A Fast Fpga Based Architecture For Measuring The Distance Between

INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATION ENGINEERING & TECHNOLOGY (IJECET)
ISSN 0976 6464(Print) ISSN 0976 6472(Online) Volume 4, Issue 3, May June, 2013, pp. 01-10 IAEME: www.iaeme.com/ijecet.asp Journal Impact Factor (2013): 5.8896 (Calculated by GISI) www.jifactor.com
International Journal of Electronics and Communication Engineering & Technology (IJECET), ISSN 0976 6464(Print), ISSN 0976 6472(Online) Volume 4, Issue 3, May June (2013), IAEME
IJECET
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A FAST FPGA BASED ARCHITECTURE FOR MEASURING THE DISTANCE BETWEEN TWO COLOR IMAGES USING MANHATTAN DISTANCE METRIC
A. Hasnat1, S. Halder1, A. Hoque2, D. Bhattacharjee3, M. Nasipuri 3
1
Dept. of Computer Science and Engineering, Government College of Engineering Textile Technology, Berhampore, West Bengal, India, 2 Research Scholar, Kalyani University, West Bengal, India 3 Dept. of Computer Science and Engineering, Jadavpur University, Kolkata, India,
ABSTRACT This paper presents an efficient FPGA based architecture for measuring the distance between two RGB color images using Manhattan distance. There are a lot of research works in literature to measure the distance between two images of same size like Euclidean method, Manhattan distance, Vector Cosine Angle Distance, Modified Euclidean distance based on histogram etc. In the present work, Manhattan distance metric is used to measure the distance between two images due to its simplicity and wide acceptability and the FPGA implementation of Manhattan distance method is designed in an efficient way. The result shows that the architecture is able to operate at 171.585 MHz speed which is faster than any software solution. Keywords: Distance metric, Manhattan distance, FPGA. I. INTRODUCTION
Image processing has become a vibrant area of research over the last few years and distance measurement between two images is needed in many applications of it [1][2][3]. There exist different distance metrics to measure the distance between two images of same size i.e. Manhattan Distance [4][5], Euclidean Distance[4][5], Vector Cosine Angle Distance(VCAD) [5][6], Modified Euclidean Distance based on histogram index[4][5] etc. Among these distance metrics, Manhattan distance and Euclidean distance gives the metric of dissimilarity whereas Vector Cosine Angle Distance and Modified Euclidean distance gives
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the metric of similarity [6]. As the Manhattan Distance metric is the simple one, this paper focuses on implementation FPGA based architecture for it. FPGA (Field Programmable Gate Array) design allows designers to design their own modules according to their needs and upgrade the system conveniently. The system design based on FPGA is flexible with the advantages of parallelism, low cost and low power consumption [7]. The main purpose of our work is to design a feasible hardware circuits based on FPGA for Manhattan distance to measure distance between two images of same size to improve the processing speed. This paper is organized as follows: The section II presents the preprocessing of the images needed for the FPGAA architecture. Section III presents the top level design of the circuit. Section IV depicts the proposed system architecture for Manhattan distance metric. Section V shows the experimental results and finally section VI concludes and remarks about some of the aspects analyzed in this paper of the paper. II. PREPROCESSING
The proposed architecture for Manhattan Distance metric is implemented on Xilinx Spartan3 XC3S50-5PQ208 FPGA. As the division operation is not allowed and division is needed to calculate average distance in the present work images are resized into power of two as average could be performed by only shift operation. So in this work each image is resized into pixel size. Fig. 1(b) shows the resized images of the original images shown in Fig. 1(a)
(a) (b) (c) (d) (e) (f)
(a)
(b)
Figure 1: Example of preprocessing (a) Original images (b) Resized images
Another preprocessing is done for giving the input to the FPGA module. Two input text files have been generated using Matlab containing the Red, Green and Blue intensity of a pixel in each row of the text file for two input images. III. MANHATTAN DISTANCE
The Manhattan distance computes the sum of difference in each dimension of two vectors in n dimensional vector space. It is the sum of the absolute differences of their corresponding components. Manhattan distance is also called the L1 distance. If u = ( x1 , x 2 ....xn ) and v = ( y1 , y 2 ..... y n ) are two vectors in n dimensional hyper plane, then the Manhattan Distance MD(u , v) between two vectors u, v is given by the Eq. 1.
