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Table of Contents
I IMORTANT NOTICE..... 1 I INTRODUCTION... 5 III DIAGRAM OF A SYSTEM....9 IV OPERATION.11 V SERIAL I/O INTERFACE...... 25 VI SPECIFICATION... 29 VII APPLICATION NOTES..... 33 VIII WARRANTY/SERVICE.....37 APPENDIX A..... 39 APPENDIX B.41
Table of Contents
I IMORTANT NOTICE..... 1 I INTRODUCTION... 5 III DIAGRAM OF A SYSTEM....9 IV OPERATION.11 V SERIAL I/O INTERFACE...... 25 VI SPECIFICATION... 29 VII APPLICATION NOTES..... 33 VIII WARRANTY/SERVICE.....37 APPENDIX A..... 39 APPENDIX B.41
General Warnings
Proper use of ultrasonic test equipment requires three essential elements:
General Warnings
Proper use of ultrasonic test equipment requires three essential elements:
Selection of the correct test equipment. Knowledge of the specific test application requirements. Training on the part of the instrument operator.
Selection of the correct test equipment. Knowledge of the specific test application requirements. Training on the part of the instrument operator.
This operational manual provides instruction in the basic set up and operation of the StressTel thickness gauge. There are, however, additional factors which affect the use of ultrasonic test equipment. Specific information regarding these additional factors is beyond the scope of this manual. The operator should refer to textbooks on the subject of ultrasonic testing for more detailed information.
This operational manual provides instruction in the basic set up and operation of the StressTel thickness gauge. There are, however, additional factors which affect the use of ultrasonic test equipment. Specific information regarding these additional factors is beyond the scope of this manual. The operator should refer to textbooks on the subject of ultrasonic testing for more detailed information.
Operator Training
Operators must receive adequate training before using ultrasonic test equipment. Operators must be trained in general ultrasonic testing procedures and in the set up and performance required by a particular test. Operators must understand:
Operator Training
Operators must receive adequate training before using ultrasonic test equipment. Operators must be trained in general ultrasonic testing procedures and in the set up and performance required by a particular test. Operators must understand:
Soundwave propagation theory. Effects of the velocity of sound of the test material. Behavior of the sound wave where two different materials are in contact.
Soundwave propagation theory. Effects of the velocity of sound of the test material. Behavior of the sound wave where two different materials are in contact.
Areas covered by the sound beam. More specific information about operator training, qualifications, certification, and test specifications is available from various technical societies, industry groups, and government agencies.
Areas covered by the sound beam. More specific information about operator training, qualifications, certification, and test specifications is available from various technical societies, industry groups, and government agencies.
Testing Limitations
In ultrasonic testing, information is obtained only from within the limits of the sound beam. Operators must exercise great caution in making inferences about the test material outside the limits of the sound beam. For example, when testing large materials it may be impossible or impractical to inspect the entire test piece. When a less-than-complete inspection is to be performed, the operator must be shown the specific areas to inspect. Inferences about the condition of areas not inspected, based on data from the evaluated areas, should only by attempted by personnel fully trained in applicable statistical and probability techniques. In particular, materials subject to erosion or corrosion, in which conditions can vary significantly in any given area, should only be evaluated by fully trained and experienced operators. Sound beams reflect from the first interior surface encountered. Because of part geometry and overlapped flaws or overlapped surfaces, thickness gauges may measure the distance to an internal flaw rather than to the back wall of the material. Operators must take steps to ensure that the entire thickness of the test material is being examined.
Testing Limitations
In ultrasonic testing, information is obtained only from within the limits of the sound beam. Operators must exercise great caution in making inferences about the test material outside the limits of the sound beam. For example, when testing large materials it may be impossible or impractical to inspect the entire test piece. When a less-than-complete inspection is to be performed, the operator must be shown the specific areas to inspect. Inferences about the condition of areas not inspected, based on data from the evaluated areas, should only by attempted by personnel fully trained in applicable statistical and probability techniques. In particular, materials subject to erosion or corrosion, in which conditions can vary significantly in any given area, should only be evaluated by fully trained and experienced operators. Sound beams reflect from the first interior surface encountered. Because of part geometry and overlapped flaws or overlapped surfaces, thickness gauges may measure the distance to an internal flaw rather than to the back wall of the material. Operators must take steps to ensure that the entire thickness of the test material is being examined.
1.
1.
The principle of operation of an ultrasonic thickness gauge is that the instrument measures the time of flight of an ultrasonic pulse through the test piece and multiplies this time by the velocity of sound in the material. Thickness measuring error is minimized by ensuring that the sound velocity to which the instrument is calibrated is the sound velocity of the material being tested. Actual sound velocities in materials often vary significantly from the values found in published tables. In all cases, best results are obtained if the instrument is calibrated on a velocity reference block made from the same material as the test piece this block should be flat and smooth and as thick as the maximum thickness of the test piece.
The principle of operation of an ultrasonic thickness gauge is that the instrument measures the time of flight of an ultrasonic pulse through the test piece and multiplies this time by the velocity of sound in the material. Thickness measuring error is minimized by ensuring that the sound velocity to which the instrument is calibrated is the sound velocity of the material being tested. Actual sound velocities in materials often vary significantly from the values found in published tables. In all cases, best results are obtained if the instrument is calibrated on a velocity reference block made from the same material as the test piece this block should be flat and smooth and as thick as the maximum thickness of the test piece.
Operators should also be aware that the sound velocity may not be constant in the material being tested; heat-treating, for example, can cause significant changes in sound velocity. This must be considered when evaluating the accuracy of the thickness provided by this instrument. Instruments should always be calibrated before testing, and the calibration should be checked after testing, to minimize testing errors.
Operators should also be aware that the sound velocity may not be constant in the material being tested; heat-treating, for example, can cause significant changes in sound velocity. This must be considered when evaluating the accuracy of the thickness provided by this instrument. Instruments should always be calibrated before testing, and the calibration should be checked after testing, to minimize testing errors.
2.
2.
The probe zero procedure must be performed as described in this manual. The probe zero block should be clean, in good condition, without noticeable wear. Failure to properly perform the probe zero procedure will cause inaccurate thickness readings.
