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FQP12N60C / FQPF12N60C 600V N-Channel MOSFET

September 2007

QFET
FQP12N60C / FQPF12N60C
600V N-Channel MOSFET
Features
12A, 600V, RDS(on) = 0.65 @VGS = 10 V Low gate charge ( typical 48 nC) Low Crss ( typical 21pF) Fast switching 100% avalanche tested Improved dv/dt capability RoHS compliant

Description
These N-Channel enhancement mode power field effect transistors are produced using Fairchilds proprietary, planar stripe, DMOS technology. This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficient switched mode power supplies, active power factor correction, electronic lamp ballast based on half bridge topology.

G G DS

TO-220
FQP Series

GD S

TO-220F
FQPF Series

Absolute Maximum Ratings


Symbol
VDSS ID IDM VGSS EAS IAR EAR dv/dt PD TJ, TSTG TL Drain-Source Voltage Drain Current Drain Current Gate-Source voltage Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Power Dissipation (TC = 25C) - Derate above 25C
(Note 2) (Note 1) (Note 1) (Note 3)

Parameter
- Continuous (TC = 25C) - Continuous (TC = 100C) - Pulsed
(Note 1)

FQP12N60C
12 7.4 48

FQPF12N60C
12* 7.4* 48*

Unit
V A A A V mJ A mJ V/ns

600

30 870 12 22.5 4.5 225 1.78 -55 to +150 300 51 0.41

W W/C C C

Operating and Storage Temperature Range Maximum Lead Temperature for Soldering Purpose, 1/8 from Case for 5 Seconds

*Drain current limited by maximum junction temperature

Thermal Characteristics
Symbol
RJC RJS RJA

Parameter
Thermal Resistance, Junction-to-Case Thermal Resistance, Case-to-Sink Typ. Thermal Resistance, Junction-to-Ambient

FQP12N60C
0.56 0.5 62.5

FQPF12N60C
2.43 -62.5

Unit
C/W C/W C/W

2007 Fairchild Semiconductor Corporation

www.fairchildsemi.com

FQP12N60C / FQPF12N60C Rev. B1

FQP12N60C / FQPF12N60C 600V N-Channel MOSFET

Package Marking and Ordering Information


Device Marking
FQP12N60C FQPF12N60C

Device
FQP12N60C FQPF12N60C

Package
TO-220 TO-220F
TC = 25C unless otherwise noted

Reel Size
-

Tape Width
-

Quantity
50 50

Electrical Characteristics
Symbol
Off Characteristics BVDSS BVDSS / TJ IDSS IGSSF IGSSR VGS(th) RDS(on) gFS Ciss Coss Crss td(on) tr td(off) tf Qg Qgs Qgd IS ISM VSD trr Qrr
Notes:

Parameter
Drain-Source Breakdown Voltage Breakdown Voltage Temperature Coefficient Zero Gate Voltage Drain Current Gate-Body Leakage Current, Forward Gate-Body Leakage Current, Reverse Gate Threshold Voltage Static Drain-Source On-Resistance Forward Transconductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-On Delay Time Turn-On Rise Time Turn-Off Delay Time Turn-Off Fall Time Total Gate Charge Gate-Source Charge Gate-Drain Charge

Conditions
VGS = 0V, ID = 250A, TJ = 25C ID = 250A, Referenced to 25C VDS = 600V, VGS = 0V VDS = 480V, TC = 125C VGS = 30V, VDS = 0V VGS = -30V, VDS = 0V VDS = VGS, ID = 250A VGS = 10V, ID = 6A VDS = 40V, ID = 6A VDS = 25V, VGS = 0V, f = 1.0MHz
(Note 4)

Min
600 -----2.0 ------

Typ
-0.5 -----0.53 13 1760 182 21 30 85 140 90 48 8.5 21 ---420 4.9

Max Units
--1 10 100 -100 4.0 0.65 -2290 235 28 70 180 280 190 63 --12 48 1.4 --V V/C A A nA nA V S pF pF pF ns ns ns ns nC nC nC A A V ns C

On Characteristics

Dynamic Characteristics

Switching Characteristics VDD = 300V, ID = 12A RG = 25


(Note 4, 5)

------(Note 4, 5)

