Working Group Test and Measurement

invites you to the seminar

RF Technology Day
New formula: combination of lectures and hands-on workshops

October 27th 2009

Congress Centre Het Pand
Ghent University - Belgium

www.feebel.be

Seminar

RF Technology Day 2009

5th Edition | New formula | Combination of lectures and hands-on workshops |

Who should attend?

This seminar is for all engineers in the following areas:
R&D engineers, design engineers for communication systems, RF team leaders and project managers, installation and maintenance
RF engineers, inventory managers, PO managers, lab responsables etc.
When? Where?
October 27th 2009
Ghent University
Congress Centre Het Pand
Onderbergen 1 - 9000 Ghent
Belgium
Routing: www.feebel.be/rftechnologyday2009
Programme
For this 5th edition, weve introduced a new formula: you now have the choice between the well known lectures and hands-on workshops.
The lectures are organised once, while all workshops are held twice. You can compose your personal programme based on the details on the
programme overview, and indicate your preferences on the registration form.
As you can see in the schedule, we start and end the day with keynote lectures of our external partners: INTEC_design (UGent) and Newtec.
These keynote lectures are organised for all participants simultaneously. You dont have to register for these activities.
All lectures are in English.
More information and registration
Participation is free of charge, but registration is required.
For more information about and registration for this seminar please check our website: www.feebel.be/rftechnologyday2009.
You can also fax us the registration form on the last page of this invitation.
Working Group Test and Measurement
The FEE Working Group Test and Measurement unites 20 suppliers of test and measurement equipment in Belgium. The group was founded in
1987 and is part of the Branch Professional Electronics, a division of the Belgian Federation of Electricity and Electronics. By means of market
survey statistics the members of the working group want to anticipate more efficiently to the needs of the professional user. They organise on
a regular base events like joint technical seminars and product shows.
The product assortment of the members consists of a wide range of test and measurement equipment. The members of the working group
guarantee their professional customers top-quality in product, advice and customer service.
Contact
FEE - Philip Struyf
Excelsiorlaan 91, 1930 Zaventem, Belgium
Tel +32 (0)2 720 40 80 - Fax +32 (0)2 720 20 60
p.struyf@feebel.be - www.feebel.be

Programme Overview
9:00
9:45

10:30

Breakfast and Registration

Keynote Lecture: High-speed Electronics For Gigabit Fiber Access Networks
To anticipate the increasing demand for broadband access, optical fiber access networks are being deployed to eliminate the bandwidth bottleneck in the last mile. Worldwide, passive optical networks (PONs) are the most widely deployed
fiber access technology. In a PON, the fiber plant is shared by a number of subscribers in a tree-like architecture, which makes the upstream transmission, based on TDMA, especially challenging. The upstream transmission requires
nanosecond-scale burst-mode operation at data rates above 1Gbps, with a high dynamic range. This presentation will focus on the design challenges of the high-speed electronics in this application and some recent research prototypes
operating at 10Gbps will be highlighted.
Dr. ir. Johan Bauwelinck, INTEC_design, UGent

Lecture: Galileo Search And Rescue Test Beacon Design

Workshop: Advanced Amplifier And Mixer Measurement

Techniques Using Single Connection Multiple Measurement
(SCMM) Architecture

Air-Parts received from ESA-ESTEC a request to design the RF-UNIT for the Search and Rescue Test Beacon as
part of the Test User Segment of the Galileo project. The challenges within this project lie in the high stability
and the flexibility of the signal generation. The stability is very important over all frequencies and power levels.
Frequencies run from 405 to 407 MHz in steps of 1 Hz, the power runs from 0.1 to 5 Watt at antenna input in
steps of 0.5 dB. The system must be able to interface with an other part of the design (made by Ursa Minor) via
LAN. The interface will arrange the power levels of the amplifiers and measure values like VSWR, Frequency and
Power at the output. The design makes use COTS products as much as possible to reduce the design time and
cost, if necessary Air-Parts modified the COTS products to fulfill the requirements (MOTS).

In this workshop we will discuss advanced measurement techniques for active devices, including Noise Figure,
swept frequency Gain Compression and swept Intermodulation Distortion measurements on amplifiers. We
will talk about calibration and measurement procedures for differential amplifiers under true mode stimulus
conditions. We will also discuss techniques for making measurements on Differential and I/Q mixers. Our
discussions will include measurement setups, calibrations methodologies and discussions about optimizing
measurement accuracy, speed and best practices for taking full advantage of SCMM architecture.
Daniel Bockstal, Application Engineer, Agilent Technologies

Joost van Heijenoort, Sales Engineer Microwave and Optical Solutions, Air-Parts

Break

11:15
11:30

Lecture: Manage the mix, Rent, Purchase New & Used

Workshop: De-Embedding Fixtures and Virtual Probing For

Accurate Signal Integrity Measurement

Manage the Mix provides you with a broad spectrum of services a user of test equipment would need to achieve
optimum productivity and cost effectiveness from their test equipment budget. Mixing options such as Rental,
Operating Lease and the purchasing of Used Equipment along with your new equipment acquisitions will offer
you quicker access to equipment, more flexibility, and a wider range of equipment while reducing costs.

