The New Standards on Digital

Industrial Radiology
ISO 16371 to replace EN 14784 ISO 16371 to replace EN 14784
ISO 17636 to replace EN 1435
by
U. Ewert
www.bam.de
uwe.ewert@bam.de
BAM, Berlin, Germany,
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ISO 16371, ISO 17636
Ewert, J une 2010
ISO/TC 135/SC 5 N 220
Available Standards on Digital Industrial Radiology
EN 13068 Radioscopy
EN 14096, ISO 14096 Film Digitisation
CR EN 14784ISO 16371 P t 1 Cl ifi ti f S t P t 2 G l CR: EN 14784ISO 16371 Part 1: Classification of Systems, Part 2: General
principles
ASTM: CR Classification (E 2446), Long-Term Stability (E 2445),
Guide (E 2007), Practice (E 2033)
ASME (BPVC, S.V, XI) CR
former Code Case 2476
Radiography (CR) with Phosphor Imaging Plates
former Code Case 2476
ASTM: DDA Manufacturing Characterization (E 2597), Practice
(E 2698), Guide (E 2736), Performance Evaluation
and Long Term Stability (E 2737) and Long-Term Stability (E 2737)
ISO/DIS 10893-7 NDT of steel tubes: Digital RT of the welded seam
EN 1435-2 ISO 17636-2 NDT of welds: Film Replacement (CR and DDA) 35 SO 636 o eds ep ace e t (C a d )
ASTM E 2422 First digital catalogue, light alloy casting
digitized films from ASTM E 155 (BAM)
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ISO 16371, ISO 17636
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ISO 16371:
Non-destructive testing Industrial computed
radiography with storage phosphor imaging plates
Part 1: Classification of systems
Part 2: General principles for testing of metallic Part 2: General principles for testing of metallic
materials using X-rays and gamma rays
New Title of ISO 17636:
Non-destructive examination of welds - Digital
radiographic examination of welded joints part 2:
X- and gamma rays techniques with digital
detectors
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ISO 16371, ISO 17636
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- Proposal ISO 10893-7
Standards to Consider
- Non-destructive testing of steel tubes Part 7: Digital radiographic testing of
the weld seam of welded steel tubes for the detection of imperfections
- ASTM: CR
- E 2445, E2446-2005: Classification, qualification, long term stability,
harmonized with EN 14784-1 but revision requested
- E 2033: Standard Practice for Computed Radiology under major revision - E 2033: Standard Practice for Computed Radiology under major revision
- ASTM: DDA
- E 2597-2007: Manufacturing Characterization,
- E 2698-2010: Standard Practice
- E 2736-2010: Guide
- E 2737-2010: Performance Evaluation and Long-Term Stability g y
- EN ISO 17635-2010 (substitutes EN 12062) NDT, General rules, weld inspection
- Non-destructive examination of welds General rules for metallic materials
R i i 14784 1 d 2 i d - Revision 14784-1 and -2 required
- Non-destructive testing - Industrial computed radiography with storage
phosphor imaging plates - Part 2 : general principles for testing of metallic
t i l i X d
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ISO 16371, ISO 17636
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materials using X-rays and gamma rays
Basic Requirements for Radiography
B i t d d i t f fil d di it l di l i i
g y
in all National and International Standards
Basic standard requirements for film and digital radiology in comparison:
A hi i i ti l D it A hi i i SNR
}
Film
Digital Detector (CR)
Achieve minimum optical Density Achieve minimum SNR
N
Do not exceed maximum film system class or calibrated minimum pixel
value
D t d i h C t t d
}
Do not exceed maximum unsharpness Correct geometry and
detector selection
Prove minimum IQI perception with
Wires or Achieve minimumCNR
}
Wires or, Achieve minimum CNR
N
Step holes or Use same IQIs to prove quality
Plate holes Use optional unsharpness IQI
}}
SNR Signal to noise ratio
CNR C t t t i ti
The following formulas and measurements will prove the
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ISO 16371, ISO 17636
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CNR Contrast to noise ratio
correctness of the requirements for digital detectors!
How to determine the Visibility of IQIs from CNR and SNR?
- Now some figures and equations for those who are interested in the - Now some figures and equations for those who are interested in the
physics of IQI vision
Contrast and noise determine the
visibility of indications
I
n
t
e
n
s
i
t
y
Contrast
Signal
(Base material)
I
n
t
e
n
s
i
t
y
Contrast
Signal
(Basematerial)
Length
(Base material)
Length
(Basematerial)
N t h i ibl ! N t h t i ibl ! Notch visible!
Contrast/Noise is high
Signal/Noise is high
Notch not visible!
Contrast/Noise is low
Signal/Noise is low
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ISO 16371, ISO 17636
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Signal/Noise is high Signal/Noise is low
Image Quality Parameters in Digital Radiography
IQI visibility (wires plate holes of given size)
g y g g p y
IQI-visibility (wires, plate holes of given size)
Specific
Contrast
eff I
SNR
CNR
=
Material, keV
Scatter protection
{
Contrast
eff I
Total
w

