RRC Kurchatov Institute, Moscow, Russia

The equipment for X-ray

polarization analysis of pulsed
plasma sources.
A.M.Stepanenko, M.M.Stepanenko, E.O.Baronova

2-3 July 2009, Singapore

 Plasma Properties
Pulsed plasma • Irreproducibility
• Anisotropy
• In laser plasma- it is direction
of laser radiation
• In pinches-it is direction of
discharge current

• X-ray spectroscopy is now designed in

the assumption of isotropic plasma!
• Conventional diagnostics based on analysis of intensities of line
radiation should be reconsidered!
 How does the polarization of radiation
born?

1s2p state

Semiclassical interpretation of
polarization of X-ray lines
In case of electric
field presence
 The basics of X-ray polarization
measurements.
1.Bragg’s law 2d*sin=k

2.Reflection coefficient from crystal

 
16  e 2
  d 2

PD     2   tan  B K | Fhkl |
 3   4 0 mc   V 

3.Brewster angle
K = (1+ cos2 B)/2

=45
only -component is reflected!
• Why we should give our attention
to the problem?

• What are possible ways to measure

polarization
Spectra, taken with identical polarizes are different –
X-rays are polarized?
Plasma focus machine, I=500 kA, Swierk, Poland

Two identical polarizers

are used
for polarization analysis
Spectra, taken with identical polarizes are different –
X-rays are polarized?
Plasma focus machine, I=500 kA, Swierk, Poland

Two identical polarizers

are used
for polarization analysis

80
Intensity [a.u.]

1
70 ArXVII- P
B
3
60 ArXVII- P
50
40
30
Spectra of ArXVII,
taken by identical
20
3,86 3,88 3,90 3,92 3,94 3,96 3,98 4,00 4,02 4,04 4,06
120

polarizers in
1
Intensity [a.u.]

100 ArXVII- P
80
A
3
ArXVII- P
60
40
20
0
single shot
3,86 3,88 3,90 3,92 3,94 3,96 3,98 4,00 4,02 4,04 4,06
Wavelength [A]
Spectra, taken with identical polarizes are different –
X-rays are polarized?
Plasma focus machine, I=500 kA, Swierk, Poland

Intensity [a.u.]
80 1
70 ArXVII- P B
3
60 ArXVII- P
50
40
30
20
3,86 3,88 3,90 3,92 3,94 3,96 3,98 4,00 4,02 4,04 4,06
120 Intensity [a.u.]

T e = 900 eV, ne = 4*1021 cm-3

Spectra, taken with identical polarizes are different –
X-rays are polarized?
Plasma focus machine, I=500 kA, Swierk, Poland

Two identical polarizers

are used
for polarization analysis

80
Spectra of ArXVII, taken
Intensity [a.u.]

1
70 ArXVII- P
B
60
50
40
3
ArXVII- P
by identical polarizers in
30
20
3,86 3,88 3,90 3,92 3,94 3,96 3,98 4,00 4,02 4,04 4,06
single shot
120
1
Intensity [a.u.]

100 ArXVII- P
80
A
3
ArXVII- P
60
40
20
0
3,86 3,88 3,90 3,92 3,94 3,96 3,98 4,00 4,02 4,04 4,06
T e = 900 eV, ne = 4*1021 cm-3
Wavelength [A]
 4 channel compact convex spectrometer with
flat output windows.

3 slits, 1*13mm2

+20Be

Pinhole image
Input diaphragm
Diafragm

3 crystals

100 pinhole+20Be
Lead, 0.5 mm
Polarization analysis on x-pinch , discharge current 80 kA, Cu wires
X-pinch, source size 1mm, plasma to crystal distance is 160 mm
Cu, L-shell (1s22s22p6 1S0), 1 shot, 3 mica crystals

2s22p6 1S0 –2s22p53s 1P1

2s22p6 1S0 –2s22p53p 1P1 2s22p6 1S0 –2s22p53d 1P1 2s22p6 1S0 –2s22p53s 3P1
2s22p6 1S0 –2s22p53p3P1 2s22p6 1S0 –2s22p53d 3D1

L-shell spectra of Cu are polarized!

Parameters of 4 channel spectrometer

Advantages: compact sizes, wide energy range,

simplicity of alignment, high resolution with point-like
X-ray sources, adopted to use MCP detectors

Resolution 3*10-3
Dispersion 0.08- 0.16 А/мм
Energy range 0.82 keV – 10 keV

Disadvantages: reflection coefficient is not well known,

field of view of crystals is different
First single crystal X-ray
spectropolarimeter
Quarz crystal serves as
polarimeter, it contains series of
planes at 120 to each other
 Polarization analysis of X-ray tube radiation

Cu К-alpha radiation, reflected in

fourth order of 10-10 cut.

Equal reflection coefficients

in both channels
 First single crystal X-ray polarimeter

CHANNEL 2 CHANNEL1

Advantages: 1. identical field of

view for both polarization
components
2. equal reflection coefficients

Disadvantages: 1. needs
careful alignment
 Conclusions.
Due to the presence of directed electromagnetic
Fields, X-ray spectroscopy measurements should
be accompanied by polarization analysis.
New perspective equipment for X-ray Plasma
Polarization Spectroscopy was manufactured
and tested:
1. 4 channel spectrometer
2. The single crystal spectropolarimeter
Thank you for
your attention