Scribd Logo
Upload

Welcome to Scribd!

  • Esterline Research Aging Report

    Uploaded by

    Esterline Research and Design
    20 views1 page
    The long term drift or Aging performance of an oscillator is one of the metrics used to ensure compliance and suitability of an an oscillator to remain in specification over the lifetime of the application. Esterline Research and Design can perform long term aging on virtually any electronic oscillator or crystal. Custom test fixtures and test profiles can be created to support any customer footprint, and temperatures.

    Copyright

    © © All Rights Reserved

    Available Formats

    PDF, TXT or read online from Scribd

    Did you find this document useful?

    Is this content inappropriate?

    Report this Document
    The long term drift or Aging performance of an oscillator is one of the metrics used to ensure compliance and suitability of an an oscillator to remain in specification over the lifetime of the application. Esterline Research and Design can perform long term aging on virtually any electronic oscillator or crystal. Custom test fixtures and test profiles can be created to support any customer footprint, and temperatures.

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Flag for inappropriate content
    20 views1 page

    Esterline Research Aging Report

    Uploaded by

    Esterline Research and Design
    The long term drift or Aging performance of an oscillator is one of the metrics used to ensure compliance and suitability of an an oscillator to remain in specification over the lifetime of the application. Esterline Research and Design can perform long term aging on virtually any electronic oscillator or crystal. Custom test fixtures and test profiles can be created to support any customer footprint, and temperatures.

    Copyright:

    © All Rights Reserved
    Download as PDF, TXT or read online from Scribd
    Flag for inappropriate content
    of 1

    Frequency Aging Test Report

    Test Information
    Model Number
    Serial Number
    Test Start Date:
    Last Read Timestamp
    Nominal Freq (Hz)
    Init Freq Read (ppb)
    Last Freq Read (ppb)
    Total Readings

    NV47S
    1
    2/26/2016 10:56:18 AM
    3/28/2016 9:37:06 AM
    10000000.000
    -956.485
    -901.045
    88089

    System Number
    Backplane SN
    Meas Card SN
    Adapter Card SN
    Test Pos
    DB Index No
    Nominal Vcc:
    Nominal EFC

    Log Fit Information [a ln(bt+1)+c]


    Fit Coefficients
    Aging Projections
    5.03
    a:
    708.04
    0.24
    b:
    ppb/day
    0.06
    15.61
    c:
    ppb/year
    0.975
    19.88
    R-Square
    ppb/2 years
    25.38
    Fit Start Day 0.99
    ppb/5 years
    Fit Stop Day 30.90
    ppb/10 years 29.49
    ppb RMS Err 0.89
    ppb/20 years 33.58

    2
    1
    1
    3
    1A
    3
    12.00
    0.00

    Raw Data
    Ra wFre q

    LogFitO fRa w

    60.0

    Delta F (ppb)

    50.0

    40.0

    30.0

    20.0

    10.0

    0.0
    0.0

    5.0

    10.0

    15.0

    20.0
    Tim e (Days)

    25.0

    30.0

    35.0

    Long Term Aging Extrapolation


    Ra wFre q

    LogFitO fRa w

    90.0
    80.0

    Delta F (ppb)

    70.0
    60.0
    50.0
    40.0
    30.0
    20.0
    10.0
    0.0
    0.1

    Monday, March 28, 2016

    1.0

    10.0

    100.0
    Tim e (Days)

    1000.0

    10000.0

    Page 1 of 1

    You might also like