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G S 4 1 2 DPAK CASE 369C (Surface Mounted) STYLE 2
3 4
1 Apk W W/C W W C mJ
IDM PD
MARKING DIAGRAMS
1 Gate 2 Drain 3 Source YWW 31 70LG
4 Drain
C/W
YWW 31 70LG = Assembly Location = Year = Work Week = Device Code = PbFree Package
4 Drain
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. When surface mounted to an FR4 board using 0.5 sq in pad size. 2. When surface mounted to an FR4 board using minimum recommended pad size.
A Y WW 3170L G
ORDERING INFORMATION
See detailed ordering and shipping information in the package dimensions section on page 2 of this data sheet.
NTD3055L170, NVD3055L170
ELECTRICAL CHARACTERISTICS (TJ = 25C unless otherwise noted)
Characteristic OFF CHARACTERISTICS DraintoSource Breakdown Voltage (Note 3) (VGS = 0 Vdc, ID = 250 mAdc) Temperature Coefficient (Positive) Zero Gate Voltage Drain Current (VDS = 60 Vdc, VGS = 0 Vdc) (VDS = 60 Vdc, VGS = 0 Vdc, TJ = 150C) GateBody Leakage Current (VGS = 15 Vdc, VDS = 0 Vdc) ON CHARACTERISTICS (Note 3) Gate Threshold Voltage (Note 3) (VDS = VGS, ID = 250 mAdc) Threshold Temperature Coefficient (Negative) Static DraintoSource OnResistance (Note 3) (VGS = 5.0 Vdc, ID = 4.5 Adc) Static DraintoSource OnVoltage (Note 3) (VGS = 5.0 Vdc, ID = 9.0 Adc) (VGS = 5.0 Vdc, ID = 4.5 Adc, TJ = 150C) Forward Transconductance (Note 3) (VDS = 8.0 Vdc, ID = 6.0 Adc) DYNAMIC CHARACTERISTICS Input Capacitance Output Capacitance Transfer Capacitance TurnOn Delay Time Rise Time TurnOff Delay Time Fall Time Gate Charge (VDD = 30 Vdc, ID = 9.0 Adc, VGS = 5.0 Vdc, RG = 9.1 W) (Note 3) (VDS = 48 Vdc, ID = 9.0 Adc, VGS = 5.0 Vdc) (Note 3) (VDS = 25 Vdc, VGS = 0 Vdc, f = 1.0 MHz) Ciss Coss Crss td(on) tr td(off) tf QT Q1 Q2 VSD trr ta tb QRR 195 70 29 9.7 69 10 38 4.7 1.4 2.9 0.98 0.85 29.8 17.6 12.2 0.031 275 100 42 20 150 20 80 10 1.25 mC Vdc ns nC ns pF VGS(th) 1.0 1.7 4.2 153 1.8 1.3 7.3 2.0 170 2.1 Vdc mV/C mW Vdc V(BR)DSS 60 53.6 1.0 10 100 Vdc mV/C mAdc Symbol Min Typ Max Unit
IDSS
IGSS
nAdc
RDS(on) VDS(on)
gFS
mhos
SOURCEDRAIN DIODE CHARACTERISTICS Forward OnVoltage Reverse Recovery Time (IS = 9.0 Adc, VGS = 0 Vdc) (Note 3) (IS = 9.0 Adc, VGS = 0 Vdc, TJ = 150C) (IS = 9.0 Adc, VGS = 0 Vdc, dIS/dt = 100 A/ms) (Note 3)
Reverse Recovery Stored Charge 3. Pulse Test: Pulse Width 300 ms, Duty Cycle 2%. 4. Switching characteristics are independent of operating junction temperatures.