VDS = 400V, ID = 12A VGS = 10V

------

Drain-Source Diode Characteristics and Maximum Ratings Maximum Continuous Drain-Source Diode Forward Current Maximum Pulsed Drain-Source Diode Forward Current Drain-Source Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge VGS = 0V, IS = 12A VGS = 0V, IS = 12A dIF/dt =100A/s
(Note 4)

--

1. Repetitive Rating: Pulse width limited by maximum junction temperature 2. L = 11mH, IAS = 12A, VDD = 50V, RG = 25, Starting TJ = 25C 3. ISD 12A, di/dt 200A/s, VDD BVDSS, Starting TJ = 25C 4. Pulse Test: Pulse width 300s, Duty Cycle 2% 5. Essentially Independent of Operating Temperature Typical Characteristics

FQP12N60C / FQPF12N60C Rev. B1

www.fairchildsemi.com

FQP12N60C / FQPF12N60C 600V N-Channel MOSFET

Typical Performance Characteristics


Figure 1. On-Region Characteristics
VGS 15.0 V 10.0 V 8.0 V 7.0 V 6.0 V 5.5 V 5.0 V Bottom : 4.5 V Top :

Figure 2. Transfer Characteristics

10

ID, Drain Current [A]

10

ID, Drain Current [A]

150 C -55 C
o

25 C
10
0

10

Notes : 1. 250s Pulse Test 2. TC = 25

Notes : 1. VDS = 40V 2. 250s Pulse Test

10

-1

10

10

10

VDS, Drain-Source Voltage [V]

VGS, Gate-Source Voltage [V]

Figure 3. On-Resistance Variation vs. Drain Current and Gate Voltage

Figure 4. Body Diode Forward Voltage Variation vs. Source Current and Temperatue

RDS(ON) [ ], Drain-Source On-Resistance

IDR, Reverse Drain Current [A]

1.5

10

VGS = 10V
1.0

10

150 25
-1

0.5

VGS = 20V
Note : TJ = 25

Notes : 1. VGS = 0V 2. 250s Pulse Test

10

15

20

25

30

35

10

0.2

0.4

0.6

0.8

1.0

1.2

1.4

ID, Drain Current [A]

VSD, Source-Drain voltage [V]

Figure 5. Capacitance Characteristics


3500 3000 2500
Ciss = Cgs + Cgd (Cds = shorted) Coss = Cds + Cgd Crss = Cgd

Figure 6. Gate Charge Characteristics


12

VDS = 120V
10

VGS, Gate-Source Voltage [V]

VDS = 300V VDS = 480V

Capacitance [pF]

Ciss Coss

2000 1500 1000 500 0 -1 10

Crss

Notes ; 1. VGS = 0 V 2. f = 1 MHz

2
Note : ID = 12A

10

10

10

20

30

40

50

VDS, Drain-Source Voltage [V]

QG, Total Gate Charge [nC]

FQP12N60C / FQPF12N60C Rev. B1

www.fairchildsemi.com

FQP12N60C / FQPF12N60C 600V N-Channel MOSFET

Typical Performance Characteristics (Continued)


Figure 7. Breakdown Voltage Variation vs. Temperature
1.2

Figure 8. On-Resistance Variation vs. Temperature


3.0

BVDSS, (Normalized) Drain-Source Breakdown Voltage

1.1

RDS(ON), (Normalized) Drain-Source On-Resistance

2.5

2.0

1.0

1.5

1.0
Notes : 1. VGS = 10 V 2. ID = 6.0 A

0.9

Notes : 1. VGS = 0 V 2. ID = 250 A

0.5

0.8 -100

-50

50

100
o

150

200

0.0 -100

-50

50

100
o

150

200

TJ, Junction Temperature [ C]

TJ, Junction Temperature [ C]

Figure 9-1. Maximum Safe Operating Area for FQP12N60C

Figure 9-2. Maximum Safe Operating Area for FQPF12N60C

10

Operation in This Area is Limited by R DS(on)

10

Operation in This Area is Limited by R DS(on)

10 s 100 s

ID, Drain Current [A]

10 s 100 s

ID, Drain Current [A]

10

1 ms 10 ms 100 ms DC

10

10

10

1 ms 10 ms 100 ms DC

10

-1

Notes : o 1. TC = 25 C o 2. TJ = 150 C 3. Single Pulse

10

-1

Notes : o 1. TC = 25 C o 2. TJ = 150 C 3. Single Pulse

10

-2

10

10

10

10

10

-2

VDS, Drain-Source Voltage [V]

