;
F18-F32;
F609-F640;
%NAILLOC; /* Force Nail Assign to place probes on test
points */
TP32.1 ; TP35.1 ; TP36.1 ; TP38.1 ; TP40.1 ; TP41.1 ;
TP42.1 ; TP43.1 ; TP45.1 ; TP46.1 ; TP47.1 ; TP48.1 ;
TP49.1 ; TP50.1 ; TP54.1 ; TP55.1 ; TP56.1 ; TP57.1 ;
TP58.1 ; TP59.1 ; TP60.1 ; TP61.1 ; TP62.1 ; TP63.1 ;
TP64.1 ; TP65.1 ; TP66.1 ; TP67.1 ; TP68.1 ; TP69.1 ;
TP71.1 ; TP73.1 ; TP75.1 ; TP76.1 ; TP77.1 ; TP78.1 ;
TP79.1 ; TP80.1 ; TP81.1 ; TP82.1 ; TP84.1 ; TP85.1 ;
TP86.1 ; TP87.1 ; TP89.1 ; TP90.1 ; TP92.1 ; TP94.1 ;
TP95.1 ; TP96.1 ; TP97.1 ; TP98.1 ; TP99.1 ; TP100.1 ;
/*Section of code deleted for this sample file. */

TP270.1 ; TP271.1 ; TP272.1 ; TP273.1 ; TP274.1 ; TP275.1 ;
TP276.1 ; TP278.1 ; TP279.1 ; TP280.1 ; TP281.1 ; TP284.1 ;
TP285.1 ; TP286.1 ; TP288.1 ; TP289.1 ; TP290.1 ; TP291.1 ;
TP292.1 ; TP293.1 ; TP294.1 ; TP296.1 ; TP297.1 ; TP298.1 ;
TP300.1 ; TP1.1 ; TP2.1 ; TP3.1 ; TP4.1 ; TP5.1 ; TP6.1 ;
TP7.1 ; TP8.1 ; TP9.1 ; TP10.1 ; TP11.1 ; TP12.1 ; TP13.1 ;
TP14.1 ; TP15.1 ; TP16.1 ; TP17.1 ; TP18.1 ; TP19.1 ;
20
TP20.1 ; TP21.1 ; TP22.1 ; TP173.1 ; TP169.1 ; TP151.1 ;

TP153.1 ; TP155.1 ; TP156.1 ; TP157.1 ; TP158.1 ; TP159.1 ;
TP160.1 ; TP161.1 ; TP162.1 ; TP163.1 ; TP165.1 ; TP167.1 ;
%NAILLOC; /* Shows temporary to target nail maping */
+TP115.1 <- CD9; +TP122.1 <- CD10; +TP129.1 <- CS1;
+TP87.1 <- F249; +TP77.1 <- F383; +TP122.1 <- F104;
+TP141.1 <- F119; +TP233.1 <- F298; +TP234.1 <- F329;
+TP236.1 <- F345; +TP225.1 <- F410; +TP114.1 <- F71;
+TP118.1 <- F55; +TP112.1 <- F79; +TP239.1 <- F130;
+TP270.1 <- F49; +TP269.1 <- F42; +TP296.1 <- F241;

+TP264.1 <- F353; +TP237.1 <- F258; +TP261.1 <- F290;
+TP2.1 <- F52; +TP18.1 <- F511; +TP151.1 <- F17;
+TP17.1 <- F400; +TP163.1 <- F505; +TP257.1 <- F337;
+TP10.1 <- F463; +TP159.1 <- F489; +TP43.1 <- F544;
+TP158.1 <- F473; +TP16.1 <- F447; +TP13.1 <- F416;
+TP155.1 <- F426; +TP161.1 <- F442; +TP11.1 <- F432;
+TP98.1 <- F479; +TP156.1 <- F457; +TP103.1 <- F456;
+TP223.1 <- F402; +TP253.1 <- F306;
/*
TEMP NAIL NUMBER -> ASSIGNED NAIL NUMBER Page: 8
----------------------------------------------------*/
%NAILMAP 2286 NEW;
CD1-> CD9 ;
CD2-> CD10 ;
CS1-> CS1 ;
F1-> F249 ;
F2-> F383 ;
F3-> F104 ;
F4-> F119 ;
F5-> F298 ;
F6-> F329 ;
F7-> F345 ;
F10-> F410 ;

F38-> F495 ;
F39-> F577 ;
F40-> F536 ;
F41-> F520 ;
F42-> F545 ;
F43-> F567 ;
/*
----------------------------------------------------21
*/
F44-> F375 ;
F45-> F183 ;
F46-> F65 ;
F47-> F170 ;
F48-> F177 ;
F49-> F138 ;
F50-> F279 ;

F93-> F145 ;
F94-> F210 ;
F95-> F233 ;
F96-> F328 ;
/*TEMP NAIL NUMBER -> ASSIGNED NAIL NUMBER Page: 10
------------------------------------------------------*/
F97-> F185 ;
F99-> F169 ;
F100-> F218 ;
F104-> F186 ;
F105-> F305 ;
F106-> F97 ;
F107-> F225 ;
/*Several pages of code deleted for this sample file. */

/*
------------------------------------------------------*/
F273-> F442 ;
F274-> F432 ;
F276-> F479 ;
F278-> F457 ;
F279-> F456 ;
F280-> F402 ;
F281-> F306 ;
22
No .OBC file is produced when errors are detected. Translator

reports errors in test statements that contain ICA-specific
parameters.
Select the ERRORS option if the program is to be run on both
ICA and Non-ICA systems.
.OBC file is produced. Translator reports warnings in test
statements that contain ICA-specific parameters.
Select the WARNINGS option when you want to know if a test
program will run on Non-ICA systems.
Translator does not report errors or warnings related to ICAspecific
parameters.
Select the NEITHER option when you want the test program to
run only on the ICA testers.
Translation takes place after nail assignment.
Converts a readable source language test program into machine
readable binary files.
Generates listing files applicable to the MergedTestProgram.
Reports
ObjectCode
Contains
Binary version of the
23
MergedTestProgram.
Binary file the tester uses to test the
fixture.
SymbolTable
Binary file with pointers to labels and
variables used for modifying or
debugging the test set.
FixtureSymbolTable
Binary file containing pointers to
labels and variables used for
modifying or debugging the fixture.
TranslatorListing
Error and warning messages
concerning Language statements,
syntax and nail assignment conflicts.
FixtureObjectCode
GENRAD 2286 TEST LANGUAGE TRANSLATOR

USER OPTIONS:
CONFIGURATION FILE: C:\GenRad\228X\config\2286sys
GENERAL WARNINGS ARE NOT DISABLED
TARGET ANALOG SUBSYSTEM IS NON_ICA
IDENTIFY ICA ONLY TESTS WITH ERRORS
programs\MergedTestProgram THU 07-NOV-96 13:29:53
BEGINNING SYNTAX PASS FOR programs\MergedTestProgram
BEGINNING OBJECT CODE GENERATION PASS
GENRAD 2286 TEST LANGUAGE TRANSLATOR tlc.exe__40
***TESTS THAT WILL ONLY EXECUTE ON ICA TESTERS: 0
TRANSLATION ERRORS: 0
TRANSLATION WARNINGS: 0
This step allows you to select the files required by the

manufacturer to build the test fixture.
24
Also NailWireLength for Short Wire Fixtures Only.