A
Scatter protection
Screens and filters
{
Exposure time Exposure time
Tube current
Detector efficiency Detector efficiency
Source Detector Distance
Specific
Contrast-to-Noise Ratio
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ISO 16371, ISO 17636
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Contrast-to-Noise Ratio
Equivalence Value for Optical Density and Film System Class
The measured SNR
N
is independent on unsharpness and is used as equivalent
value for a required film system class and given optical density.
Grey values cannot be used as equivalent values without qualification for the y q q
used system and its settings because different digital systems (DDA or IP scanner)
read out the detectors with different grey values in response to the same exposure
dose and efficiency. y
Influence of Noise in Radiography
Film system C1 (Agfa D2) C4 (Agfa D5) C6 (Agfa D8)
C t t
Noise
Contrast
Indications vanish in the noise at higher film system classes
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ISO 16371, ISO 17636
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Noise Sources
Typical noise sources in digital radiography:
1 EXPOSURE CONDITIONS: Photon noise depending on 1. EXPOSURE CONDITIONS: Photon noise, depending on
exposure dose (e.g. mAs or GBqmin). This is the main
factor! SNR increases with higher exposure dose. g p
2. Limitation for the maximum achievable SNR:
1 DETECTOR: Structural noise of DDAs and Imaging Plates 1. DETECTOR: Structural noise of DDAs and Imaging Plates
also called fixed pattern noise (due to variations in pixel to
pixel response and inhomogeneities in the phosphor layer). p p g p p y )
2. OBJECT:
1 Crystalline structure of material (e g nickel based steel 1. Crystalline structure of material (e.g. nickel based steel,
mottling)
2 Surface roughness of test object
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ISO 16371, ISO 17636
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2. Surface roughness of test object
Verification of the Visibility Equations by
Measurement and Calculation Measurement and Calculation
- The numeric calculation of the just visible IQI diameter depends on
the qualification data SNR and Eff as well as on SNR (PV) the qualification data SNR
max
and Eff
IP
as well as on SNR
measured
(PV)
and SR
b_measured
. For calculation of the just visible IQI diameter the
visibility equation and the qualification equation are applied:
Visibility equation II
Qualification equation
) (
*
PV SNR
SR
PT d
eff
b
visible

2
max
/ ) / (
IP measured measured
measured
Eff PV SNR PV
PV
SNR
+
=
4 , 7 19 / 2 100 ) 19 ( ~ =
visible visible
d mm d mmFe EPS
EPS conversion
PT* for wires is about 1,5 (depends on operator)

eff
for 200 kV and 19 mm Fe is about 0,05 mm
-1
SR
b
shall be used in mm
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ISO 16371, ISO 17636
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Verification of the Visibility Equations by
Measurement and Calculation
Calculated visible wire
diameters from pixel
value, , SR
b
and SNR
N
- The numeric conversion of the qualification data SNR
max
and Eff
IP
as
well as SNR (PV) and SR for calculation of the just
0,400
Justvisiblewirediameter
largefocalspot calcwirediameterFujiST
VI
value, , SR
b
and SNR
N
well as SNR
measured
(PV) and SR
b_measured
for calculation of the just
visible IQI diameter needs the combination of the visibility
equation and the qualification equation after normalization with
SR by:
0,300
0,350
r
VI
largefocalspot calcwirediameterFujiUR
1
largefocalspot calcwirediameterDrr
UR1
largefocalspot calcwirediameterDrrST
Calculated and measured visible
wire diameter in comparison
SR
b
by:
0,150
0,200
0,250
v
i
s
i
b
l
e

w
i
r
e

d
i
a
m
e
t
e
r
VI
largefocalspot measuredwirediameter
DrrSTVI
largefocalspot measuredwirediameter
DrrUR1
large focal spot measured wire diameter
W 12
W 13
W 14
0,050
0,100
0, 50
v
largefocalspot measuredwirediameter
FujiSTVI
largefocalspot measuredwirediameter
FujiUR1
PT* for wires = 1,49 (depends on operator)
0,000
0 10000 20000 30000 40000 50000 60000 70000
GV
The visibility equation (II) and the qualification equation were
PT for wires 1,49 (depends on operator)

