Professional Documents
Culture Documents
RDS(ON)
ID
100V
50A
TO-220
SYMBOL
LIMITS
UNITS
VGS
20
Gate-Source Voltage
Continuous Drain Current
Pulsed Drain Current
Avalanche Current
TC = 25 C
TC = 100 C
Avalanche Energy
L = 0.3mH
TC = 25 C
Power Dissipation
31
IDM
200
IAS
77
EAS
900
mJ
128
PD
TC = 100 C
50
ID
51
TJ, TSTG
-55 to 150
TL
275
SYMBOL
TYPICAL
MAXIMUM
Junction-to-Case
RJC
0.97
Junction-to-Ambient
RJA
62.5
Case-to-Heatsink
RCS
UNITS
C / W
0.5
Ver 1.0
2011/4/8
P2610ATG
N-Channel Enhancement Mode MOSFET
ELECTRICAL CHARACTERISTICS (TJ = 25 C, Unless Otherwise Noted)
PARAMETER
SYMBOL
TEST CONDITIONS
LIMITS
MIN
UNIT
TYP
MAX
2.3
4.0
STATIC
Drain-Source Breakdown Voltage
Gate Threshold Voltage
V(BR)DSS
100
VGS(th)
1.5
Gate-Body Leakage
IGSS
IDSS
ID(ON)
RDS(ON)
21
gfs
38
Forward Transconductance
250
nA
10
50
A
26
m
S
DYNAMIC
Input Capacitance
Ciss
Output Capacitance
Coss
Crss
186
Qg
79
Gate-Source Charge
Qgs
4900
VGS = 0V, VDS = 25V, f = 1MHz
887
31
Qgd
30
td(on)
25
tr
Gate-Drain Charge
Rise Time
td(off)
Fall Time2
VDD = 50V,
ID 50A, VGS = 10V, RGEN = 25
tf
pF
nC
250
nS
110
140
IS
IF = IS, VGS = 0V
50
1.5
Forward Voltage
Reverse Recovery Time
VSD
trr
100
nS
Qrr
380
nC
Ver 1.0
2011/4/8
P2610ATG
N-Channel Enhancement Mode MOSFET
Ver 1.0
2011/4/8
P2610ATG
N-Channel Enhancement Mode MOSFET
Ver 1.0
2011/4/8