ORDERING INFORMATION
Device NTD3055L170G NTD3055L1701G NTD3055L170T4G NVD3055L170T4G* Package DPAK (PbFree) DPAK3 (PbFree) DPAK (PbFree) DPAK (PbFree) Shipping 75 Units / Rail 75 Units / Rail 2500 / Tape & Reel 2500 / Tape & Reel
For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. *NVD Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AECQ101 Qualified and PPAP Capable
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NTD3055L170, NVD3055L170
20 VGS = 10 V ID, DRAIN CURRENT (AMPS) 16 12 8 4 8V 6V 4V 3.5 V 3V 0 0 1 2 3 4 5 6 7 8 5V ID, DRAIN CURRENT (AMPS) 12 16 VDS 10 V
VGS = 10 V
VGS = 15 V
TJ = 100C TJ = 25C
TJ = 55C 8 12 16 20 24
10
20
30
40
50
60
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NTD3055L170, NVD3055L170
POWER MOSFET SWITCHING Switching behavior is most easily modeled and predicted by recognizing that the power MOSFET is charge controlled. The lengths of various switching intervals (Dt) are determined by how fast the FET input capacitance can be charged by current from the generator. The published capacitance data is difficult to use for calculating rise and fall because draingate capacitance varies greatly with applied voltage. Accordingly, gate charge data is used. In most cases, a satisfactory estimate of average input current (IG(AV)) can be made from a rudimentary analysis of the drive circuit so that t = Q/IG(AV) During the rise and fall time interval when switching a resistive load, VGS remains virtually constant at a level known as the plateau voltage, VSGP. Therefore, rise and fall times may be approximated by the following: tr = Q2 x RG/(VGG VGSP) tf = Q2 x RG/VGSP where VGG = the gate drive voltage, which varies from zero to VGG RG = the gate drive resistance and Q2 and VGSP are read from the gate charge curve. During the turnon and turnoff delay times, gate current is not constant. The simplest calculation uses appropriate values from the capacitance curves in a standard equation for voltage change in an RC network. The equations are: td(on) = RG Ciss In [VGG/(VGG VGSP)] td(off) = RG Ciss In (VGG/VGSP)
700 600 C, CAPACITANCE (pF) 500 400 300 200 100 0 Crss 10 5 VGS 0 VDS 5 10 15 20 25 Crss Ciss Coss Ciss
The capacitance (Ciss) is read from the capacitance curve at a voltage corresponding to the offstate condition when calculating td(on) and is read at a voltage corresponding to the onstate when calculating td(off). At high switching speeds, parasitic circuit elements complicate the analysis. The inductance of the MOSFET source lead, inside the package and in the circuit wiring which is common to both the drain and gate current paths, produces a voltage at the source which reduces the gate drive current. The voltage is determined by Ldi/dt, but since di/dt is a function of drain current, the mathematical solution is complex. The MOSFET output capacitance also complicates the mathematics. And finally, MOSFETs have finite internal gate resistance which effectively adds to the resistance of the driving source, but the internal resistance is difficult to measure and, consequently, is not specified. The resistive switching time variation versus gate resistance (Figure 9) shows how typical switching performance is affected by the parasitic circuit elements. If the parasitics were not present, the slope of the curves would maintain a value of unity regardless of the switching speed. The circuit used to obtain the data is constructed to minimize common inductance in the drain and gate circuit loops and is believed readily achievable with board mounted components. Most power electronic loads are inductive; the data in the figure is taken with a resistive load, which approximates an optimally snubbed inductive load. Power MOSFETs may be safely operated into an inductive load; however, snubbing reduces switching losses.
VDS = 0 V
VGS = 0 V
TJ = 25C
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NTD3055L170, NVD3055L170
VGS , GATETOSOURCE VOLTAGE (VOLTS) 6 5 4 3 2 1 0 ID = 9 A TJ = 25C 0 1 2 3 4 QG, TOTAL GATE CHARGE (nC) 5 1 1 QT Q1 Q2 t, TIME (ns) 100 tr tf 10 td(off) td(on) VDS = 30 V ID = 9 A VGS = 5 V 100 1000
VGS
6 4
2 0 0.6 0.64 0.68 0.72 0.76 0.8 0.84 0.88 0.92 VSD, SOURCETODRAIN VOLTAGE (VOLTS)
0.96
SAFE OPERATING AREA The Forward Biased Safe Operating Area curves define the maximum simultaneous draintosource voltage and drain current that a transistor can handle safely when it is forward biased. Curves are based upon maximum peak junction temperature and a case temperature (TC) of 25C. Peak repetitive pulsed power limits are determined by using the thermal response data in conjunction with the procedures discussed in AN569, Transient Thermal Resistance General Data and Its Use. Switching between the offstate and the onstate may traverse any load line provided neither rated peak current (IDM) nor rated voltage (VDSS) is exceeded and the transition time (tr,tf) do not exceed 10 ms. In addition the total power averaged over a complete switching cycle must not exceed (TJ(MAX) TC)/(RqJC). A Power MOSFET designated EFET can be safely used in switching circuits with unclamped inductive loads. For reliable operation, the stored energy from circuit inductance dissipated in the transistor while in avalanche must be less than the rated limit and adjusted for operating conditions differing from those specified. Although industry practice is to rate in terms of energy, avalanche energy capability is not a constant. The energy rating decreases nonlinearly with an increase of peak current in avalanche and peak junction temperature. Although many EFETs can withstand the stress of draintosource avalanche at currents up to rated pulsed current (IDM), the energy rating is specified at rated continuous current (ID), in accordance with industry custom. The energy rating must be derated for temperature as shown in the accompanying graph (Figure 12). Maximum energy at currents below rated continuous ID can safely be assumed to equal the values indicated.