Also CAD drill files, if available.
When receiving a fixture from a contract manufacturer, use this
checklist to verify that it functions properly.
Step
Action
1.
Look for visible damage.
2.
Mount the fixture and check for vacuum leaks.
3.
Run a shorts test.
4.
Run a contact test.
5.
Verify that all specified requirements are met.
Practice using the Nail Assignment and Translate Monitor Pages,

generate the fixture data and reports, and then select the fixture
reports for release.
1. Set up and run Nail Assignment.
2. Review reports.
3. Run Translate.
4. Select reports for release to a fixture vendor.
Debugging a Test Program

Describe how component failures and messages are coded.
Use the debugging process to assist you when debugging a test
program.
Describe the purpose of each debug tool.
Use the ALLFAULT command to generate a detailed fault
coverage report.
25
Debug analog component tests using the analog debug

commands.
Debug digital component tests using the digital debug
commands.
Insert debug changes into the test program using the update
utility.
A failure occurs when the measured value of a component does not
meet its given specification or when a test statement cannot be
performed as specified.
When a test statement fails, the fail vector is first set, unless you
explicitly inhibit it. Then failure reporting options are performed
(message assignments and subroutine execution). Finally, the
error-command is executed if one is specified.
Analog component tests can fail for any of the following reasons.
A tested value is outside the set limits.
The requested measurement is not made because of
unanticipated UUT behavior. This can include problems such
as a current source operating in voltage compliance or current
limiting of a voltage source.
The requested measurement is not made because the test
system malfunctioned.
Digital tests can fail for reasons similar to analog test failures.
Digital test(s) commonly fail because a component output pin
did not reach the expected logic state.
Analog Test Failure and/or Digital Test Failure reasons
The FAIL vector must be DECLAREd as a bit string variable at
the start of the test program.
At that time, all cells (bits) in the vector are reset to zero.
Do not use the FAIL vector in a LET statement, it may change
the FAIL settings, resulting in erroneous operations.
The FAIL( ) parameter in an instrumentation statement
prevents that statement from having any effect on the FAIL
26
vector.
If FAIL(n) is omitted from an instrumentation statement,
FAIL(1) is assumed.
Failures occurring during the test program typically set bits
within the FAIL BSTRING.
The program fails if any bits in the FAIL BSTRING remain set
at the end of the test.
When a test statement fails, the specified FAIL vector bit is set
to 1, unless you explicitly inhibit it.
At the end of the program, if any FAIL vector bit remains set,
the FAIL message is displayed. Otherwise, the PASS message is
displayed.
Setting/clearing fail bits have no effect on failure processing.
FAIL bits 1 - 100 are reserved for GenRad tests. User generated
tests should use FAIL bit 100.
FAIL bits can be interrogated and custom diagnostics printed
based on which FAIL bits are set.
DECLARE BSTRING FAIL(m);
|
TEST/MEAS ----- FAIL(n)-----;
Argument
Description
Command keywords for instrumentation statements.
Keyword for FAIL vector bit string.
Maximum number of cells (bits) in the FAIL vector.
Must be DECLAREd at the start of the program.
Number of the FAIL cell that is set if the
instrumentation statement fails. If FAIL(n) is :
- Omitted from the statement, FAIL(1)
is assumed.
- Specified, execution of the statement has no effect
on
the FAIL vector.
TEST/MEAS
FAIL
(m)
(n)
TEST DCI DCS FAIL(7);
FAIL bit 7 is set if the current source cannot supply enough voltage
27
to force the current for which the DCI is programmed, that is,
voltage compliance error. Because a fail bit is set, the FAIL indicator
is turned on at the end of the program.
TEST DCI DCS [BRANCH CURRENTERR;];
The default FAIL bit 1 is set if the current source is not in voltage
compliance. If this occurs, the FAIL indicator is turned on at the
end of the program. In addition, a branch to the label
CURRENTERR is taken.
TEST DCI DCS FAIL( );
No FAIL bit is set even if the current source is not in voltage

compliance. A FAIL(null) can be included in an instrumentation
statement as shown here to inhibit a test failure from causing the
program to fail. The test failure is masked, and the FAIL indicator
remains off.
TEST DCI DCS FAIL(7);
IF FAIL(7) THEN BRANCH N30;
If the current source is not in compliance, set FAIL bit 7. Test the
status of FAIL bit 7 by means of the IF-THEN-ELSE statement. If
FAIL(7) is set, indicating a failure, branch to N30.
IL(27) OS(156) OL(156) FAIL(156);
FAIL bit 156 is set if nail 156 is not low at the above digital test
statement.
Failure-reporting options are user-defined routines and
messages.
Specify which failure-reporting options are used when an
instrumentation statement fails.
Can be specified as parameters within individual
instrumentation statements or can be predefined with a USE
statement.
System test devices supported include: DCS, DCM, ACZ, RM,
ARITH, CONTACT, SHORTS, OPENS, and BURST.
The routines have access to special diagnostic variables defined
by the system when an instrumentation statement fails.
System failure variables do not need to be declared.
Variables cannot be read into by an I/O instruction or by the
TEST/MEAS statement INTO parameter, and they cannot be
assigned a LET statement value.
28
These variables can be tested as part of the IF condition in an

IF-THEN-ELSE statement.
At the start of test program execution, the values of all failure
options and variables are reset; that is, character-string variables
are set to nulls and floating-point variables are reset to zeros.
These options and variables may then be assigned values for
individual instrumentation statements by including the options
as parameters in each statement.
The USE statement defines the default options for all
subsequent FAILed statements; that is, instrumentation
statements without explicit failure parameters revert back to the
failure options specified by the most recent USE statement.
When explicit failure parameters are used in a statement, the
options specified by those parameters apply only to that
statement.
MEAS R INTO RVAL . . . . . FSUB=FAILSUB DMSG=NOMINAL;
USE FSUB=FAILSUB DMSG=NOMINAL;
NOFSUB
FSUB=name-of-routine
PMSG=user-part-message
DMSG=user-diagnostic-message
CMSG=user-component-message
Inhibits the calling of subroutine FSUB in the event of a failure

in an instrumentation statement.
Used to replace a [CALL subroutine] error-command in an
instrumentation statement.
If the statement fails, the FAIL bit, if specified, is set; then the
failure routine is invoked.
If an [error-command] is specified, it is executed after
completion of the failure routine.
Failure routines must be DECLAREd, the same as any other
subroutines, but they cannot have an argument list.
Instead, they obtain information about the failure from special
system failure variables.
29
These user-defined messages are available to the failure

routines.
Each text string message can be up to 80 characters and, may be
specified in a USE statement or as a parameter in an
instrumentation statement.
Test strings do not adhere to the formatting rules for other
WRITE statements.
For a single percent character (%) to appear as text, use %045%
(octal 045). Do not use %% to represent a single % character, in
user-defined messages, as both percent symbols appear in the
message.
Argument
FTYPE
Description
Two-character string indicating the component type
tested/measured in the last FAILed statement.
R
V
Resistance
Voltage
Current
RP
Parallel Resistance
RS
Series Resistance
CP
Parallel Capacitance
CS
Series Capacitance
LP
Parallel Inductance
LS
Series Inductance
XP
XS
ZM
Parallel Reactance
Series Reactance
Impedance Magnitude
QQ
Quality = XS/RS = RP/XP
DD
Dissipation = RS/XS = XP/RP
VS
Voltage Source (TEST DCS DCV)
IS
Current Source (TEST DCS DCI)
AR
Arith (TEST ARITH)
DG
FSTAT
Digital
Indicates the status of the test results for the last FAILed
instrumentation statement
*LOW
Measured value was low
*HIGH
Measured value was high
*FAIL
Measurement failure
#ERR
Testing error occurred
FLABEL
Label associated with last FAILed instrumentation statement,

