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GR A P H / L I S T : GR A P H I C S S HORT 9 4 J UL 0 1 0 1 : 4 5 PM
V t h o f M O S F E T ( S Q R T ( I d ) - > V t h )
M A R K E R ( 1 . 6 0 0 0 0 0 0 0 0 0 V 3 1 . 8 3 2 3 7 3 4 5 8 m 6 7 . 8 8 3 0 1 5 6 2 0 m )
V T H 1 . 1 3 1 0 7 0 1 3 3 4 V
( ) B E T A 4 . 6 0 8 1 0 3 8 0 9 7 m ( )
2 0 0 . m 8 0 . 0 m
I n t r c p t I n t r c p t
- 7 6 . 7 8 0 4 5 m - 3 0 . 7 1 2 1 8 m
*
S Q R T I d G r a d G r a d G R A D
6 7 . 8 8 3 0 1 m 2 7 . 1 5 3 2 0 m
2 0 . 0 m 8 . 0 0 m
/ d i v / d i v
I n t r c p t : 1 . 1 3 1 0 7 V
0 . 0 0 0 . 0 0
0 . 0 0 V g ( V ) 5 0 0 . m / d i v 5 . 0 0
1
Introduction
Drain
Gate Sub s tra te
To improve the efficiency of proc-
ess evaluation and characteriza-
Sou rce
tion of semiconductor devices,
automation of semiconductor test
SMU2 SMU3 SMU4 SMU1
is required. However, analysis of
the measured data and extraction
A Id
of important parameters are diffi- Vg
cult to automate. This application Vd
note shows you how to automate
extraction of parameters using the
unique auto analysis function of
the HP 4155B/4156B semiconduc-
tor parameter analyzers, using the
measurement of threshold voltage
as an example. Figure 1. Connection Diagram
Current problems
CHANNEL S: CHANNEL DE F I NI T I ON 9 4 J UL 0 1 0 1 : 4 4 PM
Vt h o f MOS F E T ( S QRT ( I d ) - > Vt h )
Using the HP 4145B, you can se-
quentially make some measure-
* ME A S U R E ME N T MOD E
S WE E P
2
ME A S U R E : S WE E P SE T UP 9 4 J UL 0 1 0 1 : 4 4 PM
Vt h of MO S F E T ( S QR T ( I d ) - > Vt h )
* VARI ABL E V AR1 VAR2 VAR1 '
CHANNEL S: USER F UNCT I ON DEF I NI T I ON 9 4 J UL 0 1 0 1 : 4 4 PM
UNI T S MU 2 : MP UNI T S MU 1 : M P Vt h o f MOS F E T ( S QRT ( I d ) - > Vt h )
N A ME Vg N A ME Vd
S WE E P MO D E S I NGL E OF F S E T 0. 0000 V
L I N / L OG L I NE AR RAT I O 1. 000
S T A RT 0. 0000 V C O MP L I A N C E 1 0 0 . 0 0 mA
* USER F UNCT I ON
S T OP 5. 000 V P O WE R C OMP OF F
N A ME UNI T DE F I NI T I ON
STEP 1 0 0 . 0 mV S QR T I d S QR T ( I d )
NO OF STEP 51 GRAD DI F F ( S QRT I d , V g )
C OMP L I A N C E 1 0 0 . 0 0 mA V T H V @L 1 X
P O WE R C OMP OF F B ET A @L 1 G ^ 2
* T I MI N G
H OL D T I ME 0. 0000 s
DEL AY T I ME 0. 0000 s * S WE E P C ON T I N U E AT ANY St a t u s
* C ON S T A N T
UNI T S MU 4 : MP
N A ME Vs b
MO D E V
S OU RC E 0. 0000 V - - - - - - - - - - - - - - - - - - - - - - - - - - -
C OMP L I A N C E 1 0 0 . 0 0 mA - - - - - - - - - - - - - - - - - - - - - - - - - - -
* DI S PL AY MODE * L I N E 1 : [ T A NGE NT ] l i n e o n [ Y1 ] a t a p o i n t wh e r e
GR A P H I C S [ GRA D ] = [ MA X ( G R A D ) ]
[ ]
* GR A P H I C S
X a x i s Y 1 a x i s Y2 a x i s
NA ME V g S QRT I d GR A D
SCA L E L I N E A R L I NE A R L I NE A R
MI N 0 . 0 0 0 0 0 0 0 0 0 V 0 . 0 0 0 0 0 0 0 0 0 0 0 . 0 0 0 0 0 0 0 0 0 0 * L I NE2 : [ ]
MA X 5 . 0 0 0 0 0 0 V 2 0 0 . 0 0 0 0 0 0 0 0 m 8 0 . 0 0 0 0 0 0 0 0 0 m
* GR I D * L I NE P A R A ME T E R
ON ON
* DA T A VA RI A B L E S * MA R K E R : At a p o i n t wh e r e
VT H [ GRA D ] = [ MA X ( G R A D ) ]
BE T A [ ]
* I n t e r p o l a t e : [ ON ]
3
GRA P H/ L I S T : GR A P H I C S S HORT 9 4 J UL 0 1 0 1 : 4 5 PM For more information about Hewlett-
V t h o f M O S F E T ( S Q R T ( I d ) - > V t h ) Packard test and measurement products,
applications, services, and for a current
sales office listing, visit our web site:
M A R K E R ( 1 . 6 0 0 0 0 0 0 0 0 0 V 3 1 . 8 3 2 3 7 3 4 5 8 m 6 7 . 8 8 3 0 1 5 6 2 0 m )
V T H 1 . 1 3 1 0 7 0 1 3 3 4 V
( ) B E T A 4 . 6 0 8 1 0 3 8 0 9 7 m ( ) http://www.hp.com/go/tmdir
2 0 0 . m 8 0 . 0 m
You can also contact one of the following
centers and ask for a test and
I n t
- 7 6 .
