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P2610ATG

N-Channel Enhancement Mode MOSFET


PRODUCT SUMMARY
V(BR)DSS

RDS(ON)

ID

100V

26m @VGS = 10V

50A

TO-220

100% UIS tested


ABSOLUTE MAXIMUM RATINGS (TA = 25 C Unless Otherwise Noted)
PARAMETERS/TEST CONDITIONS

SYMBOL

LIMITS

UNITS

VGS

20

Gate-Source Voltage
Continuous Drain Current
Pulsed Drain Current
Avalanche Current

TC = 25 C
TC = 100 C

Avalanche Energy

L = 0.3mH
TC = 25 C

Power Dissipation

31

IDM

200

IAS

77

EAS

900

mJ

128

PD

TC = 100 C

Operating Junction & Storage Temperature Range

50

ID

51

TJ, TSTG

-55 to 150

TL

275

Lead Temperature ( /16" from case for 10 sec.)

THERMAL RESISTANCE RATINGS


THERMAL RESISTANCE

SYMBOL

TYPICAL

MAXIMUM

Junction-to-Case

RJC

0.97

Junction-to-Ambient

RJA

62.5

Case-to-Heatsink

RCS

UNITS

C / W

0.5

Pulse width limited by maximum junction temperature.

Ver 1.0

2011/4/8

P2610ATG
N-Channel Enhancement Mode MOSFET
ELECTRICAL CHARACTERISTICS (TJ = 25 C, Unless Otherwise Noted)
PARAMETER

SYMBOL

TEST CONDITIONS

LIMITS
MIN

UNIT

TYP

MAX

2.3

4.0

STATIC
Drain-Source Breakdown Voltage
Gate Threshold Voltage

V(BR)DSS

VGS = 0V, ID = 250A

100

VGS(th)

VDS = VGS, ID = 250A


VDS = 0V, VGS = 20V

1.5

Gate-Body Leakage

IGSS

Zero Gate Voltage Drain Current

IDSS

On-State Drain Current1


Drain-Source On-State

ID(ON)

VDS = 10V, VGS = 10V

RDS(ON)

VGS = 10V, ID = 25A

21

gfs

VDS = 40V, ID = 25A

38

Forward Transconductance

250

nA

VDS = 80V, VGS = 0V

VDS = 80V, VGS = 0V , TJ = 125 C

10

50

A
26

m
S

DYNAMIC
Input Capacitance

Ciss

Output Capacitance

Coss

Reverse Transfer Capacitance

Crss

186

Qg

79

Total Gate Charge

Gate-Source Charge

Qgs

4900
VGS = 0V, VDS = 25V, f = 1MHz

VDS = 80V, VGS = 10V, ID = 50A

887

31

Qgd

30

Turn-On Delay Time2

td(on)

25

tr

Gate-Drain Charge
Rise Time

Turn-Off Delay Time

td(off)

Fall Time2

VDD = 50V,
ID 50A, VGS = 10V, RGEN = 25

tf

pF

nC

250

nS

110
140

SOURCE-DRAIN DIODE RATINGS AND CHARACTERISTICS (TJ = 25 C)


Continuous Current
1

IS
IF = IS, VGS = 0V

50

1.5

Forward Voltage
Reverse Recovery Time

VSD
trr

100

nS

Reverse Recovery Charge

Qrr

380

nC

Pulse test : Pulse Width 300 sec, Duty Cycle 2.

Independent of operating temperature.

Ver 1.0

2011/4/8

P2610ATG
N-Channel Enhancement Mode MOSFET

Ver 1.0

2011/4/8

P2610ATG
N-Channel Enhancement Mode MOSFET

Ver 1.0

2011/4/8

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