High bit rates in serial data transmission create challenges in measurement accuracy caused by imperfections in
fixtures and cables. The common measurement practice of using scattering matrix parameters or s-parameters
offers a way of compensating for these imperfections. This workshop will discuss this practice to measure and
then de-embed fixtures, cables and interconnects and improving the accuracy of signal integrity measurements.
With Virtual Probing it is possible to emulate the transmission channel, add or remove pre/de-emphasis and
apply equalization. Virtual Probing allows to measure the signal at the receiver input, while probing at the
transmitter output. Practical examples will be demonstrated using a modern Digital Storage Oscilloscope.
Hugo Landman, AR Benelux

David Saeys, Electro Rent Europe

12:15
13:30

1/2

Lunch
Lecture: Measuring Coverage And Network Quality For Different
Technologies A Necessary Challenge

Workshop: Diagnosing, Isolating And Solving Problems In SDR

Design Using Real-Time Analysis And Digital Phosphor Technology

With the introduction of new technologies the complexity to maintain quality is also going up. Quality of voice,
data and video and quality of good coverage. In this presentation we will show the challenges and solutions
how to improve network quality.

Almost any RF design involves some sort of SDR. These need to be tested for correct RF behavior and response.
In this workshop, well have a short introduction to the problems associated with diagnosing SDR. Well look at
the challenges of isolating problems that occur with the different signal configurations of analog voltages and
digital words. Using todays capabilities of Real-Time Spectrum Analysis will reveal why its so good at solving
the challenges of the SDR diagnostics. Well also discuss the features and benefits offered by todays Arbitrary
Waveform Generators in various aspects of SDR testing. Throughout, well perform live measurements to show
how the concepts presented are used and applied in real-world testing situations.

Harri Silanpaa, Nemo Technologies for Livingston

Renaud Simper, RF EMEA Sales Specialist, Tektronix for CN Rood

14:15

Lecture: Changeable R&D Applications With The Advantage

Of Having All Equipment Capabilities By Renting / Leasing

Workshop Rerun: De-Embedding Fixtures and Virtual Probing

For Accurate Signal Integrity Measurement

Having more R&D possibilities and access to a larger inventory by renting and collaboration with the OEMs.

Hugo Landman, AR Benelux

Stijn Sallaerts, Telogy

Break

15:00
15:15

Workshop Rerun: Advanced Amplifier

And Mixer Measurement Techniques
Using Single Connection Multiple
Measurement (SCMM) Architecture

Workshop Rerun: Maintenance Testing Of

Analogue Radio Systems

Workshop Rerun: Tips To Improving Test

Time Of RF Measurements

Justin Taylor, Aeroflex Test Solutions for T&M

Systems

Leif Johansson & Karsten van Zwol, National

Instruments

Daniel Bockstal, Agilent Technologies

16:00

16:45

Keynote Lecture: Practical Design Flow For Microwave Filters From Concept To Test Using Modern Tools
The fundamentals of filter theory have been developed a long time ago. For bandpass filters, the concept of impedance inverter coupled resonators is powerful. This lecture briefly introduces basic filter theory and combines it with modern
CAD-simulation tools into a practical and fast, almost cookbook style, design flow, yet able to cope with real world components. The design flow is explained with a no-tune 18GHz microwave filter. Starting from concept, the basic design
is made on a circuit simulator. This is then step by step elaborated, combining circuit and EM simulations, to a final design that requires no production tune process. The design flow is widely applicable, from lumped LC filters over microstrip
filters up to waveguide filters.
Philip Sanders, Manager, Microwave & RF Engineering, Newtec

Drink

2/2
9:00

Breakfast and Registration

Keynote Lecture: High-speed Electronics For Gigabit Fiber Access Networks
To anticipate the increasing demand for broadband access, optical fiber access networks are being deployed to eliminate the bandwidth bottleneck in the last mile. Worldwide, passive optical networks (PONs) are the most widely deployed
fiber access technology. In a PON, the fiber plant is shared by a number of subscribers in a tree-like architecture, which makes the upstream transmission, based on TDMA, especially challenging. The upstream transmission requires
nanosecond-scale burst-mode operation at data rates above 1Gbps, with a high dynamic range. This presentation will focus on the design challenges of the high-speed electronics in this application and some recent research prototypes
operating at 10Gbps will be highlighted.
Dr. ir. Johan Bauwelinck, INTEC_design, UGent

Workshop: Maintenance Testing Of Analogue Radio Systems

Workshop: Tips To Improving Test Time Of RF Measurements

The workshop will be aimed at analogue radio systems 1-1000MHz, typically with AM/FM modulation. The
workshop will cover transmitter testing measurements, receiver testing measurements and antenna and feeder
testing measurements.
Justin Taylor, Application Specialist, Military and Defence Systems,
Aeroflex Test Solutions for T&M Systems

