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VB VS VG VD
Gate
p+ n+ n+
Gate
Bulk Source Oxide Drain
Contact
Bulk p–
VB VS VG VD
Subthreshold Conduction:
Why Bother?
Current levels are extremely low (pA – nA)
+ Extremely low power dissipation (pW – nW)
– Circuits have a limited bandwidth (≤ 100 kHz)
p+ n+ n+
Surface ψs
Energy VS
VDS
VD
Subthreshold Channel Current
L
-( VS -y s) UT
N(x) - ( VD -y s) UT
NS µ e µ
ND e
V S – ys ys V D – ys
VS
VDS
VD
Current flow is by diffusion:
∂N ND - N S NS - ND
I = -WqD = -WqD = WqD
∂x L L
W - (V - y ) U - ( V -y ) U
=
L
(
qDN0 e S s T - e D s T )
ys ªy0 + kVG
W kVG UT - VS U T - VD U T
I=
L
I0e e ( -e )
Capacitive-Divider
View of κ
ψs
bulk Cdep Cox gate
VG
– Vox +
surface
Vox = VG – ψs
Conservation of charge:
∂Qs ∂Qs
∆Qs = 0 = ∂ψ ∆ψs – ∂V ∆Vox
s ox
Cdep Cox
GND GND
G B G B G G B G
S S S S S
nMOS transistors
S S S S S
VDD VDD
G B G B G G B G
D D D D D
pMOS transistors
Subthreshold Channel Current
nMOS: VD
W kVG UT - VS UT VG
I=
L
I0e ( e
V U
- e- D T )
W (kVG - VS ) UT V U
I
=
L
I0e ( 1-e- DS T ) VS
W (kVG - VS ) UT
ª I0e (for VDS ≥ 4UT )
L
pMOS:
W -kVG UT VS UT V U
I=
L
I0 e ( e -eD T ) VS
W ( VS - kVG) UT I
VDS UT
=
L
I0e ( 1- e ) VG
W ( V - kV ) U VD
ª I0e S G T (for VDS £ - 4UT )
L
** Note here that VG < 0, VS < 0, and VD < 0.
Subthreshold Channel Current
nMOS: VD
W kVG UT - VS UT VG
I=
L
I0e ( e - e- D T
V U
)
W (kVG - VS ) UT V U
I
=
L
I0e ( 1-e- DS T ) VS
W (kVG - VS ) UT
ª I0e (for VDS ≥ 4UT )
L
pMOS:
W k(VW -VG ) UT - (VW- VS ) UT VS
I=
L
I0 e ( e )
(V V ) U
- e- W - D T
W (VS -(1-k)VW -kVG ) UT I
VDS UT VG
=
L
I0e ( 1- e )
W (V - (1-k)VW -kVG ) UT VW
ª I0e S (for VDS £ - 4UT )
L
VD
** Note here that VG > 0, VS > 0, VD > 0, and VW > 0.
Subthreshold Channel Current in Saturation
10–4
–5
I
10
5V
10–6 VG
10–7
10–8 I = I0 ekVG/UT
I (A)
10–9 I0 = 45.4 fA
k = 0.63
10–10 IT0 = 237 nA
VT0 = 0.662 V
10–11
10–12
0 0.5 1 1.5
VG (V)
Subthreshold Drain Characteristics
1
0.9 I 0.409 V
I = Isat (1 - e )
-VD/UT
0.8 VD
0.7 VG
0.6
I (nA)
0.5 0.389 V
0.4
0.3
0.364V
0.2
0.340 V
0.1
VG = 0.316 V
0
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5
VD (V)
Subthreshold Drain Characteristics
1
0.9 I 0.409 V
I = Isat (1 - e )
-VD/UT
0.8 VD
saturation
ohmic
0.7 VG
0.6
I (nA)
0.5 0.389 V
0.4
0.3
0.364V
0.2
0.340 V
0.1
Vsat ª 4UT VG = 0.316 V
0
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
VD (V)
General MOS Transistor
Channel Current Dependancies
Electrostatics
VG ψs(z) Dri
ft
Electrostatics
Boltzmann
I
io
n
fus
Boltzmann Dif
VS Qm(z)
Electrostatics:
ψs depends on VG and Qm
Boltzmann Distribution:
Qm depends on ψs and VS
Boltzmann
I
io
n
fus
Boltzmann Dif
VS Qm(z)
Electrostatics
Boltzmann
I
Boltzmann
VS Qm(z)
QT
Q ~ VG –VT
factor of 2
(κVG–VS)/UT
Q ~e
VG
VT
At Q = QT, half of the field lines from
gate charges end on mobile charges.
