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1. Introduction
1.1 STM and Tunneling effect
Scanning Tunneling Microscope(STM) is a facility of SPM(scanning probe
microscopy). Quantum tunneling effect is the basic concept of STM. And STM is
not limited by environment like UHV(Ultra High Vacuum)
STM consists of a sharp tip on a piezo-electric crystal tube, a mechanism to control
the location of the tip in the x-y plane parallel to the sample surface and a
feedbackloop to control the height of the tip above the sample (the z-axis). [1]
brighter regions shows that the current which is higher than darker part. In the
constant height mode there is a risk of breaking the tip if the samples are not flat.
The spectroscopic mode varies the potential difference between tip and sample, so
that measures the I(V) spectra from which we measure the differential conductance
and from differential conductance we can estimate the local density of states.
2. Experiment
2.1 Main equipment:
Tip: Pt-Ir Wire
Sample: Highly Oriented Pyrolytic Graphite (HOPG)
STM device
Tweezers, etc
desired area, as well as distance was decreased between sample and tip to get more
detailed image. Z range was also changed relatively to zooming to adjust contrast.
Imaging time was also decreased for fast processing. After imaging, the real images
were converted to Fast Fourier Transform (FFT) images, to determine d spacing
and lattice parameters.
The experiment consists of four different parts.
1. Image of highly oriented pyrolytic graphite (HOPG)
2. Conversion of real image to FFT image.
3. Measuring Crystal lattice spacing and lattice parameter
4. Comparison of values with the standard
3. Results
In the experiment, 3 different regions in the same sample were examined by the
STM.
8.538
0.234
0.213 nm
9.8 %
angles
*=59
*=60
*=61
4. Discussion:
In Topography image of the HOPG sample each point describe the planes of atom
instead of the individual atom. One can estimate the arrangement of atoms from
topography image as it shown in Figure 6.
Figure 6: Topography Image showing the planes of atoms, right side image
represent the topography image of HOPG by STM whereas the left side image
represent the schematic representation of planes [4]
The topography image of the sample contain bright and dark region, the reason
behind is bright and dark contrasts are due to the un-even surface of HOPG. As the
distance between the HOPG and tip is reduced current density which cause by the
software in the image bright and dark spots.
Another reason of bright and dark contrast may be that in the lattice model of
graphite that there are two different positions of the carbon atoms in the graphite
crystal lattice. One with a neighboring atom in the plane below appear dark and
one without a neighbor in the lattice below appear bright. The reason behind is
atoms without a direct neighbor in the layer beneath have the full electron density
therefore appear as bright spots whereas an atom with a direct neighbor in the layer
beneath loses electron density therefore appear as dark spot. Consequently the
electrical conductivity of the graphite surface varies locally slightly (different
electronic density of states). [4]
Figure 7: the Bright and dark contrast of HOPG in STM image [5]
Variations from the literature values are due to following reasons:
1. Tip preparation error
5. Conclusion
STM is a characterizing technique used for conducting material to reveal the
structure and topography at the atomic level. It can also be used to find d spacing
and lattice parameter. Experimental results shows that there has been a deviation of
maximum 10% which are due to some reasons which are mention in the
discussion part.
6. Refrences:
[1] http://www.accefyn.org.co/sp/nanociencia/documents/curso/SPM.pdf
[2]http://www.princeton.edu/chemistry/macmillan/group-meetings/DEC_tunneling.
pdf (Date: 22.04.2013)
[3] Atomic resolution images on HOPG, Nanosurf STM Application Note
http://www.nanosurf.com/index.cfm?action=act_getfile&doc_id=100486
[4] STM study of HOPG and Gold films
(http://depts.washington.edu/nanolab/NUE_UNIQUE/Lab_Units/5_Lab_Unit_ST
M.pdf)
[5] Atomic resolution of graphite surface by STM by TESS Experts, PHYWE
System
GmbH
&
Co,
(Dated:
5.3.2000)
(http://grundpraktikum.physik.uni-saarland.de/scripts/PHYWE_STM_Experiments
.pdf)