that is, the last label or subroutine used before the failure.
30
FDMSG
DMSG associated with the last FAILed instrumentation

statement.
FPMSG
PMSG associated with last FAILed instrumentation

statement.
FCMSG
CMSG associated with the last FAILed instrumentation

statement.
FMEAS
Measured value from the last FAILed instrumentation

statement.
FHI
HI limit value (if available) from the last FAILed

instrumentation statement, or some value greater than 1.0E30
(to indicate that no HI limit is available).
FLO
LO limit value (if available) from the last FAILed

instrumentation statement, or some value less than -1.0E30
(to indicate that no LO limit is available).
Failure messages and current values of the failure variables can be

written to the system message file (MESFILE).
WRITE data ;
WRITE ID=MESFILE data ;
Specifies the I/O channel for the system message file, which is
defined by the MESsage option on the DIAGNOSE monitor
page.
This MESFILE channel should not be explicitly OPENed or
CLOSEd. The MESFILE device, STRIP_PRINTER, CRT, or
FILE, is determined by the DIAGNOSE page Messages to field.
DECLARE FAILSUB( );
SET MUX AT (6:6:8:8:REF=5,6,8,11);

USE FSUB=FAILSUB;
/*TEST NAIL 89*/
SET SCAN AT (117:117:89:89);
MEAS R INTO RVAL V=.1 HI=10 MAX=1 CMSG=NAIL 89
DMSG=OPEN FROM 117 TO 89;
/*TEST NAIL 57*/
SET SCAN AT (117:117:57:57);
MEAS R INTO RVAL V=.1 HI=10 MAX=1 CMSG=NAIL 57
DMSG=OPEN FROM 117 TO 57;
/*START RESISTANCE TEST*/

SET MUX AT (6:8:9:10:REF=5,6,11);
USE DMSG=NOMINAL;
/*TEST R6*/
SET SCAN AT (135:134);
MEAS R INTO RVAL V=200M HI=4.9K LO=4.4K CMSG=R6;
31
SUBROUTINE FAILSUB( );
WRITE ID=MESFILE %S% FAILED %S%%S%%NL% FCMSG,FTYPE,FSTAT;
WRITE ID=MESFILE %S% MEASURED:%5G%%NL% FDMSG,FMEAS;
Use the [error-command] construct, also referred to as a fail

bracket, in an instrumentation statement to specify one or more
commands for execution when the statement cannot be performed
or when a test fails.
The error-command may be a simple statement, a single
command, a compound statement, or multiple commands.
For example:
TEST Z LO=550 FAIL(5) [CALL ZFAIL( );];
If the measured impedance is less than 550 , set FAIL bit 5,

then execute subroutine ZFAIL.
The [error-command] construct is useful for reporting powersupply
power-up errors. Power-up errors occur when a UUT
power supply fails to reach a desired value within an allotted
time, or values settle outside of specified limits.
Check for these errors, since test statements associated with the
failed UUT power supply do not execute. Unless specific error
statements are included within a test program, there is no way
to inform the Operator that testing has been halted. If the
Operator is not notified that testing has not been executed, he
may assume the UUT passed all tests and label it good.
Check UUT power-supply power-up errors with errorcommand
brackets included with the command keywords SET,
TEST, and MEAS. Specific requirements are discussed under
each UUT power-supply description in the GR228X Test
Language Reference Manual.
The following command within the error command brackets is
done automatically by the power supply editor.
WRITE ID=MESFILEPOWER SUPPLY FAILURE, TESTING
HALTED%NL%;
By including this message in the system message file, there is no

chance of its being overlooked. UUTs that have not been
thoroughly tested will not be falsely labeled as good. If
desired, modify the above message to include other information
such as the values that caused the failure.
32
A digital test step fails when a sensor detects a logic state

different from the expected state specified by OH or OL. In
addition, the burst is considered to have failed.
Because the digital testing software includes automatic error
reporting, additional error-handling subroutines are usually not
required for digital test bursts. If necessary, the END BURST
statement can include a jump to an error-handling subroutine,
with whatever parameter-passing statements are required.
33
Refer to Appendix A for the Monitor Page filenames.
34
The GR228X system has easy to use debugging tools that can
decrease the time you spend debugging your test programs.
Measuring Fault Coverage (ALLFAULT)
35
Manual Debug using the Diagnose Page - Debug Mode

Program Xplorer
Autodebug
Digital Waveform Display
Array Plot Tool
For details, refer to the GR228X Test Program Debug Manual.
ALLFAULT is a RunTime Debug command that analyzes your
test program and generates a report indicating how effective the test
is at detecting potential faults. The ALLFAULT generated report
can provide
A test summary for each component tested using analog
instruments. Data is derived from running the analog
component tests many times, then reporting the min, max, and
standard deviation of the collected measurements. The flags for
this test can indicate when a test failed, is measuring too close
to a measurement limit, or is unstable from test to test.
Digital Fault Insertion results for all digital components that
are tested within a burst. It also flags device pins that can not
detect open and stuck pin faults.
Results for all test program BUSTEST and FORCE sections.
It flags BUSTESTS that fail and identifies DISABLE and
FORCE sections that have incorrect current measurements.
UUT Fault Coverage Summary section that identifies:
Analog tests that contain problems which should be debugged
Nodes that are missing from the shorts and contact tests
UUT components that are not tested using any technique
Board summary of digital fault insertion results
Digital Bursts that failed and had no fault inserted
Digital Bursts that had faults inserted, but failed during reruns
UUT components tested using the Opens Xpress technique
Bustest statistics information
Use the report to identify tests that may need more debugging,
or identify components that are missing tests, and can be used
to document the test program for other departments.
36
SURROUND Prints the names of all components connected

to the specified nail and lists the nails connected
to the other pins of the component.
COMPONENT Prints to the MES file all interconnect data for
the specified component from the .idd file.
GUARD Adds the specified nail lists to channels C and
GND (in 4 wire mode only).
NAIL or NODE Provides connection information about the specified
NAIL or NODE according to the .idd file.
LOCPIN Provides the NAIL, NODE, and connection
information about the location being probed
(must be run from reset or waiting to test state).
PRINT Prints current screen display to the strip
printer.
AVE Typing AVE enables Run Time System (RTS)
to make an average measurement.
ACCEPT The RTS stores all debug changes by component
label until those changes are either ACCEPTED or
REMOVED. ACCEPTED changes will be
permanently written to the .obc and .dbt files.
ACCEPT ALL Is a valid command.
DISPLAY NODE/DISPLAY NAIL
Enables you to view either node names
or nail numbers while debugging the test
program.
ORDER/PORDER Displays the digital IC timing display by
(PINLIST) NAIL or PIN as listed in the command.
RERUN or <CR> Causes the current test to be executed again.
37
RERUN = n, Reruns the test n times, then gives the

highest, lowest, and average readings.
RUN Executes the test program or continues
executing the next test in the test program.
REMOVE ALL Restores the test program to what it was
prior to the current set of changes that
have been made to the test.
REMOVE Removes only changes made to the current
test program label.
LBLSEL Specifies a BEGIN= label and runs a test.
DEPOSIT Changes the value of the variable to the
value specified.
EXAMINE Displays current value of the specified
variable.
MULTI Toggles digital waveform display window.
PLOT Plots a floating point array.
SOH (Single Output High) senses a nail high in a
digital burst for only the specified test
statement.
STEP Steps through analog test.
Program Xplorer is a graphical debugging tool for analog tests

within the GR228X test program.
38
The Program Xplorer display provides a window environment

that enables you to:
Modify GR228X instrument statements
Determine which nodes surround the Device Under Test (DUT)
Plot measurement readings
View graphical views of mux connections
The Program Xplorer relies on information stored in the
.idd and the .wor files. Both files are created during the Verify
Circuit test step.
Apply/remove guarding with mouse clicks.
Autodebug is a debugging tool that uses the RunTime System