eff
for 200 kV and 19 mm Fe is 0,05 mm
-1
Measured with
scanner DynamIx HR and Drr HD35
Imaging plates UR 1 and ST VI
used to calculate the wire visibility. The solid lines in the graph are
the result of calculation.
The points in the diagram show the just visible wire diameters of
EN 462-1IQIs on a inchplate (19mm) with 1,74mSDD and
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ISO 16371, ISO 17636
Ewert, J une 2010
Imaging plates UR 1 and ST VI EN 462 1 IQIs on a inch plate (19 mm) with 1,74 m SDD and
200 kV of a 320 kV X-ray tube of Seifert, Isovolt.
Cl ifi ti Q lifi ti L T St bilit Classification, Qualification, Long Term Stability
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ISO 16371, ISO 17636
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Basic Requirements for Radiography
Classification, Qualification, LongTermStabilityTests Classification, Qualification, Long Term Stability Tests
- The Drr scanner provides linear
All CR systems are linear in the photo stimulated
luminescence with radiation dose but may
70000
GVResponsetomAs
IP 1 UR1
IP 2 ST VI
The Drr scanner provides linear
pixel values with the exposure dose
of the IPs.
- The FujiFilm scanner provides
y
provide non linear numeric data
y=0,0001x
2
+8,7975x 338,47
y=8E05x
2
+5,1652x+173,24
y=0,0005x
2
+48,745x 56,281
50000
60000
70000
Scanner 1 DynamIx HR
Scanner 2 Drr HD35
j p
nonlinear values with the exposure
dose of the IPs.
- The data of the DynamIx HR
y=6E06x
2
+1,7255x 167,22
30000
40000
50000
G
r
e
y

V
a
l
u
e
IP1scanner1
IP2scanner1
scanner were read as 12 bit raw data
and linearized with a look up table
(LUT) to linear 16 bit grey values:
Th d t d t f th
10000
20000
IP1scanner2
IP2scanner2
Poly.(IP 1scanner1)
Poly.(IP 2scanner1)
Poly.(IP 1scanner2)
Poly.(IP2scanner2)
- The read out data of the scanner
change depending of the used IP.
- Minor offset and nonlinearity effects
can be seen fromthe figure
No saturation observed
0
0 5000 10000 15000 20000 25000
mAs
can be seen from the figure.
320kV-X-ray tube,
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ISO 16371, ISO 17636
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320 kV X ray tube,
Seifert, Isovolt
Validation of Correlation of SNR and Grey values by
Measurements and Calculations for
Q lifi i f i i l Qualification of imaging plate - scanner systems
- The qualification is based on the correlation of SNR and Pixel Values
of a CR system with fixed scanner settings of a CR system with fixed scanner settings.
- Scanner parameters as gain, scan speed, laser intensity, scan pixel
resolution and others shall not be modified for qualification.
y=4x
0,5
y=1,2x
0,5
SNRMethod
The IPs UR 1 and ST VI were
exposed at different kVs and with
different objects (Al and Fe plates)
of different thickness (10 and 20
SNR = 215
Straight lines in the graph
represent the grey efficiency
as calculated from photon
statistic without considering
100,00
10mm FeSTVI
10mm ALST VI
20mm AlUR1
20mm ALUR 1
20mm ALUR 1
of different thickness (10 and 20
mm) and scanned with the
DynamIx HR with standard
settings.
SNR
max
=215
STVI
g
SNR
max
.
S
N
R
10mm FeUR1
UR1medianSNR Fe19mm 200kV
STVI 200kV 19mm Fe
SNRcalcSTVI
SNRcalcUR 1
SNR photo calc ST VI
All measured SNR values are
always about the same for a
corresponding pixel value.
S f
SNR
max
=165
UR1
10,00
10 100 1000 10000 100000
Greyback
SNRphoto calcST VI
SNRcalcphotoUR 1
Pot.(SNR photocalcST VI)
Pot.(SNR calcphotoUR 1)
measured
PV
SNR
measured IP Photo
PV Eff SNR =
All SNR vs. PV curves can be fitted
with one SNR
max
value and one
grey efficiency Eff
IP
value per IP.
Q lifi ti ti
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ISO 16371, ISO 17636
Ewert, J une 2010
y
2
max
/ ) / (
IP measured measured
measured
Eff PV SNR PV
PV
SNR
+
= Qualification equation:
ODD =25 cm
SNR
D
vs. Normalized SNR
N
m
SNR SNR
6 , 88
=
b
N
SR
SNR SNR =
SR 0 5 U SR
b
= 0.5 U
i
SNR Signal to noise ratio at detector
SNR
N
normalized SNR
SNR
N
is the normalized detector SNR
It is normalized to the standard pixel size of X-ray
filmin accordance to EN 584-1 (classification).
SNR
N
normalized SNR
SR
b
Basic spatial resolution
U
i
inherent detector unsharpness
film in accordance to EN 584 1 (classification).
The normalized SNR
N
considers the basic spatial
resolution SR
b
(also called: effective detector
pixel size) of the detector, measured with the
duplex wire IQI (EN 462-5).
The detector SNR of unsharp detectors is
reduced to the value which is typically measured
ith fil
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ISO 16371, ISO 17636
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with films.
Measurement of Basic Spatial Resolution
Duplex wire IQI
EN 462-5
ISO 19232-5
Determination of the basic
spatial resolution in each
ASTM E 2002
spatial resolution in each
production radiograph is
not required.
SNR controls sufficiently SNR
N
controls sufficiently
the image quality at a
given pixel size.
SNR is a sufficient SNR is a sufficient
parameter, if a maximum
detector unsharpness is
not exceeded not exceeded.
The detector unsharpness
shall be controlled by
reference exposures with reference exposures with
the duplex wire IQI.
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ISO 16371, ISO 17636
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SNR method for determination of
minimum PV
- Make a reference exposure Make a reference exposure
- Determine the GV
mean
and SNR as a graph
- Do one exposure with a step wedge or Do one exposure with a step wedge or
- Do different exposures of the IP without object but with
prefilter p
- Determine the duplex wire reading for determination of the
basic spatial resolution SR
b
p
b
- Determine the SNR
N
values as function of grey value or
dose and determine the maximum achievable SNR
N max
and
N max
classify
- Determine for the specified SNR
N
the corresponding IP
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ISO 16371, ISO 17636
Ewert, J une 2010
system class and add the basic spatial resolution
Proposed reference exposure with step wedge
Alternatively a step exposure can be taken under the same conditions as described
in the standard.
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ISO 16371, ISO 17636
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Calibration graph for SNR in dependence on PV
The following graph should be generated:

