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Features
1.3A, 100V rDS(ON) = 0.300 Single Pulse Avalanche Energy Rated SOA is Power Dissipation Limited Nanosecond Switching Speeds Linear Transfer Characteristics High Input Impedance Related Literature - TB334 Guidelines for Soldering Surface Mount Components to PC Boards
Ordering Information
PART NUMBER IRFD120 PACKAGE HEXDIP BRAND IRFD120
Symbol
D
Packaging
HEXDIP
4-275
CAUTION: These devices are sensitive to electrostatic discharge; follow proper ESD Handling Procedures. http://www.intersil.com or 407-727-9207 | Copyright Intersil Corporation 1999
IRFD120
Absolute Maximum Ratings
TC = 25oC, Unless Otherwise Specied IRFD120 100 100 1.3 5.2 20 1.0 0.008 36 -55 to 150 300 260 UNITS V V A A V W W/oC mJ oC
oC oC
Drain to Source Breakdown Voltage (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VDS Drain to Gate Voltage (RGS = 20k) (Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . VDGR Continuous Drain Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ID Pulsed Drain Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . IDM Gate to Source Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .VGS Maximum Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . PD Linear Derating Factor (See Figure 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Single Pulse Avalanche Energy Rating (Note 3). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . EAS Operating and Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TJ, TSTG Maximum Temperature for Soldering Leads at 0.063in (1.6mm) from Case for 10s. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . TL Package Body for 10s, See Techbrief 334 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Tpkg
CAUTION: Stresses above those listed in Absolute Maximum Ratings may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specication is not implied.
Electrical Specications
PARAMETER Drain to Source Breakdown Voltage Gate Threshold Voltage Zero Gate Voltage Drain Current
TC = 25oC, Unless Otherwise Specied SYMBOL BVDSS VGS(TH) IDSS ID(ON) IGSS rDS(ON) gfs td(ON) tr td(OFF) tf Qg(TOT) Qgs Qgd CISS COSS CRSS LD Measured From the Drain Lead, 2mm (0.08in) from Package to Center of Die Modified MOSFET Symbol Showing the Internal Devices Measured From the Source Inductances D Lead, 2mm (0.08in) from Header to Source Bonding LD Pad
G LS S
TEST CONDITIONS ID = 250A, VGS = 0V (Figure 9) VGS = VDS, ID = 250A VDS = Rated BVDSS, VGS = 0V VDS = 0.8 x Rated BVDSS, VGS = 0V, TJ = 125oC VDS > ID(ON) x rDS(ON) Max, VGS = 10V VGS = 20V ID = 0.6A, VGS = 10V (Figures 7, 8) VDS > ID(ON) x rDS(ON)MAX , ID = 0.6A (Figure 11) VDD = 0.5 x Rated BVDSS, ID 1.3A, VGS = 10V, RG = 9.1 RL = 38.5 for VDD = 50V MOSFET Switching Times are Essentially Independent of Operating Temperature VGS = 10V, ID = 1.3A, VDS = 0.8 x Rated BVDSS, Ig(REF) = 1.5mA (Figure 13) Gate Charge is Essentially Independent of Operating Temperature VGS = 0V, VDS = 25V, f = 1MHz (Figure 10)
UNITS V V A A A nA S ns ns ns ns nC nC nC pF pF pF nH
On-State Drain Current (Note 2) Gate Source Leakage Drain Source On Resistance (Note 2) Forward Transconductance (Note 2) Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Gate Charge (Gate to Source + Gate to Drain) Gate to Source Charge Gate to Drain Miller Charge Input Capacitance Output Capacitance Reverse Transfer Capacitance Internal Drain Inductance
LS
6.0
nH
RJA
120
oC/W
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IRFD120
Source to Drain Diode Specications
PARAMETER Continuous Source to Drain Current Pulse Source to Drain Current SYMBOL ISD ISDM TEST CONDITIONS Modified MOSFET Symbol Showing the Integral Reverse P-N Junction Diode
G D
MIN -
TYP -
UNITS A A
Source to Drain Diode Voltage (Note 2) Reverse Recovery Time Reverse Recovery Charge NOTES:
TJ = 25oC, ISD = 1.3A, VGS = 0V (Figure 12) TJ = 150oC, ISD = 1.3A, dISD/dt = 100A/s TJ = 150oC, ISD = 1.3A, dISD/dt = 100A/s
280 1.6
2.5 -
V ns C
2. Pulse test: pulse width 300s, duty cycle 2%. 3. VDD = 25V, starting TJ = 25oC, L = 32mH, RG = 25, peak IAS = 1.3A.
1.5
ID, DRAIN CURRENT (A) 0 25 125 50 75 100 TA , AMBIENT TEMPERATURE (oC) 150
1.2
0.9
0.6 0.4
0.6
0.2 0
0.3
10
20 VGS = 10V PULSE DURATION = 80s DUTY CYCLE = 0.5% MAX VGS = 9V VGS = 8V 12 VGS = 7V 8 VGS = 6V 4 VGS = 5V VGS = 4V 0 100 0 10 20 30 40 VDS, DRAIN TO SOURCE VOLTAGE (V) 50
0.1
100ms
0.01
DC
0.1
16
4-277
VGS = 8V VGS = 7V
16
PULSE DURATION = 80s DUTY CYCLE = 0.5% MAX VDS > ID(ON) x rDS(ON)MAX
12
TJ = -55oC oC TJ = 25 TJ = 125oC
10
0.8 2s PULSE TEST NORMALIZED DRAIN TO SOURCE ON RESISTANCE rDS(ON), DRAIN TO SOURCE ON RESISTANCE ()
2.2
0.6
VGS = 10V
1.8
PULSE DURATION = 80s DUTY CYCLE = 0.5% MAX VGS = 10V, ID = 0.6A
1.4
0.4
1.0
0.2
VGS = 20V
0.6
0.2 0 10 20 30 ID, DRAIN CURRENT (A) 40 -40 0 40 80 120 160 TJ , JUNCTION TEMPERATURE (oC)
NOTE:
Heating effect of 2s pulse is minimal. FIGURE 8. NORMALIZED DRAIN TO SOURCE ON RESISTANCE vs JUNCTION TEMPERATURE
1.25 IDS = 250A NORMALIZED DRAIN TO SOURCE BREAKDOWN VOLTAGE 1.15 C, CAPACITANCE (pF)
1000 VGS = 0V, f = 1MHz CISS = CGS + CGD CRSS = CGD COSS CDS + CGD
800
1.05
0.95
0.85
200
0.75 -40
40
80
120
160
10
50
4-278
20 ID = 5.2A VGS, GATE TO SOURCE (V) VDS = 20V VDS = 50V VDS = 80V 10
15
0V
IAS 0.01
0 tAV
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90%
RG DUT
VDD 0
10% 90%
10%
50%
CURRENT REGULATOR
12V BATTERY
0.2F
50k 0.3F
DUT 0
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