Professional Documents
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Deny Hanan, founder of Ducat, has over 25 years of experience in the semiconductor industry. Deny holds Master of Since degree in Quality Assurance and Reliability from the Technion, Israel Institute of Technology. Deny worked at Tower Semiconductors, Optichrom, Lambda Crossing and SanDisk serving in various positions, including QA manager at Tower Semiconductors and Q&R Director for SanDisks ASIC group.
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The Methodology
Identify and define the market segment and its relevant standards:
Automotive Telecommunication Industrial Others
Define and assess some key reliability indicators. Set reliability targets:
Dead on arrival (DOA) Early failure rate (EFR) Average failure rate (AFR) Others
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The Methodology
Collect data:
Out going inspection and test data Reliability tests data Field service data Returns and customer complaints
cont.
Analyze the data, correlate, tune and validate results. Model the Reliability Field service
reliability experiments data Tune and validate
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The Methodology
cont.
Impalement reliability engineering techniques for achieving the required reliability targets. Avoid over or under engineering.
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IC Reliability Systems
Optimize IC qualification and avoid under over stress:
Assure proper activity during stress Estimate / measure Tj Monitor activity Fit proper environmental conditions
Wave forms Current and voltage logs Temperatures and events logs Monitor response data
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IC Reliability Systems
Collect and analyze test data:
cont.
Perform parameter analysis before, during and after stress Identify parameters shift and or drifts Correlate results at different test conditions
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cont.
Assure proper activity during stress Estimate ambient and junction temperatures Monitor activity Fit proper environmental conditions
Wave forms Current and voltage logs Temperatures and events logs Monitor response data
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cont.
Estimate reliability indices based on reliability tests results. Tune and validate model. Collect field service data, estimate reliability indices tune and validate models.
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