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NTD3055L170, NVD3055L170
SAFE OPERATING AREA
EAS , SINGLE PULSE DRAINTOSOURCE AVALANCHE ENERGY (mJ) 100 I D, DRAIN CURRENT (AMPS) VGS = 15 V SINGLE PULSE TC = 25C 10 10 ms 100 ms 1 1 ms RDS(on) LIMIT THERMAL LIMIT PACKAGE LIMIT 0.1 32 ID = 7.75 A 24
16
10 ms
0.1
dc 100
25
10
D = 0.5 0.2 1 0.1 0.05 0.01 SINGLE PULSE 001 0.00001 0.0001 0.001 t1 P(pk) RqJC(t) = r(t) RqJC D CURVES APPLY FOR POWER PULSE TRAIN SHOWN READ TIME AT t1 TJ(pk) TC = P(pk) RqJC(t)
10
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NTD3055L170, NVD3055L170
PACKAGE DIMENSIONS
DPAK (SINGLE GAUGE) CASE 369C01 ISSUE D
A B C A c2
NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994. 2. CONTROLLING DIMENSION: INCHES. 3. THERMAL PAD CONTOUR OPTIONAL WITHIN DIMENSIONS b3, L3 and Z. 4. DIMENSIONS D AND E DO NOT INCLUDE MOLD FLASH, PROTRUSIONS, OR BURRS. MOLD FLASH, PROTRUSIONS, OR GATE BURRS SHALL NOT EXCEED 0.006 INCHES PER SIDE. 5. DIMENSIONS D AND E ARE DETERMINED AT THE OUTERMOST EXTREMES OF THE PLASTIC BODY. 6. DATUMS A AND B ARE DETERMINED AT DATUM PLANE H. DIM A A1 b b2 b3 c c2 D E e H L L1 L2 L3 L4 Z INCHES MIN MAX 0.086 0.094 0.000 0.005 0.025 0.035 0.030 0.045 0.180 0.215 0.018 0.024 0.018 0.024 0.235 0.245 0.250 0.265 0.090 BSC 0.370 0.410 0.055 0.070 0.108 REF 0.020 BSC 0.035 0.050 0.040 0.155 MILLIMETERS MIN MAX 2.18 2.38 0.00 0.13 0.63 0.89 0.76 1.14 4.57 5.46 0.46 0.61 0.46 0.61 5.97 6.22 6.35 6.73 2.29 BSC 9.40 10.41 1.40 1.78 2.74 REF 0.51 BSC 0.89 1.27 1.01 3.93
E b3 L3
1 4
D
2 3
Z
DETAIL A
L4
b2 e
b 0.005 (0.13)
M
c C L2
GAUGE PLANE
H C L L1 DETAIL A
SEATING PLANE
A1
ROTATED 90 5 CW
SOLDERING FOOTPRINT*
6.20 0.244 3.00 0.118
2.58 0.102
5.80 0.228
1.60 0.063
6.17 0.243
SCALE 3:1
mm inches
*For additional information on our PbFree strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D.
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NTD3055L170, NVD3055L170
PACKAGE DIMENSIONS
IPAK CASE 369D01 ISSUE C
B V R
4
C E Z
NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: INCH. DIM A B C D E F G H J K R S V Z INCHES MIN MAX 0.235 0.245 0.250 0.265 0.086 0.094 0.027 0.035 0.018 0.023 0.037 0.045 0.090 BSC 0.034 0.040 0.018 0.023 0.350 0.380 0.180 0.215 0.025 0.040 0.035 0.050 0.155 MILLIMETERS MIN MAX 5.97 6.35 6.35 6.73 2.19 2.38 0.69 0.88 0.46 0.58 0.94 1.14 2.29 BSC 0.87 1.01 0.46 0.58 8.89 9.65 4.45 5.45 0.63 1.01 0.89 1.27 3.93
S T
SEATING PLANE
A
1 2 3
F D G
3 PL
H
M
0.13 (0.005)
ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Typical parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including Typicals must be validated for each customer application by customers technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
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NTD3055L170/D