With increasing pressure to lower test costs, many RF test engineers face the challenge of reducing measurement
time. Whether you are creating an automated test system for design validation or final production test, it has
become increasingly important to optimize a test system for measurement speed. Thus, do not miss this session
that shows several concrete and practical tips to reduce measurement time of RF devices, such as WLAN. Live
demonstrations apply to a wide range of applications.
Leif Johansson & Karsten van Zwol, National Instruments

Break

9:30

10:30

11:15

Workshop: Vectoriel Amplifier Measurements In A 70 KHz To

70 GHz Band In Single Sweep

Workshop: Emulating RF Dynamic Multipath Effects Using A

Fading Simulator

During this workshop Anritsu will give you the opportunity to perform S-parameter measurements and 1dB
output power compression measurements in frequency domain. You will be invited to work with a VNA of the
next generation and a frequency band between 70KHz and 70GHz. The measurements will be performed on an
amplifier from 300KHz all the way up to 14GHz in one single connection.
Francois Grossier, Field application engineer, Anritsu

11:30

In this workshop we are emulating all RF propagation effects that can exist in a 2x2 MIMO system. Effects such
as multipath fading, doppler effect, shadow fading, are emulated in real time on 32 channels in forward and
backward with full reciprocity. The demo will be based on a MIMO Channel Emulator for Wireless Broadband.
The demo shows how MIMO, Beamforming, 64QAM transmission systems can be tested for performance and
conformance in the lab.
Frank Wybouw, Tucana & Derek MacLachlan, Keithley Instruments

12:15

Lunch
Workshop: Real-time RF measurement, diagnostic and control
system

Workshop: Performing Mixer Measurements With A Vector

Network Analyzer

A non-intrusive, real-time RF measurement, diagnostic and control system for in-situ measurement of RF
parameters. The breakthrough combination of in-line sensors and state-of-the-art instrumentation gives
tool manufacturers valuable insight into chamber performance, plasma condition and health of the entire RF
delivery system.

13:30

With power calibration, for scalar measurement and full two-port calibration, for phase correct measurement.
Type of proposed measurements: Conversion Loss / Gain, Dynamic range / Compression, Isolation and signal
leakage, Port Return Loss, Intermodulation IP3 and the Third Order Intercept, Group Delay and the Phase of S21.
Luc Pochet, Product specialist Network Analyzers, Rohde & Schwarz

Alan Powell, Bird for Heynen

Workshop Rerun: Vectoriel Amplifier Measurements In A 70 KHz

To 70 GHz Band In Single Sweep.

Workshop Rerun: Emulating RF Dynamic Multipath Effects Using

A Fading Simulator

Francois Grossier, Field application engineer, Anritsu

14:15

Frank Wybouw, Tucana & Derek MacLachlan, Keithley Instruments

Break
Workshop Rerun: Diagnosing, Isolating
And Solving Problems In SDR Design
Using Real-Time Analysis And Digital
Phosphor Technology

15:00

Workshop
Rerun:
Real-Time
RF
Measurement, Diagnostic And Control
System

Workshop Rerun: Performing Mixer

Measurements With A Vector Network
Analyzer

Alan Powell, Bird for Heynen

15:15

Luc Pochet, Rohde & Schwarz

Renaud Simper, Tektronix for CN Rood

Keynote Lecture: Practical Design Flow For Microwave Filters From Concept To Test Using Modern Tools
The fundamentals of filter theory have been developed a long time ago. For bandpass filters, the concept of impedance inverter coupled resonators is powerful. This lecture briefly introduces basic filter theory and combines it with modern
CAD-simulation tools into a practical and fast, almost cookbook style, design flow, yet able to cope with real world components. The design flow is explained with a no-tune 18GHz microwave filter. Starting from concept, the basic design
is made on a circuit simulator. This is then step by step elaborated, combining circuit and EM simulations, to a final design that requires no production tune process. The design flow is widely applicable, from lumped LC filters over microstrip
filters up to waveguide filters.
Philip Sanders, Manager, Microwave & RF Engineering, Newtec

Drink

16:00

16:45

Registration form
Please fax back to +32 (0)2 720 20 60 or fill in the online form on www.feebel.be before October 15th 2009.
Registration and participation is free of charge.

Your company:

First name:

Last name:

Function:

Address:

Zip code + City:

E-mail:

Telephone:

How did you learn about this seminar?

Which lectures or workshops would you like to attend?

Please indicate your first, second and third choice for each time slot in the boxes below.
Please be careful when composing your personal programme: lectures (L) are organised once, every workshop will be held twice (reruns
printed in italic). The keynote lectures are organised for all participants simultaneously, so no registration is necessary.

9:45

Keynote Lecture INTEC_design, UGENT

10:30

Air-Parts (L)

Agilent

T&M Systems

National Instruments

11:30

Electro-Rent (L)

AR Benelux

Anritsu

Tucana / Keithley

13:30

Livingston (L)

CN Rood

Heynen

Rohde&Schwarz

14:15

Telogy (L)

AR Benelux

Anritsu

Tucana / Keithley

15:15

Agilent

T&M Systems

National Instruments

CN Rood

Heynen

Rohde&Schwarz

16:00

Keynote Lecture Newtec

Participating Companies

ar benelux

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