(RTS) to debug your test program without programmer
interaction.
Autodebug performs the actions that you would interactively
perform using RTSs Debug mode.
Autodebug assumes that the test program, not the UUT or
fixture, is the cause for a test that does not pass.
You can edit the Autodebug command file (.ADC) to control
which debug changes are performed.
When you debug a test program using Autodebug, it recognizes
the type of test and applies a sequence of debug commands that
39
attempt to pass the test.

The tasks Autodebug can perform on analog tests include:
Changing the values of analog test parameters
Swapping source and measure
Adding a small delay to adjust the guard set
Modifying instrument parameters
For digital tests that fail or have unknown output states,
Autodebug can:
Initiate the learning of output states
Insert faults using the Digital Fault Insertion (DFI) feature
Most of the debug actions that Autodebug initiates require data
contained in the incircuit diagnostic data file (.idd). Although
an Autodebug session can be performed without an .idd, useful
results generally occur only when an .idd file is supplied.
When you test a digital component using the DIAGNOSE
monitor page set to Debug mode, a waveform display of the
driven and sensed logic states displays.
You can view digital debug information by using
Test statement
Digital waveform
The test system also offers unique debugging features for bursts
that contain CRC collection and indirect addressing statements.
40
Interpreting data in an array often depends on the ability to display

a waveform or part of a waveform and to quickly find what you are
looking for. These are the systems array plotting capabilities.
Capability
Multiple windows
Description
Enables you to display up to 20 plot windows
at a time. Each window has a unique title.
X-Y Coordinates
Uses crosshairs to read X-Y coordinates.
Multiple waveforms in a single window:
Enables you to add waveforms to an existing
window, delete waveforms, lock waveforms,
and hide waveforms.
Window size
Enables you to change the Plot window size.
Waveform attributes
Enables you to select a waveform, change its
color, point size and shape, and the type of
lines it uses to connect points.
Selecting the amount of data to plot:
Enables you to plot an entire array or a
portion of an array (subarray).
Saving, loading, and printing:
Enables you to save data from a plot window
for a future display. You can load previously
saved plot data or print a plot.
Magnification
Enables you to focus (zoom) on a particular
portion of the window.
Log10 mode
Enables you to convert the display of the X or
Y axis on a logarithmic scale.
Scrolling
Enables you to scroll (shift) the waveform
display left, right, up, and down.
Help
Provides on-line help for the plot window.
41
Practice using the Debug tools to debug a test program.

1 Debug the test program in manual debug.
2 Run the Update Monitor Page
3 Retranslate the test program.
Releasing the Test Set to

Manufacturing
Describe the process used to release a test set to manufacturing.
Determine if the test set developed by contract programmers is
acceptable.
Release a test set.
Select, and rename if necessary, the test set files that are
required to run the test program in a production environment.
Windows NT Explorer enables you to select the files you want
released as a test set.
Always include circuit preparation files such as the Circuit
Description (.CKT), program preparation files such as the Test
Program (.TPG), debug files such as the Debug Trace (.DBT),
and all Test Set Libraries when backing up the test set, as
discussed in Module 3.
Release files as <TestSetName>.extension.
Create a production batch file to be used by Manufacturing to
load and run the test program, if desired.
ObjectCode (.OBC)
InCircuitDiagnosticData (.IDD)
NailDataBase (.NDB)
NailContactList (.NCL)
DigitalDiagnostics (.DDF)
42
BoundaryScanLibrary (.BSL)
DeviceProbeReport (.DPR)
PinOpensDiagnostics (.POD)
Message (.MES)
SymbolTable (.SMT)
AtgInternalWork (.WOR)
MergedTestProgram (.TPG)
Debug (.DBT)
DebugTraceOld (.DBO)
SingleBoardTpg (.TPS)
AutomaticTestOptions (.ATO)
CircuitDescription (.CKT)
DigitalTestLibrary (.DTL)
AnalogComponentLibrary (.ACL)
AnalogTestLibrary (.ATL)
HybridTestLibrary (.HTL)
NailAssignmentReport (.NAR)
NailFixtureReport (.NFR)
When receiving a test program from a test program developer, use
this checklist to verify that it functions properly.
Step Action
1.
Check fault coverage on the board.
2.
Look over Allfault report.
3.
Understand what components are not tested and why.
4.
Be sure any specialized tests are performed.
Before releasing files to Manufacturing, ensure programs are
43
error free.
Select files for release.
Back up the test set.
Production Batch
In-Circuit Diagnostic Data
Object Code
Symbol Table
Merged Test Program
Practice releasing the test set to Manufacturing.

1 Select the files you want to release, and then place the files in a
new directory.
Data Logging
and Data Display
Describe the purpose of each data logging option
(Standard, SEL, and RTDC).
Use the Production Test menu within the Preferences Menu to
select the logging options.
Generate a report.
Interpret a Logging file.
Use Data Display to view a report.
Collects data for all components on the UUT.
Amount of test data collected for the components is selected by
the Logging options.
A combination of +PASSES option and LOG page PLOTS
generation is commonly used as a debug tool and is sometimes
44
used as acceptance criteria for Analog tests.

Enables you to select the components you want logged and the
amount of data logged.
Selective logging requires a Selective Options file (.SEL) as
input.
Provides the most comprehensive data collection control.
Can include selectable intervals.
Commonly used in a real-time network environment as it
allows for transfer of Log data at the end of each test run.
RTDC requires a Data Collection Options file (.DCO) as
input.
Option
None
Times
+Fail
+Vals
+Passes
Sel
Function
Logging is disabled. No .LOG file is created or
appended.
Time stamps are recorded for all main events
associated with executing a test program.
Includes the failing label and key for each failed
component. Measured values are not logged.
Includes any measured value for each failed
component. Test limits are not logged.
Includes test limits and any test type for all
tested components. This option also logs No
tests.
Enables selective data logging. It provides you
with more flexibility in logging test data than
other options.
The Report Generator truncates part numbers to 20 characters.