The probe zero procedure must be performed as described in this manual. The probe zero block should be clean, in good condition, without noticeable wear. Failure to properly perform the probe zero procedure will cause inaccurate thickness readings.
3.
3.
Temperature variations change the sound velocity of materials and transducer delay lines and, therefore, calibrations. All calibrations should be performed on-site, and with test blocks at the same temperature as the test piece, to minimize errors due to temperature variations.
Temperature variations change the sound velocity of materials and transducer delay lines and, therefore, calibrations. All calibrations should be performed on-site, and with test blocks at the same temperature as the test piece, to minimize errors due to temperature variations.
4.
Transducer Selection
4.
Transducer Selection
The transducer used in testing must be in good condition without noticeable wear of the front surface. Badly worn transducers will have a reduced effective measuring range. The specified range of the transducer must include the complete range of thicknesses to be tested. The temperature of the material to be tested must be within the transducers temperature range. 5. Use of Couplants
The transducer used in testing must be in good condition without noticeable wear of the front surface. Badly worn transducers will have a reduced effective measuring range. The specified range of the transducer must include the complete range of thicknesses to be tested. The temperature of the material to be tested must be within the transducers temperature range. 5. Use of Couplants
Operators must be familiar with the use of ultrasonic couplants. Testing skills must be developed so that couplant is used and applied in a consistent manner to minimize variations in couplant layer thickness and errors in test results. Calibration and actual testing should be performed under similar coupling conditions, using a minimum amount of couplant and applying consistent pressure on the transducer.
Operators must be familiar with the use of ultrasonic couplants. Testing skills must be developed so that couplant is used and applied in a consistent manner to minimize variations in couplant layer thickness and errors in test results. Calibration and actual testing should be performed under similar coupling conditions, using a minimum amount of couplant and applying consistent pressure on the transducer.
6.
Doubling
6.
Doubling
Ultrasonic thickness gauges will, under certain conditions, display readings which are twice (or, in some cases, three times) the actual material thickness being measured. This effect, commonly known as doubling, can occur
Ultrasonic thickness gauges will, under certain conditions, display readings which are twice (or, in some cases, three times) the actual material thickness being measured. This effect, commonly known as doubling, can occur
below the minimum specified range of the transducer. If the transducer being used is worn, doubling is possible at a thickness greater than the minimum of the specified range. When using anew transducer, any reading which is less than twice the minimum specified range of the transducer may be a doubled reading, and the thickness of the material being tested should be verified by the use of other methods. If the transducer shows any sign of wear, doubling may occur at a thickness greater than twice the minimum of the specified range. This thickness should be determined by calibrating the instrument/transducer combination on reference blocks that represent the complete range of possible thicknesses that may be encountered in testing. This is particularly important when the test piece is being ultrasonically measured for the first time or in any case where the history of thickness of the test specimen is unknown.
below the minimum specified range of the transducer. If the transducer being used is worn, doubling is possible at a thickness greater than the minimum of the specified range. When using anew transducer, any reading which is less than twice the minimum specified range of the transducer may be a doubled reading, and the thickness of the material being tested should be verified by the use of other methods. If the transducer shows any sign of wear, doubling may occur at a thickness greater than twice the minimum of the specified range. This thickness should be determined by calibrating the instrument/transducer combination on reference blocks that represent the complete range of possible thicknesses that may be encountered in testing. This is particularly important when the test piece is being ultrasonically measured for the first time or in any case where the history of thickness of the test specimen is unknown.
Chapter II Introduction
1.1 Foreword
The MU-GAGE PLUS Ultrasonic Thickness Gauge is a hand held, microprocessor controlled instrument for thickness measurement of a wide variety of fabricated parts, especially where conditions allow access to one side only. The MU-GAGE PLUS provides precision thickness measurement of most metals, plastics, and other materials, including differential measurements, showing the variation from a preset nominal value. Readings are displayed in the four digit Liquid Crystal Display (LCD) of the instrument, with resolution of up to 0.0001 in or 0.001mm. A variety of contact and delay line ultrasonic probes can be used with the MUGAGE PLUS, including probes designed for plastics. This versatility makes the MU-GAGE PLUS useful even in difficult applications, such as complex geometries, areas of limited access, and attenuative materials. Readings can be sent to an auxiliary device and are recorded by pressing the SEND key. 24-column reports showing measurement, statistical and instrument data can be transmitted to a serial printer or computer.
Chapter II Introduction
1.1 Foreword
The MU-GAGE PLUS Ultrasonic Thickness Gauge is a hand held, microprocessor controlled instrument for thickness measurement of a wide variety of fabricated parts, especially where conditions allow access to one side only. The MU-GAGE PLUS provides precision thickness measurement of most metals, plastics, and other materials, including differential measurements, showing the variation from a preset nominal value. Readings are displayed in the four digit Liquid Crystal Display (LCD) of the instrument, with resolution of up to 0.0001 in or 0.001mm. A variety of contact and delay line ultrasonic probes can be used with the MUGAGE PLUS, including probes designed for plastics. This versatility makes the MU-GAGE PLUS useful even in difficult applications, such as complex geometries, areas of limited access, and attenuative materials. Readings can be sent to an auxiliary device and are recorded by pressing the SEND key. 24-column reports showing measurement, statistical and instrument data can be transmitted to a serial printer or computer.
1.2
1.2
Serial I/O port provides ASCII output, in five selectable languages, to IBM compatible personal computers and most serial printers. Individual readings can be transmitted, via the Serial I/O port, to a Mitutoyo data collection device. Differential Offset mode shows the deviation of the measurement from a user set nominal value. HI/LO Tolerance Limits/Alarm mode visually alerts the operator when a reading exceeds the user programmed minimum or maximum value. On board memory saves the most recent calibration settings and operating mode when the MU-GAGE PLUS power is turned off. Four AA replaceable alkaline batteries provide over 35 hours of operation. Selectable electroluminescent backlight permits use in low light conditions.