180
The SNR number in the
graph are examples.
120
140
160

SNR=150
g p p
The corresponding GVs
can also be used in the
standard practice
60
80
100
S
N
R
SNR=70
SNR=100
standard practice
The following table may
be used to obtain
0
20
40
be used to obtain
recommended minimum
SNR values for IP-
systems with different
0 1000 2000 3000 4000 5000
Greyvalue
Pixel value
systems with different
SR
b
in equivalence to
film system classes.
SR
b
=88,6 m
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Proposedtable6intheoriginalproposalof2033,Annex5,for
definitionofminimumSNRvalues
Measurements have shown that higher SNR
N
values are required than for films. The
new European values are 180, 120, 100, 70 (see revision of EN 14784-2 and ISO
17636 2)
System parameter High definition system Standard system
17636-2)
Duplex wire value 13+
13
12 11
10
9
8
7
Detector-scanner
unsharpness
80 m 100 m 125 m 160 m 200m 260 m 300 m 400 m
unsharpness
Basic spatial CR
system resolution
40 m 50 m 63 m 80 m 100m 130 m 160 m 200 m
SNR levels
Minimum SNR
IP Special 70
85
110 135
170
220
270
340
IPLevel I 45
60
75 90
115
150
180
230
SNR
N
150
100
IP Level I 45 75 90 150 230
IP Level II 35
40
50 65
80
105
130
160
IP Level III
100
70
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Verification from measured data for low SNR
StepwedgeexposurewithTAMIQIsofE1742.
i
l
t
e
r
e
d
H
i
g
h

p
a
s
s

f
i
H
CR of a step wedge with IQIs
Taken at 80 kV and 10 mAmin, 1 m.
At SNR = 36 the 2-2T is clearly visible.
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ISO 16371, ISO 17636
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Classification in EN 14784-1 (also ASTM E 2446) by
SNR
N
and Basic spatial resolution SR
b
Where do the SNR values come from for CR ?
- Equivalence to film systems was used as defined in ISO 11699-1 for the film
t l system classes.
- Films systems have the following minimum SNR values at 88.6 m square
aperture and optical density of 2 above fog and base (see table below)
Minimum gradient-noise Signal to Noise Ratio for
Table for film system classification of international standards:
Minimum gradient noise
ratio for film at
Signal to Noise Ratio for
film and CR
D=2 above D
0
D=2 above D
0
ISO 11699-1
CEN 584-1
USA
ASTM
E181 01
G
2
/o
D
SNR
C1 Special 300 130
C2 270 117
C3 180 78
CEN 584 1
E1815-01
I
C4 150 65
C5 II 120 52
C6 III 100 43
W-A 135
W-B 110
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ISO 16371, ISO 17636
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W-B 110
W-C 80
Classification in EN 14784-1 (also ASTM E 2446) by
SNR
N
and Basic spatial resolution SR
b
Where do the SNR values come from for CR ?
- Minimum normalized SNR
N
and SR
b
requirements for CR classification
Y basic spatial
resolution SR in mm resolution SR
b
in mm
In the mean time all In the mean time all
commercial NDT CR
systems fulfill all IP
classes with classes with
different SR
b
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ISO 16371, ISO 17636
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Annex for Classification in EN 14784-1 (also ASTM E
2446) by SNR
N
and Basic spatial resolution SR
b
SNR
N
SNR
N_max
should be added for a
next revision after finalization of
IP 1
development of ISO 17636.
Efficiency is correctly
IP 1
IP 2
IP 3
IP 4
Exposure Geometry for
t f SNR G
Efficiency is correctly
considered for measurement of
ISO speed
IP 4
IP 5
IP 6
measurement of SNR
N
vs. Grey
values or exposure dose
Log (mAs or GV)
Annex A of EN 14784-1 Annex A of EN 14784 1
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ISO 16371, ISO 17636
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High Definition CR SYSTEM
D HD CR 3 NDT &HD IP
Detailed BAM qualification reports are available for Carestream, Duerr, FujiFilm and GE S&IT
Drr HD-CR 35 NDT & HD-IP
pentaprism speed: 2000 RPM
PMT Voltage: 620 HV
operating pixel size: 20 m operating pixel size: 20 m
IP Scanner System
Hi h D fi iti I i Pl t
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ISO 16371, ISO 17636
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IP Scanner System
High Definition Imaging Plates
Result of Classifications of Different Computed Radiography Systems
350
400
250
300
e
d
200
250
R