Selective logging does not affect Bustest, ScratchProbe, Contact,
Opens, or Shorts tests; data is always logged for these test
failures.
Select all the logging options needed to generate the LOG
reports before you begin testing the board. For example, all pass
and fail data should be collected when plots are generated.
45
Within digital bursts, the selective logging option treats banks

and NAME = the same:
Passing tests are identified by the bank or burst label.
Failing tests are identified separately by the name of each
individual failing component.
Log File Example File Explanation
SY:BOARD.OBC[09-JAN-91 14:08:17 Program loaded.
@09-JAN-91 14:08:27 Test started.
R1=1.001(0.995,1.005)R =Shunt resistor test. ALL data logged
for passing R1
and message.
R2<123.4KR No limits for failing high R2.
C1>82.02P(90.00P,110.00P)CS Limits included for failing low C1.
C2>87.34PCP No limits for failing low C2.
/09-JAN-91 14:09:58 Failing board test finished.
]09-JAN-91 14:10:10 Program unloaded; return to
Diagnose monitor.
Symbol
Event
Program
Loaded
Action
Load the program by pressing the Load

Key,
or keypad, or Run key on the keyboard at the
DIAGNOSE page.
@ Test Started
Start the test by pressing the start/continue
button on the keypad or Run key on the
keyboard.
Test
Aborted
Abort the test by pressing the Reset key on the
keypad or Control C on the keyboard. After
you abort a test, the system prompts:
Do you wish to cancel the last boards logging
data [Y/N]?
Passing
board test
finished
Test completed with no failures
(vacuum released).
/ Failing
board test
finished
46
Test completed with failures

(vacuum released).
* Error in
test
A test error occurred, such as a voltage source
overload or a current source compliance
condition.
& System
error
A Run-Time System error occurred.
! Test
canceled
Logged test data for last board was ignored.
After a board test is completed, if you decide
that the results should be ignored, press Reset
or Control Y on the keyboard to display the
prompt:
Do you wish to cancel the last boards logging
data [Y/N]?
Entering Y cancels a test entry in the .LOG
file for the previous test. Any other operator
action will retain the logged data. The logged
data not actually deleted, the canceled test
entry enables the Log Report Generator to
disregard the logged data for that board.
] Return to
Diagnose
mode
Unloads the test program
label key value limits type device message
The label is associated with the most-recently executed statement

that had a label. Multiple measurements between program labels
have identical labels.
A key is a one or two-character symbol indicating the result of a test
which include:
Key
=
<
>
#
%
%B
(S
(O
(B
Description
Analog measurement passed
Analog measurement failed high
Analog measurement failed low
No measurement made
Digital test failed
BUSTEST failure caused by an associated IC
SHORTS test failure
OPENS test failure
BUSTEST failure caused by bus
47
(C
(F
~
SCRATCHPROBING connection failure

CONTACT fixture failure
MESFILE delimiter when using real-time data collection
Value refers to the measured value when applicable.

Limits refer to the acceptable high and low test limits when applicable.
Type is a one or two-letter code defining the type of test used to
make the measurement, when applicable.
Type
Associated Test Language Statement
AC
MEAS DVM ACV
AI
MEAS ACI ACM
AR
TEST ARITH
AV
MEAS ACV ACM
AY
MEAS [ DVM | ( DMM [VOLTAGE|CURRENT] )
]
CS
MEAS ACZ CS
CP
MEAS ACZ CP
DC
MEAS DVM DCV *
DD
MEAS ACZ D
EV
FTM EVENT *
HZ
FTM FREQ *
I
MEAS DCM DCI
IS
TEST DCS DCI
LP
MEAS ACZ LP
LS
MEAS ACZ LS
QQ
MEAS ACZ Q
R
MEAS R
RA
FTM RATIO *
RP
MEAS ACZ RP
RS
MEAS ACZ RS
S
FTM PERIOD *
TI
FTM INTERVAL *
V
MEAS DCM DCV
VS
TEST DCS DCV
XS
MEAS ACZ XS
XP
MEAS ACZ XP
ZM
MEAS ACZ Z
IC device type; applicable
Messages are always preceded by an = (equal sign) and are
added at the end of the log file test entry.
You must insert messages for the component in the %VALUE
section of the .CKT file using the MSG=info parameter before
you can log component failure messages.
48
Digital failure messages are taken from the resulting .IDD file
and analog failure messages are taken from the .OBC file.
You can log additional messages if the selective logging option
is chosen and the MESSAGE = text is programmed in the
%COMPONENTS section of the .SEL file.
1 Access the Diagnose Monitor page.
2 Choose Mode=TEST, then choose the desired
Logging = [option]
The other fields may be set to the default.
3 Run the test with a sample lot of boards, GenRad recommends
20-25 board sample lots.
If you cannot use a sample lot of boards, use the gold
debugged board and run the test 20 times. To run the test, enter
at the TEST mode prompt: RUN=20
4 Set up the LOG page as follows:
Mode=GENERATE
Report=PLOTS
Plot=ALL
The other fields may be set to the default.
5 Running the LOG page will create a .REP file.
6 Print the .REP file and analyze the results.
The Selective Logging Control (.SEL) file is composed of three
optional sections:
%Mode
%Format
%Components
Log Option
TIMES
Selective Logging Options Equivalent

%MODE FAILS=NONE PASSES=NONE;
%FORMAT TIMES=YES;
+FAIL
%MODE FAILS=ALL PASSES=NONE;
+VALS
%MODE FAILS=ALL PASSES=NONE;
%FORMAT FAILDATA=LABEL,KEY,DEVICE TIMES=YES;

%FORMAT FAILDATA=LABEL,KEY,VALUE,DEVICE
TIMES=YES;
+PASSES
%MODE FAILS=ALL PASSES=ALL;

%FORMAT FAILDATA=ALL
PASSDATA=LABEL,KEY,VALUE,LIMITS, TYPE TIMES=YES;
/* Set up global data logging options; log fail data for all
49
tests; log pass data for those components listed in the

%COMPONENTS section only (R1, C1, and C2).*/
% MODE PASSES = ONLY FAILS = ALL;
/* Log subset of fail data; log ALL pass data by default;
log time stamps. */
%FORMAT FAILDATA = LABEL,KEY,TYPE,VALUE,DEVICE TIMES = YES
/* Components to log for ONLY
(or not to log for ALLBUT).*/
%COMPONENTS
/* Append a message to the logged test data for R1.*/
R1: MESSAGE = Shunt resistor test.;
/* Override global FAIL data options to
include LIMITS for C1.*/
C1: FAILDATA = LABEL,KEY,TYPE,VALUE,LIMITS;
/* Use global fail data options for C2; all lines in the
%COMPONENT section must be terminated with a semicolon.*/
C2: ;
Log data during specified sampling intervals.

Log data during the intervals between the sampling intervals.
Change Data Collection Options on the fly without operator
intervention.
Select options similar to the Logging options on the
DIAGNOSE page.
Specify failure messages in the log data file, which can include
MESFILE data from the test program.
Generate individual and merged log files.
Create a new individual log file for each test run. You need this
feature for compatibility with the Data Sampling LAST TEST
ONLY and the Command file options.
Specify a user command file that is executed at the end of each
test run. This file can perform any data manipulation you
identify.
50
Time period for which the report was generated

Number of failing, passing, and total boards tested
Total testing, waiting, and elapsed times
Average passing, failing, and actual board test times
Throughput per hour
Total faults and faults per failing board, if failure data was collected
Contains current failure data on a component level in addition
to board-level statistics.
Information includes the total number of failures and faults per
failing board for each failing component.
Generates a failure trend analysis in this mode if you specify the
.LOG and .SUM files to be used in the comparison in the
LOGf = fields. Both current and summary failure data are
reported, and any significant differences in failure rates for a
component are flagged to bring attention to it.
Component plots generate a distribution of test measurements
over a range on the component-level in addition to total number
of failures and board-level statistics.
The range is determined by the component test limits and
measured values for all logged current data. No trend analysis is
performed in this mode.
51
You can generate three types of component plots, using data from:
Good boards only
Component tests that pass regardless of overall board pass
and fail results
All logged test data
Yields of passing and failing boards