MD (u , v ) = x1 y1 + x 2 y 2 + .... + x n y n
n
xi yi
i =1
(1)
Now for two RGB scale images of size p q , I1 (a, b, c) and I 2 (a, b, c) where a = 1,2.... p ,
b = 1,2..q and c = 1,2,3 where c represents color intensity values Red, Green, Blue respectively. Manhattan Distance is measured using Eq. 2.
p q 3
MD( I1 , I 2 ) =
I1 (a, b, c) I 2 (a, b, c)
a =1 b=1 c=1
(2)
As the number of pixels, n which falls in skin region varies with varying size of the image, so rather than taking the absolute distance further the distance is being normalized using Eq. 3.
MD1 ( I1 , I 2 ) = MD( I1 , I 2 ) n
(3)
where n=total number of pixels considered. IV. TOP LEVEL DESIGN
The top level design of FPGA architecture for Manhattan distance metric is shown in Fig 2. The proposed architecture takes one 8-bit value for each of the Red, Green, Blue color channels for each pixel of the 1st image as input { R1 , G1 , B1 }. Likewise it also takes one 8-bit value for each of the red, green, blue color channels for each pixel of 2nd image as input{ R2 , G2 , B2 }. Then the system calculates absolute difference between {R1 R2 }, {G1 G2 } and {B1 B 2 } . Then the system sums up all these absolute difference. This process is continued for all the pixels. After calculation of summation for all pixels the sum is divided by number of pixels considered that is 128x128=16384 for the present system to get the average value. Fig. 2 shows the top level design of proposed architecture.
Figure 2: Top level Design Manhattan Distance metric V. SYSTEM ARCHITECTURE
The proposed architecture of FPGA based Manhattan distance measurement of two images is shown in Fig. 3. The architecture contains three modules for subtraction, three modules for addition and one module for addition followed by division. The division is achieved by shifting operation. The modeling of the internal architecture of each block has been designed using Very high-speed integrated circuit Hardware Description Language (VHDL). Each block is controlled by a global clock.
Figure 3: System architecture of FPGA based Manhattan Distance calculation
A. Subtractor Module These modules take two 8-bit inputs and produce their absolute subtraction value in 8bit. These blocks offer a latency of one clock cycle each. The symbolic representation of a subtractor block is shown in Fig. 4. Algorithm 1 describes the function of these modules.
Figure 4: Symbolic representation of subtractor block Algorithm 1 Algorithm Subtractor {Input: I1, I2} {Output: O} Begin O = I1 I 2 ; End {End of Algorithm} B. Adder Module These modules take one 8-bit input and one 22-bit input and produce their summation value in 22-bit. These blocks offer a latency of one clock cycle each. The symbolic representation of Adder block is shown in Fig. 5. Algorithm 2 describes the function of these modules.
Figure 5: Symbolic representation of adder block
Algorithm 2 Algorithm Adder {Input: I1(in 8bits), I2(in 22 bits)} {Output: O} Begin //Append 14 zeros in left hand side of I1 to convert it into 22 //bits. I11 = "00000000000000" & I1; // Add I11 and I2 O = I11 + I2; End {End of Algorithm} C. Adder with Shifter Module These modules take three 22-bit inputs, add them and produce divides the sum with 128128. Here the division is performed by shifting the sum by 14 bits right shift. This block offers a latency of one clock cycle. The symbolic representation of Adder block is shown in Fig. 6. Algorithm 3 describes the function of these modules.
Figure 6: Symbolic representation of adder with shifter block Algorithm 3 Algorithm Adder with Shifter {Input: I1 (in 22 bits), I2 (in 22 bits), I3 (in 22 bits)} {Output: O (in 10 bits)} Begin I123 = I1 + I2 + I3; O = I123 >> 14; End {End of Algorithm}
VI.
RTL SIMULATION
Simulation for the FPGA based Manhattan distance calculation architecture described in this paper is done with the Model SimSE 6.2c. For the testing of the system correctness a testbench file is written in VHDL. The testbench file reads the values of R1, G1, B1 for a pixel of the first image from a text file named Input1.txt and the values of R2, G2, B2 of
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second image from a text file called Input2.txt. The testbench writes the result in a different text file called Output.txt. The simulation result for the testbench is shown in the Fig. 7.
Figure 7: Simulation Result VII. EXPERIMENTAL RESULT