n
o
r
m
a
l
i
z
e
100
150
S
N
R
D2, DR, IX25
D3, M100
D4, MX125
FujiFilm CR XG1, ST VI
0
50
D7, AA400
D5, T200
D8, H800
0
0 1 2 3 4 5 6 7 8 9 10
SQRT (Dose / mGy)
Normalized SNR vs square root of Exposure Dose
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ISO 16371, ISO 17636
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Normalized SNR vs. square root of Exposure Dose
Measurement of long term stability for quality
assurance in EN 14784-1 (also ASTM E 2445)
Test phantom with a
variety of IQIs and test y
objects
The test phantom or its
IQIs shall be exposed and
the results shall be
documented periodically documented periodically.
Deviations in the
measured values will
indicate changes , aging
or malfunction.
The frequency of the test The frequency of the test
shall be part of the quality
assurance system of the
manufacturer.
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ISO 16371, ISO 17636
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Documentation of long term stability for quality
assurance in EN 14784-1 (also ASTM E 2445)
The results of the tests can be documented as demonstrated by the following
template
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ISO 16371, ISO 17636
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New Features for Standard Practice in ISO 16371-2
and ISO 17636-2
CR and DR with DDA is proposed in one standard document for ISO 17636-2.
SNR
N
or grey value as equivalent value for film system class and opt. density
and ISO 17636 2
N
g y q y p y
No mandatory requirement of SNR
N
and duplex wire for production radiographs
Usage of duplex wire for system qualification and system selection only
Mandatory usage of duplex wire for magnification technique only Mandatory usage of duplex wire for magnification technique only
Usage of flat cassettes and DDAs for curved objects with new formula for
calculation of SDD
Newrevised unsharpness tables New revised unsharpness tables
3 compensation principles (3
rd
one for DDAs only)
No lead back screens but back scatter protection
L d f t l b 250 kV d t f CR t b l 250kV Lead front screens only above 250 kV mandatory for CR, not below 250kV
(values can be discussed)
New part on DDAs with calibration and bad pixel discussion in ISO 17636-2
Annex C for conversion of SNR and SNR
N
requirements to gray values (for CR)
as equivalent for opt. density.
No use of EPS plates as in ASTM E 2033-2010 proposal.
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ISO 16371, ISO 17636
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New Requirement for Minimum SNR
N
Radiation source Penetrated wall Minimum SNR_D Type and thickness in mm of metal
Cl ass
A
Cl ass
B
X-ray < 50 kV 100 180
thickness w
in mm
y
screen
IP classes are not mentioned
X-ray 50 kV to 150 kV 70 120
X-ray > 150 kV to 250 kV 70 100
w <50 70 100
X-ray >250 kV to 350 kV
in the standard proposal
anymore
NewSNR values were
X ray > 250 kV to 350 kV
w >50 70 70
w <50 70 100
X-ray > 350 kV to 450 kV
w >50 70 70
5 70 120
New SNR
N
values were
taken due to experiences
over years with DDAs and
CR
w <5 70 120
Yb 169
w > 5 70 100
w <50 70 100
Ir 192, Se 75
w >50 70 70 w >50 70 70
w < 100 70 100
Co 60
b