10

10

10

10

VDS, Drain-Source Voltage [V]

Figure 10. Maximum Drain Current vs. Case Temperature


14 12 10 8 6 4 2 0 25

ID, Drain Current [A]

50

75

100

125

150

TC, Case Temperature []

FQP12N60C / FQPF12N60C Rev. B1

www.fairchildsemi.com

FQP12N60C / FQPF12N60C 600V N-Channel MOSFET

Typical Performance Characteristics (Continued)


Figure 11-1. Transient Thermal Response Curve for FQP12N60C

10

Z JC(t), Thermal Response

D = 0 .5 0 .2 0 .1 0 .0 5 0 .0 2 0 .0 1 s in g le p u ls e

10

-1

N o te s : 1 . Z J C (t) = 0 .5 6 /W M a x . 2 . D u ty F a c to r, D = t 1 /t 2 3 . T J M - T C = P D M * Z J C (t)

PDM t1 t2

10

-2

10

-5

10

-4

10

-3

10

-2

10

-1

10

10

t 1 , S q u a re W a v e P u ls e D u ra tio n [s e c ]

Figure 11-2. Transient Thermal Response Curve for FQPF12N60C

Z JC(t), Thermal Response

10

D = 0 .5 0 .2 0 .1

10

-1

0 .0 5 0 .0 2 0 .0 1

N o te s : 1 . Z J C (t) = 2 .4 3 /W M a x . 2 . D u ty F a c to r, D = t 1 /t 2 3 . T J M - T C = P D M * Z J C (t)

PDM t1
s in g le p u ls e

t2

10

-2

10

-5

10

-4

10

-3

10

-2

10

-1

10

10

t 1 , S q u a re W a v e P u ls e D u ra tio n [s e c ]

FQP12N60C / FQPF12N60C Rev. B1

www.fairchildsemi.com

FQP12N60C / FQPF12N60C 600V N-Channel MOSFET

Gate Charge Test Circuit & Waveform

Resistive Switching Test Circuit & Waveforms

Unclamped Inductive Switching Test Circuit & Waveforms

FQP12N60C / FQPF12N60C Rev. B1

www.fairchildsemi.com

FQP12N60C / FQPF12N60C 600V N-Channel MOSFET

Peak Diode Recovery dv/dt Test Circuit & Waveforms

FQP12N60C / FQPF12N60C Rev. B1

www.fairchildsemi.com

FQP12N60C / FQPF12N60C 600V N-Channel MOSFET

Mechanical Dimensions

TO-220
9.90 0.20 1.30 0.10 2.80 0.10 (8.70) 3.60 0.10 (1.70) 4.50 0.20

1.30 0.05

+0.10

9.20 0.20

(1.46)

13.08 0.20

(1.00)

(3.00)

15.90 0.20

1.27 0.10

1.52 0.10

0.80 0.10 2.54TYP [2.54 0.20] 2.54TYP [2.54 0.20]

10.08 0.30

18.95MAX.

(3.70)

(45 )
0.50 0.05
+0.10

2.40 0.20

10.00 0.20

Dimensions in Millimeters

FQP12N60C / FQPF12N60C Rev. B1

www.fairchildsemi.com

FQP12N60C / FQPF12N60C 600V N-Channel MOSFET

Mechanical Dimensions

(Continued)

TO-220F
3.30 0.10 10.16 0.20 (7.00) 3.18 0.10 2.54 0.20 (0.70)

6.68 0.20

15.80 0.20

(1.00x45)

MAX1.47 9.75 0.30 0.80 0.10


(3 ) 0

0.35 0.10 2.54TYP [2.54 0.20]

#1 0.50 0.05 2.54TYP [2.54 0.20] 4.70 0.20


+0.10

2.76 0.20

9.40 0.20

Dimensions in Millimeters

FQP12N60C / FQPF12N60C Rev. B1

15.87 0.20
www.fairchildsemi.com

FQP12N60C / FQPF12N60C 600V N-Channel MOSFET

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LIFE SUPPORT POLICY FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.

PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Advance Information Product Status Formative or In Design Definition This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. This datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. This datasheet contains specifications on a product that has been discontinued by Fairchild Semiconductor. The datasheet is printed for reference information only.
Rev. I31

Preliminary

First Production

No Identification Needed

Full Production

Obsolete

Not In Production

10 FQP12N60C / FQPF12N60C Rev. B1

www.fairchildsemi.com

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