Serial I/O port provides ASCII output, in five selectable languages, to IBM compatible personal computers and most serial printers. Individual readings can be transmitted, via the Serial I/O port, to a Mitutoyo data collection device. Differential Offset mode shows the deviation of the measurement from a user set nominal value. HI/LO Tolerance Limits/Alarm mode visually alerts the operator when a reading exceeds the user programmed minimum or maximum value. On board memory saves the most recent calibration settings and operating mode when the MU-GAGE PLUS power is turned off. Four AA replaceable alkaline batteries provide over 35 hours of operation. Selectable electroluminescent backlight permits use in low light conditions.
1.2
1.2
Contact Technique
Contact probes are useful for a wide range of applications. The protective wearplate on the face of the probe provides durability and acoustic matching to extend the measuring range of the probe. Use a contact probe when the thickness to be measured could exceed 1.0 inch (25 mm), or equivalent, of steel. Do not use a contact probe if thicknesses less than 0.080 inch (2.0 mm) of steel are expected. A short ultrasonic pulse is transmitted into the part by the probe (transducer). The pulse travels through the part until it reaches the back surface, where it is reflected back to the probe. The time needed for the ultrasonic pulse to make the round trip through the part is divided by two and multiplied by the velocity of sound in the test material to determine the thickness of the part.
Contact Technique
Contact probes are useful for a wide range of applications. The protective wearplate on the face of the probe provides durability and acoustic matching to extend the measuring range of the probe. Use a contact probe when the thickness to be measured could exceed 1.0 inch (25 mm), or equivalent, of steel. Do not use a contact probe if thicknesses less than 0.080 inch (2.0 mm) of steel are expected. A short ultrasonic pulse is transmitted into the part by the probe (transducer). The pulse travels through the part until it reaches the back surface, where it is reflected back to the probe. The time needed for the ultrasonic pulse to make the round trip through the part is divided by two and multiplied by the velocity of sound in the test material to determine the thickness of the part.
Delay Technique
Delay line probes provide better resolution of thin materials than contact probes by separating the active element of the probe from the surface of the material under test. The maximum thickness range of a delay line probe is limited, however, by the length of the delay line. A delay line probe must be used when thicknesses less than 0.080 inch (2.0 mm) are expected. Do not use a delay line probe to measure thicknesses greater than the length of the delay line. Measurement of the round trip transit time of the pulse begins with the interface echo, which is produced when a portion of the ultrasonic pulse is reflected at the interface between the delay line and front surface of the part being measured. Depending on part thickness, the MU-GAGE PLUS automatically chooses either to measure from the interface echo to the first backwall echo, called the interface to first mode, or to measure between consecutive backwall echoes, called the multi-echo mode.
Delay Technique
Delay line probes provide better resolution of thin materials than contact probes by separating the active element of the probe from the surface of the material under test. The maximum thickness range of a delay line probe is limited, however, by the length of the delay line. A delay line probe must be used when thicknesses less than 0.080 inch (2.0 mm) are expected. Do not use a delay line probe to measure thicknesses greater than the length of the delay line. Measurement of the round trip transit time of the pulse begins with the interface echo, which is produced when a portion of the ultrasonic pulse is reflected at the interface between the delay line and front surface of the part being measured. Depending on part thickness, the MU-GAGE PLUS automatically chooses either to measure from the interface echo to the first backwall echo, called the interface to first mode, or to measure between consecutive backwall echoes, called the multi-echo mode.
MU-GAGE PLUS
MU-GAGE PLUS
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10
Chapter IV Operation
4.1 Battery Installation
To install batteries in the MU-GAGE PLUS, loosen the two end panel screws on the bottom of the instrument and slide out the battery holder and end cap assembly. The assembly connects to the MU-GAGE PLUS circuit board with a polarized connector. This may be easily disconnected by pulling on the shell of the connector. Insert 4 AA alkaline batteries. The MU-GAGE PLUS is protected against incorrect battery installation. If the batteries are installed with polarity reversed, no damage to the MU-GAGE PLUS will occur, but the instrument will not operate. After the batteries have been installed, reconnect the cable to the printed circuit board and carefully replace the battery holder assembly. Finally, replace and tighten the screws. NOTE: When the low battery indicator appears, batteries should be replaced at once. The MU-GAGE PLUS automatically turns off when the batteries become too weak for reliable operation. When testing in remote locations, always carry spare batteries.
Chapter IV Operation
4.1 Battery Installation
To install batteries in the MU-GAGE PLUS, loosen the two end panel screws on the bottom of the instrument and slide out the battery holder and end cap assembly. The assembly connects to the MU-GAGE PLUS circuit board with a polarized connector. This may be easily disconnected by pulling on the shell of the connector. Insert 4 AA alkaline batteries. The MU-GAGE PLUS is protected against incorrect battery installation. If the batteries are installed with polarity reversed, no damage to the MU-GAGE PLUS will occur, but the instrument will not operate. After the batteries have been installed, reconnect the cable to the printed circuit board and carefully replace the battery holder assembly. Finally, replace and tighten the screws. NOTE: When the low battery indicator appears, batteries should be replaced at once. The MU-GAGE PLUS automatically turns off when the batteries become too weak for reliable operation. When testing in remote locations, always carry spare batteries.
4.2
Display Symbols
4.2
Display Symbols
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11
Carat lights when the MU-GAGE PLUS is in the Normal Thickness Measurement mode. VEL Carat lights when the MU-GAGE PLUS is in the Material Velocity mode. PRB Carat lights when the MU-GAGE PLUS is in the Probe Selection mode. Carat lights when the MU-GAGE PLUS is in the Differential DIF Offset Measurement mode. HI/LO Carat lights when the MU-GAGE PLUS is in the HI/LO Tolerance Limits Alarm setup mode. Carat lights when the Display Backlight Control mode is LT enabled. Over range indicator lights in manual display resolution when ? the reading exceeds available digits + indicates greater than, and indicates less than in DIF + mode, and when displayed value is outside tolerance limits in HI/LO mode. The low battery indicator lights when batteries should be replaced. The coupling indicator lights when satisfactory acoustic coupling between the probe and test piece has been achieved. CAL The CAL annunciator flashes when the CAL key is pressed. The scrolling keys are enabled to modify the displayed value or control parameter. MM Unit of measure of displayed value is millimeters (X.XXX or XX.XX km/s in VEL mode.) Unit of measure displayed value is inches (10 in/s in VEL IN mode.)