w > 100 70 70
w <100 70 100
X 1 MV
b
X-ray > 1 MV
b

w > 100 70 70
a
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ISO 16371, ISO 17636
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Selection of Radiation Quality vs. Exposure Dose
Compensation Principle (I)
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ISO 16371, ISO 17636
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Compensation Principle (I)
Visibility of IQIs in
dependence on
exposure dose and exposure dose and
tube voltage for steel
- Increasing tube voltage
reduces the specific
contrast b t contrast
eff
but
increases the exposure
dose on the detector
- The increase of SNR
by the improved
quantumstatistic quantum statistic
compensates the loss
of contrast
SNR
CNR
=
IQI-perception (wires, plate holes)
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ISO 16371, ISO 17636
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eff I
Total
SNR
w
=
A
Compensation Principle (I)
The diagram limiting the maximum
tube voltage is not mandatory
anymore anymore
The used tube voltage should be
higher for application of DDAs g pp
The tube voltage should be lower
(about 20%) for application of
i i l t ( di d imaging plates (medium and coarse
grained) for class B inspection in
comparison to film
Compensation principle (I):
Areduction of contrast by increased tube voltage can be compensated by increased A reduction of contrast by increased tube voltage can be compensated by increased
detector SNR. Reduced detector SNR shall be compensated by contrast increase
(e.g. by reduced tube voltage).
33
ISO 16371, ISO 17636
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BAM 5, 8mm steel
Maximum Achieved Contrast Enhancement
Fuji IX25
SNR
norm
~ 265
DDA Technology
provides better provides better
image quality than
film with a
Best (slowest) NDT film
t a
special calibration
procedure!
Images high pass
filtered for better
presentation
PerkinElmer 1620
presentation
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ISO 16371, ISO 17636
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SNR
norm
~ 1500
DDA exposure
Testing with flat Detectors and flat Cassettes is required for
ff ti t ti ith DDA d I i Pl t effective testing with DDAs and Imaging Plates
DDA flat and
Film and CR in contact
b
Cassettes
t
3 / 1
t
b
a
d
f
=
Class A: a = 7,5
Class B: a = 15
f source object distance (SOD)
d focal spot soze
t wall thickness (nominal)
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t d
t wall thickness (nominal)
The correct selection of magnification shall be proven by usage of the duplex wire IQI on the object
Magnification Technique
The correct selection of magnification shall be proven by usage of the duplex wire IQI on the object
in all production radiographs. The duplex wire IQI shall be positioned at the object side near to the
detector, if 2SR
b
>d (d - source size or focal spot size). Otherwise the duplex wire shall be
positioned at the sorce side of the object. It is recommended that a duplex wire is positioned at
both object sides for selection of the mangnification value but only one needs to be seen in the both object sides for selection of the mangnification value, but only one needs to be seen in the
final production radiographs after selection of the correct magnification factor and source size or
focal spot size.

The suitable magnification v can be estimated by the following equation: The suitable magnification v can be estimated by the following equation:


3
3 3
Im
) 2 ( ) (
1
b G
SR u
U
+ = v

Im
(5)
with
) 1 ( =
SOD
SSD
d u
G

SOD
(6)

SR
b
basic spatial resolution of the detector
SDD source detector distance SDD source detector distance
SOD source object distance
u
G
geometrical unsharpness
d focal spot size or source size in accordance with EN 12544 or EN 12579
U
I
required image unsharpness in accordance with table B13 or B14 for class A or B testing
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U
Im
required image unsharpness in accordance with table B13 or B14 for class A or B testing
Magnification Technique