Total faults and average faults per failing board
Total elapsed times, consisting of total testing time and total
waiting time
Average board test times: actual time, passing boards test time,
and failing boards test time
Board throughput per hour: actual overall, passing boards, and
failing boards
Failure data on the most frequently failing components
All component failures sorted by failure frequency or component
name
A plot of measured component values showing the distribution
of measurements for good-boards only, all component passes, or
all component measurements
52
The LOG page has two modes:

Create summary reports (.SUM files) from logged data (.LOG
files)
Generate board test reports (.REP files) from log and summary files
Fast report generation
Multi-line color charts
3-D color pie charts
3-D Histogram charts *
Run Chart
User-annotated charts
* Not currently available on Windows NT Testers
Report Name
Description
Tester Yield Report
Provides a graph of tester yields over
time.
Failure Analysis Report Simultaneously plot opens, shorts,
resistors, inductors, capacitors, digital,
and other failure types as a percent of
all failures over the date range you
select.
Trend Analysis Report
Simultaneously plots opens, shorts,
resistors, inductors, capacitors, digital,
and other failure types as an average
per board for the date range you
select.
Test Times Report
Plots the passing board test time
against time.
Passing Board Volume Report:
Operates slightly different from other
reports. The volume must be
53
represented as boards during the time

period.
Failure Analysis Chart Displays either a pie chart or a bar
chart representing the distribution of
various failure types.
Failing Parts/Components Chart:
Graphs the most frequently failing
parts or components and displays
them in either a pie chart or bar chart.
Measured Values Chart Shows how a single analog
component is performing.
54
55
Practice using the Data Logging tools.

1 Open GR228X software.
2 Set up the Log Monitor Page and generate an REP report, using
the following logging file:
12_10.log
3 Review REP report.
4 Open Data Display from the toolbar.
5 Import the above logging file.
6 Generate Component Overview report.
7 Generate Board information reports.
8 Generate Failure reports.
TEST XPRESS Tools Overview

Describe the purpose and function of Junction Xpress, Opens
Xpress, Cap Xpress, and Orient Xpress.
Determine the appropriate testing application for a given test
scenario.
56
The GR228X test system can apply three different test techniques
for detecting and diagnosing device pin defects:
Digital in-circuit test
Junction Xpress test technique
Opens Xpress test technique
NOTE: In many cases, more than one test technique should be
used for a single device. For example, a combination of Junction
Xpress, to detect opens pins defects, and simple digital vectors,
to detect wrong or incorrectly programmed part defects, can
provide better coverage than can be provided by either technique
alone.
57
Works by detecting the responses at the device outputs to

stimulus vectors applied at the device inputs.
Proven, reliable technique.
When used with the Softprobe or Scratchprobe diagnostic
techniques, it is capable of diagnosing open pin faults.
Only technique that can reliably detect wrong or incorrectly
programmed parts.
Requires a model of the DUT. Therefore, it is most useful for
those devices that have models in the library or for a model that
can be automatically generated.
Works by injecting an ac signal into a pin on a semiconductor

device and detecting the effects of that signal at another pin on
the device.
It is a low-impedance measurement technique that is able to
detect solder joint defects that have a higher than normal
resistance (10-50 ohms).
Does not require complex fixture hardware, however, it does
require a reliable low-resistance contact between the UUT and
the fixture.
Preferred technique for testing complex digital parts in certain
types of packages, such as PGAs, BGAs, FLIP CHIPs, MCMs,
PLCC, SOIC, and COB.
58
Works by detecting the coupling of an ac signal by the capacitor

formed by the lead frame of a device and a metal plate adjacent
to the device.
Requires fixture hardware to provide and support connections to
the metal plates. It is a high-impedance technique. Typically, a
solder joint will have to exhibit several hundred thousand ohms
of resistance before a defect will be detected. However, Opens
Xpress is quite insensitive to high contact resistance between
the UUT and the fixture.
This technique can test non-semiconductor parts, such as
connectors, sockets, and bypass capacitors.
Preferred technique for testing complex analog or mixed-signal
parts, such as DSPs, sound generators, and video processors.
59
Junction Xpress Overview

Describe how Junction Xpress tests an IC.
Identify the Junction Xpress hardware and software
requirements.
Use the Junction Xpress Predictor tool to evaluate the usability
of the Junction Xpress test technique.
Test Signals Emanate from PCB Nails.
DC Bias and Detector Applied to one IC Pin.
AC Source Applied to Other IC Pin.
Detector Measures Harmonic Frequencies.
60
Data Compared Against Test Limits.
Detector measures magnitude of harmonic frequencies

10 to 1 difference between good / open IC pin
SCO UNIX or NT system with GR228X Software Release 3.2.0
or greater
Instruments used are either AFTM, ICA, or ATM
Scanner Subsystem
Uses same ICT fixture, requires no special probes
Note: If Junction Xpress is to run on an AFTM module,

instead of an ICA module, three passive components need to be
added to the fixture at the AFTM slot position.
61
A 1 0resistor, with an accuracy rating of 1% or better, rated

for 1/4 W or greater, and with a drift characteristic of +/- 100
ppm per degree C or less.
A 48 kto 52 kresistor, preferably metal film, with an
accuracy rating of 1% or better, rated for 1/8 W or greater, and
with a drift characteristic of +/- 100 ppm per degree C or less.
A 0.01 F capacitor, rated at 1%, with low dielectric absorption
such as polypropylene, polycarbonate, polystyrene, NPO
ceramic, etc.
62
Use the Junction Xpress Predictor Tool (jxpredictor) tool as a

starting point
Use the type UKnn for connectors, sockets and test points in
the .ckt file
RAM banks use vectors or Opens Xpress
Large bus-structured boards with a lot of common signal lines
need unique pins for detectors - unused or no connection signal
pins are ideal for this
Device models you want to test should contain at least a head
section in the .dts defining VCC, GND, INs, OUTs - don't
forget those unused signal pins
Combine Junction Xpress with the other techniques - Opens
Xpress and Digital ICT
Multiple approved vendors of devices may require multiple
63
POLEARNs
Hybrid and Analog are better suited for Opens Xpress
Leadless devices like BGAs, COB, etc. use Junction Xpress
Devices that have a Ground or Power plane can use Junction
Xpress
Available as of GR228X Software release 3.3.1 and currently
available on the web.
Evaluates usability of Junction Xpress test technique
Views the .idd or .idx file
NOTE: Because the predictor tool only examines the .idd or .idx
file for a board and does not make electrical measurements on
an actual board, its conclusions will in some cases differ from
those of the tester-based POLEARN command.
jxpredict idd_file > report_file
idd_file typically .idd or .idx
Report file defaults to screen unless > redirected to a file
report_file
jxpredict boardcpu.idx > boardcpu_jx.rpt
Location of Junction Xpress Predictor

Windows NT c:\genrad\228X\exe
Opens Xpress Overview

Determine the GR228X hardware and software required to use
the Opens Xpress tool.
Identify the fixturing requirements.
Determine which tool (Opens Xpress, Cap Xpress, or Orient
Xpress) will provide the most effective test coverage for your
needs.
64
ICA-only based systems contain an ICA module but not an

AFTM module.
With software release version 3.2.0 (or greater), Opens Xpress,
Cap Xpress, and Orient Xpress supports ICA-only systems.
ICA - only based systems require Opens Fixture - OFM
hardware to conduct Opens Xpress, Cap Xpress, or Orient
Xpress tests.
ICA-only based systems can include the following models:
GR2280, GR2281, GR2283, GR2284, GR2285, GR2286, GR2287,
GR2287L and GR2289.
TEST XPRESS supports AFTM - based systems.