THK
Carat lights when the MU-GAGE PLUS is in the Normal Thickness Measurement mode. VEL Carat lights when the MU-GAGE PLUS is in the Material Velocity mode. PRB Carat lights when the MU-GAGE PLUS is in the Probe Selection mode. Carat lights when the MU-GAGE PLUS is in the Differential DIF Offset Measurement mode. HI/LO Carat lights when the MU-GAGE PLUS is in the HI/LO Tolerance Limits Alarm setup mode. Carat lights when the Display Backlight Control mode is LT enabled. Over range indicator lights in manual display resolution when ? the reading exceeds available digits + indicates greater than, and indicates less than in DIF + mode, and when displayed value is outside tolerance limits in HI/LO mode. The low battery indicator lights when batteries should be replaced. The coupling indicator lights when satisfactory acoustic coupling between the probe and test piece has been achieved. CAL The CAL annunciator flashes when the CAL key is pressed. The scrolling keys are enabled to modify the displayed value or control parameter. MM Unit of measure of displayed value is millimeters (X.XXX or XX.XX km/s in VEL mode.) Unit of measure displayed value is inches (10 in/s in VEL IN mode.)
THK
12
12
4.3
Keyboard Controls
4.3
Keyboard Controls
4.3.1
4.3.1
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13
NOTE: The scrolling keys are also used to change the resolution and unit of measure (IN or MM) of displayed values by pressing both keys simultaneously in THK or DIF mode (CAL annunciator must be off.) Transmits data to an external device via the Serial I/O port. The function of the SEND key is dependent upon the type of cable connected to the Serial I/O port. Note: Thickness reading transmission to a Mitutoyo data processor is initiated from the Mitutoyo device.
NOTE: The scrolling keys are also used to change the resolution and unit of measure (IN or MM) of displayed values by pressing both keys simultaneously in THK or DIF mode (CAL annunciator must be off.) Transmits data to an external device via the Serial I/O port. The function of the SEND key is dependent upon the type of cable connected to the Serial I/O port. Note: Thickness reading transmission to a Mitutoyo data processor is initiated from the Mitutoyo device.
The CLEAR key is active during the Thickness Review and File Select functions. Momentarily pressing CLEAR clears the displayed reading during Thickness Review. Pressing and holding CLEAR for 3 seconds during File Select clears the displayed file. Scrolling to ALL in File Select and holding the CLEAR key for 3 seconds erases and resets.
The CLEAR key is active during the Thickness Review and File Select functions. Momentarily pressing CLEAR clears the displayed reading during Thickness Review. Pressing and holding CLEAR for 3 seconds during File Select clears the displayed file. Scrolling to ALL in File Select and holding the CLEAR key for 3 seconds erases and resets.
4.4
Getting Started
Before using the MU-GAGE PLUS, be sure to read Important Notices at the beginning of this manual, and also Application Notes, for important information on test conditions that affect measurement results with the MU-GAGE PLUS. Select a suitable probe and connect it to the probe connector on the top end panel. Press the POWER key to turn on the MU-GAGE PLUS. The software revision number and display annunciators are briefly displayed. Then, the operating mode and control settings from the last session are restored. If low light makes the display difficult to read, press the MODE key until the carat points to enable the display backlight. To change the unit of measure or select a different manual resolution setting, press both scrolling keys simultaneously until the desired setting is displayed. To begin a measurement session, press the MODE key until the carat lights under PRB (Probe Selection mode.) Proceed to Section 4.5 to set the MUGAGE PLUS for operation with the selected probe.
4.4
Getting Started
Before using the MU-GAGE PLUS, be sure to read Important Notices at the beginning of this manual, and also Application Notes, for important information on test conditions that affect measurement results with the MU-GAGE PLUS. Select a suitable probe and connect it to the probe connector on the top end panel. Press the POWER key to turn on the MU-GAGE PLUS. The software revision number and display annunciators are briefly displayed. Then, the operating mode and control settings from the last session are restored. If low light makes the display difficult to read, press the MODE key until the carat points to enable the display backlight. To change the unit of measure or select a different manual resolution setting, press both scrolling keys simultaneously until the desired setting is displayed. To begin a measurement session, press the MODE key until the carat lights under PRB (Probe Selection mode.) Proceed to Section 4.5 to set the MUGAGE PLUS for operation with the selected probe.
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14
4.5
4.5
To change the probe selection option, press the MODE key until the carat appears under PRB. The display indicates the current probe setting. To change modes, press the CAL key to make the CAL icon appear. Now press a scroll key to change the probe setting. Finally, press CAL again to exit the probe selection procedure. NOTE: If the contact CON probe selection is made, a probe zero must be performed before calibration of velocity or measurement is attempted. See the following section.
To change the probe selection option, press the MODE key until the carat appears under PRB. The display indicates the current probe setting. To change modes, press the CAL key to make the CAL icon appear. Now press a scroll key to change the probe setting. Finally, press CAL again to exit the probe selection procedure. NOTE: If the contact CON probe selection is made, a probe zero must be performed before calibration of velocity or measurement is attempted. See the following section.
4.6
4.6
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15
4.7
4.7
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16
Proceed to Section for normal thickness measurement (THK mode) procedure, or refer to Section 4.12 for differential offset measurements (DIF mode.)
Proceed to Section for normal thickness measurement (THK mode) procedure, or refer to Section 4.12 for differential offset measurements (DIF mode.)
4.8
4.8
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The MU-GAGE PLUS is now calibrated and ready to take measurements on parts of the same material and velocity of sound as the test sample. Proceed to Section 4.11 for the normal thickness measurement (THK mode) procedure, or to Section 4.12 for instructions on setting a nominal value and performing differential offset measurements (DIF mode).