The magnification factor is typically different for source and detector side of the object. Therefore,
the magnification v should be calculated for the object center. The variation of the magnification
l t id dd t t id h ld t b hi h th 25% S ll ifi ti
g q
value at source side and detector side should not be higher than 25%. Smaller magnification
values may be choosen if compensation principle (II) as described in 6.3.3 is used.
L ti
FDD
Location
FOD
FDD
Collimator
Real
focal spot
Object
Intensity
Detector
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Partial presentation of p
table 1, class A of
ISO DIS 10893-7
Minimum requirements
for IQI visibility
SO S In ISO DIS 10893-7 is
the usage of the duplex
wire IQI mandatory.
In prEN 1435-2 the
usage of the duplex wire
shall be mandatory only shall be mandatory only
for system selection,
system qualification and
magnificationtechnique magnification technique.
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Compensation Principle (II)
Compensation of high detector unsharpness by increased SNR
Unsharp digital systems may be applied for NDT if they enable to
compensate the missing sharpness by increased SNR.
That means achieves a digital systemnot the required visibility of the That means, achieves a digital system not the required visibility of the
separated duplex wires, it can be used for NDT, if one or two single
wires more than required (see tables B.1 B.12) can be seen clearly
in the digital image for one or two missing duplex wire pairs in the digital image for one or two missing duplex wire pairs.
For instance, is a digital detection system used, which achieves the
duplex wire pair D11 (first unsharp wire pair) for inspection of a 5 mm
thick object and class B testing (required is D12 and W16), single wire
W17 shall be clearly visible in the image for acceptable quality.
Compensation principle (II): Compensation principle (II):
High detector unsharpness can be compensated by increased SNR
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Compensation Principle (II)
Test sample BAM 5
8 mm steel
Detection of fine flaws with subpixel resolution
highpass highpass
filtered
13 14 15 16 17 18 19
Draht O
3 5 6 8 9
13 14 15 16 17 18 19
C1 film:
wire ~16 visible
DDA ( ifi ti 1)
Draht O
EN 462-1
W13 200m
W14 160m
200m pixel size!
100m contrast resolution
DDA (magnification = 1):
W19 = 50m contrast resolution
W15 130m
W16 100m
W17 80m
W18 63m class B
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200m pixel size!
W18 63m
W19 50m
class B
Compensation Principle (III)
Management of Bad Pixels
The appearance of certain detector elements, which do not perform
as required has initiated a controversial discussion about the
acceptance of DDAs for NDT. p
ASTM E 2597 describes the different types and groups of bad pixels
and provides a recommendation for interpolation.
The interpolation causes local unsharp regions in the digital image.
The detection of small flaws can be achieved if the SNR is
increased.
Compensation principle (III) :
Local unsharpness due to bad pixel interpolation can be
compensated by increases SNR.
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Bad pixel Types and Classifications
Dead Pixel Pixels that have no response, or that give a constant response independent of
radiation dose on the detector.
Over responding pixel Pixels whose gray values are greater than 1.3 times the median
gray value of an area of a minimum of 2121 pixels This test is done on an offset corrected gray value of an area of a minimum of 2121 pixels. This test is done on an offset corrected
image.
Under responding pixel Pixels whose gray values are less than 0.6 times the median gray
value of an area of in a minimum of 2121 pixels. This test is done on an offset corrected
iimage.
Noisy pixel Pixels whose standard deviation in a sequence of 30 to 100 images without
radiation is more than 6 times the median pixel standard deviation for the complete DDA.
Non-uniform pixel Pixel whose value exceeds a deviation of more than +/-1 % of the
median value of its 99 neighbor pixel. The test should be performed on an image where the
average gray value is at or above 75% of the DDAs linear range. This test is done on an
offset and gain corrected image.
Persistence / Lag pixel Pixel whose value exceeds a deviation of more than a factor of 2 Persistence / Lag pixel Pixel whose value exceeds a deviation of more than a factor of 2
of the median value of its 99 neighbors in the first image after X-ray shut down
Bad neighborhood pixel Pixel, where all 8 neighboring pixels are bad pixels, is also
considered a bad pixel.
Single bad pixel Cluster bad pixels
Line of bad pixels
CKP
Cluster kernel pixel (CKP) are pixels which only
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Line of bad pixels Cluster kernel pixel (CKP) are pixels, which only
have four or less good neighborhood pixels
Measurement of Bad Pixel
Bad Pixel Evaluation
ASTM E2597 Manufacturers measure bad pixels and their nature ASTM - E2597 Manufacturers measure bad pixels and their nature
Some classifications of Bad Pixels ...
single dead line (without signal)
cluster (2x3 pixel)
single non uniform line
(signal level varies differently to dose than
signal level of the other lines)
single dead pixel (without signal)
single noisy pixel (> 6 sigma in dark image)
single non uniform pixel
(signal level varies differently with dose than
signal level of the neighboring pixels)
detail from the complete image
signal level of the neighboring pixels)
single lag pixel
(pixel with factor 3 higher lag compared
di l f h l 9 % )
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to median lag of the central 95% area)
Bad Pixels, Relevant and Irrelevant Clusters, and Bad Lines
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Bad Pixel Correction
How Bad Pixels are corrected:
Bad Pixels do not avoid the detection of flaws, if the SNR is high enough
