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  • Esterline Research Microjump Sample Report

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    Esterline Research and Design
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    Micro jumps are an oscillator phenomenon where the frequency of the oscillator changes suddenly. These events are often random and non repeatable. Also referred to as phase jumps, phase bursts, or phase pops the nature of the micro jump can cause system related problems especially in phase locked applications. The sudden change in frequency (thus phase) can cause many phase lock loops to lose lock. This is particularly troublesome in the GPS arena were maintaining lock is vital to receiving uninterrupted navigation data. Esterline Research and Design performs micro jump testing on virtually any electronic oscillator. Custom Test fixtures and test profiles can be created to support any customer footprint, and temperatures ranging from -60 C to +200 C. Please contact sales@esterlineresearch.com for pricing inquiries for micro jump testing services. Price varies based on quantity, temperature range and ramp rate.

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    Micro jumps are an oscillator phenomenon where the frequency of the oscillator changes suddenly. These events are often random and non repeatable. Also referred to as phase jumps, phase bursts, or phase pops the nature of the micro jump can cause system related problems especially in phase locked applications. The sudden change in frequency (thus phase) can cause many phase lock loops to lose lock. This is particularly troublesome in the GPS arena were maintaining lock is vital to receiving uninterrupted navigation data. Esterline Research and Design performs micro jump testing on virtually any electronic oscillator. Custom Test fixtures and test profiles can be created to support any customer footprint, and temperatures ranging from -60 C to +200 C. Please contact sales@esterlineresearch.com for pricing inquiries for micro jump testing services. Price varies based on quantity, temperature range and ramp rate.

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    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
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    21 views2 pages

    Esterline Research Microjump Sample Report

    Uploaded by

    Esterline Research and Design
    Micro jumps are an oscillator phenomenon where the frequency of the oscillator changes suddenly. These events are often random and non repeatable. Also referred to as phase jumps, phase bursts, or phase pops the nature of the micro jump can cause system related problems especially in phase locked applications. The sudden change in frequency (thus phase) can cause many phase lock loops to lose lock. This is particularly troublesome in the GPS arena were maintaining lock is vital to receiving uninterrupted navigation data. Esterline Research and Design performs micro jump testing on virtually any electronic oscillator. Custom Test fixtures and test profiles can be created to support any customer footprint, and temperatures ranging from -60 C to +200 C. Please contact sales@esterlineresearch.com for pricing inquiries for micro jump testing services. Price varies based on quantity, temperature range and ramp rate.

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    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
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    of 2

    Microjump Test Report

    Model Number

    NV47S

    System Number

    Total Readings

    81914

    Max uJump 1 S (ppt)

    115

    Serial Number

    Backplane SN

    Nominal Vcc:

    12.00

    Count > 1 Sec Spec

    Meas Card SN

    Nominal EFC

    0.00

    Sigma Tau = 1 S

    25

    Adapter Card SN

    DB Index No

    Max uJump 10 S (ppt)

    64

    Test Pos (User)

    1A

    Lot ID

    Count > 10 Sec Spec

    Sigma Tau = 10 S

    13

    User ID Code
    5/9/2016 9:54:23 AM

    Test Start Date:

    Last Read Timestamp 5/10/2016 9:55:34 AM


    10000000.000

    Nominal Freq (Hz)

    Test Pos (System) 1

    Worst-Case First Differences


    Gate Tim e = 1 Second
    150

    100

    Delta F (ppt)

    50

    -50

    -100

    -150
    0

    10000

    20000

    30000

    40000

    50000

    60000

    70000

    80000

    Tim e (Secs)

    Histogram of First Differences


    Gate Tim e = 1 Second
    25000

    19814

    20000

    # Occerrences

    17370

    15000

    13101

    12744

    10000
    7078

    6462

    5000
    2282

    1997

    -150

    -135

    -120

    -105

    -90

    -75

    104

    21

    150

    MORE

    425

    135

    10

    120

    105

    90

    75

    410

    -60

    95

    MORE

    60

    45

    30

    15

    -15

    -30

    -45

    dF Bin (ppt)

    Thursday, May 19, 2016

    Page 1 of 2

    First Event Detail


    Gate Tim e = 1 Second
    -789.82

    200

    Frequency (ppb)

    0
    -789.92

    -100

    -789.97

    -200
    -300

    -790.02

    -400
    -790.07

    1st Differencees (ppt)

    100

    -789.87

    -500

    -790.12

    -600

    29500

    29450

    29400

    29350

    29300

    29250

    Tim e (S)

    -782.58

    200

    -782.63

    100
    0

    -782.68

    -100
    -782.73

    -200
    -782.78

    -300
    -782.83

    1st Differences (ppt)

    Frequency (ppb)

    2nd Event Detail


    Gate Tim e = 1 Second

    -400
    -500

    -782.88

    63350

    63300

    63250

    63200

    63150

    63100

    Tim e (S)

    -780.58

    200

    -780.63

    100
    0

    -780.68

    -100
    -780.73

    -200
    -780.78

    -300
    -780.83

    -400

    -780.88

    -500

    1st Differences (ppt)

    Frequency (ppb)

    3rd Event Detail


    Gate Time = 1 Second

    78150

    78100

    78050

    78000

    77950

    77900

    Tim e (S)

    Thursday, May 19, 2016

    Page 2 of 2

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