The MU-GAGE PLUS is now calibrated and ready to take measurements on parts of the same material and velocity of sound as the test sample. Proceed to Section 4.11 for the normal thickness measurement (THK mode) procedure, or to Section 4.12 for instructions on setting a nominal value and performing differential offset measurements (DIF mode).
4.9
VEL Mode Calibration to a Known Velocity The MU-GAGE PLUS may be calibrated to a known material velocity of sound. Velocity is displayed as XXXX IN (10 in/s implied); X.XXX MM, for velocities of 0.254 to 9.999 km/s; or XX.XX MM, for velocities of 10.00 to 15.00 km/s.
To calibrate to a known velocity, follow the preliminary instructions in section 4.4. Set the probe selection option for the correct probe type (Section 4.5). If you are using a contact probe, perform the probe zero procedure (Section 4.6). When the probe zero has been completed (indicated by a row of dashes), press CAL to exit the calibration mode. For delay and plastics probes, no probe zero procedure is needed. Press the MODE key until the carat appears under VEL. The display will show the material velocity to which the MU-GAGE PLUS is currently set. Press the CAL key and use the scrolling keys to change the display to the known material velocity. Press CAL again to end the calibration procedure. Press the MODE key until the carat appears under THK. The MU-GAGE PLUS is now calibrated and ready to measure using the supplied velocity of sound.
4.9
VEL Mode Calibration to a Known Velocity The MU-GAGE PLUS may be calibrated to a known material velocity of sound. Velocity is displayed as XXXX IN (10 in/s implied); X.XXX MM, for velocities of 0.254 to 9.999 km/s; or XX.XX MM, for velocities of 10.00 to 15.00 km/s.
To calibrate to a known velocity, follow the preliminary instructions in section 4.4. Set the probe selection option for the correct probe type (Section 4.5). If you are using a contact probe, perform the probe zero procedure (Section 4.6). When the probe zero has been completed (indicated by a row of dashes), press CAL to exit the calibration mode. For delay and plastics probes, no probe zero procedure is needed. Press the MODE key until the carat appears under VEL. The display will show the material velocity to which the MU-GAGE PLUS is currently set. Press the CAL key and use the scrolling keys to change the display to the known material velocity. Press CAL again to end the calibration procedure. Press the MODE key until the carat appears under THK. The MU-GAGE PLUS is now calibrated and ready to measure using the supplied velocity of sound.
4.10
4.10
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The front and back surface of the test piece should be smooth and free of rust, corrosion, paint, etc. (Other gauges, such as Mitutoyos MU-GAGE are designed for measurement on rough, corroded surfaces.) The front and back surfaces should also be parallel. Measurements on curved surfaces are feasible and commonly done. Apply a small amount of couplant to the test piece. Please the probe gently but firmly on the surface. The coupling icon will appear and the thickness of the part will be displayed. Use firm, steady pressure to obtain a stable reading. Some practice may be necessary to develop a good technique. Remove the probe from the surface and read the thickness of the material under test directly from the display If incorrect values occur repeatedly, check probe selection. If probe selection is correct, recalibrate the instrument (Section 4.6-4.10).
The front and back surface of the test piece should be smooth and free of rust, corrosion, paint, etc. (Other gauges, such as Mitutoyos MU-GAGE are designed for measurement on rough, corroded surfaces.) The front and back surfaces should also be parallel. Measurements on curved surfaces are feasible and commonly done. Apply a small amount of couplant to the test piece. Please the probe gently but firmly on the surface. The coupling icon will appear and the thickness of the part will be displayed. Use firm, steady pressure to obtain a stable reading. Some practice may be necessary to develop a good technique. Remove the probe from the surface and read the thickness of the material under test directly from the display If incorrect values occur repeatedly, check probe selection. If probe selection is correct, recalibrate the instrument (Section 4.6-4.10).
4.11
4.11
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19
4.12
4.12
4.13
4.13
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To view or change the current high tolerance limit, press CAL again. The CAL icon continues to flash and the current high tolerance limit is displayed. Press CAL again to return to the HI limit ON/OFF display without changing the current HI limit, or use the scrolling keys to increase or decrease the high tolerance limit. When the desired limit is displayed, press CAL to return to the HI limit ON/OFF display. If a THK file is active, the file number is displayed briefly as a reminder that the stored settings have been changed in the file. Press MODE to advance from the H. On/H.OFF display to the LO limit functions. L.OFF will appear indicating the status of the low tolerance limit. Adjust the LO limit in a manner identical with the high limit described above. To use the HI or LO alarm, or both, make sure the limit(s) is set and the alarm(s) enabled (H.On, L.On). Use MODE to return to the THK mode. The display will flash if the measured thickness is less than the LO, or greater than the HI tolerance limit (if enabled). A plus sign (+) indicates a reading greater than the HI limit. A minus sign (-) indicates a reading less than the LO limit.
To view or change the current high tolerance limit, press CAL again. The CAL icon continues to flash and the current high tolerance limit is displayed. Press CAL again to return to the HI limit ON/OFF display without changing the current HI limit, or use the scrolling keys to increase or decrease the high tolerance limit. When the desired limit is displayed, press CAL to return to the HI limit ON/OFF display. If a THK file is active, the file number is displayed briefly as a reminder that the stored settings have been changed in the file. Press MODE to advance from the H. On/H.OFF display to the LO limit functions. L.OFF will appear indicating the status of the low tolerance limit. Adjust the LO limit in a manner identical with the high limit described above. To use the HI or LO alarm, or both, make sure the limit(s) is set and the alarm(s) enabled (H.On, L.On). Use MODE to return to the THK mode. The display will flash if the measured thickness is less than the LO, or greater than the HI tolerance limit (if enabled). A plus sign (+) indicates a reading greater than the HI limit. A minus sign (-) indicates a reading less than the LO limit.
4.14
Recording Measurements
Displayed thickness reading can be sent to an external recording device by pressing SEND. With SPC devices, the SEND key is disabled. The SPC device initiates data transfer. See Section 4 for information on connecting external devices to the MU-GAGE PLUS. To record a reading in THK or DIF mode, first perform the measurement (Section 4.11 or 4.13). When the coupling indicator appears and the reading is stable, uncouple the probe and wipe the excess couplant from the probe face. Press SEND. The location where the reading has been stored is displayed briefly. After a displayed reading has been sent, SEND is disabled until a new reading is taken. Zero values will not record in THK mode.