(κVG–VS)/UT
Extrapolate curve: QT = Q0 e
Q
Take log: κVT – VS = UT log T = κVT0
Q0
Rearrange: VT = VT0 + VS
Threshold
κ for VS=0
VS(D)
Substitute: QS(D) = Cox (VG –VT0 – κ )
Above-Threshold
Channel Current
Current flows by drift: I = Q µ E||
I is constant ⇒ Larger Q ↔ Smaller E||
Channel has capacitance: Cox to gate
Cdep to bulk
Total capacitance (per unit area):C = Cox + Cdep
∂ψ
Surface potential: ψs ~ Q ⇒ E|| = – s ≈ – 1 ∂Q
C ∂z C ∂z
µ ∂Q
Current (per unit width): I = – C Q
∂z
Integrate from source to drain:
∫ ∫
L QD
µ
I dz = – C Q dQ ⇒ IL = µ (QS – QD)
2 2
0 SQ
2C
κ(VG –VT0)
VD
Vsat
µCox
Isat = W
L 2κ (κ(VG –VT0) – VS) 2
Above-threshold
model
VT VG
µCox
I =W
L 2κ (κ(V G –VT0) – VS) 2
Above-Threshold Channel Current
nMOS: VD
VG
I=
W µCox
L 2κ
[
(κ (VG − V T 0 ) − VS ) − (κ(VG − V T 0 ) − VD )
2 2
] I
W µCox VS
I= (κ (VG − V T 0 ) − VS ) , for VD ≥ κ(VG − V T 0 )
2
L 2κ
pMOS:
I=
W µCox
L 2κ
[
( VS − κ (VG − V T 0 )) − ( VD − κ(VG − V T 0 ))
2 2
] I
VS
W µCox
I= ( VS − κ (VG − V T 0 )) , for VD ≤ κ(VG − V T 0 )
2 VG
VD
L 2κ
** Note here that VG < 0, VS < 0, VD < 0, and VT0 < 0.
Above-Threshold Channel Current
nMOS: VD
VG
I=
W µCox
L 2κ
[
(κ (VG − V T 0 ) − VS ) − (κ(VG − V T 0 ) − VD )
2 2
] I
W µCox VS
I= (κ (VG − V T 0 ) − VS ) , for VD ≥ κ(VG − V T 0 )
2
L 2κ
pMOS:
VS
I=
W µCox
L 2κ
( [
κ ((VW − VG ) − V T0 ) − (VW − V S ))
2
I
− (κ ((VW − VG ) − VT 0 ) − (VW − VD ))
