Professional Documents
Culture Documents
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Complete models developed for CAD and implemented in the circuit simulator AIMSpice Based on the new, universal charge control concept, which guarantees stability and conversion Unified DC models cover all regimes of operation AC models accurately reproduces Cgc frequency dispersion
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Automatic scaling of model parameters to accurately model a wide range of device geometries Temperature dependence included A minimum number of physically based parameters that can easily be extracted from experimental data and related back to the fabrication steps Automatic parameter extraction implemented in AIM-Extract Verified using a wide variety of TFT structures from many foundries Well documented and described both in technical journals and in monographs
Applications
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AMLCD (Active Matrix Liquid Crystal Display) Flat Panel Display a-Si TFT: Radiation detectors, image sensors, driver circuits, printing applications and memories Poly-Si TFT: High definition television (HDTV), portable devices, projection displays and static random access memories (SRAMs) Multi-billion markets
AIMSPICE
Features
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AIM-Spice runs on the Microsoft Windows operating systems, which include Windows 3.1, Windows 95 and Windows NT. Uses the Berkeley SPICE version 3.E1 as kernel, fully compatible with PSpice, which is the industry standard. Displays simulation results in progress by plotting circuit variables during a run. Includes advanced new models for a number of semiconductor devices.
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Includes a graphical post processor, AIM-Postprocessor. Runs on Windows NT on several platforms, including DEC's ALFA and MIPS.
User interface
A more user friendly interface: choosing Microsoft Windows as the operating environmentGraphic user interface (GUI) which allows for a more visual mode of working.
Simulation Control
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In AIM-Spice the operator has complete control A powerful graphic postprocessor, AIM-processor, is included
SAMPLE SIMULATION
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Device characterization using our TFT model on data from many semiconductor device research foundries: Univ. of Waterloo, Canada Univ. of Utrecht Princeton University OIS, INC Univ. of Michigan Penn State Univ. Lehigh Univ. Xerox PARC Example: Results published in MRS spring97 meeting, San Francisco, CA
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Dr. Charles W. Boecker IOWA State Univ. Dr. Holly C. Slade WhiteOak Inc. Dr. Trond Ytterdal Nordic VLSI, Norway Prof. Milttiadis Hatalis Lehigh Univ. Prof. Steven Fonash Penn State Univ. Dr. Ganiyu Hanidu Hampton Univ. Dr. James Atherton David Sarnoff Research Center Dr. Ron Troutman IBM Watson Research Center Dr. Tsu- Jae King Xerox Inc. Dr. Young Byun OIS Inc. Dr. Steven Theiss Princeton Univ. Dr. Mike Hack dpiX Inc. Dr. Mike Brownlow Sharp Laboratories of Europe, Ltd. Dr. Koorosh Aflatooni Univ. of Waterloo, Canada
Dr. Ping Mei Xerox Parc Ms. Hamide Kavak IOWA State Univ. Ms. Vyshi Suntharalingam Penn State Univ.
CONTACT US
Semiconductor Devices Research Group @
CII 9015, Department of Electrical, Computer and Systems Engineering Rensselaer Polytechnic Inst., Troy, NY 12180 (Fax: 518-276-2990) People working on TFT characterization and modeling Professor Michael Shur phone: 518-276-2201 email shurm@rpi.edu Homepage http://nina.ecse.rpi.edu/shur/ Professor Tor Fjeldly phone: 518-276-2518 email fjeldt@rpi.edu Homepage http://www.fysel.ntnu.no/People/Fjeldly/index.html Ms. Ling Wang phone: 518-276-2948 email wangl@rpi.edu Homepage http://www.rpi.edu/~wangl
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SELECTED PUBLICATION
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K. LEE, M. SHUR, T. A. FJELDLY and T. YTTERDAL, Semiconductor Device Modeling for VLSI, Prentice Hall, New Jersey (1993) T. A. FJELDLY, T. YTTERDAL and M. SHUR, Introduction to Device Modeling and Circuit Simulation, John Wiley & Sons, New York, October (1997) M. S. SHUR, H. C. SLADE, T. YTTERDAL, L. WANG, Z. XU, K. AFLATOONI, Y. BYUN, Y. CHEN, M. FROGGATT, A. KRISHNAN, P. MEI, H. MEILING, B.-H. MIN, A. NATHAN, S. SHERMAN, M. STEWART, and S. D. THEISS, Modeling and Scaling of a-Si:H and Poly-Si Thin Film Transistors, Material Research Society Proceedings, Amorphous and Microcrystalline Silicon Technology, 467 (1997) M. S. SHUR, M. D. JACUNSKI, H. C. SLADE, A. A. OWUSU, T. YTTERDAL, and M.HACK, SPICE Models for Amorphous Silicon and Polysilicon Thin Film Transistors, Electrochemical Society Proceedings, 96-23, 242,(1996)
Analytical Models for Amorphous-Silicon and Polysilicon Thin Film Transistors for High-DefinitionDisplay Technology, Journal of Society for Information
Display, 3 (4), 223, (1995)
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