4.14
Recording Measurements
Displayed thickness reading can be sent to an external recording device by pressing SEND. With SPC devices, the SEND key is disabled. The SPC device initiates data transfer. See Section 4 for information on connecting external devices to the MU-GAGE PLUS. To record a reading in THK or DIF mode, first perform the measurement (Section 4.11 or 4.13). When the coupling indicator appears and the reading is stable, uncouple the probe and wipe the excess couplant from the probe face. Press SEND. The location where the reading has been stored is displayed briefly. After a displayed reading has been sent, SEND is disabled until a new reading is taken. Zero values will not record in THK mode.
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To view the current display resolution or unit of measure, the MU-GAGE PLUS must be in THK or DIF mode and the CAL annunciator must be off. Press and hold both scrolling keys for about one second to display the current setting. Release the scrolling keys as soon as the current setting appears to avoid changing it. If auto ranging is enabled, the display will appear with all four decimal points. If manual resolution is enabled the display will appear with the decimal point and IN MM display in the selected resolution. To change resolution or units continue to hold both scrolling keys. Each of the options will momentarily appear. Release the scrolling keys when the desired option is displayed. When the MU-GAGE PLUS is turned off, the resolution setting is saved and restored when the unit is turned on.
To view the current display resolution or unit of measure, the MU-GAGE PLUS must be in THK or DIF mode and the CAL annunciator must be off. Press and hold both scrolling keys for about one second to display the current setting. Release the scrolling keys as soon as the current setting appears to avoid changing it. If auto ranging is enabled, the display will appear with all four decimal points. If manual resolution is enabled the display will appear with the decimal point and IN MM display in the selected resolution. To change resolution or units continue to hold both scrolling keys. Each of the options will momentarily appear. Release the scrolling keys when the desired option is displayed. When the MU-GAGE PLUS is turned off, the resolution setting is saved and restored when the unit is turned on.
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released. It remains on continuously during the probe zero procedure, any time the CAL annunciator is flashing. Therefore, battery life can be extended by turning off the backlight during a lengthy operation, such as printing a large file or all files. To set the desired backlight control option, press MODE until the carat appears under LT. Press CAL and use the scrolling keys to select the desired option. The display continuously loops through the options while either scrolling key is held. Press CAL again to end the backlight control operation. When the TM1-CD is turned off, the current backlight setting is saved and will be restored when the instrument is turned off again.
released. It remains on continuously during the probe zero procedure, any time the CAL annunciator is flashing. Therefore, battery life can be extended by turning off the backlight during a lengthy operation, such as printing a large file or all files. To set the desired backlight control option, press MODE until the carat appears under LT. Press CAL and use the scrolling keys to select the desired option. The display continuously loops through the options while either scrolling key is held. Press CAL again to end the backlight control operation. When the TM1-CD is turned off, the current backlight setting is saved and will be restored when the instrument is turned off again.
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NOTE: The MU-GAGE PLUS should be off when connecting a cable for an external device to the Serial I/O.
NOTE: The MU-GAGE PLUS should be off when connecting a cable for an external device to the Serial I/O.
5.1
Printing Data
A thickness measurement can be transferred, via the Serial port, to a printer. The 24-column format is compatible with most 24, 40, 80 or 132 column serial printers, if the proper cable is used.
5.1
Printing Data
A thickness measurement can be transferred, via the Serial port, to a printer. The 24-column format is compatible with most 24, 40, 80 or 132 column serial printers, if the proper cable is used.
5.2
5.2
5.3
5.3
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With the MU-GAGE PLUS off, connect the SPC device to the Serial I/O port using a standard 10 pin ribbon cable. Set up the SPC device according to the instructions provided by the manufacturer. Be sure the device is on and ready to receive data. Turn on the MU-GAGE PLUS. Obtain the desired reading in the display of the MU-GAGE PLUS (Section 4.11). When the desired reading is displayed, initiate transfer of the reading at the SPC device by pressing the appropriate key or switch. Consult the operating manual of the device for the correct procedure. The SEND key of the MUGAGE PLUS is completely useless when the Mitutoyo interface cable is connected, and you must press the SEND key on the Mitutoyo device. After the reading has been transferred, the MU-GAGE PLUS is ready to take another measurement.
With the MU-GAGE PLUS off, connect the SPC device to the Serial I/O port using a standard 10 pin ribbon cable. Set up the SPC device according to the instructions provided by the manufacturer. Be sure the device is on and ready to receive data. Turn on the MU-GAGE PLUS. Obtain the desired reading in the display of the MU-GAGE PLUS (Section 4.11). When the desired reading is displayed, initiate transfer of the reading at the SPC device by pressing the appropriate key or switch. Consult the operating manual of the device for the correct procedure. The SEND key of the MUGAGE PLUS is completely useless when the Mitutoyo interface cable is connected, and you must press the SEND key on the Mitutoyo device. After the reading has been transferred, the MU-GAGE PLUS is ready to take another measurement.