r c p t
7 8 0 4 5 m
I n t
- 3 0 .
r c p t
7 1 2 1 8 m
measurement sales representative.
*
S Q R T I d G r a d G r a d G R A D United States:
6 7 . 8 8 3 0 1 m 2 7 . 1 5 3 2 0 m
Hewlett-Packard Company
Test and Measurement Call Center
P.O. Box 4026
2 0 . 0 m 8 . 0 0 m Englewood, CO 80155-4026
/ d i v / d i v (tel) 1 800 452 4844
Canada:
Hewlett-Packard Canada Ltd.
5150 Spectrum Way
o Mississauga, Ontario
L4W 5G1
I n t r c p t : 1 . 1 3 1 0 7 V (tel) (905) 206 4725
0 . 0 0 0 . 0 0
0 . 0 0 V g ( V ) 5 0 0 . m / d i v 5 . 0 0
Europe:
Hewlett-Packard Company
European Marketing Centre
Figure 7. Measurement Result P.O. Box 999
1180 AZ Amstelveen
10 ASSIGN @Hp415x to 800 The Netherlands
(tel) (31 20) 547 9900
20 OUTPUT @Hp415x;":TRAC? 'VTH'" ! Read out Vth
Japan:
30 ENTER @Hp415x;Vth_data ! Enter Vth Hewlett-Packard Japan Ltd.
40 OUTPUT @Hp415x;":TRAC? 'BETA'" ! Read out Beta Measurement Assistance Center
9-1, Takakura-Cho, Hachioji-Shi,
50 ENTER @Hp415x;Beta_data ! Enter Beta Tokyo 192, Japan
60 PRINT Vth_data, Beta_data (tel) (81) 426 56 7832
(fax) (81) 426 56 7840
70 END
Latin America:
Figure 8. Example Program Hewlett-Packard Company
Latin American Region Headquarters
versus Vg. Also VTH and BETA By executing the simple program 5200 Blue Lagoon Drive
are to be displayed in the data in Figure 8, you can transfer the 9th Floor
variables display area. VTH and BETA data to variables Miami, Florida 33126
U.S.A.
using the internal HP Instrument (tel) (305) 267 4245/4220
The auto analysis functions are de- BASIC or an external controller. (fax) (305) 267 4288
fined in the ANALYSIS SETUP
Australia/New Zealand:
page shown in Figure 6. A tangent Conclusion Hewlett-Packard Australia Ltd.
line (Line 1) is drawn on the 31-41 Joseph Street
SQRTId versus Vg curve (Y1) at You can automate data analysis Blackburn, Victoria 3130
the point where the GRAD is maxi- Australia
and extraction of DC parameters (tel) 1 800 629 485 (Australia)
mum. The marker is also moved using the auto analysis features of (tel) 0 800 738 378 (New Zealand)
to the point where the GRAD is the HP 4155B/4156B. You can per- (fax) (61 3) 9210 5489
maximum. form accurate analysis, free from Asia Pacific:
error that may be caused by man- Hewlett-Packard Asia Pacific Ltd
If you execute a single measure- 17-21/F Shell Tower, Times Square,
ual operations. It is easy to trans-
ment, as shown in Figure 7, two 1 Matheson Street, Causeway Bay,
fer extracted parameters to an HP Hong Kong
curves are drawn. Right after the
Instrument BASIC program or ex- (tel) (852) 2599 7777
measurement, a tangent line is (fax) (852) 2506 9285
ternal controller. Using this capa-
drawn as specified in ANALYSIS
bility, full automation of Hewlett-Packard Company 1998
SETUP page, and VTH and BETA
complicated procedures, such as Data subject to change
are displayed. Printed in Japan 1/1998
reliability tests, is easily
5963-1249E
implemented.