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SurfaceCharacterizationof Biomaterials:VacuumTechniques
XrayPhotoelectronSpectroscopy (XPS)
Ejected Photoelectron Incident X-ray
Free elevel Fermi level
Valence Band Conduction Band
KE h BE Spec
2p 2s
L2,L3 L1
1s
Physicalbasis:photoionizationandemissionof corelevelelectronsuponirradiationwithXrays XPSspectrallinesareidentifiedbytheshellfrom whichtheelectronwasejected(1s,2s,2p,etc) Surfacesensitive(1 10nm) Quantitative countingelectrons!But accuracy dependsonthequalityoftheatomicsensitivity factors Sampledegradationisanissue!
XPS
AreaunderpeakIiproportionalto numberofelectronsejected(&to numberofatomspresent) Onlyelectronsinthenearsurface regionescapewithoutlosing energybyinelasticcollision Sensitivity:dependsonelement. Elementspresentinconcentrations >0.1atom%aregenerally detectable(H&Heexceptions, nondetectable)
HighResolutionXPS
HighResolutionXPS
Quantification:PeakFitting
High Resolution C 1s and O 1s Spectra of p(S-co-MMA) Brush
C2 C2 C2 m C1 C1 C4 n C5 O
O
O O1
O O2
C3 CH3
CH3
C3 C4 C2 C5 C1
O2 O1
Survey Method
FMMA
FMMA
8( I O C / I C ) exp 3( I O C / I C ) exp 1
Survey Spectra
Survey Spectra
DepthProfilingwithXPSatDepths>10nm
SIMS
SIMS
SIMS
SIMSModesofOperation
SIMSModesofOperation:
ExampleofStaticMode
SIMSModesofOperation:
ExampleofDynamicMode