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Chapter VI Specifications
6.1 MU-GAGE PLUS Specifications
Operating Principle: Ultrasonic, pulse-echo measurement method
Chapter VI Specifications
6.1 MU-GAGE PLUS Specifications
Operating Principle: Ultrasonic, pulse-echo measurement method
Thickness Measuring Range: Contact Probe Option: Delay Probe Option: 0.080 inch to approx 15 inches; 2.0 mm to approx. 380 mm. 0.010 inch to 1.000 inch; 0.25 mm to 26.00 mm
Thickness Measuring Range: Contact Probe Option: Delay Probe Option: 0.080 inch to approx 15 inches; 2.0 mm to approx. 380 mm. 0.010 inch to 1.000 inch; 0.25 mm to 26.00 mm
NOTE: Published thickness measuring ranges are based on flat carbon steel (or plastic) reference standards at room temperature. Actual ranges depend on probe selection and characteristics of material under test. Material Velocity Range: 10,000 to 590,000 inches per second; 0.254 to 16.00 kilometers per second Default resolution is auto ranging 0.001 below 10.0 inches; 00.01 above 9.999 inches 0.01 mm below 100 mm; 0.1 mm above 99.99 mm 0.0001 below 1.0 inch; 0.001 above 0.9999 inch 0.01 below 10.0 mm; 0.01 above 9.999 mm 2 counts of least significant digit over 24 hour period at constant temperature
NOTE: Published thickness measuring ranges are based on flat carbon steel (or plastic) reference standards at room temperature. Actual ranges depend on probe selection and characteristics of material under test. Material Velocity Range: 10,000 to 590,000 inches per second; 0.254 to 16.00 kilometers per second Default resolution is auto ranging 0.001 below 10.0 inches; 00.01 above 9.999 inches 0.01 mm below 100 mm; 0.1 mm above 99.99 mm 0.0001 below 1.0 inch; 0.001 above 0.9999 inch 0.01 below 10.0 mm; 0.01 above 9.999 mm 2 counts of least significant digit over 24 hour period at constant temperature
Instrument Stability:
Instrument Stability:
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Linearity: Contact Probe Option: Delay Probe Option: 2 counts of least significant digit 2 counts of least significant digit when measuring 0.040 inch (1.0 mm); 3 counts of least significant digit when measuring <0.040 inch (1.0 mm) Push-button, keyed to built in probe zero block (contact probes only) One point, off block, with known thickness calibration standard of same material and velocity as material to be measured (all probe types)
Linearity: Contact Probe Option: Delay Probe Option: 2 counts of least significant digit 2 counts of least significant digit when measuring 0.040 inch (1.0 mm); 3 counts of least significant digit when measuring <0.040 inch (1.0 mm) Push-button, keyed to built in probe zero block (contact probes only) One point, off block, with known thickness calibration standard of same material and velocity as material to be measured (all probe types)
Calibration:
Calibration:
Measurement Method: Contact Probe Option: Delay Probe Option: From excitation to first backwall echo Multiple echo for thickness up to approximately 0.070 inch in steel; interface to first backwall echo for greater than 0.070 inch in steel 1200 baud; 8 data bits; 1 stop bit; no parity Mitutoyo Format Via SEND key English, German, French, Italian, and Spanish
Measurement Method: Contact Probe Option: Delay Probe Option: From excitation to first backwall echo Multiple echo for thickness up to approximately 0.070 inch in steel; interface to first backwall echo for greater than 0.070 inch in steel 1200 baud; 8 data bits; 1 stop bit; no parity Mitutoyo Format Via SEND key English, German, French, Italian, and Spanish
Serial Protocol:
Serial Protocol:
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Display Type:
Four digit, 0.5 inch (12.7 mm) high, Liquid Crystal Display with electroluminescent backlight 4 each 1.5 volt, AA alkaline cells over 45 hours at 25% duty cycle, (Operating Time) without backlight 3.5 minutes after last probe couple or last press of any key +15F to 125F (-10 to +50C)
Display Type:
Four digit, 0.5 inch (12.7 mm) high, Liquid Crystal Display with electroluminescent backlight 4 each 1.5 volt, AA alkaline cells over 45 hours at 25% duty cycle, (Operating Time) without backlight 3.5 minutes after last probe couple or last press of any key +15F to 125F (-10 to +50C)
Automatic Shut-Off:
Automatic Shut-Off:
40F to +140F (-40C to + 60C) without batteries 40F to +125F (-40C to 50C) with alkaline batteries 3.5 inches wide 6.25 inches long 1.5 inches deep Approximately 14.5 ounces including batteries Lemo #00 10 pin dual row header
40F to +140F (-40C to + 60C) without batteries 40F to +125F (-40C to 50C) with alkaline batteries 3.5 inches wide 6.25 inches long 1.5 inches deep Approximately 14.5 ounces including batteries Lemo #00 10 pin dual row header
Dimensions:
Dimensions:
Weight:
Weight:
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7.1
Calibration
The accuracy of any measurement obtained with the MU-GAGE PLUS depends on the accuracy of the calibration. The importance of following calibration procedures described cannot be overemphasized. The MU-GAGE PLUS should be calibrated at the beginning of each measurement session and checked periodically during the session with samples of known thickness. The instrument must also be recalibrated whenever the probe or test material is changed. It is also recommended that the gauge be recalibrated if the thickness range to be measured changes significantly.
7.1
Calibration
The accuracy of any measurement obtained with the MU-GAGE PLUS depends on the accuracy of the calibration. The importance of following calibration procedures described cannot be overemphasized. The MU-GAGE PLUS should be calibrated at the beginning of each measurement session and checked periodically during the session with samples of known thickness. The instrument must also be recalibrated whenever the probe or test material is changed. It is also recommended that the gauge be recalibrated if the thickness range to be measured changes significantly.
7.2
Surface Condition
The MU-GAGE PLUS has been designed to provide optimum results when the contact surface and backwall are both clean and smooth. If the contact surface is too rough, excess couplant can be trapped between the probe and test piece resulting in erroneous readings. If the backwall is rough or uneven, the ultrasonic pulses can be distorted or scattered, resulting in erroneous thickness readings.
7.2
Surface Condition
The MU-GAGE PLUS has been designed to provide optimum results when the contact surface and backwall are both clean and smooth. If the contact surface is too rough, excess couplant can be trapped between the probe and test piece resulting in erroneous readings. If the backwall is rough or uneven, the ultrasonic pulses can be distorted or scattered, resulting in erroneous thickness readings.