Grid of the detector
The defect pixel is substituted by the The defect pixel is substituted by the
8 neighborhood pixels
one pixel
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one pixel
Worst case scenario - Interpolation
Bad pixels do not look like defects
-Defects have some blur, bad pixels are discrete
A Defect in Material, size of 1.5 pixel
Example:
An area of material with grayvalue 10000.
Th d f t h 2% l d it th th The defect has 2% less density than the
rest.
The defect covers ~ of the pixel (A100).
10100 10038
The substituted Pixel will be:
(3*10100 + 5*10000) / 8 = 10038 == 0.38%
and well visible with SNR>265.
Pixel Grid of the Detector
10000
Bad Pixel
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Pixel Grid of the Detector
Guidance for bad pixel specifications based on CNR and
defect size
Bad pixel
considerations
Bad pixel
considerations
Limited number of
bad pixels allowed in
area of interest
Detectability: positive (best
practice)
area of interest
isolated bad pixels
allowed, but no
clusters allowed
isolated bad pixels
and irrelevant
clusters allowedbut
clusters allowed
clusters allowed but
relevant clusters not
allowed.
impact of different
Defect size (as number of pixels)
impact of different
types of bad pixels
on detectability is
minimal
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Defect size (as number of pixels)
6.9.2 Calibration of DDAs
If using DDAs the detector calibration procedure as recommended by
th f t h ll b li d the manufacturer shall be applied.
The detector shall be calibrated with a background image (without
radiation) and at least with one gain image (X-Rays on and ) g g ( y
homogenously exposed).
Multigain calibration will increase the achievable SNR and linearity but
takes more time All calibration images shall be taken at least with 2 takes more time. All calibration images shall be taken at least with 2
times longer exposure dose (mAmin or GBq min) as finally used for
the production radiographs to minimise the noise introduction of the
lib ti d calibration procedure.
Calibrated images may be treated as unprocessed raw images for
quality assurance if the procedure has been documented. qua ty assu a ce t e p ocedu e as bee docu e ted
The calibration and a bad pixel interpolation shall be performed
periodically and if the exposure conditions are changes significantly.
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B d i l d f i d t t l t f DDA Th d fi d d
6.9.3 Bad pixel interpolation
Bad pixels are underperforming detector elements of DDAs. They are defined and
described in ASTM 2597.
If using DDAs the detector shall be mapped to determine the bad pixel map in
d ith th f t id li Thi b d i l h ll b d t d accordance with the manufacturer guideline. This bad pixel map shall be documented.
The bad pixel interpolation is acceptable and an essential procedure of radiography with
DDAs. It is recommended to apply only detectors which have no cluster kernel pixels
(CKP, definition see inASTME 2597) in the region of interest (ROI). All cluster kenel (CKP, definition see in ASTM E 2597) in the region of interest (ROI). All cluster kenel
pixels shall be documented.
DDAs without CKPs and CR shall be applied for inspection of flaws which are larger than
3x3 pixels for spot like indications and larger than 2x6 pixels for linear indications in the 3x3 pixels for spot like indications and larger than 2x6 pixels for linear indications in the
digital image.
If using DDAs or Imaging plates for inspection of smaller flaw sizes, the required SNR
shall be increased significantly. The inspectionshall be performed on the basis of an shall be increased significantly. The inspection shall be performed on the basis of an
agreement between the contracting parties. The image quality shall be proven as
described above.
Note 3: ote 3
In analogy to the compensation principle (II) the increased SNR compensates also for
the local unsharpness caused by bad pixel interpolation. This is considered as
compensation principle (III).
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p p p ( )
Minimum Requirement for SNR and Lead Screen Thickness
Radiation source Penetrated wall Minimum SNR_D Type and thickness in mm of metal
Cl ass
A
Cl ass
B
Fr on t Back
X-ray < 50 kV 100 180 None None
thickness w
in mm
y
screen
X-ray 50 kV to 150 kV 70 120 Pb 0 - 0,1 Fe 0,5+ Pb
X-ray > 150 kV to 250 kV 70 100 Pb 0 - 0,1 Fe 0,5+ Pb
w <50 70 100 Pb 0 - 0,2 Fe 0,5+ Pb
X-ray >250 kV to 350 kV X ray > 250 kV to 350 kV
w >50 70 70 Pb 0,1 - 0,3 Fe 0,5+ Pb
w <50 70 100 Pb 0,1 - 0,3 Fe 0,5+ Pb
X-ray > 350 kV to 450 kV
w >50 70 70 Pb 0,1 - 0,3 Fe 0,5+ Pb
5 70 120 Pb 0 0 1 F 0 5 Pb w <5 70 120 Pb 0 - 0,1 Fe 0,5+ Pb
Yb 169
w > 5 70 100 Pb 0 - 0,1 Fe 0,5+ Pb
w <50 70 100 Pb 0,1 - 0,3 Fe 0,5+ Pb
Ir 192, Se 75
w >50 70 70 Pb 0 1 - 0 4 Fe 0 5+Pb w >50 70 70 Pb 0,1 - 0,4 Fe 0,5+ Pb
w < 100 70 100 Fe 0,5+Pb 1,5 Fe 0,5+Pb
Co 60
b

w > 100 70 70 Fe 0,5+Pb 2,0 Fe 0,5+Pb
w <100 70 100 Fe 0,5+Pb 1,5 Fe 0,5+Pb
X 1 MV
b
X-ray > 1 MV
b

w > 100 70 70 Fe 0,5+Pb 2,0 Fe 0,5+Pb
a
.
b

In case of multiple screens (Fe+Pb) the steel screen shall be located between the IP and the lead screen.
Instea
Fe or Fe+Pb also copper tantalumor tungsten screens may be used if the image quality can be proven
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Fe or Fe+Pb also copper, tantalum or tungsten screens may be used if the image quality can be proven.
Edge Profiles
220 kV, no Pb back screen
Effect of
Scatter Unsharpness
Effect of
Scatter Unsharpness
Scatter Effects at
sharp edges:
- Internal scatter in the
220 kV 4 mmPb back screen
layer
- Internal scatter of the
back screen support
Long range
220 kV, 4 mm Pb back screen
back screen, support
and cassette
- Object scatter
unsharpness
effect from lead
back screen,
cassette and
support
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END END
www.bam.de
uwe.ewert@bam.de
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