2
] VG
W µCox
(κ ((VW − VG ) − V T0 ) − (VW − V S )) ,
VW
2
I=
L 2κ
for VD ≤ VW − κ ((VW − VG ) − VT 0 ) VD
** Note here that VG > 0, VS > 0, VD > 0, and VW > 0.
Above-Threshold Channel Current in Saturation
10
9
I
8
5V
7
VG
6
I ( mA )
5
4
3
mC ox k
2
I= (VG - VT0)
2
mC ox k
1 = 22.6 mA/V2
VT0 = 0.59 V 2
0
0 0.5 1 1.5 2 2.5
VG (V)
Above-Threshold Drain Characteristics
120
ohmic saturation
VG = 2.72 V
100
I
VD
80
model VG
equation
I (mA)
60 2.18 V
20 1.47 V
1.25 V
0
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5
VD (V)
Surface Energy in Subthreshold
VB VS VG VD
Gate
p+ n+ n+
ψs
Surface
Energy VS
VDS
VD
Surface Energy in Saturation
Above Threshold
VB VS VG VD
Gate
p+ n+ n+
ψs(z)
Surface
Energy VS
VDS
VD
Surface Energy in Ohmic Region
Above Threshold
VB VS VG VD
Gate
p+ n+ n+
ψs(z)
Surface
Energy VS
VDS
VD
Enz-Krummenacher-Vittoz Model
log I
Subthreshold
model Above-threshold
model
EKV
model
VT0 VG
I=
W µCox
L κ
[ ( (κ V − V − V ) 2U
2U T log 1 + e ( G T0 ) S T
2 2
)
(
− log 2 1 + e (κ (VG − V T0 ) − VD) 2UT )]
Model is continuous from subthreshold
to above threshold and is valid in both
the ohmic and saturation regions.
log2(1 + ex/2) function smoothly interpolates
between ex and x2.
Not based on first principles.
(i.e., an elegant mathematical hack!)
EKV Model Channel Current
nMOS: VD
[ (
VG
I=
W µCox
L κ
2 2 (κ V − V − V ) 2U
2UT log 1 + e ( G T0 ) S T ) I
(
− log 2 1 + e (κ (VG − V T0 ) − VD) 2UT )] VS
pMOS:
I=
W µCox
L κ
[ ( ( V − κ V − V ) 2U
2UT log 1 + e S ( G T0 ) T
2 2
) I
VS
(
− log 2 1 + e (VD − κ (VG − V T0 )) 2UT )] VG
VD
** Note here that VG < 0, VS < 0, VD < 0, and VT0 < 0.
EKV Model Channel Current
nMOS: VD
[ (
VG
I=
W µCox
L κ
2 2 (κ V − V − V ) 2U
2UT log 1 + e ( G T0 ) S T ) I
(
− log 2 1 + e (κ (VG − V T0 ) − VD) 2UT )] VS
pMOS:
VS
I=
W µCox
L κ
2
2U T log
2
[ (
1 + e
(κ ( ( VW − VG )− V T0 )− ( VW − VS )) 2UT
) I
( )]
VG
− log 2 1 + e (κ ( ( VW − VG )− VT0 )− ( VW − VD ) ) 2UT
VW
** Note here that VG > 0, VS > 0, VD > 0, and VW > 0. VD
EKV Model: Channel Current in Saturation
10–4
10–5 subthreshold
model above-threshold
10–6 model
10–7
EKV model
–8 k ( V -V ) 2U
10 kV U 2
(
I = I 0 e T0 T log 1 + e G T0 T )
I (A)
I0 = 45.4 fA
10–9 k = 0.63 I
VT0 = 0.620 V 5V
10–10
VG
–11
10
10–12
0 0.5 1 1.5 2 2.5
VG (V)
EKV Model: Drain Characteristics
1
0.9 I 0.790 V
0.8 VD
EKV model VG
0.7
0.6
I (mA)
0.5 0.731 V
0.4
0.3
0.683 V
0.2
0.642 V
0.1
VG = 0.609 V
0
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
VD (V)
Channel Current in Saturation
30
Isat = 26.2 µA
25
V
I = Isat (1 + VD) gD = 0.11 µA/V
0 V0 = 231 V
20
I (µA)
15
Above-Threshold
Model
10
Ohmic Saturation
5 Region Region
Vsat = 0.845 V
0
0 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5
VD (V)
p+ n+ n+
L′ ∆L
Surface
Energy VS ψs
VDS
VD
∆VD
VD′
Modeling the Early Effect
I
Early
voltage
–V0 VD
Drain
Conductance gD = ∂∂IV = ∂I ∂L
∂L ∂V
Chain
Rule
D D
∂I =
I=W
L
( )⇒ ∂L
–W
L2
( ) = – LI
⇒ gD = – LI ∂L ≈
∂VD V0 where V0 ∝ L
Isat