7.3
Part Geometry
Part geometry can easily affect measurement accuracy. When testing parts with curved surfaces, such as a tube, it is very important that the probe be placed on the center line of
7.3
Part Geometry
Part geometry can easily affect measurement accuracy. When testing parts with curved surfaces, such as a tube, it is very important that the probe be placed on the center line of
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the part and remain stationary. Some practice may be necessary to develop the proper technique. As a general rule, as the radius of curvature of the test piece decreases, the diameter of the probe used should also decrease to minimize probe rocking problems. Non-parallel surfaces, where the contact surface is not parallel to the backwall, can also cause measurement errors. For critical measurements on parts with non-parallel surfaces, or on curved parts, it may be helpful to view the echo waveforms on an oscilloscope. Contact StressTel for information on thickness gauges that provide RF output.
the part and remain stationary. Some practice may be necessary to develop the proper technique. As a general rule, as the radius of curvature of the test piece decreases, the diameter of the probe used should also decrease to minimize probe rocking problems. Non-parallel surfaces, where the contact surface is not parallel to the backwall, can also cause measurement errors. For critical measurements on parts with non-parallel surfaces, or on curved parts, it may be helpful to view the echo waveforms on an oscilloscope. Contact StressTel for information on thickness gauges that provide RF output.
7.4
Coupling Errors
The couplant layer between the probe and test piece is part of the thickness measurement. To achieve the best measurement accuracy, the couplant layer must be as thin as possible. This is accomplished by using a low viscosity couplant, and as little couplant as necessary to obtain a stable reading. Firm, even pressure on the probe is also needed to minimize the thickness of the couplant layer. As a rule, larger diameter probes require more pressure to force excess couplant from between the probe face and test surface.
7.4
Coupling Errors
The couplant layer between the probe and test piece is part of the thickness measurement. To achieve the best measurement accuracy, the couplant layer must be as thin as possible. This is accomplished by using a low viscosity couplant, and as little couplant as necessary to obtain a stable reading. Firm, even pressure on the probe is also needed to minimize the thickness of the couplant layer. As a rule, larger diameter probes require more pressure to force excess couplant from between the probe face and test surface.
7.5
Temperature
Variations in temperature also affect measurement accuracy. Most materials expand when heated and contract when cooled. There can also be a change in the velocity of sound in a material when its temperature changes. For best accuracy, the MU-GAGE PLUS should be calibrated on a calibration standard that is at the same temperature as the parts to be measured.
7.5
Temperature
Variations in temperature also affect measurement accuracy. Most materials expand when heated and contract when cooled. There can also be a change in the velocity of sound in a material when its temperature changes. For best accuracy, the MU-GAGE PLUS should be calibrated on a calibration standard that is at the same temperature as the parts to be measured.
7.6
7.6
7.6.1
Attenuation
Many materials, especially lower density plastics and rubbers, rapidly attenuate ultrasonic signals. This can reduce the maximum thickness that can be measured, and, in severe cases, prevent measurement entirely.
7.6.1
Attenuation
Many materials, especially lower density plastics and rubbers, rapidly attenuate ultrasonic signals. This can reduce the maximum thickness that can be measured, and, in severe cases, prevent measurement entirely.
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7.6.2
Scattering
Some materials are not homogeneous, this is, not of uniform consistency throughout. Sound can be scattered by the grain structure of some cast metals (stainless steel, iron, aluminum, brass) and by the internal acoustic interfaces inherent in reinforced composite materials and fiberglass type materials. Scattering makes it difficult for the gauge to differentiate between valid backwall echoes and spurious scattered echoes caused by the internal structure of the material. In such cases, the MU-GAGE PLUS may be unable to accurately measure the material under test.
7.6.2
Scattering
Some materials are not homogeneous, this is, not of uniform consistency throughout. Sound can be scattered by the grain structure of some cast metals (stainless steel, iron, aluminum, brass) and by the internal acoustic interfaces inherent in reinforced composite materials and fiberglass type materials. Scattering makes it difficult for the gauge to differentiate between valid backwall echoes and spurious scattered echoes caused by the internal structure of the material. In such cases, the MU-GAGE PLUS may be unable to accurately measure the material under test.
7.7
Flaws
If, during testing, the MU-GAGE PLUS suddenly reads a value that does not seem to be correct, for example much thinner than the apparent thickness of the part, the instrument may be reading a flaw or delamination in the part rather than the backwall. If this condition occurs, the part should be examined with an ultrasonic flaw detector, or other suitable non-destructive test method, to determine the cause of the suspicious method.
7.7
Flaws
If, during testing, the MU-GAGE PLUS suddenly reads a value that does not seem to be correct, for example much thinner than the apparent thickness of the part, the instrument may be reading a flaw or delamination in the part rather than the backwall. If this condition occurs, the part should be examined with an ultrasonic flaw detector, or other suitable non-destructive test method, to determine the cause of the suspicious method.
7.8
Probe Selection
A number of different types of contact and delay line probes (transducers) are available for use with the MU-GAGE PLUS. The standard plastics probe is a delay line type. Selection of properties of the material to be tested and on the geometry of the test piece. For best results, the highest frequency, smallest
7.8
Probe Selection
A number of different types of contact and delay line probes (transducers) are available for use with the MU-GAGE PLUS. The standard plastics probe is a delay line type. Selection of properties of the material to be tested and on the geometry of the test piece. For best results, the highest frequency, smallest
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diameter probe that will cover the required thickness range should be used. Higher frequency probes have shorter pulse widths, which improve the accuracy of the measurement. However, some applications, such as the testing of attenuative or coarse grain materials, may require lower frequency probe to improve penetration or reduce sensitivity to grain structure. Smaller diameter probes are less likely to trap excess couplant between the probe face and test surface, contributing to improved measurement accuracy. They also proved better results on curved parts by reducing the problem of probe rocking and by improving the coupling between the probe face and curved test surface.
diameter probe that will cover the required thickness range should be used. Higher frequency probes have shorter pulse widths, which improve the accuracy of the measurement. However, some applications, such as the testing of attenuative or coarse grain materials, may require lower frequency probe to improve penetration or reduce sensitivity to grain structure. Smaller diameter probes are less likely to trap excess couplant between the probe face and test surface, contributing to improved measurement accuracy. They also proved better results on curved parts by reducing the problem of probe rocking and by improving the coupling between the probe face and curved test surface.
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This information is provided for the convenience of the user. Actual velocities depend on exact composition, temperature, and processing of each material.
This information is provided for the convenience of the user. Actual velocities depend on exact composition, temperature, and processing of each material.
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