AFTM-based systems can use either Opens Fixture - OFM
65
hardware or Opens Fixture - Buffer/MUX hardware to conduct

Opens Xpress, Cap Xpress, or Orient Xpress tests.
AFTM-based systems can include the following models:
GR2280, GR2281, GR2282, GR2283, GR2284, GR2285, GR2286,
GR2287, and GR2289.
The ATM - based system uses the following modules:
Analog MUX Module (AMM)
Analog Test Module (ATM)
Analog Peripheral Module (APM)
Opens Xpress, Cap Xpress, or Orient Xpress supports

ATM - based systems.
ATM based system can use either the Opens Fixture Module
hardware or the buffer/mux hardware (Buffer/MUX) to conduct
Opens Xpress, Cap Xpress, or Orient Xpress tests.
ATM-based systems can include the following models:
GR2281A and GR2287A.
66
Combines multiplexer and buffer boards

Each module services 32 probes
All electronics reside on overclamp
Small footprint (2.5 x 6.5)
67
Daisy chain interconnect simple expansion

Single thirty pin transfer connector
Expandable to 192 OX probes
Signal processing enhancements
- Modified high pass filter
- Added low pass filter
- Auxiliary active guard connection
Probe signal path verification
Rotary switch board ID (no jumpers)
Single +5V power supply
A test fixture that includes Opens Xpress hardware requires that
you verify both the fixture's bed-of-nails and Opens Xpress wiring.
Verify the wiring and operation of the Opens Xpress portion of the
fixture by:
Ensuring the Fixture Grounding Rules are satisfied.
Verifying agreement between the .dpr file and the fixture.
Using LOCPROBE.
Debugging the Opens Fixture, if necessary.
68
1. An AC signal is injected into a lead frame of an IC pin / node

on an unpowered printed-circuit board.
2. The capacitive coupled voltage at the plate above the IC is
buffered, amplified, sampled and channeled into the AFTM's or
ICA's sampling DVM.
3. The quality of the pin connection response is processed (DFT)
and converted into a value that is compared against precalculated
threshold limits.
69
Opens Xpress tests for open pins by applying an AC signal to a

node on an unpowered printed-circuit board and measuring the
voltage at the plate above the IC.
The high and low thresholds are calculated by using the average
measured voltage.
When a node is connected to a single lead of the IC, the voltage
detected is 400 V or higher.
For IC pins that are not connected, the measurement is usually
between 2 and 3 V.
Source Applied to Outer Electrode

Guard Applied to Inner Electrode
Large Signal Value Measured
Source Applied to Inner Electrode
Guard Applied to Outer Electrode
Guard Shields Signal from Sensor
70
Low Signal Value Measured

Large Characteristic Difference
Between Pins
WE0006-
Axial
Can
Drop
Chip
Uses Existing Opens Xpress Probes

Components with Multiple Vcc or Gnd Pins
Determines Patterns of Rotation
Orientation tests for an IC use the principle that if an IC is misoriented
such that a VCC or GND pin on the IC is rotated into
a testable pin location, the amplitude measured by Opens
Xpress for that pin will vary significantly from the learned data
because of the internal construction of the IC.
The IC orientation test performs an algorithm on those testable
pins that would have a VCC or GND pin in their position if the
IC were mis-rotated 90, 180, or 270 degrees clockwise.
SCO UNIX or NT system with GR228X Software Release 3.2.0
or greater
Instruments used are either AFTM, ICA, or ATM
71
Scanner Subsystem
ICT fixture requires overclamp, OX probes and special
hardware
Note: VMS systems with an AFTM can use Opens Xpress to
test ICs, connectors, and caps. However VMS systems do not
support Cap Xpress or Orient Xpress.
Most Opens Xpress problems are fixture related

Mis-application of probes
Premature failure of probes
Inconsistent Opens Xpress implementation by vendor
Wiring errors
Incomplete diagnostics
Electrostatic coupling without proper shielding
TEST XPRESS
Test Program Development
Describe the purpose and content of the four data files that
provide TEST XPRESS Tools data to the test program.
Describe the TEST XPRESS Tools test program development
process.
Use the TEST XPRESS Tools procedure to assist you in
72
developing a TEST XPRESS Tools test set.

Generate a TEST XPRESS Tools test program.
The four data files that provide TEST XPRESS Tools data to the
test program are: Device Probe Information (.dpi), Device Probe
Report (.dpr), Pin Opens Data (.pod), and POLEARN - generated
Coverage Report.
Contains data used to produce the .dpr file.
73
Manually created using a text editor.

Lists the devices to be tested and describes the interconnections
between the Opens Probes and the system for Opens Xpress,
Cap Xpress, and Orient Xpress.
Produced using the .dpi file as input during NAIL_ASSIGNMENT.
The Run-Time-System (RTS) can update the .dpr file when
you use PODEBUG mode.
Contains the Opens test data generated by POLEARN.
This data is later used by the test program to test other UUTs.
Contains an analysis of the test results.
To develop a TEST XPRESS Tools test set for a new board or to

add a TEST XPRESS Tools test to an existing board's test set
1 Create a .dpi file. This input file identifies each IC that TEST
74
XPRESS Tools will test.

2 Select the TEST XPRESS option on the ATG monitor page.
3 Run NAIL_ASSIGNMENT or XPRESS_NAIL.
4 Obtain a fixture with special Opens Xpress hardware or modify
an existing fixture using GenRad guidelines for assistance. Note
that this step does not apply to Junction Xpress.
5 Learn and verify the TEST XPRESS tests using the Run-Time
System (RTS) debug mode.
Just specify devices to be tested.
/* Component Probe */
J1;
U6;
U8;
C52;
U6 JX;
75
These optional .dpi file statements are normally used when adding
Opens Xpress to an existing test program.
HARDWARE=[ ]
MEAS_CONN=[ ]
AFTM_SLOT=n
AFTM_COMPATIBLE
AFTM_SIGNAL_NAIL, AFTM_RTN_NAIL
SCANNED_SIGNAL_NAIL, SCANNED_RTN_NAIL
GUARD, GUARDGND
PIO_USED
VPLUS_NAIL, VMINUS_NAIL
PRBGND_NAIL
VCCGRD_RLY, GNDGRD_RLY
Indicates which type of fixture hardware will be used so that the
wiring description in the .dpr file will be done correctly.
HARDWARE=OFM; (default)
or
HARDWARE=MUX;
Argument
OFM
MUX
Description
Indicates OFM hardware will be used. Use
OFM hardware on ICA systems with no
AFTM, which is also compatible with
GR2281A and GR2287A test systems as well
as AFTM systems.
Indicates the Buffer/ MUX board hardware
will be used. The MUX hardware can only
be used on GR2281A or GR2287A test
systems and systems having an AFTM
board.
Indicates how the measurement signal from the fixture hardware

will be connected to the tester interface.
MEAS_CONN=SCANNED; (default)
76
or
MEAS_CONN=DIRECT;
SCANNED indicates the measurement signal and its associated