The FPGA based Manhattan distance calculation architecture was implemented on VHDL, synthesized for a Xilinx Spartan 3 XC3S50-5PQ208 FPGA with simulation on the Modelsim 6.2c from Mentor Graphics Corporation. The device utilization summary is given in Table 1. The architecture is capable of operating at a clock frequency of 171.585 MHz or the minimum clock period is 5.828 ns. Hence for calculating the Manhattan distance of two images having image size 128128 requires 0.095 ms. TABLE 1: DEVICE UTILIZATION SUMMARY Usage Total Number of Slices 100 1408 Number of Slice Flip Flops 100 2816 Number of 4 input LUTs 180 2816 6% Number of bonded IOBs 58 140 41% Number of GCLKs 1 4 6%
Percentage 7% 3%
Some sample results with calculating Manhattan distance is shown in Fig. 8 to Fig. 14.
(a)
(b) Manhattan distance=127
Figure 8: Manhattan distance (a) Image1 (b) Image2
(b) Manhattan distance=214 Figure 9: Manhattan distance (a) Image1 (b) Image2
(a)
(a)
(b)
Manhattan distance=127 Figure 10: Manhattan distance (a) Image1 (b) Image2
(a)
(a) (b) Manhattan distance=117 Figure 12: Manhattan distance (a) Image1 (b) Image2
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(a)
(a)
(a)
VIII.
CONCLUSION
The FPGA based architecture for calculating the Manhattan distance between two images is useful in many image processing applications. This architecture is capable of operating at a speed 171.585 MHz on a Vertex 2P FPGA kit which is much faster than any software solution and hence the proposed methodology is applicable in a real time system.
ACKNOWLEDGMENT Authors are thankful to the "Center for Microprocessor Application for Training Education and Research", "Project on Storage Retrieval and Understanding of Video for Multimedia" at Computer Science & Engineering Department, Jadavpur University, for providing infrastructural facilities during progress of the work. Two of the authors, Dr. Santanu Halder and Mr. Abul Hasnat, are thankful to Government College of Engineering and Textile Technology, Berhampore,WB for kindly permitting them to carry on the research work. REFERENCES [1] R. C. Gonzalez, R. E. Woods, S. L. Eddins, Digital Image processing using MATLB, Mc-Graw Hill, 2011. [2] W. K. Pratt, Digital image processing, A Wiley Interscience Publication, 1991. [3] R. C. Gonzalez, R. E. Woods, Digital Image Processing, Addison Wesley, 2002. [4] Jain Anil K,Vailaya Aditya, (1996), Image retrieval using color and shape, Pattern Recognition, Volume 29, Issue 8, Pages 12331244. [5] Abul Hasnat, Santanu Halder, D. Bhattacharjee, M. Nasipuri, D. K. Basu, Comparative Study of Distance Metrics for Finding Skin Color Similarity of Two Color Facial Images, ACER 2013, pp. 99108, 2013, DOI : 10.5121/csit.2013.3210. [6] A Vadivel, A K Majumdar, Shamik Sural, ( 2003),Performance comparison of distance metrics in content-based Image retrieval applications, International Conference on Information Technology (CIT), Bhubaneswar, India, pp. 159-164.. [7] Jayaram Bhasker, A VHDL Primer, 3rd edition, P T R Prentice Hall, 1998. [8] K.Ganapathi Babu, A.Komali, V.Satish Kumar and A.S.K.Ratnam, An Overview of Content Based Image Retrieval Software Systems, International journal of Computer Engineering & Technology (IJCET), Volume 3, Issue 2, 2012, pp. 424 - 432, ISSN Print: 0976 6367, ISSN Online: 0976 6375. [9] Abhishek Choubey , Omprakash Firke and Bahgwan Swaroop Sharma, Rotation and Illumination Invariant Image Retrieval using Texture Features, International Journal of Electronics and Communication Engineering &Technology (IJECET), Volume 3, Issue 2, 2012, pp. 48 - 55, ISSN Print: 0976- 6464, ISSN Online: 0976 6472. [10] Tarun Dhar Diwan and Upasana Sinha, Performance Analysis Is Basis on Color Based Image Retrieval Technique, International Journal of Computer Engineering & Technology (IJCET), Volume 4, Issue 1, 2013, pp. 131 - 140, ISSN Print: 0976 6367, ISSN Online: 0976 6375.
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INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATION ENGINEERING & TECHNOLOGY (IJECET)

(a) (b) (c) (d) (e) (f)

Figure 1: Example of preprocessing (a) Original images (b) Resized images

where n=total number of pixels considered. IV. TOP LEVEL DESIGN

Figure 2: Top level Design Manhattan Distance metric V. SYSTEM ARCHITECTURE

Figure 3: System architecture of FPGA based Manhattan Distance calculation

Figure 5: Symbolic representation of adder block

Figure 7: Simulation Result VII. EXPERIMENTAL RESULT

(b) Manhattan distance=127

Figure 8: Manhattan distance (a) Image1 (b) Image2

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