return pin are connected to pin board scanner nails.
The scanning system will route the measurement signal to the
AC voltmeter during the test.
SCANNED must be used on ICA systems with no AFTM.
SCANNED is compatible with GR2281A and GR2287A test
systems as well as AFTM systems.
SCANNED connections do not require the AFTM position to
be in a fixed slot unless there is direct wiring to HFNAILS in
the fixture to test oscillators and crystals. This reduces the need
for cable connections from the fixture to modified fixture
adapter plates.
If MEAS_CONN=SCANNED
and the configuration is... Then...
AFTM-Only
Keywords in the .dpi file
relating to the AFTM, such as
AFTM_COMPATIBLE and
AFTM_SLOT are ignored.
AFTM and ICA
Measurement signal will be
routed to the ICA. The ICA
will also provide the AC source
and the AFTM is not used.
GR2282 system
MEAS_CONN=DIRECT
must be stated in the .dpi file.
This is critical because
SCANNED is the default.
DIRECT can only be used on GR2281A and GR2287A test

systems or systems having an AFTM board.
If MEAS_CONN=DIRECT and the...
Then connections are made
Configuration is ATM-based
To CSYNC7 and CSYNC8

pins in slot 2
AFTM_COMPATIBLE option is used,and the configuration is AFTM/ICAbased
or AFTM/Meas-based:
In the fixture from the AFTM
slot to the CSYNC7X and
CSYNC8X pins in slot 2
AFTM_COMPATIBLE option is not used, and the configuration is AFTM/ICA-based or
77
AFTM/Meas-based:
Directly to the AFTM slot
The n argument is the slot where AFTM resides.

Available for AFTM-based systems only.
Include the AFTM_COMPATIBLE keywords in the .dpi file to
provide fixture compatibility across all test systems.
If MEAS_CONN=SCANNED, the measurement signal output
from the Opens Xpress fixture and its associated return signal
are wired to pin board scanner nails.
If MEAS_CONN=DIRECT, an explicit statement must be
included in the .dpi file, and the test system must be an ICA
system or a GR2281A or GR2287A tester. The measurement
signal is wired to pin 02-A02 and the measurement signal return
is wired to pin 02-A03 at slot 2 of the tester receiver.
On GR2281A and GR2287A systems, these pins are the
dedicated Opens Xpress connections that are switched by the
AMM board to the AC voltmeter. These pins are known on
other GR228X systems as CSYNC8 and CSYNC7 respectively.
When wired for Opens Xpress compatibility, CSYNC7 and
CSYNC8 cannot be used as clock sync pins.
Causes the device probe report to connect the opens MUX board
to the AFTM by way of the AMM connections on slot 2.
Alerts nail assignments to create the .dpr file wire list to support
fixture wiring that is compatible with both AFTM and ATM
based testers.
Used in the device probe input file (.dpi) with the keyword
AFTM_SLOT=n.
/*---------------------------------------------------------This dpi creates wiring for the OFM fixture hardware. The
resulting fixture will be compatible on ATM based systems
and testers with an AFTM in slot14. The hardware option
defaults to OFM. Component U8 will be tested with both Opens
and Junction Xpress.
----------------------------------------------------------*/
/* Component Probe */
U6 4; /* Opens Xpress - Assign Channel 4 to U6 */
U8; /* Opens Xpress - Leave channel unassigned */
U8 JX; /* Junction Xpress */
C52; /* Cap Xpress */
78
VPLUS_NAIL=1210;
VMINUS_NAIL=1217; /* Not Used - OFM produces its own -5V
supply */
MEAS_CONN=DIRECT; /* Routes signal wires directly
to HF nails */
GUARD=1010;
GUARDGND=1026;
PRBGND_NAIL=900;
SCANNED_SIGNAL_NAIL=916; /* Not Used because the
connection is DIRECT */
SCANNED_RTN_NAIL=924; /* Not Used because the
connection is DIRECT */
VCCGRD_RLY=1;
GNDGRD_RLY=4;
AFTM_COMPATIBLE; /* Causes Jumpers from CS7X & CS8X
to HF nails */
AFTM_SLOT=14;
AFTM_SIGNAL_NAIL=3; /* Applies because connection is
DIRECT - Use HF3 */
AFTM_RTN_NAIL=4; /* Applies because connection is
DIRECT - Use HF4*/
PIO_USED=2,4,6; /* Indicate not to use TDR2, TDR4,
and TDR6*/
/* NOTE: Only the minimum of a list of components to be
tested is required. Settings will default to OFM and
SCANNED. If Junction Xpress tests are to be performed on
non-ICA systems, the AFTM_SLOT must also be specified.*/
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Target Tester: All GR228X testers except the GR2288

Generated by: xpse:PTS.r.320 [pse:Arena:sv386] Sat Feb 3

Used to define variables, which customize the generated output

/** Power Supply Programming Statements generated

DECLARE GLOBAL CSTRING UUT_POWER_STATUS(3) = 'OFF';

/** PS(13), which is wired in some 228X testers to **/

IF POWER_TYPE > 0 THEN BRANCH NA_ZERO;

LET UUT_POWER_STATUS = 'OFF';

Generating a Test Program

ATG Input Filename

Circuit Description file that has been

ATG Output Filename

Analog Test Program created by ATG to

In-circuit Test Fixtures

Choose a fixture vendor from GenRads current vendor list.

are somewhat more expensive, except when you are having

Generating Fixture Data

Allows you to specify how to assign permanent nails to your test

each nail in the fixture makes

READ '%S%' YN;

THU 07-NOV-96 13:27:41

BEGINNING SYNTAX PASS FOR programs\FixtureTestProgram

Process completed: 0 errors detected

The NailDatabase file can be used to control (customize) how Nail

Specifies nodes from the CircuitDescription

/*Section of code deleted for this sample file. */

TP20.1 ; TP21.1 ; TP22.1 ; TP173.1 ; TP169.1 ; TP151.1 ;

/*Section of code deleted for this sample file. */

/*Section of code deleted for this sample file. */

/*Section of code deleted for this sample file. */

/*Several pages of code deleted for this sample file. */

No .OBC file is produced when errors are detected. Translator

GENRAD 2286 TEST LANGUAGE TRANSLATOR

This step allows you to select the files required by the

Also NailWireLength for Short Wire Fixtures Only.

Practice using the Nail Assignment and Translate Monitor Pages,

Debugging a Test Program

Debug analog component tests using the analog debug

TEST DCI DCS FAIL(7);

No FAIL bit is set even if the current source is not in voltage

These variables can be tested as part of the IF condition in an

Inhibits the calling of subroutine FSUB in the event of a failure

These user-defined messages are available to the failure

Quality = XS/RS = RP/XP

Dissipation = RS/XS = XP/RP

Voltage Source (TEST DCS DCV)

Current Source (TEST DCS DCI)

Arith (TEST ARITH)

Measured value was low

Measured value was high

Testing error occurred

Label associated with last FAILed instrumentation statement,

DMSG associated with the last FAILed instrumentation

PMSG associated with last FAILed instrumentation

CMSG associated with the last FAILed instrumentation

Measured value from the last FAILed instrumentation

HI limit value (if available) from the last FAILed

LO limit value (if available) from the last FAILed

Failure messages and current values of the failure variables can be

SET MUX AT (6:6:8:8:REF=5,6,8,11);

/*START RESISTANCE TEST*/

Use the [error-command] construct, also referred to as a fail

If the measured impedance is less than 550 , set FAIL bit 5,

/ PS(13), which is wired in some 228X testers to /

/Section of code deleted for this sample file. /

/Section of code deleted for this sample file. /

/Section of code deleted for this sample file. /

/Section of code deleted for this sample file. /

/Several pages of code deleted for this sample file. /

/START RESISTANCE TEST/